A data acquisition device for transformer winding deformation tester calibration

Abstract

The embodiment of the application provides a data acquisition device for calibrating a transformer winding deformation tester, and relates to the technical field of power monitoring.The data acquisition device comprises a sweep signal generator, a signal shaper and a processor, wherein the sweep signal generator is connected with the processor and the signal shaper. It can be seen that, by implementing the embodiment, accurate data for calibrating the transformer winding deformation tester can be acquired, so that the accuracy of calibrating the transformer winding deformation tester is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of power monitoring, in particular to a data acquisition device for calibrating a transformer winding deformation tester. BACKGROUND

[0002] The transformer winding deformation tester is an instrument for measuring the winding deformation of a transformer according to the national power industry standard DL / T911-2004. It mainly detects the amplitude-frequency response characteristics of each winding of the transformer and compares the detection results vertically or horizontally. According to the degree of change of the amplitude-frequency response and the phase-frequency response characteristics, the possible winding deformation of the transformer can be determined.

[0003] However, although the transformer winding deformation tester has strong functions, the calibration detection of the transformer winding deformation tester itself is performed by connecting a fixed attenuator to the transformer winding deformation tester. In practice, it is found that the accuracy of the current calibration detection method of the transformer winding deformation tester cannot be guaranteed, resulting in low accuracy of the transformer winding deformation tester. SUMMARY

[0004] The purpose of the embodiment of the present application is to provide a data acquisition device for calibrating a transformer winding deformation tester, which can obtain accurate data for calibrating the transformer winding deformation tester, thereby improving the accuracy of the calibration of the transformer winding deformation tester.

[0005] The embodiment of the present application provides a data acquisition device for calibrating a transformer winding deformation tester, which comprises a sweep signal generator, a signal shaper and a processor, wherein,

[0006] The processor is configured to obtain sweep signal parameters and single run time of the transformer winding deformation tester, and send the sweep signal setting parameters and the single run time to the sweep signal generator;

[0007] The signal shaper is configured to obtain a start signal output by the transformer winding deformation tester, perform shaping processing on the start signal to obtain a trigger signal, and send the trigger signal to the sweep signal generator;

[0008] The sweep signal generator is connected with the processor and the signal shaping device, used for receiving the sweep signal setting parameters and the single running time, and outputting two-way sweep signals corresponding to the sweep signal setting parameters and the single running time when the trigger signal is received, so that the transformer winding deformation tester performs testing and obtains testing result data; wherein the sweep signal setting parameters are used for fixing the phase difference and amplitude difference of the two-way sweep signals.

[0009] In the above implementation process, the data acquisition device can pre-acquire a complete running time of the transformer winding deformation tester running independently by the processor, and make the processor acquire all sweep signal parameters required by the sweep signal generator, so that the sweep signal generator can set parameters of the sweep signal to be generated according to the sweep signal parameters and the single running time. Meanwhile, the data acquisition device also acquires the start trigger signal of the transformer winding deformation tester through the signal shaper, and performs shaping processing on the start trigger signal sent by the transformer winding deformation tester through the signal shaper to obtain a trigger signal in the form of a pulse signal, so that the data acquisition device can know that the transformer winding deformation tester has started running through the sweep signal generator, and output two-way sweep signals preset according to the sweep signal parameters, wherein the fixed phase difference and fixed amplitude difference of the two-way sweep signals can greatly improve the accuracy of the data for calibrating the transformer winding deformation tester. It can be seen that by implementing this embodiment, accurate sweep signals can be output through the combination of the sweep signal generator, the signal shaper and the processor, and the transformer winding deformation tester generates testing data according to the sweep signals. Since the sweep signal parameters are known and the testing data is also known, the inaccurate data in the testing data will be more accurately displayed, thereby improving the accuracy of data acquisition and the accuracy of calibration of the transformer winding deformation tester.

[0010] Further, the data acquisition device further comprises a chronograph, wherein,

[0011] The chronograph is connected with the processor and the transformer winding deformation tester respectively, used for detecting the single running time of the transformer winding deformation tester, and sending the single running time to the processor.

[0012] In the implementation process, the data acquisition device can also acquire the single running time of the transformer winding deformation tester through the built-in time meter, and send the single running time to the processor. It can be seen that, by implementing this embodiment, the data acquisition device can acquire the real-time single running time of the calibrated transformer winding deformation tester through the time meter, so that the single running time in the processor has real-time performance, and the data acquisition accuracy of calibrating the transformer winding deformation tester is further improved.

[0013] Further, the processor is further configured to acquire the sweep signal setting parameters and the test result data, and calculate the calibration data according to the sweep signal setting parameters and the test result data.

[0014] In the implementation process, the processor can calculate various data of the sweep signal according to the sweep signal setting parameters, and based on the various data, the difference data between the multiple sweep signals can be further calculated. Therefore, when the difference data is fixed (i.e., the two sweep signals have a fixed phase difference and a fixed amplitude difference), the test result data obtained by the transformer winding deformation tester in theory should match the fixed phase difference and the fixed amplitude difference. However, in practice, it can be found that the test result data obtained by the transformer winding deformation tester is different from the difference data. Therefore, the differences become the calibration data calculated by the processor again, so that the calibration data can more directly indicate the problem of the transformer winding deformation tester, thereby effectively improving the effectiveness of the data output and increasing the usability of the data output.

[0015] Further, the sweep signal generator comprises a power supply adaptation circuit, a communication circuit, a synchronization circuit, a first direct digital frequency synthesizer circuit, a second direct digital frequency synthesizer circuit, and a microprocessor, wherein,

[0016] The power supply adaptation circuit is connected with the microprocessor, and is configured to supply power for the microprocessor;

[0017] The communication circuit is connected with the microprocessor, and is configured to receive the sweep signal setting parameters and the single running time;

[0018] The synchronization circuit is connected with the microprocessor, and is configured to receive the trigger signal;

[0019] The first direct digital frequency synthesizer circuit is connected with the microprocessor, and is configured to output a sweep signal corresponding to the sweep signal setting parameters and the single running time when the synchronization circuit receives the trigger signal;

[0020] The second direct digital frequency synthesizer circuit is connected with the microprocessor, and is used for outputting another frequency sweeping signal corresponding to the frequency sweeping signal setting parameter and the single operation time when the trigger signal is received by the synchronization circuit; wherein, the two frequency sweeping signals have fixed phase difference and amplitude difference.

[0021] The microprocessor is used for power supply, data signal transmission and data signal processing operation of the communication circuit, the synchronization circuit, the first direct digital frequency synthesizer circuit and the second direct digital frequency synthesizer circuit.

