A functional plate deformation stress detection system

Abstract

This utility model discloses a functional board deformation stress detection system, relating to the field of functional board testing. It includes a cylinder, a pressure detection module, and a deformation stress detection module. The functional board to be tested is placed above the pressure detection module, and the cylinder is located directly above the pressure detection module. The deformation stress detection module connects the pressure detection module and the cylinder. After detecting the pressure, the pressure detection module outputs a high-level signal to the deformation stress detection module. The deformation stress detection module includes a time control circuit and a deformation detection circuit. The time control circuit consists of a frequency divider circuit and a timing circuit, which can generate a periodic square wave and achieve precise timing. The deformation detection circuit uses components such as a PMOS transistor, comparator, and latching diode to convert the time difference into a voltage difference, combined with an LED to indicate the detection result. This utility model detects deformation by converting the time difference into a voltage, achieving precise deformation detection. The preset time can be manually adjusted via external buttons to meet different needs.

Description

Technical Field

[0001] This utility model relates to the field of functional board testing, and in particular to a functional board deformation stress testing system. Background Technology

[0002] Functional boards are core components of electronic devices, widely used in smartphones, computers, smart home devices, industrial control instruments, and other fields. In smartphone motherboards, functional boards house electronic components such as chips, capacitors, and resistors, enabling key functions such as signal transmission and power management. In industrial control instruments, functional boards serve as the carriers of circuit connections and signal processing, directly affecting the operational stability and control accuracy of the equipment. Their structural integrity and deformation stress state are crucial to the performance and lifespan of electronic devices.

[0003] Traditional deformation stress detection methods for functional boards lack precision, failing to accurately capture deformations caused by minute stresses. However, functional boards are used in environments with high integration and thin, lightweight materials, where minute deformations can lead to poor circuit contact or signal distortion. Furthermore, different models of electronic functional boards vary greatly in material, size, and stress threshold, and existing systems mostly use fixed parameters, making it difficult to adapt to diverse needs by flexibly adjusting detection conditions. Utility Model Content

[0004] The technical problem to be solved by this utility model is to provide a more accurate and practical functional plate deformation stress detection system.

[0005] To solve the above-mentioned technical problems, the technical solution adopted by this utility model is as follows:

[0006] A functional board deformation stress detection system, the key features of which include a cylinder, a pressure detection module, and a deformation stress detection module; the functional board to be tested is placed on the pressure detection module, and the cylinder is positioned directly above the pressure detection module; the deformation stress detection module is connected to the pressure detection module; the pressure detection module outputs a high-level signal to the deformation stress detection module after detecting the pressure; the deformation stress detection module is connected to and controls the cylinder.

[0007] Preferably, the deformation stress detection module includes a time control circuit and a deformation detection circuit;

[0008] The deformation detection circuit includes PMOS transistors Q1 and Q2, switch K1, comparators U2 and U5, and latching diode Q4. Port 1 of K1 is connected to the power supply, and port 2 is connected to the cylinder and the source of Q2, respectively. The drain of Q2 is connected to the gate of Q1. The gate of Q2 is connected to the pressure detection module. The source of Q1 is connected to the power supply. The drain of Q1 is connected to the inverting comparator of U2 through resistor R1. The output of U2 is connected to the inverting comparator of U2 through capacitor C1. The positive comparator of U2 is grounded. The output of U2 is connected to the positive comparator of U5 through an inverter. The inverting comparator of U5 is connected to an adjustable threshold voltage. The output of U5 is connected to the control pin of Q4. The positive terminal of Q4 is connected to the power supply through a switch, and the negative terminal is connected to the positive terminal of LED1, with the negative terminal of LED1 grounded.

[0009] Preferably, the time control circuit includes a frequency divider circuit and a timing circuit;

[0010] The frequency divider circuit includes transistor Q5, crystal oscillator X1, and counting chips U1 and U4.

[0011] The base of Q5 is connected to port 2 of K1, the collector is connected to the power supply, and the emitter is connected to the VCC pin of crystal oscillator X1; X1 is a 1MHz crystal oscillator; the output of X1 is connected to the first 5-division input of U1; the first QD output of U1 is connected to the second 5-division input of U1; the second QA output of U1 is connected to the first 5-division input of U4; the first QA output of U4 is connected to the second 5-division input of U4; the second QA output of U4 is connected to the timing circuit through inverter U6;

[0012] The timing circuit includes a counter chip U3; the CLK pin of U3 is connected to the output terminal of U6; the A, B, C and D pins of U3 are respectively connected to the power supply through independent switches; the RCO pin of U4 is connected to the control pin of the latching diode Q3; the LOAD pin of U3 is connected to the power supply through switch K6; the positive terminal of Q3 is connected to the power supply through a switch, and the negative terminal is connected to the gate of Q1.

[0013] Preferably, the reset pins of U1 and U4 are connected to the power supply via the reset button K7; the reset pin of U3 is connected to port 2 of K1.

