Laminate for detection plates

Abstract

To provide a laminate for a detection plate which suppresses detection of particles mixed in a base material layer and / or a foreign matter bonded in a production step when dielectric particles are detected by a phase difference observation method, and thereby can improve detection accuracy of the dielectric particles.SOLUTION: A laminate 1 for a detection plate is used for a detection plate for detecting dielectric particles by a phase difference observation method. The laminate 1 for the detection plate includes a base material layer 2, a curable resin layer 3, and a conductive layer 4 in this order toward one side in a thickness direction. A refractive index of the curable resin layer 3 is 1.55 or more. When the base material layer 2 contains particles, the surface of the curable resin layer 3 does not have a projection caused by the particles.SELECTED DRAWING: Figure 1

Description

Technical Field

[0001] The present invention relates to a laminate for a detection plate, and more particularly to a laminate for a detection plate used for a detection plate for detecting dielectric particles by a phase difference observation method.

Background Art

[0002] Conventionally, in the food manufacturing process, a method for detecting microorganisms is known from the viewpoint of hygiene management.

[0003] As an apparatus used in such a method, for example, an inspection system provided with an inspection chip has been proposed (see, for example, Patent Document 1).

[0004] According to this inspection system, dielectric particles (for example, microorganisms and microplastics) in the inspection liquid can be inspected by the phase difference observation method.

Prior Art Documents

Patent Documents

[0005] <利用可能なメモリサイクル数を取得するために、カウンタを初期化する。

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0006] The inspection chip of Patent Document 1 includes an electrode film composed of a transparent film substrate and an electrode. On the other hand, in the production of the inspection chip, from the viewpoint of improving the production efficiency of the electrode film, further consideration is given to providing a cured resin layer on the surface of the transparent film substrate.

[0007] Specifically, as such an inspection chip, a laminate including a base material layer, a cured resin layer, and a conductive layer (electrode) in this order toward one side in the thickness direction is considered. Further, the base material layer is composed of, for example, only the base material or includes the base material and an easy adhesion layer.

[0008] On the other hand, from the viewpoint of improving the transportability of the substrate layer, it is being considered to improve antiblocking properties by incorporating particles into the substrate layer. Specifically, if the substrate layer consists only of the substrate, particles are incorporated into the substrate; if the substrate layer comprises both the substrate and an easy-adhesion layer, particles are incorporated into the substrate and / or the easy-adhesion layer.

[0009] When particles are incorporated into the substrate layer, a problem arises where, when detecting dielectric particles using the phase difference observation method, the particles are detected together with the dielectric particles, reducing the detection accuracy of the dielectric particles.

[0010] Furthermore, during the manufacturing process of the above-mentioned laminate, foreign matter may adhere to the laminate (particularly the substrate layer). In such cases, when detecting dielectric particles using the phase difference observation method, the foreign matter is detected along with the dielectric particles, resulting in a decrease in the detection accuracy of the dielectric particles.

[0011] The present invention aims to provide a laminate for a detection plate that can improve the detection accuracy of dielectric particles by suppressing the detection of particles compounded in the substrate layer and / or foreign matter adhering during the manufacturing process when detecting dielectric particles by phase difference observation. [Means for solving the problem]

[0012] The present invention [1] is a laminate for a detection plate used in a detection plate for detecting dielectric particles by phase difference observation, comprising a base layer, a cured resin layer, and a conductive layer in order toward one side in the thickness direction, wherein the refractive index of the cured resin layer is 1.55 or higher.

[0013] The present invention [2] is a laminate for a detection plate used in a detection plate for detecting dielectric particles by phase difference observation, comprising a base layer, a cured resin layer, and a conductive layer in order toward one side in the thickness direction, wherein the base layer contains particles, the refractive index of the cured resin layer is 1.55 or more, and the surface of the cured resin layer does not have protrusions caused by the particles.

[0014] The present invention [3] includes the laminate for detection plates described in [2] above, wherein the base material layer has an easy-adhesion layer containing particles on the surface of the cured resin layer.

[0015] The present invention [4] includes the detection plate laminate described in [2] or [3] above, wherein the particles are silica.

[0016] The present invention [5] includes a laminate for a detection plate according to any one of the above [1] to [4], wherein the cured resin layer contains second particles having a refractive index of 1.60 or higher.

