Resistance measuring device and resistance measuring fixture

Abstract

The resistance measuring device (1) comprises: a first fixture (3U); a plurality of first contacts; a second fixture (3D); a plurality of second contacts; a resistance measuring unit (5) for supplying current between the first contacts and the second contacts corresponding to each other, detecting the voltage between the first contacts and the second contacts, and calculating the resistance value of the object to be measured based on the relationship between the supplied current value and the detected voltage value; a first wiring for connecting the resistance measuring unit (5) and the first contacts corresponding to each first contact; and a second wiring for connecting the resistance measuring unit and the second contacts from the resistance measuring unit (5) via the first fixture (3U) corresponding to each second contact, and the first wiring and the second wiring respectively connected to the first contacts and the second contacts corresponding to each other are arranged adjacent to each other between the resistance measuring unit (5) and the first fixture (3U). The present invention further provides a resistance measuring fixture.

Description

[0001] This application is based on Japanese patent application No. 2018-56107 filed on March 23, 2018, the contents of which are incorporated herein by reference. Technical Field

[0002] The present invention relates to a resistance measuring device and a resistance measuring fixture, and in particular to a technology for improving the measurement accuracy of the resistance measuring device. Background Art

[0003] Conventionally, there is known a resistance measuring device that makes a plurality of contacts abut one side and the other side of a measured object, supplies current between corresponding contacts, detects voltage between contacts, and calculates the resistance value of the measured object based on the relationship between the supplied current value and the detected voltage value (for example, see Patent Document 1). According to the technology described in Patent Document 1, a structure is adopted in which wirings connected to corresponding contacts are independently arranged.

[0004] Prior art literature

[0005] Patent Literature

[0006] Patent Document 1: Japanese Patent Application Publication No. 2012-117991 Summary of the invention

[0007] As described in the background art, when the wirings connected to the corresponding contacts are independently arranged, the degree of electromagnetic influence from the outside is different for each wiring. Therefore, when noise is generated due to external factors, the size of the noise is different for each wiring, which becomes a factor that reduces measurement accuracy.

[0008] The present invention has been made in view of the above-mentioned situation, and an object of the present invention is to provide a resistance measuring device and a resistance measuring jig that can suppress a decrease in measurement accuracy even when noise is generated due to external factors.

[0009] In order to solve the above-mentioned problems, the present invention provides a resistance measuring device and a resistance measuring jig configured as follows.

[0010] A resistance measuring device according to an example of the present invention comprises: a first fixture facing one side of a measured object; a plurality of first contact members arranged in the first fixture and capable of abutting against the one side; a second fixture facing the other side of the measured object; a plurality of second contact members arranged in the second fixture corresponding to the plurality of first contact members and capable of abutting against the other side; and a resistance measuring unit for supplying current between one of the first contact members and one of the second contact members corresponding to each other, and for supplying current to another first contact member adjacent to the one of the first contact members corresponding to each other and another first contact member adjacent to the one of the second contact members. The voltage between a first contact and a second contact is detected, and the resistance value of the measured object is calculated based on the relationship between the supplied current value and the detected voltage value; a first wiring, corresponding to each of the first contact pieces, connects the resistance measuring unit and the first contact piece; and a second wiring, corresponding to each of the second contact pieces, connects the resistance measuring unit and the second contact piece from the resistance measuring unit via the vicinity of the first clamp, and between the resistance measuring unit and the first clamp, the first wiring and the second wiring, which are respectively connected to the first contact piece and the second contact piece corresponding to each other, are arranged adjacent to each other.

[0011] Moreover, a resistance measuring device of an example of the present invention includes: a first fixture facing one side of a measured object; a plurality of first contact members arranged in the first fixture and capable of abutting against the one side; a second fixture facing the other side of the measured object; a plurality of second contact members arranged in the second fixture corresponding to the plurality of first contact members, capable of abutting against the other side; a resistance measuring unit supplying current between one of the first contact members and one of the second contact members corresponding to each other, detecting a voltage between another first contact member adjacent to the one of the first contact members corresponding to each other and another second contact member adjacent to the one of the second contact members, and calculating the resistance value of the measured object based on the relationship between the supplied current value and the detected voltage value; a first wiring corresponding to each of the first contact members, connecting the resistance measuring unit and the first contact member; and a second wiring corresponding to each of the first contact members. A second contact piece connects the resistance measuring part and the second contact piece, and from the resistance measuring part to a specified position between the first clamp, the first wiring connected to the first contact piece and the second contact piece corresponding to each other is arranged adjacent to the second wiring. The resistance measuring device includes a third wiring, the third wiring extends from the specified position in the first wiring corresponding to each first contact piece, and the third wiring connected to the first contact piece and the second contact piece corresponding to each other is arranged adjacent to the second wiring at a front end side relative to the specified position. The resistance measuring device includes a fourth wiring, the fourth wiring extends from the specified position in the second wiring corresponding to each second contact piece, and the first wiring connected to the first contact piece and the second contact piece corresponding to each other is arranged adjacent to the fourth wiring at a front end side relative to the specified position.

[0012] Moreover, a resistance measuring fixture of an example of the present invention includes: a first fixture facing one side of a measured object; a plurality of first contact members arranged in the first fixture and capable of abutting against the one side; a second fixture facing the other side of the measured object; a plurality of second contact members arranged in the second fixture corresponding to the plurality of first contact members, respectively, and capable of abutting against the other side; a first wiring connected to each of the first contact members; and a second wiring connected to each of the second contact members, and the first wiring and the second wiring respectively connected to the first contact members and the second contact members corresponding to each other are arranged adjacent to each other via the vicinity of the first fixture, on the base end side relative to the vicinity of the first fixture.

[0013] Moreover, a resistance measuring jig of an example of the present invention includes: a first jig facing one side of a measured object; a plurality of first contacts arranged in the first jig and capable of abutting against the one side; a second jig facing the other side of the measured object; a plurality of second contacts arranged in the second jig corresponding to the plurality of first contacts, respectively, and capable of abutting against the other side; a first wiring connected to each of the first contacts; and a second wiring connected to each of the second contacts, and the first wiring and the second wiring are arranged adjacent to each other at a base end side closer to the first jig via the first jig, the first jig including a first connecting member connecting the plurality of first contacts and the first wiring, the first connecting member including a plurality of electrodes contacted by the plurality of first contacts, a first wiring pattern connected to the electrodes and connected to the first wiring, and a second partial pattern constituting a part of the second wiring, and in the first connecting member, the first wiring pattern and the second partial pattern are arranged adjacent to each other. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 This is a conceptual diagram schematically showing the structure of the resistance measuring device according to the first embodiment.

[0015] Figure 2 This is a block diagram schematically showing the electrical structure of the resistance measuring device.

[0016] Figure 3 This is a diagram schematically showing the electrical structure of the resistance measurement jig.

[0017] Figure 4 This is a graph showing the relationship between voltage and noise.

