Dynamic Position Data Correction Using Non-Destructive Inspection

Abstract

Dynamic position data correction using nondestructive inspection. Embodiments described herein utilize nondestructive inspection (NDI) scan data obtained during a process performed on a surface of a structure to update the position of an NDI scanner on the surface. Subsurface features within a structure are detected based on the NDI scan data associated with predefined position data of the subsurface features. The measured position of the NDI scanner on the surface is corrected based on the predefined position data of the subsurface features.

Description

Technical Field

[0001] The present disclosure relates to the field of non-destructive inspection (NDI), and in particular, to NDI processes performed on structures. Background Art

[0002] Building an aircraft may include attaching components to a support structure that provides structural rigidity. For example, the support structure may include a hoop frame and longitudinal elongated stringers to which skin panels are attached. The combination of the skin panels and the support structure together define a portion of the fuselage of the aircraft.

[0003] The aircraft structure may be inspected at various times to determine whether the aircraft structure meets design standards and / or is free of damage. For example, the aircraft structure may be inspected during manufacturing to ensure that the aircraft structure is manufactured to specification. In another example, the aircraft structure may be inspected during aircraft service to ensure that the structure is free of damage during aircraft operation.

[0004] Such inspections may be performed to determine if subsurface anomalies are present within an aircraft structure. Although subsurface anomalies may not be observable on the exterior surface of an aircraft structure, various inspection processes may be performed that may reveal the presence of such subsurface anomalies. One type of inspection that may be performed is a non-destructive inspection (NDI) test. NDI may also be referred to as non-destructive evaluation or inspection (NDE) or non-destructive testing (NDT). The techniques used to perform NDI tests vary widely, but NDI tests generally have the common quality of not permanently altering the structure under inspection.

[0005] Inspections of aircraft structures may be performed by human operators using handheld devices, and / or by robotic assets. However, the NDI data generated during these processes requires measuring the exact position of the NDI scanner to allow the location of the anomaly to be accurately determined, but acquiring accurate position data for NDI applications can be challenging.

[0006] Therefore, there is a need to improve the localization aspect of the NDI anomaly detection process. Summary of the invention

[0007] Embodiments described herein utilize non-destructive inspection (NDI) scan data to update the position of an NDI scanner on a surface of a structure. Subsurface features within a structure are detected based on the NDI scan data associated with predefined position data of the subsurface features. The measured position of the NDI scanner on a surface is corrected based on the predefined position data of the subsurface features.

[0008] One embodiment includes an apparatus including an NDI scanner and a controller. The NDI scanner generates NDI scan data during processing performed on a surface of a structure. The controller detects subsurface features within the structure based on the NDI scan data, accesses predefined position data of the subsurface features, and corrects a measurement position of the NDI scanner on the surface of the structure based on the predefined position data of the subsurface features.

[0009] Another embodiment includes a method of correcting a measurement position of an NDI scanner during processing performed on a surface of a structure. The method includes detecting subsurface features within the structure based on NDI scan data generated by the NDI scanner, accessing predefined position data of the subsurface features, and correcting the measurement position of the NDI scanner on the surface of the structure based on the predefined position data of the subsurface features.

[0010] Another embodiment includes an inspection vehicle. The inspection vehicle includes an NDI scanner that generates NDI scan data during processing performed on a surface of a structure. The inspection vehicle also includes: a movement system that moves the inspection vehicle on the surface of the structure; and a position detector that measures the position of the inspection vehicle on the surface relative to a known position on the surface of the structure. The inspection vehicle also includes a controller. The controller instructs the movement system to move the inspection vehicle along a predefined path on the surface, activates the NDI scanner to generate NDI scan data, and detects subsurface features within the structure based on transitions in the NDI scan data. The controller accesses predefined position data of boundaries of the subsurface features and corrects the measured position based on the predefined position data and the known position of the subsurface features.