[0017] The present invention [6] includes the detection plate laminate described in [5] above, wherein the average particle diameter of the second particles is 10 nm or more and 200 nm or less.

[0018] The present invention [7] includes the detection plate laminate according to [5] or [6] above, wherein the second particle is zirconia. [Effects of the Invention]

[0019] The cured resin layer in the detection plate laminate of the present invention has a refractive index within a predetermined range. Furthermore, if the base layer contains particles, the surface of the cured resin layer does not have protrusions caused by the particles incorporated into the base layer. Therefore, when detecting dielectric particles by phase difference observation, the detection of particles incorporated into the base layer and / or foreign matter adhering during the manufacturing process can be suppressed using this detection plate laminate. As a result, the detection accuracy of dielectric particles can be improved. [Brief explanation of the drawing]

[0020] [Figure 1] Figure 1 shows a cross-sectional view of a first embodiment of the laminate for detection plates of the present invention. [Figure 2]Figures 2A to 2C show an embodiment of a method for manufacturing a laminate for a detection plate according to the present invention. Figure 2A shows the step of preparing a base material layer in the first step. Figure 2B shows the second step of disposing a cured resin layer on the base material layer. Figure 2C shows the third step of disposing a conductive layer on the cured resin layer. [Figure 3] Figure 3 shows a cross-sectional view of a second embodiment of the laminate for a detection plate according to the present invention.

Mode for Carrying Out the Invention

[0021] [First Embodiment] Referring to Figure 1, a first embodiment of the laminate for a detection plate according to the present invention (a laminate for a detection plate in which the base material layer contains particles) will be described.

[0022] In Figure 1, the vertical direction in the plane of the paper is the vertical direction (thickness direction), the upper side of the paper is the upper side (one side of the thickness direction), and the lower side of the paper is the lower side (the other side of the thickness direction). Also, the horizontal direction and the depth direction in the plane of the paper are plane directions orthogonal to the vertical direction. Specifically, it conforms to the direction arrows in each figure.

[0023] In the first embodiment, the base material layer consists of, for example, only the base material or includes the base material and an easy-adhesion layer. Also, the base material layer contains particles.

[0024] When the base material layer consists of only the base material, the base material contains particles. When the base material layer includes the base material and an easy-adhesion layer, the base material and / or the easy-adhesion layer contains particles.

[0025] In the following description, an aspect in which the base material layer includes the base material and an easy-adhesion layer and the easy-adhesion layer contains particles will be described in detail.

[0026] <Laminate for Detection Plate> The laminate 1 for a detection plate has a film shape (including a sheet shape) with a predetermined thickness. The laminate 1 for a detection plate extends in a plane direction orthogonal to the thickness direction.

[0027] As shown in Figure 1, the detection plate laminate 1 comprises a base layer 2, a cured resin layer 3, and a conductive layer 4 in order toward one side in the thickness direction. More specifically, the detection plate laminate 1 comprises a base layer 2, a cured resin layer 3 disposed on the upper surface (one side in the thickness direction) of the base layer 2, and a conductive layer 4 disposed on the upper surface (one side in the thickness direction) of the cured resin layer 3, in order toward one side in the thickness direction. Preferably, the detection plate laminate 1 consists of a base layer 2, a cured resin layer 3, and a conductive layer 4.

[0028] The thickness of the detection plate laminate 1 is, for example, 300 μm or less, preferably 200 μm or less, and for example, 10 μm or more, preferably 50 μm or more, more preferably 100 μm or more.

[0029] Furthermore, as will be explained in more detail later, the detection plate (described later) can be manufactured by patterning the conductive layer 4 in the detection plate laminate 1. In other words, the detection plate laminate 1 is distributed independently as a precursor to the detection plate (described later).

[0030] <Base material layer> The base layer 2 is a base material for ensuring the mechanical strength of the detection plate laminate 1.

[0031] The base layer 2 has a film shape. The base layer 2 is located on the lower surface of the cured resin layer 3.

[0032] The base layer 2 comprises the base material 10 and the easy-adhesion layer 11 in order toward one side in the thickness direction.