[0018] Figure 5 It is a diagram schematically showing the electrical configuration of a resistance measurement jig in the resistance measurement device according to the second embodiment.

[0019] Figure 6 It is a diagram schematically showing the electrical configuration of a resistance measurement jig in the resistance measurement device according to the third embodiment.

[0020] [Explanation of Symbols]

[0021] 1: Resistance measuring device

[0022] 3: Inspection fixture

[0023] 3D: Second fixture

[0024] 3U: First fixture

[0025] 3cD: Second connecting member

[0026] 3cU: First connecting member

[0027] 4: Detection Department

[0028] 4D: Detection Department

[0029] 4U: Inspection Department

[0030] 5: Resistance measurement unit

[0031] 6: Notification Department

[0032] 31: Supporting member

[0033] 41: Connect the circuit

[0034] 51: Power circuit

[0035] 52: Voltage detection unit

[0036] 53: Control Department

[0037] 100: Lithium-ion secondary battery

[0038] 101: Positive plate

[0039] 102: Positive electrode collector

[0040] 103: Ear

[0041] 104: Terminal lug

[0042] 105: Welding area

[0043] 111: Negative plate

[0044] 112: Negative electrode collector

[0045] 113: Ear

[0046] 114: Terminal lug

[0047] 115: Welding area

[0048] 321: Base plate

[0049] 531: Detection and Control Department

[0050] 532: Measurement Department

[0051] 533: Output

[0052] Ca: Base side wiring tape

[0053] Cb: Front side wiring strip

[0054] C1~CN: Wiring

[0055] Cb1~CbN: Wiring

[0056] CA1: First wiring group

[0057] CA2: Second wiring group

[0058] CB1: The third wiring group

[0059] CB2: Fourth wiring group

[0060] I: DC current

[0061] Nv: Noise component

[0062] P: Probe

[0063] P1~P4: Wiring pattern

[0064] Pp2: Local pattern

[0065] Pd: Probe

[0066] Pu: Probe

[0067] V: Voltage

[0068] Vc: Potential difference

[0069] Vn: Potential difference DETAILED DESCRIPTION

[0070] The following is based on Figures 1 to 4 The structure of the resistance measuring device 1 according to the first embodiment of the present invention will be described. In addition, the structures denoted by the same reference numerals in the respective drawings represent the same structures, and the description thereof will be omitted. Figure 1 This is a conceptual diagram schematically showing the structure of a resistance measuring device 1 according to the first embodiment of the present invention. Figure 1 The resistance measuring device 1 shown is a device for measuring the resistance value of the tab terminals 104 and 114 of a lithium-ion secondary battery 100 as an example of a measurement object. The "lithium-ion secondary battery" in this embodiment includes a product before the stack of positive electrodes, separators, and negative electrodes is combined with an electrolyte. In addition, the measurement object whose resistance value is measured by the resistance measuring device 1 of this embodiment is not limited, and all other conductive bodies can be used as the measurement object.

[0071] Figure 1The lithium-ion secondary battery 100 shown is composed of a plurality of positive plates 101 (electrode plates) and a plurality of negative plates 111 (electrode plates) alternately stacked with a separator (not shown) sandwiched therebetween. The positive plate 101 is formed by coating a positive active material (not shown) on the surface of a positive current collector 102 comprising a metal foil such as aluminum foil, for example. The negative plate 111 is formed by coating a negative active material (not shown) on the surface of a negative current collector 112 comprising a metal foil such as copper foil, for example.

[0072] At one end of the lithium-ion secondary battery 100, a portion of each positive electrode current collector 102 is led out as a pole ear portion 103 (a portion of an electrode sheet or electrode plate), and a portion of each negative electrode current collector 112 is led out as a pole ear portion 113 (a portion of an electrode sheet or electrode plate). Each pole ear portion 103 is led out on one side of the one end, and each pole ear portion 113 is led out on the opposite side to the pole ear portion 103. Thus, the pole ear portions 103 and the pole ear portions 113 do not overlap.

[0073] The tabs 103 are stacked and closely connected, and are welded to each other in the welding area 105 shown by the strip-shaped grid lines, thereby forming the positive tab terminal 104. The tabs 113 are stacked and closely connected, and are welded to each other in the welding area 115 shown by the strip-shaped grid lines, thereby forming the negative tab terminal 114 (electrode sheet member, tab terminal). As a welding method for the welding areas 105 and 115, various welding methods can be applied, for example, ultrasonic welding is used. Figure 1 , the state before the lug portions 103 and 113 are welded is shown.

[0074] Figure 1 The resistance measuring device 1 shown includes a detection unit 4U, a detection unit 4D, a resistance measuring unit 5, a notification unit 6, and a battery holding unit (not shown) for holding the lithium-ion secondary battery 100 to be inspected at a specified position between the detection units 4U and 4D. The detection units 4U and 4D respectively include a first fixture 3U and a second fixture 3D as detection fixtures. The detection units 4U and 4D can move the first fixture 3U and the second fixture 3D along the Z-axis direction (a direction substantially perpendicular to the main surface of the tab terminals 104 and 114) by omitting a driving mechanism (not shown). The detection units 4U and 4D can also move along the three-axis directions of X, Y, and Z that are orthogonal to each other, and can further rotate the first fixture 3U and the second fixture 3D around the Z-axis.

[0075] The notification unit 6 is a notification device that visually notifies the user of the information obtained by the resistance measurement unit 5. As the notification unit 6, for example, a display device such as a liquid crystal display device or a printer can be used.

[0076] The detection unit 4U is located above the lithium-ion secondary battery 100 fixed to the battery holding unit (not shown). The detection unit 4U is detachably configured with a first fixture 3U, which is a detection fixture for making the probe Pu contact the tab terminals 104 and 114 of the lithium-ion secondary battery 100 in sequence. The first fixture 3U is set to face the upper side (positive Z-axis direction side, the same below) of the tab terminals 104 and 114.

[0077] The detection unit 4D is located below the lithium-ion secondary battery 100 fixed to the battery holding unit (not shown). The detection unit 4D is detachably configured with a second fixture 3D, which is a detection fixture for making the probe Pd contact the tab terminals 104 and 114 of the lithium-ion secondary battery 100 in sequence. The second fixture 3D is arranged to face the lower side (negative Z-axis direction side, the same below) of the tab terminals 104 and 114. The first fixture 3U and the second fixture 3D are configured similarly to each other except that the installation directions of the detection units 4U and 4D are opposite to each other.

[0078] In addition, the first fixture 3U and the second fixture 3D can also adopt the following structure, that is, the tab terminals 104 and 114 are unified, so that the probes Pu and Pd are simultaneously in contact with the two tab terminals 104 and 114. In this embodiment, the probe installed in the first fixture 3U located at the top is called the probe Pu, and the probe installed in the second fixture 3D located at the bottom is called the probe Pd. Hereinafter, the detection units 4U and 4D are collectively referred to as the detection unit 4, and the probes Pu and Pd are collectively referred to as the probe P.

