PCB Test Module
The modular PCB testing module addresses compatibility and cost issues by enabling easy probe attachment/detachment through a detachable frame and probe design, enhancing flexibility and reducing operational complexity.
Patent Information
- Application Number
- CN202010810012.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2020-08-12
- Publication Date
- 2025-07-15
- Estimated Expiration
- 2040-08-12
AI Technical Summary
The existing PCB testing tools have poor compatibility, high cost and inconvenient operation due to differences in the number, size and layout position of probes.
A PCB test module is designed, including disassembly and assembly operating parts, independent frame and probe module. The probe module can be disassembled and assembled with the frame body, and the locking structure of the disassembly and assembly operating parts and frame body can be used to achieve flexible disassembly and assembled probe modules, reducing costs and improving compatibility.
It realizes flexible disassembly and assembles between the probe module and the frame, reduces costs, improves compatibility and operation convenience, and enhances testing efficiency.
Smart Images

Figure CN111965522B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of PCB (printed circuit board) functional testing, and in particular to a PCB test module for PCB functional testing. Background Art
[0002] A PCB (printed circuit board) is one of the important components in the electronics industry. Whether it is as small as an electronic watch and a calculator, or as large as a computer, a communication electronic device, and a military weapon system, etc., as long as they use electronic components such as integrated circuits, they all need to use a printed circuit board. Since the printed circuit board can replace complex wiring to achieve the electrical connection between the components in the circuit, it simplifies the assembly and soldering work of electronic products, reduces the wiring workload in the traditional way, greatly reduces the labor intensity of workers; and reduces the volume of the whole machine, reduces the product cost, and improves the quality and reliability of electronic devices. At the same time, the printed circuit board has good product consistency, and it can adopt a standardized design, which is conducive to the realization of mechanization and automation in the production process. Moreover, the whole assembled and debugged printed circuit board can be used as an independent spare part, which is convenient for the interchange and maintenance of the whole machine products. Therefore, printed circuit boards have been extremely widely used in the production and manufacturing of electronic products.
[0003] Among them, in the production process of printed circuit boards, various performance tests of printed circuit boards are indispensable. Among the existing test tools for testing printed circuit boards, it includes a frame body for locking to an external test base and multiple probes arranged in a matrix on the frame body, and the frame body includes an upper frame body and a lower frame body that are covered and fixed, and each of the upper frame body and the lower frame body is provided with a through hole for each probe to be individually inserted and fixed; therefore, during the probe assembly process, each probe is first inserted into a corresponding through hole on the upper frame body or the lower frame body, and then the upper frame body and the lower frame body are covered and fixed together, so as to fix each probe on the frame body.
[0004] However, when performing functional tests on printed circuit boards of different models and types, there are differences in the number, size, and arrangement positions of the probes. Since the frame body is locked to an external test base, the size of the frame body generally remains unchanged; therefore, in order to meet the functional tests of printed circuit boards of different models and types, due to the differences in the number, size, and arrangement positions of the probes, the test tools are designed into multiple models, so there are defects such as poor compatibility, high cost, and inconvenient use and operation.
[0005] Therefore, there is an urgent need for a PCB test module with good compatibility, low cost, and convenient use and operation to overcome the above defects. Summary of the Invention
[0006] The object of the present invention is to provide a PCB test module with good compatibility, low cost and convenient use and operation.
[0007] To achieve the above object, the PCB test module of the present invention includes a disassembly and assembly operating member, and a frame body and a probe module that are independent of each other and can be detachably assembled together. The probe module includes an assembly die core detachably assembled with the frame body and probes disposed through the assembly die core, with both ends of the probes exposed. The disassembly and assembly operating member is assembled on one of the frame body and the assembly die core, and the other of the frame body and the assembly die core has a locking structure. The disassembly and assembly operating member is selectively locked or unlocked with the locking structure to correspondingly block or release the disassembly and assembly of the probe module on the frame body.
