Test fixture and device
By introducing multiple temperature control modules and temperature control modules into the test fixture, the temperature of each area of the crimping module can be independently obtained, which solves the problem of temperature fluctuation and achieves higher temperature control accuracy and test reliability.
Patent Information
- Application Number
- CN202422587553.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-25
- Publication Date
- 2025-09-23
- Estimated Expiration
- 2034-10-25
AI Technical Summary
During the product pre-packaging test process, gas or liquid temperature fluctuations cause the test temperature environment of the product to be tested to deviate significantly from the preset temperature environment, affecting the test accuracy and reliability.
A test fixture is designed, including multiple temperature control modules and crimping modules. The temperature of each area of the crimping module is independently obtained by the temperature control module, and the precise temperature control of each area of the crimping module is achieved by combining the heating element and the cooling element.
The temperature control and adjustment accuracy of each area of the crimping module are improved to ensure the test accuracy and reliability of the product under test under preset temperature conditions.
Smart Images
Figure CN223377444U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of product testing technology, and in particular to a testing fixture and device. Background Art
[0002] In the fields of electronic components, chips, digital products, etc., products need to be tested before packaging to check whether the functions of the test products are normal.
[0003] Currently, during the press-fit test of products under test (such as semiconductor chips and display modules), the product is typically placed in a press-fit fixture. A gas or liquid at a certain temperature is then introduced into the fixture to simulate the test environment of the product under test. However, the temperature of the gas or liquid fluctuates during the flow, making it difficult to control the test temperature of the product under test. This can lead to significant deviations between the actual test temperature of the product under test and the preset temperature, seriously affecting the test accuracy and reliability of the product under test. Utility Model Content
[0004] Based on this, it is necessary to provide a test fixture and device to address the problem that the test temperature environment of the product is difficult to control during the crimping test of existing products.
[0005] A test fixture, comprising:
[0006] crimping dies; and
[0007] Multiple temperature control modules are arranged at intervals on the crimping module, and the multiple temperature control modules respectively obtain the temperature of each area of the crimping module.
[0008] In one embodiment, the temperature control module includes a first temperature sensor and a temperature control component. The first temperature sensor is used to obtain the temperature of the contact surface between the crimping module and the product to be tested, and is communicated with the temperature control component. The temperature control component is used to control the temperature of the crimping module.
[0009] In one embodiment, the temperature control component includes a heating element and a cooling element, and both the heating element and the cooling element are communicatively connected to the first temperature sensor.
[0010] In one embodiment, the crimping module includes a fixture body and a plurality of test heads, and the plurality of test heads are spaced apart from each other on the fixture body and correspond to the plurality of temperature control modules.
[0011] In one embodiment, the test fixture further includes a plurality of second temperature sensors, which are correspondingly disposed at the plurality of test heads, and are used to obtain the temperature of the test heads.
[0012] In one embodiment, the plurality of temperature control modules can be detachably mounted on the crimping module, and the second temperature sensor can be detachably mounted on the test head.
[0013] In one embodiment, the fixture body is provided with a wire groove, which opens on the surface of the fixture body and extends toward the interior of the fixture body.
[0014] In one embodiment, the test fixture further includes a control module, and the control module is communicatively connected to the first temperature sensor and the temperature control component.
[0015] A testing device, comprising:
[0016] Machine;
[0017] As in any one of the above technical solutions, the test fixture, the crimping module is movably arranged on the machine; and
[0018] The moving mechanism is arranged on the machine platform and is transmission-connected to the crimping module.
[0019] In one embodiment, the moving mechanism includes a multi-axis moving module and a multi-axis rotating module. The multi-axis moving module and the multi-axis rotating module are both arranged on the machine platform and are transmission-connected to the crimping module.
[0020] In the above-mentioned test fixture and device, the temperature control module independently obtains the temperature of each area of the crimping module, which facilitates the independent adjustment of the temperature of each area of the crimping module to the preset temperature. When the crimping module is in the process of pressing the product to be tested, the crimping module transfers heat to the product to be tested to simulate the temperature test environment of the product to be tested. The test fixture provided by this application has multiple temperature control modules that can independently obtain the temperature of each area of the crimping module, improve the temperature sensing accuracy of each area of the crimping module, independently control the temperature of each area of the crimping module, improve the temperature control and adjustment accuracy of the crimping module, and thus improve the test accuracy and reliability of the product to be tested under preset temperature conditions. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] Figure 1 Schematic diagram of the structure of the test fixture provided in some embodiments.