[0011] The features, functions, and advantages that have been discussed can be achieved independently in various embodiments or may be combined in yet other embodiments further details of which can be seen with reference to the following description and drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Some embodiments will now be described by way of example only and with reference to the accompanying drawings. The same reference numbers on all drawings represent the same element or the same type of element.

[0013] Figure 1 A side view of an aircraft in an exemplary embodiment is depicted.

[0014] Figure 2 is a block diagram of an inspection environment in an exemplary embodiment.

[0015] Figure 3 In an exemplary embodiment, Figure 2 Block diagram of the NDI scanner with additional details.

[0016] Figures 4 to 5In other exemplary embodiments Figure 2 Block diagram of the inspection device.

[0017] Figure 6 to Figure 7 is a flow chart of a method for calibrating a measurement position of an apparatus including an NDI scanner during an inspection of a structure.

[0018] Figure 8 is a block diagram of an inspection carrier in an exemplary embodiment.

[0019] Fig. 9 In the exemplary embodiment, Figure 1 Illustration of a wing of an aircraft. DETAILED DESCRIPTION

[0020] The accompanying drawings and the following description illustrate specific exemplary embodiments. It will be appreciated that those skilled in the art will be able to conceive of various arrangements, although not explicitly described or illustrated herein, which specifically implement the principles described herein and are included within the intended scope of the claims. In addition, any examples described herein are intended to aid in understanding the principles of the present disclosure and are to be interpreted as not limiting. As a result, the present disclosure is not limited to the specific embodiments or examples described below, but is defined by the claims and their equivalents.

[0021] Figure 1 A side view of an aircraft 100 in an exemplary embodiment is depicted. The aircraft 100 includes a nose 110, wings 120, a fuselage 130, and a tail 140. Although for discussion purposes, the aircraft 100 is depicted as having a particular configuration, in other embodiments the aircraft 100 may have other configurations. The aircraft 100 may undergo a manufacturing process, a certification process, and a delivery process before being placed in service by a customer. Once the aircraft 100 is placed in service, routine maintenance and service may be scheduled for the aircraft 100.

[0022] By correlating predefined position data about subsurface features in a structure with NDI data collected during inspection, the exemplary embodiments described herein enable self-correcting positioning capabilities for NDI crawlers, NDI robots, and NDI automated scanners. The use of a self-correcting NDI scanning system improves the accuracy of NDI processing while speeding up NDI processing. The accuracy of NDI processing is improved by reducing position errors during NDI scanning while the use of an automated scanning system speeds up NDI processing.

[0023] Typical automated NDI scanning systems utilize a positioning system to position and orient the NDI scanner relative to the structure under inspection. However, the positioning system is susceptible to measurement errors, which may be reflected in the accuracy of the location of anomalies detected by the NDI process. In addition, the NDI crawler may utilize a local positioning system that provides an estimate of its position on the surface of the structure, which is also susceptible to measurement errors. Deviations in the position of the NDI crawler on the surface of the structure under inspection may shift the measured position of any anomalies detected during the NDI process, which makes accurate location of the anomalies difficult. Although an external positioning system may be used to measure the position of the NDI scanning device, the setup and execution of an external positioning guide (e.g., an optical reference) requires an operator to correctly set up and position the external positioning guide. In addition, such setup and positioning of the external positioning guide adds additional time to the NDI process.

[0024] In the exemplary embodiments described herein, NDI scan data generated by an NDI scanner during processing performed on a surface of a structure is analyzed to detect subsurface features within the structure, and predefined position data of the subsurface features is accessed. The measurement position of the NDI scanner on the surface of the structure is corrected based on the predefined position data of the subsurface features.

[0025] The exemplary embodiments described herein may be employed during the manufacturing process and / or the certification process and / or the delivery process, and / or after the aircraft is placed in service by a customer. Specifically, the exemplary embodiments described herein may be used to improve the manufacturing process of the aircraft 100 by speeding up the assembly and / or inspection of the aircraft 100, while reducing the costs associated with manufacturing the aircraft 100. Additionally, the exemplary embodiments described herein may be used to speed up routine maintenance or service processes for the aircraft 100, thereby reducing the costs associated with inspecting the aircraft 100.