[0008] Preferably, the disassembly and assembly operating member includes an exposed operating portion and a plugging core connected to the operating portion and slid along the left-right direction or the front-back direction of the frame body driven by the operating portion. The locking structure is a slot structure for the plugging core to be inserted.
[0009] Preferably, a positioning structure protrudes from the front side and / or the rear side of the assembly die core. The plugging core is slidably disposed through the positioning structure along the left-right direction of the frame body. The operating portion is located on the positioning structure. The frame body is provided with an embedding matching cavity for the assembly die core to be embedded and assembled, a positioning cavity for positioning and cooperating with the positioning structure, an operating notch for partially exposing the positioning structure, and a through cavity for the probe to expose from the bottom of the frame body. The positioning cavity is communicated with the embedding matching cavity. The operating notch penetrates the cavity wall of the positioning cavity. The through cavity is located below the embedding matching cavity and communicated with the embedding matching cavity. The slot structure is located on the frame body, and the probe is located in the through cavity.
[0010] Preferably, the slot structure penetrates the cavity wall of the embedding matching cavity.
[0011] Preferably, on the same positioning structure, the disassembly and assembly operating members are arranged back to back, one on the left and one on the right.
[0012] Preferably, the left end corners of both the assembly die core and the embedding matching cavity are right angles, and the right end corners of both the assembly die core and the embedding matching cavity are rounded corners; or, the left end corners of both the assembly die core and the embedding matching cavity are rounded corners, and the right end corners of both the assembly die core and the embedding matching cavity are right angles.
[0013] Preferably, the PCB test module of the present invention further includes a guiding and protecting plate assembled at the bottom of the frame body. The guiding and protecting plate is provided with a through hole and a socket cavity. The through hole penetrates the guiding and protecting plate up and down. The socket cavity penetrates the bottom surface of the guiding and protecting plate and surrounds the through hole from all around. The bottom end of the probe sequentially passes through the through cavity and the through hole downward and then is located in the socket cavity.
[0014] Preferably, the frame body is further provided with an embedding and assembling cavity located below the through cavity and communicating with the through cavity. The embedding and assembling cavity penetrates the bottom surface of the frame body. The guiding and protecting plate is embedded in the embedding and assembling cavity from the bottom of the frame body. The socket cavity is provided with mounting notches communicating with the outside laterally at the positions on the left and right sides. A locking screw is offset toward the mounting notch and locks the guiding and protecting plate to the frame body.
[0015] Preferably, the probe module is one, two or three. When the probe module is two or three, they are arranged in a spaced manner in the left-right direction of the frame body.
[0016] Preferably, the PCB test module of the present invention further includes a locking screw for locking the frame body to an external base and a stop screw for preventing the locking screw from falling. Each of the left and right ends of the frame body extends out a lug. The lug is provided with a sunken hole penetrating up and down. The locking screw is rotatably assembled in the sunken hole. The stop screw is assembled in the sunken hole and blocks the locking screw from falling out. The middle of the stop screw is provided with an operating space for a tool to pass through to screw the locking screw.
[0017] Compared with the prior art, since the PCB test module of the present invention includes a disassembly and assembly operating member, and a frame body and a probe module that are independent of each other and can be disassembled and assembled together, the probe module and the frame body are designed to be separated; and the probe module includes an assembly die core that can be disassembled and assembled with the frame body and a probe disposed in the assembly die core, so that the probe and the assembly die core are made into a separate component relative to the frame body. By using the detachable cooperation between the assembly die core and the frame body, the probe module can be compatible with different frame bodies to reduce costs. At the same time, with the help of the disassembly and assembly operating member assembled on one of the frame body and the assembly die core, and the matching lock structure of the other of the frame body and the assembly die core, the disassembly, assembly and replacement between the probe module and the frame body are convenient, so that the use of the PCB test module of the present invention is more flexible and convenient. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] Figure 1 is a schematic perspective view of the PCB test module of the present invention.