[0014] U1 and U4 use 74930 counter chips; U3 uses 74LS161DC counter chips.

[0015] The beneficial effects of adopting the above technical solution are as follows:

[0016] This invention converts time difference into voltage through a deformation stress detection module, enabling the quantitative detection of minute deformations of functional boards and achieving high-precision detection. It also supports manual adjustment of threshold and preset time to adapt to different detection needs, combining practicality and suitability for rapid deformation stress detection scenarios of various functional boards. Attached Figure Description

[0017] The present invention will now be described in further detail with reference to the accompanying drawings and specific embodiments.

[0018] Figure 1 This is a schematic diagram of the structure of a functional plate deformation stress detection system proposed in this utility model;

[0019] Figure 2 This is a circuit diagram of the deformation stress detection module proposed in this utility model. Detailed Implementation

[0020] The technical solutions of this utility model will be clearly and completely described below with reference to the embodiments of this utility model. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this utility model.

[0021] A functional plate deformation stress detection system, such as Figure 1 It includes a cylinder, a pressure detection module, and a deformation stress detection module; the function board to be tested is placed on the pressure detection module, and the cylinder is positioned directly above the pressure detection module; the deformation stress detection module is connected to the pressure detection module; after detecting the pressure, the pressure detection module outputs a high-level signal to the deformation stress detection module; the deformation stress detection module is connected to and controls the cylinder.

[0022] For the deformation stress test of the functional board, considering the small degree of deformation of the functional board, this utility model adopts a pressure test method. The degree of bending deformation of the functional board is obtained by comparing the time from the stroke of the cylinder to the pressure detection module under the functional board receiving the pressure with a preset time. The preset time is determined by the ratio of the cylinder running speed and the cylinder stroke minus the thickness of the functional board.

[0023] like Figure 2 The deformation stress detection module includes a time control circuit and a deformation detection circuit;

[0024] The time control circuit includes a frequency divider circuit and a timing circuit; the frequency divider circuit includes a transistor Q5, a crystal oscillator X1, and counting chips U1 and U4.

[0025] The base of Q5 is connected to port 2 of K1, the collector is connected to the power supply, and the emitter is connected to the VCC pin of crystal oscillator X1; X1 is a 1MHz crystal oscillator; the output of X1 is connected to the first 5-division input of U1; the first QD output of U1 is connected to the second 5-division input of U1; the second QA output of U1 is connected to the first 5-division input of U4; the first QA output of U4 is connected to the second 5-division input of U4; the second QA output of U4 is connected to the timing circuit through inverter U6;

[0026] The square wave generated by the 1MHz crystal oscillator is processed by two frequency divider and counter chips to obtain a square wave with a duty cycle of 0.5 and a period of 2ms output from U6. Square waves with different periods can also be obtained by combining different crystal oscillator frequencies and counters to control the error range and control accuracy of the system.

[0027] The timing circuit includes a counter chip U3; the CLK pin of U3 is connected to the output of U6; the A, B, C, and D pins of U3 are connected to the power supply through independent switches; the RCO pin of U4 is connected to the control pin of the latching diode Q3; the LOAD pin of U3 is connected to the power supply through switch K6; the positive terminal of Q3 is connected to the power supply, and the negative terminal is connected to the gate of Q1; the timing circuit sets the time by inputting a square wave from a frequency divider circuit. When the number of cycles of the input square wave reaches the carry value, the RCO pin outputs a positive pulse, turning on Q3, and keeping Q1 in the off state through the latch of Q3.

[0028] In the timing circuit, the use of the preset position can be controlled via K6, and the preset position can be manually adjusted at any time via buttons K2, 3, 4, and 5. Furthermore, U3 provides a cascading function, allowing for the expansion of the selection of time dimensions through cascading.

[0029] The deformation detection circuit includes PMOS transistors Q1 and Q2, switch K1, comparators U2 and U5, and latching diode Q4. Port 1 of K1 is connected to the power supply, and port 2 is connected to the cylinder and the source of Q2, respectively. The drain of Q2 is connected to the gate of Q1. The gate of Q2 is connected to the pressure detection module. The source of Q1 is connected to the power supply. The drain of Q1 is connected to the inverting comparator of U2 through resistor R1. The output of U2 is connected to the inverting comparator of U2 through capacitor C1. The non-inverting comparator of U2 is grounded. The output of U2 is connected to the non-inverting comparator of U5 through an inverter. The inverting comparator of U5 is connected to an adjustable threshold voltage. The output of U5 is connected to the control pin of Q4. The positive terminal of Q4 is connected to the power supply, and the negative terminal is connected to the positive terminal of LED1. The negative terminal of LED1 is grounded.

