A bit error rate testing apparatus

Abstract

The application discloses a bit error rate test device, which comprises a first box and a second box which are stacked and used for placing a signal amplification device and a signal processing device; the first box and the second box are provided with opposite openings; a locking device comprises a first magnet and a second magnet, the first magnet is vertically arranged in the opening of the first box, and the second magnet is transversely arranged in the opening of the second box; the first magnet can move up and down under the action of the second magnet to realize locking and unlocking of the first box and the second box; the second magnet can switch the magnetic pole close to the first magnet through transverse movement. The first magnet is driven to move up and down in the vertical direction by using the principle that "like poles repel and opposite poles attract" to change the magnetic pole of the second magnet through transverse movement of the second magnet, so that locking or unlocking is completed.

Description

Technical Field

[0001] This application relates to the field of bit error rate testing technology, and in particular to a bit error rate testing device. Background Technology

[0002] In high-precision testing equipment such as bit error rate testers, structural design not only needs to ensure the reliability and stability of the connection, but also needs to take into account the simplicity of the appearance and the confidentiality of the technology. However, existing snap-fit ​​structures generally adopt locking tongue / lock hole cooperation or screw fixing, which have defects such as insufficient aesthetics, poor concealment and single function. Specifically, the exposed locking tongue / lock hole structure affects the overall aesthetics of the product, the exposed screws destroy the simplicity of the design, and the exposed structure lacks concealment, especially on technically sensitive equipment, which cannot meet the modern product design requirements for aesthetics, concealment and functionality. Summary of the Invention

[0003] To address the aforementioned problems, this application provides a bit error rate testing device, comprising: The first and second boxes are stacked together, and the first and second boxes are used to house the signal amplification device and the signal processing device; The locking device includes a first magnet and a second magnet. The first magnet is vertically disposed in the opening of the first housing, and the second magnet is horizontally disposed in the opening of the second housing. The first magnet can move up and down under the action of the second magnet to lock and unlock the first housing and the second housing. The second magnet can switch the magnetic pole close to the first magnet by moving horizontally. The first box and the second box are provided with opposite openings.

[0004] Preferably, the locking device includes: A first magnetic mechanism is disposed within the opening of the first housing and includes a lifting assembly, a limiting assembly, and a first magnet. The first magnet is disposed in the lifting assembly so that it can drive the lifting assembly to move synchronously under the magnetic force of the second magnet. The limiting assembly is disposed on the side of the lifting assembly away from the second magnet to limit the lifting stroke of the lifting assembly. The second magnetic mechanism is disposed inside the opening of the second housing and includes a connecting plate, a toggle switch and a second magnet. The toggle switch drives the second magnet to move through the connecting plate to switch the magnetic poles close to the first magnet.

[0005] Preferably, the lifting assembly includes a movable component and a lifting column, the first magnet is disposed inside the movable component, the lifting column is disposed around the movable component, the moving directions of the lifting column and the first magnet are parallel, and the movable component is sleeved on the lifting column so as to be able to move along the setting direction of the lifting column.

[0006] Preferably, the movable member includes a receiving block for accommodating the first magnet and a wedge plate disposed on the side of the receiving block facing the limiting component, the wedge plate having a notch adapted to the limiting component for accommodating the limiting component.

[0007] Preferably, the limiting component includes a limiting plate disposed on the side of the moving member away from the second magnet and a limiting post disposed laterally on the limiting plate away from the moving member. The limiting post is disposed parallel to the moving direction of the first magnet, and the limiting plate is sleeved on the limiting post so as to be able to move along the setting direction of the limiting post.

[0008] Preferably, the limiting plate includes a first body and a second body. Along the moving direction of the first magnet, the cross-sectional dimension of the first body is larger than that of the second body to form a T-shaped structure. The first main body is sleeved on the limiting post, and the second main body is disposed on the side of the first magnet away from the second magnet.

[0009] Preferably, along the direction of movement perpendicular to the first magnet, the width of the second body is not less than the width of the moving member.

[0010] Preferably, the opening of the second housing is provided with an isolation structure to isolate the second magnet from the outside and to form a mating space for the first magnet to be embedded.

[0011] Preferably, the first housing and / or the second housing includes a closed metal cavity having the opening, and the locking device is disposed in the metal cavity.

