Radio frequency circuit testing device and radio frequency circuit testing box

Abstract

The present application provides a radio frequency circuit testing device and a radio frequency circuit testing box. The testing device includes a timing circuit, an AND gate circuit, and a MIPI control circuit. The timing circuit provides a timing logic signal; the AND gate circuit is connected in series with the timing circuit to provide an AND gate logic signal; the input end of the MIPI control circuit is connected to the AND gate circuit and the timing circuit connected in series, and the timing logic signal and the MIPI signal are combined into a timing MIPI signal through the AND gate logic signal; the output end of the MIPI control circuit is connected to the radio frequency circuit to provide the timing MIPI signal to the radio frequency circuit.

Description

Technical Field

[0001] The present application relates to the field of radio frequency communication technology, and in particular to a radio frequency circuit testing device and a radio frequency circuit testing box. Background Art

[0002] As humanity enters the information age, wireless communication technology has developed rapidly. Mobile phones, wireless LANs, Bluetooth, and other technologies have become an integral part of social life and development. The advancement of wireless communication technology is inseparable from the development of radio frequency circuits and microwave technologies.

[0003] Currently, the power supply during the debugging process of RF chips and circuits is divided into two parts: the regulated DC power supply provides DC voltage and the Mobile Industry Processor Interface (MIPI) control logic, such as Figure 1 However, due to their bulk and weight, regulated DC power supplies can only be installed in one location for a long time, resulting in limited flexibility and high cost. The MIPI controller requires a computer connection and uses the appropriate computer software to control the logic controller within the RF chip.

[0004] Evaluating the quality of RF chips is divided into two steps: the first is the RF performance when the regulated DC power supply and MIPI signals are supplied normally; the second is the stability and reliability test of the chip during timing operation.

[0005] At present, stability and reliability testing requires setting up a test environment and manually turning MIPI on and off to achieve the timing effect, which greatly increases labor and time costs. In addition, the timing is irregular, which increases the difficulty of stability and reliability testing and does not guarantee accuracy. Summary of the Invention

[0006] An embodiment of the present application provides a radio frequency circuit testing device, including a timing circuit, an AND gate circuit and a MIPI control circuit, wherein the timing circuit provides a timing logic signal; the AND gate circuit is connected in series with the timing circuit to provide an AND gate logic signal; the input end of the MIPI control circuit is connected to the AND gate circuit and the timing circuit connected in series, and the timing logic signal and the MIPI signal are synthesized into a timing MIPI signal through the AND gate logic signal; the output end of the MIPI control circuit is connected to the radio frequency circuit to provide the timing MIPI signal to the radio frequency circuit.

[0007] According to some embodiments, the timing MIPI signal includes: a data bit of the timing MIPI signal, a clock bit of the timing MIPI signal, and a power bit of the timing MIPI signal.

[0008] According to some embodiments, the testing device further includes a first switch, which is connected in series with the sequential circuit and the AND gate circuit to control the on / off of the MIPI control circuit, the sequential circuit, and the AND gate circuit.

[0009] According to some embodiments, the testing device further includes a power supply module, which provides operating power to the MIPI control circuit, the timing circuit, the AND gate circuit, and the radio frequency circuit.

[0010] According to some embodiments, the operating power supply is 3.5 VDC.

[0011] According to some embodiments, the power supply module includes a voltage regulating module, which is connected to the control device through a USB interface to obtain power and convert the power into the working power. The control device is used to control the MIPI control circuit to generate the timing MIPI signal.

[0012] According to some embodiments, the testing device further includes a first output switch group, which connects the power module, the MIPI control circuit and the RF circuit, and controls the on and off of the working power supply and the timing MIPI signal output to the RF circuit.

[0013] According to some embodiments, the testing device also includes a second output switch group, which connects the power module, the MIPI control circuit and the radio frequency circuit, and combines the output signal combination of the power module and the MIPI control circuit according to the input signal logic of the radio frequency circuit.

[0014] According to some embodiments, the testing device further includes a display screen connected to the MIPI control circuit and configured to display the timing MIPI signal.