[0033] The thickness of the base layer 2 is, for example, 2 μm or more, preferably 8 μm or more, more preferably 15 μm or more, even more preferably 60 μm or more, particularly preferably 110 μm or more, and also, for example, 250 μm or less, preferably 180 μm or less.

[0034] The thickness of the base layer 2 can be measured using a dial gauge (PEACOCK, "DG-205").

[0035] The total light transmittance of the substrate layer 2 (JIS K 7375-2008) is, for example, 80% or more, preferably 85% or more.

[0036] <Base material> The base material 10 has a film shape. Preferably, the base material 10 is flexible. The base material 10 is placed on the lower surface of the easy-adhesion layer 11.

[0037] Examples of the base material 10 include polymer films. Examples of materials for polymer films include polyester resin, (meth)acrylic resin, olefin resin, polycarbonate resin, polyethersulfone resin, polyarylate resin, melamine resin, polyamide resin, polyimide resin, cellulose resin, and polystyrene resin. Examples of polyester resins include polyethylene terephthalate, polybutylene terephthalate, and polyethylene naphthalate. Examples of (meth)acrylic resins include polymethacrylate. Examples of olefin resins include polyethylene, polypropylene, and cycloolefin polymers. Examples of cellulose resins include triacetylcellulose. Preferably, the material for the polymer film is polyester resin, and more preferably polyethylene terephthalate.

[0038] The thickness of the base material 10 is, for example, 1 μm or more, preferably 5 μm or more, more preferably 10 μm or more, even more preferably 50 μm or more, particularly preferably 100 μm or more, and also, for example, 200 μm or less, preferably 150 μm or less.

[0039] The thickness of the base material 10 can be measured using a dial gauge (PEACOCK, "DG-205").

[0040] <Easy adhesion layer> The easy-adhesion layer 11 is a layer provided to improve the adhesion between the substrate 10 and the cured resin layer 3.

[0041] The easy-adhesion layer 11 has a film shape. The easy-adhesion layer 11 is placed on the upper surface of the substrate 10.

[0042] The easy-adhesion layer 11 contains a matrix resin and particles, and preferably, the easy-adhesion layer 11 contains particles on the surface facing the cured resin layer 3. That is, the base layer 2 contains particles. If the easy-adhesion layer 11 (base layer 2) contains particles and has protrusions on the surface of the easy-adhesion layer 11, blocking can be prevented. Therefore, the transportability of the base layer 2 can be improved in the manufacture of the detection plate laminate 1. In the following description, the particles contained in the base layer 2 may be referred to as first particles.

[0043] Examples of matrix resins include hydrophilic cellulose derivatives, polyvinyl alcohol compounds, hydrophilic polyester compounds, polyvinyl compounds, (meth)acrylic acid compounds, epoxy compounds, polyurethane compounds, and natural polymer compounds.

[0044] Examples of the first particles include inorganic oxide fine particles and organic fine particles. Examples of inorganic oxide fine particles include silica, alumina, titania, zirconia, calcium oxide, tin oxide, indium oxide, cadmium oxide, and antimony oxide. Examples of organic fine particles include polymethyl methacrylate, silicone, polystyrene, polyurethane, acrylic-styrene copolymer, benzoguanamine, melamine, and polycarbonate. Preferably, the first particles are inorganic oxide fine particles, and more preferably silica from the viewpoint of light transmittance.

[0045] The average particle diameter of the first particle is, for example, 50 nm or more, preferably 100 nm or more, and for example, 3000 nm or less, preferably 2000 nm or less, more preferably 1000 nm or less, and particularly preferably 500 nm or less.

[0046] The average particle size of the first particle represents the average particle size (D50) of the volume-based particle size distribution. For example, a solution in which particles are dispersed in water can be measured by optical diffraction / scattering.

[0047] If the easy-adhesion layer 11 contains first particles on the surface facing the cured resin layer 3, when detecting dielectric particles (described later) using a detection plate (described later) obtained with the detection plate laminate 1, the first particles become easier to detect along with the dielectric particles (described later). This reduces the detection accuracy of the dielectric particles (described later).

[0048] In contrast, the laminated body 1 for the detection plate, as will be described in detail later, has a cured resin layer 3 with a refractive index within a predetermined range, and the surface of the cured resin layer 3 does not have protrusions caused by the first particles. Therefore, even if the easy-adhesion layer 11 contains the first particles on the surface of the cured resin layer 3, the detection of the first particles can be suppressed when detecting dielectric particles by the phase difference observation method. As a result, the detection accuracy of dielectric particles can be improved.