[0022] In the above implementation process, the frequency sweeping signal generator in the data acquisition device includes a power supply adaptation circuit, a communication circuit, a synchronization circuit, a first direct digital frequency synthesizer circuit, a second direct digital frequency synthesizer circuit and a microprocessor, wherein the communication circuit and the synchronization circuit are used for information interaction with other devices and realize the function of transmitting data to the microprocessor, the first direct digital frequency synthesizer circuit and the second direct digital frequency synthesizer circuit generate frequency sweeping signals according to the parameters and data information in the microprocessor circuit, and the power supply adaptation circuit supplies power to the rest of the frequency sweeping signal generator. In addition, the microprocessor also has the function of indirect power distribution. It can be seen that by implementing this embodiment, the frequency sweeping signal generator can effectively divide the work and organically combine through the microprocessor, so as to realize the function of generating frequency sweeping signals accurately and efficiently, thereby improving the accuracy of the overall test result data.

[0023] Further, the frequency sweeping signal generator further includes a control circuit and a display circuit, wherein,

[0024] The control circuit is connected with the microprocessor, and is used for receiving a control signal for controlling the microprocessor;

[0025] The display circuit is connected with the microprocessor, and is used for displaying the data information included in the microprocessor.

[0026] In the above implementation process, the frequency sweeping signal generator can also be connected with keyboard and other peripheral devices according to the control circuit, and can also be connected with display or player and other devices according to the display circuit, so as to realize the operability and visibility of the frequency sweeping signal generator, and further improve the use effect of the data acquisition device.

[0027] Further, the communication circuit, the control circuit, the display circuit and the synchronization circuit are respectively connected with the microprocessor through different photoelectric isolation circuits.

[0028] In the implementation process, the data acquisition device uses an opto-isolator to completely isolate the communication circuit, the control circuit, the display circuit and the synchronization circuit from the part where high voltage may occur, thus ensuring the safety of the device and protecting the personal safety.

[0029] Further, the power supply adaptation circuit comprises a three-terminal power plug, an isolation transformer, a power filter circuit, a rectification and voltage stabilization circuit and a low-voltage power conversion circuit, wherein,

[0030] The three-terminal power plug is configured to acquire a power signal.

[0031] The isolation transformer is connected to the three-terminal power plug and configured to transform and transmit the power signal.

[0032] The power filter circuit is connected to the isolation transformer and configured to filter the power signal to obtain a filtered power signal.

[0033] The rectification and voltage stabilization circuit is connected to the power filter circuit and configured to rectify and stabilize the filtered power signal to obtain a direct current signal.

[0034] The low-voltage power conversion circuit is connected to the rectification and voltage stabilization circuit and the microprocessor and configured to step down the direct current signal to supply power to the microprocessor.

[0035] In the implementation process, the three-terminal power plug is connected to the mains to acquire a power signal, and the power filter circuit filters and protects the mains; then the processed alternating current signal is input into the isolation transformer, so that the isolation transformer can isolate and transform the input filtered power signal, and the transformed filtered power signal (alternating current signal) is input into the rectification and voltage stabilization circuit, so that the rectification and voltage stabilization circuit converts the alternating voltage into a direct current signal through bridge rectification and outputs the direct current signal to the low-voltage power conversion circuit, thereby generating 5V, 3.3V and other voltages to supply power to the low-voltage circuit part of the sweep signal generator. It can be seen that this embodiment can improve the safety of the data acquisition device.

[0036] Further, the signal shaper comprises a first attenuation circuit, a first Schmitt trigger circuit and a voltage amplification circuit, wherein,

[0037] The first attenuation circuit is configured to acquire a start signal output by the transformer winding deformation tester; the start signal is a sinusoidal signal.

[0038] The first Schmitt trigger circuit is connected to the first attenuation circuit and configured to convert the start signal into a trigger signal; the trigger signal is a pulse signal.

[0039] The voltage amplification circuit is connected with the first Schmitt trigger circuit, and is used for voltage amplification processing of the trigger signal and transmitting the voltage-amplified trigger signal to the sweep signal generator.

[0040] In the implementation process, the signal shaper obtains the sinusoidal signal output by the transformer winding deformation tester through the first attenuation circuit, processes the sinusoidal signal through the first Schmitt trigger circuit to obtain a regular square wave signal, and further amplifies the amplitude of the square wave signal (trigger signal) to the amplitude at which the sweep signal generator can be successfully triggered through the voltage amplification circuit. It can be seen that the implementation of this embodiment can ensure the triggering of the sweep signal generator, thereby improving the accuracy of data acquisition.

[0041] Further, the time measurer comprises a second attenuation circuit, a time filtering circuit, a second Schmitt trigger circuit, an electronic gate, a counter, a phase-locked loop circuit and a time base circuit, wherein,

[0042] The second attenuation circuit is connected with both the processor and the transformer winding deformation tester, and is used for detecting and attenuating the time signal;

[0043] The time filtering circuit is connected with the second attenuation circuit, and is used for filtering the attenuated time signal to obtain a time filtering signal;

[0044] The second Schmitt trigger circuit is connected with the time filtering circuit, and is used for converting the time filtering signal into a time pulse signal;

[0045] The phase-locked loop circuit is connected with the second attenuation circuit, and is used for phase-locked signal frequency of the attenuated time signal, and transmitting the phase-locked time signal to the time base circuit;

[0046] The time base circuit is connected with the phase-locked loop circuit, and is used for generating a clock pulse signal according to the phase-locked time signal;

[0047] The electronic gate is connected with the second Schmitt trigger circuit and the time base circuit, and is used for selecting the time pulse signal according to the clock pulse signal;

[0048] The counter is connected with the electronic gate, and is used for counting the time pulse signal and the clock pulse signal to obtain the single running time of the transformer winding deformation tester, and transmitting the single running time to the processor.

[0049] In the implementation process, the sine wave signal outputted by the calibrated transformer winding deformation tester enters the attenuation circuit in the time measuring device; the time measuring filter circuit can shield the high frequency noise from the outside and the high order harmonic of the power supply; in addition, when the sine wave signal enters the second Schmitt trigger circuit after filtering, the sine signal will become a regular square wave signal; and the square wave signal is used to control the opening and closing of the electronic gate, so that the count pulse (time pulse signal) generated by the time base circuit enters the counter; so that the counter completes counting on the count pulse to measure the duration of the sine wave outputted by the calibrated transformer winding deformation tester; at the same time, the phase-locked loop circuit is used to collect the frequency of the sine wave outputted by the calibrated transformer winding deformation tester to provide a frequency reference for the time base circuit. It can be seen that the implementation of this embodiment can obtain more accurate single run time measurement, thereby improving the accuracy of data acquisition.

[0050] Further, the frequency sweep signal generator is connected with the signal shaper through a Trigger interface, and the frequency sweep signal generator is connected with the processor through an RS232 interface.

[0051] In the implementation process, the frequency sweep signal generator is connected with the signal shaper through a Trigger interface, and the frequency sweep signal generator is connected with the processor through an RS232 interface. In practice, it is found that using the above interface connection can increase the stability of the device. BRIEF DESCRIPTION OF DRAWINGS

[0052] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the embodiments of the present application. It should be understood that the following drawings only show some embodiments of the present application, and therefore should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can also be obtained without creative labor.

