Power supply device

Abstract

The utility model provides a power supply device which comprises a power supply module, two wire inlet ends, N discharge gaps and N impedance elements, each impedance element comprises a resistor and a reactance element which are connected in series, the N discharge gaps are connected between the two wire inlet ends, one wire inlet end is used for being connected with a protective ground, and the other wire inlet end is used for being connected with the protective ground. The N discharge gaps are used for introducing the instantaneous overvoltage of the power supply module into the protection ground, and N is an integer greater than or equal to 2. Wherein the N discharge gaps are sequentially connected in series, and each discharge gap in the N discharge gaps is connected with one impedance element in parallel. According to the scheme provided by the invention, the withstand voltage test can be carried out under the condition that the discharge gap is grounded, so that the production efficiency can be improved.

Description

Technical Field

[0001] This application relates to the field of power equipment technology, and more particularly to a power supply device. Background Technology

[0002] Generally, power supply ports are equipped with protective devices to meet certain electromagnetic susceptibility (EMS) standards, and the power supply must also meet certain safety standards. Typically, the high-frequency operating voltage of the protective devices is not lower than the low-frequency operating voltage. To enhance the protection capability of the power module, the safety test voltage is higher than the high-frequency operating voltage, thus exceeding the low-frequency operating voltage. Safety testing (i.e., withstand voltage testing) is generally performed in low-frequency environments. To prevent the protective devices (such as discharge gaps) from breaking down during the withstand voltage test, the connection between the protective devices and protective ground is disconnected before the test. Common-mode protection is generally used for the protective devices. Since the common-mode protection is connected to the protective ground using protective screws, these screws are generally not installed before the withstand voltage test.

[0003] However, since there are many ports using common-mode protection in the circuit system, if the protective screws are not installed before the withstand voltage test and are only installed after the withstand voltage test, it will lead to low production efficiency. Utility Model Content

[0004] This application provides a power supply device that can perform withstand voltage tests with the discharge gap grounded, thereby improving production efficiency.

[0005] In a first aspect, a power supply device is provided, comprising a power module, two input terminals, N discharge gaps, and N impedance elements. Each impedance element includes a resistor and a reactance element connected in series. The N discharge gaps are connected between the two input terminals, one of which is connected to protective ground. The N discharge gaps are used to introduce instantaneous overvoltages of the power module into the protective ground, where N is an integer greater than or equal to 2. The N discharge gaps are connected in series sequentially, and each of the N discharge gaps is connected in parallel with an impedance element.

[0006] In this embodiment, since each of the N discharge gaps is connected in parallel with an impedance element, when performing a withstand voltage test on the N discharge gaps, it is equivalent to the voltage between the two input terminals acting on the N discharge gaps connected in series. Therefore, the N discharge gaps will only break down when the voltage between the two input terminals reaches the sum of the low-frequency breakdown voltages of the N discharge gaps connected in series. Generally, the sum of the low-frequency breakdown voltages of the N discharge gaps is greater than the high-frequency breakdown voltage of a single discharge gap. When the voltage between the two input terminals is higher than the high-frequency breakdown voltage of a single discharge gap but less than the sum of the low-frequency breakdown voltages of the N discharge gaps, the N discharge gaps will not break down. This allows for withstand voltage testing of the discharge gaps while they are connected to protective ground, thereby improving production efficiency.

[0007] Specifically, if the power supply unit is an embedded battery, the BMS cannot be directly disconnected from the protective ground after assembly with the battery pack, preventing the entire battery unit from undergoing withstand voltage testing. This poses a reliability risk should the entire unit fail its safety insulation. However, the embodiments of this application allow withstand voltage testing to be completed even with the protective branch (i.e., the discharge gap) connected to the protective ground. Even if the battery has insulation failure issues, this application can still perform withstand voltage testing, thereby improving the reliability of the power supply unit.

[0008] Furthermore, since each discharge gap is connected in parallel with an impedance element, by selecting appropriate resistors or reactance elements, the voltage between the two input terminals during surge testing of these N discharge gaps can be mostly applied to one of the discharge gaps at the same time. Thus, the voltage between the two input terminals can be slightly greater than the high-frequency breakdown voltage of one of the discharge gaps to complete the surge test of these N discharge gaps, which is simple to implement.

[0009] In conjunction with the first aspect, in one possible implementation, the reactive element is an X-capacitor, and the ratio of the capacitances of the N X-capacitors is equal to the ratio of the breakdown voltages of the corresponding N discharge gaps. When the frequency of the voltage between the two input terminals is less than a first preset frequency, the N discharge gaps are broken down when the amplitude of the voltage between the two input terminals reaches the sum of the breakdown voltages of the N discharge gaps.

[0010] In this embodiment, since the reactance of a capacitor is negatively correlated with frequency, the capacitive reactance is large at lower voltage frequencies. The voltage between the two input terminals acts primarily on these N capacitors. When the amplitude of the voltage between the two input terminals reaches the sum of the low-frequency breakdown voltages of the N discharge gaps, the N discharge gaps are broken down. This application designs the ratio of the capacitances of the N X capacitors to be equal to the ratio of the low-frequency breakdown voltages of the corresponding N discharge gaps. Therefore, the voltages of these N X capacitors can more accurately reflect the low-frequency breakdown voltages of the corresponding N discharge gaps, thereby improving the accuracy and reliability of the withstand voltage test of the discharge gaps.

[0011] In conjunction with the first aspect, in one possible implementation, the resistance values ​​of the N resistors are all unequal. When the frequency of the voltage between the two input terminals is greater than a second preset frequency, and the amplitude of the voltage between the two input terminals reaches a first voltage value that causes the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors to break down, the N discharge gaps break down one by one, and the order of breakdown is from the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors to the discharge gap connected in parallel with the resistor with the smallest resistance among the N resistors. The first voltage value is greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors. The second preset frequency is greater than the first preset frequency.

[0012] In this embodiment, when the frequency of the voltage between the two input terminals is greater than the second preset frequency, that is, when a high-frequency voltage is applied between the two input terminals, since the resistance values ​​of the N resistors are not equal, when the amplitude of the voltage between the two input terminals reaches the first voltage value, the discharge gap connected in parallel with the resistor with the largest resistance value among the N resistors is broken down. When the discharge gap connected in parallel with the resistor with the largest resistance value is broken down, the voltage between the two input terminals acts on the discharge gap connected in parallel with the resistor with the second largest resistance value, thereby breaking down the discharge gap connected in parallel with the resistor with the second largest resistance value. Thus, the N discharge gaps are broken down one by one. Thus, during the surge test of N discharge gaps, the breakdown voltage of the N series-connected discharge gaps is close to the high-frequency breakdown voltage of a single discharge gap. In other words, during the surge test, the voltage between the two input terminals only needs to be greater than the high-frequency breakdown voltage of a single discharge gap to achieve the breakdown of N discharge gaps one by one. In this way, the voltage between the two input terminals does not need to be increased to be greater than the sum of the high-frequency breakdown voltages of multiple discharge gaps to complete the surge test of N discharge gaps, which is easy to implement and can improve the feasibility of surge testing.

