A detection method and system for one-button sequential control system of intelligent substation

Abstract

A detection method and system for a one-button sequential control system of an intelligent substation, comprising communicating the one-button sequential control detection system with a system under test through a switch to obtain information of the system under test; distributing data according to a preset SCD model based on the information of the one-button sequential control detection system and the system under test; the system under test performing device state migration based on a device state migration method specified by the one-button sequential control detection system; the one-button sequential control detection system issues remote control instructions to the migrated system under test to perform affirmative and negative tests on the one-button sequential control anti-error locking logic of the device under test, and automatically compares the test results with expected results to obtain comprehensive anti-error locking logic test results; wherein the SCD model is designed based on a main wiring diagram of the one-button sequential control detection system including various wiring methods, and the technical solution provided by the present invention realizes logical decoupling of the device state and the current test device through device state migration, simplifies the test configuration, and improves the correctness and coverage of the anti-error logic test.

Description

Technical Field

[0001] The present invention relates to a detection device, and in particular to a detection method and system for a one-key sequential control system of an intelligent substation. Background Art

[0002] One-key sequential control is an operation mode for substation switching operation, which can realize the prefabrication of operation project software, modular construction of operation tasks, automatic identification of equipment status, intelligent verification of anti-error interlocking, one-key start of operation steps, and automatic sequential execution of operation process. By calling the corresponding sequential control ticket on the station-side monitoring background machine or the dispatching monitoring computer, the substation equipment can be changed from one state to another, saving a lot of manpower and material resources. At the same time, the safety is improved accordingly without manual direct operation of the primary equipment, breaking through the bottleneck of large operation workload and low operation efficiency in the traditional mode, and bringing new technical support for improving the efficiency of power grid operation and maintenance. Make full use of modern technology to alleviate the contradiction of tight human resources and ensure the safe, intelligent, efficient and stable operation of the power grid. One-key sequential control operation plays a breakthrough and economical role in the intelligent development of smart substations. While reducing manual intervention and automatic execution, the correct function and safety and reliability of the one-key sequential control system have become the most critical factors of the one-key sequential control system.

[0003] The detection system in the prior art can generally only target one wiring method, the detection object is single, and during the anti-mislocking logic test process, the negative test cannot be performed because the device state is associated with the state of the current test device; and the detection results are mostly achieved by manual comparison, which has large errors. Summary of the invention

[0004] The present invention provides a detection method and system for a one-key sequential control system of an intelligent substation, comprising:

[0005] A detection method for a one-key sequential control system of an intelligent substation, the method comprising:

[0006] The one-button sequential control detection system communicates with the system under test through a switch to obtain information of the system under test;

[0007] Distribute data based on the information of the one-button sequential control detection system and the system under test according to a preset SCD model;

[0008] The system under test performs device state migration based on the device state migration method specified by the one-key sequential control detection system;

[0009] The one-button sequential control detection system issues remote control instructions to the migrated system under test, performs positive and negative tests on the one-button sequential control anti-mistaken locking logic of the device under test, and automatically compares the test results with the expected results to obtain comprehensive anti-mistaken locking logic test results;

[0010] The SCD model is designed based on the main wiring diagram of the one-button sequential control detection system including various wiring modes.

[0011] Preferably, the system under test performs device state migration based on a device state migration method specified by the one-key sequential control detection system, including:

[0012] The system under test migrates the device states of all intervals to the device state of a specified interval before the anti-error locking logic test, thereby realizing the decoupling of the device state and the anti-error locking logic.

[0013] Preferably, the one-button sequential control detection system issues a remote control command to the migrated system under test to perform a positive and negative test on the one-button sequential control anti-mislocking logic of the device under test, including:

[0014] Configuring the one-button sequential control detection system based on the system under test;

[0015] Performing basic function testing on the system under test based on the configured one-button sequential control testing system;

[0016] Based on the one-button sequential control detection system, the one-button sequential control anti-mislocking logic is positively and negatively tested on the system under test according to preset test items.

[0017] Preferably, configuring the one-button sequential control detection system based on the system under test includes:

[0018] When the system under test is a sequence control host, the one-button sequence control detection system is configured to simulate an anti-mistake host;

[0019] When the system under test is an anti-error host, the one-button sequence control detection system is configured to simulate a sequence control host.

