A test fixture for detecting the quality factor of a single cavity of a dielectric filter

Abstract

The present invention relates to the field of radio frequency communication technology. The present invention provides a test fixture for detecting the quality factor of a single cavity of a dielectric filter. The surface of the base is provided with a receiving groove. The cover plate is detachably connected to the base and forms a receiving cavity for receiving the dielectric filter when the two are connected. One of a pair of connectors is used to pass through the base and abut against a first demetallized area of ​​the dielectric filter. The other of the pair of connectors is used to pass through the cover plate and abut against a second demetallized area of ​​the dielectric filter. The quality factor of the single cavity of the dielectric filter can be measured by electrically connecting the pair of connectors to a test instrument through cables. Conductive elastic elements are provided on three adjacent surfaces of the receiving cavity formed by the base and the cover plate, so that the first demetallized area and the second demetallized area of ​​the dielectric filter can be in close contact with the connector and the surface of the dielectric filter can be avoided.

Description

Technical Field

[0001] The invention relates to the technical field of radio frequency communication, and in particular provides a testing tool for detecting the quality factor of a single cavity of a dielectric filter. Background Art

[0002] The quality factor (Q value) is a quality indicator of the ratio of the energy stored in the resonant circuit to the energy lost per cycle. The larger the Q value of the component, the better the selectivity of the circuit or network composed of the component. With the miniaturization and densification of communication systems, dielectric filters with smaller size and higher quality factor are widely used in the communication industry compared with metal cavity waveguide filters. The Q value of a single cavity of a dielectric filter depends on the material composition ratio of the dielectric filter. In order to ensure the consistency of the performance of the dielectric filter, it is first necessary to test the Q value of the single cavity of the dielectric filter, and then continuously optimize the material composition ratio based on the Q value obtained from the test to control the Q value of the single cavity of the dielectric filter within a certain range. This also leads to the need for Q value testing tooling or fixtures. At present, no special tools for testing the Q value of a single cavity of a dielectric filter have been found. Summary of the invention

[0003] The purpose of the present invention is to provide a test fixture for detecting the quality factor of a single cavity of a dielectric filter, aiming to provide a fixing device for testing the single cavity Q value of a dielectric filter, which can accurately position the dielectric filter and the dielectric filter single cavity Q value detection connector for testing without damaging the surface of the dielectric filter.

[0004] To achieve the above object, the technical solution adopted by the present invention is:

[0005] A test fixture for detecting the quality factor of a single cavity of a dielectric filter comprises a base having an X-axis, a Y-axis and a Z-axis, a cover plate and a pair of connectors; a receiving groove is arranged on the surface of the base; the cover plate is detachably connected to the base and when the two are connected, the receiving groove forms a receiving cavity for receiving the dielectric filter; one of the pair of connectors is used to pass through the base and abut against a first demetallized area of ​​the dielectric filter, and the other of the pair of connectors is used to pass through the cover plate and abut against a second demetallized area of ​​the dielectric filter; the receiving cavity is provided with a first conductive elastic element for abutting against the dielectric filter in a direction parallel to the X-axis direction, a second conductive elastic element for abutting against the dielectric filter in a direction parallel to the Y-axis direction, and a third conductive elastic element for abutting against the dielectric filter in a direction parallel to the Z-axis direction.

[0006] Preferably, the accommodating groove includes an open end, a closed end opposite to the open end, and two side walls parallel to each other and located between the open end and the closed end, and the cover plate is provided with a first protrusion corresponding to the open end and used to close the open end and a second protrusion used to press the dielectric filter.

[0007] Preferably, the first, second and third conductive elastic elements each include one or more of conductive cotton, conductive glue, conductive cloth, beryllium copper spring assembly and spring pin.

[0008] Preferably, the bottom surface of the accommodating groove and / or the surface of one side of the cover plate close to the base are respectively provided with one or more of conductive cotton, conductive glue and conductive cloth.

[0009] Preferably, a surface of one side of the cover plate close to the base is provided with conductive cotton, and the conductive cotton is in a rectangular ring shape.