[0053] Figure 1 A structural schematic diagram of a data acquisition device for transformer winding deformation tester calibration provided by the embodiments of the present application;

[0054] Figure 2 A structural schematic diagram of another data acquisition device for transformer winding deformation tester calibration provided by the embodiments of the present application;

[0055] Figure 3 A structural schematic diagram of a frequency sweep signal generator provided by the embodiments of the present application;

[0056] Figure 4 A structural schematic diagram of a signal shaper provided by the embodiments of the present application;

[0057] Figure 5 A structural schematic diagram of a time meter provided by an embodiment of the present application;

[0058] Figure 6 A circuit structural schematic diagram of a power supply adaptation circuit provided by an embodiment of the present application;

[0059] Figure 7 A circuit structural schematic diagram of a communication circuit and an accessory circuit provided by an embodiment of the present application;

[0060] Figure 8 A circuit structural schematic diagram of a control circuit and an accessory circuit provided by an embodiment of the present application;

[0061] Figure 9 A circuit structural schematic diagram of a signal shaper corresponding circuit provided by an embodiment of the present application;

[0062] Figure 10 A circuit structural schematic diagram of a frequency synthesizer circuit provided by an embodiment of the present application;

[0063] Figure 11 A circuit structural schematic diagram of a time meter provided by an embodiment of the present application.

[0064] Main component symbol explanation:

[0065] 100 - processor; 200 - signal shaper; 210 - first attenuation circuit; 220 - first Schmitt trigger circuit; 230 - voltage amplification circuit; 300 - sweep signal generator; 310 - power supply adaptation circuit; 311 - three-terminal power plug; 312 - power filter circuit; 313 - isolation transformer; 314 - rectification and voltage stabilization circuit; 315 - low-voltage power conversion circuit; 320 - communication circuit; 330 - synchronization circuit; 340 - first direct digital frequency synthesizer circuit; 350 - second direct digital frequency synthesizer circuit; 360 - microprocessor; 370 - control circuit; 380 - display circuit; 390 - photoelectric isolation circuit; 400 - time meter; 410 - second attenuation circuit; 420 - time meter filter circuit; 430 - second Schmitt trigger circuit; 440 - electronic gate; 450 - counter; 460 - phase-locked loop circuit; 470 - time base circuit. DETAILED DESCRIPTION

[0066] The technical solutions in the embodiments of the present application will be described below with reference to the accompanying drawings.

[0067] It should be noted that the terms "upper", "lower", "left", "right", "front", "back", "top", "bottom", "inner", "outer", "middle", "vertical", "horizontal", "lateral", "longitudinal", and the like indicate directions or positional relationships based on the orientations or positions shown in the drawings. These terms are mainly used to better describe the contents in the present application, and are not intended to limit the indicated devices, elements or components to have a specific orientation, or to be constructed and operated in a specific orientation.

[0068] In addition, in addition to indicating the orientation or positional relationship, the above-mentioned partial terms can also be used to indicate other meanings, for example, the term "upper" can also be used to indicate a certain dependent relationship or connection relationship in some cases. For those skilled in the art, the specific meaning of these terms in the present application can be understood according to the specific situation.

[0069] In addition, the terms "mounting", "setting", "provided with", "connected", "connected" should be broadly understood. For example, it can be fixedly connected, detachably connected, or integrally constructed; it can be mechanically connected or point connected; it can be directly connected, or indirectly connected through an intermediate medium, or internal communication between two devices, elements or components. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific situation.

[0070] Finally, similar reference numerals and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings. In the description of the present application, the terms "first", "second", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

[0071] Embodiment 1

[0072] Please refer to Figure 1 , Figure 1 A structural schematic diagram of a data acquisition device for calibrating a transformer winding deformation tester is provided for the embodiments of the present application. The acquisition device is applied to the scene of calibrating the transformer winding deformation tester. Specifically, the acquisition device is in the case of not being used or requiring test calibration. Among them, the data acquisition device for calibrating the transformer winding deformation tester includes a frequency sweeping signal generator 300, a signal shaper 200 and a processor 100, wherein,

[0073] The processor 100 is configured to acquire the frequency sweeping signal parameters and the single run time of the transformer winding deformation tester, and send the frequency sweeping signal setting parameters and the single run time to the frequency sweeping signal generator 300;

[0074] The signal shaper 200 is used to acquire the start signal output by the transformer winding deformation tester, to shape the start signal to obtain a trigger signal, and to send the trigger signal to the sweep signal generator 300.

[0075] The sweep signal generator 300 is connected with the processor 100 and the signal shaper 200, and is used to receive the sweep signal setting parameters and the single operation time, and to output two sweep signals corresponding to the sweep signal setting parameters and the single operation time when the trigger signal is received, so as to make the transformer winding deformation tester to test and obtain the test result data; wherein the sweep signal setting parameters are used to fix the phase difference and the amplitude difference of the two sweep signals.

[0076] In the embodiment, the transformer winding deformation tester will send a start trigger signal (i.e. the start signal) when it starts to run, the start signal is converted by the signal shaper 200 and then enters the Trigger interface of the sweep signal generator 300, then the sweep signal generator 300 will send two sweep signals with fixed phase difference and amplitude difference; finally, the processor 100 can obtain the data for calibrating the transformer winding deformation tester by the data of the calibrated transformer winding deformation tester and the sweep signal generator 300.

[0077] As an optional implementation, the sweep signal generator 300 is connected with the signal shaper 200 through the Trigger interface, and the sweep signal generator 300 is connected with the processor 100 through the RS232 interface.

[0078] In the embodiment, the Trigger interface is composed of the photoelectric isolation circuit 390, and under the control of the microprocessor 360, the output signal of the signal shaper 200 is constantly monitored, when the TTL high level appears, the sweep signal generator 300 is triggered to output the two sweep signals with fixed amplitude difference and phase difference, so as to realize the operation synchronization of the calibration system and the calibrated transformer winding deformation tester.

[0079] In the implementation, the sweep signal generator 300 is connected with the signal shaper 200 through the Trigger interface, and the sweep signal generator 300 is connected with the processor 100 through the RS232 interface. In practice, it is found that using the above interface connection can increase the stability of the device.

[0080] For example, the signal output port of the transformer winding deformation tester is connected with the time meter 400 through a BNC cable, the processor 100 is connected with the time meter 400 through a GPIB, a network port, a USB or a serial port and the like, the time meter 400 is controlled to accurately measure the time of the signal of a complete operation of the calibrated transformer winding deformation tester, and then the measured time data is returned to the processor 100, and the connection between the time meter 400 and the calibrated transformer winding deformation tester is disconnected; the two signal output ports of the sweep signal generator 300 are connected with the reference input port and the measurement input port of the calibrated transformer winding deformation tester respectively, and the processor 100 is connected with the RS232 interface of the sweep signal generator 300 through a serial port, the processor 100 can set the sweep mode, the sweep point number, the sweep width, the sweep time (the time measured by the time meter 400), the phase difference and the amplitude difference of the two output signals and the like according to the requirements of an operator, and then make it enter a waiting trigger state; the signal output port of the calibrated transformer winding deformation tester is connected with the input port of the signal shaper 200, and the output port of the signal shaper 200 is connected with the Trigger interface of the sweep signal generator 300; the calibrated transformer winding deformation tester is manually controlled to start running, after starting running, the signal emitted by the calibrated device is adjusted by the signal shaper 200 and then enters the Trigger interface of the sweep signal generator 300, the sweep signal generator 300 outputs two sweep signals with a fixed amplitude difference and a fixed phase difference after receiving the trigger signal, the calibrated transformer winding deformation tester measures the two sweep signals, collects the measurement values of the amplitude difference and the phase difference, and compares the measurement values with the standard values output by the sweep signal generator 300, so as to realize the calibration of the transformer winding deformation tester.

