A motherboard adjustable power supply test device, test system and test method

Abstract

The embodiments of the present application disclose a motherboard adjustable power supply test device, test system and test method, which relate to the field of power supply testing technology and are invented to facilitate improving the flexibility of the design of the test device and test system and the flexibility of using the test method to complete the power supply test. The test device includes: a control board connected to an analog CPU load board, and the analog CPU load board has pins for connecting to a chip seat; the control board includes a field programmable logic gate array module connected to the input end of the digital-to-analog conversion module and the output end of the analog-to-digital conversion module, and the output end of the digital-to-analog conversion module is connected to the load control signal port via a first operational amplifier; the current feedback signal port and the power supply voltage feedback signal port are connected to the input end of the analog-to-digital conversion module via a second operational amplifier; the power supply voltage setting signal port of the field programmable logic gate array module is connected to the power supply voltage setting signal port; the first end of the USB interface is used to connect to the host computer, and the second end of the USB interface is connected to the field programmable logic gate array. The present application is suitable for testing the motherboard power supply.

Description

Technical Field

[0001] The present application relates to the field of power supply testing technology, and in particular to a motherboard adjustable power supply testing device, a testing system, and a testing method. Background Art

[0002] In a server, the motherboard power supply can supply power to the CPU. However, if there is a problem with the motherboard power supply, the CPU cannot be supplied normally, thereby affecting the normal use of the CPU. Therefore, before the CPU chip is installed on the motherboard, it is particularly important to test the power supply on the motherboard that supplies power to the CPU and determine the power supply characteristics of the motherboard power supply. In the existing technology, the power supply test equipment for testing the motherboard power supply that supplies power to the CPU includes a CPU power supply characteristic simulation board, a control system, and matching structural parts. The control system adopts a processor solution, and the processor's external interface is a fixed interface. This results in low flexibility of the motherboard adjustable power supply test equipment. Summary of the Invention

[0003] In view of this, the embodiments of the present application provide a method for improving the flexibility of designing a motherboard adjustable power supply test device and a test system of the embodiment and the flexibility of using the test method of the embodiment.

[0004] The embodiment of the present application provides a motherboard adjustable power supply test device, comprising: a control board and a simulated CPU load board, wherein the control board and the simulated CPU load board are connected via a signal cable, the control board having a host computer connection interface for connecting to a host computer, and the back of the simulated CPU load board having a pin array for electrically connecting to a CPU chip seat on the motherboard under test; wherein the control board comprises: a field programmable logic gate array module, a digital-to-analog conversion module, an analog-to-digital conversion module, a cable interface, and a USB interface; the field programmable logic gate array module is respectively connected to the input end of the digital-to-analog conversion module and the output end of the analog-to-digital conversion module via a system management bus, and the output end of the digital-to-analog conversion module is connected to the input end of a first operational amplifier The output end of the first operational amplifier is connected to the load control signal port on the cable interface; the current feedback signal port and the power supply voltage feedback signal port on the cable interface are connected to the input end of the second operational amplifier, and the output end of the second operational amplifier is connected to the input end of the analog-to-digital conversion module; the voltage setting signal port of the field programmable logic gate array module is connected to the voltage setting signal port of the power supply on the cable interface through a VR serial bus, and the power control signal port of the field programmable logic gate array module is connected to the power control signal port on the cable interface through a control signal line; the first end of the USB interface is used to be connected to the host computer, and the second end of the USB interface is connected to the field programmable logic gate array.

[0005] According to a specific implementation of an embodiment of the present application, the field programmable logic gate array module includes: a central control submodule, a USB interface protocol submodule, a VR serial bus interface protocol submodule, a system management bus interface protocol submodule and a control processing signal submodule, wherein the central processing submodule is communicatively connected to the USB interface protocol submodule, the VR serial bus interface protocol submodule, the system management bus interface protocol submodule and the control processing signal submodule respectively; the USB interface protocol submodule is connected to the USB interface, the VR serial bus interface protocol submodule is connected to the VR serial bus, the system management bus interface protocol submodule is connected to the system management bus, and the control processing signal submodule is connected to the control signal line.

[0006] According to a specific implementation of an embodiment of the present application, the simulated CPU load board includes a printed circuit board, a power circuit module and a sampling circuit module, and the power circuit module and the sampling circuit module are arranged on the printed circuit board; the first input end of the power circuit module is connected to the load control signal port on the cable interface, and the second input end of the power circuit module is connected to the first pin in the pin array on the back side of the simulated CPU load board, the first pin is used to be connected to the pin on the CPU chip seat on the tested motherboard, and the pin is the pin corresponding to the output voltage signal of the tested power supply; the current feedback signal port includes a first voltage feedback signal port and a second voltage feedback signal port, the first end of the sampling circuit module is connected to the first voltage feedback signal port, and the second end of the sampling circuit module is connected to the second voltage feedback signal port, the first output end of the power circuit module is also connected to the first end of the sampling circuit module, and the second end of the sampling circuit module is grounded.

[0007] According to a specific implementation of an embodiment of the present application, the simulated CPU load board also includes: a power supply voltage setting pin, a power supply voltage feedback pin and a power supply control signal pin. The power supply voltage setting pin, the power supply voltage feedback pin and the power supply control signal pin are arranged on the front of the simulated CPU load board, the power supply voltage setting signal port on the cable interface is connected to the power supply voltage setting pin through the cable, the power supply voltage feedback port on the cable interface is connected to the power supply voltage feedback pin, and the power supply control signal port on the cable interface is connected to the power supply control signal pin through the cable; the power supply voltage setting pin, the power supply voltage feedback pin and the control signal pin are respectively connected one-to-one with the second pin, the third pin and the fourth pin in the pin array on the back of the CPU load board, and the first pin, the second pin and the third pin are respectively used to be connected one-to-one with the CPU chip seat on the tested motherboard and the pins corresponding to the power supply voltage setting interface, the power supply voltage feedback interface and the control signal interface on the tested motherboard.

[0008] According to a specific implementation of an embodiment of the present application, the power circuit module includes: a metal-oxide semiconductor field-effect transistor, the gate of the metal-oxide semiconductor field-effect transistor is connected to the load control signal port on the cable interface, the drain of the metal-oxide semiconductor field-effect transistor is used to connect to the first pin in the back pin array of the simulated CPU load board, and the source of the metal-oxide semiconductor field-effect transistor is connected to the sampling circuit module, wherein the fourth pin is used to connect to the pin on the CPU chip socket on the motherboard under test, corresponding to the voltage signal of the power supply.