[0079] The first fixture 3U and the second fixture 3D respectively include: a support member 31 for holding the front ends of the plurality of probes Pu and Pd toward the fusion regions 105 and 115 of the tab terminals 104 and 114; and a base plate 321. The base plate 321 is provided with electrodes (not shown) that are in contact with and conductive with the rear ends of the probes Pu and Pd. The detection units 4U and 4D electrically connect the probes Pu and Pd to the power circuit 51 and the voltage circuit 52 of the resistance measurement unit 5 via the electrodes of the base plate 321 and the connection circuit 41 described later, or switch the connection.

[0080] The probes Pu and Pd have a generally rod-like shape. A plurality of through holes for supporting the probes Pu and Pd are formed in the support member 31. The support member 31 has a shape and size corresponding to the fusion regions 105 and 115. The support member 31 supports the probes Pu and Pd in ​​a manner that the plurality of probes Pu and Pd are in contact with each other in a substantially uniform distribution in the fusion region 105 or in substantially the entire region in the fusion region 115. For example, the plurality of probes Pu and Pd are arranged in a manner corresponding to the intersection positions of the grid.

[0081] Figure 2 It is conceptually expressed Figure 1 1 is a block diagram of the electrical structure of the resistance measuring device 1 shown. Figure 2 The resistance measuring device 1 shown includes M probes Pu1 to PuM provided in a first jig 3U, M probes Pd1 to PdM provided in a second jig 3D, a resistance measuring unit 5 , a base-side wiring tape Ca, and a tip-side wiring tape Cb. Figure 2 , a state in which the probes Pu1 to PuM and Pd1 to PdM are brought into contact with the tab terminal 104 is shown.

[0082] The base end side wiring tape Ca is a collection of wirings that connect the first jig 3U and the connection circuit 41 of the resistance measurement unit 5 (see Figure 3 The front-end wiring tape Cb is a collection of wiring that connects the first fixture 3U and the second fixture 3D (see Figure 3 ). The resistance measuring unit 5 is as follows Figure 2 As shown, it includes a connection circuit 41, a power supply circuit 51, a voltage detection unit 52 and a control unit 53.

[0083] In this embodiment, the components of the resistance measuring device 1 other than the resistance measuring unit 5 (the first jig 3U, the second jig 3D, the base end wiring tape Ca, and the front end wiring tape Cb) are collectively referred to as a "resistance measuring jig". The resistance measuring device 1 is configured so that the resistance measuring jig can be detached and replaced with another resistance measuring jig according to the type of the lithium ion secondary battery 100 to be inspected.

[0084] Figure 2 The tab terminal 104 is cut along the X-axis direction. Figure 1 The cross section of the tab terminal 104 shown in FIG. 1 is shown. Among the probes Pu1 to PuM and Pd1 to PdM, a probe number is marked for each row of probes Pu and Pd arranged along the X-axis direction. The probe number marked on the probes Pu and Pd corresponds to the X-axis direction X coordinate indicating the position of the fusion region 105 contacted by each probe P. That is, the probes Pu and Pd with the same probe number are correspondingly set at the same position.

[0085] In addition to the probe Pu and Pd Figure 2 In addition to the probes P shown, multiple rows are provided adjacent to each other and substantially parallel to each other in the Y-axis direction, but the illustration is omitted. Numbers are assigned to the rows of probes P, and the row numbers correspond to the Y coordinates in the Y-axis direction indicating the positions of the fusion regions 105 contacted by the probes P. In addition, the rows of probes P do not necessarily need to be straight rows, but may be zigzag, curved, or scattered rows.

[0086] Each probe P includes a contact T for a four-terminal measurement method. Figure 2 As shown, the probes Pu1, Pu2, Pu3, Pu4...PuM provided in the first fixture 3U are provided with contacts T1, T3, T5, T7...T(N-1) that can abut against the upper surface of the tab terminals 104, 114. Here, N is a number equivalent to twice M (an even number). Moreover, the probes Pd1, Pd2, Pd3, Pd4...PdM provided in the second fixture 3D and corresponding to the probes Pu1, Pu2, Pu3, Pu4...PuM, respectively, are provided with contacts T2, T4, T6, T8...TN that can abut against the lower surface of the tab terminals 104, 114. In the present embodiment, the contacts T1, T3, T5, T7...T(N-1) provided in the first fixture 3U are collectively referred to as "first contacts". Furthermore, T2, T4, T6, T8, ..., TN arranged in the second jig 3D are collectively referred to as "second contacts".

[0087] In addition, each probe may be configured to include two contacts for current supply and voltage measurement. For example, a probe having two needle pins (contacts) as a pair as described in Japanese Patent Publication No. 2006-329998, or a coaxial probe including a cylindrical contact and another contact inserted into the inside of the contact as described in Japanese Patent Publication No. 2012-154670 may be used. Alternatively, rod-shaped probes arranged in a grid may be used as contacts, and two probes (contacts) may be set as a group and used as one probe.

[0088] The first contacts T1, T3, T5, T7, ..., T(N-1) provided on the first fixture 3U are connected to the connection circuit 41 of the resistance measuring unit 5 via the base end wiring tape Ca. Figure 3 As shown, the base-side wiring strip Ca includes first wirings C1, C3, C5, C7 ... C(N-1) that connect the first contacts T1, T3, T5, T7 ... T(N-1) to the connection circuit 41. Hereinafter, the first wirings C1, C3, C5, C7 ... C(N-1) are collectively referred to as "first wiring group CA1".

[0089] The second contacts T2, T4, T6, T8, ... TN provided on the second fixture 3D are connected to the connection circuit 41 of the resistance measuring unit 5 via the base end wiring tape Ca and the front end wiring tape Cb. Figure 3 As shown, the base-side wiring strip Ca and the front-side wiring strip Cb include second wirings C2, C4, C6, C8, ... CN that connect the second contacts T2, T4, T6, T8, ... TN to the connection circuit 41. Hereinafter, the second wirings C2, C4, C6, C8, ... CN are collectively referred to as "second wiring group CA2".

[0090] Furthermore, the first contacts T1, T3, T5, T7, ... T(N-1) provided on the first fixture 3U are connected to the second fixture 3D via the front-end wiring tape Cb. Figure 3 As shown, the front-end side wiring strip Cb includes third wirings Cb1, Cb3, Cb5, Cb7...Cb(N-1), and the third wirings Cb1, Cb3, Cb5, Cb7...Cb(N-1) are respectively connected to the first contacts T1, T3, T5...T(N-1), and are respectively branched and extended from the first wirings C1, C3, C5, C7...C(N-1). The third wirings Cb1, Cb3, Cb5, Cb7...Cb(N-1) are each not electrically connected in the second fixture 3D, but are set as open ends. Hereinafter, the third wirings Cb1, Cb3, Cb5, Cb7...Cb(N-1) are collectively referred to as the "third wiring group CB1". In addition, as Figure 5 As shown in the second embodiment, the open end of the third wiring group CB1 may be separated from the second fixture 3D as long as it is close to the second fixture 3D.