[0081] It can be seen that the implementation Figure 1The data acquisition device for calibrating the transformer winding deformation tester described in the embodiment can pre-acquire a single complete running time of the transformer winding deformation tester running independently by the processor 100, and make the processor 100 acquire all the sweep signal parameters required by the sweep signal generator 300, so that the sweep signal generator 300 can set the parameters of the sweep signal to be generated according to the sweep signal parameters and the single running time. Meanwhile, the data acquisition device also acquires the start trigger signal of the transformer winding deformation tester through the signal shaper 200, and performs shaping processing on the start trigger signal sent by the transformer winding deformation tester through the signal shaper 200 to obtain a trigger signal in the form of a pulse signal, so that the data acquisition device can know that the transformer winding deformation tester has started running through the sweep signal generator 300, and output two sweep signals preset according to the sweep signal parameters, wherein the two sweep signals have a fixed phase difference and a fixed amplitude difference, which can greatly improve the accuracy of the data for calibrating the transformer winding deformation tester. It can be seen that, by implementing this embodiment, accurate sweep signals can be output through the combination of the sweep signal generator 300, the signal shaper 200 and the processor 100, and the transformer winding deformation tester generates test data according to the sweep signals. Since the sweep signal parameters are known and the test data is also known, the inaccurate data in the test data can be more accurately displayed, thereby improving the accuracy of data acquisition and further improving the accuracy of calibration of the transformer winding deformation tester.

[0082] Embodiment 2

[0083] Please refer to Figure 2 , Figure 2 Another structure diagram of a data acquisition device for calibrating a transformer winding deformation tester provided in the embodiment. Figure 2 The structure diagram of the data acquisition device for calibrating the transformer winding deformation tester described in the embodiment is further improved on the basis of Figure 1 the structure diagram of the data acquisition device for calibrating the transformer winding deformation tester in the prior art. The data acquisition device further comprises a time meter 400, wherein

[0084] The time meter 400 is connected with the processor 100 and the transformer winding deformation tester respectively, and is used for detecting the single running time of the transformer winding deformation tester and sending the single running time to the processor 100.

[0085] In the embodiment, the processor 100 can be a host computer.

[0086] In the embodiment, the processor 100 can control the chronograph 400 to detect a complete running time of the calibrated transformer winding deformation tester through the RS232 interface, and then input the detected time as a known parameter to the sweep signal generator 300, and set the sweep mode, sweep points, sweep width, phase difference of two-way output signals, amplitude difference and other parameters of the sweep signal generator 300.

[0087] In the embodiment, the processor 100 can control the sweep signal generator 300 and the chronograph 400 through various interfaces such as GPIB, network interface, USB or serial port, and read data.

[0088] In the embodiment, the data acquisition device can also acquire the single running time of the transformer winding deformation tester through the built-in chronograph 400, and send the single running time to the processor 100. It can be seen that in the embodiment, the data acquisition device can acquire the real-time single running time of the calibrated transformer winding deformation tester through the chronograph 400, so that the single running time in the processor 100 has real-time performance, and the data acquisition accuracy of calibrating the transformer winding deformation tester is further improved.

[0089] As an optional embodiment, the processor 100 is further configured to acquire the sweep signal setting parameters and the test result data, and calculate the calibration data according to the sweep signal setting parameters and the test result data.

[0090] In the embodiment, the processor 100 can acquire the data for calibrating the transformer winding deformation tester by the data of the calibrated transformer winding deformation tester and the sweep signal generator 300.

[0091] In the embodiment, the processor 100 can calculate various data of the sweep signal according to the sweep signal setting parameters, and further calculate the difference data between the multiple sweep signals based on the various data. Therefore, when the difference data is fixed (i.e., the two-way sweep signals have a fixed phase difference and a fixed amplitude difference), the test result data obtained by the transformer winding deformation tester in theory should match the fixed phase difference and the fixed amplitude difference. However, in practice, it can be found that the test result data obtained by the transformer winding deformation tester is different from the difference data, and the difference becomes the calibration data calculated by the processor 100 again, so that the calibration data can more directly and obviously indicate the problem of the transformer winding deformation tester, thereby effectively improving the effectiveness of the data output and increasing the directly usable of the data output.

[0092] Please refer to Figure 3 , Figure 3 A structural schematic diagram of a sweep signal generator 300 provided by an embodiment of the present application is shown in FIG. 1. Figure 3 The structural schematic diagram of the sweep signal generator 300 described is obtained by refining the sweep signal generator 300 in FIG. 1. The sweep signal generator 300 includes a power supply adaptation circuit 310, a communication circuit 320, a synchronization circuit 330, a first direct digital frequency synthesizer circuit 340, a second direct digital frequency synthesizer circuit 350, and a microprocessor 360, wherein Figure 1 Figure 2 The power supply adaptation circuit 310 is connected to the microprocessor 360 and is configured to supply power to the microprocessor 360.

[0093] The communication circuit 320 is connected to the microprocessor 360 and is configured to receive sweep signal setting parameters and single run time.

[0094] The synchronization circuit 330 is connected to the microprocessor 360 and is configured to receive a trigger signal.

[0095] The first direct digital frequency synthesizer circuit 340 is connected to the microprocessor 360 and is configured to output a sweep signal corresponding to the sweep signal setting parameters and the single run time when the synchronization circuit 330 receives the trigger signal.

[0096] The second direct digital frequency synthesizer circuit 350 is connected to the microprocessor 360 and is configured to output another sweep signal corresponding to the sweep signal setting parameters and the single run time when the synchronization circuit 330 receives the trigger signal. The two sweep signals have a fixed phase difference and amplitude difference.

[0097] The microprocessor 360 is configured to perform power supply, data signal transmission, and data signal processing operations on the communication circuit 320, the synchronization circuit 330, the first direct digital frequency synthesizer circuit 340, and the second direct digital frequency synthesizer circuit 350.

[0098] The microprocessor 360 is configured to perform power supply, data signal transmission, and data signal processing operations on the communication circuit 320, the synchronization circuit 330, the first direct digital frequency synthesizer circuit 340, and the second direct digital frequency synthesizer circuit 350.