[0030] The deformation detection circuit controls the working state of the cylinder and the time control circuit through switch K1. When K1 is closed, the cylinder starts working, and the time control circuit starts working at the same time. When there is deformation on the functional board, the pressure detection module sends a high-level signal for a shorter time than the preset time, and the cylinder starts working. When the pressure detection module does not send a signal, Q2 is turned on and Q1 is turned off. Then, the pressure detection module sends a high level, Q2 is turned off, Q3 is not turned on, and Q1 is turned on. The integrating circuit built by U2 performs integration. Further, when the preset time is reached, Q3 is turned on and Q1 is turned off. The integrating circuit integrates the voltage within this time difference and compares it with the threshold voltage. When the threshold is exceeded, Q4 is turned on, and LED1 is constantly lit to alert the operator.

[0031] U1 and U4 use 74930 counter chips; U3 uses 74LS161DC counter chips. The reset pins of U1 and U4 are connected to the power supply via reset button K7; the reset pin of U3 is connected to port 2 of K1.

[0032] The reset operation is performed manually by pressing the buttons for K7 and the latching diode. In actual use, the reset buttons can be standardized.

[0033] This invention converts the thickness change of a deformable functional board into a time difference for the pressure detection module to receive the signal. The time difference is then converted into a voltage difference through circuit detection and is adjustable externally via buttons, increasing the system's usability. Furthermore, the timing is controlled at the millisecond level, ensuring accuracy even for minute deformations of the functional board.

[0034] The above are merely preferred embodiments of the present utility model and are not intended to limit the present utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model shall be included within the protection scope of the present utility model.

Claims

1. A functional plate deformation stress detection system, characterized in that, It includes a cylinder, a pressure detection module, and a deformation stress detection module; the functional board to be tested is placed on the pressure detection module, and the cylinder is positioned directly above the pressure detection module; The deformation stress detection module is connected to the pressure detection module; after detecting the pressure, the pressure detection module outputs a high-level signal to the deformation pressure detection module; the deformation pressure detection module is connected to and controls the cylinder.

2. The functional plate deformation stress detection system according to claim 1, characterized in that, The deformation stress detection module includes a time control circuit and a deformation detection circuit; The deformation detection circuit includes PMOS transistors Q1 and Q2, switch K1, comparators U2 and U5, and latching diode Q4. Port 1 of switch K1 is connected to the power supply, and port 2 is connected to the cylinder and the source of PMOS transistor Q2, respectively. The drain of PMOS transistor Q2 is connected to the gate of PMOS transistor Q1. The gate of PMOS transistor Q2 is connected to the pressure detection module. The source of PMOS transistor Q1 is connected to the power supply. The drain of PMOS transistor Q1 is connected to the inverting comparison terminal of comparator U2 through resistor R1. The output of comparator U2 is connected to the inverting comparison terminal of comparator U2 via capacitor C1; the non-inverting comparison terminal of comparator U2 is grounded; the output of comparator U2 is connected to the non-inverting comparison terminal of comparator U5 via an inverter; the inverting comparison terminal of comparator U5 is connected to an adjustable threshold voltage; the output of comparator U5 is connected to the control pin of latching diode Q4; the anode of latching diode Q4 is connected to the power supply via a switch, and the cathode is connected to the anode of LED1, with the cathode of LED1 grounded.

3. The functional plate deformation stress detection system according to claim 2, characterized in that, The time control circuit includes a frequency division circuit and a timing circuit; The frequency divider circuit includes transistor Q5, crystal oscillator X1, and counting chips U1 and U4. The base of transistor Q5 is connected to port 2 of switch K1, the collector is connected to the power supply, and the emitter is connected to the VCC pin of crystal oscillator X1; crystal oscillator X1 is a 1MHz crystal oscillator; the output of crystal oscillator X1 is connected to the first 5-division frequency divider input terminal of counter chip U1; the first QD output terminal of counter chip U1 is connected to the second 5-division frequency divider input terminal of counter chip U1; the second QA output terminal of counter chip U1 is connected to the first 5-division frequency divider input terminal of counter chip U4; the first QA output terminal of counter chip U4 is connected to the second 5-division frequency divider input terminal of counter chip U4; the second QA output terminal of counter chip U4 is connected to the timing circuit through inverter U6; The timing circuit includes a counter chip U3; the CLK pin of the counter chip U3 is connected to the output of the inverter U6; the A, B, C and D pins of the counter chip U3 are each connected to the power supply through independent switches; the RCO pin of the counter chip U4 is connected to the control pin of the latching diode Q3; the LOAD pin of the counter chip U3 is connected to the power supply through switch K6; the positive terminal of the diode Q3 is connected to the power supply through a switch, and the negative terminal is connected to the gate of the PMOS transistor Q1.

4. The functional plate deformation stress detection system according to claim 3, characterized in that, The reset pins of the counting chips U1 and U4 are connected to the power supply via the reset button K7; the reset pin of the counting chip U3 is connected to port 2 of K1. The counting chips U1 and U4 are 74930 counting chips; the counting chip U3 is a 74LS161DC counting chip.

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