Flexible substrate, test jig

Abstract

This invention provides a flexible substrate that is not easily damaged even when locally stressed. The flexible substrate includes: one end; another end; and a patterned portion 31a3, formed at least between the one end and the other end. The patterned portion 31a3 has a tongue 31a4 formed by a cut. The tongue 31a4 is electrically connected to other components. A plurality of portions electrically connected to other components are provided in the tongue 31a4. The tongue 31a4 is formed at the end of a signal line.

Description

Technical Field

[0001] The present invention relates to a flexible substrate and the like. Prior Art

[0002] In the past, as described in Patent Document 1, a flexible substrate that can be freely stretched and contracted has been proposed.

[0003] [Prior Art Documents]

[0004] [Patent Documents]

[0005]

[0006] Patent Document 1: Japanese Patent Application Laid-Open No. 2020-92277 Summary of the Invention Problems to be Solved by the Invention

[0007] However, when a local force is applied to the flexible substrate, there is a risk of damage such as bending in a part of the flexible substrate.

[0008] Therefore, an object of the present invention is to provide a flexible substrate and the like that are not easily damaged even when a local force is applied. Means for Solving the Problems

[0009] The flexible substrate of the present invention includes: one end; the other end; and a pattern portion formed at least between the one end and the other end. The pattern portion has a tongue piece formed by a cut. The tongue piece is electrically connected to other members. Effects of the Invention

[0010] Thus, according to the present invention, a flexible substrate and the like that are not easily damaged even when a local force is applied can be provided. Brief Explanation of the Drawings

[0011]

[0012] FIG. 1 is an exploded perspective view of the inspection jig of the present embodiment.

[0013] FIG. 2 is an exploded perspective view of the connector contact portion, the substrate holding portion, and the substrate portion.

[0014] Figure 3 is an exploded perspective view of the front substrate assembly.

[0015] Figure 4 is a perspective view of the front flexible substrate viewed from the front and from below.

[0016] Figure 5 is a perspective view of the front flexible substrate viewed from the rear and from below.

[0017] Figure 6 is a perspective view of the area with the tongue on the front flexible substrate, viewed from the front and from below.

[0018] Figure 7 is an exploded perspective view of the assembly of the front flexible substrate and the front connector, the front retaining part, the front connector base, and the front probe group.

[0019] Figure 8 is an exploded perspective view of the rear substrate assembly.

[0020] Figure 9 is a perspective view of the inspection fixture viewed from the front and bottom.

[0021] Figure 10 is a front view of the inspection fixture when viewed from the front.

[0022] Figure 11 shows the inspection fixture and the connector for the inspection object in the first state, and includes a yz cross-sectional view of the region with the first spring.

[0023] Figure 12 is an enlarged xz cross-sectional view of the tongue-shaped area of ​​the flexible substrate on the front side in the first state.

[0024] Figure 13 shows the inspection fixture and the connector for the inspection object in the second state, and includes a yz cross-sectional view of the region with the first spring.

[0025] Figure 14 shows the inspection fixture and the connector for the inspection object in the third state, and includes a yz cross-sectional view of the region with the first spring.

[0026] Figure 15 shows the fourth state of the inspection fixture and the connector for the inspection object, and includes a yz cross-sectional view of the region with the first spring.

[0027] Figure 16 is an enlarged xz cross-sectional view of the tongue-shaped area of ​​the flexible substrate on the front side before the fourth state.

[0028] Figure 17 shows the fifth state of the inspection fixture and the connector for the inspection object, and includes a yz cross-sectional view of the region with the first spring.

[0029] Figure 18 shows a perspective view of the first flexible substrate, the second flexible substrate, and the third flexible substrate.

[0030] Figure 19 is a perspective view of the front flexible substrate, composed of different individuals, mounted on the front retaining part, viewed from the front and from the top.

[0031] Figure 20 is a perspective view of the front flexible substrate, composed of different individuals, mounted on the front retaining part, viewed from the rear and from the top.

[0032] Figure 21 is a perspective view of a front flexible substrate consisting of different individuals mounted on a front retaining part, and a front connector mounted on the connector connection end of the first flexible substrate, viewed from the front and from the top. Implementation

[0033] The following uses Figures 1 to 17 to illustrate this embodiment. Furthermore, the embodiments are not limited to the following embodiments. In addition, the content described in one embodiment generally applies equally to other embodiments. Furthermore, the embodiments and variations can be appropriately combined.

[0034] (Inspection fixture 1)

[0035] As shown in Figure 1, the inspection fixture 1 of this embodiment includes a connector contact portion 10, a substrate holding portion 20, a substrate portion 30, and a horizontal position adjustment portion 40. The inspection fixture 1 contacts the inspection object connector (BtoB (Board to Board) connector) 100 of the inspection object via the connector contact portion 10, and is electrically connected to the internal front flexible substrate 31a and rear flexible substrate 32a. The inspection object connector 100 is omitted from the illustration in Figure 1.

[0036] To illustrate the directions, the horizontal direction (front-to-back direction) of the arrangement of the two substrate assemblies (front substrate assembly 31 and rear substrate assembly 32) is defined as the x-direction; the direction perpendicular to the x-direction and where the two support portions 43 are arranged (left-right direction) is defined as the y-direction; and the direction perpendicular to both the x- and y-directions (up-down direction) is defined as the z-direction. In Figure 1, the directions indicated by the arrows on the x, y, and z axes are defined as the forward direction, right direction, and up direction, respectively. Specifically, the direction from the rear substrate assembly 32 toward the front substrate assembly 31 is defined as the forward direction. Furthermore, the direction from the support portion 43 located in the lower right of Figure 1 toward the support portion 43 located in the upper left of Figure 1 is defined as the right direction. Finally, the direction from the connector contact portion 10 toward the horizontal position adjustment portion 40 is defined as the up direction.

[0037] (Connector contact 10)

[0038] As shown in Figure 2, the connector contact portion 10 includes a floating guide (first movable member) 11 and a first spring (first elastic member) 13. The floating guide 11 has a through hole in the z-direction. The lower end of the lower retaining portion 21 and the lower end of the base plate portion 30 are inserted into the hole of the floating guide 11 from the upper z-direction. The upper end of the inspection target connector 100 is inserted into the hole of the floating guide 11 from the lower z-direction. That is, the inspection target connector 100 is installed in the floating guide 11 in a detachable state.

[0039] Ideally, the guide portion 11a with an inclined shape whose opening gradually increases on the lower side of the hole in the floating guide 11 in the z direction should be provided so that the insertion of the inspection object connector 100 can be easily performed.

[0040] The floating guide 11 is mounted to the lower retaining portion 21 by means of screws on the upper side of the z-direction. A first spring 13 is provided between the floating guide 11 and the lower retaining portion 21. The first spring 13 pushes the floating guide 11 away from the front flexible substrate 31a and the rear flexible substrate 32a in the z-direction. Therefore, when the inspection fixture 1 is pushed into the inspection object connector 100, etc., from the upper side of the z-direction, the floating guide 11 and the lower retaining portion 21 will be held in the disengaged state by the first spring 13 as long as no force is applied in the direction that will compress in the z-direction.

