Method for determining the layer thickness of an at least partially transparent surface coating

A method using focused radiation and relative movement to measure transparent coating thickness and topography, addressing the inadequacies of existing methods, facilitates reliable manufacturing integration and optical structuring.

DE102024138958B3Active Publication Date: 2026-03-26MERCEDES BENZ GROUP AG
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Patent Information

Application Number
DE102024138958
Authority / Receiving Office
DE · DE
Patent Type
Patents
Current Assignee / Owner
Filing Date
2024-12-19
Publication Date
2026-03-26
Estimated Expiration
2044-12-19

AI Technical Summary

Technical Problem

Existing methods are inadequate for reliably measuring the thickness of partially transparent surface coatings, such as clear coats, and do not allow for integration into manufacturing processes.

Method used

A method utilizing a measuring device that emits focused radiation and changes distance relative to the substrate, capturing images at different positions to infer focusing on the substrate-coating interface or air interface, calculating thickness based on refractive index and path difference, and optionally incorporating image processing for topography analysis.

Benefits of technology

Enables simple, reliable, and process-safe measurement of layer thickness and topography, allowing integration into manufacturing processes and enabling subsequent structuring of the coating for optical properties modification.

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Abstract

The invention relates to a method for determining the layer thickness of an at least partially transparent surface coating on the surface of a substrate, using a measuring device for emitting focused radiation. The invention is characterized in that the distance between the surface of the substrate and the measuring device for emitting focused radiation is changed by a relative movement between the measuring device and the substrate, wherein the image of the radiation is captured in different relative positions, wherein in the case of an image with a clear outline edge, focusing is inferred at the interface between the surface coating and the substrate and the current relative position is stored as the first position, and wherein in the case of an image surrounded by scattering effects, focusing is inferred at the interface between the surface coating and the air and the current relative position is stored as the second position, after which the difference between the first and second positions is used to determine theTaking into account the refractive index of the transparent surface coating, the layer thickness of the at least partially transparent surface coating is determined.
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