[0026] Figure 2 An inspection environment 200 is shown in an exemplary embodiment. The inspection environment 200 can be used to inspect Figure 1100 of an aircraft 100. In this embodiment, inspection environment 200 includes inspection equipment 202 that can be used to perform inspection 204 of structure 206. Structure 206 may include any type of manufactured structure, including aircraft structure (e.g., nose 110 of aircraft 100, wing 120 of aircraft 100, fuselage 130 of aircraft 100, and tail 140 of aircraft 100). In this embodiment, inspection 204 is performed using NDI scanner 208 of inspection equipment 202. For example, NDI scanner 208 may be placed near surface 210 of structure 206 during anomaly detection processing. In the exemplary embodiment described herein, NDI scanner 208 is capable of detecting subsurface features 212. Subsurface features 212 may include any type of manufactured parts, such as ribs under skin panels forming wing 120, stringers under skin panels forming fuselage 130, or the feature may be a change in surface structure, such as a change in thickness, density, porosity, holes, cuts, etc.

[0027] In this embodiment, the inspection device 202 also includes a controller 214 that coordinates the activities of the inspection device 202. Although the specific hardware implementation of the controller 214 is subject to design choice, a particular embodiment may include one or more processors 216 connected to a memory 218. The processor 216 includes any hardware device capable of performing a function. The processor 216 may include one or more central processing units (CPUs), microprocessors, digital signal processors (DSPs), application specific integrated circuits (ASICs), etc. Some examples of processors include CORE TM Processors, Advanced Reduced Instruction Set Computing (RISC) Machines Processor, etc. Memory 218 includes any hardware device capable of storing data. For example, memory 218 may store NDI scan data 220 generated by NDI scanner 208 during inspection 204 of structure 206. Memory 218 may also store predefined position data 222 about subsurface features 212 of structure 206. Memory 218 may include one or more volatile or non-volatile dynamic random access memory (DRAM) devices, flash memory devices, volatile or non-volatile static RAM devices, hard drives, solid-state drives (SSDs), etc. Some examples of non-volatile DRAM and SRAM include DRAM with batteries and SRAM with batteries. Although processor 216 is shown as part of inspection device 202, in other embodiments, processor 216 may be separate or external to inspection device 202 and connected to the inspection device using a cable or connected via a wireless communication link.

[0028] During operation, the inspection device 202 utilizes position information 224 during the inspection 204. The position information 224 includes a measured position of the NDI scanner 208 on the surface 210 of the structure 206 relative to a reference position. For example, the position information 224 may be generated using a position detector (not shown) within the inspection device 202 or by an external positioning system that measures the position of the NDI scanner 208 on the surface 210 of the structure 206. The position information 224 may be continuously sent to the processor 216 so that the processor 216 has access to the latest position of the inspection device 202 on the surface 210 of the structure 206. In some embodiments, the position information 224 may be sent to the processor 216 periodically and / or in response to an event. The processor 216 may utilize the position information 224 to correlate the NDI scan data 220 generated by the NDI scanner 208 with the subsurface features 212 (e.g., using predefined position data 222 of the subsurface features 212). Processor 216 may also utilize location information 224 to correlate NDI scan data 220 generated by NDI scanner 208 with anomalies or inconsistencies detected in structure 206 .

[0029] Figure 3 Additional details of NDI scanner 208 in an exemplary embodiment are shown. In some embodiments, NDI scanner 208 may include ultrasonic scanner 302, infrared thermography scanner 304, eddy current scanner 306, microwave scanner 308, terahertz scanner 310, millimeter wave scanner 312, bond test scanner 314, radiography scanner 316, laser scanner 318 (e.g., laser thermography scanner), x-ray scanner 320, backscatter x-ray scanner 322, or a combination thereof. Inspection 204 may be performed on surface 210 of structure 206, which may reveal information about subsurface features 212 within structure 206 and any anomalies or inconsistencies within structure 206.