[0041] (Substrate holding section 20)

[0042] The substrate holding portion 20 has a lower holding portion (pin block frame) 21 and an upper holding portion (connecting plate) 23. The lower holding portion 21 is located on the lower side of the substrate portion 30 in the z-direction. The upper holding portion 23 is located on the upper side of the substrate portion 30 in the z-direction. The lower holding portion 21 and the upper holding portion 23 are separated from the substrate portion 30 in the z-direction.

[0043] The lower retaining portion 21 has a through hole in the z-direction. The lower end of the substrate portion 30 is inserted into the hole in the lower retaining portion 21 from the upper z-direction. A protrusion is formed on the lower z-direction side of the lower retaining portion 21. This protrusion is inserted into the hole of the floating guide 11 from the upper z-direction.

[0044] On the upper z-direction of the lower retaining portion 21, a front retaining portion 31c of the front substrate assembly 31 and a rear retaining portion 32c of the rear substrate assembly 32 are mounted. The front retaining portion 31c is mounted to the lower retaining portion 21 by fitting and attaching it using a boss hole. The rear retaining portion 32c is mounted to the lower retaining portion 21 by attaching it.

[0045] On the lower z-direction side of the upper retaining portion 23, a front push block 31i of the front substrate assembly 31 and a rear push block 32i of the rear substrate assembly 32 are mounted. The front push block 31i is mounted to the upper retaining portion 23 by a screw-in method using a round hole extending upwards in the z-direction. The rear push block 32i is mounted to the upper retaining portion 23 by a screw-in method using an elongated hole extending upwards in the x-direction extending upwards in the z-direction. The elongated hole extending in the x-direction of the upper retaining portion 23 is used to adjust the x-direction spacing between the front retaining portion 31c of the front push block 31i and the rear retaining portion 32c of the rear push block 32i.

[0046] The x-direction spacing between the front retaining portion 31c and the rear retaining portion 32c is determined by the x-direction spacing corresponding to the electrode positions of the connector 100 under inspection. When the x-direction spacing of the electrodes of the connector 100 under inspection is narrow, the front retaining portion 31c and the rear retaining portion 32c are installed on the lower retaining portion 21, and the front push block 31i and the rear push block 32i are installed on the upper retaining portion 23, while the x-direction spacing between the front retaining portion 31c and the rear retaining portion 32c is narrow. When the x-direction spacing of the electrodes of the connector 100 under inspection is wide, the front retaining portion 31c and the rear retaining portion 32c are installed on the lower retaining portion 21, and the front push block 31i and the rear push block 32i are installed on the upper retaining portion 23, while the x-direction spacing between the front retaining portion 31c and the rear retaining portion 32c is wide.

[0047] That is, the substrate holding part 20 holds a plurality of flexible substrates (front flexible substrate 31a and rear flexible substrate 32a) at an adjustable interval in the x-direction.

[0048] (Substrate part 30)

[0049] The substrate portion 30 has a front substrate assembly 31 and a rear substrate assembly 32. The front substrate assembly 31 is disposed on the front side in the x-direction, and the rear substrate assembly 32 is disposed on the rear side in the x-direction.

[0050] (Front side substrate assembly 31)

[0051] As shown in Figure 3, the front substrate assembly 31 has a front flexible substrate (flexible substrate) 31a, a front connector 31b, a front retaining part 31c, a front connector seat 31d, a front connector pressing rubber 31e, a front connector cover 31f, a front probe group 31g, a front second spring 31h, and a front push block (second movable member) 31i.

[0052] (Front flexible substrate 31a)

[0053] As shown in Figures 4 to 6, the front flexible substrate 31a has a connector connection end (one end) 31a1, a retaining part connection end (the other end) 31a2, and a pattern part 31a3.

[0054] The connector connection end 31a1 is located at the front end of the front flexible substrate 31a in the x-direction and the upper end in the z-direction, and the front connector 31b is mounted on the connector connection end 31a1 by soldering or the like. The retaining part connection end 31a2 is located at the rear end of the front flexible substrate 31a in the x-direction and the upper end in the z-direction, and is hooked onto the front retaining part 31c. Specifically, a hole 31a21 provided in the retaining part connection end 31a2 is inserted into a boss 31c3 located on the upper end of the probe receiving part 31c1 in the z-direction of the front retaining part 31c. However, the hooking of the retaining part connection end 31a2 and the front retaining part 31c is not limited to the insertion of the hole 31a21 and the boss 31c3.

[0055] The patterned portion 31a3 is the area between the connector connection end 31a1 and the retaining portion connection end 31a2. On the lower (surface) side of the patterned portion 31a3 in the z-direction, a pattern of signal lines and ground lines extending from the connector connection end 31a1 is formed. The patterned portion 31a3 is bent into a roughly V-shape when viewed from the y-direction. The ends of the signal lines and ground lines are located in the lower part of the lower surface of the patterned portion 31a3 in the z-direction, which is bent into a roughly V-shape. These ends of the signal lines and ground lines are used as substrate-side electrodes electrically connected to the electrodes of the connector 100 under inspection. Furthermore, a slit S is provided around the ends of the signal lines and ground lines (including the area of ​​the patterned portion 31a3 electrically connected to the connector 100 under inspection). A roughly U-shaped tongue 31a4 is formed by this slit S. The slit S is a cut with closed ends (open slit), but it can also be an open end on one end and a closed end on the other. Furthermore, the pattern on the lower (surface) side of the pattern section 31a3 in the z-direction is not limited to signal lines and grounding lines. On the lower (surface) side of the pattern section 31a3 in the z-direction, a plurality of through holes 31a5 and grounding lines can be provided only in the area connected to the connector 100 under inspection (including the area containing the tongue 31a4) and in the area of ​​the connector connection end 31a1 for soldering the front connector 31b. In this case, since the area for providing grounding lines is reduced, it is more cost-effective than having the grounding line pattern covering the entire lower (surface) side of the pattern section 31a3 in the z-direction.

[0056] To increase the amount by which the probe P of the front probe group 31g is displaced downwards in the z-direction, it is preferable to increase the length of the slit S forming the tongue 31a4 in the longitudinal direction. On the other hand, to prevent the signal line's characteristics from deteriorating in the high-frequency region, it is preferable to shorten the length of the slit S forming the tongue 31a4 in the longitudinal direction. Therefore, the length of the slit S forming the tongue 31a4 in the longitudinal direction must be determined while considering the amount of downward displacement of the tongue 31a4 in the z-direction and the characteristics of the signal line in the high-frequency region. A single tongue 31a4 may contain only one signal line, ground line, or power line, or it may contain at least one of a plurality of signal lines, ground lines, and power lines.

[0057] Furthermore, the tongue 31a4 formed by the slit S is not limited to a general U-shape. When the patterned portion 31a3 is not extended, it can also be other shapes such as a general V-shape, a general C-shape, a general L-shape, or a general groove shape, as long as it can be moved from the upper side of the z-direction to the lower side of the z-direction by the probe P of the front probe group 31g.

