A wiring test device

By adding an anti-dust limit mechanism between the fixed seat of the cable test device and the probe seat, combined with the anti-dust pressure block on the flip, the problems of short service life and easy damage of the micron-level probe are solved, and the stable and safe use of the probe is achieved, reducing the testing cost.

CN111880086BActive Publication Date: 2025-04-29GUANGDONG JINLONG DONGCHUANG INTELLIGENT EQUIP CO LTD
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Patent Information

Application Number
CN202010916447.9
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2020-09-03
Publication Date
2025-04-29
Estimated Expiration
2040-09-03

AI Technical Summary

Technical Problem

The micron-scale probes in the existing cable test modules have a short service life and are easily contaminated or damaged by accidental touch of people or objects, resulting in higher testing costs.

Method used

A wire test device is designed. By adding a silence limit mechanism between the fixed seat and the probe seat, combined with the anti-silence pressure block on the flip, the probe is hidden in the probe seat in the non-test stage and avoiding exposure, thereby canceling the silence limit during testing, achieving stable and safe use of the probe.

Benefits of technology

It effectively avoids damage caused by mistake by people or objects when touching the probe, extends the service life of the probe, reduces the cost of the probe, and is suitable for large-scale promotion and application.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention discloses a cable test device, which is composed of a test base and a flip cover hinged to the test base; the test base includes a fixed base, a probe base and a probe; the probe base can be embedded in the fixed base so as to move up and down; one end of the probe is fixedly arranged on the fixed base, and the other end is inserted into the probe base; the fixed base is provided with an anti-foolproof limit mechanism, which is composed of a fixed block, a movable block and a first elastic member arranged between the fixed block and the movable block; a limit portion that contacts the probe base and limits the downward movement of the probe base is arranged on the side of the movable block close to the probe base; the flip cover is provided with an anti-foolproof pressure block used in conjunction with the anti-foolproof limit mechanism. The present invention adds an anti-foolproof limit mechanism between the fixed base and the probe base, so that the probe is hidden in the probe base when not testing and is not exposed to the outside, thereby avoiding the situation where the probe is damaged by a person or an object touching the probe by mistake, prolonging the service life of the probe, and being suitable for large-scale promotion and application.
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Description

Technical Field

[0001] The embodiments of the present invention relate to the technical field of detection fixtures, and in particular to a cable testing device. Background Art

[0002] With the continuous development of electronic technology and people's increasing requirements for the thinness of electronic products, electronic products such as electronic watches are gradually developing towards a more integrated and sophisticated direction, the layout of internal components of the products is becoming more and more compact, and the manufacturing process is becoming more and more rigorous.

[0003] The flat cable in the electronic watch, also called flexible printed circuit (FPC), has many advantages such as small footprint and flexible appearance. It can easily connect the mainboard with multiple functional modules, such as distance sensor module, camera module and screen display module, and realize the functional control of these functional modules. Since the performance of the flat cable has a great influence on the performance of the electronic watch, in order to ensure the quality of the product, the performance of the flat cable needs to be tested after the production of the flat cable or before the assembly of the flat cable, so as to avoid the use of poor quality flat cables in the finished product.

[0004] At present, micron-level probes are generally used for electronic testing of the tiny flat cables in electronic watches. However, in actual use, the service life of micron-level probes is not high and they need to be replaced more frequently, resulting in high testing costs. The reason is that when the flat cable test module using micron-level probes is not tested, the micron-level probes are always exposed, which makes it very easy for people or objects to accidentally touch or collide with the probes and contaminate or damage them.

[0005] Therefore, how to improve the service life of the micron-level probes in the cable test module has become a technical problem that needs to be solved urgently in this field. Summary of the invention

[0006] The present invention provides a cable testing device to solve the deficiencies of the prior art.

[0007] To achieve the above object, the present invention provides the following technical solutions:

[0008] A cable test device, comprising a test base and a flip cover hinged to the test base;

[0009] The test base comprises a fixing base, a probe base and a probe; the probe base can be movably embedded in the fixing base; one end of the probe is fixedly arranged on the fixing base, and the other end is inserted into the probe base;

[0010] The fixing seat is provided with an anti-foolproof limit mechanism, which is composed of a fixed block, a movable block and a first elastic member arranged between the fixed block and the movable block;

[0011] A limiting portion that contacts the probe seat and limits the downward movement of the probe seat is provided on one side of the movable block close to the probe seat;

[0012] The flip cover is provided with an anti-foolproof pressure block used in conjunction with the anti-foolproof limit mechanism;

[0013] When the flip cover is turned over and pressed down, the anti-foolproof pressure block is pressed down accordingly to push the movable block away from the probe seat until the limiting portion breaks contact with the probe seat, so that the probe seat can move downward as the flip cover is pressed down, thereby allowing the probe to extend from the probe seat.

