Device for testing high and low temperature resistance of silica gel key

By combining the design of an arc-shaped cover and an electric heating element with precise temperature control using a low-temperature air duct and an infrared temperature sensor, the problems of uneven temperature and inaccurate pressing in silicone button testing have been solved, achieving efficient and accurate performance testing.

CN224416771UActive Publication Date: 2026-06-26INJECTION PRECISION RUBBER SUZHOU CO LTD
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Patent Information

Application Number
CN202521165813.6
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-06-09
Publication Date
2026-06-26
Estimated Expiration
2035-06-09

AI Technical Summary

Technical Problem

Existing high and low temperature testing devices for silicone buttons are difficult to control the temperature precisely, and both manual and automated testing equipment cannot simulate real pressing operations, resulting in a lack of accuracy and consistency in test results.

Method used

It uses an arc-shaped cover and electric heating tube in combination with high-purity aluminum foil to achieve rapid heating; the low-temperature air duct, blower and nozzle design ensure uniform cooling; combined with infrared temperature sensor and single-chip microcomputer, the temperature is precisely controlled; the pressing component works in concert with motor, gear and lever to simulate pressing operation of different force.

Benefits of technology

It achieves precise temperature control and realistic pressing simulation of silicone buttons at different temperatures, ensuring the accuracy and comprehensiveness of test results.

✦ Generated by Eureka AI based on patent content.
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Abstract

The utility model discloses a silica gel key high and low temperature resistance testing device, which comprises a shell, a test board arranged in the middle of the inner wall of the shell, a key test slot arranged on the upper side surface of the test board, key shafts symmetrically distributed on the bottom wall of the key test slot, a temperature control assembly and a pressing assembly, the temperature control assembly comprises an arc-shaped cover and a low-temperature air pipe, the arc-shaped cover is arranged in the shell, a heating assembly is arranged in the arc-shaped cover, the arc-shaped cover is located on the front side of the key testing groove, the low-temperature air pipe is arranged on the left side wall of the shell, and the low-temperature air pipe is located on the left side of the key testing groove; the pressing assembly is arranged in the shell, a single-chip microcomputer is arranged on the front side face of the shell, and the input end of the single-chip microcomputer is electrically connected with an external power source. According to the utility model, the high and low temperature environment can be accurately simulated, the real pressing operation can be highly restored, and the performance of the silica gel key at different temperatures can be comprehensively and accurately detected.
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