[0013] In conjunction with the first aspect, in one possible implementation, the ratio of the resistance values ​​of adjacent resistors among the N resistors is greater than or equal to a first threshold.

[0014] In this embodiment, when a high-frequency voltage is applied between the two input terminals, since the ratio of the resistance values ​​of adjacent resistors among the N resistors is greater than a first threshold value, which can be set to a large value, the resistance value of each resistor among the N resistors is much greater than the resistance value of adjacent resistors. As a result, the breakdown voltage of the multiple discharge gaps connected in series is closer to the high-frequency breakdown voltage of a single discharge gap. Thus, when the high-frequency voltage value between the two input terminals is slightly greater than the high-frequency breakdown voltage of a single discharge gap, the N discharge gaps can be broken down one by one, which is easy to achieve.

[0015] In conjunction with the first aspect, in one possible implementation, the power supply device further includes a Y capacitor. The Y capacitor is connected between the two input terminals and is connected in parallel with N discharge gaps. The breakdown voltage of the Y capacitor is greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors.

[0016] Thus, during surge testing of the discharge gaps, when the voltage between the two input terminals reaches the high-frequency breakdown voltage of the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors, these N discharge gaps will break down sequentially. However, the breakdown voltage of the Y capacitor designed in this application is greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors. Even if the voltage between the two input terminals reaches the high-frequency breakdown voltage of the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors, the Y capacitor will not break down, thereby preventing damage to the Y capacitor and extending its lifespan. Moreover, compared with the scheme where the breakdown voltage of the Y capacitor is greater than the sum of the breakdown voltages of the N discharge gaps, this application does not require increasing the withstand voltage specification of the Y capacitor, which can reduce costs and facilitate selection.

[0017] In conjunction with the first aspect, in one possible implementation, the reactive element is an inductor, and the ratio of the resistance values ​​of the N resistors is equal to the ratio of the breakdown voltages of the corresponding N discharge gaps. When the frequency of the voltage between the two input terminals is less than a first preset frequency, the N discharge gaps are broken down when the amplitude of the voltage between the two input terminals reaches the sum of the low-frequency breakdown voltages of the N discharge gaps.

[0018] In this embodiment, since the inductive reactance of an inductor is positively correlated with frequency, the inductive reactance is small at lower voltage frequencies. Therefore, the voltage between the two input terminals essentially acts on these N resistors. When the amplitude of the voltage between the two input terminals reaches the sum of the low-frequency breakdown voltages of the N discharge gaps, the N discharge gaps are broken down. This application designs the ratio of the resistance values ​​of the N resistors to be equal to the ratio of the low-frequency breakdown voltages of the corresponding N discharge gaps. Therefore, the voltage across these N resistors can more accurately reflect the low-frequency breakdown voltages of the corresponding N discharge gaps, thereby improving the accuracy and reliability of the withstand voltage test of the discharge gaps.

[0019] In conjunction with the first aspect, in one possible implementation, the inductances of the N inductors are all unequal. When the frequency of the voltage between the two input terminals is greater than a second preset frequency, and the amplitude of the voltage between the two input terminals reaches a second voltage value that causes the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors to break down, the N discharge gaps break down one by one, and the breakdown order is from the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors to the discharge gap connected in parallel with the inductor with the smallest resistance among the N inductors. The second voltage value is greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors. The second preset frequency is greater than the first preset frequency.

[0020] In this embodiment, when the frequency of the voltage between the two input terminals is greater than a second preset frequency (i.e., when a high-frequency voltage is applied between the two input terminals), since the inductances of the N inductors are not equal, when the amplitude of the voltage between the two input terminals reaches the second voltage value, the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors is broken down. When the discharge gap connected in parallel with the resistor with the largest inductance is broken down, the voltage between the two input terminals acts on the discharge gap connected in parallel with the inductor with the second largest inductance, thereby breaking down the discharge gap connected in parallel with the inductor with the second largest inductance. Thus, the N discharge gaps are broken down one by one. In this way, during the surge test of the N discharge gaps, the breakdown voltage of the N series-connected discharge gaps is close to the high-frequency breakdown voltage of a single discharge gap, which is highly feasible.

[0021] In conjunction with the first aspect, in one possible implementation, the ratio of the inductance of adjacent inductors among the N inductors is greater than a second threshold.

[0022] In this embodiment, when a high-frequency voltage is applied between the two input terminals, the ratio of the inductance of adjacent inductors among the N inductors is greater than a second threshold. This second threshold can be set to a large value, which is equivalent to the inductance of each inductor among the N inductors being much greater than the inductance of adjacent inductors. As a result, the breakdown voltage of the multiple discharge gaps connected in series is closer to the high-frequency breakdown voltage of a single discharge gap. Thus, when the high-frequency voltage value between the two input terminals is slightly greater than the high-frequency breakdown voltage of a single discharge gap, the N discharge gaps can be broken down one by one, which is easy to implement.

[0023] In conjunction with the first aspect, in one possible implementation, the power supply device further includes a Y capacitor. The Y capacitor is connected between the two input terminals and is connected in parallel with N discharge gaps. The breakdown voltage of the Y capacitor is greater than the breakdown voltage of the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors.

[0024] Thus, during surge testing of the discharge gaps, the N discharge gaps will only break down when the voltage between the two input terminals reaches the high-frequency breakdown voltage of the discharge gap connected in parallel with the N inductors, which has the largest inductance among them. However, the breakdown voltage of the Y capacitor designed in this application is greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the N inductors, so even if the voltage between the two input terminals reaches the high-frequency breakdown voltage of the discharge gap connected in parallel with the N inductors, the Y capacitor will not break down, thereby preventing damage to the Y capacitor and extending its lifespan. Furthermore, compared to schemes where the breakdown voltage of the Y capacitor is greater than the sum of the breakdown voltages of the N discharge gaps, this application does not require increasing the withstand voltage of the Y capacitor, reducing costs and facilitating selection.

[0025] In conjunction with the first aspect, in one possible implementation, the power supply device further includes N voltage sensors. Each of the N discharge gaps has a voltage sensor connected in parallel, and the voltage sensors are used to detect the voltage across the corresponding discharge gap.

[0026] In this way, the voltage of the voltage sensor can detect whether the discharge gap is damaged, which is beneficial for the withstand voltage test and surge test of the discharge gap. This is because if the discharge gap is not detected, the results of the withstand voltage test or surge test will be inaccurate if the discharge gap is damaged, which will affect the protection of the power module by the discharge gap. Therefore, this application designs a voltage sensor to improve the protection of the power module by the discharge gap and enhance the reliability of the protection.

[0027] In conjunction with the first aspect, in one possible implementation, the reactive element is an X capacitor. The power supply is used to: generate a command indicating that at least one of the N discharge gaps is damaged when no voltage is input between the two input terminals and the ratio of the voltage values ​​of the N voltage sensors is not equal to the ratio of the capacitances of the corresponding N capacitors.