[0014] Furthermore, in the cable test device, a first inclined surface is provided on one end of the anti-mistake pressure block that contacts the movable block;

[0015] The movable block is provided with a second inclined surface adapted to the first inclined surface.

[0016] Further, in the cable arrangement test device, the probe seat includes an inner template and a carrier plate;

[0017] The inner template is embedded in the fixing seat, and a second elastic member is connected between the inner template and the fixing seat;

[0018] The carrier plate is embedded in the inner template and fixedly connected to the inner template;

[0019] A probe hole is provided on the carrier plate at a position corresponding to the probe.

[0020] Furthermore, in the cable arrangement testing device, the number of the probe holes is the same as the number of the probes.

[0021] Furthermore, in the cable testing device, the first elastic member and the second elastic member are both springs or elastic plastics.

[0022] Furthermore, in the cable arrangement test device, the test base further includes a pre-pressing plate;

[0023] The pre-pressing plate is hinged to the inner template and is used to press and limit the cable to be tested on the carrier plate.

[0024] Further, in the cable arrangement testing device, the fixing seat comprises a fixing seat body and a bottom plate;

[0025] The fixing seat body is provided with a through hole penetrating the upper and lower walls of the fixing seat body;

[0026] The bottom plate is arranged in the through hole and fixedly connected to the fixing seat body to form a groove with the bottom plate as the groove bottom for the inner template to be embedded.

[0027] Furthermore, in the cable arrangement test device, a guide column capable of playing a guiding role is provided on the bottom plate;

[0028] A guide groove used in conjunction with the guide post is provided at a position on the inner template corresponding to the guide post.

[0029] Furthermore, in the cable arrangement testing device, the fixing block and the fixing seat body are integrally formed or fastened together.

[0030] Furthermore, in the cable testing device, a buckle assembly is provided on the fixing seat body;

[0031] A hook assembly used in conjunction with the buckle assembly is provided at a position on the flip cover corresponding to the buckle assembly.

[0032] A cable testing device provided by an embodiment of the present invention adds an anti-foolproof limit mechanism between the fixed seat and the probe seat, and cooperates with the anti-foolproof pressure block on the flip cover so that the probe is hidden in the probe seat in the non-testing stage and will not be exposed to the outside, thereby achieving the purpose of anti-foolproof limit when not testing and canceling the anti-foolproof limit when testing. The device is very stable and convenient, and avoids the situation where people or objects accidentally touch the probe and damage the probe, meeting the needs of extending the service life of the probe and reducing the cost of using the probe, and is suitable for large-scale promotion and application. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0034] Figure 1 is a schematic structural diagram of the cable test device provided by an embodiment of the present invention when it is not covered;

[0035] Figure 2 is a schematic structural diagram of the cable test device provided by an embodiment of the present invention when it is not covered;

[0036] Figure 3 is a schematic structural diagram of the cable arrangement test device provided by an embodiment of the present invention when the cover is closed;

[0037] Figure 4It is a structural schematic diagram of the foolproof limiting mechanism provided by an embodiment of the present invention;

[0038] Figure 5 It is a structural schematic diagram of the cooperation between the fool-proof limit mechanism and the fool-proof pressure block provided in an embodiment of the present invention;

[0039] Figure 6 is a schematic diagram of the structure when the flip cover provided by the embodiment of the present invention is not pressed down and the probe is not extended;

[0040] Figure 7 It is a structural schematic diagram of the probe extending out after the flip cover is pressed down provided by an embodiment of the present invention.

[0041] Reference numerals:

[0042] Test base 1, flip cover 2, anti-foolproof pressure block 3, pre-pressing plate 4, buckle assembly 5, hook assembly 6;

[0043] A fixing seat 11, a probe seat 12, a probe 13, and an anti-foolproof limiting mechanism 14;

[0044] A fixing seat body 111 and a bottom plate 112;

[0045] Inner template 121, carrier plate 122, probe hole 123;

[0046] The fixed block 141 , the movable block 142 , the first elastic member 143 , and the limiting portion 144 . DETAILED DESCRIPTION

[0047] In order to make the purpose, features and advantages of the present invention more obvious and easy to understand, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described below are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0048] In the description of the present invention, it is to be understood that when a component is considered to be "connected" to another component, it may be directly connected to the other component or there may be a centrally disposed component. When a component is considered to be "disposed on" another component, it may be directly disposed on the other component or there may be a centrally disposed component.