[0058] On the z-direction upper (back) side of the pattern section 31a3, that is, the side opposite to the side electrically connected to the connector 100 under inspection, a ground wire or ground plane is provided that is different from the ground wire on the z-direction lower (surface) side. The pattern section 31a3 has a plurality of through holes 31a5 for electrically connecting the z-direction upper and lower surfaces. Figures 4 to 6 show examples of having a plurality of through holes 31a5. However, the arrow line of the component symbol "31a5" only indicates one of the plurality of through holes 31a5.

[0059] When a plurality of through holes 31a5 are provided in the patterned portion 31a3, even if other components are electrically connected only on one side of the patterned portion 31a3 (the side electrically connected to other components, the surface side), the other side of the patterned portion 31a3 (the opposite side of the side electrically connected to other components, the back side) can be electrically connected to other components.

[0060] Furthermore, depending on the specifications of the connector 100 being inspected, the grounding wire or ground plane on the upper surface of the patterned portion 31a3 in the z-direction and the plurality of through holes 31a5 may also be omitted. In addition, in figures other than Figures 4 to 6, the signal lines and grounding wires of the patterned portion 31a3, the slit S, the tongue 31a4, and the through holes 31a5 are omitted from the illustration.

[0061] In addition, a plurality of through holes 31a5 and a grounding area (grounding wire or ground plane) on the upper (back) side in the z-direction may be provided only in the area connected to the connector 100 of the object under inspection (including the area containing the tongue 31a4) and the area of ​​the connector connection end 31a1 for soldering the front connector 31b.

[0062] (Front connector 31b)

[0063] As shown in Figure 7, the front connector 31b is installed on the connector connection end 31a1 of the front flexible substrate 31a. The front connector 31b is used to electrically connect the front flexible substrate 31a to an inspection device (not shown).

[0064] (Front retaining part 31c)

[0065] The front retaining portion 31c holds the front connector seat 31d in the x-direction. The front retaining portion 31c holds the retaining portion connection end 31a2 of the front flexible substrate 31a in the x-direction.

[0066] (Probe receiving part 31c1)

[0067] On the rear side in the x-direction and the lower side in the z-direction of the front retaining part 31c, there is a probe receiving part 31c1 for holding the front probe group 31g. The probe receiving part 31c1 is formed of resin material. When the probe receiving part 31c1 is formed of resin material, it is lighter and easier and cheaper to process than when the probe receiving part 31c1 is formed of metal material. Alternatively, the probe receiving part 31c1 can also be formed of metal material.

[0068] The probe receiving portion 31c1 is composed of a groove (upper groove 31c11, lower groove 31c12) extending in the z-direction and a hole (upper hole 31c13, lower hole 31c14) extending in the z-direction. The widths of the upper groove 31c11 and lower groove 31c12 in the x and y directions are larger than the outer diameters of the spring receiving portion (cylinder) P2 of the probe P constituting the front probe group 31g. The upper end of the upper hole 31c13 communicates with the lower end of the upper groove 31c11, and the lower end of the upper hole 31c13 communicates with the upper end of the lower groove 31c12. The inner diameter of the upper hole 31c13 is larger than the outer diameter of the spring receiving portion P2 of the probe P constituting the front probe group 31g. The upper end of the lower hole portion 31c14 is connected to the lower end of the lower groove portion 31c12, and the lower end of the lower hole portion 31c14 is open. The inner diameter of the lower hole portion 31c14 is larger than the outer diameter of the front end portion P1 of the probe P constituting the front probe group 31g, and smaller than the outer diameter of the spring receiving portion P2.

[0069] (Method for forming probe receiving part 31c1)

[0070] The upper groove portion 31c11 and the lower groove portion 31c12 are formed using a metal mold. The holes in the upper hole portion 31c13 and the lower hole portion 31c14 are formed by drilling holes in the cuboid region using pins or the like. However, the method of forming the probe receiving portion 31c1 is not limited to the above.

[0071] (Mounting of the front flexible substrate 31a to the front retaining part 31c)

[0072] The front flexible substrate 31a is mounted on the front retaining portion 31c in a manner that satisfies the following two conditions. First condition: The lower side of the front retaining portion 31c in the z-direction faces the upper side of the patterned portion 31a3 of the front flexible substrate 31a in the z-direction. Second condition: The ends of the signal lines and ground lines of the patterned portion 31a3 of the front flexible substrate 31a are located on the lower side of the lower hole portion 31c14 of the probe receiving portion 31c1 of the front retaining portion 31cc in the z-direction.

[0073] (Push block groove 31c2)

[0074] On the upper z-direction of the probe receiving portion 31c1 of the front retaining portion 31c, there is a groove (push block groove 31c2) with an opening formed on the upper z-direction. In the push block groove 31c2, the front push block 31i is inserted from the upper z-direction (see Figure 3).

[0075] (31c3 boss)

[0076] On the upper side of the probe receiving portion 31c1 of the front holding portion 31c in the z-direction, there is a boss 31c3 extending upward in the z-direction. The boss 31c3 is used to attach to the holding portion connection end 31a2 of the front flexible substrate 31a.

[0077] (Front connector 31d)

[0078] The front connector seat 31d holds the front connector 31b in the x-direction. The front connector seat 31d is located further forward in the x-direction than the front retaining part 31c and is mounted on the front retaining part 31c.

[0079] The assembly of the front flexible substrate 31a and the front connector 31b clamps the front retaining portion 31c and the front connector seat 31d in the x-direction, and is mounted on the assembly of the front retaining portion 31c and the front connector seat 31d in such a way that it covers the lower end of the front retaining portion 31c. The front retaining portion 31c is mounted on the front connector seat 31d by screwing from the rear in the x-direction.

[0080] (Front connector press rubber 31e)

[0081] The front connector pressing rubber 31e is located between the front connector 31b and the front connector cover 31f. The front connector pressing rubber 31e is used to minimize the adverse effects on the electrical connection with the inspection device caused by the uneven height of the front connector 31b. Furthermore, the front connector pressing rubber 31e is used to prevent the front connector 31b from shifting during the installation and removal of cables extending from the inspection device.

[0082] (Front connector cover 31f)

[0083] The front connector cover 31f covers the patterned portion 31a3 of the front flexible substrate 31a and the front side of the front connector 31b in the x-direction. The front connector cover 31f is used to mount the front connector seat 31d by screwing it from the front side in the x-direction. The front connector cover 31f and the front connector seat 31d clamp the front connector 31b and the front connector pressing rubber 31e in the x-direction.

[0084] (Anterior probe group 31g)

[0085] The front probe group 31g has a plurality of probes (telescopic members) P that extend and retract in the z-direction. The plurality of probes P are arranged in the y-direction. Each probe P constituting the front probe group 31g has a front end portion P1 on the lower side in the z-direction, and a spring receiving portion P2 on the upper side in the z-direction further than the front end portion P1. A spring (not shown) is housed in the spring receiving portion P2. The front end portion P1 is pushed by the spring in the spring receiving portion P2 in the direction of its full length extension.