[0030] Ultrasonic scanner 302 may include an array of transducers that transmit signals into structure 206 during inspection 204 and detect responses to those signals that reveal subsurface features of structure 206. Infrared thermography scanner 304 uses infrared images during inspection 204 of structure 206 to reveal subsurface features of structure 206. Eddy current scanner 306 may utilize an array of probes that generate magnetic fields that induce eddy currents in structure 206 during inspection 204 and detect changes in the eddy currents based on subsurface features of structure 206. Microwave scanner 308 may transmit microwaves into structure 206 during inspection 204 and detect responses to the microwaves to reveal subsurface features of structure 206. Terahertz scanner 310 may utilize inspection signals in the range of 0.3 to 3 terahertz, while millimeter wave scanner 312 may utilize inspection signals in the range of 30 gigahertz to 300 gigahertz. Bond test scanner 314 utilizes different modes of operation to inspect a wide variety of materials and material combinations used in multi-layer bonded structures and modern composite materials. The radiographic scanner 316 utilizes x-rays or gamma rays as an inspection signal, while the laser scanner 318 (eg, a laser thermography scanner) may utilize coherent light as an inspection signal.

[0031] Figure 4 2 is a block diagram of an inspection device 202 in another exemplary embodiment. In this embodiment, the inspection device 202 also includes a movement system 402. The movement system 402 operates to move the NDI scanner 208 over the surface 210 of the structure 206. For example, during the inspection 204, the movement system 402 can move the NDI scanner 208 along a predefined path over the entire surface 210 of the structure 206. For example, the processor 216 can use the position information 224 to guide the NDI scanner 208 along the predefined path over the entire surface 210 of the structure 206 during the inspection 204. The movement system 402 can include a robotic arm 404 (e.g., with the NDI scanner 208 attached), wheels 406, continuous tracks 408, legs 410, or a combination thereof.

[0032] Figure 5 2 is a block diagram of inspection device 202 in another exemplary embodiment. In this embodiment, inspection device 202 includes position detector 502 that generates position information 224. Position detector 502 may include a rotary encoder or other type of position detection system that measures the displacement of inspection device 202 relative to structure 206. For example, position detector 502 may measure the displacement of NDI scanner 208 on surface 210 of structure 206 relative to known position 228 on surface 210 of structure 206 (see Figure 2 ) displacement.

[0033] Consider that inspection device 202 is on surface 210 of structure 206 and is ready to perform inspection 204 . Figure 6 to Figure 7 6 is a flow chart of a method 600 for correcting a measurement position of an apparatus including an NDI scanner during an inspection of a structure. The method 600 will be described with respect to the inspection environment 200, although the method 600 may be performed by other inspection environments or systems not shown. The steps shown for the method 600 are not all-inclusive, and the method 600 may include other steps not shown. Furthermore, the steps of the method 600 may be performed in an alternating order.

[0034] During inspection 204, NDI scanner 208 moves relative to structure 206 and generates NDI scan data 220. During movement of NDI scanner 208 relative to structure 206, updates to position information 224 allow processor 216 to correlate the position of NDI scanner 208 with NDI scan data 220 generated by NDI scanner 208. For example, NDI scanner 208 may be placed at known location 228 on surface 210 of structure 206, and inspection device 202 is programmed to follow a predefined path across surface 210. Processor 216 uses the predefined path and position information 224 to direct mobile system 402 to follow the predefined path.

[0035] The processor 216 detects the subsurface features 212 within the structure 206 based on the NDI scan data 220 (see step 602). For example, the processor 216 may perform edge detection processing on the NDI scan data 220 to detect the boundaries 226-227 of the subsurface features 212 within the structure 206 (see Figure 7 Step 704).