[0049] In addition, terms such as "long", "short", "inside" and "outside" indicating directions or positional relationships are based on the directions or positional relationships shown in the accompanying drawings and are only used to facilitate the description of the present invention. They do not indicate or imply that the device or component referred to must have this specific direction or operate with a specific direction structure, and should not be understood as a limitation of the present invention.

[0050] The technical solution of the present invention is further described below with reference to the accompanying drawings and through specific implementation methods.

[0051] Embodiment 1

[0052] Please refer to Figures 1 to 7 The embodiment of the present invention provides a cable testing device, which is composed of a test base 1 and a flip cover 2 hinged to the test base 1;

[0053] The test base 1 comprises a fixing base 11, a probe base 12 and a probe 13; the probe base 12 is embedded in the fixing base 11 movably up and down; one end of the probe 13 is fixedly disposed on the fixing base 11, and the other end is passed through the probe base 12;

[0054] The fixing seat 11 is provided with a foolproof limiting mechanism 14, which is composed of a fixed block 141, a movable block 142, and a first elastic member 143 provided between the fixed block 141 and the movable block 142;

[0055] A limiting portion 144 that contacts the probe seat 12 and limits the downward movement of the probe seat 12 is disposed on one side of the movable block 142 close to the probe seat 12 ; the limiting portion 144 and the movable block 142 are integrally formed or fastened together.

[0056] The flip cover 2 is provided with an anti-foolproof pressure block 3 used in conjunction with the anti-foolproof limit mechanism 14;

[0057] When the flip cover 2 is flipped over and pressed down, the anti-foolproof pressure block 3 is pressed down accordingly to push the movable block 142 away from the probe seat 12 until the limiting portion 144 breaks contact with the probe seat 12, so that the probe seat 12 can move downward as the flip cover 2 is pressed down, thereby allowing the probe 13 to extend from the probe seat 12 and then connect to the metal sheet of the cable for testing.

[0058] The first elastic member 143 is a spring or elastic plastic, preferably a spring.

[0059] In this embodiment, a first inclined surface is provided on the end of the anti-misbehavior pressure block 3 that contacts the movable block 142;

[0060] The movable block 142 is provided with a second inclined surface adapted to the first inclined surface.

[0061] It should be noted that the inclination angles of the first inclined surface and the second inclined surface are complementary. The reason for this arrangement is that when the anti-fouling pressure block 3 is pressed down, it can continue to press down along the second inclined surface smoothly with the help of the first inclined surface, thereby pushing the movable block 142 away from the probe seat 12.

[0062] In this embodiment, the probe seat 12 includes an inner template 121 and a carrier plate 122;

[0063] The inner template 121 is embedded in the fixing seat 11, and a second elastic member is connected between the inner template 121 and the fixing seat 11;

[0064] The carrier plate 122 is embedded in the inner template 121 and fixedly connected to the inner template 121;

[0065] A probe hole 123 is formed on the carrier board 122 at a position corresponding to the probe 13 .

[0066] The number of the probe holes 123 is the same as the number of the probes 13 ; the second elastic member, like the first elastic member 143 , can be a spring or elastic plastic.

[0067] It should be noted that, since the carrier plate 122 is fixedly connected to the inner template 121, when the inner template 121 is pressed and moves downward, the carrier plate 122 will also move downward (actually, it will also be subject to the downward pressure of the flip cover 2), that is, the movement of the inner template 121 and the carrier plate 122 is synchronous. Similarly, when the inner template 121 is not pressed (that is, when the flip cover 2 is opened), the inner template 121 will move upward due to the action of the spring (that is, the elastic force provided when the spring recovers its deformation), and at this time, the carrier plate 122 will also move upward driven by the inner template 121. In order to save parts, this embodiment only exemplifies that a spring is provided between the inner template 121 and the fixing seat 11, but in fact, a spring can also be provided between the carrier plate 122 and the fixing seat 11 as needed, or springs can be provided between the inner template 121 and the carrier plate 122 and the fixing seat 11.

[0068] In this embodiment, the test base 1 further includes a pre-pressing plate 4;

[0069] The pre-pressing plate 4 is hinged to the inner template 121 and is used to press and limit the cable to be tested on the carrier plate 122 .