[0086] When the front flexible substrate 31a is mounted on the front holding portion 31c, and each of the probes P constituting the front probe group 31g is placed on the probe receiving portion 31c1 of the front holding portion 31c, the front end P1 of the probe P protrudes downward in the z-direction from the hole (lower hole portion 31c14) at the lower end of the probe receiving portion 31c1. However, the spring receiving portion P2 is held by the step difference between the lower hole portion 31c14 and the lower groove portion 31c12, so the probe P will not fall out of the lower hole portion 31c14.

[0087] When the front flexible substrate 31a is mounted on the front holding portion 31c, and each of the probes P constituting the front probe group 31g is placed on the probe receiving portion 31c1 of the front holding portion 31c, the front end P1 of the probe P is connected to the back side of the region of the front flexible substrate 31a having a tongue 31a4. For example, the first probe P among the plurality of probes P is in a positional relationship connected to one of the regions of the front flexible substrate 31a that is electrically connected to the connector 100 to be inspected (one of the tongues 31a4). Furthermore, the second probe P among the plurality of probes P, which is different from the first probe P, is in a positional relationship connected to one of the regions of the front flexible substrate 31a that is electrically connected to the connector 100 to be inspected (one of the tongues 31a4), and is different from the tongue 31a4 corresponding to the first probe P. However, since the probe P is relatively light, it is only connected and hardly causes the tongue 31a4 to shift downward in the z-direction.

[0088] The mounting of the assembly of the front flexible substrate 31a and the front connector 31b onto the assembly of the front retaining part 31c and the front connector seat 31d is performed with each of the probes P constituting the front probe group 31g placed on the probe receiving part 31c1.

[0089] (Front side second spring 31h, front side push block 31i)

[0090] The front pusher 31i is inserted into the groove (pusher groove 31c2) of the front retaining portion 31c from the upper side in the z-direction, while being movable in the z-direction. The front pusher 31i is used to push each of the probes P constituting the front probe group 31g downward in the z-direction. That is, the plurality of probes P constituting the front probe group 31g are disposed between the front flexible substrate 31a and the front pusher 31i.

[0091] A front second spring 31h is provided between the front retaining part 31c and the front push block 31i. The front second spring 31h pushes the front push block 31i in a way that causes the front push block 31i to move away from the front retaining part 31c in the z direction.

[0092] When a force is applied in the direction of compression in the z-direction, in order to complete the compression of the first spring 13 in the z-direction, and then complete the compression of the front second spring 31h and the rear second spring 32h (described later), the spring characteristics (spring compression, spring constant, etc.) of the first spring 13, the front second spring 31h, and the rear second spring 32h are set. That is, after the first spring 13 is compressed, the front second spring 31h and the rear second spring 32h are compressed.

[0093] That is, when the front flexible substrate 31a and the rear flexible substrate 32a are connected to the inspection target connector 100, as described below, the movement control of the floating guide 11 and the front flexible substrate 31a and the rear flexible substrate 32a is performed by the first spring 13, the front second spring 31h, and the rear second spring 32h. After the first distance d1 between the floating guide 11 and the front flexible substrate 31a and the rear flexible substrate 32a shortens, the second distance d2 between the front push block 31i and the front flexible substrate 31a shortens, and at approximately the same time, the second distance d2 between the rear push block 32i and the rear flexible substrate 32a shortens.

[0094] For example, the first distance d1 is the z-direction distance between the lower end of the floating guide 11 (the opening area for the insertion of the inspection target connector 100) and the lower end of the front flexible substrate 31a (the area of ​​the patterned portion 31a3 electrically connected to the inspection target connector 100). For example, the second distance d2 is the z-direction distance between the lower end of the front push block 31i (the area connected to the front probe group 31g) and the lower end of the front flexible substrate 31a (the area of ​​the patterned portion 31a3 electrically connected to the inspection target connector 100) (see Figure 9).

[0095] Therefore, even if the inspection fixture 1 is pushed into the inspection object connector 100 from the z-direction upwards, and force is applied in the direction that needs to be compressed in the z-direction, as long as the first spring 13 is not compressed, the front push block 31i and the front retaining part 31c will be kept apart by the front second spring 31h, and the rear push block 32i and the rear retaining part 32c will be kept apart by the rear second spring 32h.

[0096] (Rear substrate assembly 32)

[0097] The rear substrate assembly 32 includes a rear flexible substrate 32a, a rear connector 32b, a rear retaining part 32c, a rear connector seat 32d, a rear connector pressing rubber 32e, a rear connector cover 32f, a rear probe group 32g, a rear second spring 32h, and a rear push block (second movable member) 32i.

[0098] Except for the reversal of the x-direction orientation, the rear substrate assembly 32 is identical in configuration to the front substrate assembly 31. The rear flexible substrate 32a of the rear substrate assembly 32 corresponds to the front flexible substrate 31a of the front substrate assembly 31. The rear connector 32b of the rear substrate assembly 32 corresponds to the front connector 31b of the front substrate assembly 31. The rear retaining portion 32c of the rear substrate assembly 32 corresponds to the front retaining portion 31c of the front substrate assembly 31. The rear connector seat 32d of the rear substrate assembly 32 corresponds to the front connector seat 31d of the front substrate assembly 31. The rear connector pressing rubber 32e of the rear substrate assembly 32 corresponds to the front connector pressing rubber 31e of the front substrate assembly 31. The rear connector cover 32f of the rear substrate assembly 32 corresponds to the front connector cover 31f of the front substrate assembly 31. The rear probe group 32g of the rear substrate assembly 32 is equivalent to the front probe group 31g of the front substrate assembly 31. The rear second spring 32h of the rear substrate assembly 32 is equivalent to the front second spring 31h of the front substrate assembly 31. The rear push block 32i of the rear substrate assembly 32 is equivalent to the front push block 31i of the front substrate assembly 31.

[0099] (Horizontal position adjustment unit 40)

[0100] The horizontal position adjustment part 40 has a third spring (third elastic member) 41, a support part (third movable member) 43, and a bracket 45 (see Figure 1).

[0101] (Third spring 41, support part 43)

[0102] There are two support parts 43 in the y direction. Each of the two support parts 43 has a built-in coil spring (not shown).

[0103] The support portion 43 is used to absorb the positional shift of the area with tongue 31a4 of the front flexible substrate 31a of the front substrate assembly 31 from the position opposite to the electrode of the inspection target connector 100 in the z direction, and to absorb the positional shift of the area with tongue of the rear flexible substrate 32a of the rear substrate assembly 32 from the position opposite to the electrode of the inspection target connector 100 in the z direction.

[0104] For example, suppose that the area with the tongue 31a4 of the front flexible substrate 31a of the front substrate assembly 31 and the area with the tongue of the rear flexible substrate 32a of the rear substrate assembly 32 are offset in the xy plane from the position opposite to the electrode of the inspection target connector 100 in the z direction. At this time, when the inspection fixture 1 is installed on the inspection target connector 100, the connector contact part 10, the substrate holding part 20 and the substrate part 30 can be moved in the xy plane without moving the horizontal position adjustment part 40.

[0105] The support portion 43 is installed on the upper retaining portion 23 by screwing it downwards in the z-direction. A third spring 41 is provided between the support portion 43 and the upper retaining portion 23. The third spring 41 pushes the support portion 43 away from the upper retaining portion 23 in the z-direction.