[0009] According to a specific implementation of the embodiment of the present application, the sampling circuit module includes: a sampling resistor, wherein a first end of the sampling resistor is respectively connected to the first output end of the power circuit module and the first voltage feedback signal port, a second end of the sampling resistor is grounded, and the second end of the sampling resistor is also connected to the second voltage feedback signal port.

[0010] According to a specific implementation method of an embodiment of the present application, the size of the printed circuit board is equal to the size of the real CPU, and the real CPU is the CPU corresponding to the tested motherboard during actual use; the number of the power circuit modules is equal to the number of grain dies on the real CPU, and the position of the power circuit module on the printed circuit board corresponds to the position of the grain die on the real CPU on the real CPU.

[0011] According to a specific implementation method of the embodiment of the present application, it also includes: a host computer, which is connected to the first end of the USB interface.

[0012] According to a specific implementation of the embodiment of the present application, it also includes: a radiator, which is arranged on the simulated CPU load board.

[0013] The present application also provides a testing system for a motherboard adjustable power supply, comprising: a host computer, a motherboard, and a motherboard adjustable power supply testing device as described in any of the above embodiments, the host computer being connected to a USB interface in the motherboard adjustable power supply testing device, and the simulated CPU load board in the motherboard adjustable power supply testing device being installed on the CPU chip seat on the motherboard.

[0014] The present application also provides a method for testing a mainboard adjustable power supply, comprising: a host computer sends a voltage setting instruction, wherein the instruction includes a preset voltage value; a field programmable logic gate array module parses the voltage setting instruction and obtains the preset voltage value; the field programmable logic gate array module sends the preset voltage value to the adjustable power supply on the mainboard through a VR serial bus; the adjustable power supply on the mainboard receives the preset voltage value and sets the output voltage value of the adjustable power supply according to the preset voltage value; the field programmable logic gate array module receives a voltage feedback signal from the mainboard adjustable power supply and determines the output voltage value of the mainboard adjustable power supply according to the voltage feedback signal; the host computer The computer sends a current setting instruction, wherein the current setting instruction includes a preset current value; the field programmable logic gate array module parses the current setting instruction to obtain the preset current value; the field programmable logic gate array module sends a load control signal to the simulated CPU load board according to the preset current value to adjust the resistance of the simulated CPU load board; the field programmable logic gate array module receives a current feedback signal from the simulated CPU load board and determines the current on the simulated CPU load board according to the current feedback signal; and determines the power supply characteristics of the mainboard adjustable power supply according to the output voltage value of the mainboard adjustable power supply and the current on the simulated CPU load board.

[0015] According to a specific implementation method of an embodiment of the present application, the preset current includes a first preset current value and a second preset current value; the field programmable logic gate array module parses the current setting instruction to obtain the preset current value, specifically: the field programmable logic gate array module parses the current setting instruction to obtain the first preset current value and the second preset current value; the field programmable logic gate array module sends a load control signal to the analog CPU load board according to the preset current value to adjust the resistance of the analog CPU load board; the field programmable logic gate array module receives the current feedback signal on the analog CPU load board and determines the current on the analog CPU load board according to the current feedback signal, specifically: the field programmable logic gate array module sends a first load control signal to the analog CPU load board according to the first preset current value to adjust the resistance of the analog CPU load board resistance; the field programmable logic gate array module receives a first current feedback signal on the simulated CPU load board, and determines a first current on the simulated CPU load board according to the first current feedback signal; the field programmable logic gate array module sends a second load control signal to the simulated CPU load board according to a second preset current value to adjust the resistance of the simulated CPU load board; the field programmable logic gate array module receives a second current feedback signal on the simulated CPU load board, and determines a second current on the simulated CPU load board according to the second current feedback signal; the power supply characteristics of the mainboard adjustable power supply are determined according to the output voltage value of the mainboard adjustable power supply and the current on the simulated CPU load board, specifically: the power supply characteristics of the mainboard adjustable power supply are determined according to the output voltage value of the mainboard adjustable power supply and the first current and the second current on the simulated CPU load board.

[0016] According to a specific implementation of an embodiment of the present application, after determining the output voltage value on the mainboard adjustable power supply according to the voltage feedback signal, and before the host computer sends a current setting instruction, the method further includes: the field programmable logic gate array module determines whether the output voltage value is within a preset power supply voltage range; if so, executing the step of the host computer sending a current setting instruction; if not, ending the process.

[0017] The embodiment of the present application provides a motherboard adjustable power supply test device, test system and test method. The control board and the simulated CPU load board are connected through a signal cable. The control board has a host computer connection interface for connecting to a host computer, and the back of the simulated CPU load board has a pin array for electrically connecting to the CPU chip seat on the tested motherboard; wherein the control board includes: a field programmable logic gate array module, a digital-to-analog conversion module, an analog-to-digital conversion module, a cable interface and a USB interface; the field programmable logic gate array module is respectively connected to the input end of the digital-to-analog conversion module and the output end of the analog-to-digital conversion module through a system management bus, the output end of the digital-to-analog conversion module is connected to the input end of the first operational amplifier, and the output end of the first operational amplifier is connected to the load control signal port on the cable interface; the current feedback signal port on the cable interface is connected to the input end of the second operational amplifier, and the output end of the second operational amplifier is connected to the load control signal port on the cable interface; The output end is connected to the input end of the analog-to-digital conversion module; the power supply voltage setting signal of the field programmable logic gate array module is connected to the power supply voltage setting signal port on the cable interface through the VR serial bus, and the control signal of the field programmable logic gate array module is connected to the power control signal port on the cable interface through the control signal line; the first end of the USB interface is used to be connected to the host computer, and the second end of the USB interface is connected to the field programmable logic gate array to implement testing of the adjustable power supply of the mainboard. Since the FPGA is used on the control board to implement signal processing, and the FPGA can form various interfaces through its I / O, the FPGA has the flexibility of input and output interface design. Therefore, the VR serial bus interface can be flexibly implemented, which facilitates improving the flexibility of the test device and test system design of this embodiment and the flexibility of completing power supply testing using the test method of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0019] Figure 1 This is a structural diagram of a motherboard adjustable power supply testing device and a testing system according to an embodiment of the present application;