[0015] The present application also provides a radio frequency circuit test box, comprising the radio frequency circuit test device and a box body as described above, wherein the timing circuit, the AND gate circuit, and the MIPI control circuit are integrated and installed in the box body.

[0016] According to some embodiments, the box body is a shielding box body for shielding interference signals.

[0017] The technical solution provided in the embodiment of the present application can provide MIPI with timing signals for RF circuits, which is used for RF circuit stability and reliability testing, and can improve the accuracy of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0019] Figure 1 This is a working diagram of a radio frequency circuit testing device provided by the prior art.

[0020] Figure 2 This is a functional block diagram of a radio frequency circuit testing device provided in an embodiment of the present application.

[0021] Figure 3 This is a functional block diagram of another radio frequency circuit testing device provided in an embodiment of the present application.

[0022] Figure 4 This is a functional block diagram of another radio frequency circuit testing device provided in an embodiment of the present application.

[0023] Figure 5 This is a working diagram of another radio frequency circuit testing device provided in an embodiment of the present application.

[0024] Figure 6 This is a schematic diagram of a radio frequency circuit test box provided in an embodiment of the present application. DETAILED DESCRIPTION

[0025] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without making creative efforts are within the scope of protection of this application.

[0026] It should be understood that the terms "first," "second," and the like in the claims, specification, and drawings of this application are used to distinguish different objects, rather than to describe a specific order. The terms "comprise" and "comprising" used in the specification and claims of this application indicate the presence of the described features, integers, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or combinations thereof.

[0027] Figure 2 This is a functional block diagram of a radio frequency circuit testing device provided in an embodiment of the present application, including a MIPI control circuit 1, an AND gate circuit 2 and a timing circuit 3.

[0028] The sequential circuit 3 provides a sequential logic signal. AND gate circuit 2 is connected in series with the sequential circuit 3 to provide an AND logic signal. The input of the MIPI control circuit 1 is connected to the serially connected sequential circuit 3 and AND gate circuit 2. The sequential logic signal and the MIPI signal are combined into a sequential MIPI signal via the AND logic signal. The output of the MIPI control circuit 1 is connected to the RF circuit 4 to provide the sequential MIPI signal.

[0029] When the MIPI control circuit 1 works normally, it will output three signals, namely VIO (power bit of the timing MIPI signal), SDATA (data bit of the timing MIPI signal), and SCLK (clock bit of the timing MIPI signal). Among them, VIO is a voltage of 1.8V, but it is not limited to this.

[0030] A sequential circuit outputs a square wave signal with periodic high and low levels. When the low level of the sequential circuit and VIO form an AND logic circuit in the AND gate, one high level and one low level are generated, resulting in a low output. When the high level of the sequential circuit and VIO form an AND logic circuit in the AND gate, one high level and one high level are generated, resulting in a high output. Thus, the VIO output also has a periodic square wave signal.

[0031] With power on, adjust the mismatch standing wave ratio (SWR) of the RF circuit's matching circuit to 10:1. Then, repeatedly cycle the RF circuit between active and inactive states. As long as the MIPI-controlled logic circuit is sequential, the RF circuit's operating states will also be sequential, i.e., active and inactive. Testing the chip for damage in this state is a test of its stability and reliability.

[0032] The technical solution provided in this embodiment can provide MIPI with timing signals for RF circuits, which is used for RF circuit stability and reliability testing, and can improve the accuracy of the test.

[0033] Figure 3 This is a functional block diagram of another radio frequency circuit testing device provided in an embodiment of the present application, including a MIPI control circuit 1, an AND gate circuit 2, a timing circuit 3, a first switch 5, a power module, and a display screen (not shown).

[0034] The sequential circuit 3 provides a sequential logic signal. AND gate circuit 2 is connected in series with the sequential circuit 3 to provide an AND logic signal. The input of the MIPI control circuit 1 is connected to the serially connected sequential circuit 3 and AND gate circuit 2. The sequential logic signal and the MIPI signal are combined into a sequential MIPI signal via the AND logic signal. The output of the MIPI control circuit 1 is connected to the RF circuit 4 to provide the sequential MIPI signal.

