Electron microscope detection sample storing and taking device
By designing an electron microscope detection sample access device, the continuous one-way flow and automatic cleaning of the sample are achieved, the detection accuracy and efficiency problems caused by sample contamination are solved, and the reliability and automation of electron microscope detection are improved.
CN223272455UActive Publication Date: 2025-08-26JIANGSU WANPAN TECHNOLOGY CO LTD
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Patent Information
- Application Number
- CN202422457026.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-11
- Publication Date
- 2025-08-26
- Estimated Expiration
- 2034-10-11
AI Technical Summary
Technical Problem
In existing electron microscope detection, the direct contact between the sample and the detection table leads to contamination, affecting the accuracy and experimental efficiency of subsequent samples.
Method used
An electron microscope detection sample access device is designed, including a conveying structure and a positioning structure to realize the continuous one-way flow of the sample, and automatically remove residual substances through the self-cleaning structure to avoid cross-contamination.
Benefits of technology
It improves the accuracy and efficiency of detection, ensures stable transmission and positioning of samples in the channel, reduces equipment maintenance needs, and improves operation automation and reliability.
✦ Generated by Eureka AI based on patent content.
Abstract
The utility model discloses an electron microscope detection sample storing and taking device which comprises a storing and taking platform, the storing and taking platform comprises a platform body, a detection groove and a sample channel, and the sample channel is formed in the middle of the upper surface of the platform body. By arranging the conveying structure and the positioning structure, when a sample to be detected is detected, the sample is placed on the right side of the conveying belt in the sample channel, then the rotating handle is manually rotated anticlockwise, and the conveying roller is rotated by rotating the handle, so that the sample on the upper surface is conveyed in the sample channel through the conveying belt; after the sample is conveyed to the position of the detection groove, the sample is subjected to electron microscope detection, and then the rotating handle is continuously rotated anticlockwise, so that the conveying belt continuously conveys the sample until the sample is taken out through the leftmost side of the sample channel, continuous one-way flowing of the sample in the electron microscope detection process is realized, and sample pollution is effectively avoided; and the detection efficiency and precision are improved.
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