[0012] Preferably, the bit error rate testing device further includes a Hall sensor, which is laterally disposed on the movement path of the second magnet to detect changes in the position of the second magnet, so as to determine the state of the locking device.

[0013] Based on the above technical solution, the bit error rate testing device described in this application has the following beneficial effects: The device employs magnetic force for locking. By moving the second magnet laterally to change its magnetic poles, and utilizing the principle of "like poles repel and unlike poles attract," the first magnet is driven to move vertically up and down, thus locking or unlocking. The entire process involves no physical contact or mechanical friction, resulting in almost zero wear. The operation is smooth, quiet, and responsive, greatly improving the user experience and the device's durability. Secondly, the locking device utilizes the "opposite openings" on the housing as installation and operating space, integrating the first and second magnets into the joint of the two housings. This allows the locking device to not occupy additional external space, resulting in a compact structure that blends seamlessly with the housing, achieving a high degree of integration. Furthermore, the locking device of this application is completely built into the opening of the housing, giving the bit error rate testing equipment a unified, flat appearance, enhancing aesthetics and concealment. Attached Figure Description

[0014] To more clearly illustrate the technical solutions of this application, the accompanying drawings used in the description of the embodiments or prior art will be briefly introduced below. Obviously, the drawings described below are merely some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without any creative effort.

[0015] Figure 1 This is a schematic diagram of the overall structure of the bit error rate testing device provided in the embodiments of this application.

[0016] Figure 2 This is a frontal cross-sectional view of the bit error rate testing device provided in the embodiments of this application.

[0017] Figure 3 This is a schematic diagram of the internal structure of the bit error rate testing device provided in the embodiment of this application in the first section.

[0018] Figure 4 yes Figure 3 A magnified view of section A in the image.

[0019] Figure 5 This is a schematic diagram of the internal structure of the bit error rate testing device provided in the embodiment of this application in the second section.

[0020] Figure 6 yes Figure 5 A magnified view of section B in the image.

[0021] Figure 7 This is a partial structural schematic diagram of the first magnetic mechanism provided in the embodiments of this application.

[0022] Figure 8 This is a schematic diagram of the structure of the movable component provided in the embodiments of this application.

[0023] Figure 9This is a schematic diagram of the structure of the limiting plate provided in the embodiment of this application.

[0024] Figure 10 This is a simplified diagram illustrating the mechanism of the locking device in the locked state provided in the embodiments of this application.

[0025] Figure 11 This is a simplified diagram of the mechanism by which the locking device provided in this application is in the unlocked state.

[0026] The reference numerals in the attached drawings are as follows: 100, Bit error rate testing equipment; 11, partition; 12, metal cavity; 200, first housing; 300, second housing; 400, locking device; 41, first magnetic mechanism; 411, first magnet; 412, lifting assembly; 4121, moving part; 4122, lifting column; 4123, receiving block; 4124, receiving groove; 4125, wedge plate; 4126, protruding section; 4127, notch; 413, limiting assembly; 4131, limiting plate; 4132, limiting column; 4133, first main body; 4134, second main body; 42, second magnetic mechanism; 421, connecting plate; 422, toggle switch; 423, second magnet; 43, Hall sensor. X, the length direction of the first magnet; Y, the width direction of the first magnet; Z, the direction of movement of the first magnet. Detailed Implementation

[0027] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0028] The term "an embodiment" or "embodiment" as used herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of this application. In the description of this application, it should be understood that the terms "upper," "lower," "left," "right," "top," "bottom," etc., indicating orientation or positional relationships based on the orientation or positional relationships shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. Moreover, the terms "first," "second," etc., are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein.

[0029] This application discloses a bit error rate testing device 100 for testing the bit error rate of optical modules.

[0030] It is understandable that the optical module is a key component in an optical fiber communication system. Its main function is to convert between electrical and optical signals, that is, to convert electrical signals into optical signals for transmission, or to convert received optical signals back into electrical signals. Because signals can produce errors during transmission due to various factors (such as noise, interference, and signal attenuation), the data received by the receiver may differ from that of the transmitter. Therefore, bit error rate (BER) testing simulates the actual transmission environment and detects the probability of errors occurring when the optical module receives or transmits signals, in order to determine whether its performance meets the standards.