[0020] Preferably, the one-button sequential control detection system after configuration performs basic function detection on the system under test, including:

[0021] When the one-button sequence control detection system is configured to simulate the sequence control host, the basic function tests of drawing the main wiring diagram, editing the operation ticket, and issuing the one-button sequence control operation ticket through the transmission protocol are performed, and a test message is generated;

[0022] When the one-button sequential control detection system is configured to simulate an anti-error host, positive and negative response function detection of the anti-error logic check result is performed, and a test message is generated.

[0023] Preferably, when the one-key sequence control detection system is configured to simulate a sequence control host, basic function detection of operation ticket editing is performed and a test message is generated, including:

[0024] When the one-button sequence control detection system is configured to simulate a sequence control host, a sequence control operation ticket is imported or newly added, and the simulated sequence control host sends a sequence control ticket and a control command to the tested anti-error host to generate a response test message.

[0025] Preferably, when the one-key sequence control detection system is configured to simulate a sequence control host, a basic function detection of issuing a one-key sequence control operation ticket through a transmission protocol and generating a test message includes:

[0026] The simulated sequential control host tests the correctness and robustness of the transmission protocol and generates test messages.

[0027] Preferably, when the one-button sequential control detection system is configured to simulate an anti-error host, positive and negative response function detection of the anti-error logic check result is performed, and a test message is generated, including:

[0028] The simulated error prevention host sends a positive or negative test message to the system under test;

[0029] The simulated error prevention host performs a single-step or continuous test on the device under test according to the preset test items and the positive or negative test message, and automatically checks the communication protocol consistency of the device under test to generate a test result;

[0030] The simulated error-proof host compares the test result with the expected result, and performs data processing and analysis to obtain a comprehensive error-proof locking logic test result.

[0031] A detection system for a one-key sequential control system of an intelligent substation, the system comprising:

[0032] An information acquisition module is used to communicate the one-button sequential control detection system with the system under test through a switch to acquire information of the system under test;

[0033] A data distribution module distributes data according to a preset SCD model based on information of the one-button sequential control detection system and the system under test;

[0034] A data migration module, wherein the system under test performs device state migration based on a device state migration method specified by the one-key sequential control detection system;

[0035] The test module, wherein the one-button sequential control detection system issues remote control instructions to the migrated system under test, performs positive and negative tests on the one-button sequential control anti-mistaken locking logic of the device under test, and automatically compares the test results with the expected results to obtain comprehensive anti-mistaken locking logic test results;

[0036] The SCD model is designed based on the main wiring diagram of the one-button sequential control detection system including various wiring modes.

[0037] Preferably, the test module includes: a configuration unit, a basic function detection unit and an anti-error test unit;

[0038] The configuration unit is used to configure the one-key sequential control detection system based on the system under test;

[0039] The basic function detection unit is used to perform basic function detection on the system under test based on the configured one-key sequence control detection system;

[0040] The anti-error test unit is used to perform positive and negative tests on the one-button sequence control anti-error locking logic of the system under test according to preset test items based on the one-button sequence control detection system.

[0041] Compared with the prior art, the present invention has the following beneficial effects:

[0042] 1. The present invention provides a detection method for a one-button sequential control system of an intelligent substation. The device state migration method is used to migrate the device state of the device under test, thereby realizing the logical decoupling of the device state and the current test device. The SCD model is used for data distribution to realize the unification of test data and communication methods.

[0043] 2. The one-button sequential control test system provided by the present invention can simulate the sequential control host and the anti-error host to test the functions of the device under test. At the same time, according to the preset test items, the protocol consistency of the device under test can be tested according to the settings and compared with the expected results to automatically draw the detection conclusion.

[0044] 3. The technical solution provided by the present invention is combined with the main wiring diagram to design the SCD model of the system, covering all the data of the typical main wiring. The DL / T 860 communication protocol is adopted between the measurement and control device, the detection system and the device under test to achieve the unification of test data and communication methods, laying the foundation for parallel testing of multiple devices under test. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] Figure 1 A flow chart of a detection method of a one-key sequential control system for a smart substation according to the present invention;

[0046] Figure 2 It is an overall schematic diagram of a detection system of a one-key sequential control system of an intelligent substation of the present invention;

[0047] Figure 3 A flow chart is provided for the one-key sequential control system of the present invention. DETAILED DESCRIPTION

[0048] The present invention provides a detection method and system for a one-key sequential control system of an intelligent substation, which can achieve full coverage of various typical wiring modes of the substation. The designed full-station model and network system can ensure the synchronous detection of multiple sets of one-key sequential control systems. A device state migration method is designed to improve the detection efficiency of error-proof logic rules. The protocol test system of the present invention can realize the automatic generation of protocol test tasks, the automatic execution of detection steps and the automatic generation of detection conclusions, reduce interference from artificial factors, eliminate test randomness, improve test efficiency and test reliability, achieve test repeatability, ensure the traceability of test work, and ensure the reliability and consistency of test results.