[0106] When a force is applied in the direction of compression in the z-direction, to ensure that the compression of the third spring 41 in the z-direction is completed after the compression of the first spring 13, the front second spring 31h, the rear second spring 32h, and the third spring 41 is completed, the spring characteristics (spring compression, spring constant, etc.) of the first spring 13, the front second spring 31h, the rear second spring 32h, and the third spring 41 are compressed. That is, the third spring 41 is compressed after the compression of the first spring 13, the front second spring 31h, and the rear second spring 32h.

[0107] That is, when the front flexible substrate 31a and the rear flexible substrate 32a are connected to the inspection target connector 100, the movement control of the floating guide 11, the front push block 31i, the rear push block 32i, and the support part 43 is performed by the first spring 13, the front second spring 31h, the rear second spring 32h, and the third spring 41, as described below. After the first distance d1 between the floating guide 11 and the front flexible substrate 31a and the rear flexible substrate 32a shortens, the second distance d2 between the front push block 31i and the front flexible substrate 31a shortens, and at approximately the same time, the second distance d2 between the rear push block 32i and the rear flexible substrate 32a shortens. After the second distance d2 between the front push block 31i and the front flexible substrate 31a becomes shorter, and the second distance d2 between the rear push block 32i and the rear flexible substrate 32a becomes shorter, the third distance d3 between the support portion 43 and the front flexible substrate 31a and the rear flexible substrate 32a becomes shorter.

[0108] For example, the distance d3 is the distance in the z-direction between the lower end of the support portion 43 (the area facing the upper holding portion 23 in the z-direction) and the lower end of the front flexible substrate 31a (the area where the pattern portion 31a3 is electrically connected to the inspection object connector 100).

[0109] Therefore, even when the inspection fixture 1 is pushed into the inspection object connector 100 from the z-direction upwards and a force is applied in the direction of compression in the z-direction, as long as the first spring 13, the front second spring 31h and the rear second spring 32h are not compressed, the support part 43 and the upper retaining part 23 will be kept apart by the third spring 41.

[0110] As an example of spring characteristics, the spring characteristics of each spring can be set such that the spring pressure of the third spring 41 is higher than that of the front second spring 31h and the rear second spring 32h, and the spring pressure of the front second spring 31h and the rear second spring 32h is higher than that of the first spring 13.

[0111] Furthermore, as an example of spring characteristics, the spring characteristics of each spring can be set as follows: the combined spring constant (elastic coefficient) of the two third springs 41 is larger than the combined spring constant (elastic coefficient) of the two front second springs 31h and the two rear second springs 32h, and the combined spring constant (elastic coefficient) of the two front second springs 31h and the two rear second springs 32h is larger than the combined spring constant (elastic coefficient) of the two first springs 13.

[0112] (Bracket 45)

[0113] The bracket 45 is mounted on a device (not shown) that holds and moves the inspection fixture 1, such as an inspection apparatus or machine tool. The bracket 45 is mounted on the upper side of the two support parts 43 in the z-direction. The bracket 45 is mounted on the support parts 43 by screws from the upper side in the z-direction.

[0114] As shown in Figures 9 and 10, the first spring 13, the front second spring 31h, and the rear second spring 32h are configured such that a portion of the first spring 13 is visible from the outside, while the front second spring 31h and the rear second spring 32h are almost invisible from the outside (not visible from the front in the x-direction and the rear in the x-direction). Furthermore, the third spring 41 is configured such that, in its extended state, at least a portion of the third spring 41 is visible from the outside.

[0115] (Materials, metal parts, resin parts for each department)

[0116] The conductive areas of the front flexible substrate 31a, the front probe group 31g, the rear probe group 32g, and the screws in the components constituting the inspection fixture 1 are made of metal. The other components constituting the inspection fixture 1 are made of non-conductive materials such as resin.

[0117] (Inspect the connection procedure of the inspection fixture 1 for the connector 100 being inspected)

[0118] Next, the changes in the extension and retraction state of the first spring 13 when the inspection fixture 1 is moved from the upper z-direction to the lower z-direction and connected to the inspection object connector 100 will be explained (Figs. 11 to 17).

[0119] Furthermore, the rear second spring 32h is not shown in the yz-sectional configuration diagrams of Figures 11, 13 to 15, and 17. However, the rear second spring 32h is located behind the front second spring 31h in the x-direction and extends and retracts in the same manner as the front second spring 31h. Additionally, the rear push block 32i is not shown in the yz-sectional configuration diagrams of Figures 11, 13 to 15, and 17. However, the rear push block 32i is located behind the front push block 31i in the x-direction and moves in the same manner as the front push block 31i. Furthermore, the rear probe group 32g is not shown in the yz-sectional configuration diagrams of Figures 11, 13 to 15, and 17. However, the rear probe group 32g is located behind the front probe group 31g in the x-direction and operates in the same manner as the front probe group 31g. Finally, the tongue of the rear flexible substrate 32a is not shown. However, the tongue of the rear flexible substrate 32a is located behind the tongue 31a4 of the front flexible substrate 31a in the x direction, and is displaced in the same manner as the tongue 31a4 of the front flexible substrate 31a.

[0120] As shown in Figure 11, before the inspection fixture 1 contacts the inspection object connector 100, the first spring 13, the front second spring 31h, the rear second spring 32h, and the third spring 41 are in an extended state, and the first distance d1, the second distance d2, and the third distance d3 have not shortened (first state). At this time, the front end P1 of the probe P constituting the front probe group 31g in the z-direction downward side is connected to the tongue 31a4 of the front flexible substrate 31a (see Figure 12). However, since the probe P is relatively light, the tongue 31a4 of the front flexible substrate 31a is hardly pushed downward in the z-direction downward side. Similarly, the front end P1 of the probe P constituting the rear probe group 32g in the z-direction downward side is connected to the tongue of the rear flexible substrate 32a. However, since the probe P is relatively light, the tongue of the rear flexible substrate 32a is hardly pushed downward in the z-direction downward side.

[0121] As shown in Figure 13, immediately after the inspection target connector 100 is inserted into the hole of the floating guide 11 of the inspection fixture 1, the first spring 13, the front second spring 31h, the rear second spring 32h, and the third spring 41 are in an extended state, and the first distance d1, the second distance d2, and the third distance d3 have not shortened (second state). At this time, the front flexible substrate 31a and the rear flexible substrate 32a are not in contact with the inspection target connector 100.

[0122] As shown in Figure 14, when the inspection fixture 1 moves further down in the z direction from the second state, the first spring 13 is compressed in the z direction, and the lower holding part 21 approaches the floating guide 11 (third state).

[0123] At this time, the front flexible substrate 31a and the rear flexible substrate 32a are in a state close to the connector 100 being inspected. Therefore, the first distance d1 in the third state is shorter than the first distance d1 in the second state. However, the front second spring 31h, the rear second spring 32h, and the third spring 41 are almost uncompressed. Therefore, the second distance d2 in the third state is almost not shorter than the second distance d2 in the second state. The third distance d3 in the third state is almost not shorter than the third distance d3 in the second state.