[0049] The first particle can be used alone or in combination with two or more other particles.

[0050] The easy-adhesion layer 11 is provided, for example, during the extrusion process when manufacturing the base layer 2.

[0051] <Cured resin layer> The cured resin layer 3 has a refractive index of 1.55 or higher and is in the shape of a film. The cured resin layer is located on the lower surface of the conductive layer 4.

[0052] The cured resin layer 3 is, for example, a protective layer that prevents scratches from occurring on the substrate layer 2 and the conductive layer 4.

[0053] The cured resin layer 3 is formed, for example, from a cured resin composition.

[0054] The cured resin composition comprises a resin and, if necessary, a second particle. In other words, the cured resin layer 3 comprises a resin and, if necessary, a second particle.

[0055] Examples of resins include thermoplastic resins and curable resins. Examples of thermoplastic resins include polyolefin resins.

[0056] Examples of curable resins include active energy ray curable resins that harden upon irradiation with active energy rays (e.g., ultraviolet rays and electron beams), and thermosetting resins that harden upon heating. Preferably, active energy ray curable resins are used as curable resins.

[0057] Examples of active energy ray curable resins include (meth)acrylic UV-curable resins, urethane resins, melamine resins, alkyd resins, siloxane polymers, and organic silane condensates. Preferably, the active energy ray curable resin is a (meth)acrylic UV-curable resin.

[0058] Furthermore, the resin may contain, for example, a reactive diluent as described in Japanese Patent Publication No. 2008-88309.

[0059] The resins can be used individually or in combination of two or more types.

[0060] Examples of the second particles include those exemplified in the easy-adhesion layer 11, preferably inorganic oxide fine particles, and more preferably zirconia, from the viewpoint of setting the refractive index of the cured resin layer 3 within the range described later.

[0061] The refractive index of the second particle is, for example, 1.60 or higher, preferably 1.80 or higher, more preferably 2.00 or higher, and also, for example, 3.00 or lower.

[0062] If the refractive index of the second particle is above the lower limit mentioned above, the refractive index of the cured resin layer 3, described later, can be adjusted to a predetermined range.

[0063] The average particle diameter of the second particle is, for example, 10 nm or more, and for example, 200 nm or less, more preferably 100 nm or less, and even more preferably 50 nm or less.

[0064] If the average particle size of the second particle is within the above range, the cured resin layer 3 exhibits excellent light transmittance.

[0065] The second particle can be used alone or in combination with two or more other particles.

[0066] Furthermore, the curing resin composition may optionally contain thixotropy-imparting agents (e.g., organic clay), photopolymerization initiators, fillers, and leveling agents in appropriate proportions. The curing resin composition may also be diluted with known solvents.

[0067] Furthermore, to form the cured resin layer 3, as will be described in detail later, a diluted solution of the cured resin composition is applied to one side in the thickness direction of the substrate layer 2 (easy-adhesion layer 11), and heated and dried as necessary. After drying, the cured resin composition is cured, for example, by irradiation with active energy rays and / or by heating.

[0068] This forms a cured resin layer 3.

[0069] Furthermore, the surface of the cured resin layer 3 does not have protrusions caused by the first particles. If the surface of the cured resin layer 3 does not have protrusions caused by the first particles, the detection of the first particles can be suppressed when detecting dielectric particles (described later) by phase difference observation using the detection plate (described later) obtained using the detection plate laminate 1. As a result, the detection accuracy of dielectric particles (described later) can be improved.

[0070] The method for confirming the aforementioned protrusions will be described in detail in the embodiments described later.

[0071] Furthermore, it is particularly preferable that the value obtained by subtracting the average particle diameter of the first particles from the thickness of the cured resin layer 3, as described later, falls within a predetermined range, in order to suppress the occurrence of protrusions on the surface of the cured resin layer 3 caused by the first particles.

[0072] The thickness of the cured resin layer 3 is, for example, 150 nm or more, preferably 300 nm or more, more preferably 600 nm or more, even more preferably 900 nm or more, and also, for example, 5000 nm or less, preferably 3000 nm or less.