[0070] It should be noted that the pre-pressing plate 4 can ensure that the tested flat cable placed on the carrier plate 122 does not move or deviate, so that the probe 13 extending from the probe hole 123 can accurately pierce the metal sheet of the flat cable during testing.

[0071] In this embodiment, the fixing seat 11 includes a fixing seat body 111 and a bottom plate 112;

[0072] The fixing seat body 111 is provided with a through hole penetrating the upper and lower walls of the fixing seat body 111;

[0073] The bottom plate 112 is disposed in the through hole and fixedly connected to the fixing seat body 111 to form a groove with the bottom plate 112 as the bottom for the inner template 121 to be embedded.

[0074] In this embodiment, the bottom plate 112 is provided with a guide column that can play a guiding role;

[0075] A guide groove used in conjunction with the guide post is provided at a position on the inner template 121 corresponding to the guide post.

[0076] Preferably, the fixing block 141 and the fixing seat body 111 are integrally formed or fastened together.

[0077] In this embodiment, a buckle assembly 5 is provided on the fixing seat body 111;

[0078] A hook assembly 6 for use with the buckle assembly 5 is provided on the flip cover 2 at a position corresponding to the buckle assembly 5 .

[0079] The foolproofing principle of the foolproofing limit mechanism 14 is described as follows:

[0080] When no test is performed (when the flip cover 2 is open), the movable block 142 is subjected to spring pressure in the direction of the probe seat 12, so that the movable block 142 is pushed under the probe seat 12 to support the probe seat 12, so that as long as the probe seat 12 is not subjected to a force sufficient to damage the movable block 142, the probe 13 will not be exposed no matter how it is pressed, thereby avoiding contact with external contaminants or accidental touch by human hands;

[0081] When testing (when the flip cover 2 is closed), as the flip cover 2 is pressed down, the anti-mismatch pressure block 3 pushes the movable block 142 away from the probe seat 12 along the second inclined surface through the first inclined surface until the movable block 142 is disengaged from under the probe seat 12. At this time, the limiting effect of the movable block 142 on the probe seat 12 disappears, the probe seat 12 can be pressed down, and the probe 13 is relatively lifted up to perform the wiring test.

[0082] A cable testing device provided by an embodiment of the present invention adds an anti-foolproof limit mechanism between the fixed seat and the probe seat, and cooperates with the anti-foolproof pressure block on the flip cover so that the probe is hidden in the probe seat in the non-testing stage and will not be exposed to the outside, thereby achieving the purpose of anti-foolproof limit when not testing and canceling the anti-foolproof limit when testing. The device is very stable and convenient, and avoids the situation where people or objects accidentally touch the probe and damage the probe, meeting the needs of extending the service life of the probe and reducing the cost of using the probe, and is suitable for large-scale promotion and application.

[0083] Thus far, the description of the above-described embodiments is provided for the purpose of illustration and description. It is not intended to be exhaustive or to limit the present disclosure. The individual elements or features of a specific embodiment are generally not subject to the limitations of the specific embodiment, but when applicable, they can be interchanged and used for selected embodiments even if not specifically shown or described. In many respects, the same element or feature also can be changed. This variation is not considered to be a departure from the present disclosure, and all such modifications are intended to be included in the scope of the present disclosure.

[0084] Example embodiments are provided so that the present disclosure will be thorough and the scope will be fully conveyed to those skilled in the art. In order to thoroughly understand the embodiments of the present disclosure, numerous details are set forth, such as examples of specific parts, devices, and methods. Obviously, for those skilled in the art, it is not necessary to use specific details, the example embodiments can be implemented in many different forms, and neither should be construed as limiting the scope of the present disclosure. In certain example embodiments, well-known processes, well-known device structures, and well-known technologies are not described in detail.

[0085] Here, specialized vocabulary is used only for the purpose of describing specific example embodiments, and is not intended to be limiting. Unless the context clearly indicates otherwise, the singular forms "a" and "the" used herein may be intended to include plural forms as well. The terms "including" and "having" are inclusive, and therefore specify the presence of the claimed features, wholes, steps, operations, elements and / or components, but do not exclude the presence or additional presence of one or more other features, wholes, steps, operations, elements, components and / or combinations thereof. Unless the order of execution is clearly indicated, the method steps, processing and operations described herein are not interpreted as necessarily needing to be performed in the specific order discussed and shown. It should also be understood that additional or optional steps may be adopted.

