Long-lasting probe
CN309935250SActive Publication Date: 2026-04-21HEFEI GUOWEI ELECTRONICS
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- CN202530604368.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-10-15
- Publication Date
- 2026-04-21
- Estimated Expiration
- 2040-10-15
Smart Images
Figure 000001_ABST
Abstract
1. Name of the product in this design: Long-lasting probe. 2. Applications of this design: Real-time intelligent monitoring of microseismic events, earthquake background noise imaging, etc. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
Need to check novelty before this filing date? Find Prior Art