[0073] Furthermore, the value obtained by subtracting the average particle diameter of the first particles from the thickness of the cured resin layer 3 is, for example, 10 nm or more, preferably 100 nm or more, more preferably 200 nm or more, even more preferably 400 nm or more, particularly preferably 600 nm or more, most preferably 800 nm or more, and also, for example, 1500 nm or less, preferably 1000 nm or less.

[0074] Furthermore, the ratio of the thickness of the cured resin layer 3 to the average particle diameter of the first particles (thickness of cured resin layer 3 / average particle diameter of the first particles) is, for example, greater than 1, preferably 1.2 or more, preferably 1.5 or more, more preferably 1.8 or more, even more preferably 3.0 or more, and also, for example, 10 or less, preferably 7 or less.

[0075] If the above values ​​and ratios are within the above range, the detection of first particles can be further suppressed when detecting dielectric particles (described later) by phase difference observation using the detection plate (described later) obtained using the detection plate laminate 1. As a result, the detection accuracy of dielectric particles (described later) can be further improved.

[0076] If the above ratio is within the above range, the detection of first particles can be further suppressed when detecting dielectric particles (described later) by phase difference observation using the detection plate (described later) obtained using the detection plate laminate 1. As a result, the detection accuracy of dielectric particles (described later) can be further improved.

[0077] The refractive index of the cured resin layer 3 is 1.55 or higher, preferably 1.60 or higher, more preferably 1.63 or higher, and for example, 1.80 or lower.

[0078] If the refractive index is above the lower limit, the detection of the first particle can be suppressed when detecting dielectric particles (described later) by phase difference observation using the detection plate (described later) obtained using the detection plate laminate 1. As a result, the detection accuracy of dielectric particles (described later) can be improved.

[0079] On the other hand, if the refractive index is below the lower limit, when detecting dielectric particles (described later) using the detection plate (described later) obtained using the detection plate laminate 1 for detection plates by phase difference observation, the detection of particles incorporated into the substrate layer 2 cannot be suppressed. As a result, the detection accuracy of dielectric particles (described later) decreases.

[0080] The refractive index of the cured resin layer 3 can be adjusted to the above range by adjusting the type and blending ratio of the resin and the second particles.

[0081] <Conductive layer> The conductive layer 4, as will be described in more detail later, is a layer formed in a desired pattern to create electrodes.

[0082] The conductive layer 4 has a film shape. The conductive layer 4 is located on the upper surface of the cured resin layer 3.

[0083] Examples of materials for the conductive layer 4 include metals, metal oxides, and conductive resin compositions. Examples of metals include copper, nickel, chromium, iron, titanium, or alloys thereof. Examples of metal oxides include indium-containing oxides. Examples of conductive resin compositions include metal nanowire-containing resin compositions. Preferably, the material for the conductive layer 4 is a metal, more preferably copper.

[0084] The conductive layer 4 is conductive. Specifically, the resistivity of the conductive layer 41 is, for example, 1 × 10⁻⁶. -3 Less than or equal to Ω·cm, and for example, 1 × 10 -8 It is greater than or equal to Ω·cm.

[0085] The resistivity can be determined in accordance with JIS K7194-1994.

[0086] The thickness of the conductive layer 4 is, for example, 10 nm or more, preferably 50 nm or more, and also, for example, 20,000 nm or less, preferably 10,000 nm or less.

[0087] <Method for manufacturing a laminate for detection plates> The manufacturing method for the detection plate laminate 1 will be explained with reference to Figure 2.

[0088] The manufacturing method for the detection plate laminate 1 comprises a first step of preparing a base layer 2, a second step of placing a cured resin layer 3 on the base layer 2, and a third step of placing a conductive layer 4 on the cured resin layer 3. In this manufacturing method, each layer is arranged sequentially, for example, using a roll-to-roll method.

[0089] <1st process> In the first step, the base layer 2 is prepared. In this method, an easy-adhesion layer 11 containing the first particles is pre-placed on the upper surface of the base material 10.

[0090] <Second process> In the second step, as shown in Figure 2B, the cured resin layer 3 is placed on the substrate layer 2. Specifically, a diluted solution of the cured resin composition is applied to one side in the thickness direction of the substrate layer 2, and after drying, the cured resin composition is cured by ultraviolet irradiation and / or heating. This places (forms) the cured resin layer 3 on one side in the thickness direction of the substrate layer 2.