[0022] Figure 2 Schematic diagram of the structure of the test fixture provided in some embodiments.
[0023] Figure 3 Schematic diagram of the structure of the test fixture provided in some embodiments.
[0024] Reference numerals:
[0025] 100. Test fixture;
[0026] 110. Crimp module; 111. Fixture body; 112. Test head; 113. Wire duct; 120. Temperature control module; 121. First temperature sensor; 122. Temperature control assembly; 130. Second temperature sensor. DETAILED DESCRIPTION
[0027] To make the above-mentioned objects, features, and advantages of the present application more clearly understood, the specific embodiments of the present application are described in detail below with reference to the accompanying drawings. The following description sets forth many specific details to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways than those described herein, and those skilled in the art can make similar improvements without violating the scope of the present application. Therefore, the present application is not limited to the specific embodiments disclosed below.
[0028] In the description of this application, it should be understood that if the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. appear, the orientation or position relationship indicated by these terms is based on the orientation or position relationship shown in the accompanying drawings, which is only for the convenience of describing this application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on this application.
[0029] In addition, if the terms "first" or "second" appear, these terms are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly specify the number of technical features indicated. Therefore, a feature specified as "first" or "second" may explicitly or implicitly include at least one of such features. In the description of this application, if the term "plurality" appears, "plurality" means at least two, for example, two, three, etc., unless otherwise specifically defined.
[0030] In this application, unless otherwise specified or limited, the terms "mounted," "connected," "connected," "fixed," etc., should be interpreted broadly. For example, these terms may refer to fixed connections, removable connections, or integration; mechanical connections or electrical connections; direct connections or indirect connections through an intermediary; and internal communication between two components or interaction between two components, unless otherwise specified. Those skilled in the art will understand the specific meanings of these terms in this application based on the specific circumstances.
[0031] In this application, unless otherwise expressly specified or limited, if a first feature is described as being "above" or "below" a second feature, or similar descriptions, this may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium. Furthermore, when a first feature is described as being "above," "above," or "above" a second feature, it may mean that the first feature is directly above or diagonally above the second feature, or simply means that the first feature is at a higher level than the second feature. When a first feature is described as being "below," "below," or "below" a second feature, it may mean that the first feature is directly below or diagonally below the second feature, or simply means that the first feature is at a lower level than the second feature.
[0032] It should be noted that if an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be an intermediate element. If an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be an intermediate element. If any, the terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in this application are for illustrative purposes only and do not represent the only embodiment.
[0033] The technical solutions provided by the embodiments of the present application are described below with reference to the accompanying drawings.
[0034] See Figure 1 and Figure 2 As shown, the present application provides a test fixture 100, which includes a crimping module 110 and multiple temperature control modules 120. The test fixture 100 can simulate different test temperature environments of the product under test and perform a crimping test on the product under test under a preset temperature environment. The product under test can be a semiconductor chip, a display module, etc., and the specific product type of the product under test is not limited by this application.
[0035] The plurality of temperature control modules 120 are spaced apart from each other on the crimping module 110, and the plurality of temperature control modules 120 respectively obtain the temperature of each area of the crimping module 110. For example, in one embodiment, refer to Figure 1 As shown, there are five temperature control modules 120, four of which are distributed in the edge areas of the crimping module 110, and one temperature control module 120 is distributed in the middle area of the crimping module 110; in another embodiment, refer to Figure 2 As shown, there are four temperature control modules 120, which are distributed at the edge of the crimping module 110. The specific number and distribution of the temperature control modules 120 are not limited in this application and can be similarly configured according to the above embodiment, which will not be described in detail here.