[0035] A first switch 5 is connected in series with the timing circuit 3 and the AND gate circuit 2 to control the on / off switching of the MIPI control circuit 1, the timing circuit 3, and the AND gate circuit 2. A power module provides operating power to the MIPI control circuit, the timing circuit, the AND gate circuit, and the radio frequency circuit. A display screen is connected to the MIPI control circuit 1. The control device is used to control the MIPI control circuit 1 to emit sequential MIPI signals. The display screen is used to display the parameters of the sequential MIPI signals. The display screen includes, but is not limited to, an LCD display.

[0036] Specifically, the first switch 5 can be configured to be connected in series with the timing circuit 3 and the AND gate circuit 2 to control whether to synthesize the sequential MIPI signal. When the first switch 5 is disconnected, the MIPI control circuit 1 outputs a constant logic signal. When the first switch 5 is connected, it becomes a sequential MIPI signal. The position of the first switch 5 and whether it is a software switch or a hardware switch can be flexibly set according to actual circumstances and are not limited to this. For example, the first switch 5 can be implemented by software through a control device.

[0037] Generally, the operating power supply is 3.5VDC, but it is not limited to this.

[0038] When the MIPI control circuit 1 works normally, it will output three MIPI logic signals, namely VIO (power bit of the timing MIPI signal), SDATA (data bit of the timing MIPI signal), and SCLK (clock bit of the timing MIPI signal). Among them, VIO is a voltage of 1.8V, but it is not limited to this.

[0039] A sequential circuit outputs a square wave signal with periodic high and low levels. When the low level of the sequential circuit and VIO form an AND logic circuit in the AND gate, one high level and one low level are generated, resulting in a low output. When the high level of the sequential circuit and VIO form an AND logic circuit in the AND gate, one high level and one high level are generated, resulting in a high output. Thus, the VIO output also has a periodic square wave signal.

[0040] With power on, adjust the mismatch standing wave ratio (SWR) of the RF circuit's matching circuit to 10:1. Then, repeatedly cycle the RF circuit between active and inactive states. As long as the MIPI-controlled logic circuit is sequential, the RF circuit's operating states will also be sequential, i.e., active and inactive. Testing the chip for damage in this state is a test of its stability and reliability.

[0041] Optionally, the power module includes but is not limited to a voltage regulating module 61. The voltage regulating module 61 is connected to the control device through the USB interface 8 to obtain power, and converts the voltage of the power supply from the control device into an operating power supply voltage. The control device is used to control the MIPI control circuit 1 to synthesize the timing MIPI signal.

[0042] Optionally, the testing device further includes a first output switch group 7, which connects the power module, the MIPI control circuit 1 and the RF circuit 4 to control the on and off of the power supply and timing MIPI signals output to the RF circuit.

[0043] The first output switch group includes at least five switches, each of which controls the on / off of one signal. These five signals include VCC (power supply voltage), GND (ground), SDATA (data bit of the timing MIPI signal), SCLK (clock bit of the timing MIPI signal), and VIO (power bit of the timing MIPI signal). For example, switch 71 includes but is not limited to a mechanical switch to control the on / off of VCC, switch 72 controls the on / off of GND, switch 73 controls the on / off of SDATA, switch 74 controls the on / off of SCLK, and switch 75 controls the on / off of VIO, but the present invention is not limited thereto.

[0044] When the RF circuit needs to synthesize sequential MIPI signals, it only needs to connect the power module, MIPI control circuit 1, and RF circuit 4 through the first output switch group 7, and the RF circuit 4 can achieve sequential operation. Each switch 71, 72, ... 7N is in the on state. When the RF circuit requires a normal constant voltage, it only needs to disconnect the sequential MIPI signal by switching the first output switch group.

[0045] Control devices include but are not limited to computers, such as Figure 5 As shown, Figure 5 This is a working diagram of a radio frequency circuit testing device provided in an embodiment of the present application.