[0010] Preferably, one of the two parallel side walls of the accommodating groove and a surface of the first protrusion close to the closed end are both provided with a groove, and a beryllium copper spring assembly is accommodated in the groove.

[0011] Preferably, one of the two parallel side walls of the accommodating groove and a surface of the first protrusion close to the closed end are both provided with threaded holes, and a spring pin is placed in the threaded hole.

[0012] Preferably, the test fixture for detecting the single-cavity quality factor of the dielectric filter also includes a plurality of auxiliary blocks, and hand screws and positioning pins of the same number as the auxiliary blocks; each of the auxiliary blocks is provided with a first threaded through hole axially parallel to the direction from the base to the cover plate, and each of the auxiliary blocks is provided with a radial threaded blind hole axially parallel to its first threaded through hole on its outer wall; the base is provided with auxiliary block mounting holes of the same number as the auxiliary blocks, each of the auxiliary block mounting holes is provided with adjacent small holes and a large hole for accommodating the auxiliary block along the direction from the cover plate to the base, and the inner wall of the large hole is formed with a second threaded through hole that passes through the inner wall of the large hole and the outer wall of the base; each of the positioning pins cooperates with its corresponding second threaded through hole and the threaded blind hole in turn; each of the hand screws passes through the cover plate and cooperates with its corresponding small hole and the first threaded through hole of the auxiliary block in turn.

[0013] Preferably, the hand screw includes one or more of a butterfly screw, a thumb screw or a knurled screw.

[0014] Preferably, the base is provided with a plurality of positioning pins on a side close to the cover plate, and the cover plate is provided with positioning holes corresponding to the positioning pins on a side close to the base.

[0015] Beneficial effects of the present invention: The test fixture for detecting the quality factor of a single cavity of a dielectric filter provided by the present invention has a receiving groove on the surface of its base, and its cover plate is detachably connected to the base. When the two are connected, the receiving groove forms a receiving cavity for receiving the dielectric filter. One of the pair of connectors is used to pass through the base and abut against the first demetallized area of ​​the dielectric filter, and the other of the pair of connectors is used to pass through the cover plate and abut against the second demetallized area of ​​the dielectric filter. The pair of connectors is electrically connected to a test instrument through a cable to measure the quality factor of a single cavity of the dielectric filter, thereby providing a device for testing a dielectric filter. The invention discloses a fixing device for testing the quality factor of a single cavity of a dielectric filter, and the conductive elastic elements are arranged on three adjacent surfaces of the accommodating cavity formed by the base and the cover plate. The conductive elastic elements have good conductivity, which can meet the requirement of conductive performance when testing the quality factor of the single cavity of the dielectric filter. Meanwhile, the elastic deformation capacity of the conductive elastic elements can control the pressure of pressing the dielectric filter within a certain range. The conductive elastic elements are used to press the dielectric filter in three directions of the X-axis, Y-axis and Z-axis of the base at the same time, which ensures that the first demetallized area and the second demetallized area of ​​the dielectric filter can be in close contact with the corresponding connector and avoids the surface of the dielectric filter from being damaged. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0017] Figure 1 An exploded schematic diagram of a test fixture for detecting the quality factor of a single cavity of a dielectric filter provided by an embodiment of the present invention;

[0018] Figure 2 A three-dimensional schematic diagram of a test fixture for detecting the single-cavity quality factor of a dielectric filter provided by an embodiment of the present invention;

[0019] Figure 3 A three-dimensional schematic diagram of a base of a test fixture for detecting a single-cavity quality factor of a dielectric filter provided by an embodiment of the present invention;

[0020] Figure 4 A perspective schematic diagram of a base of a test fixture for detecting a single-cavity quality factor of a dielectric filter provided by an embodiment of the present invention;

[0021] Figure 5A three-dimensional schematic diagram of an auxiliary block of a test fixture for detecting the quality factor of a single cavity of a dielectric filter provided by an embodiment of the present invention;

[0022] Figure 6 A perspective schematic diagram of a base of a test fixture for detecting the single-cavity quality factor of a dielectric filter provided in an embodiment of the present invention.