[0036] If only one temperature control module 120 is used to measure the temperature of the crimping module 110, the temperature control module 120 will have high temperature sensing accuracy in areas close to it, but low temperature sensing accuracy in areas further away. In the aforementioned test fixture 100, the temperature control module 120 independently measures the temperature of each area of the crimping module 110, facilitating independent adjustment of the temperature of each area of the crimping module 110 to a preset temperature. When the crimping module 110 is crimping the product under test, the crimping module 110 transfers heat to the product under test through solid conduction, simulating the temperature test environment of the product under test. Since multiple temperature control modules 120 are arranged at intervals on the crimping module 110, each temperature control module 120 obtains the temperature of the area near it respectively, that is, multiple temperature control modules 120 can independently obtain the temperature of each area of the crimping module 110. The temperature control module 120 has higher temperature sensing accuracy for the crimping module 110, and improves the temperature control and adjustment accuracy of each area of the crimping module 110, so as to independently control the temperature of each area of the crimping module 110, improve the temperature control and adjustment accuracy of the crimping module 110, and thereby improve the test accuracy and reliability of the product to be tested under preset temperature conditions.
[0037] In one embodiment, see Figure 1-Figure 3 As shown, the temperature control module 120 includes a first temperature sensor 121 and a temperature control assembly 122. The first temperature sensor 121 is used to obtain the temperature of the contact surface between the crimping module 110 and the product to be tested. The first temperature sensor 121 and the temperature control assembly 122 are communicatively connected, such as by a cable, Wi-Fi, Bluetooth, etc. The temperature control assembly 122 is used to control the temperature of the crimping module 110. For example, if the surface of the crimping module 110 that contacts the product to be tested is defined as the crimping surface, the first temperature sensor 121 is used to obtain the temperature of the crimping surface. Since the crimping surface of the crimping module 110 contacts the product to be tested during the crimping process of the product to be tested, the temperature of the crimping surface is obtained by the first temperature sensor 121. The temperature signal obtained by the first temperature sensor 121 is closer to the amount of heat conducted to the product to be tested. The temperature control component 122 can control the temperature of the area near the crimping surface of the crimping module 110 to a preset temperature, which can ensure that the amount of heat conducted to the product to be tested by the crimping module 110 is closer to the preset temperature environment of the product to be tested, thereby improving the test accuracy and reliability of the product to be tested under the preset temperature conditions.
[0038] Specifically, see Figure 1-Figure 3As shown, the temperature control component 122 includes a heating element and a cooling element, and both the heating element and the cooling element are communicatively connected to the first temperature sensor 121. For example, the heating element and the first temperature sensor 121 are communicatively connected via cables, WIFI, Bluetooth, etc., and the cooling element and the first temperature sensor 121 are also communicatively connected via cables, WIFI, Bluetooth, etc. Exemplarily, when the first temperature sensor 121 obtains that the temperature of a certain area of the crimping module 110 is lower than the preset temperature, the first temperature sensor 121 feeds back a low temperature signal of the area of the crimping module 110 to the temperature control component 122, and the heating element in the temperature control component 122 heats the area to make up the temperature difference of the area of the crimping module 110 to the preset temperature; on the contrary, when the first temperature sensor 121 obtains that the temperature of a certain area of the crimping module 110 is higher than the preset temperature, the first temperature sensor 121 feeds back a high temperature signal of the area of the crimping module 110 to the temperature control component 122, and the refrigeration element in the temperature control component 122 cools the area to make up the temperature difference of the area of the crimping module 110 to the preset temperature.
[0039] The above-mentioned test fixture 100 can independently sense and control the temperature of each area of the crimping module 110 through the first temperature sensor 121 and the temperature control component 122. In the process of controlling the temperature of each area of the crimping module 110, the heating element and the cooling element cooperate to maintain the temperature of each area of the crimping module 110 at a preset temperature, and adjust the temperature of the crimping module 110 in a zoned manner, dynamically adjust the temperature of each area of the crimping module 110, and improve the test accuracy and reliability of the product to be tested under the preset temperature conditions.
[0040] In one embodiment, see Figure 2 and Figure 3 As shown, the crimping module 110 includes a fixture body 111 and a plurality of test heads 112, the plurality of test heads 112 are spaced apart from each other on the fixture body 111, and the plurality of test heads 112 correspond to the plurality of temperature control modules 120, that is, the number and setting position of the test heads 112 and the temperature control modules 120 are consistent. Figure 2 As shown, there are four test heads 112 and four temperature control modules 120, and the locations of the four test heads 112 are consistent with the locations of the four temperature control modules 120. Each test head 112 corresponds to a temperature control module 120. This application does not limit the specific number and location of the test heads 112 and the temperature control modules 120, and they can be adaptively configured according to the above example. In this way, multiple test heads 112 can be used to simultaneously crimp multiple products to be tested, improving the efficiency of the crimping module 110 in crimping the products to be tested.