[0036] Processor 216 accesses predefined position data 222 of subsurface feature 212 (see step 604). For example, predefined position data 222 may indicate boundaries 226-227 of subsurface feature 212 (see Figure 7 702 of step 702). The processor 216 corrects the measured position of the NDI scanner 208 on the surface 210 of the structure 206 based on the predefined position data 222 of the subsurface features 212 (see step 606). For example, as the NDI scanner 208 moves along the surface 210, measurement errors in the position of the NDI scanner 208 may occur. Using the predefined position data 222 about the subsurface features 212, the processor 216 is able to correct the position information 224. In some embodiments, the processor 216 may instruct the mobile system 402 to reposition the NDI scanner 208 on the surface 210 based on the correction to the measured position of the NDI scanner 208 (see optional step 608). For example, if the NDI scanner 208 follows a predefined path relative to the structure 206, the processor 216 may determine that the NDI scanner 208 is not actually on the predefined path and reposition the NDI scanner 208 accordingly.

[0037] Figure 8 802 in an exemplary embodiment. In this embodiment, the inspection vehicle includes the controller 214, the NDI scanner 208, the movement system 402, and the position detector 502, all of which have been previously described.

[0038] Fig. 9 A top view of a portion of wing 120 of aircraft 100 is shown in an exemplary embodiment. Fig. 9 Also shown in FIG. 8 is a predefined path 902 across surface 904 that inspection vehicle 802 is programmed to follow, starting at a known location 906 .

[0039] To begin inspection 804 of wing 120, inspection vehicle 802 is placed at known location 906 on surface 904 of wing 120. In this embodiment, position detector 502 measures the position of inspection vehicle 802 on surface 904 of wing 120 relative to known location 906. For example, position detector 502 may be a displacement detector that updates position information 224 as movement system 402 moves inspection vehicle 802 relative to wing 120. As a displacement detector, position detector 502 may be implemented as a rotary encoder attached to one or more wheels 406 or continuous track 408 of movement system 402.

[0040] To begin inspection 804, processor 216 activates NDI scanner 208 and instructs movement system 402 to move inspection vehicle 802 along predefined path 902. As inspection vehicle 802 moves along predefined path 902, NDI scan data 220 is generated. NDI scan data 220 can reveal various subsurface features of wing 120, including ribs 908-912 (e.g., subsurface portions). Processor 216 analyzes NDI scan data 220 to detect transitions representing, for example, boundaries 914-923 of ribs 908-912 captured by NDI scan data 220. Of course, other subsurface features, such as stringers, beams, brackets, fasteners, etc., can be detected by analyzing NDI scan data 220.

[0041] The processor 216 accesses the predefined position data 222 of the boundaries 914-923 of the ribs 908-912. For example, the predefined position data 222 may spatially define the boundaries 914-923 of the ribs 908-912 in the wing 120 and their positions relative to the known positions 906. As the inspection vehicle 802 moves along the predefined path 902, the position detector 502 measures the displacement of the inspection vehicle 802 relative to the known positions 906. This measurement is not perfect and is susceptible to error. Specifically, as the inspection vehicle 802 moves along the predefined path 902, the error in the measurement may increase. This increase in measurement error may cause the inspection vehicle 802 to leave the predefined path 902, which is undesirable. For example, if the inspection vehicle 802 does not move along the predefined path 902, it may be necessary to perform the inspection 204 again.

[0042] The processor 216 correlates the predefined position data 222 of the boundaries 914-923 of the ribs 908-912 with the transition in the NDI scan data 220 representing the boundaries 914-923, and uses the information about the known location 906 to correct the position measured by the position detector 502. For example, the predefined position data 222 may spatially define the boundary 923 of the rib 912 relative to the known location 906. When the processor 216 detects the transition in the NDI scan data 220 representing the boundary 923, the processor 216 may use the information from the predefined position data 222 to calculate the displacement of the NDI scanner 208 along the predefined path 902 relative to the known location 906. The processor 216 may then calculate the deviation between the displacement of the NDI scanner 208 on the wing 120 relative to the known location 906 and the measured displacement of the NDI scanner 208 on the wing 120 relative to the known location 906. The deviation is a measurement error that may be corrected by updating the displacement measured by the position detector 502 with the corrected value.