[0023] Among them, the reference numerals in the figure are:

[0024] 200-dielectric filter; 100-test tooling; 1-base; 11-accommodating groove; 111-open end; 112-closed end; 113-groove; 12-locating pin; 13-auxiliary block mounting hole; 131-small hole; 132-large hole; 133-second threaded through hole; 2-cover plate; 21-first protrusion; 211-groove; 22-second protrusion; 23-locating hole; 31-connector; 32-connector; 41-conductive cotton; 42-beryllium copper spring assembly; 5-auxiliary block; 51-first threaded through hole; 52-threaded blind hole; 6-hand screw; 7-locating pin. DETAILED DESCRIPTION

[0025] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present invention, and should not be construed as limiting the present invention.

[0026] In the description of the present invention, it should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0027] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0028] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0029] See also Figure 1 and Figure 2 The present embodiment provides a test fixture 100 for detecting the quality factor of a single cavity of a dielectric filter, which includes a base 1, a cover plate 2, a connector 31, a connector 32, a first conductive elastic element, a second conductive elastic element, a third conductive elastic element, a plurality of auxiliary blocks 5, and hand screws 6 and positioning pins 7, the number of which is the same as that of the auxiliary blocks 5.

[0030] Combined with reference Figure 3 The base 1 has an X-axis, a Y-axis and a Z-axis, and a receiving groove 11 is arranged on a surface close to the cover plate 2. The long strip receiving groove 11 includes an open end 111 and a closed end 112, wherein the closed end 112 is arranged opposite to the open end 111, that is, the end that does not penetrate the side surface of the base 1 is the closed end 112, and the end that penetrates one side surface of the base 1 is the open end 111. The receiving groove 11 between the open end 111 and the closed end 112 also has two side walls parallel to each other. In this embodiment, a side of the receiving groove 11 close to the closed end 112 is connected to the side wall of the receiving groove 11 with a rounded corner. In this embodiment, one of the two opposite side surfaces of the receiving groove 11 is provided with a groove 113, and the groove 113 is used to accommodate a first conductive elastic element whose telescopic direction is perpendicular to the side surface of the receiving groove 11.

[0031] Combined with reference Figure 4The base 1 and the cover plate 2 are detachably connected and when connected to the base 1, the receiving groove 11 on the base 1 forms a receiving cavity for receiving the dielectric filter 200. In this embodiment, the cover plate 2 is provided with a first protrusion 21 and a second protrusion 22 on the surface close to the base 1. The first protrusion 21 matches the cross-sectional size of the open end 111 of the receiving groove 11. The cross-sectional size of the first protrusion 21 described here is perpendicular to the direction from the open end 111 to the closed end 112, and the cross-sectional size of the receiving groove 11 described here is also perpendicular to the direction from the open end 111 to the closed end 112. In this way, when the base 1 and the cover plate 2 are matched, the first protrusion 21 can just be inserted into the receiving groove 11 to close the open end 111 of the receiving groove 11. The second protrusion 22 is a rectangular parallelepiped. When the cover plate 2 is matched with the base 1, the positive projection of the second protrusion 22 on the base 1 is located in the receiving cavity, so that when the cover plate 2 is matched with the base 1, the second protrusion 22 can assist in pressing the dielectric filter 200. In this embodiment, a groove 211 is provided on one side of the first protrusion 21 close to the closed end 112, and the groove 211 is used to accommodate a second conductive elastic element. The expansion and contraction direction of the second conductive elastic element is perpendicular to the side of the first protrusion 21 close to the closed end 112, that is, parallel to the Y-axis direction of the base 1.