[0028] In this embodiment, when the reactive element is an X capacitor, under normal circumstances, the ratio of the voltage values ​​of the N voltage sensors should be equal to the ratio of the capacitances of the corresponding N capacitors. If they are not equal, it indicates that the discharge gap connected in parallel with the capacitor is damaged. Therefore, in this case, the power supply device can generate an instruction to indicate that at least one of the N discharge gaps is damaged, so as to notify maintenance personnel to repair or replace the discharge gap as soon as possible. This can prevent damage to the power module or personal injury caused by the damage of the discharge gap, thereby improving the reliability of the discharge gap's protection of the power module and protecting personal safety.

[0029] In conjunction with the first aspect, in one possible implementation, the reactive element is an inductor. The power supply is used to: generate a command indicating that at least one of the N discharge gaps is damaged when no voltage is input between the two input terminals and the ratio of the voltage values ​​of the N voltage sensors is not equal to the ratio of the resistance values ​​of the corresponding N resistors.

[0030] In this embodiment, when the reactive element is an inductor, under normal circumstances, the ratio of the voltage values ​​of the N voltage sensors should be equal to the ratio of the resistance values ​​of the corresponding N resistors. If they are not equal, it indicates that the discharge gap connected in parallel with the inductor is damaged. Therefore, in this case, the power supply device can generate an instruction to indicate that at least one of the N discharge gaps is damaged, so as to notify maintenance personnel to repair or replace the discharge gap as soon as possible. This can prevent damage to the power module or personal injury caused by the damage of the discharge gap, thereby improving the reliability of the discharge gap's protection of the power module and protecting personal safety. Attached Figure Description

[0031] Figure 1 This is a schematic diagram of the structure of a base station used in a 5G communication system.

[0032] Figures 2 to 9 A schematic diagram of a power supply device provided in an embodiment of this application. Detailed Implementation

[0033] The technical solutions in this application will now be described with reference to the accompanying drawings.

[0034] To facilitate understanding of the solutions in this application, the following is a brief introduction to the terminology used in this application.

[0035] Discharge gap: also known as a protective gap, is generally composed of two metal rods exposed to the air with a certain gap between them. One metal rod is connected to the power supply phase line or neutral line of the equipment to be protected, and the other metal rod is connected to the grounding wire. When a transient overvoltage occurs, the gap is broken down, and part of the overvoltage charge is introduced to the ground, which can prevent the voltage on the protected equipment from rising.

[0036] Withstand voltage test: This is mainly used to test the maximum withstand voltage of a circuit over a relatively long period of time. Generally, the test requires that the voltage rise not exceed 50% of the test voltage within 1 second, and that the voltage remain stable at the test voltage for a considerable period of time.

[0037] Surge testing: Circuits often experience high operational overvoltages when struck by lightning or when switching on or off inductive or large loads. These transient overvoltages (or overcurrents) are called surge voltages (or surge currents) and are a type of transient interference. Surge testing measures the maximum instantaneous voltage or current the circuit can withstand. Typically, the test requires the voltage to rise to the test voltage within microseconds (µs).

[0038] In the description of the embodiments of this application, unless otherwise stated, " / " means "or". For example, A / B can mean A or B. "And / or" in this document is merely a description of the relationship between related objects, indicating that there can be three relationships. For example, A and / or B can mean: A exists alone, A and B exist simultaneously, and B exists alone.

[0039] The prefixes such as "first" and "second" used in this application embodiment are merely for distinguishing different descriptive objects and do not limit the position, order, priority, quantity, or content of the described objects. The use of ordinal numbers and other prefixes used to distinguish descriptive objects in this application embodiment does not constitute a limitation on the described objects. The description of the described objects is given in the claims or the context of the embodiments, and should not constitute unnecessary restrictions due to the use of such prefixes. Furthermore, in the description of this embodiment, unless otherwise stated, "multiple" means two or more.

[0040] Figure 1 This is a schematic diagram of the structure of a base station 10 applied in a 5G communication system according to an embodiment of this application.

[0041] See Figure 1 The base station 10 may include a bandwidth-based unit (BBU) (not shown in the figure), a remote radio unit (RRU) 11, an active antenna unit (AAU) 12, an antenna device 13, and a power supply device 14.

[0042] The BBU can be connected to RRU11 and AAU12 via optical fiber. The BBU is the core equipment in base station 10, mainly responsible for the processing and modulation of digital signals, and transmitting the processed digital signals to RRU11 and AAU12 via optical fiber.

[0043] RRU11 can be electrically connected to antenna device 13 via feeder 16. RRU11 is mainly responsible for modulating the digital signal from BBU into a radio frequency signal and amplifying it, and then transmitting the amplified radio frequency signal to antenna device 13 via feeder 16, whereby antenna device 13 transmits the radio frequency signal. Alternatively, RRU11 can also receive radio frequency signals from antenna device 13 via feeder 16, demodulate the radio frequency signal, and then transmit it to BBU.

[0044] The RRU11 typically includes an intermediate frequency (IF) unit, a transceiver unit, a power amplifier unit, and a power supply unit. The IF unit performs modulation and demodulation, digital up / down conversion, and D / A conversion on the digital signal, converting it into an IF analog signal. The transceiver unit converts this IF analog signal into a radio frequency (RF) signal. The power amplifier unit amplifies the RF signal. The power supply unit provides power to the transceiver unit and the power amplifier unit.

[0045] AAU12 can be formed by integrating RRU11 and part of antenna equipment 13 into one unit, thus combining the structure and function of RRU11 and antenna equipment 13.

[0046] Power supply unit 14 can be connected to BBU, RRU11, and AAU12 via bus 15 to supply power to BBU, RRU11, and AAU12. Power supply unit 14 may include an alternating current-to-direct current (AC-DC) converter to convert the AC voltage value from the power grid (e.g., 220V AC mains power) into a negative DC voltage value before supplying it to BBU, RRU11, and AAU12. Alternatively, power supply unit 14 may also include a DC battery to directly provide a negative DC voltage value to BBU, RRU11, and AAU12. In addition, battery 17 can also supply power to BBU, RRU11, and AAU12 via bus 15.

[0047] The rated negative DC voltage supplied by power supply unit 14 to BBU, RRU11, and AAU12 is generally -48V, and can fluctuate within the range of -34V to -60V. Understandably, the negative DC voltage supplied by power supply unit 14 can be flexibly adjusted according to actual production and design requirements; for example, it can also provide a rated negative DC voltage of -36V or -60V, and is allowed to fluctuate within a certain range.

[0048] It should be understood that the above Figure 1 This is merely one example; in one possible instance, the battery 17 and the power supply unit 14 can be an integrated device, thereby Figure 1 It includes only the power supply unit 14, which supplies power to the BBU, RRU11 and AAU12.

[0049] In practical use, such as Figure 1 As shown, base station 10 can be a distributed base station. RRU 11, AAU 12, and antenna equipment 13 can be installed on the top of tower 20; alternatively, RRU 11, AAU 12, and antenna equipment 13 can be installed on a rooftop 30, or at other high locations such as mountains. BBU and power supply unit 14 can be installed on the top of tower 20 or in a remote equipment room 40.

