A dual-view data alignment method based on at least two common marker points

A public marker point and data alignment technology, applied in the field of image processing and visual measurement, can solve problems affecting the integrity and accuracy of data acquisition, achieve the effect of reducing the surface area of ​​objects, flexibly measuring postures, and reducing dead angles of measurement

CN105043250BActive Publication Date: 2017-08-11NANJING UNIV OF POSTS & TELECOMM
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Publication Date
2017-08-11

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Abstract

The invention discloses a dual-view data alignment method based on at least two public marker points, the steps of which include: reconstructing the center position and normal vector information of the marker points in adjacent views, and based on the reconstructed public marker center position and normal vector information Compute the rotation and translation relationship of adjacent viewing angles. Compared with the traditional data alignment method that only relies on the central position of the marked point, the method of the present invention can make full use of the information provided by the marked point, and only need to see two common marked points in adjacent viewing angles to achieve reliable data alignment , reducing the number of marking points that need to be pasted on the surface of the object and the covering of the measured object by the marking points. The invention is easy to implement and has reliable results, and can be applied to all fields where marking points are used to assist in aligning measurement data from different viewing angles.
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Description

technical field

[0001] The invention relates to a dual-view data alignment method based on at least two public marker points, belonging to the fields of image processing and visual measurement. Background technique

[0002] Vision measurement is a technology that uses a camera to collect images of the surface of the measured object and recover its three-dimensional shape from it. Line structured light measurement and surface structured light measurement are two commonly used implementation methods in many vision measurement methods. No matter what visual measurement method is used, in order to obtain complete object surface data, the object needs to be measured at multiple positions and angles. This requires the fusion of measurement data from different coordinate systems at multiple angles into a unified coordinate system to correct the data misalignment caused by the movement of the measuring device.

[0003] At present, the algorithms for aligning measurement data under...

Examples

Embodiment Construction

[0045] Below in conjunction with accompanying drawing, technical scheme of the present invention is described in further detail:

[0046] figure 1 The line structured light measurement device used in this embodiment is composed of left and right eye cameras and a line laser emitter. Both the left and right eye cameras use the DMK23U445 industrial camera of The Imaging Source Company, the sensor is 1 / 3"CCD, the output mode is USB3.0, and the lens is a Computar M0814-MP2 megapixel fixed-focus lens; the two cameras are rigidly connected through the skeleton, The angle between the optical axes of the left and right eye cameras is about 40°, and the baseline distance is about 25cm. The inline laser is located in the middle of the two cameras. Before implementing the specific steps, the parameters of the measuring device have been calibrated, and the parameters include: left and right eyes Intrinsic parameters of the camera, rigid body transformation parameters between the left and...