[0099] ​In the implementation, the sweep signal generator 300 in the data acquisition device comprises a power supply adaptation circuit 310, a communication circuit 320, a synchronization circuit 330, a first direct digital frequency synthesizer circuit 340, a second direct digital frequency synthesizer circuit 350, and a microprocessor 360. The communication circuit 320 and the synchronization circuit 330 are used for information interaction with other devices and realize the function of transmitting data to the microprocessor 360. The first direct digital frequency synthesizer circuit 340 and the second direct digital frequency synthesizer circuit 350 generate sweep signals according to the parameters and data information in the microprocessor circuit. The power supply adaptation circuit 310 supplies power to the rest of the circuits in the sweep signal generator 300. The microprocessor 360 also has the function of indirectly distributing power. It can be seen that, in the implementation, the sweep signal generator 300 can effectively divide the work and organically combine through the microprocessor 360, so as to realize the function of efficiently and accurately generating sweep signals, thereby improving the accuracy of the overall test result data.

[0100] In the embodiment, the microprocessor can be an STM32F429IG single-chip microcomputer.

[0101] In the embodiment, the communication circuit 320 can use an RS232 module. Specifically, the RS232 module can be an integrated circuit chip of the MAX233 type. For details, refer to the circuit structure shown in Figure 7 .

[0102] In the embodiment, Figure 10 A circuit structure schematic diagram of a frequency synthesizer circuit (including the first direct digital frequency synthesizer circuit 340 and the second direct digital frequency synthesizer circuit 350) is provided. The first direct digital frequency synthesizer circuit 340 can comprise a first direct digital frequency synthesizer and a voltage regulation module. The first direct digital frequency synthesizer is composed of two AD9852 chips. The voltage regulation module is composed of an integrated operational amplifier chip AD8615 and peripheral capacitors and resistors. The second direct digital frequency synthesizer circuit 350 can comprise a second direct digital frequency synthesizer and a voltage regulation module. The second direct digital frequency synthesizer is composed of two AD9852 chips. The voltage regulation module is composed of an integrated operational amplifier chip AD8615 and peripheral capacitors and resistors.

[0103] As an optional implementation, the sweep signal generator 300 further comprises a control circuit 370 and a display circuit 380. The control circuit 370 is connected to the microprocessor 360 and is used for receiving a control signal for controlling the microprocessor 360.

[0104] The control circuit 370 is connected to the microprocessor 360 and is used for receiving a control signal for controlling the microprocessor 360.

[0105] The display circuit 380 is connected to the microprocessor 360 and is used to display the data information included by the microprocessor 360.

[0106] In the embodiment, the control circuit 370 can include a control chip of model BC7281B, and a circuit structure diagram of the control chip can refer to the diagram shown in Fig. 4. Figure 8

[0107] In the embodiment, the display circuit 380 can be composed of a capacitive touch screen of model HZ-TFT070CE083-C and a touch chip of model GT9157.

[0108] By implementing the embodiment, the sweep signal generator 300 can also be connected to peripheral devices such as a keyboard according to the control circuit 370, and can also be connected to devices such as a display or a player according to the display circuit 380, so that the operability and visibility of the sweep signal generator 300 can be realized, and the use effect of the data acquisition device is further improved.

[0109] As an optional embodiment, the communication circuit 320, the control circuit 370, the display circuit 380 and the synchronization circuit 330 are respectively connected to the microprocessor 360 through different optoelectronic isolation circuits 390.

[0110] In the embodiment, the optoelectronic isolation circuit 390 can be composed of a TLP521 chip.

[0111] By implementing the embodiment, the data acquisition device uses the optoelectronic isolation circuit 390 to completely isolate the communication circuit 320, the control circuit 370, the display circuit 380 and the synchronization circuit 330 from the part that can generate high voltage, so that the safety of the device and the personal safety can be guaranteed.

[0112] As an optional embodiment, the power adapter circuit 310 includes a three-terminal power plug 311, an isolation transformer 313, a power filter circuit 312, a rectification and voltage stabilization circuit 314 and a low-voltage power conversion circuit 315, wherein,

[0113] The three-terminal power plug 311 is used to acquire a power signal;

[0114] The isolation transformer 313 is connected to the three-terminal power plug 311 and is used to transform and transmit the power signal;

[0115] The power filter circuit 312 is connected to the isolation transformer 313 and is used to filter the power signal to obtain a filtered power signal;

[0116] The rectification and voltage stabilization circuit 314 is connected to the power filter circuit 312 and is used to rectify and stabilize the filtered power signal to obtain a direct current signal;

[0117] ​The low-voltage power conversion circuit 315 is connected with the rectification and voltage stabilization circuit 314 and the microprocessor 360, and is used for outputting a direct current signal with a reduced voltage to supply power to the microprocessor 360.

[0118] Please refer to Figure 6 , Figure 6 Fig. 1 is a schematic diagram of a circuit structure of a power supply adaptation circuit 310 provided in the embodiment. The sweep signal generator 300 includes a standard three-terminal power plug 311, an EMI filter circuit (i.e., a power filter circuit 312), an isolation transformer 313 (i.e., an R-type isolation transformer), a rectification and voltage stabilization circuit 314 (i.e., a power circuit), a low-voltage power conversion circuit 315, an RS232 module (i.e., a communication circuit 320), a keyboard module (i.e., a control circuit 370), a display circuit 380, a Trigger interface circuit (i.e., a synchronization circuit 330), an opto-isolator circuit 390, a microprocessor 360, DDS direct digital frequency synthesizers (i.e., a first direct digital frequency synthesizer circuit 340 and a second direct digital frequency synthesizer circuit 350), a voltage adjustment module (a module included in both the first direct digital frequency synthesizer circuit 340 and the second direct digital frequency synthesizer circuit 350), and a BNC interface (an interface used by both the first direct digital frequency synthesizer circuit 340 and the second direct digital frequency synthesizer circuit 350 to output sweep signals), and all the above structures are connected through circuits.

[0119] In the embodiment, the three-terminal power plug 311 is coupled to an external socket by plugging to obtain an electrical signal of an external power supply.

[0120] In the embodiment, the processor 100 can control and read data of the sweep signal generator 300, the time meter 400, and the signal shaper 200 through various interfaces such as GPIB, network interface, USB, or serial port.

[0121] In the embodiment, the EMI filter circuit is a low-pass filter circuit composed of a series reactor and a parallel capacitor, which allows a 220V mains frequency signal to enter the calibration system and shields high-frequency interference signals existing in the power line.

[0122] In the embodiment, the voltage adjustment module (voltage adjustment circuit) can solve the problem of reduced accuracy of amplitude-frequency characteristic measurement caused by the inconsistency of impedances of a reference input end and a measurement input end of a calibrated transformer winding deformation tester.

[0123] In the embodiment, the isolation transformer 313 is used to output the acquired electrical signal after voltage reduction. Specifically, the isolation transformer 313 can be an R-type isolation transformer, the primary side winding of the isolation transformer 313 is 220V (with a shielding line), and the secondary side winding can be 15V / 30W (with an intermediate tap), 6V / 12W (without an intermediate tap) or 6V / 6W (without an intermediate tap). The primary side winding of the isolation transformer 313 is coupled with the three-terminal power plug 311, and the primary side winding of the isolation transformer 313 can acquire the electrical signal. The isolation transformer 313 can reduce the electrical signal through the electromagnetic coupling relationship between the primary side winding and the secondary side winding, and output the reduced electrical signal to the power filter circuit 312 through the coupling between the secondary side winding and the power filter circuit 312.