[0050] It is understood that the structure of base station 10 described above is merely illustrative. Depending on the actual application scenario, base station 10 may include more or fewer communication devices than described above. For example, base station 10 may include only one of RRU11 and AAU12.

[0051] Generally, power supply ports are equipped with protective devices to meet certain EMS standards, and the power supply must also meet certain safety standards. Typically, the high-frequency operating voltage of these protective devices is not lower than their low-frequency operating voltage. To enhance the protection capability of the power module, the safety test voltage is higher than the high-frequency operating voltage, thus exceeding the low-frequency operating voltage. Safety testing (i.e., withstand voltage testing) is generally performed in low-frequency environments. To prevent protective devices (such as discharge gaps) from breaking down during withstand voltage testing, the connection between the protective device and protective ground is disconnected before the test. Common-mode protection is generally used for these devices. Since common-mode protection is connected to protective ground using protective screws, these screws are usually not installed before withstand voltage testing. However, because many ports in a circuit system use common-mode protection, installing protective screws after the withstand voltage test without installing them beforehand leads to lower production efficiency.

[0052] Based on this, this application provides a power supply device that can perform withstand voltage tests when the discharge gap is grounded, thereby improving production efficiency.

[0053] like Figure 2 As shown, a power supply device 200 provided in an embodiment of this application is provided. The power supply device 200 includes a power module 210, two input terminals HV and LV, N discharge gaps G1, G2, ..., GN, and N impedance elements. Each impedance element includes a resistor and a reactance element connected in series. The N discharge gaps are connected between the two input terminals. One of the input terminals is used for grounding. The N discharge gaps are used to introduce the instantaneous overvoltage of the power module into the protective ground. N is an integer greater than or equal to 2.

[0054] Specifically, refer to Figure 2N discharge gaps, G1, G2, ..., GN, are connected in series, and each of these N discharge gaps is connected in parallel with an impedance element, and the impedance element connected in parallel for each discharge gap is different. Specifically, the impedance element connected in parallel for discharge gap G1 includes a resistor R1 and a reactance element 1 connected in series; the impedance element connected in parallel for discharge gap G2 includes a resistor R2 and a reactance element 2 connected in series; ..., the impedance element connected in parallel for discharge gap GN includes a resistor RN and a reactance element N connected in series.

[0055] In this embodiment, during the actual withstand voltage test, a voltage with a frequency lower than a first preset frequency can be applied between the two input terminals. The amplitude of the voltage applied between the two input terminals gradually increases. When the amplitude of the voltage applied between the two input terminals is small, such as when it is less than the sum of the low-frequency breakdown voltages (i.e., the low-frequency operating voltages mentioned above) of the N discharge gaps, the N discharge gaps will not be broken down. As the amplitude of the voltage applied between the two input terminals gradually increases, the N discharge gaps will only be broken down when the amplitude of the voltage applied between the two input terminals reaches the sum of the low-frequency breakdown voltages of the N discharge gaps. Generally, the sum of the low-frequency breakdown voltages of N discharge gaps is greater than the high-frequency breakdown voltage of a single discharge gap. When the voltage between two input terminals is higher than the high-frequency breakdown voltage of a single discharge gap (i.e., the high-frequency operating voltage mentioned above) but less than the sum of the low-frequency breakdown voltages of N discharge gaps, these N discharge gaps will not be broken down. This allows the withstand voltage test of the discharge gaps to be completed while the discharge gaps are connected to the protective ground. Compared with the solution of not installing protective screws before the withstand voltage test and then installing them after the withstand voltage test, the solution provided in this application allows the protective screws to be installed before the withstand voltage test, eliminating the need to install them after the withstand voltage test, thereby improving production efficiency.

[0056] Specifically, if the power supply device is an embedded battery, the battery management system (BMS) cannot be directly disconnected from the protective ground after the battery pack is manufactured and assembled. This prevents the entire battery unit from undergoing withstand voltage testing, posing a reliability risk if the overall safety insulation fails. The embodiments of this application allow withstand voltage testing to be completed even when the protective branch (discharge gap) is connected to the protective ground. Even if the battery has insulation failure issues, this application can still perform withstand voltage testing, thereby improving the reliability of the power supply device.

[0057] Furthermore, since each discharge gap is connected in parallel with an impedance element, by selecting appropriate resistors or reactance elements, the voltage between the two input terminals during surge testing of these N discharge gaps can be mostly applied to one of the discharge gaps at the same time. Thus, the voltage between the two input terminals can be slightly greater than the high-frequency breakdown voltage of one of the discharge gaps to complete the surge test of these N discharge gaps, which is simple to implement.

[0058] It should be noted that the frequency of the voltage at the two input terminals is lower than the first preset frequency, which can be understood as the frequency of the voltage at the two input terminals being low. The first preset frequency here can be a few Hz or tens of Hz, so that when the frequency of the voltage between the two input terminals is lower than a few Hz or tens of Hz, withstand voltage tests can be performed on these N discharge gaps.

[0059] In the above embodiments, the reactive element can be a capacitor or an inductor, which will be described below with reference to the accompanying drawings.

[0060] In one embodiment, when the reactive element is an X capacitor, the ratio of the capacitances of the N X capacitors is equal to the ratio of the breakdown voltages of the corresponding N discharge gaps. In this embodiment, when the frequency of the voltage between the two input terminals is less than a first preset frequency, the N discharge gaps are broken down when the amplitude of the voltage between the two input terminals reaches the sum of the low-frequency breakdown voltages of the N discharge gaps.

[0061] Taking N=3 as an example, refer to Figure 3 It can be seen that the impedance elements connected in parallel in the discharge gap G1 include a resistor R1 and a capacitor C1 connected in series, the impedance elements connected in parallel in the discharge gap G2 include a resistor R2 and a capacitor C2 connected in series, and the impedance elements connected in parallel in the discharge gap G3 include a resistor R3 and a capacitor C3 connected in series.

[0062] In this embodiment, if the low-frequency breakdown voltages of the N discharge gaps are equal, then the capacitances of the N capacitors can be designed to be equal. This is because, according to the capacitive reactance formula X... C As can be seen from 1 / 2πfC, the lower the frequency, the larger the capacitive reactance of the capacitor. When the frequency of the voltage between the two input terminals is less than the first preset frequency, the capacitive reactance of these capacitors in the power supply device is relatively large, so the voltage between the two input terminals is basically shared by these N capacitors. At this time, when the voltage amplitude reaches the sum of the low-frequency breakdown voltages of the N discharge gaps, these N discharge gaps are broken down.

[0063] For example, with Figure 3Taking N as 3 as an example, assuming resistors R1 = 100kΩ, R2 = 10kΩ, and R3 = 1kΩ, and the first preset frequency is 12Hz, the frequency of the voltage between the two input terminals can be less than 12Hz, such as 10Hz. If the capacitance of each capacitor is 10pF, then the capacitive reactance of the capacitor is X. C =1 / 2πfC=1 / (2π*10*10*10) -9 The capacitance is 1591.5kΩ. The capacitive reactance of this capacitor is greater than the resistance of the resistor connected in series. In this case, it can be considered that the voltage between the two input terminals is basically shared by these three capacitors. If the low-frequency breakdown voltage of each discharge gap is 600V, then when the amplitude of the voltage between the two input terminals reaches 1800V, these three discharge gaps will break down.