[0031] Therefore, the bit error rate test of the optical module refers to the detection and evaluation of various performance indicators of the optical module. It is usually carried out during the production process of the optical module and before delivery for use. The test results will serve as an important basis for product quality control. Through testing, unqualified products can be screened out, ensuring the quality and reliability of the products and ensuring that they meet specific standards and application requirements.

[0032] like Figures 1-11 As shown in this embodiment, the bit error rate testing device 100 includes: A first box 200 and a second box 300 are stacked, wherein the first box 200 and the second box 300 are used to house a signal amplification device and a signal processing device; the first box 200 and the second box 300 are provided with opposing openings; The locking device 400 includes a first magnet 411 and a second magnet 423. The first magnet 411 is vertically disposed in the opening of the first housing 200, and the second magnet 423 is horizontally disposed in the opening of the second housing 300. The first magnet 411 can move up and down under the action of the second magnet 423 to lock and unlock the first housing 200 and the second housing 300. The second magnet 423 can switch the magnetic pole close to the first magnet 411 by moving horizontally.

[0033] In this embodiment of the application, the signal amplification device is a power amplifier module (PA) used to amplify the input radio frequency signal to achieve the power level required for bit error rate testing.

[0034] In this embodiment of the application, the signal processing device is a stacked radio frequency signal processing unit, used for processing, analyzing and transmitting radio frequency signals.

[0035] Therefore, in the bit error rate testing device, the power amplifier module and the stacked RF signal processing unit are connected through the locking device 400, providing efficient and reliable hardware support to work together with the power amplifier module and the stacked RF signal processing unit to complete the bit error rate testing.

[0036] It is understandable that the first enclosure 200 and the second enclosure 300 are stacked without a specific order of placement, and therefore the signal amplification device and the signal processing device also have no fixed order of placement.

[0037] It is understandable that the locking device 400 is sandwiched between the first housing 200 and the second housing 300.

[0038] It is understandable that the opening of the first housing 200 and the opening of the second housing 300 are aligned to ensure that the first magnet 411 can extend and retract relative to the opening of the second housing 300.

[0039] Understandably, the first magnet 411 can lock or separate from the second housing 300 by moving up and down. Specifically, under the magnetic attraction of the second magnet 423, the first magnet 411 can pass through the openings of the first housing 200 and the second housing 300 in sequence and extend into the interior of the second housing 300 to lock the first housing 200 and the second housing 300. Under the magnetic repulsion of the second magnet 423, the first magnet 411 can pass through the openings of the second housing 300 and the first housing 200 in sequence and retract into the interior of the first housing 200 to unlock the first housing 200 and the second housing 300.

[0040] Understandably, the second magnet 423 can switch the magnetic pole opposite to the first magnet 411 by moving laterally, thereby changing the magnetic force on the first magnet 411.

[0041] Therefore, a magnetic drive locking mechanism is adopted. By moving the second magnet 423 laterally to change its magnetic poles, and utilizing the principle of "like poles repel and unlike poles attract," the first magnet 411 is driven to move vertically up and down, thereby completing the locking or unlocking. The entire process involves no physical contact or mechanical friction, resulting in almost zero wear. The operation is smooth, quiet, and responsive, greatly improving the user experience and the durability of the bit error rate testing equipment 100. Secondly, the locking device 400 utilizes the "opposite openings" on the housing as installation and operating space, integrating the first magnet 411 and the second magnet 423 into the joint of the two housings. This allows the locking device 400 to not occupy additional external space, resulting in a compact structure that is integrated with the housing itself, achieving a high degree of integration. Furthermore, the locking device 400 of this application is completely built into the interior of the housing opening, giving the bit error rate testing equipment 100 a unified, flat appearance, improving aesthetics and concealment.

[0042] In a preferred embodiment, the locking device 400 includes: The first magnetic mechanism 41 is disposed in the opening of the first housing 200. It includes a lifting assembly 412, a limiting assembly 413 and a first magnet 411. The first magnet 411 is disposed in the lifting assembly 412 so that it can drive the lifting assembly 412 to move synchronously under the magnetic force of the second magnet 423. The limiting assembly 413 is disposed on the side of the lifting assembly 412 away from the second magnet 423 so as to limit the lifting stroke of the lifting assembly 412. The second magnetic mechanism 42 is disposed in the opening of the second housing 300. It includes a connecting plate 421, a toggle switch 422 and a second magnet 423. The toggle switch 422 drives the second magnet 423 to move through the connecting plate 421 to switch the magnetic poles close to the first magnet 411.