[0020] Figure 2 This is a schematic structural diagram of a control panel in one embodiment of the present application;

[0021] Figure 3 Schematic diagram of the structure of the pin array on the back side of the simulated CPU load board in one embodiment of the present application;

[0022] Figure 4 This is a schematic structural diagram of a field programmable gate array module in an embodiment of the present application;

[0023] Figure 5 This is a schematic structural diagram of a simulated CPU load board in one embodiment of the present application;

[0024] Figure 6 This is a schematic structural diagram of a simulated CPU load board in another embodiment of the present application;

[0025] Figure 7 This is a schematic structural diagram of the front side of a simulated CPU load board in another embodiment of the present application;

[0026] Figure 8 This is a flow chart of a method for testing a motherboard adjustable power supply according to an embodiment of the present application;

[0027] Figure 9 This is a flow chart of a specific embodiment of the testing method of the present application. DETAILED DESCRIPTION

[0028] The embodiments of the present application are described in detail below with reference to the accompanying drawings.

[0029] It should be clear that the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0030] Figure 1 This is a structural diagram of a motherboard adjustable power supply testing device according to an embodiment of the present application. Figure 2 This is a schematic diagram of the structure of a control panel in one embodiment of the present application. Figure 3 This is a schematic diagram of the structure of the pin array on the back of the analog CPU load board in one embodiment of the present application, as shown in FIG. Figures 1 to 3As shown, the motherboard adjustable power supply test device 1 of this embodiment may include: a control board 100 and a simulation CPU load board 12, the control board 100 and the simulation CPU load board 12 are connected via a signal cable, the control board 100 has a host computer connection interface for connecting to a host computer, and the back of the simulation CPU load board 12 has a pin array for electrically connecting to the CPU chip seat on the motherboard under test; wherein, the control board 10 includes: a field programmable logic gate array module 100, a digital-to-analog conversion module 101, an analog-to-digital conversion module 102, a cable interface 103 and a USB interface 104; the field programmable logic gate array module 100 is respectively connected to the input end of the digital-to-analog conversion module 101 and the output end of the analog-to-digital conversion module 102 via a system management bus, and the output end of the digital-to-analog conversion module 101 is connected to the first operational amplifier The input end of the first operational amplifier 105 is connected to the load control signal port on the cable interface; the current feedback signal port and the power supply voltage feedback signal port on the cable interface 103 are connected to the input end of the second operational amplifier 106, and the output end of the second operational amplifier 106 is connected to the input end of the analog-to-digital conversion module 102; the voltage setting signal port of the field programmable logic gate array module 100 is connected to the power supply voltage setting signal port on the cable interface through the VR serial bus, and the power control signal port of the field programmable logic gate array module 100 is connected to the power control signal port on the cable interface 103 through a control signal line; the first end of the USB interface 104 is used to be connected to the host computer, and the second end of the USB interface 104 is connected to the field programmable logic gate array module 100.

[0031] The motherboard, also known as the mainboard, system board, or motherboard, is a generally rectangular circuit board that houses the computer's primary circuitry. Installed within the computer case, it is one of the most fundamental and crucial components of a computer. The motherboard is the core of the computer's hardware system and the largest printed circuit board within the computer case. The motherboard houses the power supply that powers the CPU core. The power supply's connector is connected to the CPU. Wires on the printed circuit board connect the CPU chip holder and the power supply. The CPU chip holder has pins for corresponding signals that electrically connect to the CPU chip, enabling signal transmission between the power supply and the CPU chip.

[0032] The adjustable power supply (PS) is installed on the motherboard and provides power to the CPU core. The adjustable power supply sets the voltage level based on commands from the CPU to provide power to the CPU core.

[0033] The control board 10 is used to send a start command and a voltage setting signal to the power supply and receive a feedback signal from the power supply, and to control the load size of the simulated CPU load board 12 and receive a current feedback signal.

[0034] The simulated CPU load board 12 is used to simulate CPU load. In one example, to measure the power characteristics of the motherboard's power supply, the simulated CPU load board 12 has an adjustable load value. Therefore, the adjustable power supply of the motherboard under test can be tested to simulate the power supply's responsiveness to changes in CPU load and its power supply capacity at minimum and maximum CPU loads. The simulated CPU load board can be packaged similarly to an actual CPU, using a metal shell similar to that used in an actual CPU. Thermally conductive material is placed between the metal shell and the components on the simulated CPU load board to dissipate heat from the power components through the metal shell. In one example, when in use, the simulated CPU load board is installed in a CPU socket. If the motherboard under test actually uses a BGA package soldered to the motherboard, the simulated CPU load board 12 also needs to be designed as a BGA package and soldered to the motherboard under test.

[0035] In order to receive operation commands issued by the host computer or transmit data to the host computer, the control board 10 has a host computer connection interface for connecting to the host computer. The connection interface can be any interface that can realize the above functions. In this embodiment, the connection interface with the host computer is a USB interface.

[0036] The back side of the simulated CPU load board 12 is one side of the simulated CPU load board 12 and is opposite to the side on which the components are mounted. The pins may be pins extending from the internal circuit of the simulated CPU load board 12 and used to electrically connect to the CPU chip socket on the motherboard under test. The number of pins may be determined based on the number and types of signals transmitted between the power supply and the simulated CPU load board 12 and the control board 10.

[0037] The Field Programmable Gate Array (FPGA) module 100 is a further development of programmable devices such as PALs and GALs. It emerged as a semi-custom circuit within the field of application-specific integrated circuits (ASICs). As the core chip on a control board, the FPGA offers greater design flexibility than a processor.

[0038] See also Figure 4In one embodiment of the present application, the field programmable logic gate array module 100 includes: a central control submodule 101a, a USB interface protocol submodule 101b, a VR serial bus interface protocol submodule 101c, a system management bus interface protocol submodule 101d, and a control processing signal submodule 101e. The central processing submodule 101 is communicatively connected to the USB interface protocol submodule 101b, the VR serial bus interface protocol submodule 101c, the system management bus interface protocol submodule 101d, and the control processing signal submodule 101e respectively; the USB interface protocol submodule 101b is connected to the USB interface 104, the VR serial bus interface protocol submodule 101c is connected to the VR serial bus, the system management bus interface protocol submodule 101d is connected to the system management bus, and the control processing signal submodule 101e is connected to the control signal line.