[0064] If the low-frequency breakdown voltages of these N discharge gaps are not equal, then the capacitances of these N capacitors can be designed to be unequal. However, it should be noted that in this case, the ratio of the capacitances of the N capacitors can be designed to be equal to the ratio of the low-frequency breakdown voltages of the N discharge gaps.

[0065] For example, still using the above Figure 3 For example, assuming resistors R1 = 100kΩ, R2 = 10kΩ, and R3 = 1kΩ, and the low-frequency breakdown voltages of discharge gaps G1, G2, and G3 are 600V, 300V, and 900V respectively, then the ratio of the low-frequency breakdown voltages of these three discharge gaps is 2:1:3. Therefore, the ratio of the capacitances of these three capacitors can also be designed to be 2:1:3, such as capacitors C1 = 10pF, C2 = 5pF, and C3 = 15pF. If the first preset frequency is 12Hz, and the frequency f of the voltage between the two input terminals is less than the first preset frequency, for example, when the frequency f of the voltage between the two input terminals is 10Hz, then the capacitive reactance of capacitor C1 is X. C1 =1 / 2πfC=1 / (2π*10*10*10) -9 ) = 1591.5kΩ, and the capacitive reactance of capacitor C2 is X. C2 =1 / 2πfC=1 / (2π*10*5*10) -9 The capacitance is 3183.1 kΩ, and the capacitive reactance of capacitor C3 is X. C3 =1 / 2πfC=1 / (2π*10*15*10) -9The capacitance of each of the three capacitors is 1061.0 kΩ, and their capacitive reactance is several thousand kΩ. Since the capacitive reactance of each capacitor is greater than the resistance of the resistor connected in series, the voltage between the two input terminals can be considered to be primarily shared by these three capacitors. If the low-frequency breakdown voltages of the three discharge gaps G1, G2, and G3 are 600V, 300V, and 900V respectively, then when the voltage amplitude between the two input terminals reaches 1800V, these three discharge gaps will break down. Furthermore, in this embodiment, the ratio of the capacitance of the three X capacitors is designed to be equal to the ratio of the low-frequency breakdown voltage of the corresponding three discharge gaps. Therefore, the ratio of the capacitances of the three X capacitors is 2:1:3, and the voltage of these three X capacitors can more accurately reflect the low-frequency breakdown voltage of the corresponding three discharge gaps, thereby improving the accuracy and reliability of the withstand voltage test of the discharge gaps.

[0066] In one embodiment, the resistance values ​​of the N resistors are all unequal. When the frequency of the voltage between the two input terminals is greater than a second preset frequency, and the amplitude of the voltage between the two input terminals reaches a first voltage value that causes the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors to break down, the N discharge gaps are broken down one by one, and the order of breakdown is from the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors to the discharge gap connected in parallel with the resistor with the smallest resistance among the N resistors. The first voltage value is greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors. The second preset frequency is greater than the first preset frequency.

[0067] In this embodiment, when the frequency of the voltage at the two input terminals is greater than the second preset frequency, it can be understood as the voltage frequency at the two input terminals being at a high frequency. The second preset frequency here can be thousands of Hz, thus allowing surge testing of these N discharge gaps when the frequency of the voltage between the two input terminals is greater than several thousand Hz.

[0068] Specifically, during the actual test, the amplitude of the voltage applied between the two input terminals gradually increases. When the amplitude of the voltage between the two input terminals is small, it is insufficient to break down the N discharge gaps, and therefore, the N discharge gaps will not be broken down. As the amplitude of the voltage applied between the two input terminals gradually increases, when the amplitude of the voltage applied between the two input terminals becomes larger, such as when the amplitude of the voltage between the two input terminals reaches a first voltage value, since the first voltage value is greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors, the discharge gap connected in parallel with the largest resistance is broken down, and then the remaining discharge gaps are broken down one by one.

[0069] For example, continue to refer to Figure 3Assuming resistors R1 = 100kΩ, R2 = 10kΩ, R3 = 1kΩ, and all capacitors have a capacitance of 10pF, if the second preset frequency is 50kHz, then the reactance of the capacitors is X. C =1 / 2πfC=1 / (2π*50*10) 3 *10*10 -9 =63.7Ω. This reactance is almost negligible compared to the resistance. Therefore, in this case, the magnitude of the voltage between the two input terminals is borne by these three resistors. Under normal circumstances, the voltage amplitude between the two input terminals starts from 0 and rises. As the voltage amplitude gradually increases, when the voltage amplitude between the two input terminals reaches the first voltage value V1, since the resistance of resistor R1 is greater than that of resistor R2, and the resistance of resistor R2 is greater than that of resistor R3, V1 mostly acts on resistor R1, and the discharge gap G1 is broken down and conducts. When the discharge gap G1 is broken down and conducts, it is equivalent to resistor R1 being short-circuited. At this time, V1 is redistributed, and since the resistance of resistor R2 is greater than that of resistor R3, V1 mostly acts on resistor R2, and the discharge gap G2 is broken down and conducts. When the discharge gap G1 is broken down and conducts, it is equivalent to resistor R2 being short-circuited. At this time, V1 is redistributed, and V1 mostly acts on resistor R3, and the discharge gap G3 is broken down. Thus, when the frequency of the voltage between the two input terminals is greater than the second preset frequency, as the voltage amplitude increases, these three discharge gaps are broken down one by one. Therefore, it can be seen that during the surge test of these three discharge gaps, the breakdown voltage of the multiple discharge gaps connected in series is close to the high-frequency breakdown voltage of a single discharge gap. Thus, the voltage between the two input terminals does not need to be increased to be greater than the sum of the high-frequency breakdown voltages of the multiple discharge gaps to complete the surge test of N discharge gaps, which is easy to implement and can improve the feasibility of surge testing.

[0070] In one embodiment, the ratio of the resistance values ​​of adjacent resistors among the N resistors is greater than or equal to a first threshold.

[0071] In this embodiment, the first threshold can be set relatively large, such as 10 or even larger. When the amplitude of the voltage applied between the two input terminals reaches the first voltage value V1, since the resistance of resistor R1 is much larger than that of resistor R2, most of V1 acts on resistor R1, and the discharge gap G1 is broken down and turned on. The subsequent process is similar to the above and will not be repeated. The advantage of this design is that the breakdown voltage of multiple discharge gaps connected in series is closer to the high-frequency breakdown voltage of a single discharge gap. Thus, when the high-frequency voltage value between the two input terminals is slightly greater than the high-frequency breakdown voltage of a single discharge gap, N discharge gaps can be broken down one by one, which is easy to implement.

[0072] It should be understood that the larger the first threshold, the closer the first voltage value is to the high-frequency breakdown voltage of the discharge gap formed by the parallel connection of the resistor with the largest resistance among the N resistors. This is because the larger the first threshold, the greater the voltage between the two input terminals acts on the resistor with the largest resistance among the N resistors, and the smaller the voltage acts on the other resistors. Consequently, the difference between the first voltage value and the high-frequency breakdown voltage of the discharge gap formed by the parallel connection of the resistor with the largest resistance among the N resistors is smaller.