[0043] Understandably, simple magnetic adsorption may be misaligned due to vibration or accidental impact, but the "lifting assembly 412" encapsulates the first magnet 411 in a mechanical structure that can move along a fixed path, so that when the second magnet 423 generates magnetic force, it can drive the entire "lifting assembly 412" to perform precise lifting and lowering movements.

[0044] Understandably, if the second magnet 423 has too strong a magnetic force or is operated too quickly during unlocking, the lifting component 412 may be excessively lifted upwards or even dislodged from its mounting track, causing damage. Therefore, the limit component 413 can precisely limit its maximum rising position, ensuring that it always moves within the preset stroke.

[0045] In this embodiment, the limiting component 413 is made of flexible material (such as rubber) or other mechanical structure, so that it can not only limit the movement of the lifting component 412, but also provide a buffer when the lifting component 412 moves to the end of the movement, absorb its impact force, and reduce noise and wear.

[0046] Understandably, users can unlock the device by toggling switch 422 (e.g., from left to right), making the operation logic more intuitive.

[0047] In a preferred embodiment, the lifting assembly 412 includes a movable member 4121 and a lifting column 4122. The first magnet 411 is disposed inside the movable member 4121, and the lifting column 4122 is disposed around the movable member 4121. The lifting column 4122 and the first magnet 411 are arranged parallel to each other in the Z-direction of movement. The movable member 4121 is sleeved on the lifting column 4122 so that it can move along the direction of the lifting column 4122.

[0048] Understandably, by fitting the moving part 4121 onto the lifting column 4122, the potentially free and disordered magnetic drive can be strictly constrained into a single, precise linear movement along the direction of the lifting column 4122. This ensures that regardless of the magnetic force, the moving part 4121 can only move up and down, without deflection or wobbling. Furthermore, by presetting the height of the lifting column 4122, its guiding function ensures that the moving part 4121 reaches the same precise position each time it is locked and unlocked, thus ensuring the reliability and consistency of locking and unlocking.

[0049] In a preferred embodiment, the movable member 4121 includes a receiving block 4123 for accommodating the first magnet 411 and a wedge plate 4125 disposed on the side of the receiving block 4123 facing the limiting component 413. The wedge plate 4125 is provided with a notch 4127 adapted to the limiting component 413 for accommodating the limiting component 413.

[0050] Understandably, when the moving part 4121 is pushed upward by magnetic force and approaches the end of its stroke, the inclined surface of the wedge plate 4125 can first contact the limiting component 413, serving as a guide and buffer. Furthermore, as the moving part 4121 continues to move upward, the limiting component 413 will slide slightly along the inclined surface of the wedge plate 4125 and eventually lock into the notch 4127, thereby greatly reducing the impact and vibration on the limiting component 413. Simultaneously, the design of the notch 4127 also reduces the space occupied by the first magnetic mechanism 41 within the first housing 200, thus limiting the moving part 4121 while also reducing the space occupancy rate of the first housing 200.

[0051] It is understood that the receiving block 4123 is provided with a receiving groove 4124, which is used to receive the first magnetic block, that is, the first magnet 411 is covered in the receiving block 4123.

[0052] In this embodiment, the bit error rate testing device 100 primarily performs precise signal analysis to determine the quality of signal transmission. Therefore, any form of external electromagnetic interference, especially interference from within the device itself, can be superimposed on the signal under test, leading to misjudgment or even distorted test results. The first magnet 411 and the second magnet 423 generate a stable static magnetic field. Although the static magnetic field itself does not directly generate electromagnetic waves, when the first magnet 411 moves up and down, it induces eddy currents, thereby generating a changing electromagnetic field and forming electromagnetic interference.

[0053] Therefore, in this embodiment of the application, under the premise of ensuring the magnetic attraction force in the locked state, the receiving block 4123 is at least made of metal to form an electromagnetic shielding structure, so that the magnetic lines of force generated by the first magnet 411 will be mostly "bound" inside the metal receiving block 4123, thereby greatly reducing the possibility of leakage to the outside.