[0124] As shown in Figure 15, when the inspection fixture 1 moves further down in the z-direction from the third state, the front second spring 31h is compressed in the z-direction, and the front push block 31i approaches the front holding part 31c (fourth state). Similarly, the rear second spring 32h is compressed in the z-direction, and the rear push block 32i approaches the rear holding part 32c.

[0125] Furthermore, by moving the front push block 31i downward in the z-direction, the probe P of the front probe group 31g moves downward in the z-direction, and the front end P1 of the probe P presses against the back side (upper z-direction) of the front flexible substrate 31a. This causes the tongue 31a4 of the front flexible substrate 31a to be pushed downward in the z-direction (see Figure 16). That is, the probe P of the front probe group 31g brings the tongue 31a4 of the front flexible substrate 31a close to the electrode of the connector 100 being inspected. Similarly, by moving the rear push block 32i downward in the z-direction, the probe P of the rear probe group 32g moves downward in the z-direction, and the front end P1 of the probe P presses against the back side (upper z-direction) of the rear flexible substrate 32a. This causes the tongue of the rear flexible substrate 32a to be pushed downward in the z-direction. That is, by means of the probe P of the rear probe group 32g, the tongue of the rear flexible substrate 32a is brought close to the electrode of the connector 100 to be inspected.

[0126] Herein, the front flexible substrate 31a and the rear flexible substrate 32a are electrically connected to the inspection target connector 100. Furthermore, the first distance d1 in the fourth state is shorter than the first distance d1 in the third state. Additionally, the front push block 31i and the rear push block 32i are pushed downwards to the lowest point of their movable range in the z-direction. Therefore, the second distance d2 in the fourth state is shorter than the second distance d2 in the third state. However, the third spring 41 hardly compresses. Therefore, the third distance d3 in the fourth state is almost not shorter than the third distance d3 in the third state.

[0127] As shown in Figure 17, when the inspection fixture 1 moves further downward in the z-direction from the fourth state, the third spring 41 is compressed in the z-direction, and the support 43 and the bracket 45 approach the upper retaining part 23 (fifth state). At this time, the support 43 is in a state close to the upper retaining part 23. Therefore, the third distance d3 in the fifth state is shorter than the third distance d3 in the fourth state.

[0128] Whether the front second spring 31h and the rear second spring 32h have become compressed cannot be visually discerned from the front and rear sides in the x-direction. Furthermore, whether the front push block 31i and the rear push block 32i have moved downwards in the z-direction cannot be visually discerned from the front and rear sides in the x-direction. However, a portion of the third spring 41 can be visually discerned from the outside when it is at least in an extended state. Therefore, by observing the area with the third spring 41 from the outside, it can be confirmed whether the third spring 41 has begun to compress significantly, and thus whether the front flexible substrate 31a and the rear flexible substrate 32a have become electrically connected to the connector 100 under inspection after the front push block 31i and the others have moved downwards in the z-direction.

[0129] (Inspecting the effectiveness of the two-stage elastic component used in fixture 1)

[0130] First, the inspection target connector 100 is brought close to the front flexible substrate 31a and the rear flexible substrate 32a via the floating guide 11. Then, the front push block 31i, the rear push block 32i, and the probe P are used to connect the front flexible substrate 31a and the rear flexible substrate 32a to the inspection target connector 100. Therefore, the electrical connection between the front flexible substrate 31a and the rear flexible substrate 32a included in the inspection fixture 1 and the inspection target connector 100 can be performed without causing significant deformation or displacement of the front flexible substrate 31a and the rear flexible substrate 32a. That is, the electrical connection between the front flexible substrate 31a and the rear flexible substrate 32a included in the inspection fixture 1 and the inspection target connector 100 can be performed without easily damaging the inspection fixture 1 containing the front flexible substrate 31a and the rear flexible substrate 32a.

[0131] (The function of setting up support part 43 and bracket 45)

[0132] The inspection fixture 1 can be installed on a working machine or the like via the support part 43 and the bracket 45.

[0133] (The effect of placing the third spring 41 in a visible position)

[0134] After the compression of the first spring 13, the front second spring 31h, and the rear second spring 32h is completed, the degree of expansion and contraction of the third spring 41 caused by the compression can be observed to determine whether the connection between the front flexible substrate 31a, the rear flexible substrate 32a, and the inspection target connector 100 has been completed. Therefore, by applying the minimum required force to the front flexible substrate 31a and the rear flexible substrate 32a, the front flexible substrate 31a and the rear flexible substrate 32a can be connected to the inspection target connector 100.

[0135] (The effect of setting multiple flexible substrates)

[0136] The inspection object connector 100, which has multiple rows of electrodes, can be electrically connected to multiple flexible substrates (front flexible substrate 31a and rear flexible substrate 32a). Furthermore, the inspection fixture 1 can be configured by adjusting the spacing of the multiple flexible substrates (front flexible substrate 31a and rear flexible substrate 32a) according to the spacing of the multiple rows.

[0137] (The effect of individually pressing with probe P)

[0138] Considering the uneven height of the parts (electrodes) in contact with the connector 100 of the object being inspected in the signal line and ground line, each electrode presses against the telescopic member of the probe P, etc., to reliably connect each electrode to the connector 100 of the object being inspected.

[0139] (The effect of providing tongues on the front flexible substrate 31a and the rear flexible substrate 32a)

[0140] To absorb the unevenness in electrode height, when the probe P and other telescopic members apply localized force, the tongue 31a4 formed on the front flexible substrate 31a of the region containing the applied force moves away from other areas of the tongue 31a4 adjacent to the front flexible substrate 31a via the slit S and displaces in the direction of the pressure (downward in the z-direction). Furthermore, the tongue formed on the rear flexible substrate 32a of the region containing the applied force moves away from other areas of the tongue adjacent to the rear flexible substrate 32a via the slit S and displaces in the direction of the pressure (downward in the z-direction). Therefore, compared to the case without tongues, even with displacement, the flexible substrates (front flexible substrate 31a, rear flexible substrate 32a) are less prone to breakage.

[0141] (The effect of having multiple electrodes in a single tongue)

[0142] Compared to a configuration where only one electrode is provided on a tongue 31a4, the number of slits S can be reduced, making it easier to form the tongue 31a4 in narrow areas. The same applies to the tongue of the rear flexible substrate 32a.

[0143] (The benefits of using the end as an electrode)

[0144] When electrical connections are made to other components along the signal line, there is a risk that the connection point may function as an antenna and transmit / receive noise between itself and the end. Making electrical connections to other components near the end can reduce noise transmission and reception. Additionally, when electrical connections are made to other components along the ground wire, impedance matching may be disrupted.

[0145] (Examples of applications for the shape of flexible substrates)

[0146] In this embodiment, an example has been described where the flexible substrate (front flexible substrate 31a, rear flexible substrate 32a) is composed of a single flexible substrate. However, the flexible substrate may also be composed of a plurality of flexible substrates (see Figures 18 to 21).