[0124] In the embodiment, the power filter circuit 312 is coupled with the isolation transformer 313 through the input end to filter out the interference signal in the electrical signal input by the isolation transformer 313, so as to prevent the interference signal in the external power supply from affecting the normal operation of the calibration device. In the embodiment, the power filter circuit 312 can use an EMI (Electromagnetic Interference) filter, wherein the power of the EMI filter can be greater than 80W. The power filter circuit 312 can eliminate the electromagnetic interference existing in the input external power supply through filtering and shielding. The power filter circuit 312 can filter out the high-frequency interference signal in the electrical signal through its own series reactor and parallel capacitor. The output end of the power filter circuit 312 is coupled with the rectifier and voltage stabilizing circuit 314, and the filtered signal can be output to the rectifier and voltage stabilizing circuit 314.

[0125] In the embodiment, the rectifier and voltage stabilizing circuit 314 is used to rectify the electrical signal output by the power filter circuit 312. Specifically, the rectifier and voltage stabilizing circuit 314 can include a bridge rectifier circuit and a three-terminal voltage stabilizing chip. The bridge rectifier circuit and the three-terminal voltage stabilizing chip are coupled, wherein the three-terminal voltage stabilizing chip can be LM8715, LM7915, HT1621B, HT7130 or LM7805. The rectifier and voltage stabilizing circuit 314 can rectify the alternating current electrical signal acquired by the output end into a direct current electrical signal through its own rectifier bridge. The output end of the rectifier and voltage stabilizing circuit 314 is coupled with the low-voltage power conversion circuit 315, and the direct current electrical signal can be output to the low-voltage power conversion circuit 315.

[0126] In the embodiment, the low-voltage power conversion circuit 315 is used to obtain the electrical signal output by the rectification and voltage stabilization circuit 314, and output the electrical signal to the microprocessor 360 MCU, the direct digital frequency synthesizer DDS and the voltage regulation module after voltage reduction. Specifically, the low-voltage power conversion circuit 315 can be a DC-DC chip of WB24S05-5W type and a three-terminal voltage regulator of LM2937-3.3V type. The low-voltage power conversion circuit 315 can output the obtained electrical signal to the microprocessor 360 MCU, the direct digital frequency synthesizer DDS and the voltage regulation module after voltage reduction to 15V, 5V and 3.3V to supply power to them.

[0127] In the embodiment, the standard three-terminal power plug 311 is connected to the mains to obtain a power signal, and the mains connected is filtered and protected by the power filter circuit 312; then the processed alternating current signal is input into the isolation transformer 313, so that the isolation transformer 313 can isolate and transform the input filtered power signal, and input the filtered power signal (alternating current signal) after isolation and transformation into the rectification and voltage stabilization circuit 314, so that the rectification and voltage stabilization circuit 314 converts the alternating voltage into a direct current signal through bridge rectification, and outputs the direct current signal to the low-voltage power conversion circuit 315, thereby generating 5V, 3.3V and other voltages to supply power to the low-voltage circuit part of the sweep frequency signal generator 300. It can be seen that the embodiment can improve the safety of the data acquisition device.

[0128] For example, the standard three-terminal power plug 311 is connected to the mains, and the power filter circuit 312 filters and protects the incoming mains, etc.; then the processed AC signal is input into the isolation transformer 313, which isolates and transforms the input signal, and inputs the isolated and transformed AC signal into the rectifier and voltage stabilizing circuit 314; the rectifier and voltage stabilizing circuit 314 converts the AC voltage into DC voltage through bridge rectification and inputs it into the low-voltage power conversion circuit 315 to generate 5V, 3.3V, etc. voltage to power the low-voltage circuit part of the sweep signal generator 300. After receiving the control instruction from the processor 100, the sweep signal generator 300 analyzes the instruction through the microprocessor 360, and then the microprocessor 360 judges whether it should enter the test working state by monitoring the level change of the Trigger interface; when the Trigger interface monitors the high-low level change, the microprocessor 360 will control the direct digital synthesizer DDS and the voltage regulating circuit (the direct digital synthesizer DDS and the voltage regulating circuit constitute the first direct digital frequency synthesizer circuit 340, and the direct digital synthesizer DDS and the voltage regulating circuit also constitute the second direct digital frequency synthesizer circuit 350) to output sweep signals with fixed amplitude difference and phase difference according to the parameters set by the operator. The microprocessor 360 judges the end time of the sweep signal and sends an end instruction to the processor 100 through the communication circuit 320.

[0129] Please refer to Figure 4 , Figure 4 for a structural schematic diagram of a signal shaper 200 provided by an embodiment of the present application. Figure 4 The structural schematic diagram of the signal shaper 200 described is obtained by refining the signal shaper 200 in Figure 1 or Figure 2 . The signal shaper 200 includes a first attenuation circuit 210, a first Schmitt trigger circuit 220, and a voltage amplification circuit 230, wherein

[0130] The first attenuation circuit 210 is configured to obtain a start signal output by a transformer winding deformation tester; the start signal is a sinusoidal signal;

[0131] The first Schmitt trigger circuit 220 is connected to the first attenuation circuit 210 and is configured to convert the start signal into a trigger signal; the trigger signal is a pulse signal;

[0132] The voltage amplification circuit 230 is connected to the first Schmitt trigger circuit 220 and is configured to perform voltage amplification processing on the trigger signal and send the voltage-amplified trigger signal to a sweep signal generator 300.

[0133] In this embodiment, the signal shaper 200 includes the first attenuation circuit 210, the first Schmitt trigger circuit 220 and the voltage amplification circuit 230, which are connected by circuits.

[0134] In this embodiment, the first Schmitt trigger circuit 220 can quickly convert the sine signal output by the transformer winding deformation tester into a pulse signal, so as to drive the sweep signal generator 300 to start action.

[0135] In this embodiment, the first attenuation circuit 210 is a T-shaped resistance attenuation network built by a metal film resistor.

[0136] In this embodiment, the first Schmitt trigger in the first Schmitt trigger circuit 220 is composed of a 74LS18 chip and peripheral resistance and capacitance circuits, and the specific circuit structure can be seen from the circuit structure schematic diagram shown in Figure 9

[0137] In this embodiment, the voltage amplification circuit 230 is a proportional amplification circuit composed of an integrated operational amplifier chip AD8615 and peripheral capacitors and resistors, with a bandwidth of 10 Hz to 20 MHz and an amplification multiple of 5.

[0138] By implementing this embodiment, the signal shaper 200 acquires the sine wave signal output by the transformer winding deformation tester through the first attenuation circuit 210, processes the sine wave signal through the first Schmitt trigger circuit 220 to obtain a regular square wave signal, and further amplifies the amplitude of the square wave signal (trigger signal) to the amplitude at which the sweep signal generator 300 can be successfully triggered through the voltage amplification circuit 230. It can be seen that implementing this embodiment can ensure the triggering of the sweep signal generator 300, thereby improving the accuracy of data acquisition.