[0049] The following is a further introduction to a detection method of a one-key sequential control system for a smart substation provided by the present invention in conjunction with the accompanying drawings:

[0050] Embodiment 1:

[0051] A detection method for a one-button sequential control system of an intelligent substation, such as Figure 1 As shown, the method includes:

[0052] Step 1: The one-button sequential control detection system communicates with the system under test through a switch to obtain information of the system under test;

[0053] Step 2: Distribute data based on the information of the one-button sequential control detection system and the system under test according to a preset SCD model;

[0054] Step 3: The system under test performs device state migration based on the device state migration method specified by the one-key sequential control detection system;

[0055] Step 4: The one-button sequential control detection system issues a remote control command to the migrated system under test, performs a positive and negative test on the one-button sequential control anti-mistaken locking logic of the device under test, and automatically compares the test result with the expected result to obtain a comprehensive anti-mistaken locking logic test result;

[0056] The SCD model is designed based on the main wiring diagram of the one-button sequential control detection system including various wiring modes.

[0057] The present invention also provides a detection method for a one-key sequential control system of an intelligent substation, the method specifically comprising the following steps:

[0058] Step 1: The one-button sequential control detection system communicates with the system under test (sequential control host and anti-error host) through the DL / T 634.5104 transmission protocol to configure the simulation system and configure the corresponding communication parameters.

[0059] Step 2: The one-button sequence control detection system simulation software performs basic function detection on the device under test. When used as a simulated sequence control host, the sequence control operation ticket is imported or added, and the simulated sequence control host sends the sequence control ticket and control command to the tested anti-error host; when used as a simulated anti-error host, the anti-error verification result is sent to the tested sequence control host.

[0060] Step 3: The one-button sequential control detection system simulates the software to communicate with the device under test, sends relevant positive or negative test messages, and can perform single-step or continuous tests according to preset test items to automatically detect the communication protocol consistency of the device under test;

[0061] Step 4: Record the sent and received test messages in real time, compare the received messages with the expected results, and perform data processing and analysis to automatically generate test results.

[0062] In step 1, the type of simulation system is selected through the device under test. When the device under test is a sequential control host, it is configured to simulate the anti-error host to cooperate with the test. Conversely, when the device under test is an anti-error host, it is configured to simulate the monitoring host. After configuring the simulation system, the relevant communication parameters are configured. The configuration information includes the communication address, port, protocol mode, maximum number k of unconfirmed I formats, maximum number w of the latest confirmed application protocol data unit APDU, timeout time t0~t3 and other communication parameters of the DL / T 634.5104 communication protocol. The flexibility and wide compatibility of the test system are realized through open parameter configuration.

[0063] In the step 2, when simulating the function of the sequential control host, the basic functions such as drawing the main wiring diagram, editing the operation ticket, and issuing the one-key sequential control operation ticket through the DL / T 634.5104 transmission protocol can be realized, and the information interaction and operation with the device under test (anti-error host) can be completed, and the corresponding functional test can be completed; when simulating the anti-error host function, the basic functions such as the affirmative and negative response of the anti-error logic check result can be completed, and the information interaction and operation with the device under test (sequential control host) can be completed. The corresponding functional test is completed, and the one-key sequential control simulation operation process is as follows Figure 3 shown.

[0064] In step 3, the protocol consistency detection system can perform a correctness and robustness test on the DL / T 634.5104 transmission protocol. The automatic consistency detection content includes continuous sending w test - continuous sending w telesignal change frames, telesignal change sending frame sequence number advance, telesignal change sending frame sequence number lag, telesignal change receiving frame sequence number advance, telesignal change receiving frame sequence number lag, application protocol data unit ASDU43 sending frame sequence number advance, application protocol data unit ASDU43 sending frame sequence number lag, application protocol data unit ASDU43 receiving frame sequence number advance, application protocol data unit ASDU43 receiving frame sequence number lag, single-step execution check sending frame sequence number advance, single-step execution check sending frame sequence number lag, single-step execution check receiving frame sequence number advance, single-step execution check receiving frame sequence number lag, wrong public transmission address, sequence control ticket preview request start character test, application protocol data unit APDU length test, message type test, transmission reason test and other 31 test items. Some or all test items can be configured for detection according to needs, and single-step or continuous mode can be selected for testing, such as Figure 3 As shown, the test repeatability and test efficiency are improved.