[0046] The computer acts as the control device. When USB port 8 is connected to the test device, the computer's 5V voltage is converted to approximately 3.5V by the voltage regulator module and directly connected to the test device. The computer controls the test device's MIPI control circuit 1. AND gate circuit 2 and timing circuit 3, each powered by 3.5V, synthesize the sequential MIPI signal. The test device converts the 5V power supply to 3.5V and sends it to RF circuit 4 along with the sequential MIPI signal.

[0047] When the RF circuit needs to synthesize sequential MIPI signals, it only needs to turn on the first switch 5 to achieve sequential operation. When the RF circuit requires a normal constant voltage, it only needs to disconnect the MIPI control circuit 1 from the sequential circuit 3 and / or the AND gate circuit 2 by switching the first switch.

[0048] Based on the requirements of RF circuit 4, the test device outputs VCC (power supply voltage), GND (ground), SDATA (data bit of the timing MIPI signal), SCLK (clock bit of the timing MIPI signal), and VIO (power bit of the timing MIPI signal) signals to RF circuit 4. This tests the stability and reliability of RF circuit 4 during timing operation. These signal parameters are displayed on the test device's display.

[0049] The technical solution provided in this embodiment can provide MIPI with timing signals for RF circuits, which is used for RF circuit stability and reliability testing, thereby improving test accuracy. It can also provide a stable DC power supply for RF circuit testing, eliminating the need for a heavy regulated DC power supply and requiring only a USB data cable to connect to a computer for power.

[0050] Figure 4 This is a functional block diagram of another RF circuit testing device provided in an embodiment of the present application, including a MIPI control circuit 1, an AND gate circuit 2, a timing circuit 3, a first switch 5, a power module, and a display screen (not shown).

[0051] The sequential circuit 3 provides a sequential logic signal. AND gate circuit 2 is connected in series with the sequential circuit 3 to provide an AND logic signal. The input of the MIPI control circuit 1 is connected to the serially connected sequential circuit 3 and AND gate circuit 2. The sequential logic signal and the MIPI signal are combined into a sequential MIPI signal via the AND logic signal. The output of the MIPI control circuit 1 is connected to the RF circuit 4 to provide the sequential MIPI signal.

[0052] The first switch 5 is connected in series with the timing circuit 3 and the AND gate circuit 2 to control the on / off switching of the MIPI control circuit 1, the timing circuit 3, and the AND gate circuit 2. The power module provides operating power to the MIPI control circuit, the timing circuit, the AND gate circuit, and the radio frequency circuit. The display is connected to the MIPI control circuit 1. The control device is used to control the MIPI control circuit 1 to emit sequential MIPI signals, and the display is used to display the parameters of the sequential MIPI signals.

[0053] Specifically, the first switch 5 can be configured to be connected in series with the timing circuit 3 and the AND gate circuit 2 to control whether to synthesize the sequential MIPI signal. When the first switch 5 is disconnected, the MIPI control circuit 1 outputs a constant logic signal. When the first switch 5 is connected, it becomes a sequential MIPI signal. The position of the first switch 5 and whether it is a software switch or a hardware switch can be flexibly set according to actual circumstances and are not limited to this. For example, the first switch 5 can be implemented by software through a control device.

[0054] Generally, the operating power supply is 3.5VDC, but it is not limited to this.

[0055] When the MIPI control circuit 1 works normally, it will output three signals, namely VIO (power bit of the timing MIPI signal), SDATA (data bit of the timing MIPI signal), and SCLK (clock bit of the timing MIPI signal). Among them, VIO is a voltage of 1.8V, but it is not limited to this.

[0056] A sequential circuit outputs a square wave signal with periodic high and low levels. When the low level of the sequential circuit and VIO form an AND logic circuit in the AND gate, one high level and one low level are generated, resulting in a low output. When the high level of the sequential circuit and VIO form an AND logic circuit in the AND gate, one high level and one high level are generated, resulting in a high output. Thus, the VIO output also has a periodic square wave signal.

[0057] With power on, adjust the mismatch standing wave ratio (SWR) of the RF circuit's matching circuit to 10:1. Then, repeatedly cycle the RF circuit between active and inactive states. As long as the MIPI-controlled logic circuit is sequential, the RF circuit's operating states will also be sequential, i.e., active and inactive. Testing the chip for damage in this state is a test of its stability and reliability.