[0073] In one embodiment, such as Figure 4 As shown, the power supply device also includes a Y capacitor C0. The Y capacitor C0 is connected between the two input terminals, and the Y capacitor C0 is connected in parallel with N discharge gaps. The breakdown voltage of the Y capacitor C0 is greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the resistor with the largest resistance value among the N resistors.

[0074] As described above, when the frequency of the voltage between the two input terminals is greater than the second preset frequency, the capacitive reactance of the capacitor is almost negligible compared to the resistance value of the resistor. Therefore, in this case, the amplitude of the voltage between the two input terminals is essentially borne by these three resistors. Since the resistance value of resistor R1 is greater than that of resistor R2, and the resistance value of resistor R2 is greater than that of resistor R3, the discharge gaps G1, G2, and G3 are broken down sequentially. It can be seen that during the surge test of the discharge gap, the voltage between the two input terminals mostly acts on the resistor with the largest resistance value among the parallel resistors of the unbroken discharge gap at the same time. Therefore, this application only needs to design the breakdown voltage of the Y capacitor C0 to be greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the resistor with the largest resistance value among the N resistors. There is no need to increase the withstand voltage specification of the Y capacitor, which can reduce costs and facilitate selection.

[0075] Furthermore, since the breakdown voltage of Y capacitor C0 is greater than the high-frequency breakdown voltage of the discharge gap formed by the parallel connection of the resistor with the largest resistance among the N resistors, the voltage between the two input terminals acts on resistor R1. Even if the discharge gap G1 is broken down, Y capacitor C0 will not be broken down, which can prevent damage to the Y capacitor and extend its lifespan.

[0076] The following text combines Figure 5 Explain the case where the reactive element is an inductor.

[0077] In one embodiment, when the reactive element is an inductor, the ratio of the resistance values ​​of the N resistors is equal to the ratio of the breakdown voltages of the corresponding N discharge gaps. In this embodiment, when the frequency of the voltage between the two input terminals is less than a first preset frequency, the N discharge gaps are broken down when the amplitude of the voltage between the two input terminals reaches the sum of the low-frequency breakdown voltages of the N discharge gaps.

[0078] Taking N=3 as an example, refer to Figure 5It can be seen that the impedance elements connected in parallel in the discharge gap G1 include a resistor R1 and an inductor L1 connected in series, the impedance elements connected in parallel in the discharge gap G2 include a resistor R2 and an inductor L2 connected in series, and the impedance elements connected in parallel in the discharge gap G3 include a resistor R3 and an inductor L3 connected in series.

[0079] In this embodiment, if the low-frequency breakdown voltages of these N discharge gaps are equal, then the resistance values ​​of the N resistors can be designed to be equal. This is because, according to the inductive reactance formula X... L As can be seen from 2πfL, the lower the frequency, the lower the inductive reactance of the inductor. Since the frequency of the voltage between the two input terminals is lower than the first preset frequency, the inductive reactance of these inductors in the power supply device is relatively small. Therefore, the voltage between the two input terminals is basically borne by these N resistors. At this time, when the amplitude of the voltage between the two input terminals reaches the sum of the low-frequency breakdown voltages of the N discharge gaps, the N discharge gaps are broken down.

[0080] For example, with Figure 5 Taking N as 3 as an example, assuming the resistance of each resistor is 100kΩ, the first preset frequency is 12Hz, and the frequency of the voltage between the two input terminals can be less than 12Hz, such as 10Hz, and if the inductance of each inductor is 10mH, then the inductive reactance of the inductor is X. L =2πfL=2π*10*10*10 -3 =0.628Ω. This inductive reactance is less than the resistance of the resistor connected in series. In this case, the voltage between the two input terminals can be considered to be basically shared by these three resistors. If the low-frequency breakdown voltage of each discharge gap is 600V, then when the voltage amplitude reaches 1800V, these three discharge gaps will break down.

[0081] If the low-frequency breakdown voltages of these N discharge gaps are not equal, then the resistance values ​​of the N resistors can be designed to be unequal. However, it should be noted that in this case, the ratio of the resistance values ​​of the N resistors can be designed to be equal to the ratio of the low-frequency breakdown voltages of the corresponding N discharge gaps.

[0082] For example, still using the above Figure 5 For example, the low-frequency breakdown voltage of discharge gap G1 is 300V, the low-frequency breakdown voltage of discharge gap G2 is 600V, and the low-frequency breakdown voltage of the discharge gap is 900V. Therefore, the low-frequency breakdown voltages of these three discharge gaps are in a ratio of 1:2:3. Resistors R1 = 10kΩ, R2 = 20kΩ, and R3 = 30kΩ can be designed, resulting in a resistance ratio of 1:2:3. Assuming the inductance of inductors L is 10mH and the first preset frequency is 12Hz, and the frequency f of the voltage between the two input terminals is less than the first preset frequency (e.g., when the frequency f is 10Hz), then the inductive reactance of the inductor is X. L =2πfL=2π*10*10*10 -3=0.628kΩ. The inductive reactance of these three inductors is less than 1kΩ, and the inductive reactance of these three inductors is much smaller than the resistance value of the resistors connected in series. At this time, it can be considered that the voltage between the two input terminals is basically shared by these three resistors. If the breakdown voltages of these three discharge gaps G1, G2, and G3 are 300V, 600V, and 900V respectively, then when the amplitude of the voltage between the two input terminals reaches 1800V, these three discharge gaps will break down. Furthermore, in this embodiment, the ratio of the resistance values ​​of the three resistors is designed to be equal to the ratio of the low-frequency breakdown voltages of the corresponding three discharge gaps. Therefore, the ratio of the resistance values ​​of these three resistors is also 1:2:3. Thus, the voltage of these three resistors can more accurately reflect the low-frequency breakdown voltage of the corresponding three discharge gaps, thereby improving the accuracy and reliability of the withstand voltage test of the discharge gaps.

[0083] In one embodiment, the inductances of the N inductors are all unequal. When the frequency of the voltage between the two input terminals is greater than a second preset frequency, and the amplitude of the voltage between the two input terminals reaches a second voltage value that causes the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors to break down, the N discharge gaps break down one by one, and the breakdown order is from the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors to the discharge gap connected in parallel with the inductor with the smallest resistance among the N inductors. The second voltage value is greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors. The second preset frequency is greater than the first preset frequency.

[0084] In this embodiment, when the frequency of the voltage at the two input terminals is greater than the second preset frequency, it can be understood as the voltage frequency at the two input terminals being at a high frequency. The second preset frequency here can be thousands of Hz, thus allowing surge testing of these N discharge gaps when the frequency of the voltage between the two input terminals is greater than several thousand Hz.