[0032] The base 1 and the cover plate 2 are detachably connected and when the two are connected, a receiving cavity approximately in the shape of a rectangular parallelepiped is formed on the base 1 for receiving the dielectric filter 200. Conductive elastic elements are arranged on three adjacent faces of the receiving cavity. The specific arrangement is as follows: the receiving cavity is provided with a first conductive elastic element for abutting against the dielectric filter 200 in a direction parallel to the X-axis direction, a second conductive elastic element for abutting against the dielectric filter 200 in a direction parallel to the Y-axis direction, and a third conductive elastic element for abutting against the dielectric filter 200 in a direction parallel to the Z-axis direction. That is, the dielectric filter 200 is pressed in three directions of the length, width and height of the receiving cavity. The first, second and third conductive elastic elements all include one or more of conductive cotton, conductive glue, conductive cloth, beryllium copper spring assembly and spring pin. In this embodiment, the specific arrangement of the first, second and third conductive elastic elements is as follows: the third conductive elastic element is arranged along the Z-axis direction of the base 1, that is, the surface of the second protrusion 22 of the cover plate 2 close to the base 1 is provided with conductive cotton 41, and the conductive cotton 41 is in the shape of a rectangular ring. The plane where the rectangular ring conductive cotton 41 is located is parallel to the upper surface of the dielectric filter 200. The first conductive elastic element is arranged along the X-axis direction of the base 1, that is, one of the two opposite side surfaces of the accommodating groove 11 is provided with a beryllium copper spring assembly 42, and the accommodating groove 111 is provided on the surface where the beryllium copper spring assembly 42 is required to be provided. The second conductive elastic element is arranged along the Y-axis direction of the base 1, that is, the surface of the first protrusion 21 close to the closed end 112 is provided with a beryllium copper spring assembly 42, and the first protrusion 21 is provided with a groove 211 on the surface where the beryllium copper spring assembly 42 is required to be provided, and the beryllium copper spring assembly 42 is inserted into the corresponding groove. The beryllium copper spring assembly 42 includes a plurality of beryllium copper springs with the same telescopic direction.

[0033] The connector 31 passes through the base 1 to abut against the first demetallized area of ​​the dielectric filter 200. The base 1 is provided with a first connector threaded hole for the connector 31 to pass through. The connector 31 is threadedly connected to the first connector threaded hole of the base 1. The connector 32 passes through the cover plate 2 to abut against the second demetallized area of ​​the dielectric filter 200. The cover plate 2 is provided with a second connector threaded hole for the connector 32 to pass through. The connector 32 is threadedly connected to the second connector threaded hole on the cover plate 2. The other ends of the connector 31 and the connector 32 are both connected to cables. The cables are used to connect instruments for measuring the single-cavity quality factor of the dielectric filter, such as a vector network analyzer. The first demetallized area here can be a first de-silvered area, and the second demetallized area can be a second de-silvered area. The first de-silvered area and the second de-silvered area are areas formed by peeling off a part of the silvered area of ​​the silvered surface of the dielectric filter 200 as an electrode. When using the instrument to measure the quality factor of a single cavity of a dielectric filter, the first and second de-silvered areas are arranged near the single cavity of the dielectric filter to be tested, and other single cavities on the dielectric filter 200 are short-circuited during measurement.

[0034] Combined with reference Figure 1 , Figure 4 as well as Figure 6 The specific method of detachably connecting the base 1 and the cover plate 2 in the test fixture for detecting the quality factor of a single cavity of a dielectric filter is as follows: first, the base 1 and the cover plate 2 are positioned by hole-shaft matching, that is, the base 1 is provided with a plurality of positioning pins 12 on a side close to the cover plate 2, and the cover plate 2 is provided with positioning holes 23 corresponding to the positioning pins 12 on a side close to the base 1. Then, the base 2 and the cover plate 1 are fixedly connected by a plurality of auxiliary blocks 5 and positioning pins 7 and hand screws 6 of the same number as the auxiliary blocks 5. Specifically, the base 1 is provided with auxiliary block mounting holes 13 having the same number as the auxiliary blocks 5, and each auxiliary block mounting hole 13 is provided with adjacent small holes 131 and large holes 132 along the direction from the cover plate 2 to the base 1, that is, the small hole 131 is provided on the side close to the cover plate 2, and the large hole 132 is provided on the side away from the cover plate 2, and there is a step surface between the large hole 132 and the small hole 131, and a second threaded through hole 133 is formed on the inner wall of the large hole 132, which penetrates the inner wall of the large hole 132 and the outer wall of the base 1. Figure 5 Each auxiliary block 5 is provided with a first threaded through hole 51 axially along the direction from the base 1 to the cover plate 2, and a radial threaded blind hole 52 axially parallel to the corresponding first threaded through hole 51 is provided on the outer wall of each auxiliary block 5.