[0139] For example, the sine wave signal output by the calibrated transformer winding deformation tester enters the first attenuation circuit 210 in the signal shaper 200 through the BNC interface; after attenuation, the sine wave signal enters the first Schmitt trigger circuit, and the sine signal becomes a regular square wave signal; the voltage amplification circuit 230 amplifies the amplitude of the square wave signal to the amplitude at which the Trigger interface in the next-stage sweep signal generator 300 can be successfully triggered.

[0140] Please refer to Figure 5 , Figure 5 for a structural schematic diagram of a time measuring device 400 provided in the embodiment of the present application. Figure 5 The structural schematic diagram of the time measuring device 400 described is according to Figure 2 ​The time measurement module (i.e. the time measurer 400) is refined to obtain the time signal. The time measurer 400 includes a second attenuation circuit 410, a time measurement filter circuit 420, a second Schmitt trigger circuit 430, an electronic gate 440, a counter 450, a phase-locked loop circuit 460, and a time base circuit 470, wherein,

[0141] The second attenuation circuit 410 is connected to both the processor 100 and the transformer winding deformation tester, for detecting and attenuating the time signal.

[0142] The time measurement filter circuit 420 is connected to the second attenuation circuit 410, for filtering the attenuated time signal to obtain a time filter signal.

[0143] The second Schmitt trigger circuit 430 is connected to the time measurement filter circuit 420, for converting the time filter signal into a time pulse signal.

[0144] The phase-locked loop circuit 460 is connected to the second attenuation circuit 410, for phase-locked signal frequency of the attenuated time signal, and transmitting the phase-locked time signal to the time base circuit 470.

[0145] The time base circuit 470 is connected to the phase-locked loop circuit 460, for generating a clock pulse signal according to the phase-locked time signal.

[0146] The electronic gate 440 is connected to the second Schmitt trigger circuit 430 and the time base circuit 470, for gating the time pulse signal according to the clock pulse signal.

[0147] The counter 450 is connected to the electronic gate 440, for counting the time pulse signal and the clock pulse signal to obtain the single running time of the transformer winding deformation tester, and sending the single running time to the processor 100.

[0148] In this embodiment, the time measurement module (i.e. the time measurer 400) includes the second attenuation circuit 410, the time measurement filter circuit 420, the second Schmitt trigger circuit 430, the electronic gate 440, the counter 450, the time base circuit 470, and the PPL circuit (i.e. the phase-locked loop circuit 460), which are all connected by circuits.

[0149] Please refer to Figure 11 , Figure 11 which is a circuit structure schematic diagram of the time measurer 400 provided in this embodiment.

[0150] In this embodiment, the time expansion technology is used to effectively correct the quantization error in the time measurement process, which can improve the measurement accuracy.

[0151] In this embodiment, the digital frequency synthesis technology is used to accurately lock the frequency of the signal outputted by the transformer winding deformation tester, so as to effectively reduce the system error.

[0152] In this embodiment, the time measuring filter circuit 420 is a two-stage low-pass filter composed of an LM102 integrated operational amplifier and peripheral resistors and capacitors.

[0153] In this embodiment, the electronic gate 440 is composed of a 2SK385 type FET field effect transistor and resistors.

[0154] In this embodiment, the counter 450 is composed of multiple T flip-flops.

[0155] In this embodiment, the time base circuit 470 is composed of a DSA321SCL voltage-controlled temperature compensation crystal oscillator and peripheral capacitors and resistors used for starting vibration.

[0156] In this embodiment, the second Schmitt trigger circuit 430 and the first Schmitt trigger circuit 220 have the same structure.

[0157] In this embodiment, the second attenuation circuit 410 and the first attenuation circuit 210 have the same structure.

[0158] In this embodiment, the sinusoidal wave signal outputted by the calibrated transformer winding deformation tester enters the attenuation circuit in the time measurer 400; the time measuring filter circuit 420 can shield the high-frequency noise from the outside and the high-order harmonics caused by the power supply from the sinusoidal wave signal; in addition, when the sinusoidal wave signal enters the second Schmitt trigger circuit after being filtered, the sinusoidal signal will become a regular square wave signal; and the square wave signal is used to make the time base circuit 470 generate a counting pulse (time pulse signal) to enter the counter 450 by controlling the switch of the electronic gate 440; so that the counter 450 completes counting on the counting pulse to realize the measurement of the duration of the sinusoidal wave outputted by the calibrated transformer winding deformation tester; at the same time, the phase-locked loop circuit 460 is used to collect the frequency of the sinusoidal wave outputted by the calibrated transformer winding deformation tester to provide a frequency reference for the time base circuit 470. It can be seen that this embodiment can obtain more accurate measurement of single operation time, thereby improving the accuracy of data acquisition.

[0159] For example, the sine wave signal outputted by the calibrated transformer winding deformation tester enters the second attenuation circuit 410 in the time measuring device 400 through the BNC interface; the time measuring filter circuit 420 can shield the high frequency noise from the outside and the high order harmonic of the power supply from being mixed in the sine wave signal; after the sine wave signal is filtered, it enters the second Schmitt trigger circuit 430, and the sine signal becomes a regular square wave signal; the square wave signal passes through the switch of the control electronic gate 440, so that the count pulse generated by the time base circuit 470 enters the counter 450; the counter 450 completes counting on the count pulse, thereby realizing the measurement of the duration of the sine wave outputted by the calibrated transformer winding deformation tester; the phase-locked loop circuit 460 is used to collect the frequency of the sine wave outputted by the calibrated transformer winding deformation tester, so as to provide the frequency reference for the time base circuit 470.

[0160] In this embodiment, all the described contents can be explained and described with reference to the description in Embodiment 1, and the same contents will not be described herein.

[0161] The data acquisition device for the calibration of the transformer winding deformation tester described in Embodiment 2 can realize the calibration of the transformer winding deformation tester under the control of the processor 100; by using the direct digital synthesis technology (DDS), the problem of difficult calibration of the amplitude-frequency characteristic and the phase-frequency characteristic is solved; by increasing the Trigger interface, the problem of operation synchronization between the transformer winding deformation tester and the frequency sweep signal generation module is solved; by using the time expansion technology, the quantization error in the time measurement process is effectively corrected, and the measurement precision is improved; by using the digital frequency synthesis technology, the signal frequency outputted by the calibrated transformer winding deformation tester is accurately phase-locked, and the system error is effectively reduced.

[0162] In several embodiments provided in the present application, it should be understood that the disclosed circuit and device can also be implemented by other ways. The device embodiments described above are only schematic, for example, the block diagram in the drawings shows the architecture, function and operation of the device which can be implemented according to the embodiments of the present application. In this regard, each block in the block diagram can represent a module containing one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions noted in the blocks can occur in different order than that shown in the figure. For example, two consecutive blocks can actually be executed substantially in parallel, and sometimes they can be executed in reverse order, depending on the function involved. It should also be noted that each block in the block diagram, and the combination of blocks in the block diagram, can be implemented by a dedicated hardware-based system for performing the specified function or action.