[0019] Figure 2It is a schematic three-dimensional exploded view of the PCB test module of the present invention after the probe module is separated from the frame body.
[0020] Figure 3 is Figure 2 A further schematic three-dimensional exploded view of the PCB test module shown in the figure.
[0021] Figure 4 is Figure 1 A schematic internal structure view of the PCB test module shown in the figure after being cut by a plane passing through the center line of the same row of probes.
[0022] Figure 5 It is a schematic three-dimensional structure view of the probe module in the PCB test module of the present invention.
[0023] Figure 6 is Figure 5 A schematic three-dimensional exploded view of the probe module shown in the figure.
[0024] Figure 7 is Figure 5 A schematic plane structure view of the probe module shown in the figure projected from left to right.
[0025] Figure 8 It is a schematic three-dimensional structure view of the frame body and the alignment guard plate in the PCB test module of the present invention when assembled together.
[0026] Figure 9 is Figure 8 The schematic three-dimensional exploded view of
[0027] Figure 10 It is a schematic three-dimensional structure view of the frame body in the PCB test module of the present invention. Detailed implementation mode
[0028] In order to elaborate in detail the technical content and structural features of the present invention, the following further description is made in conjunction with the implementation modes and with reference to the accompanying drawings.
[0029] Please refer to Figures 1 to 4, the PCB test module 100 of the present invention includes a disassembly and assembly operating member 10, and a frame body 20 and a probe module 30 that are independent of each other and can be detachably assembled together, so that the frame body 20 and the probe module 30 are designed separately, making the frame body 20 an independent component and the probe module 30 another independent component, thus facilitating the disassembly and assembly operations between the probe module 30 and the frame body 20. The probe module 30 includes an assembly die core 31 that can be detachably assembled with the frame body 20 and probes 32 inserted into the assembly die core 32. The two ends of each probe 32 are exposed. Preferably, the top end of the probe 32 extends upward from the top surface of the assembly die core 31, and the bottom end of the probe 32 extends downward from the bottom surface of the assembly die core 31 to meet the electrical contact requirements of the top end and the bottom end of the probe 32 with corresponding components respectively. For example, the top end of the probe 32 is in electrical contact with the components in the test base, and the bottom end of the probe 32 is in electrical contact with the PCB to be tested, but this is not limited thereto; specifically, there are multiple probes 32 arranged in a matrix on the assembly die core 31, and all the probes 32 are fixed together by the assembly die core 31 to achieve the disassembly and assembly of the probe module 30 on the frame body 20 by the disassembly and assembly of the assembly die core 31 on the frame body 20; and for the specific number of the probes 32, it is flexibly selected according to the actual situation; also, since the assembly die core 31 is detachably engaged with the frame body 20, a series of probe modules 30 with different numbers of probes 32 and each capable of maintaining normal disassembly and assembly cooperation with the frame body 10 can be obtained by increasing or decreasing the number of probes 32 while keeping the size of the assembly die core 31 unchanged, so as to further improve the compatibility between the probe module 30 and the frame body 20. The disassembly and assembly operating member 10 is assembled on the assembly die core 31, so that the disassembly and assembly operating member 10 is also made into an independent component with the probe module 30; the frame body 20 has a locking structure 21a, so the disassembly and assembly operating member 10 is selectively locked and connected with the locking structure 21a to block the disassembly and assembly of the probe module 30 on the frame body 20, and the disassembly and assembly operating member 10 is selectively unlocked and connected with the locking structure 21a to release the