[0035] When it is necessary to test the quality factor of a single cavity of the dielectric filter, firstly, the auxiliary block 5 is installed into the large hole 132, so that the side of the auxiliary block 5 close to the cover plate 2 is in contact with the step surface, and the positioning pin 7 is screwed into the second threaded through hole 133 on the base 1 and the threaded blind hole 52 on the auxiliary block 5 in turn, so that the auxiliary block 5 is fixedly connected to the base 1, and the beryllium copper spring assembly 42 is installed in both the groove 113 and the groove 211, and then the dielectric filter 200 provided with the first demetallized area and the first demetallized area is placed in the accommodating groove 11, and it is ensured that all cavities except the single cavity to be tested on the dielectric filter are short-circuited, and conductive cotton 42 is placed on the surface of the dielectric filter 200, and then the positioning pin 12 of the base 1 is aligned with the positioning hole 23 on the cover plate 2 to complete the positioning of the base 1 and the cover plate 2, and finally the hand screw 6 is passed through the cover plate 2 and matched with the corresponding small hole 131 and the corresponding first threaded through hole 51 on the auxiliary block 5 in turn to complete the fixed connection between the base 1 and the cover plate 2. When the single cavity quality factor of the dielectric filter needs to be tested again, it is sufficient to loosen the hand screw 6 and replace the dielectric filter 200. The hand screw 6 may include a combination of one or more of a butterfly screw, a thumb screw or a knurled screw.

[0036] The test fixture for detecting the quality factor of a single cavity of a dielectric filter provided in this embodiment has a receiving groove 11 on one side of the base 1 close to the cover plate 2, the cover plate 2 and the base 1 are detachably connected and when the two are connected, the receiving groove 11 forms a receiving cavity for accommodating the dielectric filter 200, the connector 31 passes through the base 1 to abut against the first demetallized area of ​​the dielectric filter 200, the connector 32 passes through the cover plate 2 to abut against the second demetallized area of ​​the dielectric filter 200, the connector 31 and the connector 32 are electrically connected to the test instrument through a cable to measure the quality factor of a single cavity of the dielectric filter, and a fixed device for testing the quality factor of a single cavity of a dielectric filter is provided. The device is characterized in that the conductive elastic elements are respectively arranged on three adjacent surfaces of the accommodating cavity formed by the base 1 and the cover plate 2. The conductive elastic elements have a conductive performance that can meet the conductive performance requirements of the single cavity test quality factor of the dielectric filter. At the same time, the elastic deformation ability of the conductive elastic elements can control the pressure of pressing the dielectric filter 200 within a certain range. The conductive elastic elements are used to press the dielectric filter 200 in three directions of the X-axis, Y-axis and Z-axis of the base at the same time, which ensures that the first demetallized area of ​​the dielectric filter 200 and the connector 31 and the second demetallized area of ​​the dielectric filter 200 and the connector 32 can be in close contact, and the surface of the dielectric filter 200 can be prevented from being damaged. In addition, the dielectric filter single cavity quality factor test fixture provided in this embodiment uses positioning pins 7 to fix the auxiliary block 5 with the base 1, and then uses hand screws 6 to fix the cover plate 2 with the auxiliary block 5, thereby realizing the fixed connection between the base 1 and the cover plate 2. After repeated disassembly and assembly resulting in thread failure, only the auxiliary block 5, hand screws 6 or positioning pins 7 need to be replaced, avoiding frequent replacement of the entire base 1 just because of thread failure, which can effectively reduce costs and avoid affecting test efficiency. And when using hand screws 6 to fix the cover plate 2 and the base 1, no other tools are required to assist, which can effectively improve work efficiency.