[0065] The one-key sequential control detection system simulation software in step 4 can record the test messages sent and received in real time, and display them in real time in the message window. According to the test cases and the sent and received messages, it performs real-time online processing, and automatically obtains and displays the test results of the test items. Through data recording and display, the traceability of the test work is guaranteed, and the online data processing is automatically realized to avoid the uncertainty of manual operation, and the reliability and consistency of the test results are guaranteed.

[0066] Embodiment 2:

[0067] Based on the same inventive concept, the present invention also provides a detection system for a one-key sequential control system of an intelligent substation, such as Figure 2 As shown:

[0068] The switch connects the one-button sequence control detection system, sequence control host, intelligent anti-error host and measurement and control device to form a platform for unified data distribution; the tester provides switch quantity and analog quantity signals for the measurement and control device; the measurement and control device converts the tested switch quantity and analog quantity signals into unified data in accordance with the DL / T 860 protocol format, providing basic data for the one-button sequence control detection system and sequence control host.

[0069] The detection system includes a test system main wiring diagram, an SCD model, a migration device state definition, a one-button sequential control detection system server, a switch, an OMICRON tester, and a measurement and control device. The devices under test are a sequential control host and an anti-error host.

[0070] The one-button sequential control detection system server and the measurement and control device both exchange data with the device under test through a switch.

[0071] The detection system can achieve full coverage of various typical wiring modes of substations. The designed full-station test model and network system can ensure the synchronous detection of multiple sets of one-button sequential control systems. The device state migration method is designed to improve the detection efficiency of anti-error logic rules.

[0072] The protocol testing system communicates with the device under test to achieve automatic generation of protocol testing tasks, automatic execution of detection steps and automatic generation of detection conclusions.

[0073] The typical main wiring diagram of the one-button sequential control test system is designed with a four-winding transformer, each winding corresponds to a voltage level, covering the four voltage levels of 500kV, 220kV, 110kV and 10kV in the substation, and covering a variety of typical wiring methods, including single mother wiring, single mother with side mother, double mother wiring connected to mother, double mother double segmentation, 3 / 2 wiring, and capacitor interval, etc. 13 typical wiring methods, and the corresponding dispatch number is defined according to the designed typical error prevention logic rules. Through the design of the main wiring, a wide-coverage and representative substation system structure is established, which lays the foundation for the unified deployment of the test system, the unified acquisition of signals, and the concurrent testing of error prevention logic rules, and also provides a consistent test environment for the objective evaluation of the equipment under test.

[0074] The system SCD model is based on the typical main wiring of the test system and uses the DL / T 860 communication standard to establish the SCD model required for the test. The SCD model includes 16 interval measurement and control devices, each of which can support up to 16 client accesses. The measurement and control device accesses all the switch and knife switch signals and part of the analog quantity information in the main wiring diagram, and renames them according to the scheduling number of each switch and knife switch under the typical wiring mode, which lays the foundation for the test system to unify information resources, concurrent testing of data and interoperability testing of the tested system, and further provides a consistent test environment for the objective evaluation of the tested equipment.

[0075] The device state migration method is designed to avoid the influence of the device state of the tested interval in the process of verifying the correctness of the anti-error locking logic, reduce the work of finding different devices and setting the state in the simulation software, migrate the device state of all intervals to the device state of a specified interval before the anti-error locking logic test, and realize the decoupling of the device state and the anti-error locking logic. Before the test starts, it is only necessary to set the device state of the migrated interval to perform affirmative and negative tests on the anti-error locking logic of all intervals, which can greatly improve the efficiency of the anti-error logic. At the same time, combination tests of different logic conditions can be performed, which also improves the coverage of logic test conditions.

[0076] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present application may adopt the form of a computer program product implemented in one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that include computer-usable program code.

[0077] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0078] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0079] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process in the computer or other programmable device. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0080] The above are merely embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention are included in the scope of the claims of the present invention to be approved.