[0043] In some embodiments, when the deviation is greater than a threshold, an action is performed. For example, when the deviation is greater than a threshold, then processor 216 may instruct movement system 402 to reposition inspection vehicle 802 on wing 120. For example, if the deviation is greater than a threshold, then movement system 402 may be configured to reposition inspection vehicle 802 back to a previously known point on wing 120 (e.g., known position 906).

[0044] In some embodiments, inspection vehicle 802 is programmed to follow predefined path 902 throughout wing 120, thereby collecting NDI scan data 220 during inspection 204 while recalibrating position information 224 using predefined position data 222 and detected boundaries 914-923 within NDI scan data 220. This type of activity allows inspection vehicle 802 to quickly and accurately perform inspection 204 of wing 120 with little or no operator supervision, thereby expediting inspection 204.

[0045] Any of the various elements shown in the drawings or described herein may be implemented as hardware, software, firmware, or some combination of these. For example, an element may be implemented as dedicated hardware. A dedicated hardware element may be referred to as a "processor," "controller," or some similar term. When provided by a processor, the function may be provided by a single dedicated processor, a single shared processor, or a plurality of separate processors (some of which may be shared). In addition, the explicit use of the term "processor" or "controller" should not be interpreted as referring specifically to hardware capable of executing software, and may implicitly include (but not limited to) digital signal processor (DSP) hardware, network processor, application specific integrated circuit (ASIC) or other circuit, field programmable gate array (FPGA), read-only memory (ROM), random access memory (RAM), non-volatile storage device, logic, or some other physical hardware component or module for storing software.

[0046] In addition, the element may be implemented as an instruction that can be executed by a processor or computer to perform the function of the element. Some examples of instructions are software, program code, and firmware. The instructions are operable to instruct the processor to perform the function of the element when executed by the processor. The instructions may be stored on a storage device readable by the processor. Some examples of storage devices are digital or solid-state memory, magnetic storage media such as disks and tapes, hard drives, or optically readable digital data storage media.

[0047] Although specific embodiments are described herein, the scope is not limited to those specific embodiments. Rather, the scope is defined by the following claims and any equivalents thereof.

Claims

1. An inspection device (202), comprising: a non-destructive inspection (NDI) scanner (208) configured to generate NDI scan data (220) while moving relative to a surface (210) of a structure (206) during an NDI scan of an anomaly detection process; a position detector (502) configured to measure position information of the NDI scanner on the surface of the structure while the NDI scanner moves during the NDI scanning of the anomaly detection process; as well as a controller (214) configured to store predefined position data of one or more subsurface features within the structure; wherein the controller is configured to receive the position information from the position detector and associate the NDI scan data and the position information with one or more anomalies detected in the structure, and The controller is configured to detect subsurface features (212) within the structure based on the NDI scan data generated during the NDI scan of the anomaly detection process, access the predefined position data (222) of the subsurface features, and reposition the NDI scanner on the surface of the structure during the NDI scan based on the predefined position data of the subsurface features.

2. The inspection device according to claim 1, wherein: The controller is configured to detect the subsurface features within the structure by performing edge detection processing on the NDI scan data to detect boundaries (226-227) of the subsurface features.

3. The inspection device according to claim 1, wherein: The position detector (502) includes an encoder configured to measure displacement of the NDI scanner relative to a known position on the surface of the structure.

4. The inspection device according to claim 1, further comprising: a movement system configured to move the NDI scanner on the surface of the structure, Wherein the controller is configured to instruct the mobile system to follow a predefined path on the surface of the structure during the NDI scan of the anomaly detection process.