[0091] Furthermore, the second contacts T2, T4, T6, T8, ... TN provided on the second fixture 3D are respectively as follows: Figure 3 As shown, it is connected to the fourth wiring Cb2, Cb4, Cb6, Cb8...CbN, and the fourth wiring Cb2, Cb4, Cb6, Cb8...CbN is arranged in the first fixture 3U which is the front end side of the part branching from the first wiring group CA1 and the second wiring group CA2. The fourth wiring Cb2, Cb4, Cb6, Cb8...CbN branches and extends from the second wiring C2, C4, C6, C8...CN respectively in the first fixture 3U. The fourth wiring Cb2, Cb4, Cb6, Cb8...CbN are each not electrically connected in the first fixture 3U, but are set as open ends. Hereinafter, the fourth wiring Cb2, Cb4, Cb6, Cb8...CbN are collectively referred to as the "fourth wiring group CB2". In addition, as Figure 5 As shown in the second embodiment, the open end of the fourth wiring group CB2 may be separated from the first fixture 3U as long as it is close to the first fixture 3U.

[0092] In this embodiment, the connection circuit 41 is configured using, for example, a plurality of switching elements. The connection circuit 41 selects a pair of probes Pu and Pd (one probe Pu and Pd) corresponding to each other with the tab terminal 104 sandwiched therebetween according to a control signal from the control unit 53. Furthermore, the positive electrode of the power supply circuit 51 is connected to the first contact T of the selected probe Pu, and the negative electrode of the power supply circuit 51 is connected to the second contact T of the probe Pd corresponding to the probe Pu. For example, when the probes Pu1 and Pd1 are selected as one probe Pu and Pd, the first contact T1 and the second contact T2 are connected to the power supply circuit 51.

[0093] Furthermore, the connection circuit 41 selects a pair of probes Pu and Pd (another probe Pu and Pd) that correspond to each other and are adjacent to the one probe Pu and the other probe Pu with the tab terminal 104 sandwiched therebetween according to a control signal from the control unit 53. Furthermore, the positive electrode of the voltage circuit 52 is connected to the first contact T of the other selected probe Pu, and the negative electrode of the voltage circuit 52 is connected to the second contact T of the probe Pd corresponding to the other probe Pu. For example, when the probes Pu1 and Pd1 are selected as one probe Pu and Pd, the probes Pu2 and Pd2 can be selected as the other probes Pu and Pd, and the first contact T3 and the second contact T4 can be connected to the voltage circuit 52.

[0094] The power supply circuit 51 is, for example, a constant current power supply circuit such as a switching power supply circuit. The power supply circuit 51 supplies a preset fixed DC current I between the first contacts T1, T3, T5 ... T(N-1) and the second contacts T2, T4, T6 ... TN corresponding to each other (for example, between the contact T1 of the probe Pu1 and the contact T2 of the probe Pd1) according to a control signal from the control unit 53.

[0095] The voltage detection unit 52 is, for example, a voltage measuring circuit formed by using a voltage dividing resistor or an analog digital converter, etc. The voltage detection unit 52 measures the voltage V between the first contacts T1, T3, T5 ... T(N-1) and the second contacts T2, T4, T6 ... TN corresponding to each other in a pair of probes Pu and Pd selected by the connection circuit 41 (for example, between the contact T3 of the probe Pu2 and the contact T4 of the probe Pd2), and sends the measured value to the control unit 53.

[0096] The control unit 53 is, for example, a so-called microcomputer including a central processing unit (CPU) for executing a predetermined operation process, a random access memory (RAM) for temporarily storing data, a storage device for storing a predetermined control program, and their peripheral circuits, etc. The control unit 53 functions as a detection control unit 531, a measuring unit 532, and an output unit 533, for example, by executing the control program.

[0097] The detection control unit 531 controls the driving mechanism (not shown) to move and position the detection units 4U and 4D, so that the front ends of the probes Pu and Pd sequentially contact the fusion regions 105 and 115 of the lithium-ion secondary battery 100. In addition, the first fixture 3U and the second fixture 3D may also include a number of probes Pu and Pd that can contact the fusion regions 105 and 115 at the same time, so that the probes Pu and Pd contact the fusion regions 105 and 115 at the same time. At this time, each probe P includes a contact T, and the current supply and voltage measurement are performed through different contacts T, so that resistance measurement based on the four-terminal measurement method can be achieved.

[0098] The measuring unit 532 calculates the resistance value of the tab terminals 104 and 114 between the corresponding probes Pu and Pd (for example, the probes Pu1 and Pd1) based on the relationship between the current value supplied by the power circuit 51 and the voltage value detected by the voltage detecting unit 52. The output unit 533 outputs the resistance value calculated by the measuring unit 532 through the notifying unit 6.

[0099] The connection circuit 41 changes the selected probes Pu and Pd, and calculates the resistance value for each corresponding probe Pu and Pd in ​​sequence. At this time, the probes Pu and Pd that function as current supply in one inspection step are made to function as voltage measurement in the next inspection step. For example, in the connection circuit 41, when the contact T1 is electrically connected to the power supply circuit 51, the contact T1 functions as a current supply (at this time, the first wiring C1 functions as a current supply wiring). On the other hand, when the same contact T1 is electrically connected to the voltage detection unit 52, the contact T1 functions as a voltage measurement (at this time, the first wiring C1 functions as a voltage measurement wiring). According to this structure, it is possible to obtain a number of measurement points that is approximately equal to the number M of contacts T arranged in the first fixture 3U.

[0100] Furthermore, not only a combination of two adjacent contacts T in the same row can be used as a current supply and voltage measurement function, but also a combination of two contacts T adjacent to each other in adjacent rows can be used. Thus, the number of measurement points exceeding the number of contacts T arranged in the first fixture 3U can be obtained, so the number of measurement points per unit area of ​​the object to be measured can be increased. That is, it is possible to easily detect the portion of the tab terminals 104 and 114 of the lithium-ion secondary battery 100 that has a high resistance due to a local lack of welding strength.

[0101] In the resistance measuring device 1 of this embodiment and the resistance measuring fixture included in the resistance measuring device 1, as shown in FIG. Figure 3As shown, in the base end wiring tape Ca connecting the resistance measuring unit 5 and the first fixture 3U, the first wiring group CA1 and the second wiring group CA2 respectively connected to the first contacts T1, T3, T5 ... T(N-1) and the second contacts T2, T4, T6 ... TN corresponding to each other are arranged adjacent to each other. Specifically, the first wiring C1, C3, C5, C7 ... C(N-1) respectively connected to the first contacts T1, T3, T5 ... T(N-1) and the second wiring C2, C4, C6, C8 ... CN respectively connected to the second contacts T2, T4, T6, T8 ... TN are arranged adjacent to each other at corresponding positions.