[0091] <3rd process> In the third step, as shown in Figure 2C, the conductive layer 4 is placed on the cured resin layer 3.

[0092] Methods for arranging the conductive layer 4 on the cured resin layer 3 include, for example, vacuum deposition, sputtering, CVD, and coating, drying, and curing, with sputtering being preferred.

[0093] As a result, a conductive layer 4 is placed (formed) on one side in the thickness direction of the cured resin layer 3, and a laminated body 1 for a detection plate is manufactured, which has the base layer 2, the cured resin layer 3, and the conductive layer 4 arranged in order toward one side in the thickness direction.

[0094] [Second Embodiment] Next, a second embodiment of the detection plate laminate of the present invention (a detection plate laminate in which the base layer does not contain particles) will be described.

[0095] In the following second embodiment, descriptions that are the same as those in the first embodiment will be omitted.

[0096] As shown in Figure 3, the detection plate laminate 1 comprises a base layer 2, a cured resin layer 3, and a conductive layer 4 in order toward one side in the thickness direction.

[0097] The base layer 2 comprises the base material 10 and the easy-adhesion layer 11 in order toward one side in the thickness direction. The base material 10 and the easy-adhesion layer 11 do not contain particles.

[0098] Examples of the base material 10 include the polymer film (preferably polyethylene terephthalate) mentioned in the first embodiment described above.

[0099] The easy-adhesion layer 11 includes a matrix resin. Examples of the matrix resin include those listed in the first embodiment described above.

[0100] The cured resin layer 3 is the same as the cured resin layer 3 described in the first embodiment above.

[0101] The conductive layer 4 is the same as the conductive layer 4 described in the first embodiment above.

[0102] Then, the detection plate laminate 1 is manufactured by the same manufacturing method as in the first embodiment described above.

[0103] <Effects and Effects> In the first embodiment described above, the cured resin layer 3 in the detection plate laminate 1 has a refractive index within a predetermined range. Furthermore, the surface of the cured resin layer 3 does not have protrusions caused by the first particles. Therefore, with a detection plate obtained using this detection plate laminate 1, the detection of the first particles can be suppressed when detecting dielectric particles by the phase difference observation method. As a result, the detection accuracy of dielectric particles can be improved. In particular, even if the easy-adhesion layer 11 contains the first particles on the surface of the cured resin layer 3, the detection accuracy of dielectric particles can be improved.

[0104] Furthermore, in the first and second embodiments described above, the cured resin layer 3 in the detection plate laminate 1 has a refractive index within a predetermined range. Therefore, when detecting dielectric particles using this detection plate laminate 1, the detection of foreign matter adhering during the manufacturing process can be suppressed. As a result, the detection accuracy of dielectric particles can be improved.

[0105] <Detection Plate> The detection plate is obtained by patterning the conductive layer 4 in the detection plate laminate 1 using a known method. Specifically, two electrodes facing each other with a gap between them are formed as a pattern on the conductive layer 4.

[0106] This detection plate is used to detect dielectric particles using the phase difference observation method. The following describes in detail how to detect dielectric particles using this detection plate with the phase difference observation method.

[0107] In this method, a test solution is first introduced between two electrodes. The test solution contains dielectric particles. Examples of dielectric particles include bacteria and microorganisms.

[0108] Next, a voltage is applied to the detection plate to cause electrophoresis of the dielectric particles contained in the test solution. The electrophoretically dispersed dielectric particles gradually localize near the electrodes (electrophoretic concentration). Then, the test solution is pumped until the dielectric particles reach a predetermined amount.

[0109] Dielectric particles are typically about 1 μm in size, making them difficult to observe with an optical microscope (phase contrast observation method). However, by using this method to concentrate the dielectric particles by electrophoresis to a predetermined amount, the dielectric particles can be observed even with an optical microscope (phase contrast observation method).

[0110] Subsequently, the dielectric particles are observed using the phase difference observation method.

[0111] In this case, if the substrate layer 2 contains particles (first particles), particles (specifically, black spots originating from the particles) may be observed along with the dielectric particles. This makes it impossible to distinguish between the dielectric particles and the particles, reducing the detection accuracy of the dielectric particles.