Claims

1. A detection method for a one-button sequential control system of an intelligent substation, characterized in that: The method comprises: The one-button sequential control detection system communicates with the system under test through a switch to obtain information of the system under test; Distribute data based on the information of the one-button sequential control detection system and the system under test according to a preset SCD model; The system under test performs device state migration based on the device state migration method specified by the one-key sequential control detection system; The one-button sequential control detection system issues remote control instructions to the migrated system under test, performs positive and negative tests on the one-button sequential control anti-mistaken locking logic of the tested device, and automatically compares the test results with the expected results to obtain comprehensive anti-mistaken locking logic test results; Wherein, the SCD model is designed based on the main wiring diagram of the one-button sequential control detection system including various wiring modes; The system under test performs device state migration based on the device state migration method specified by the one-key sequential control detection system, including: The system under test migrates the device states of all intervals to the device state of a specified interval before the anti-error locking logic test, so as to achieve decoupling of the device state and the anti-error locking logic; The one-button sequential control detection system sends remote control instructions to the migrated system under test, and performs affirmative and negative tests on the one-button sequential control anti-mislocking logic of the device under test, including: Configuring the one-button sequential control detection system based on the system under test; Performing basic function testing on the system under test based on the configured one-button sequential control testing system; Based on the one-button sequential control detection system, the system under test is subjected to a positive and negative test of the one-button sequential control anti-mislocking logic according to preset test items; The configuring the one-button sequential control detection system based on the system under test includes: When the system under test is a sequence control host, the one-button sequence control detection system is configured to simulate an anti-mistake host; When the system under test is an anti-error host, the one-button sequence control detection system is configured to simulate a sequence control host.

2. The method according to claim 1, characterized in that The one-button sequential control detection system based on the configuration performs basic function detection on the system under test, including: When the one-button sequence control detection system is configured to simulate the sequence control host, the basic function tests of drawing the main wiring diagram, editing the operation ticket, and issuing the one-button sequence control operation ticket through the transmission protocol are performed, and a test message is generated; When the one-button sequential control detection system is configured to simulate an anti-error host, positive and negative response function detection of the anti-error logic check result is performed, and a test message is generated.

3. The method according to claim 2, characterized in that When the one-key sequence control detection system is configured to simulate the sequence control host, the basic function detection of operation ticket editing is performed and a test message is generated, including: When the one-button sequence control detection system is configured to simulate a sequence control host, a sequence control operation ticket is imported or newly added, and the simulated sequence control host sends a sequence control ticket and a control command to the tested anti-error host to generate a response test message.

4. The method according to claim 2, characterized in that When the one-key sequence control detection system is configured to simulate the sequence control host, a basic function detection of issuing a one-key sequence control operation ticket through a transmission protocol is performed, and a test message is generated, including: The simulated sequential control host tests the correctness and robustness of the transmission protocol and generates test messages.

5. The method according to claim 1, characterized in that When the one-button sequential control detection system is configured to simulate the anti-error host, the positive and negative response function detection of the anti-error logic check result is performed, and a test message is generated, including: The simulated error prevention host sends a positive or negative test message to the system under test; The simulated error prevention host performs a single-step or continuous test on the device under test according to the preset test items and the positive or negative test message, and automatically checks the communication protocol consistency of the device under test to generate a test result; The simulated error-proof host compares the test result with the expected result, and performs data processing and analysis to obtain a comprehensive error-proof locking logic test result.

6. A detection system for a one-button sequential control system of an intelligent substation, characterized in that: The system comprises: An information acquisition module is used to communicate the one-button sequential control detection system with the system under test through a switch to acquire information of the system under test; A data distribution module distributes data according to a preset SCD model based on information of the one-button sequential control detection system and the system under test; A data migration module, wherein the system under test performs device state migration based on a device state migration method specified by the one-key sequential control detection system; The test module, wherein the one-button sequential control detection system issues remote control instructions to the migrated system under test, performs affirmative and negative tests on the one-button sequential control anti-mistaken locking logic of the device under test, and automatically compares the test results with the expected results to obtain comprehensive anti-mistaken locking logic test results; Wherein, the SCD model is designed based on the main wiring diagram of the one-button sequential control detection system including various wiring modes; The data migration module is specifically used for: The system under test migrates the device states of all intervals to the device state of a specified interval before the anti-error locking logic test, so as to achieve decoupling of the device state and the anti-error locking logic; The test module includes: a configuration unit, a basic function detection unit and an anti-error test unit; The configuration unit is used to configure the one-key sequential control detection system based on the system under test; The basic function detection unit is used to perform basic function detection on the system under test based on the configured one-key sequence control detection system; The anti-error test unit is used to perform a positive and negative test of the one-button sequence control anti-error locking logic on the system under test according to preset test items based on the one-button sequence control detection system; The configuration unit is specifically used for: When the system under test is a sequence control host, the one-button sequence control detection system is configured to simulate an anti-mistake host; When the system under test is an anti-error host, the one-button sequence control detection system is configured to simulate a sequence control host.

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