[0086] When an element or layer is referred to as being "on ...", "engaged with ...", "connected to" or "coupled to" another element or layer, it may be directly on another element or layer, engaged with another element or layer, connected to or coupled to another element or layer, or there may be an intervening element or layer. In contrast, when an element or layer is referred to as being "directly on ...", "directly engaged with ...", "directly connected to" or "directly coupled to" another element or layer, there may be no intervening element or layer. Other words used to describe element relationships should be interpreted in a similar manner (e.g., "between ..." and "directly between ...", "adjacent" and "directly adjacent", etc.). The term "and / or" used herein includes any and all combinations of one or more of the associated listed items. Although the terms first, second, third, etc. may be used herein to describe various elements, components, regions, layers and / or parts, these elements, components, regions, layers and / or parts are not limited by these terms. These terms may only be used to distinguish one element, component, region or part from another element, component, region or part. Unless clearly indicated by the context, the use of terms such as "first", "second" and other numerical terms herein does not imply sequence or order. Therefore, the first element, component, region, layer or part discussed below can adopt the terminology of the second element, component, region, layer or part without departing from the teaching of the exemplary embodiment.

[0087] Spatially relative terms, such as "inside", "outside", "below", "below...", "lower", "above", "upper", etc., may be used herein for ease of description to describe the relationship between one element or feature and one or more other elements or features as shown in the figure. Spatially relative terms may be meant to include different orientations of the device in addition to the orientation depicted in the figure. For example, if the device in the figure is flipped, the elements described as "below other elements or features" or "below elements or features" will be oriented as "above other elements or features". Therefore, the example term "below..." may include both upward and downward orientations. The device can be oriented in other ways (rotated 90 degrees or other orientations) and interpreted with the spatially relative descriptions herein.

Claims

1. A cable testing device, characterized in that: It consists of a test base and a flap hinged to the test base; The test base comprises a fixing base, a probe base and a probe; the probe base can be movably embedded in the fixing base; one end of the probe is fixedly arranged on the fixing base, and the other end is inserted into the probe base; The fixing seat is provided with an anti-foolproof limit mechanism, which is composed of a fixed block, a movable block and a first elastic member arranged between the fixed block and the movable block; A limiting portion that contacts the probe seat and limits the downward movement of the probe seat is provided on one side of the movable block close to the probe seat; The flip cover is provided with an anti-foolproof pressure block used in conjunction with the anti-foolproof limit mechanism; When the flip cover is turned over and pressed down, the fool-proof pressure block is pressed down accordingly to push the movable block in a direction away from the probe seat until the limiting portion is disconnected from the probe seat, so that the probe seat can move downward as the flip cover is pressed down, thereby allowing the probe to extend from the probe seat; A first inclined surface is provided on one end of the fool-proof pressure block that contacts the movable block; The movable block is provided with a second inclined surface adapted to the first inclined surface; The probe seat comprises an inner template and a carrier plate; The inner template is embedded in the fixing seat, and a second elastic member is connected between the inner template and the fixing seat; The carrier plate is embedded in the inner template and fixedly connected to the inner template; A probe hole is provided at a position on the carrier plate corresponding to the probe; The number of the probe holes is the same as the number of the probes; The first elastic member and the second elastic member are both springs or elastic plastics.

2. The cable testing device according to claim 1, characterized in that: The test base also includes a pre-compression plate; The pre-pressing plate is hinged to the inner template and is used to press and limit the cable to be tested on the carrier plate.

3. The cable testing device according to claim 1, characterized in that: The fixing seat comprises a fixing seat body and a bottom plate; The fixing seat body is provided with a through hole penetrating the upper and lower walls of the fixing seat body; The bottom plate is arranged in the through hole and fixedly connected to the fixing seat body to form a groove with the bottom plate as the groove bottom for the inner template to be embedded.

4. The cable testing device according to claim 3, characterized in that: The bottom plate is provided with a guide column which can play a guiding role; A guide groove used in conjunction with the guide post is provided at a position on the inner template corresponding to the guide post.

5. The cable testing device according to claim 3, characterized in that: The fixing block and the fixing seat body are integrally formed or fastened together.

6. The cable testing device according to claim 1, characterized in that: A buckle assembly is provided on the fixing seat body; A hook assembly used in conjunction with the buckle assembly is provided at a position on the flip cover corresponding to the buckle assembly.

Citation Information

Patent Citations

  • Flexible cable testing device

    CN213091816U