[0039] The central control submodule 101a is used to control and coordinate the interactive management of various modules, the USB interface protocol submodule 101b is used to implement the USB interface protocol, the VR serial bus interface protocol submodule 101c is used to implement the VR serial bus interface protocol and control the setting of VR voltage, the system management bus interface protocol submodule 101d is used to implement the SMBUS interface protocol, and the control processing signal submodule 101e is used to enable the motherboard VR PowerButton and perform calculations on various feedback signals.

[0040] After the system is powered on, the host computer sends a PowerButton control signal. The USB interface protocol module parses the USB data sent by the host computer and sends it to the central control submodule. The central control submodule 101a analyzes the command data and sends it to the adjustable power supply on the tested motherboard through the control processing signal submodule 101e, turning on the adjustable power output of the motherboard.

[0041] When testing, when setting the voltage, the host computer sends a voltage adjustment command, which is sent by the central control submodule 101a to the VR serial bus interface protocol submodule 101c to adjust the VR output voltage and load it to the voltage of the CPU power load board. In one example, the power control signal includes the power-on button signal PWR_BTN# and the VR power-on normal signal PWR_GOOD. PWR_BTN# is used to enable the mainboard adjustable power module, and PWR_GOOD is used to feedback the VR power-on.

[0042] When adjusting the current, the host computer sends a current adjustment command, and the central control submodule 101a sends the command to the D / A conversion module through the system management bus interface protocol submodule 101d, converts it into an analog signal, and then amplifies it through the first operational amplifier to an analog signal that can drive the analog CPU load board, and transmits it to the analog CPU load board; the current feedback signals VCC_FB_P and VCC_FB_N on the CPU power load board are amplified by the second operational amplifier to analog signals that can be processed by the A / D conversion module, converted into digital signals by the A / D conversion module, and then sent to the control processing sub-signal module 101e through the SMBUS bus for calculation and processing.

[0043] During the process of voltage setting and current adjustment, the correctness of the power supply output voltage adjustment can be determined based on the voltage feedback signal, and the correctness of the adjusted current value can be determined based on the feedback current value. The results can be reported to the host computer through the USB interface for analysis and processing.

[0044] The digital-to-analog conversion module 101 , also known as a D / A conversion module, can convert digital signals into analog signals.

[0045] The analog-to-digital conversion module 102, also known as the A / D conversion module, can convert analog signals into digital signals. Analog signals can only be processed by software after being converted into digital signals. All of this is achieved through the A / D conversion module.

[0046] The cable interface 103 is an interface for connecting to a cable. The cable interface has a port for signal transmission between the control board 10 and the simulated CPU load board 12 and the power supply on the mainboard.

[0047] USB, also known as Universal Serial Bus (USB), is a serial bus standard that regulates the connection and communication between computers and external devices. The corresponding USB interface can connect to a variety of peripherals, such as mice and keyboards, and has hot-swappable functions.

[0048] The System Management Bus (SMBus) provides a control bus for tasks such as system and power management. In systems using the SMBus, devices send and receive messages via the SMBus rather than using separate control lines, saving device pin count. FPGA 100 transmits load control signals VCC_CTL and current feedback signals VCC_FB_P and VCC_FB_N to the simulated CPU load board 12 via the SMBus. It also receives power supply voltage feedback signals transparently transmitted from the motherboard under test via the power supply voltage feedback signal port, the A / D conversion module, and the SMBus. These power supply voltage feedback signals, including the voltage feedback signals VCC_SENSE_P and VCC_SENSE_N output from the motherboard under test's adjustable power supply, are used to provide feedback on the power supply output voltage. Within the A / D conversion module's reception range, these signals are converted to digital signals by the A / D conversion module and then sent to the FPGA via the SMBus for computation and processing. Specifically, these signals are processed by the FPGA's control processing signal submodule 101e and reported to the host computer via the USB interface for analysis and processing.

[0049] The VR serial bus may include a clock signal line, a data signal line, and an alarm signal line, for transmitting a serial VID clock signal VID_CLK, a serial VID data signal VID_DATA, and a serial VID alarm signal VID_ALERT#.

[0050] The FPGA 100 can transmit a power button signal to the power supply on the mainboard through the power control signal line, and the power supply can transmit a power-on normal signal to the FPGA 100 through the power control signal line.

[0051] The following table shows the signals on the control board and the corresponding control line signal types.

[0052]

[0053]

[0054] The first operational amplifier 105 and the second operational amplifier 106 are circuit units with very high amplification factors. Their output signals can be the results of mathematical operations such as addition, subtraction, differentiation, and integration of the input signals. They can be implemented by discrete devices or in a semiconductor chip. They can also be in the form of a single chip.

[0055] The motherboard adjustable power supply test device of this embodiment is used as follows: The back of the simulated CPU load board 12 has a pin array for electrically connecting to the CPU chip socket on the motherboard under test. The pin array is connected to the CPU chip socket on the motherboard under test. The USB interface is used to communicate with the host computer, sending host computer commands to the FPGA. The FPGA sends power control signals to the simulated CPU load board 12, which are then sent to the motherboard under test, thereby controlling the motherboard's VR power-up and enabling the motherboard's adjustable power module. The FPGA then sends a voltage setting signal to the motherboard's adjustable power supply via the VR serial bus to set the power supply voltage. The power supply generates an output voltage based on the internal setting. At the same time, a voltage feedback signal is transmitted to the FPGA via the VR serial bus. The voltage feedback signal is input into the FPGA through the A / D conversion module for processing. The processing result is transmitted to the host computer via the USB interface. If the voltage value is within the normal deviation range, a load control signal is sent to the simulated CPU load board 12 to adjust the load. The FPGA also receives a current feedback signal from the current feedback signal port. The current feedback signal is transmitted to the FPGA through an amplifier and an A / D converter. In this way, a corresponding relationship between voltage and current is obtained. If it is necessary to conduct the next load current value test at the same voltage, adjust the current of the simulated CPU load board again.

[0056] Repeat the above process to set the next voltage value and test the corresponding current size. The voltage of the power supply on the mainboard can be set through the control board, and the load size of the simulated CPU load board can be adjusted to achieve current extraction and finally realize power supply testing. In this way, in the early stage of CPU development, the CPU can be simulated and the mainboard adjustable power supply system can be tested, which can better support the later CPU verification. In addition, it can be used for customers to test the mainboard adjustable power supply system to ensure the stability of CPU working conditions and speed up project progress.