blockage of the disassembly and assembly of the probe module 30 on the frame body 20, thus facilitating the disassembly and assembly operations of the probe module 30 on the frame body 20; of course, according to actual needs, the disassembly and assembly operating member 10 can be assembled on the frame body 20. Correspondingly, the locking structure 21a can be provided by the assembly die core 31, and the same purpose of facilitating the disassembly and assembly operations of the probe module 30 on the frame body 20 can be achieved. Specifically, as Figures 1 to 4 shown, there are two probe modules 30 arranged separately in the left-right direction (i.e., the direction indicated by arrow A) of the frame body 20 to be able to test two groups of PCBs simultaneously, thus improving the test efficiency; of course, according to actual needs, the number of probe modules 30 can also be one or three or the like, so this is not limited thereto. More specifically, as follows:
[0030] As Figures 2 to 3 , and Figures 5 to 7As shown, the disassembly and assembly operating member 10 includes an exposed operating portion 11 and a plug-in core 12 that is connected to the operating portion 11 and is driven by the operating portion 11 to slide in the left-right direction of the frame body 20. The lock-matching structure 21a is a slot structure for the plug-in core 12 to be inserted into, so that the locking connection between the disassembly and assembly operating member 10 and the lock-matching structure 21a is more reliable and the unlocking operation is more convenient. Specifically, the operating portion 11 is a cylindrical block structure. The first end of the plug-in core 12 adjacent to the lock-matching structure 21a has a flat portion 121. The second end of the plug-in core 12 away from the lock-matching structure 21a is provided with a threaded structure 122. The cylindrical block structure is threadedly connected to the threaded structure 122. By means of the flat portion 121, it is convenient for the operator to clamp the plug-in core 12 with an operating tool (such as a wrench or pliers), so that the plug-in core 12 can make a rotational movement. Thus, the threaded structure 122 of the plug-in core 12 is screwed into or out of the operating portion 11 to achieve the purpose of assembling and disassembling between the plug-in core 12 and the operating portion 11, and thus it is convenient for the disassembly and assembly of the disassembly and assembly operating member 10 at the assembly die core 31. Of course, according to actual needs, the operating portion 11 and the plug-in core 12 can be made into an integral structure, such as welding and fixing or integrally processing and forming the operating portion 11 and the plug-in core 12, etc. Preferably, the cylindrical block structure can be provided with knurling, which can increase the reliability of the operator's grip on the operating portion 11. In addition, a convex ring 123 that is in extrusion fit with the lock-matching structure 21a when the first end of the plug-in core 12 is inserted into the lock-matching structure 21a is provided on the side wall of the first end of the plug-in core 12, so as to provide a damping force during locking by means of the convex ring 123 and prevent the probe module 30 from loosening during testing. In order to make the assembly of the disassembly and assembly operating member 10 on the assembly die core 31 more compact and reasonable, a positioning structure 31a protrudes from the front side surface 311 and the rear side surface 312 of the assembly die core 31. The plug-in core 12 is slidably inserted through the positioning structure 31a in the left-right direction of the frame body 20, and the operating portion 11 is located on the positioning structure 31a. Preferably, on the same positioning structure 31a, the disassembly and assembly operating members 10 are arranged back to back, one on the left and one on the right, so that the direction in which the left disassembly and assembly operating member 10 is inserted into a lock-matching structure 21a corresponding to the left disassembly and assembly operating member 10 is exactly opposite to the direction in which the right disassembly and assembly operating member 10 is inserted into a lock-matching structure 21a corresponding to the right disassembly and assembly