[0102] Thus, in the resistance measuring device 1 of the present embodiment and the resistance measuring fixture included in the resistance measuring device 1, the first wiring and the second wiring (for example, the first wiring C1 and the second wiring C2) respectively connected to the corresponding first contact and the second contact (for example, the first contact T1 and the second contact T2) are arranged adjacent to each other between the resistance measuring part 5 and the first fixture 3U (the base end side of the first fixture 3U). Therefore, noise caused by electromagnetic influence from the outside is generated in the adjacent wiring with approximately the same magnitude.

[0103] Specifically, if Figure 4 As shown in FIG. 1 , when the potentials measured by the first contact T1 and the second contact T2 are respectively set to v1 and v2, the change caused by the noise component Nv is equally expressed in both v1 and v2. Therefore, even when affected by the noise component Nv, the potential difference Vn does not change significantly relative to the potential difference Vc in normal times. That is, even when noise is generated between the resistance measuring unit 5 and the first fixture 3U due to external factors, the decrease in measurement accuracy in the resistance measuring device 1 can be suppressed.

[0104] like Figure 2 and Figure 3 As shown, the second wiring group CA2 corresponds to each second contact T2, T4, T6, T8 ... TN, and connects the resistance measuring part 5 and the second contact T2, T4, T6, T8 ... TN via the vicinity of the first clamp 3U. In this embodiment, as Figure 3 As shown, the second wiring group CA2 adopts a structure that branches from the first wiring group CA1 in the first fixture 3U. However, as long as the part where the second wiring group CA2 branches from the first wiring group CA1 is near the first fixture 3U, it can also be separated from the first fixture 3U. In other words, the "near the first fixture 3U" in this embodiment is used in the two meanings of "the first fixture 3U" and "the part separated from the first fixture 3U by proximity".

[0105] Moreover, in the resistance measuring device 1 of this embodiment and the resistance measuring fixture included in the resistance measuring device 1, as shown in FIG. Figure 3 As shown, in the front-end wiring strip Cb connecting the first fixture 3U and the second fixture 3D, the third wiring group CB1 and the second wiring group CA2 respectively connected to the first contacts T1, T3, T5 ... T(N-1) and the second contacts T2, T4, T6 ... TN corresponding to each other are arranged adjacent to each other. Specifically, the third wiring Cb1, Cb3, Cb5, Cb7 ... Cb(N-1) respectively connected to the first contacts T1, T3, T5 ... T(N-1) and the second wiring C2, C4, C6, C8 ... CN respectively connected to the second contacts T2, T4, T6, T8 ... TN are arranged adjacent to each other at corresponding positions.

[0106] Thus, in the resistance measuring device 1 of the present embodiment and the resistance measuring fixture included in the resistance measuring device 1, between the first fixture 3U and the second fixture 3D, the third wiring connected to the first contact and the second contact (for example, the first contact T1 and the second contact T2) corresponding to each other is arranged adjacent to the second wiring (for example, the third wiring Cb1 and the second wiring C2). Therefore, the noise caused by the electromagnetic influence received by the second wiring from the outside will be generated in the adjacent third wiring with approximately the same size. That is, the noise generated in the second wiring will also be generated in the third wiring and transmitted to the first wiring in the same manner, thereby reducing the influence of the noise. Thus, even if noise is generated between the first fixture 3U and the second fixture 3D due to external factors, the decrease in measurement accuracy in the resistance measuring device 1 can be suppressed.

[0107] Moreover, in the resistance measuring device 1 of this embodiment and the resistance measuring fixture included in the resistance measuring device 1, as shown in FIG. Figure 3 As shown, in the first fixture 3U at the front end side of the portion branching from the first wiring group CA1 and the second wiring group CA2, the first wiring group CA1 and the fourth wiring group CB2 connected to the first contacts T1, T3, T5 ... T(N-1) and the second contacts T2, T4, T6 ... TN corresponding to each other are arranged adjacent to each other. Specifically, the first wiring C1, C3, C5, C7, ... C(N-1) connected to the first contacts T1, T3, T5 ... T(N-1) respectively, and the fourth wiring Cb2, Cb4, Cb6, Cb8 ... CbN connected to the second contacts T2, T4, T6, T8 ... TN respectively are arranged adjacent to each other at corresponding positions.

[0108] Thus, in the resistance measuring device 1 of the present embodiment and the resistance measuring fixture included in the resistance measuring device 1, in the first fixture 3U on the front end side of the portion where the first wiring group CA1 and the second wiring group CA2 branch off, the first wiring and the fourth wiring (e.g., the first wiring C1 and the fourth wiring Cb2) respectively connected to the first contact and the second contact (e.g., the first contact T1 and the second contact T2) corresponding to each other are arranged adjacently. Therefore, the noise caused by the electromagnetic influence received by the first wiring from the outside will be generated in the adjacent fourth wiring with approximately the same magnitude. That is, the noise generated in the first wiring is also generated in the fourth wiring and transmitted to the second wiring in the same manner, thereby reducing the influence of the noise. Thus, even in the case where the portion where the first wiring group CA1 and the second wiring group CA2 branch off is the front end side and noise is generated due to external factors, the decrease in the measurement accuracy in the resistance measuring device 1 can be suppressed.

[0109] Moreover, if Figure 5 As in the second embodiment shown in FIG. 1 , as long as the structure includes all of the first wiring group CA1, the second wiring group CA2, the third wiring group CB1, and the fourth wiring group CB2, the location where the second wiring group CA2 branches from the first wiring group CA1 does not need to be near the first fixture 3U. That is, in this embodiment, in the resistance measuring section 5 (refer to Figure 2 ) and the first clamp 3U, until a predetermined portion ( Figure 5 The first wiring group CA1 and the second wiring group CA2 are adjacent to each other, from the position where the second wiring group CA2 branches off from the first wiring group CA1) to the position where the second wiring group CA2 branches off from the first wiring group CA1), and the first wiring group CA1 and the second wiring group CA2 are adjacent to each other. Furthermore, on the front end side that is more than a predetermined position, the third wiring group CB1 and the second wiring group CA2 are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other, which are adjacent to each other.

[0110] According to this structure, the first wiring is arranged adjacent to the second wiring until the predetermined position, the third wiring is arranged adjacent to the second wiring at the front end side of the predetermined position, and the first wiring is arranged adjacent to the fourth wiring, so even if noise caused by external factors is generated in each wiring, it will be generated in the adjacent wiring with approximately the same size. That is, the noise generated in one wiring is also generated and transmitted in the adjacent wiring, thereby reducing the influence of the noise. Therefore, no matter which wiring generates noise due to external factors, the decrease in measurement accuracy in the resistance measuring device 1 can be suppressed.