[0057] In this embodiment, the control board and the analog CPU load board are connected via a signal cable. The control board has a host computer connection interface for connecting to a host computer, and the back of the analog CPU load board has a pin array for electrically connecting to the CPU chip seat on the motherboard under test; wherein, the control board includes: a field programmable logic gate array module, a digital-to-analog conversion module, an analog-to-digital conversion module, a cable interface and a USB interface; the field programmable logic gate array module is respectively connected to the input end of the digital-to-analog conversion module and the output end of the analog-to-digital conversion module through a system management bus, the output end of the digital-to-analog conversion module is connected to the input end of the first operational amplifier, and the output end of the first operational amplifier is connected to the load control signal port on the cable interface; the current feedback signal port on the cable interface is connected to the input end of the second operational amplifier, and the output end of the second operational amplifier is connected to the analog-to-digital conversion module The power supply voltage setting signal of the field programmable logic gate array module is connected to the power supply voltage setting signal port on the cable interface through the VR serial bus, and the control signal of the field programmable logic gate array module is connected to the power control signal port on the cable interface through the control signal line; the first end of the USB interface is used to be connected to the host computer, and the second end of the USB interface is connected to the field programmable logic gate array to implement testing of the adjustable power supply of the mainboard. Since FPGA is used on the control board to implement signal processing, and FPGA can form various interfaces through its I / O, the FPGA has flexibility in input and output interface design. Therefore, the VR serial bus interface can be flexibly implemented, which is convenient for improving the flexibility of the design of the test device of this embodiment, and further, it is convenient for reducing the cost of the test device of this embodiment.

[0058] See also Figure 5 Another embodiment of the present application is substantially the same as the above embodiment, except that the simulated CPU load board 12 of this embodiment includes a printed circuit board (not shown), a power circuit module 120, and a sampling circuit module 122. The power circuit module 120 and the sampling circuit module 122 are disposed on the printed circuit board. A first input end of the power circuit module 120 is connected to a load control signal port on the cable interface, and a second input end of the power circuit module 120 is connected to a first pin in a pin array on the back side of the simulated CPU load board 12. The first pin is used to connect to a pin on a CPU chip socket on a motherboard under test. The pin on the CPU chip socket corresponds to the output voltage signal of the power supply under test. The current feedback signal port includes a first voltage feedback signal port and a second voltage feedback signal port. A first end of the sampling circuit module 122 is connected to the first voltage feedback signal port, and a second end of the sampling circuit module 122 is connected to the second voltage feedback signal port. A first output end of the power circuit module 120 is also connected to the first end of the sampling circuit module 122, and a second end of the sampling circuit module 122 is grounded.

[0059] The power circuit module 120 can be used as a load to simulate a CPU load board. In one example, the load size of the power circuit module 120 is adjustable. The first input end of the power circuit module 120 is connected to the load control signal port on the cable interface, and the output resistance of the power circuit module 120 can be adjusted by the load control signal.

[0060] The second input end of the power circuit module 120 is connected to the first pin in the pin array on the back side of the simulated CPU load board 12. The first pin is used to connect to the second pin on the CPU chip seat on the motherboard under test. The second pin is the pin corresponding to the output voltage signal of the power supply under test. In this way, the output voltage of the power supply under test can be loaded onto the power circuit module 120, so that the corresponding current can be generated on the power circuit module 120.

[0061] The first output terminal of the power circuit module 120 is also connected to the first terminal of the sampling circuit module 122. In this way, the current of the power circuit module 120 is equal to the current in the sampling circuit module 122. The current feedback signal port includes a first voltage feedback signal port and a second voltage feedback signal port. The first terminal of the sampling circuit module 122 is connected to the first voltage feedback signal port, and the second terminal of the sampling circuit module 122 is connected to the second voltage feedback signal port. The first voltage feedback signal port and the second voltage feedback signal port respectively receive the voltages VCC_FB_P and VCC_FB_N at both ends of the sampling circuit module 122. These two voltages are amplified by the second operational amplifier to an input range suitable for the A / D conversion module. The A / D converter converts the obtained analog voltage difference into a digital signal and transmits it to the FPGA via the SMBus. The FPGA calculates the current value according to Ohm's law and transmits it to the host computer via the USB interface.

[0062] See also Figure 6 The power circuit module 120 can use an adjustable heating block as a power device, and can also use an adjustable power resistor as a power device. In one example, the power circuit module 120 includes: a metal-oxide semiconductor field-effect transistor 120a, the gate of the metal-oxide semiconductor field-effect transistor 120a is connected to the load control signal port on the cable interface, the drain of the metal-oxide semiconductor field-effect transistor 120a is used to be connected to the first pin in the back pin array of the simulated CPU load board, and the source of the metal-oxide semiconductor field-effect transistor 120a is connected to the sampling circuit module, wherein the fourth pin is used to be connected to the pin on the CPU chip seat on the motherboard under test, corresponding to the voltage signal of the power supply.

[0063] Metal-Oxide-Semiconductor Field-Effect Transistor 120a, also known as MOSFET, is a field-effect transistor widely used in analog and digital circuits. MOSFETs have three electrodes: a gate, a source, and a drain. MOSFETs are power devices with variable resistance capabilities.

[0064] The load control signal port is connected to the gate of the power device MOS tube (taking N-channel as an example), the voltage VCC output by the motherboard VR is connected to the drain of the MOSFET, and the source is connected to the sampling circuit module.

[0065] According to the characteristics of MOSFET, when Vgs (the voltage between the gate and the source) increases, Rds (the resistance between the drain and the source) will decrease. When the VCC applied to the drain remains unchanged, Id (flowing through the drain to the source, and then flowing to GND through the sampling resistor) becomes larger. In this way, by controlling the gate voltage, the resistance between the drain and the source can be controlled, and the current flowing from the drain to the source can be obtained.

[0066] This allows the MOSFET resistance to be adjusted while the VCC voltage remains constant, allowing for different current draws and power supply testing. For example, the load resistance of a power device can be quickly adjusted to perform a power supply response test.