[0054] In this embodiment of the application, the wedge plate 4125 is provided with an extension section 4126 at one end facing the lifting column 4122. The extension section 4126 is provided with a moving hole adapted to the lifting column 4122 for the lifting column 4122 to pass through.

[0055] In this embodiment, there are two wedge plates 4125. The two wedge plates 4125 are arranged opposite to each other and spaced apart along the width direction Y of the first magnet 411, so as to uniformly mount the limiting component 413.

[0056] In a preferred embodiment, the limiting component 413 includes a limiting plate 4131 disposed on the side of the moving member 4121 away from the second magnet 423 and a limiting post 4132 disposed laterally on the end of the limiting plate 4131 away from the moving member 4121. The limiting post 4132 and the moving direction Z of the first magnet 411 are arranged parallel to each other. The limiting plate 4131 is sleeved on the limiting post 4132 so that it can move along the setting direction of the limiting post 4132.

[0057] In this embodiment, the limiting plate 4131 is initially located at the bottom end of the limiting post 4132. When the moving member 4121 moves towards the side away from the second housing 300 and touches the limiting plate 4131, it can move synchronously with the limiting plate 4131 along the preset direction of the limiting post 4132. This utilizes the limiting plate 4131 to slow down the movement of the moving member 4121. Simultaneously, the moving member 4121 is guided by the lifting post 4122 towards the second housing 300 and by the limiting post 4132 towards the limiting assembly 413. This enhances the stability of the moving member 4121 throughout its lifting stroke, ensuring that the locking device 400 operates smoothly and reliably under all circumstances.

[0058] In other embodiments, the limiting plate 4131 may also be directly set at the top of the limiting post 4132, i.e., at the end of the travel of the moving member 4121.

[0059] Understandably, the preset height of the limit post 4132 precisely defines the maximum travel of the moving part 4121, ensuring that the moving part 4121 can stop in the same position every time it is unlocked, thus guaranteeing the consistency of the unlocked state.

[0060] In a preferred embodiment, the limiting plate 4131 includes a first body 4133 and a second body 4134. Along the moving direction Z of the first magnet 411, the cross-sectional dimension of the first body 4133 is larger than the cross-sectional dimension of the second body 4134 to form a T-shaped structure. The first body 4133 is sleeved on the limiting post 4132, and the second body 4134 is disposed on the side of the first magnet 411 away from the second magnet 423.

[0061] Understandably, utilizing the first main body 4133 with a larger cross-sectional size can more effectively constrain the movement posture of the limiting plate 4131, preventing it from swaying or tilting during movement, and ensuring that the limiting plate 4131 always moves in tandem with the movement of the moving part 4121. In a preferred embodiment, the width of the second body 4134 along the width direction Y of the first magnet 411 is not less than the width of the moving member 4121.

[0062] like Figure 1 As shown, the height direction Z, length direction X, and width direction Y of the first magnet 411 are illustrated. It can be understood that the height direction Z of the first magnet 411 is the direction of movement Z of the first magnet, and the length direction X of the first magnet 411 is the direction of movement Z of the second magnet 423.

[0063] It is understandable that, along the moving direction Z of the first magnet 411, the orthographic projection width direction Y of the second body 4134 can completely cover the width direction Y of the first magnet 411. That is, the width of the second body 4134 is greater than the spacing of the notches 4127 on the wedge plate 4125. This allows the second body 4134 to limit the moving part 4121 to the greatest extent, ensuring the reliability and stability of the limiting effect.

[0064] In a preferred embodiment, the opening of the second housing 300 is provided with an isolation structure to isolate the second magnet 423 from the outside and to form a mating space for the first magnet 411 to be embedded.

[0065] Specifically, the opening of the second housing 300 includes a partition 11. Along the moving direction Z of the first magnet 411, the partition 11 can at least cover the second magnet 423. The partition 11 and the outer side of the second housing 300 form the mating space. The second magnet 423 is separated by the partition 11 inside the second housing 300, so that the protruding end of the lifting assembly 412 can be embedded into the mating space under the magnetic attraction of the first magnet 411.