operating member 10. Also, the disassembly and assembly operating members 10 are provided around the assembly die core 31, thereby increasing the locking reliability between the assembly die core 31 and the frame body 20. Of course, according to actual needs, the positioning structure 31a can protrude from the front side surface 311 or the rear side surface 312 of the assembly die core 31. In addition, in other embodiments, the plug-in core 12 can be slidably inserted through the positioning structure 31a in the front-rear direction of the frame body 20 (i.e., the direction indicated by the arrow B). In order to make the assembly between the assembly die core 31 and the frame body 20 more reasonable and compact, at Figures 2 to 4 , and Figures 8 to 10Among them, the frame body 20 is provided with an embedding and matching cavity 21 for the fitting die core 31 to be embedded and assembled, a positioning cavity 22 for positioning and cooperating with the positioning structure 31a, an operation notch 23 for partially exposing the positioning structure 31a (see Figure 1 ), and a through cavity 24 for the probe 32 to expose from the bottom of the frame body 20; the positioning cavity 22 communicates with the embedding and matching cavity 21, the operation notch 23 penetrates the cavity wall 221 of the positioning cavity 22, and the through cavity 24 is located below the embedding and matching cavity 21 and communicates with the embedding and matching cavity 21; the slot structure is located on the frame body 20, and the probe 32 is located in the through cavity 24; preferably, the slot structure penetrates the cavity wall 211 of the embedding and matching cavity 21, and such a design can facilitate the processing operation of the slot structure, which can utilize the avoidance space provided by the embedding and matching cavity 21 during the processing of the slot structure to facilitate tool feeding. To achieve the anti-fooling effect, in Figures 1 to 3 , and Figure 10 Among them, the left end corners of both the fitting die core 31 and the embedding and matching cavity 21 are right angles 314 (212), and the right end corners of both the fitting die core 31 and the embedding and matching cavity 21 are rounded corners 315 (213); of course, according to actual needs, the left end corners of both the fitting die core 31 and the embedding and matching cavity 21 are rounded corners 315 (213), and the right end corners of both the fitting die core 31 and the embedding and matching cavity 21 are right angles 314 (212). To improve the convenience of the operator in installing or disassembling the fitting die core 31 for taking, the positioning structure 31a is provided with a slot 316 to define a fin 313; preferably, the fin 313 extends along the left-right direction of the frame body 20, and there are two fins 313 and they are spaced apart from each other in the up-down direction of the frame body 20; of course, the number of fins 313 is not limited to this; in addition, the middle of the positioning structure 31a can be used to engrave the P / N code and S / N code, and when the fitting die core 31 is installed on the frame body 20, the bottom of the positioning structure 31a provides a supporting force. It should be noted that as Figures 1 to 3 shown, when there are two probe modules 20, at this time, for the fitting die core 31 and the embedding and matching cavity 21 on the left side, the left end corners of both the fitting die core 31 and the embedding and matching cavity 21 are right angles 314 (212), and the right end corners of both the fitting die core 31 and the embedding and matching cavity 21 are rounded corners 315 (213); while for the fitting die core 31 and the embedding and matching cavity 21 on the right side, the left end corners of both the fitting die core 31 and the embedding and matching cavity 21 are rounded corners 315 (213), and the right end corners of both the fitting die core 31 and the embedding and matching cavity 21 are right angles 314 (212). To prevent the fitting die core 31 from protruding outward, as Figure 1 shown, the top surface of the fitting die core 31 embedded in the embedding and matching cavity 21 is flush with the top surface of the frame body 20, so as to facilitate the top end of the probe 32 to protrude upward from the frame body 20, but it is not limited to this.