[0147] For example, the front flexible substrate 31a has a first flexible substrate 311a containing signal lines for use as RF lines, a second flexible substrate 312a containing ground lines for use as ground lines, and a third flexible substrate 313a containing power lines for use as power lines. The first flexible substrate 311a, the second flexible substrate 312a, and the third flexible substrate 313a are composed of different individuals. Each of the first flexible substrate 311a, the second flexible substrate 312a, and the third flexible substrate 313a has a connector connection end (one end) 31a1, a holding connection end (the other end) 31a2, and a patterned portion 31a3. Furthermore, a tongue 31a4 is formed in the patterned portion 31a3 of each of the first flexible substrate 311a, the second flexible substrate 312a, and the third flexible substrate 313a. In addition, a through hole 31a5 is provided in the connector connection end 31a1 of the first flexible substrate 311a. Furthermore, a through hole 31a5 is provided in the patterned portion 31a3 of the second flexible substrate 312a.

[0148] The locking system between the retaining part connecting end 31a2 and the front retaining part 31c is configured as follows. As shown in FIG20, a plurality of upper protrusions 31c4 and a plurality of lower protrusions 31c5 are provided on the rear side of the front retaining part 31c in the x direction. A necked-down portion provided on the retaining part connecting end 31a2 is embedded in the lower protrusion 31c5. A hole provided on the front end side of the necked-down portion of the retaining part connecting end 31a2 is embedded in the upper protrusion 31c4. The upper protrusion 31c4 is used for positioning (longitudinal positioning) of the retaining part connecting end 31a2 during fixing, and for positioning in the x direction during fixing. The lower protrusion 31c5 is located further down in the z direction than the upper protrusion 31c4 and is used for positioning in the y direction during fixing. Since the lower protrusion 31c5, which is closer to the tongue 31a4 than the upper protrusion 31c4, is used for positioning in the y-direction, the front flexible substrate 31a can be positioned more accurately than the type of positioning in the y-direction that is located away from the tongue 31a4.

[0149] (The effect of a flexible substrate being composed of multiple flexible substrates)

[0150] By using different individual components, a flexible substrate that can be easily used with connectors of various shapes (front connector 31b, rear connector 32b), inspection devices, and inspection object connectors 100 is made available. This reduces the need to prepare individually specially shaped flexible substrates, thus helping to reduce manufacturing costs and other expenses. Furthermore, by using different individual components, even if a portion of a flexible substrate has a wide section and physical interference occurs with other flexible substrates on the same plane, that portion can be offset to avoid physical interference.

[0151] In the examples shown in Figures 18 to 21, a wide portion (connector connection end 31a1) is located on a part of the first flexible substrate 311a. Therefore, the connector connection end 31a1 of the first flexible substrate 311a is not easily formed on the same plane as the connector connection ends 31a1 of the second flexible substrate 312a and the third flexible substrate 313a to avoid physical interference. However, since the first flexible substrate 311a, the second flexible substrate 312a, and the third flexible substrate 313a are formed as different individuals, the patterned portions 31a3 of the second flexible substrate 312a and the third flexible substrate 313a can be bent without bending the patterned portion 31a3 of the first flexible substrate 311a. In this way, the connector connection end 31a1 of the first flexible substrate 311a can be formed on different planes to avoid physical interference with the connector connection ends 31a1 of the second flexible substrate 312a and the third flexible substrate 313a.

[0152] (The benefits of using flexible substrates)

[0153] In this embodiment, a flexible substrate (front flexible substrate 31a, rear flexible substrate 32a) is used as the substrate for electrical connection with the front connector 31b or the rear connector 32b. Therefore, when electrically connecting the lines of the front connector 31b or the rear connector 32b to the lines of the flexible substrate by means of soldering or the like, the angle at which the two lines intersect in the area where the two lines are connected can be freely set by bending the flexible substrate. For example, the two lines are electrically connected in the area where they are connected in a state where they are approximately on the same straight line. At this time, due to the orthogonal positional relationship of the two lines in the area where they are connected, it is less likely to cause high-frequency characteristic degradation such as reflection compared to the type of electrical connection.

[0154] In this embodiment, at the connector connection end 31a1 of the front flexible substrate 31a, a line extending from the patterned portion 31a3 (a line extending from the area of ​​the front flexible substrate 31a that is electrically connected to the inspection target connector 100) and a line of the front connector 31b mounted on the connector connection end 31a1 (a line of a member mounted on one end of the front flexible substrate 31a) are electrically connected in a straight line. Similarly, at the connector connection end of the rear flexible substrate 32a, a line extending from the patterned portion (a line extending from the area of ​​the rear flexible substrate 32a that is electrically connected to the inspection target connector 100) and a line of the rear connector 32b mounted on the connector connection end (a line of a member mounted on one end of the rear flexible substrate 32a) are electrically connected in a straight line.

[0155] Figure 21 shows an example of an electrical connection at the connector connection end 31a1 of the front flexible substrate 31a, where the lines (signal lines 311a1) of the first flexible substrate 31a of the front flexible substrate 31a and the connection terminals 31b1 of the front connector 31b for connecting to the front flexible substrate 31a are electrically connected in a substantially parallel manner, i.e., on a substantially straight line. The area where the lines extending from the patterned portion 31a3 connect to the lines of the front connector 31b, and the area where the lines of the front connector 31b connect to the lines extending from the patterned portion 31a3, extend in the same direction. For example, the lines (signal lines 311a1) extending from the patterned portion 31a3 of the first flexible substrate 31a and the lines (connection terminals 31b1) of the front connector 31b extend in a predetermined direction dr in the area where the two lines connect. The predetermined direction dr is parallel to the line connecting the region behind and below in the x direction and the region in front and above in the z direction, and forms a predetermined angle with the yz plane and the xy plane.

[0156] (Other implementation types, telescopic components other than probes)

[0157] In this embodiment, a probe P has been described as a telescopic member that pushes the front flexible substrate 31a from the back side (upper side in the z direction) to the lower side in the z direction, and a telescopic member that pushes the rear flexible substrate 32a from the back side (upper side in the z direction) to the lower side in the z direction. However, if the member is telescopic in the z direction, it is not limited to the probe P, and other elastic members may also be used.

[0158] (In other implementations, the probes are not limited to two rows)

[0159] In this embodiment, it has been described that the front probe group 31g and the rear probe group 32g are arranged in the x-direction, that is, the probe groups arranged in the y-direction are arranged in two columns in the x-direction. However, the number of columns of probe groups may be one or more columns depending on the configuration of the electrodes of the connector 100 being inspected.

[0160] (Other implementations, elastic components other than springs)

[0161] In this embodiment, a first spring 13 is provided between the floating guide 11 and the lower retaining part 21, a front second spring 31h is provided between the front retaining part 31c and the front push block 31i, a rear second spring 32h is provided between the rear retaining part 32c and the rear push block 32i, and a third spring 41 is provided between the upper retaining part 23 and the support part 43. However, if the component is capable of extending and retracting in the z-direction, it is not limited to a spring, and other elastic components may also be used.