[0066] Understandably, the size and shape of the mating space are adapted to the lifting assembly 412. Thus, when the first housing 200 and the second housing 300 are closed, the lifting assembly 412 can be directly aligned with the mating space. The mating space thus achieves the effect of positioning the lifting assembly 412, restricting its lateral degrees of freedom (including the length direction X and width direction Y of the first magnet 411), thereby preventing misalignment between the first housing 200 and the second housing 300.

[0067] In a preferred embodiment, the first housing 200 and / or the second housing 300 include a closed metal cavity 12 having the opening, and the locking device 400 is disposed in the metal cavity 12.

[0068] Understandably, placing the locking device 400 inside the metal cavity 12 further eliminates the possibility of interference with external signals to the metal cavity 12, ensures the continuity of shielding, and improves the overall shielding effectiveness.

[0069] In this embodiment of the application, along the length direction X of the first magnet 411, the length of the metal cavity 12 accommodating the second magnet 423 is at least three times the length of the second magnet 423.

[0070] Understandably, the triple length design ensures that the second magnet 423 has sufficient room to move and meet the requirements of a large stroke. Furthermore, the triple length design also ensures that the magnetic field is more evenly distributed within the metal cavity 12, reducing edge effects and improving the accuracy of magnetic force control.

[0071] In a preferred embodiment, the bit error rate testing device 100 further includes a Hall sensor 43, which is laterally disposed on the movement path of the second magnet 423 to detect changes in the position of the second magnet 423, so as to determine the state of the locking device 400.

[0072] It is understood that the bit error rate testing device 100 also includes a controller. The Hall sensor 43 is electrically connected to the controller. The Hall sensor 43 is used to detect the position change of the second magnet 423 and output an electrical signal. The controller can receive the electrical signal sent by the Hall sensor 43 and generate an assembly status signal.

[0073] In this embodiment, the Hall sensor 43 is disposed on the movement path of the second magnet 423, specifically at the beginning and end of the sliding trajectory of the second magnet 423.

[0074] Understandably, the Hall sensor 43 is electrically connected to the controller and is used to convert the mechanical locking state into an electrical signal output. Specifically, the Hall sensor 43 outputs different electrical signals, such as high / low level outputs, by sensing the change in the magnetic field strength of the second magnet 423.

[0075] In this embodiment, the working mechanism of the controller and the Hall sensor 43 being electrically connected is as follows: the analog / digital electrical signal (such as voltage change) of the Hall sensor 43 is converted into a logic signal and sent to the controller. The logic signal is, for example, 0 / 1. The controller then determines whether the toggle switch 422 is in a locked or unlocked state based on the logic signal and generates an assembly status signal so that the test process can be triggered when the bit error rate test equipment 100 is in a locked state, or the interrupt program or alarm prompt program can be triggered when the bit error rate test equipment 100 detects that the locking device 400 is in an unlocked state during the test.

[0076] In other embodiments, the Hall sensor 43 may also output a continuously changing electrical signal, such as a PWM signal, to achieve linear monitoring of the displacement of the second magnet 423.

[0077] like Figure 10 The diagram shows a simplified mechanism of the locking device 400 in the locked state in an embodiment of this application. The locking principle of the locking device 400 is as follows: For example, the magnetic pole of the first magnet 411 extending into the ground is preset to be the S pole, and the left side of the second magnet 423 is preset to be the S pole and the right side to be the N pole. When the first housing 200 and the second housing 300 are directly fastened together, the second magnet 423 remains in its original position. The extending end of the first magnet 411 can move towards the second housing 300 under the magnetic attraction of the N pole of the second magnet 423. At the same time, it drives the moving part 4121 to move along the lifting column 4122 until the extending end of the first magnet 411 enters the mating space, thus completing the locking of the first housing 200 and the second housing 300.