[0067] See also Figure 6 In another example, the sampling circuit module 122 includes: a sampling resistor, Figure 7 For example, the sampling resistors include a sampling resistor RS1, a sampling resistor RS2, a sampling resistor RS3, and a sampling resistor RS4. The first ends of the sampling resistors are respectively connected to the first output end of the power circuit module and the first voltage feedback signal port, the second ends of the sampling resistors are grounded, and the second ends of the sampling resistors are also connected to the second voltage feedback signal port.

[0068] The sampling resistor may be a precision resistor with a small resistance value, and the first voltage feedback signal port and the second voltage feedback signal port receive the voltage across the sampling resistor.

[0069] In order to carry out high current testing, multiple groups of power devices on the simulated CPU load board are required. The specific number of groups can be determined according to the power supply characteristics of the specific simulated CPU model and the current capacity of the specific power devices.

[0070] In another example, the size of the printed circuit board is equal to the size of the real CPU, and the real CPU is the CPU corresponding to the tested motherboard during actual use; the number of power circuit modules is equal to the number of grain dies on the real CPU, and the position of the power circuit module on the printed circuit board corresponds to the position of the grain dies on the real CPU on the real CPU.

[0071] A die is a continuous piece of semiconductor material (usually silicon) that can contain at least one CPU core. Integrated circuits are typically fabricated in batches on large semiconductor wafers through multiple steps, including photolithography. These wafers are then divided into smaller, square-shaped pieces, each called a die.

[0072] The size of the printed circuit board is equal to that of a real CPU. When using the test device of this embodiment for testing, a simulated CPU load can be installed in the CPU chip mounting socket on the motherboard under test; the number of power circuit modules is equal to the number of grain dies on a real CPU, and the position of the power circuit module on the printed circuit board corresponds to the position of the grain dies on the real CPU. In this way, the layout of the simulated CPU load can be made more similar to that of a real CPU.

[0073] Reference Figure 7 The multiple power device modules on the front of the simulated CPU load board simulate the actual CPU design and are placed according to the die layout on the actual CPU chip. Taking a CPU chip with four die as an example, it is divided into four blocks (the four rectangular vertical blocks in the middle), each of which includes two power modules, specifically two MOSFET modules, to simulate the four die of the CPU.

[0074] Another embodiment of the present application is substantially the same as the above embodiment, except that the analog CPU load board of this embodiment further comprises: a power supply voltage setting pin, a power supply voltage feedback pin, and a power supply control signal pin, wherein the power supply voltage setting pin, the power supply voltage feedback pin, and the power supply control signal pin are provided on the front surface of the analog CPU load board, the power supply voltage setting signal port on the cable interface is connected to the power supply voltage setting pin via the cable, the power supply voltage feedback port on the cable interface is connected to the power supply voltage feedback pin, and the power supply control signal port on the cable interface is connected to the power supply control signal pin via the cable;

[0075] The power supply voltage setting pin, the power supply voltage feedback pin and the control signal pin are respectively connected to the second pin, the third pin and the fourth pin in the pin array on the back of the CPU load board in a one-to-one correspondence; the second pin, the third pin and the fourth pin are respectively used to be connected to the CPU chip seat on the tested motherboard and the pins corresponding to the voltage setting interface, the power supply voltage feedback interface and the control signal interface of the power supply on the tested motherboard in a one-to-one correspondence.

[0076] The power supply voltage setting pin is connected to the power supply voltage setting signal port on the cable interface. In addition, the power supply voltage setting pin is connected to a second pin in the pin array on the back of the CPU load board. The second pin is used to connect to a pin on the CPU chip seat on the motherboard under test, corresponding to the power supply voltage setting interface on the motherboard under test.

[0077] The power supply voltage feedback pin is connected to the power supply voltage feedback port on the cable interface. In addition, the power supply voltage feedback pin is connected to the third pin in the pin array on the back of the CPU load board. The third pin is used to connect to the interface on the CPU chip seat on the tested motherboard, corresponding to the power supply voltage feedback interface on the tested motherboard.

[0078] The power control signal pin is connected to the power control signal port on the cable interface. In addition, it is connected to the fourth pin in the pin array on the back of the CPU load board. The fourth pin is used to connect to the CPU chip seat on the tested motherboard and the pin corresponding to the control signal interface on the tested motherboard.

[0079] An embodiment of the present application is basically the same as the above embodiment, except that the testing device of this embodiment further includes: a host computer connected to the first end of the USB interface.

[0080] The host computer is primarily used to set configuration commands, receive feedback signals, analyze test results, and present them to the user. The host computer is designed with configuration settings that limit the default settings of basic system parameters such as the maximum input voltage and current based on the actual CPU and power supply needs to prevent incorrect operation and over-limit settings during use.

[0081] Another embodiment of the present application is basically the same as the above embodiment, except that the testing device of this embodiment further includes: a heat sink, which is arranged on the simulated CPU load board.

[0082] A radiator is installed on the simulated CPU load board. In this way, during the operation of the test equipment, the heat generated by the simulated CPU load board can be taken away by the radiator to reduce the temperature of the simulated CPU load board. In one example, the radiator can be a radiator that is matched with the motherboard under test. In this way, the use of additional customized cooling equipment can be avoided, which increases the cost of the test equipment.

[0083] See also Figure 1 A motherboard adjustable power supply test system according to an embodiment of the present application includes: a host computer 2, a motherboard 3, and the motherboard adjustable power supply test device 1 of the above embodiment; the host computer 2 is connected to the USB interface 104 in the motherboard adjustable power supply test device 1, and the simulated CPU load board 12 in the motherboard adjustable power supply test device 1 is installed on the CPU chip seat on the motherboard.

[0084] The host computer 2 can be a computer that can directly issue control commands and display various signal changes on the screen. Software can be installed on the host computer; the host computer software is application software installed on a PC operating system, such as a PC. It is mainly used to set configuration commands, receive feedback signals, analyze test results, and present them to the user.

[0085] The host computer software has configuration setting parameters, that is, the basic system parameters such as the maximum value of the input voltage and current are limited by default according to the actual needs of the CPU and VR power supply to prevent incorrect operation during use and excessive settings.

[0086] The motherboard 3, also known as the mainboard, systemboard, or motherboard, is installed in the computer's main chassis and is one of the most basic and important components of the computer. A motherboard is typically a rectangular circuit board that houses the computer's main circuitry, typically including the BIOS chip, I / O control chip, keyboard and panel control switch interface, indicator light connectors, expansion slots, the motherboard, DC power supply connectors for plug-in cards, and a chip holder for mounting the CPU chip. The CPU chip holder is used to mount the CPU chip. The simulated CPU load board in the motherboard adjustable power supply test device of this embodiment is mounted on the CPU chip holder on the motherboard.