[0041] In one embodiment, see Figure 2 and Figure 3As shown, the test fixture 100 further includes a plurality of second temperature sensors 130. The plurality of second temperature sensors 130 are correspondingly disposed at the plurality of test heads 112, and the second temperature sensors 130 are used to obtain the temperature of the test heads 112. For example, see Figure 3 As shown, there are four test heads 112 and four second temperature sensors 130, with each test head 112 being provided with a second temperature sensor 130. The specific number of test heads 112 and second temperature sensors 130 is not limited in this application and can be adaptively configured according to the above example.
[0042] The above-mentioned test fixture 100, since the test head 112 will directly contact and press the product under test during the crimping process of the product under test, obtains the temperature of the test head 112 through the second temperature sensor 130, which can improve the accuracy of sensing heat conducted to the product under test, ensure that the amount of heat conducted to the product under test by the test head 112 is closer to the preset temperature environment of the product under test, and improve the test accuracy and reliability of the product under test under the preset temperature conditions.
[0043] In one embodiment, see Figure 2 and Figure 3 As shown, multiple temperature control modules 120 can be detachably arranged on the crimping module 110, such as the temperature control modules 120 can be detachably arranged on the crimping module 110 by plugging, snapping, etc., and the second temperature sensors 130 can be detachably arranged on the test head 112, such as the second temperature sensors 130 can be detachably arranged on the test head 112 by plugging, snapping, etc. In this way, when one or more temperature control modules 120 fail or are damaged, only the failed or damaged temperature control modules 120 need to be replaced, and when one or more second temperature sensors 130 fail or are damaged, only the failed or damaged second temperature sensors 130 need to be replaced, without scrapping the entire test fixture 100, which facilitates the later maintenance of the test fixture 100 and reduces the use cost of the test fixture 100.
[0044] Further, see Figure 2 and Figure 3As shown, the fixture body 111 is provided with a wire groove 113, which opens on the surface of the fixture body 111 and extends toward the inside of the fixture body 111. Preferably, the wire groove 113 is integrally formed on the fixture body 111 by injection molding, extrusion, etc., which simplifies the molding process of opening the wire groove 113 on the fixture body 111. In this way, the wire groove 113 is provided on the fixture body 111, which facilitates the wiring of the temperature control module 120 and the second temperature sensor 130, avoids the wiring direction of the temperature control module 120 and the second temperature sensor 130 being too chaotic, and causes interference to the subsequent crimping test of the product to be tested, and protects the temperature control module 120 and the second temperature sensor 130, thereby reducing the failure rate of the temperature control module 120 and the second temperature sensor 130, and further reduces the use cost of the test fixture 100.
[0045] In one embodiment, see Figure 1-Figure 3 As shown, the test fixture 100 also includes a control module. The control module is in communication with the first temperature sensor 121 and the temperature control component 122, for example, the control module is in communication with the first temperature sensor 121 and the temperature control component 122 via a cable, WIFI, Bluetooth, or the like. The first temperature sensor 121 can feed back the acquired temperature signal to the control module, which controls the operation of the temperature control component 122 after analysis to adjust the temperature difference of each area of the crimping module 110, thereby ensuring that the amount of heat transferred from the crimping module 110 to the product to be tested is closer to the preset temperature environment of the product to be tested, thereby improving the test accuracy and reliability of the product to be tested under the preset temperature conditions.
[0046] It should be noted that the control module is also in communication with the second temperature sensor 130, which can also feed back the acquired temperature signal to the control module. The control module controls the temperature control component 122 to perform temperature adjustment or temperature reduction operations to compensate for the temperature difference of the test head 112. The control module can be a PLC (Programmable Logic Controller), a CPU (Central Processing Unit), or other components capable of performing control analysis. This application does not limit the specific component type of the control module.
[0047] Also, see Figure 1-Figure 3As shown, the present application also provides a testing device, which includes a machine, a moving mechanism, and a test fixture 100 as described above. The crimping module 110 is movably arranged on the machine, and the moving mechanism is arranged on the machine. The moving mechanism is connected to the crimping module 110 in a transmission manner to drive the movement of the crimping module 110. The relative position of the crimping module 110 and the product to be tested can be adjusted by the moving mechanism, and the crimping module 110 can be driven to move toward or away from the product to be tested, so as to realize the crimping test of the product to be tested by the crimping module 110.