[0163] In addition, each functional module in each embodiment of the present application can be integrated together to form an independent part, or each module can exist independently, or two or more modules can be integrated to form an independent part.

[0164] The above only describes the embodiments of the present application and is not used to limit the protection scope of the present application. For those skilled in the art, the present application can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application. It should be noted that similar reference numbers and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings.

[0165] The above only describes the embodiments of the present application and is not used to limit the protection scope of the present application. For those skilled in the art, the present application can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application. It should be noted that similar reference numbers and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings.

[0166] It should be noted that, in this document, relational terms such as first and second, and the like can be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises", "comprising", or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but can include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without limitation, an element preceded by "comprises... a" does not, without more constraints, foreclose the existence of additional identical elements in the process, method, article, or apparatus that comprises the element.

Claims

1. A data acquisition device for calibrating a transformer winding deformation tester, characterized in that, The data acquisition device includes a sweep frequency signal generator, a signal shaper, and a processor, wherein, The processor is used to acquire the sweep frequency signal parameters and the single run time of the transformer winding deformation tester, and send the sweep frequency signal parameters and the single run time to the sweep frequency signal generator. The signal shaper is used to acquire the start signal output by the transformer winding deformation tester, shape the start signal to obtain a trigger signal, and send the trigger signal to the sweep frequency signal generator. The frequency sweep signal generator is connected to the processor and the signal shaping device, and is used to receive the frequency sweep signal parameters and the single run time. When the trigger signal is received, it outputs two frequency sweep signals corresponding to the frequency sweep signal parameters and the single run time, so that the transformer winding deformation tester can perform the test and obtain test result data. The frequency sweep signal parameters are used to fix the phase difference and amplitude difference of the two frequency sweep signals. The data acquisition device further includes a timer, wherein, The timer is connected to both the processor and the transformer winding deformation tester, and is used to detect the single run time of the transformer winding deformation tester and send the single run time to the processor.

2. The data acquisition device for calibrating a transformer winding deformation tester according to claim 1, characterized in that, The processor is also used to acquire the sweep frequency signal parameters and the test result data, and to perform calculations based on the sweep frequency signal parameters and the test result data to obtain calibration data.

3. The data acquisition device for calibrating a transformer winding deformation tester according to claim 1, characterized in that, The frequency sweep signal generator includes a power adapter circuit, a communication circuit, a synchronization circuit, a first direct digital frequency synthesizer circuit, a second direct digital frequency synthesizer circuit, and a microprocessor. The power adapter circuit is connected to the microprocessor and is used to supply power to the microprocessor; The communication circuit is connected to the microprocessor and is used to receive the frequency sweep signal parameters and the single run time; The synchronization circuit is connected to the microprocessor and is used to receive the trigger signal; The first direct digital frequency synthesizer circuit is connected to the microprocessor and is used to output a sweep frequency signal corresponding to the sweep frequency signal parameters and the single running time when the synchronization circuit receives the trigger signal; The second direct digital frequency synthesizer circuit is connected to the microprocessor and is used to output another sweep frequency signal corresponding to the sweep frequency signal parameters and the single run time when the synchronization circuit receives the trigger signal; wherein the two sweep frequency signals have a fixed phase difference and amplitude difference; The microprocessor is used to power the communication circuit, the synchronization circuit, the first direct digital frequency synthesizer circuit, and the second direct digital frequency synthesizer circuit, transmit data signals, and process data signals.

4. The data acquisition device for calibrating a transformer winding deformation tester according to claim 3, characterized in that, The frequency sweep signal generator also includes a control circuit and a display circuit, wherein, The control circuit is connected to the microprocessor and is used to receive control signals for controlling the microprocessor. The display circuit is connected to the microprocessor and is used to display the data information included in the microprocessor.

5. The data acquisition device for calibrating a transformer winding deformation tester according to claim 4, characterized in that, The communication circuit, the control circuit, the display circuit, and the synchronization circuit are each connected to the microprocessor through different opto-isolation circuits.

6. The data acquisition device for calibrating a transformer winding deformation tester according to claim 3, characterized in that, The power adapter circuit includes a three-terminal power plug, an isolation transformer, a power filter circuit, a rectifier and voltage regulator circuit, and a low-voltage power conversion circuit. The three-terminal power plug is used to acquire power signals; The isolation transformer is connected to the three-terminal power plug and is used to transform and transmit the power signal; The power filtering circuit is connected to the isolation transformer and is used to filter the power signal to obtain a filtered power signal. The rectifier and voltage regulator circuit is connected to the power supply filter circuit and is used to rectify and regulate the filtered power supply signal to obtain a DC signal. The low-voltage power conversion circuit is connected to the rectifier and voltage regulator circuit and the microprocessor, and is used to step down the DC signal to power the microprocessor.

7. The data acquisition device for calibrating a transformer winding deformation tester according to claim 1, characterized in that, The signal shaper includes a first attenuation circuit, a first Schmitt trigger circuit, and a voltage amplification circuit, wherein... The first attenuation circuit is used to acquire the start signal output by the transformer winding deformation tester; the start signal is a sine wave signal. The first Schmitt trigger circuit is connected to the first attenuation circuit and is used to convert the start signal into a trigger signal; the trigger signal is a pulse signal. The voltage amplification circuit is connected to the first Schmitt trigger circuit and is used to amplify the voltage of the trigger signal and send the amplified trigger signal to the sweep frequency signal generator.

8. The data acquisition device for calibrating a transformer winding deformation tester according to claim 1, characterized in that, The timer includes a second attenuation circuit, a timing filter circuit, a second Schmitt trigger circuit, an electronic gate, a counter, a phase-locked loop circuit, and a time base circuit, wherein... The second attenuation circuit is connected to both the processor and the transformer winding deformation tester, and is used to detect the time signal and attenuate the time signal. The timing filter circuit is connected to the second attenuation circuit and is used to filter the attenuated time signal to obtain a time-filtered signal. The second Schmitt trigger circuit is connected to the timing filter circuit and is used to convert the time filter signal into a time pulse signal; The phase-locked loop circuit is connected to the second attenuation circuit and is used to lock the signal frequency of the attenuated time signal into phase and transmit the phase-locked time signal to the time base circuit. The time base circuit is connected to the phase-locked loop circuit and is used to generate a clock pulse signal based on the phase-locked time signal; The electronic gate is connected to the second Schmitt trigger circuit and the time base circuit, and is used to select the time pulse signal according to the clock pulse signal; The counter is connected to the electronic gate and is used to count the time pulse signal and the clock pulse signal to obtain the single running time of the transformer winding deformation tester, and send the single running time to the processor.

9. The data acquisition device for calibrating a transformer winding deformation tester according to claim 1, characterized in that, The sweep frequency signal generator is connected to the signal shaper via a Trigger interface, and the sweep frequency signal generator is connected to the processor via an RS232 interface.

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