[0111] In addition, in the present structure, the open end of the third wiring group CB1 can also reach the second fixture 3D. For example, in a printed circuit board (PCB) interposer such as the second connecting member described later, the second wiring pattern is arranged adjacent to the third wiring pattern having an open end, a portion of the front end side of the second wiring group CA2 includes the second wiring pattern, and a portion of the front end side of the third wiring group CB1 includes the third wiring pattern, thereby, even when noise is generated in the second fixture 3D due to external factors, the decrease in measurement accuracy in the resistance measuring device 1 can be suppressed. Moreover, the open end of the fourth wiring group CB2 can also reach the first fixture 3U, and similarly to the PCB interposer, each adjacent wiring pattern can also be configured as a portion of the front end side of the first wiring group CA1 and the fourth wiring group CB2.

[0112] Next, use Figure 6 The electrical structure of the resistance measuring fixture in the resistance measuring device of the third embodiment of the present invention is described. The resistance measuring fixture in this embodiment is different from the structure of the resistance measuring fixture in the first embodiment in that Figure 6 As shown, the first clamp 3U includes a first connecting member 3cU, and the second clamp 3D includes a second connecting member 3cD. In this embodiment, the same symbols are marked for the same structures as those in the first embodiment, and detailed descriptions are omitted. In addition, it is also possible to set the following structure, that is, only the first clamp 3U includes the first connecting member 3cU, and the second clamp 3D does not include the second connecting member 3cD. On the contrary, it is also possible to set the following structure, that is, only the second clamp 3D includes the second connecting member 3cD, and the first clamp 3U does not include the first connecting member 3cU.

[0113] The first connecting member 3cU and the second connecting member 3cD include a PCB adapter board, in which various wiring patterns are formed (as described in detail later, the first wiring pattern P1 to the fourth wiring pattern P4 and the second partial pattern Pp2). Moreover, the first connecting member 3cU and the second connecting member 3cD are connected to various wiring groups through the connectors CN1 to CN3. The first connecting member 3cU connects the first contacts T1, T3, T5, T7...T(N-1) and the first wiring C1, C3, C5, C7...C(N-1). Moreover, the second connecting member 3cD connects the second contacts T2, T4, T6, T8...TN and the second wiring C2, C4, C6, C8...CN.

[0114] Specifically, if Figure 6 As shown, the first connection member 3cU includes: a plurality of electrodes E1, E3, E5, E7...E(N-1) contacted by the first contacts T1, T3, T5, T7...T(N-1); a first wiring pattern P1 connected to these electrodes E1, E3, E5, E7...E(N-1) and connected to the first wiring C1, C3, C5, C7...C(N-1); and a second partial pattern Pp2 constituting a part of the second wiring C2, C4, C6, C8...CN. Moreover, the first connection member 3cU also includes a fourth wiring pattern P4 extending from the second partial pattern Pp2.

[0115] Moreover, if Figure 6 As shown, the second connecting member 3cD includes: a plurality of electrodes E2, E4, E6, E8…EN contacted by the second contact members T2, T4, T6, T8…TN; a second wiring pattern P2 connected to these electrodes E2, E4, E6, E8…EN and connected to the second wiring C2, C4, C6, C8…CN; and a third wiring pattern P3 connected to the third wiring Cb1, Cb3, Cb5, Cb7…Cb(N-1).

[0116] Furthermore, according to the present embodiment, in the first connection member 3cU, the first wiring pattern P1 and the second partial pattern Pp2, which are respectively connected to the first contacts T1, T3, T5 ... T(N-1) and the second contacts T2, T4, T6 ... TN corresponding to each other, are arranged adjacent to each other. In this way, in the first connection member 3cU, the first wiring pattern P1 and the second partial pattern Pp2 are arranged adjacent to each other, so even when noise caused by external factors is generated on the base end side of the first connection member 3cU, it is possible to suppress a decrease in measurement accuracy.

[0117] Furthermore, according to the present embodiment, in the second connection member 3cD, the third wiring pattern P3 connected to the first contacts T1, T3, T5 ... T(N-1) and the second contacts T2, T4, T6 ... TN corresponding to each other is arranged adjacent to the second wiring pattern P2. In this way, in the second connection member 3cD, the third wiring pattern P3 is arranged adjacent to the second wiring pattern P2, so even if noise caused by external factors is generated in the second connection member 3cD, it is possible to suppress a decrease in measurement accuracy.

[0118] Furthermore, according to the present embodiment, in the first connection member 3cU, the first wiring pattern P1 and the fourth wiring pattern P4, which are respectively connected to the first contacts T1, T3, T5 ... T(N-1) and the second contacts T2, T4, T6 ... TN corresponding to each other, are arranged adjacent to each other. In this way, in the first connection member 3cU, the first wiring pattern P1 and the fourth wiring pattern P4 are arranged adjacent to each other, so even if noise caused by external factors is generated at the front end side of the portion where the first wiring pattern P1 and the second partial pattern Pp2 are branched, it is possible to suppress the decrease in measurement accuracy.

[0119] That is, a resistance measuring device of an example of the present invention includes: a first fixture facing one side of a measured object; a plurality of first contact members arranged in the first fixture and capable of abutting against the one side; a second fixture facing the other side of the measured object; a plurality of second contact members arranged in the second fixture corresponding to the plurality of first contact members, capable of abutting against the other side; a resistance measuring unit for supplying current between one of the first contact members and one of the second contact members corresponding to each other, and for supplying current between another first contact member adjacent to the one of the first contact members corresponding to each other and another first contact member adjacent to the one of the second contact members The voltage between the two second contact members is detected, and the resistance value of the measured object is calculated based on the relationship between the supplied current value and the detected voltage value; a first wiring, corresponding to each of the first contact members, connects the resistance measuring unit and the first contact member; and a second wiring, corresponding to each of the second contact members, connects the resistance measuring unit and the second contact member from the resistance measuring unit via the vicinity of the first clamp, and between the resistance measuring unit and the first clamp, the first wiring and the second wiring, which are respectively connected to the first contact member and the second contact member corresponding to each other, are arranged adjacent to each other.

[0120] According to this configuration, since the first wiring and the second wiring are arranged adjacent to each other, even when noise due to external factors is generated between the resistance measuring unit and the first jig, a decrease in measurement accuracy can be suppressed.

[0121] Moreover, preferably, the resistance measuring device further includes: a third wiring extending from the first wiring corresponding to each of the first contacts, and the third wiring respectively connected to the first contact and the second contact corresponding to each other is arranged adjacent to the second wiring between the first clamp and the second clamp.

[0122] According to this configuration, since the third wiring is arranged adjacent to the second wiring, even when noise due to external factors is generated between the first jig and the second jig, it is possible to suppress a decrease in measurement accuracy.

[0123] Moreover, preferably, the resistance measuring device also includes: a fourth wiring, which extends from the second wiring corresponding to each of the second contact pieces, and is arranged adjacent to the first wiring and the fourth wiring at the front end side of the portion where the first wiring and the second wiring branch off, and the first wiring and the fourth wiring respectively connected to the first contact pieces and the second contact pieces corresponding to each other.