[0031] As Figures 3 to 4 , and Figures 8 to 9As shown, the PCB test module 100 of the present invention further includes a guiding and protecting plate 40 assembled at the bottom of the frame 20. The guiding and protecting plate 40 is provided with a through hole 41 and a socket cavity 42. The through hole 41 penetrates the guiding and protecting plate 40 vertically, and the socket cavity 42 penetrates the bottom surface 40a of the guiding and protecting plate 40 and surrounds the through hole 41 from all around. The bottom end of the probe 32 sequentially passes through the through cavity 24 and the through hole 41 downward and then is located in the socket cavity 42, so as to ensure the reliability of the probe 32 during operation by means of the guiding and protecting plate 40, as well as the reliability of the cooperation between the PCB under test and the guiding and protecting plate 40 in a sleeved manner. Specifically, in Figure 4 and Figure 9 , a chamfer 411 is provided at the upper end edge of the through hole 41 to ensure the smoothness of inserting the probe 32 into the through hole 41 of the guiding and protecting plate 40; a chamfer 421 is provided at the lower end edge of the socket cavity 42 to ensure the smoothness of sleeving between the guiding and protecting plate 40 and the PCB under test. To make the assembly of the guiding and protecting plate 40 on the frame 20 more reasonable and compact, the frame 20 is further provided with an embedding and assembly cavity 25 located below the through cavity 24 and communicating with the through cavity 24. The embedding and assembly cavity 25 penetrates the bottom surface 20a of the frame 20; the guiding and protecting plate 40 is embedded in the embedding and assembly cavity 25 from the bottom of the frame 20. Preferably, the guiding and protecting plate 40 also retracts inside the bottom of the frame 20, as shown in Figure 4 , to prevent the guiding and protecting plate 40 from causing an obstacle due to protruding downward from the bottom of the frame 20; installation notches 43 communicating with the outside laterally are provided at the left and right positions of the socket cavity 42, and a locking screw 50 is offset towards the installation notch 43 (i.e., the locking screw 50 is screwed into the guiding and protecting plate 40 from the installation notch 43) to lock the guiding and protecting plate 40 to the frame 20. Such a design makes the locking connection between the guiding and protecting plate 40 and the frame 20 more compact and avoids the locking screw 50 from blocking and interfering with the probe 32.
[0032] As Figures 1 to 4 shown, the PCB test module 100 of the present invention further includes a locking screw 60 for locking the frame 20 to an external base and a stop screw 70 for preventing the locking screw 60 from falling off. A lug 26 extends from each of the left and right ends of the frame 20. A sunken hole 261 is vertically penetrated through the lug 26. The locking screw 60 is rotatably assembled in the sunken hole 261. The stop screw 70 is assembled in the sunken hole 261 to block the locking screw 60 from falling out. An operation space 71 for a tool (such as a screwdriver or an electric screwdriver) to pass through and screw the locking screw 60 is provided in the middle of the stop screw 70. Such a design ensures the screwing operation of the locking screw 60 on the one hand and prevents the locking screw 70 from accidentally falling off when the frame 20 is disassembled and assembled from the external base on the other hand, improving the operation convenience. Specifically, the stop screw 70 is located directly above the locking screw 70, but not limited thereto.
[0033] It should be noted that in the attached drawings, the assembly die core 31 is a rubber core with a square outer shape; the frame body 20 is a plate, and the embedding matching cavity 21, positioning cavity 22, penetrating cavity 23 and embedding assembly cavity 25 on the frame body 20 are square, and the operation notch 23 is an isosceles trapezoid; of course, they can be of other shapes according to actual needs, so this is not limited thereto. At the same time, in the attached drawings, the direction indicated by arrow A is the left-to-right direction of the frame body 20, the direction indicated by arrow B is the front-to-back direction of the frame body 20, and the direction indicated by arrow C is the top-to-bottom direction of the frame body 20.
[0034] Compared with the prior art, since the PCB test module 100 of the present invention includes a disassembly and assembly operation member 10 and a frame body 20 and a probe module 30 that are independent of each other and can be detachably assembled together, the probe module 30 and the frame body 20 are designed in a separated manner; and the probe module 30 includes an assembly die core 31 that can be detachably assembled with the frame body 20 and a probe 32 inserted into the assembly die core 31, so that the probe 32 and the assembly die core 31 are made into a component relatively independent of the frame body 20. By using the detachable cooperation between the assembly die core 31 and the frame body 20, the probe module 30 can be compatible with different frame bodies 20 to reduce costs. At the same time, with the help of the disassembly and assembly operation member 10 assembled on one of the frame body 20 and the assembly die core 31, and the lock matching structure 21a on the other of the frame body 20 and the assembly die core 31, the disassembly, assembly operation and replacement between the probe module 30 and the frame body 20 are convenient, so that the use of the PCB test module 100 of the present invention is more flexible and convenient.
[0035] The above-disclosed are only the preferred examples of the present invention. Of course, the scope of the rights of the present invention cannot be limited thereby. Therefore, equivalent changes made according to the claims of the present invention still fall within the scope covered by the present invention.