[0085] Specifically, during the actual test, the amplitude of the voltage applied between the two input terminals gradually increases. When the amplitude of the voltage between the two input terminals is small, it is insufficient to break down the N discharge gaps, and therefore, the N discharge gaps will not be broken down. As the amplitude of the voltage applied between the two input terminals gradually increases, when the amplitude of the voltage applied between the two input terminals becomes larger, such as when the amplitude of the voltage between the two input terminals reaches a second voltage value, since the second voltage value is greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors, the discharge gap connected in parallel with the inductor with the largest inductance is broken down, and then the remaining discharge gaps are broken down one by one.

[0086] For example, refer to Figure 5Assuming inductors L1 = 1000mH, L2 = 100mH, L3 = 10mH, and all resistors are 10Ω, if the second preset frequency is 10kHz, then the inductive reactance of inductor L1 is X. L1 =2πfL=2π*10*10 3 *1000*10 -3 = 62831.8Ω, the inductive reactance of inductor L2 is X L2 =2πfL=2π*10*10 3 *100*10 -3 = 6283.18Ω, the inductive reactance of inductor L3 is X L3 =2πfL=2π*10*10 3 *10*10 -3 =628.3Ω. The inductive reactance of these three inductors is several hundred Ω or thousands of Ω. Compared with the inductive reactance of these three inductors, the resistance of the resistor is almost negligible. Therefore, in this case, the amplitude of the voltage between the two input terminals is equivalent to being borne by these three inductors. Under normal circumstances, the voltage amplitude between the two input terminals starts from 0 and rises. As the voltage amplitude gradually increases, when the voltage amplitude between the two input terminals reaches the second voltage value V2, since the inductive reactance of inductor L1 is greater than the resistance of inductor L2, and the inductive reactance of inductor L2 is greater than that of inductor L3, V2 mostly acts on inductor L1, and discharge gap G1 breaks down and conducts. When discharge gap G1 breaks down and conducts, it is equivalent to inductor L1 being short-circuited. At this time, V2 is redistributed. Since the inductive reactance of inductor L2 is greater than that of inductor L3, V2 mostly acts on inductor L2, and discharge gap G2 breaks down and conducts. When discharge gap G2 breaks down and conducts, it is equivalent to inductor L2 being short-circuited. At this time, V2 is redistributed, and V2 mostly acts on inductor L3, and discharge gap G3 breaks down. Thus, when the frequency of the voltage between the two input terminals is greater than the second preset frequency, as the voltage amplitude increases, these three discharge gaps are broken down one by one. Therefore, it can be seen that during the surge test of these three discharge gaps, the breakdown voltage of the multiple discharge gaps connected in series is close to the high-frequency breakdown voltage of a single discharge gap. Compared with the current surge test scheme where the breakdown voltage of the multiple discharge gaps connected in series needs to reach the sum of the high-frequency breakdown voltages of these multiple discharge gaps, the scheme of this application has higher feasibility.

[0087] In one embodiment, the ratio of the inductance of adjacent inductors among the N inductors is greater than a second threshold.

[0088] In this embodiment, the second threshold can be set relatively large, such as 10 or even larger. When the amplitude of the voltage applied between the two input terminals reaches the first voltage value V1, since the inductive reactance of inductor L1 is much greater than the resistance of inductor L2, most of V2 acts on inductor L1, and the discharge gap G1 is broken down and conducts. The subsequent process is similar to the above and will not be repeated. The advantage of this design is that the breakdown voltage of multiple discharge gaps connected in series is closer to the high-frequency breakdown voltage of a single discharge gap. Thus, when the high-frequency voltage value between the two input terminals is slightly greater than the high-frequency breakdown voltage of a single discharge gap, N discharge gaps can be broken down one by one, which is easy to implement.

[0089] Similarly, the larger the second threshold, the closer the second voltage value is to the high-frequency breakdown voltage of the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors. The specific reasons are similar to those described above and will not be repeated here.

[0090] In one embodiment, such as Figure 6 As shown, the power supply device also includes a Y capacitor. The Y capacitor is connected between the two input terminals and is connected in parallel with N discharge gaps. The breakdown voltage of the Y capacitor C0 is greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors.

[0091] As described above, when the frequency of the voltage between the two input terminals is greater than the second preset frequency, the inductive reactance of the inductor is negligible compared to the resistance of the resistor. Therefore, in this case, the amplitude of the voltage between the two input terminals is essentially borne by these three inductors. Since the inductive reactance of inductor L1 is greater than the resistance of inductor L2, and the inductive reactance of inductor L2 is greater than that of inductor L3, the discharge gaps G1, G2, and G3 are broken down sequentially. It can be seen that during the surge test of the discharge gap, the voltage between the two input terminals acts primarily on the inductor with the largest inductive reactance among the inductors connected in parallel with the unbroken discharge gap at the same time. Therefore, this application only needs to design the breakdown voltage of the Y capacitor C0 to be greater than the breakdown voltage of the high-frequency discharge gap connected in parallel with the inductor with the largest inductance among the N inductors. There is no need to increase the withstand voltage of the Y capacitor, which can reduce costs and facilitate selection.

[0092] Furthermore, since the breakdown voltage of Y capacitor C0 only needs to be greater than the high-frequency breakdown voltage of the discharge gap of the inductor with the largest inductance among the N inductors connected in parallel, the voltage between the two input terminals acts on the inductor L1. Even if the discharge gap G1 is broken down, Y capacitor C0 will not be broken down, which can prevent damage to the Y capacitor and extend its life.

[0093] In one embodiment, such as Figure 7As shown, the power supply device also includes N voltage sensors. Each of the N discharge gaps has a voltage sensor connected in parallel, and these voltage sensors are used to detect the voltage across the corresponding discharge gap.

[0094] refer to Figure 7 A voltage sensor V1 is connected in parallel to discharge gap G1, a voltage sensor V2 is connected in parallel to discharge gap G2, ..., a voltage sensor VN is connected in parallel to discharge gap GN. The voltage sensors can detect the voltage across the discharge gaps. Based on the voltage readings, it is possible to detect whether the discharge gap is damaged, which is beneficial for withstand voltage and surge testing of the discharge gap. This is because if the discharge gap is not detected, subsequent withstand voltage or surge tests will be inaccurate if the discharge gap is damaged, thus affecting the protection of the power module by the discharge gap. Therefore, this application designs voltage sensors to improve the reliability of the discharge gap's protection of the power module.

[0095] In one embodiment, the reactive element is an X capacitor. The power supply is configured to: generate a command indicating that at least one of the N discharge gaps is damaged when no voltage is input between the two input terminals and the ratio of the voltage values ​​of the N voltage sensors is not equal to the ratio of the capacitances of the corresponding N capacitors.

[0096] In the embodiments of this application, Figure 8 For example, the power supply device includes three voltage sensors, wherein voltage sensor V1 is connected in parallel with discharge gap G1, voltage sensor V2 is connected in parallel with discharge gap G2, and voltage sensor V3 is connected in parallel with discharge gap G3.