[0037] Embodiment 2

[0038] The main difference between this embodiment and the first embodiment is that the second conductive elastic element and the third conductive elastic element arranged in the accommodating groove 11 are different, and spring pins are arranged on one of the two opposite side surfaces of the accommodating groove 11 and on the side of the first protrusion 21 close to the closed end 112, and a threaded hole is vertically arranged on the side surface of the accommodating groove 11 where the spring pin is required to be arranged, and the spring pin is arranged in the threaded hole.

[0039] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A test fixture for detecting the quality factor of a single cavity of a dielectric filter, comprising a base having an X-axis, a Y-axis and a Z-axis, characterized in that: It also includes a cover plate and a pair of connectors; the surface of the base is provided with a receiving groove; the cover plate is detachably connected to the base and when the two are connected, the receiving groove forms a receiving cavity for receiving the dielectric filter; One of the pair of connectors is used to pass through the base and abut against the first demetallized area of ​​the dielectric filter, and the other of the pair of connectors is used to pass through the cover plate and abut against the second demetallized area of ​​the dielectric filter; the accommodating cavity is provided with a first conductive elastic element abutting against the dielectric filter in a direction parallel to the X-axis direction, a second conductive elastic element abutting against the dielectric filter in a direction parallel to the Y-axis direction, and a third conductive elastic element abutting against the dielectric filter in a direction parallel to the Z-axis direction; The accommodating groove comprises an open end, a closed end opposite to the open end, and two side walls parallel to each other and located between the open end and the closed end, and the cover plate is provided with a first convex block corresponding to the open end and used to close the open end and a second convex block used to press the dielectric filter; The test fixture for detecting the single-cavity quality factor of the dielectric filter also includes a plurality of auxiliary blocks, and hand screws and positioning pins of the same number as the auxiliary blocks; each of the auxiliary blocks is provided with a first threaded through hole axially along the direction from the base to the cover plate, and each of the auxiliary blocks is provided with a radial threaded blind hole axially parallel to its first threaded through hole on its outer wall; the base is provided with auxiliary block mounting holes of the same number as the auxiliary blocks, each of the auxiliary block mounting holes is provided with adjacent small holes and a large hole for accommodating the auxiliary block along the direction from the cover plate to the base, and the inner wall of the large hole is formed with a second threaded through hole that penetrates the inner wall of the large hole and the outer wall of the base; each of the positioning pins is matched with the second threaded through hole and the threaded blind hole corresponding to it in sequence; each of the hand screws penetrates the cover plate and then matches with the small hole corresponding to it and the first threaded through hole of the auxiliary block in sequence; The base is provided with a plurality of positioning pins on a side close to the cover plate, and the cover plate is provided with positioning holes corresponding to the positioning pins on a side close to the base.

2. The test fixture for detecting the single cavity quality factor of a dielectric filter according to claim 1, characterized in that: The first, second and third conductive elastic elements each include one or more of conductive cotton, conductive glue, conductive cloth, beryllium copper spring assembly and spring pin.

3. The test fixture for detecting the single cavity quality factor of a dielectric filter according to claim 1, characterized in that: The bottom surface of the accommodating groove and / or the surface of one side of the cover plate close to the base are respectively provided with one or more of conductive cotton, conductive glue and conductive cloth.

4. The test fixture for detecting the quality factor of a single cavity of a dielectric filter according to claim 1, characterized in that: Conductive cotton is arranged on a surface of one side of the cover plate close to the base, and the conductive cotton is in a rectangular ring shape.

5. The test fixture for detecting the quality factor of a single cavity of a dielectric filter according to claim 1, characterized in that: One of the two parallel side walls of the accommodating groove and one side of the first protrusion close to the closed end are both provided with a groove, and a beryllium copper spring component is placed in the groove.

6. The test fixture for detecting the quality factor of a single cavity of a dielectric filter according to claim 1, characterized in that: One of the two parallel side walls of the accommodating groove and one side of the first protrusion close to the closed end are both provided with threaded holes, and a spring pin is arranged in the threaded hole.

7. The test fixture for detecting the quality factor of a single cavity of a dielectric filter according to claim 1, characterized in that: The hand screw includes one or more of a butterfly screw, a thumb screw or a knurled screw.

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