[0058] Optionally, the power module includes but is not limited to a voltage regulating module 61. The voltage regulating module 61 is connected to the control device through the USB interface 8 to obtain power, and converts the voltage of the power supply from the control device into an operating power supply voltage. The control device is used to control the MIPI control circuit 1 to synthesize the timing MIPI signal.

[0059] Optionally, the testing device also includes a second output switch group 9, which connects the power module, the MIPI control circuit 1 and the RF circuit 4, and combines the output signal combination of the MIPI control circuit 1 according to the input signal logic of the RF circuit 4.

[0060] For example, the second output switch group 9 includes at least five switches, each of which has five positions, namely VCC (power supply voltage), GND (ground), SDATA (data bit of the timing MIPI signal), SCLK (clock bit of the timing MIPI signal), and VIO (power bit of the timing MIPI signal). Switches 91, 92...9N include but are not limited to DIP switches. By selecting the position of each switch, any combination of the five signals can be achieved to meet the input signal logic requirements of different models of RF circuits 4. However, this is not limited to this.

[0061] When the RF circuit needs to synthesize a timing MIPI signal, it only needs to switch the output switch of the corresponding pin of the RF circuit to the corresponding logic through the second output switch group to realize the timing operation. That is to say, each switch 91, 92...9N of the output switch group can be switched to the corresponding signal according to the requirements of the RF circuit, such as VCC (power supply voltage), GND (ground), SDATA (data bit of the timing MIPI signal), SCLK (clock bit of the timing MIPI signal), VIO (power bit of the timing MIPI signal), which can be applied to RF circuits with different pin arrangements and meet the test input requirements of various different RF circuits. When the RF circuit requires a normal constant voltage, it only needs to disconnect the timing circuit and the MIPI control circuit by switching the output switch group.

[0062] Control devices include but are not limited to computers, such as Figure 4 As shown, Figure 4 This is a working diagram of a radio frequency circuit testing device provided in an embodiment of the present application.

[0063] The computer acts as the control device. When USB port 8 is connected to the test device, the computer's 5V voltage is converted to approximately 3.5V by the voltage regulator module and directly connected to the test device. The computer controls the test device's MIPI control circuit 1. AND gate circuit 2 and timing circuit 3, each powered by 3.5V, synthesize the sequential MIPI signal. The test device converts the 5V power supply to 3.5V and sends it to RF circuit 4 along with the sequential MIPI signal.

[0064] When the RF circuit needs to synthesize sequential MIPI signals, it only needs to turn on the first switch to achieve sequential operation. When the RF circuit needs a normal constant voltage, it only needs to disconnect the MIPI control circuit 1 from the sequential circuit 3 and / or the AND gate circuit 2 by switching the first switch.

[0065] Based on the requirements of RF circuit 4, the test device outputs VCC (power supply voltage), GND (ground), SDATA (data bit of the timing MIPI signal), SCLK (clock bit of the timing MIPI signal), and VIO (power bit of the timing MIPI signal) signals to RF circuit 4. This tests the stability and reliability of RF circuit 4 during timing operation. These signal parameters are displayed on the test device's display.

[0066] The technical solution provided in this embodiment can provide MIPI with timing signals for RF circuits, which is used for RF circuit stability and reliability testing, and can improve the accuracy of the test. A stable DC power supply can be provided for RF circuit testing, and no heavy regulated DC power supply is required. It only needs to be connected to the computer with a USB data cable for power supply. Moreover, the selection between VCC (power supply high voltage), GND (ground), SDATA (data bit of timing MIPI signal), SCLK (clock bit of timing MIPI signal), and VIO (power bit of timing MIPI signal) can be switched through a switch, which is suitable for RF circuits with different pin arrangements.

[0067] Figure 6 This is a schematic diagram of a radio frequency circuit test box provided in an embodiment of the present application.

[0068] The radio frequency circuit test box includes a radio frequency circuit test device 10 and a box body 20 , and the timing circuit 3 , the AND gate circuit 2 , the MIPI control circuit 1 and other components are integrated and installed in the box body 20 .