[0097] When no voltage is input between the two input terminals, i.e., no withstand voltage or surge test is performed on the discharge gaps, the damage status of the three discharge gaps can be determined based on the voltage values ​​of the voltage sensors. Specifically, assuming the capacitance C1:C2:C3 = 1:1:1, if the voltage values ​​of voltage sensors V1, V2, and V3 are all 100V, then the ratio of these three voltage sensors is also 1:1:1, indicating that none of the three discharge gaps are damaged, and the power supply unit does not need to generate a command. If the voltage values ​​of voltage sensors V1 and V2 are both 100V, but the voltage value of voltage sensor V3 is 50V, then the voltage values ​​of these three voltage sensors are 2:2:1. The ratio of the voltage values ​​of these three voltage sensors is not equal to the ratio of the capacitances of the corresponding three capacitors, indicating that at least one of the three discharge gaps is damaged. Therefore, the power supply device can generate an instruction to indicate that at least one of the three discharge gaps is damaged, so as to notify maintenance personnel to repair or replace the discharge gap as soon as possible, in order to prevent damage to the power module or personal injury caused by the damage to the discharge gap. This can improve the reliability of the discharge gap's protection of the power module and protect personal safety.

[0098] In one embodiment, the reactive element is an inductor. The power supply device is configured to: generate a command indicating that at least one of the N discharge gaps is damaged when no voltage is input between the two input terminals and the ratio of the voltage values ​​of the N voltage sensors is not equal to the ratio of the resistance values ​​of the corresponding N resistors.

[0099] In the embodiments of this application, Figure 9 For example, the power supply device includes three voltage sensors, wherein voltage sensor V1 is connected in parallel with discharge gap G1, voltage sensor V2 is connected in parallel with discharge gap G2, and voltage sensor V3 is connected in parallel with discharge gap G3.

[0100] When no voltage is input between the two input terminals, i.e., no withstand voltage or surge test is performed on the discharge gaps, the damage status of the three discharge gaps can be determined based on the voltage values ​​of the voltage sensors. Specifically, assuming resistors R1:R2:R3 = 1:1:1, if the voltage values ​​of voltage sensors V1, V2, and V3 are all 100V, then the ratio of these three voltage sensors is also 1:1:1, indicating that none of the three discharge gaps are damaged, and the power supply unit does not need to generate a command. If the voltage values ​​of voltage sensors V1 and V2 are both 100V, but the voltage value of voltage sensor V3 is 50V, then the voltage values ​​of these three voltage sensors are 2:2:1. The ratio of the voltage values ​​of these three voltage sensors is not equal to the ratio of the resistance values ​​of the corresponding three resistors, indicating that at least one of the three discharge gaps is damaged. Therefore, the power supply device can generate an instruction to indicate that at least one of the three discharge gaps is damaged, so as to notify maintenance personnel to repair or replace the discharge gap as soon as possible, in order to prevent damage to the power module or personal injury caused by the damage to the discharge gap. This can improve the reliability of the discharge gap's protection of the power module and protect personal safety.

[0101] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A power supply device, characterized in that, The power supply device includes a power module, two input terminals, N discharge gaps, and N impedance elements. Each impedance element includes a resistor and a reactance element connected in series. The N discharge gaps are connected between the two input terminals, one of which is used to connect to protective ground. N is an integer greater than or equal to 2. The N discharge gaps are connected in series, and each of the N discharge gaps is connected in parallel with one of the impedance elements.

2. The power supply device according to claim 1, characterized in that, The reactive element is an X capacitor, and the ratio of the capacitances of the N X capacitors is equal to the ratio of the breakdown voltages of the corresponding N discharge gaps. When the frequency of the voltage between the two input terminals is less than the first preset frequency, the N discharge gaps are broken down when the amplitude of the voltage between the two input terminals reaches the sum of the low-frequency breakdown voltages of the N discharge gaps.

3. The power supply device according to claim 2, characterized in that, The resistance values ​​of the N resistors are all different; When the frequency of the voltage between the two input terminals is greater than the second preset frequency, and the amplitude of the voltage between the two input terminals reaches a first voltage value that causes the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors to break down, the N discharge gaps are broken down one by one, and the order of breakdown is from the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors to the discharge gap connected in parallel with the resistor with the smallest resistance among the N resistors. The first voltage value is greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the resistor with the largest resistance among the N resistors. The second preset frequency is greater than the first preset frequency.

4. The power supply device according to claim 3, characterized in that, The ratio of the resistance values ​​of adjacent resistors among the N resistors is greater than or equal to a first threshold.

5. The power supply device according to any one of claims 2 to 4, characterized in that, The power supply device also includes a Y capacitor; The Y capacitor is connected between the two input terminals, and the Y capacitor is connected in parallel with the N discharge gaps. The breakdown voltage of the Y capacitor is greater than the breakdown voltage of the discharge gap connected in parallel with the resistor with the largest resistance value among the N resistors.

6. The power supply device according to claim 1, characterized in that, The reactive element is an inductor, and the ratio of the resistance values ​​of the N resistors is equal to the ratio of the breakdown voltages of the corresponding N discharge gaps; When the frequency of the voltage between the two input terminals is less than the first preset frequency, the N discharge gaps are broken down when the amplitude of the voltage between the two input terminals reaches the sum of the low-frequency breakdown voltages of the N discharge gaps.

7. The power supply device according to claim 6, characterized in that, The inductance of each of the N inductors is not equal; When the frequency of the voltage between the two input terminals is greater than the second preset frequency, and the amplitude of the voltage between the two input terminals reaches the second voltage value, causing the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors to be broken down, the N discharge gaps are broken down one by one, and the order of breakdown is from the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors to the discharge gap connected in parallel with the inductor with the smallest inductance resistance among the N inductors. The second voltage value is greater than the high-frequency breakdown voltage of the discharge gap connected in parallel with the inductor with the largest inductance among the N inductors. The second preset frequency is greater than the first preset frequency.

8. The power supply device according to claim 7, characterized in that, The ratio of the inductance of adjacent inductors among the N inductors is greater than or equal to the second threshold.

9. The power supply device according to any one of claims 6 to 8, characterized in that, The power supply device also includes a Y capacitor; The Y capacitor is connected between the two input terminals, and the Y capacitor is connected in parallel with the N discharge gaps. The breakdown voltage of the Y capacitor is greater than the breakdown voltage of the discharge gap connected in parallel with the N inductors, which has the largest inductance among them.

10. The power supply device according to any one of claims 1 to 4 or 6 to 8, characterized in that, The power supply device also includes N voltage sensors; Each of the N discharge gaps is connected in parallel with a voltage sensor, which is used to detect the voltage value across the corresponding discharge gap.

11. The power supply device according to claim 10, characterized in that, The reactive element is an X capacitor; The power supply device is used for: When no voltage is input between the two input terminals, and the ratio of the voltage values ​​of the N voltage sensors is not equal to the ratio of the capacitances of the corresponding N X capacitors, an instruction is generated to indicate that at least one of the N discharge gaps is damaged.

12. The power supply device according to claim 10, characterized in that, The reactive element is an inductor; The power supply device is used for: When no voltage is input between the two input terminals, and the ratio of the voltage values ​​of the N voltage sensors is not equal to the ratio of the resistance values ​​of the corresponding N resistors, a command is generated to indicate that at least one of the N discharge gaps is damaged.

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