5. The inspection device according to claim 1, wherein: The subsurface feature includes a subsurface portion.

6. The inspection device according to claim 1, wherein: The NDI scanner includes an ultrasound scanner (302).

7. The inspection device according to claim 4, wherein: The movement system (402) is configured to reposition the NDI scanner on the surface of the structure relative to the predefined path.

8. The inspection device according to claim 4, wherein: The mobile system includes a robotic arm (404) to which the NDI scanner is attached.

9. The inspection device according to claim 4, wherein: The movement system includes wheels (406), continuous tracks (408), legs (410), or a combination of wheels, continuous tracks, and legs.

10. The inspection device according to claim 1, wherein: The controller is configured to reposition the NDI scanner on the surface of the structure when a deviation between a measured displacement of the NDI scanner based on the position information and a calculated displacement of the NDI scanner based on the predefined position data of the subsurface feature is greater than a threshold.

11. A method comprising the steps of: storing predefined position data of one or more subsurface features within the structure; placing an inspection device on a surface of the structure; moving a non-destructive inspection NDI scanner of the inspection device relative to the surface of the structure during an NDI scan of an anomaly detection process and generating NDI scan data using the NDI scanner; During the NDI scanning of the anomaly detection process, measuring position information of the NDI scanner on the surface of the structure using a position detector of the inspection device while the NDI scanner is moving; receiving the position information from the position detector at a controller of the inspection device; associating, at the controller, the NDI scan data and the location information with one or more anomalies detected in the structure; detecting, at the controller, subsurface features within the structure based on the NDI scan data generated during the NDI scan of the anomaly detection process; accessing the predefined position data of the subsurface feature; as well as The NDI scanner is repositioned on the surface of the structure during the NDI scan based on the predefined position data of the subsurface features.

12. The method according to claim 11, wherein: The step of detecting the subsurface feature comprises: Edge detection processing is performed (702) on the NDI scan data.

13. The method according to claim 11, wherein: The steps for repositioning the NDI scanner include: The NDI scanner is repositioned (608) on the surface of the structure using a motion system of the inspection device.

14. The method according to claim 11, wherein: The steps for repositioning the NDI scanner include: The NDI scanner is repositioned on the surface of the structure when a deviation between a measured displacement of the NDI scanner based on the position information and a calculated displacement of the NDI scanner based on the predefined position data of the subsurface feature is greater than a threshold.

15. The method of claim 11, wherein: The structure comprises an aircraft structure.

16. An inspection carrier (802), the inspection carrier comprising: a movement system configured to move the inspection vehicle over a surface of a structure; a position detector configured to measure position information of the inspection carrier on the surface of the structure while the inspection carrier moves; a non-destructive inspection (NDI) scanner configured to generate NDI scan data while moving relative to the surface of the structure; as well as a controller configured to store predefined position data of one or more subsurface features within the structure, wherein the controller is configured to: instruct the movement system to move the inspection vehicle along a predefined path on the surface of the structure during an NDI scan of anomaly detection processing, activate the NDI scanner to generate the NDI scan data, receive the position information from the position detector, and associate the NDI scan data and the position information with one or more anomalies detected in the structure, and Wherein, the controller is configured to: detect subsurface features within the structure based on the NDI scan data generated during the NDI scan of the anomaly detection process, access the predefined position data of the subsurface features, and reposition the inspection vehicle relative to the predefined path during the NDI scan based on the predefined position data of the subsurface features.

17. The inspection carrier according to claim 16, wherein: The mobile system includes a robotic arm (404) to which the NDI scanner is attached.

18. The inspection carrier according to claim 16, wherein: The movement system includes wheels (406), continuous tracks (408), legs (410), or a combination of wheels, continuous tracks, and legs.

19. The inspection carrier according to claim 16, wherein: The NDI scanner includes an ultrasound scanner (302).

20. The inspection carrier according to claim 16, wherein: The structure comprises an aircraft structure.

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