[0124] According to this configuration, the first wiring and the fourth wiring are arranged adjacent to each other. Therefore, even when noise due to external factors is generated on the leading end side of the portion where the first wiring and the second wiring branch, a decrease in measurement accuracy can be suppressed.

[0125] Moreover, a resistance measuring device of an example of the present invention includes: a first fixture facing one side of a measured object; a plurality of first contact members arranged in the first fixture and capable of abutting against the one side; a second fixture facing the other side of the measured object; a plurality of second contact members arranged in the second fixture corresponding to the plurality of first contact members, capable of abutting against the other side; a resistance measuring unit supplying current between one of the first contact members and one of the second contact members corresponding to each other, detecting a voltage between another first contact member adjacent to the one of the first contact members corresponding to each other and another second contact member adjacent to the one of the second contact members, and calculating the resistance value of the measured object based on the relationship between the supplied current value and the detected voltage value; a first wiring corresponding to each of the first contact members, connecting the resistance measuring unit and the first contact member; and a second wiring corresponding to each of the first contact members. A second contact piece connects the resistance measuring part and the second contact piece, and from the resistance measuring part to a specified position between the first clamp, the first wiring connected to the first contact piece and the second contact piece corresponding to each other is arranged adjacent to the second wiring. The resistance measuring device includes a third wiring, the third wiring extends from the specified position in the first wiring corresponding to each first contact piece, and the third wiring connected to the first contact piece and the second contact piece corresponding to each other is arranged adjacent to the second wiring at a front end side relative to the specified position. The resistance measuring device includes a fourth wiring, the fourth wiring extends from the specified position in the second wiring corresponding to each second contact piece, and the first wiring connected to the first contact piece and the second contact piece corresponding to each other is arranged adjacent to the fourth wiring at a front end side relative to the specified position.

[0126] According to this structure, the first wiring and the second wiring are arranged adjacent to each other up to the specified position, and the third wiring and the second wiring are arranged adjacent to each other on the front end side closer to the specified position, and the first wiring and the fourth wiring are arranged adjacent to each other. Therefore, even if noise caused by external factors is generated in each wiring, the decrease in measurement accuracy can be suppressed.

[0127] Moreover, a resistance measuring fixture of an example of the present invention includes: a first fixture facing one side of a measured object; a plurality of first contact members arranged in the first fixture and capable of abutting against the one side; a second fixture facing the other side of the measured object; a plurality of second contact members arranged in the second fixture corresponding to the plurality of first contact members, respectively, and capable of abutting against the other side; a first wiring connected to each of the first contact members; and a second wiring connected to each of the second contact members, and the first wiring and the second wiring respectively connected to the first contact members and the second contact members corresponding to each other are arranged adjacent to each other via the vicinity of the first fixture, on the base end side relative to the vicinity of the first fixture.

[0128] According to this configuration, since the first wiring and the second wiring are arranged adjacent to each other, even when noise due to external factors is generated on the proximal end side relative to the vicinity of the first jig, a decrease in measurement accuracy can be suppressed.

[0129] Moreover, preferably, the resistance measuring fixture further includes: a third wiring extending from the first wiring corresponding to each of the first contacts, and the third wiring respectively connected to the first contact and the second contact corresponding to each other is arranged adjacent to the second wiring between the first fixture and the second fixture.

[0130] According to this configuration, since the third wiring is arranged adjacent to the second wiring, even when noise due to external factors is generated between the first jig and the second jig, it is possible to suppress a decrease in measurement accuracy.

[0131] Moreover, preferably, the resistance measuring fixture also includes: a fourth wiring, which extends from the second wiring corresponding to each of the second contact pieces, and is arranged adjacent to the first wiring and the fourth wiring at the front end side of the portion where the first wiring and the second wiring branch off, and the first wiring and the fourth wiring respectively connected to the first contact pieces and the second contact pieces corresponding to each other.

[0132] According to this configuration, the first wiring and the fourth wiring are arranged adjacent to each other. Therefore, even when noise due to external factors is generated on the leading end side of the portion where the first wiring and the second wiring branch, a decrease in measurement accuracy can be suppressed.

[0133] Moreover, a resistance measuring jig of an example of the present invention includes: a first jig facing one side of a measured object; a plurality of first contacts arranged in the first jig and capable of abutting against the one side; a second jig facing the other side of the measured object; a plurality of second contacts arranged in the second jig corresponding to the plurality of first contacts, respectively, and capable of abutting against the other side; a first wiring connected to each of the first contacts; and a second wiring connected to each of the second contacts, and the first wiring and the second wiring are arranged adjacent to each other at a base end side closer to the first jig via the first jig, the first jig including a first connecting member connecting the plurality of first contacts and the first wiring, the first connecting member including a plurality of electrodes contacted by the plurality of first contacts, a first wiring pattern connected to the electrodes and connected to the first wiring, and a second partial pattern constituting a part of the second wiring, and in the first connecting member, the first wiring pattern and the second partial pattern are arranged adjacent to each other.

[0134] According to this configuration, in the first connection member, the first wiring pattern and the second partial pattern are arranged adjacent to each other. Therefore, even when noise due to external factors is generated on the base end side of the first connection member, a decrease in measurement accuracy can be suppressed.

[0135] Moreover, preferably, the resistance measuring fixture also includes: a third wiring extending from the first wiring corresponding to each of the first contact pieces, and between the first fixture and the second fixture, the third wiring respectively connected to the first contact pieces and the second contact pieces corresponding to each other is arranged adjacent to the second wiring, the second fixture includes a second connecting member connecting the multiple second contact pieces and the second wiring, the second connecting member includes a plurality of electrodes contacted by the multiple second contact pieces, a second wiring pattern connected to the electrodes and connected to the second wiring, and a third wiring pattern connected to the third wiring, and in the second connecting member, the third wiring pattern respectively connected to the first contact pieces and the second contact pieces corresponding to each other is arranged adjacent to the second wiring pattern.

[0136] According to this configuration, in the second connection member, the third wiring pattern is arranged adjacent to the second wiring pattern. Therefore, even when noise due to external factors is generated in the second connection member, a decrease in measurement accuracy can be suppressed.

[0137] Moreover, preferably, in the resistance measuring fixture, the first connecting member also includes a fourth wiring pattern extending from the second local pattern, and the first wiring pattern and the fourth wiring pattern are arranged adjacent to each other at the front end side of the portion where the first wiring pattern and the second local pattern of the first connecting member branch off.

[0138] According to this structure, in the first connecting member, the first wiring pattern and the fourth wiring pattern are arranged adjacent to each other, so even if noise caused by external factors is generated on the front end side of the part of the first connecting member where the first wiring pattern and the second local pattern branch off, the decrease in measurement accuracy can be suppressed.

[0139] According to such a resistance measuring device and resistance measuring jig, even when noise is generated due to external factors, it is possible to suppress a decrease in measurement accuracy.

[0140] In addition, the specific implementation or example described in the specific implementation is only to clarify the technical content of the present invention, and the present invention should not be limited to such specific examples and interpreted in a narrow sense.