[0112] On the other hand, this detection plate is obtained from the laminate 1 for the detection plate. Therefore, the detection of the first particle can be suppressed. As a result, the detection accuracy of dielectric particles can be improved.

[0113] Furthermore, during the manufacturing process of the detection plate laminate 1, foreign matter may adhere to the detection plate laminate 1 (particularly the base layer 2). In such cases, when detecting dielectric particles using the phase difference observation method, foreign matter (specifically, black spots originating from the foreign matter) is detected along with the dielectric particles, reducing the detection accuracy of the dielectric particles.

[0114] On the other hand, this detection plate is obtained from the laminated body 1 for detection plates. Therefore, the detection of foreign matter can be suppressed. As a result, the detection accuracy of dielectric particles can be improved.

[0115] <Variation> In the modified examples, the same reference numerals are used for components and processes as in the first and second embodiments, and their detailed descriptions are omitted. Furthermore, the modified examples can achieve the same effects and advantages as the first and second embodiments, unless otherwise specified. In addition, the first embodiment, the second embodiment, and their modified examples can be combined as appropriate.

[0116] In the first embodiment, the base layer 2 comprises a base material 10 and an easy-adhesion layer 11, wherein the easy-adhesion layer 11 contains particles. Alternatively, the easy-adhesion layer 11 may not contain particles, and the base material 10 may contain particles. Furthermore, both the base material 10 and the easy-adhesion layer 11 may contain particles.

[0117] In the first embodiment, the base layer 2 comprises a base material 10 and an easy-adhesion layer 11, wherein the easy-adhesion layer 11 contains particles. Alternatively, the base layer 2 may consist only of the base material 10 without the easy-adhesion layer 11, and the base material 10 may contain particles.

[0118] In the second embodiment, the base layer 2 comprises a base material 10 and an easy-adhesion layer 11, while the base layer 2 may consist only of the base material 10 without the easy-adhesion layer 11.

[0119] In the first and second embodiments, the detection plate laminate 1 comprises a base layer 2, a cured resin layer 3, and a conductive layer 4 in order toward one side in the thickness direction. On the other hand, the detection plate laminate 1 may also further include one or more functional layers on the lower or upper surface of the cured resin layer 3.

[0120] Examples of functional layers include adhesion layers, refractive index adjusting layers, and antiblocking layers. Furthermore, the functional layer may be an organic layer, an inorganic layer, or a mixed layer of organic and inorganic layers. [Examples]

[0121] The present invention will be further described below with reference to examples and comparative examples. However, the present invention is not limited in any way to the examples and comparative examples. Furthermore, specific numerical values ​​such as blending ratios (content ratios), physical properties, and parameters used in the following description may be replaced with the corresponding upper limits (numerical values ​​defined as "less than or equal to" or "less than") or lower limits (numerical values ​​defined as "greater than or equal to" or "greater than or equal to") of the blending ratios (content ratios), physical properties, and parameters described in the "Modes for Carrying Out the Invention" above.

[0122] 1. Details of the ingredients The trade names and abbreviations of the components used in each example and comparative example are described in detail below. Curing resin composition 1: Acrylic UV-curable resin composition containing 51% by mass of zirconia particles with an average particle diameter of 40 nm (refractive index 1.64) Curing resin composition 2: Acrylic UV-curable resin composition containing 61% by mass of zirconia particles with an average particle size of 40 nm (refractive index 1.68) Curing resin composition 3: Acrylic UV-curable resin composition containing 66% by mass of zirconia particles with an average particle size of 40 nm (refractive index 1.72) Curing resin composition 4: Urethane polyfunctional polyacrylate, trade name "UNIDIC", manufactured by DIC Corporation, refractive index 1.52

[0123] 1. Manufacturing of the laminate for detection plates Example 1 <1st process> As the base layer, a PET film with an easy-adhesion layer (thickness 125 μm (easy-adhesion layer 0.1 μm), manufactured by Toray Industries, Inc., "125U483") was prepared. The easy-adhesion layer contains two types of silica particles (first particle, refractive index 1.46) with average particle diameters of 300 nm and 150 nm. This was used to prepare the base layer.