[0162] Although several embodiments of the present invention have been described, these embodiments are provided as examples and are not intended to limit the scope of the invention. These embodiments can be implemented in various other forms, and various omissions, substitutions, and modifications can be made without departing from the spirit of the invention. These embodiments and their variations are included in the scope and spirit of the invention, and similarly are included in the scope of the invention described in the claims and their equivalents.

[0163] According to this specification, the following conditions are provided.

[0164] (State 1)

[0165] The flexible substrate includes: one end; another end; and a patterned portion, which is formed at least between the one end and the other end. The patterned portion has a tongue formed by a cut. The tongue is electrically connected to other components.

[0166] When a probe or other telescopic component is pressed against and locally subjected to force, the tongue of the flexible substrate formed in the area containing the area subjected to force will move away from other areas of the tongue adjacent to the flexible substrate through a cut and displace in the direction of being pressed.

[0167] Therefore, compared to the case without the tongue, the flexible substrate is less likely to break even when localized force is applied.

[0168] (State 2)

[0169] Preferably, the tongue has a plurality of portions that are electrically connected to other components.

[0170] Compared to a design where only one electrode is placed on a tongue, this design reduces the number of incisions, making it easier to form tongues in narrow areas.

[0171] (State 3)

[0172] It is preferable that the tongue is formed at the end of the signal line.

[0173] When an electrical connection is made to other components along the signal line, that connection point, relative to the end, can function as an antenna, potentially causing noise transmission and reception. By making electrical connections to other components near the end, noise transmission and reception can be reduced.

[0174] (State 4)

[0175] More preferably, a plurality of through holes are provided in the pattern section, which electrically connect the side that is electrically connected to other components and the opposite side of the side that is electrically connected to other components.

[0176] In flexible substrates, a structure is often adopted in which signal lines are provided on one side and ground lines are provided on the other side. When a plurality of through holes are provided in the patterned portion, even if other components are electrically connected only on one side of the patterned portion (the side electrically connected to other components), the other side of the patterned portion (the side opposite to the side electrically connected to other components) can be electrically connected to other components.

[0177] (Style 5)

[0178] More preferably, at one end, the line extending from the patterned portion and the line of the component mounted at one end are electrically connected in a state where they are on the same straight line.

[0179] (Style 6)

[0180] Preferably, the flexible substrate and telescopic member are of any one of states 1 to 4. The telescopic member is used to make the tongue electrically connected to other components by pressing the back side of the region containing the part that is electrically connected to other components.

[0181] (Style 7)

[0182] Preferably, the inspection fixture has a first movable member. Other components are accessed by the flexible substrate via the first movable member. The tongue is accessed by the other components via a telescopic member.

[0183] Other components are brought closer to the flexible substrate via the first movable member, and the tongue of the flexible substrate is connected to the other components using a telescopic member such as a probe. Therefore, the electrical connection between the flexible substrate and other components in the inspection fixture can be performed without causing significant movement of the flexible substrate, i.e., without damaging the flexible substrate.

[0184]

[0185] 1: Inspection fixture

[0186] 10: Connector Contact Section

[0187] 11: Floating guide (first movable component)

[0188] 11a: Guide section

[0189] 13: First spring (first elastic component)

[0190] 20: Substrate holding section

[0191] 21: Lower retaining part (wedge frame)

[0192] 23: Upper retaining part (connecting plate)

[0193] 30:Substrate part

[0194] 31: Front substrate assembly

[0195] 31a: Front flexible substrate (flexible substrate)

[0196] 311a: First flexible substrate

[0197] 311a1: Signal line

[0198] 312a: Second flexible substrate

[0199] 313a: Third flexible substrate

[0200] 31a1: Connector connection end

[0201] 31a2: Retaining part connection end

[0202] 31a21: Hole

[0203] 31a3: Pattern Section

[0204] 31a4: Tongue slice

[0205] 31a5: Through hole

[0206] 31b: Front connector

[0207] 31b1: Connecting terminal

[0208] 31c: Front retaining part

[0209] 31c1: Probe receiving part

[0210] 31c11: Upper ditch

[0211] 31c12: Lower ditch

[0212] 31c13: Upper hole

[0213] 31c14: Lower hole portion

[0214] 31c2: Groove for push block

[0215] 31c3: Boss

[0216] 31c4: Upper protrusion

[0217] 31c5: Lower protrusion

[0218] 31d: Front connector socket

[0219] 31e: Front connector press rubber

[0220] 31f: Front connector cover

[0221] 31g: Anterior probe group

[0222] 31h: Front second spring (second elastic component)

[0223] 31i: Front push block (second movable component)

[0224] 32: Rear substrate assembly

[0225] 32a: Rear flexible substrate (flexible substrate)

[0226] 32b: Rear connector

[0227] 32c: Rear retaining part

[0228] 32d: Rear connector socket

[0229] 32e: Rear connector press rubber

[0230] 32f: Rear connector cover

[0231] 32g: Rear probe group

[0232] 32h: Rear second spring (second elastic component)

[0233] 32i: Rear push block (second movable component)

[0234] 40: Horizontal position adjustment unit

[0235] 41: Third Spring

[0236] 43: Support section

[0237] 45: Bracket

[0238] 100: Check the connector

[0239] d1: First distance

[0240] d2: Second distance

[0241] d3: Third distance

[0242] dr: the intended direction

[0243] P: Probe (telescopic component)

[0244] P1: Front end

[0245] P2: Spring housing section

[0246] S: Slit

Claims

1. A flexible substrate comprising: one end portion; another end portion; and a patterned portion formed at least between the one end portion and the other end portion, and having a connecting portion for electrically connecting with other components; the patterned portion having a tongue, the tongue being displaced toward the other components to electrically connect the connecting portion with the other components; the tongue being formed by a cut.

2. The flexible substrate as described in claim 1, wherein, The aforementioned tongue is pushed and displaced in the direction of the aforementioned other components.

3. The flexible substrate as described in claim 1, wherein, The aforementioned cut is configured to surround at least a portion of the region containing the aforementioned connecting portion.

4. The flexible substrate as described in claim 1, wherein, The aforementioned tongue plate is provided with a plurality of the aforementioned connecting parts.

5. The flexible substrate as described in claim 1, wherein, The aforementioned tongue is formed at the end of the signal line.

6. The flexible substrate as described in claim 1, wherein, A plurality of through holes are provided in the aforementioned patterned portion to serve as the aforementioned connecting portion.

7. The flexible substrate as described in claim 1, wherein, At one end of the aforementioned portion, the line extending from the aforementioned pattern portion and the line of the component mounted at the end of the aforementioned portion are electrically connected in a state where they are on the same straight line.

8. The flexible substrate as described in claim 1, wherein, The aforementioned tongue piece allows for relative displacement of its opposing edges through the aforementioned incision.

9. An inspection fixture comprising: a flexible substrate as described in any one of claims 1 to 8; and a telescopic member; wherein the telescopic member electrically connects the connecting portion to the other components by pressing the region including the connecting portion of the tongue.

10. The inspection fixture as claimed in claim 9, comprising a first movable member; the aforementioned other members being accessible to the aforementioned flexible substrate via the aforementioned first movable member; and the aforementioned tongue being accessible to the aforementioned other members via the aforementioned telescopic member.

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