Claims

1. A resistance measuring device, comprising: A first fixture faces one side of the object to be measured; A plurality of first contact members are arranged in the first fixture and can abut against one of the surfaces; a second fixture facing the other side of the object to be measured; a plurality of second contact members, arranged in the second fixture corresponding to the plurality of first contact members respectively, and capable of abutting against the other surface; a resistance measuring unit that supplies a current between one of the first contacts and one of the second contacts that correspond to each other, detects a voltage between another first contact that is adjacent to the one of the first contacts that correspond to each other and another second contact that is adjacent to the one of the second contacts, and calculates a resistance value of the object to be measured based on a relationship between a supplied current value and a detected voltage value; a first wiring corresponding to each of the first contacts and connecting the resistance measuring unit and the first contacts; as well as A second wiring, corresponding to each of the second contacts, connects the resistance measuring section and the second contacts via the vicinity of the first jig from the resistance measuring section. The resistance measuring unit includes a voltage detecting unit that detects a voltage between another first contact and one of the second contacts adjacent to one of the first contacts corresponding to each other. The first wiring and the second wiring respectively connected to the first contact and the second contact corresponding to the voltage detection unit are arranged adjacent to each other between the resistance measurement unit and the first jig.

2. The resistance measuring device according to claim 1, further comprising: a third wiring extending from the first wiring corresponding to each of the first contacts, The third wirings connected to the first contacts and the second contacts corresponding to each other are arranged adjacent to the second wirings between the first jig and the second jig.

3. The resistance measuring device according to claim 1 or 2, further comprising: a fourth wiring extending from the second wiring corresponding to each of the second contacts, The first wiring and the fourth wiring, which are respectively connected to the first contact and the second contact corresponding to each other, are arranged adjacent to each other on the front end side of the portion where the first wiring and the second wiring branch.

4. A resistance measuring device, comprising: A first fixture faces one side of the object to be measured; A plurality of first contact members are arranged in the first fixture and can abut against one of the surfaces; a second fixture facing the other side of the object to be measured; a plurality of second contact members, arranged in the second fixture corresponding to the plurality of first contact members respectively, and capable of abutting against the other surface; a resistance measuring unit that supplies a current between one of the first contacts and one of the second contacts that correspond to each other, detects a voltage between another first contact that is adjacent to the one of the first contacts that correspond to each other and another second contact that is adjacent to the one of the second contacts, and calculates a resistance value of the object to be measured based on a relationship between a supplied current value and a detected voltage value; a first wiring corresponding to each of the first contacts and connecting the resistance measuring unit and the first contacts; as well as a second wiring corresponding to each of the second contacts and connecting the resistance measuring unit and the second contacts; The resistance measuring unit includes a voltage detecting unit that detects a voltage between another first contact and one of the second contacts adjacent to one of the first contacts corresponding to each other. The first wiring and the second wiring connected to the first contact and the second contact corresponding to the voltage detection unit are arranged adjacent to each other from the resistance measurement unit to a predetermined position between the first clamp and the first contact. The resistance measuring device includes a third wiring extending from the prescribed portion of the first wiring corresponding to each of the first contacts, The third wiring connected to the first contact and the second contact corresponding to each other is arranged adjacent to the second wiring at the front end side relative to the predetermined position, The resistance measuring device includes a fourth wiring extending from the prescribed portion of the second wiring corresponding to each of the second contacts, The first wiring and the fourth wiring, which are respectively connected to the first contact and the second contact corresponding to each other, are arranged adjacent to each other on the front end side relative to the predetermined position.

5. A resistance measuring fixture, comprising: A first fixture faces one side of the object to be measured; A plurality of first contact members are arranged in the first fixture and can abut against one of the surfaces; a second fixture facing the other side of the object to be measured; a plurality of second contact members, arranged in the second fixture corresponding to the plurality of first contact members respectively, and capable of abutting against the other surface; a first wiring connected to each of the first contacts and connectable to a voltage detection unit; as well as A second wiring is connected to each of the second contacts and can be connected to the voltage detection unit and passes through the vicinity of the first clamp. The first wiring and the second wiring connected to the first contact and the second contact corresponding to the voltage detection unit are disposed adjacent to each other on the proximal side relative to the vicinity of the first clamp.

6. The resistance measuring fixture according to claim 5, further comprising: a third wiring extending from the first wiring corresponding to each of the first contacts, The third wirings connected to the first contacts and the second contacts corresponding to each other are arranged adjacent to the second wirings between the first jig and the second jig.

7. The resistance measuring fixture according to claim 5 or 6, further comprising: a fourth wiring extending from the second wiring corresponding to each of the second contacts, The first wiring and the fourth wiring, which are respectively connected to the first contact and the second contact corresponding to each other, are arranged adjacent to each other on the front end side of the portion where the first wiring and the second wiring branch.

8. A resistance measuring fixture, comprising: A first fixture faces one side of the object to be measured; A plurality of first contact members are arranged in the first fixture and can abut against one of the surfaces; a second fixture facing the other side of the object to be measured; a plurality of second contact members, arranged in the second fixture corresponding to the plurality of first contact members respectively, and capable of abutting against the other surface; a first wiring connected to each of the first contacts and connectable to a voltage detection unit; as well as a second wiring connected to each of the second contacts and connectable to the voltage detection unit via the first clamp, The first wiring connected to the first contact and the second contact corresponding to the voltage detection unit are arranged adjacent to the second wiring on the proximal side relative to the vicinity of the first clamp, The first fixture includes a first connecting member connecting the plurality of first contacts and the first wiring, The first connection member includes a plurality of electrodes contacted by the plurality of first contacts, a first wiring pattern connected to the electrodes and connected to the first wiring, and a second partial pattern constituting a portion of the second wiring, In the first connection member, the first wiring pattern connected to the first contact and the second contact corresponding to each other is arranged adjacent to the second partial pattern.

9. The resistance measuring fixture according to claim 8, further comprising: a third wiring extending from the first wiring corresponding to each of the first contacts, The third wiring connected to the first contact and the second contact corresponding to each other is arranged adjacent to the second wiring between the first clamp and the second clamp, The second fixture includes a second connecting member connecting the plurality of second contacts and the second wiring, The second connection member includes a plurality of electrodes contacted by the plurality of second contacts, a second wiring pattern connected to the electrodes and connected to the second wiring, and a third wiring pattern connected to the third wiring, In the second connection member, the third wiring pattern connected to the first contact and the second contact corresponding to each other is arranged adjacent to the second wiring pattern.

10. The resistance measuring fixture according to claim 8 or 9, wherein The first connection member further includes a fourth wiring pattern extending from the second partial pattern, The first wiring pattern and the fourth wiring pattern connected to the first contact and the second contact corresponding to each other are arranged adjacent to each other at the front end side of the portion of the first connection member where the first wiring pattern and the second partial pattern branch off.

Images