Claims
1. A PCB test module, characterized in that, It includes a disassembly and assembly operating part, a frame body and a probe module that are independent of each other and can be detachably assembled together. The probe module includes an assembly core that can be detachably assembled with the frame body and probes inserted into the assembly core. Both ends of the probes are exposed. The disassembly and assembly operating part is assembled on one of the frame body and the assembly core, and the other of the frame body and the assembly core has a locking structure. The disassembly and assembly operating part is selectively locked or unlocked with the locking structure to correspondingly block or release the blocking of the disassembly and assembly of the probe module on the frame body. Among them, the disassembly and assembly operating part includes an exposed operating part and a plugging core connected to the operating part and driven by the operating part to slide along the left-right direction or the front-back direction of the frame body. A positioning structure protrudes from the front side and / or the rear side of the assembly core. The plugging core is slidably inserted into the positioning structure along the left-right direction of the frame body. The operating part is located on the positioning structure. The frame body is provided with an embedding matching cavity for the assembly core to be embedded and assembled, a positioning cavity that is positioned and matched with the positioning structure, an operating notch for partially exposing the positioning structure, and a through cavity for the probe to expose from the bottom of the frame body. The positioning cavity is communicated with the embedding matching cavity. The operating notch penetrates the cavity wall of the positioning cavity. The through cavity is located below the embedding matching cavity and is communicated with the embedding matching cavity. The probe is located in the through cavity.
2. The PCB testing module according to claim 1, wherein The locking structure is a slot hole structure for the plugging core to be inserted.
3. The PCB test module according to claim 2, wherein, The slot hole structure is located on the frame body.
4. The PCB testing module according to claim 3, wherein The slot hole structure penetrates the cavity wall of the embedding matching cavity.
5. The PCB testing module according to claim 3, characterized in that On the same positioning structure, the disassembly and assembly operating parts are arranged back to back, one on the left and one on the right.
6. The PCB test module according to claim 3, wherein The left end corners of both the assembly core and the embedding matching cavity are right angles, and the right end corners of both the assembly core and the embedding matching cavity are rounded corners; or, the left end corners of both the assembly core and the embedding matching cavity are rounded corners, and the right end corners of both the assembly core and the embedding matching cavity are right angles.
7. The PCB test module according to claim 3, wherein, It further includes a guiding and protecting plate assembled at the bottom of the frame body. The guiding and protecting plate is provided with a through hole and a socket cavity. The through hole penetrates the guiding and protecting plate up and down. The socket cavity penetrates the bottom surface of the guiding and protecting plate and surrounds the through hole from all around. The bottom end of the probe sequentially passes through the through cavity and the through hole downward and then is located in the socket cavity.
8. The PCB test module according to claim 7, wherein The frame body is further provided with an embedding and assembling cavity located below the through cavity and communicated with the through cavity. The embedding and assembling cavity penetrates the bottom surface of the frame body. The guiding and protecting plate is embedded in the embedding and assembling cavity from the bottom of the frame body. The socket cavity is provided with installation notches that communicate with the outside laterally at the left and right positions. A locking screw is offset towards the installation notch and locks the guiding and protecting plate to the frame body.
9. The PCB test module according to claim 1, wherein, The number of the probe modules is one, two or three. When the number of the probe modules is two or three, they are arranged in a spaced manner in the left-right direction of the frame body.
10. The PCB test module according to claim 1, wherein, It further includes locking screws for locking the frame body to an external base and stop screws for preventing the locking screws from falling off. At both left and right ends of the frame body, a lug extends out, and a sunken hole is vertically penetrated through the lug. The locking screws are rotatably assembled in the sunken holes, the stop screws are assembled in the sunken holes to prevent the locking screws from falling out, and an operation space for a tool to pass through to screw the locking screws is provided in the middle of the stop screws.
Citation Information
Patent Citations
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Quick-release probe module
CN209028109U
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CN212569049U