[0087] In this embodiment, the host computer is connected to the USB interface in the mainboard adjustable power supply test device, and the simulated CPU load board in the mainboard adjustable power supply test device is installed on the CPU chip seat on the mainboard. The control board in the adjustable power supply test device uses FPGA to implement signal processing, and the FPGA can form various interfaces through its I / O, so that the FPGA has the flexibility of input and output interface design. Therefore, the VR serial bus interface can be flexibly implemented, which facilitates improving the flexibility of the test system design of this embodiment and further facilitates reducing the cost of the test system of this embodiment.

[0088] Figure 8 This is a flow chart of a method for testing a motherboard adjustable power supply according to an embodiment of the present application. Figure 8 The motherboard adjustable power supply testing method of this embodiment includes:

[0089] Step 101: The host computer sends a voltage setting instruction, which includes a preset voltage value.

[0090] The host computer can refer to a computer that can directly issue control commands and display various signal changes on the screen. Software can be installed on the host computer; host computer software is application software installed on a PC operating system, such as a PC, and is primarily used to set configuration commands, receive feedback signals, analyze test results, and present them to the user. The software installed on the host computer in this embodiment is equipped with configuration setting parameters. This means that basic system parameters such as the maximum input voltage and current are set by default based on the actual needs of the CPU and VR power supply to prevent incorrect operation and excessive settings during use.

[0091] The preset voltage value is the voltage value that the motherboard's adjustable power supply is expected to output.

[0092] Step 102: The field programmable gate array module parses the voltage setting instruction to obtain the preset voltage value.

[0093] The Field Programmable Gate Array (FPGA) is a further development of programmable devices such as PALs and GALs. It emerged as a semi-custom circuit within the field of application-specific integrated circuits (ASICs). As the core chip on the control board, the FPGA offers greater design flexibility than a processor.

[0094] Step 103: The field programmable logic gate array module sends the preset voltage value to the adjustable power supply on the mainboard via the VR serial bus.

[0095] An adjustable power supply (PS) is installed on the motherboard and provides power to the CPU core. It contains a power controller that adjusts the power supply voltage. The adjustable power supply reads the CPU pin status, which indicates voltage settings, based on the CPU's commands. Based on this voltage, the adjustable power supply adjusts its internal parameters to provide the output voltage needed to power the CPU core. In this embodiment, the adjustable power supply is used to power a simulated CPU load board.

[0096] The FPGA transmits the preset voltage value to the adjustable power supply of the mainboard through the VR serial bus.

[0097] Step 104: The adjustable power supply on the mainboard receives the preset voltage value and sets the output voltage value of the adjustable power supply according to the preset voltage value to power the simulated CPU load board.

[0098] The adjustable power supply adjusts the internal parameters of the power supply according to the received preset voltage value, so that the power supply controller adjusts the output voltage value of the adjustable power supply.

[0099] Step 105: The field programmable logic gate array module receives a voltage feedback signal from the mainboard adjustable power supply, and determines an output voltage value of the mainboard adjustable power supply according to the voltage feedback signal.

[0100] The voltage feedback signal on the mainboard's adjustable power supply monitors the voltage signal output by the adjustable power supply (VR). The voltage value corresponding to this signal is within the receiving range of the analog / digital conversion module (A / D module) and does not require amplification by an operational amplifier. It is converted into a digital signal through the analog / digital conversion module and then sent to the FPGA through the SMBus bus for calculation and processing to determine whether the output voltage of the VR module is correct. The result is then reported to the host computer through the USB interface for analysis and processing.

[0101] Step 106: The host computer sends a current setting instruction, wherein the current setting instruction includes a preset current value.

[0102] The preset current value is the current value expected to simulate the CPU load board.

[0103] Step 107: The field programmable logic gate array module parses the current setting instruction to obtain the preset current value.

[0104] Step 108: The field programmable logic gate array module sends a load control signal to the simulated CPU load board according to the preset current value to adjust the resistance of the simulated CPU load board.

[0105] When the voltage loaded on the simulated CPU load board remains unchanged, different currents can be drawn by adjusting the resistance value of the simulated CPU load board.

[0106] Step 109: The field programmable logic gate array module receives the current feedback signal on the simulated CPU load board, and determines the current on the simulated CPU load board according to the current feedback signal.

[0107] The current feedback signal corresponds to the actual current on the simulated CPU load board, and the current on the simulated CPU load board can be determined through the current feedback signal.

[0108] Step 110 : Determine the power supply characteristics of the mainboard adjustable power supply based on the output voltage value of the mainboard adjustable power supply and the current on the simulated CPU load board.

[0109] In this embodiment, a voltage setting instruction is sent by a host computer, and the instruction includes a preset voltage value; the field programmable logic gate array module parses the voltage setting instruction to obtain the preset voltage value; the field programmable logic gate array module sends the preset voltage value to the adjustable power supply on the mainboard through the VR serial bus; the adjustable power supply on the mainboard receives the preset voltage value, and sets the output voltage value of the adjustable power supply according to the preset voltage value to power the analog CPU load board; the field programmable logic gate array module receives the voltage feedback signal on the mainboard adjustable power supply, and determines the output voltage value of the mainboard adjustable power supply according to the voltage feedback signal; the host computer sends a current setting instruction, and the current setting instruction includes a preset current value; the field programmable logic gate array module parses the current setting instruction to obtain the preset current value; the field programmable logic gate array module Based on the preset current value, the programmable logic gate array module sends a load control signal to the simulated CPU load board to adjust the resistance of the simulated CPU load board. The field programmable logic gate array module receives a current feedback signal from the simulated CPU load board and determines the current flowing through the simulated CPU load board based on the current feedback signal. The power supply characteristics of the motherboard adjustable power supply are determined based on the output voltage value of the motherboard adjustable power supply and the current flowing through the simulated CPU load board. Because FPGAs are used for signal processing and can form various interfaces through their I / O, FPGAs offer flexibility in input and output interface design. Therefore, VR serial bus interfaces can be flexibly implemented. This improves the flexibility of the test method of this embodiment and further reduces the cost of completing power supply characteristic testing using this test method.