[0048] In the above-mentioned testing device, since multiple temperature control modules 120 are arranged at intervals on the crimping module 110, each temperature control module 120 respectively obtains the temperature of the area near it, that is, multiple temperature control modules 120 can independently obtain the temperature of each area of the crimping module 110. The temperature control module 120 has higher temperature sensing accuracy for the crimping module 110, and improves the temperature control and adjustment accuracy of each area of the crimping module 110, so as to independently control the temperature of each area of the crimping module 110, improve the temperature control and adjustment accuracy of the crimping module 110, and thus improve the test accuracy and reliability of the product to be tested under preset temperature conditions.
[0049] In one embodiment, see Figure 1-Figure 3 As shown, the moving mechanism includes a multi-axis moving module and a multi-axis rotating module, both of which are mounted on the machine platform and are in transmission connection with the crimping module 110. The multi-axis moving module and the multi-axis rotating module cooperate to adjust the relative position of the crimping module 110 and the product under test, and can drive the crimping module 110 toward or away from the product under test to perform crimping testing on the product under test.
[0050] For example, the multi-axis mobile module is used to drive the crimping module 110 to move relative to the machine along the X-axis, Y-axis, and Z-axis directions, that is, the multi-axis mobile module drives the crimping module 110 to move in three-dimensional space, and the multi-axis rotation module is used to adjust the deflection angle of the crimping module 110 relative to the machine along the Rx-axis, Ry-axis, and Rz-axis directions, that is, the multi-axis rotation module drives the crimping module 110 to rotate in three-dimensional space. Through the mutual cooperation of the multi-axis mobile module and the multi-axis rotation module, the crimping module 110 can be driven to move and rotate in three-dimensional space to adjust the relative position of the crimping module 110 and the product to be tested, thereby realizing the crimping test of the product to be tested by the crimping module 110.
[0051] The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above-mentioned embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0052] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present patent application shall be determined by the appended claims.
Claims
1. A test fixture, characterized in that: The test fixture includes: crimping dies; and Multiple temperature control modules are arranged at intervals on the crimping module, and the multiple temperature control modules respectively obtain the temperature of each area of the crimping module.
2. The test fixture according to claim 1, characterized in that: The temperature control module includes a first temperature sensor and a temperature control component. The first temperature sensor is used to obtain the temperature of the contact surface between the crimping module and the product to be tested, and is communicated with the temperature control component. The temperature control component is used to control the temperature of the crimping module.
3. The test fixture according to claim 2, characterized in that: The temperature control component includes a heating element and a cooling element, and both the heating element and the cooling element are communicatively connected to the first temperature sensor.
4. The test fixture according to any one of claims 1 or 2, characterized in that: The crimping module includes a fixture body and a plurality of test heads. The plurality of test heads are arranged at intervals on the fixture body and correspond to the plurality of temperature control modules.
5. The test fixture according to claim 4, characterized in that: The test fixture further includes a plurality of second temperature sensors, which are correspondingly disposed at the plurality of test heads and are used to obtain the temperature of the test heads.
6. The test fixture according to claim 5, characterized in that: The plurality of temperature control modules are detachably mounted on the crimping module, and the second temperature sensor is detachably mounted on the test head.
7. The test fixture according to claim 4, characterized in that: The fixture body is provided with a wire groove, which opens on the surface of the fixture body and extends toward the inside of the fixture body.
8. The test fixture according to claim 2, wherein: The test fixture further includes a control module, which is communicatively connected to the first temperature sensor and the temperature control component.
9. A testing device, characterized in that: The testing device comprises: Machine; The test fixture according to any one of claims 1 to 8, wherein the crimping module is movably disposed on the machine platform; and The moving mechanism is arranged on the machine platform and is transmission-connected to the crimping module.
10. The testing device according to claim 9, characterized in that: The moving mechanism includes a multi-axis moving module and a multi-axis rotating module. The multi-axis moving module and the multi-axis rotating module are both arranged on the machine platform and are transmission-connected to the crimping module.