[0069] The USB interface 8 is used to connect the control device. The display screen 11 is installed on the surface of the box body 20 and is used to display the parameters output by the test device 10. The second output switch group 7 is used to switch to the corresponding signals according to the requirements of the RF circuit, such as VCC (power supply voltage), GND (ground), SDATA (data bit of the timing MIPI signal), SCLK (clock bit of the timing MIPI signal), VIO (power bit of the timing MIPI signal), and can be applied to RF circuits with different pin arrangements to meet the test input requirements of various RF circuits. The socket 12 is used to connect the RF circuit 4.

[0070] The box body 20 is a shielding box body used to shield interference signals. The material of the box body 20 includes but is not limited to brass or aluminum, and is used to shield external signal interference and reduce interference during RF circuit testing.

[0071] The embodiments of the present application are described in detail above. Specific examples are used herein to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only intended to help understand the method and core ideas of the present application. At the same time, changes or modifications made by those skilled in the art based on the ideas of the present application, the specific implementation methods, and the scope of application of the present application, all fall within the scope of protection of the present application. In summary, the contents of this specification should not be construed as limiting the present application.

Claims

1. A radio frequency circuit testing device, comprising: A timing circuit provides a timing logic signal, wherein the timing logic signal is a square wave signal with periodic high and low levels; An AND gate circuit, connected in series with the sequential circuit, providing an AND gate logic signal; The MIPI control circuit has an input end connected to the AND gate circuit and the timing circuit connected in series, and an output end connected to the RF circuit. When the MIPI control circuit operates normally, it outputs the power supply voltage VIO of the timing MIPI signal, the data bit SDATA of the timing MIPI signal, and the clock bit SCLK of the timing MIPI signal, respectively. The periodic high and low level square wave signal output by the timing circuit and the power supply voltage VIO of the timing MIPI signal are ANDed in the AND gate circuit to provide the timing MIPI signal to the RF circuit, including: The low level of the timing circuit generates a logic AND with the power supply voltage VIO of the timing MIPI signal, and outputs a low level; The high level of the timing circuit generates a logic AND with the power supply voltage VIO of the timing MIPI signal, and outputs a high level; The output of the power supply voltage VIO of the timing MIPI signal is made into a periodic square wave signal, so that the working state of the radio frequency circuit has timing.

2. The testing device according to claim 1, wherein: The timing MIPI signal includes: The data bit of the timing MIPI signal, the clock bit of the timing MIPI signal, and the power bit of the timing MIPI signal.

3. The testing device according to claim 1 , further comprising: The first switch is connected in series with the sequential circuit and the AND gate circuit to control the on / off of the MIPI control circuit, the sequential circuit, and the AND gate circuit.

4. The testing device according to claim 1, further comprising: A power supply module provides working power for the MIPI control circuit, the timing circuit, the AND gate circuit, and the radio frequency circuit.

5. The testing device according to claim 4, wherein: The working power supply is 3.5VDC. The testing device according to claim 4 , wherein: The power module includes: The voltage regulating module is connected to the control device through a USB interface to obtain power and convert the power into the working power. The control device is used to control the MIPI control circuit to generate the timing MIPI signal.

7. The testing device according to claim 4, further comprising: The first output switch group connects the power module, the MIPI control circuit and the radio frequency circuit, and controls the on and off of the working power and the timing MIPI signal output to the radio frequency circuit.

8. The testing device according to claim 4, further comprising: The second output switch group connects the power module, the MIPI control circuit and the radio frequency circuit, and combines the output signals of the power module and the MIPI control circuit according to the input signal logic of the radio frequency circuit.

9. The testing device according to claim 1, further comprising: A display screen is connected to the MIPI control circuit and is used to display the timing MIPI signal.

10. A radio frequency circuit test box, comprising: The radio frequency circuit testing device according to any one of claims 1 to 9; A box body is provided in which the timing circuit, the AND gate circuit, and the MIPI control circuit are integrated and installed. The test kit according to claim 10 , wherein: The box body is a shielding box body, which is used for shielding interference signals.

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