[0078] like Figure 11 The diagram illustrates a simplified mechanism of the locking device 400 in the unlocked state according to an embodiment of this application. The unlocking principle of the locking device 400 is as follows: For example, the magnetic pole of the first magnet 411 extending into the ground is preset to be the S pole, and the left side of the second magnet 423 is preset to be the S pole and the right side to be the N pole. When the toggle switch 422 is pulled, the toggle switch 422 can pull the second magnet 423 laterally through the connecting plate 421, thereby changing the magnetic pole corresponding to the extending end of the first magnet 411. Then, the first magnet 411 can be unlocked in the first state. The magnetic poles of the second magnet 423 change, and under the magnetic repulsion of the left S pole of the second magnet 423, it moves away from the second housing 300. At the same time, it drives the moving part 4121 to move along the lifting column 4122 until the first magnet 411 is completely retracted into the first housing 200, and the surface of the moving part 4121 touches the limiting plate 4131 or the moving part 4121 and the limiting plate 4131 move to the end of the stroke of the limiting column 4132 at the same time, thus completing the unlocking of the first housing 200 and the second housing 300.

[0079] The foregoing description has fully disclosed the specific embodiments of this application. It should be noted that any modifications made by those skilled in the art to the specific embodiments of this application do not depart from the scope of the claims. Accordingly, the scope of the claims of this application is not limited to the foregoing specific embodiments.

Claims

1. A bit error rate testing device, characterized in that, It includes: A first box and a second box are stacked together, and the first box and the second box are provided with opposite openings; The locking device includes a first magnet and a second magnet, wherein the first magnet is vertically disposed in the opening of the first housing, and the second magnet is horizontally disposed in the opening of the second housing; The first magnet can move up and down under the action of the second magnet to lock and unlock the first and second boxes; the second magnet can switch the magnetic poles close to the first magnet by moving laterally. The first and second enclosures are used to house the signal amplification device and the signal processing device.

2. The bit error rate testing device according to claim 1, characterized in that, The locking device includes: A first magnetic mechanism is disposed within the opening of the first housing and includes a lifting assembly, a limiting assembly, and a first magnet. The first magnet is disposed in the lifting assembly so that it can drive the lifting assembly to move synchronously under the magnetic force of the second magnet. The limiting assembly is disposed on the side of the lifting assembly away from the second magnet to limit the lifting stroke of the lifting assembly. The second magnetic mechanism is disposed inside the opening of the second housing and includes a connecting plate, a toggle switch and a second magnet. The toggle switch drives the second magnet to move through the connecting plate to switch the magnetic poles close to the first magnet.

3. The bit error rate testing device according to claim 2, characterized in that, The lifting assembly includes a movable component and a lifting column. The first magnet is disposed inside the movable component, and the lifting column is disposed around the periphery of the movable component. The moving directions of the lifting column and the first magnet are parallel. The movable component is sleeved on the lifting column so that it can move along the setting direction of the lifting column.

4. The bit error rate testing device according to claim 3, characterized in that, The movable component includes a receiving block for accommodating the first magnet and a wedge plate disposed on the side of the receiving block facing the limiting component. The wedge plate has a notch adapted to the limiting component for accommodating the limiting component.

5. The bit error rate testing device according to claim 3, characterized in that, The limiting component includes a limiting plate disposed on the side of the moving member away from the second magnet and a limiting post disposed laterally on the limiting plate away from the moving member. The limiting post is disposed parallel to the moving direction of the first magnet, and the limiting plate is sleeved on the limiting post so as to be able to move along the setting direction of the limiting post.

6. The bit error rate testing device according to claim 5, characterized in that, The limiting plate includes a first body and a second body. Along the moving direction of the first magnet, the cross-sectional dimension of the first body is larger than that of the second body to form a T-shaped structure. The first main body is sleeved on the limiting post, and the second main body is disposed on the side of the first magnet away from the second magnet.

7. The bit error rate testing device according to claim 6, characterized in that, Along the direction of movement perpendicular to the first magnet, the width of the second body is not less than the width of the moving part.

8. The bit error rate testing device according to claim 1, characterized in that, The opening of the second housing is provided with an isolation structure to isolate the second magnet from the outside and to form a mating space for the first magnet to be embedded.

9. The bit error rate testing device according to claim 1, characterized in that, The first housing and / or the second housing includes a closed metal cavity having the opening, and the locking device is disposed in the metal cavity.

10. The bit error rate testing device according to claim 1, characterized in that, The bit error rate testing equipment also includes a Hall sensor, which is horizontally arranged on the movement path of the second magnet to detect changes in the position of the second magnet, so as to determine the state of the locking device.

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