[0124] <Second process> A diluted solution of cured resin composition 1 was applied to one side of the substrate layer in the thickness direction and dried. Then, ultraviolet light was irradiated to cure the cured resin composition. This resulted in the formation of a cured resin layer (1 μm thick) on one side of the substrate layer in the thickness direction.

[0125] <3rd process> A Cu layer (100 nm thick) was formed on one side of the cured resin layer in the thickness direction by sputtering. This resulted in a laminate for a detection plate.

[0126] Examples 2 to 5, and Comparative Examples 1 and 2 A laminate for the detection plate was obtained using the same procedure as in Example 1. However, the type of cured resin composition and the thickness of the cured resin layer were changed according to Table 1.

[0127] 2. Evaluation (Presence or absence of protrusions on the surface of the cured resin layer caused by the first particle) For each example and comparative example, the presence or absence of protrusions caused by the first particle was observed on the surface of the cured resin layer. Specifically, the cross-section was observed using a 5000x SEM, and the presence or absence of protrusions caused by the first particle was observed at 10 locations containing the particle on the surface of the cured resin layer.

[0128] No protrusions were observed in Examples 1 to 5 and Comparative Example 1. On the other hand, protrusions were observed in Comparative Example 2.

[0129] (Test accuracy testing) An etching solution (MEC Bright, manufactured by MEC Corporation) was used to form an electrode pattern on the conductive layer.

[0130] Next, using a microscope ("BX51", manufactured by Olympus) and phase contrast observation, we observed the presence or absence of black spots originating from particles contained in the easy-adhesion layer (silica particles with an average particle diameter of 300 nm and silica particles with an average particle diameter of 150 nm) (hereinafter referred to as particle-derived black spots), and black spots originating from foreign matter that adhered during the manufacturing process (specifically, foreign matter contained in the easy-adhesion layer (excluding particles)) (hereinafter referred to as foreign matter-derived black spots).

[0131] The microscope magnifications were set to 100x, 200x, and 400x. Phase-contrast objective lenses (10x, 20x, and 40x magnification) were used, with a long-working-length phase-contrast objective lens used at 40x magnification.

[0132] Regarding inspection accuracy, black spots originating from particles and black spots originating from foreign matter were observed for silica particles with an average particle diameter of 300 nm and silica particles with an average particle diameter of 150 nm, respectively. The accuracy was evaluated based on the following criteria. The results are shown in Table 1. ○: No sunspots (sunspots originating from particles or foreign matter) were observed. ×: Sunspots (sunspots originating from particles or sunspots originating from foreign matter) were observed.

[0133] In the above evaluation, if both the observation of black spots originating from particles and black spots originating from foreign matter are marked with "○", it indicates that when detecting dielectric particles using the phase difference observation method, neither black spots originating from particles nor black spots originating from foreign matter are observed, and the inspection accuracy of dielectric particles is excellent.

[0134] On the other hand, in the above evaluation, if at least one of the black spots originating from particles and black spots originating from foreign matter is marked with "×", then black spots (particle-derived and / or foreign matter-derived) will be observed when detecting dielectric particles using the phase difference observation method, indicating a decrease in the inspection accuracy of dielectric particles.

[0135] [Table 1] [Explanation of symbols]

[0136] 1. Laminate for detection plate 2 Base material layer 3 Cured resin layer 4. Conductive layer

Claims

1. A laminate for a detection plate used in a detection plate for detecting dielectric particles by phase difference observation method, The substrate layer, the cured resin layer, and the conductive layer are arranged in order toward one side in the thickness direction. The substrate layer contains particles, The refractive index of the cured resin layer is 1.55 or higher. The laminate for detection plates has a cured resin layer surface that does not have protrusions caused by the particles.

2. The laminate for a detection plate according to claim 1, wherein the base material layer has an easy-adhesion layer containing particles on the surface of the cured resin layer.

3. The laminate for detection plates according to claim 1 or 2, wherein the particles are silica.

4. The laminate for a detection plate according to any one of claims 1 to 3, wherein the cured resin layer contains second particles with a refractive index of 1.60 or higher.

5. The laminate for detection plates according to claim 4, wherein the average particle diameter of the second particles is 10 nm or more and 200 nm or less.

6. The laminate for detection plates according to claim 4 or 5, wherein the second particle is zirconia.

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