[0110] Another embodiment of the present application is substantially the same as the above embodiment, except that the preset current in this embodiment includes a first preset current value and a second preset current value.

[0111] The field programmable logic gate array module parses the current setting instruction and obtains the preset current value (step 107). Specifically, the field programmable logic gate array module parses the current setting instruction and obtains the first preset current value and the second preset current value.

[0112] The first preset current value and the second preset current value are different in magnitude.

[0113] The field programmable logic gate array module sends a load control signal to the simulated CPU load board according to the preset current value to adjust the resistance of the simulated CPU load board; the field programmable logic gate array module receives a current feedback signal on the simulated CPU load board and determines the current on the simulated CPU load board according to the current feedback signal (steps 108 and 109), specifically as follows: the field programmable logic gate array module sends a first load control signal to the simulated CPU load board according to the first preset current value to adjust the resistance of the simulated CPU load board; the field programmable logic gate array module receives the first current feedback signal on the simulated CPU load board and determines the first current on the simulated CPU load board according to the first current feedback signal; the field programmable logic gate array module sends a second load control signal to the simulated CPU load board according to the second preset current value to adjust the resistance of the simulated CPU load board; the field programmable logic gate array module receives the second current feedback signal on the simulated CPU load board and determines the second current on the simulated CPU load board according to the second current feedback signal.

[0114] The power supply characteristics of the mainboard adjustable power supply are determined based on the output voltage value of the mainboard adjustable power supply and the current on the simulated CPU load board (step 110). Specifically, the power supply characteristics of the mainboard adjustable power supply are determined based on the output voltage value of the mainboard adjustable power supply and the first current and the second current on the simulated CPU load board.

[0115] This embodiment can test two or more currents under one voltage, and can conveniently and quickly accumulate data for determining the power supply characteristics of the adjustable power supply.

[0116] Another embodiment of the present application is basically the same as the above embodiment, except that the testing method of this embodiment, after determining the output voltage value on the mainboard adjustable power supply according to the voltage feedback signal and before the host computer sends the current setting instruction, further includes: the field programmable logic gate array module determines whether the output voltage value is within a preset power supply voltage range; if so, executes the step of the host computer sending the current setting instruction; if not, ends the process.

[0117] By checking whether the output voltage value is within the preset power supply voltage range before the host computer sends the current setting instruction, the risk of damage to the test equipment due to incorrect operation during use can be prevented.

[0118] The mainboard adjustable power supply testing method in the above embodiment can be applied to a mainboard adjustable power supply testing device and / or a mainboard adjustable power supply testing system.

[0119] Figure 9 This is a flow chart of a specific embodiment of the testing method of the present application, such as Figure 9 shown.

[0120] Step 1: The host computer sends a command to power on the motherboard and sets the test voltage range, and then sends it to the FPGA.

[0121] Step 2: The FPGA sends a power control signal to the motherboard's adjustable power supply, thereby setting the motherboard's VR output voltage.

[0122] Step 3: The FPGA reads the power supply voltage feedback signal sent by the mainboard adjustable power supply, and determines whether the voltage value corresponding to the voltage feedback signal is normal.

[0123] Step 4: If the voltage value is normal, adjust the load value (current value), record the voltage and current values, and go to step 6.

[0124] Step 5: If the voltage value is abnormal, end the process.

[0125] Step 6: Determine whether the next load value adjustment is required under the same voltage.

[0126] Step 7: If necessary, adjust the load value and record the voltage and current values.

[0127] Step 8: If it is not necessary, determine whether the voltage test within the voltage test range has been completed.

[0128] Step 9: If the test is not completed, execute steps 2-8 again; if the test is completed, end the process.

[0129] It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a..." does not exclude the presence of additional identical elements in the process, method, article, or device comprising the element.

[0130] Each embodiment in this specification is described in a related manner. The same or similar parts between the embodiments can be referred to each other. Each embodiment focuses on the differences from other embodiments.

[0131] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in the present application should be included in the scope of protection of the present application. Therefore, the scope of protection of the present application should be based on the scope of protection of the claims.

Claims

1. A motherboard adjustable power supply test device, characterized in that: include: A control board and a simulated CPU load board, wherein the control board and the simulated CPU load board are connected via a signal cable, the control board having a host computer connection interface for connecting to a host computer, and the back of the simulated CPU load board having a pin array for electrically connecting to a CPU chip seat on a motherboard under test; the control board is used to control the load size of the simulated CPU load board; The control board includes: a field programmable logic gate array module, a digital-to-analog conversion module, an analog-to-digital conversion module, a cable interface, and a USB interface; the field programmable logic gate array module is connected to the input end of the digital-to-analog conversion module and the output end of the analog-to-digital conversion module via a system management bus, the output end of the digital-to-analog conversion module is connected to the input end of a first operational amplifier, the output end of the first operational amplifier is connected to the load control signal port on the cable interface; the current feedback signal port and the power supply voltage feedback signal port on the cable interface are connected to the input end of a second operational amplifier, and the output end of the second operational amplifier is connected to the input end of the analog-to-digital conversion module; The voltage setting signal port of the field programmable logic gate array module is connected to the voltage setting signal port of the power supply on the cable interface via a VR serial bus, and the power control signal port of the field programmable logic gate array module is connected to the power control signal port on the cable interface via a control signal line; The first end of the USB interface is used to connect to the host computer, and the second end of the USB interface is connected to the field programmable logic gate array.

2. The testing device according to claim 1, characterized in that The field programmable logic gate array module includes: a central control submodule, a USB interface protocol submodule, a VR serial bus interface protocol submodule, a system management bus interface protocol submodule, and a control processing signal submodule. The central control submodule is communicatively connected to the USB interface protocol submodule, the VR serial bus interface protocol submodule, the system management bus interface protocol submodule, and the control processing signal submodule respectively; the USB interface protocol submodule is connected to the USB interface, the VR serial bus interface protocol submodule is connected to the VR serial bus, the system management bus interface protocol submodule is connected to the system management bus, and the control processing signal submodule is connected to the control signal line.

3. The testing device according to claim 1, wherein: The simulated CPU load board includes a printed circuit board, a power circuit module and a sampling circuit module, wherein the power circuit module and the sampling circuit module are arranged on the printed circuit board; The first input end of the power circuit module is connected to the load control signal port on the cable interface, and the second input end of the power circuit module is connected to the first pin in the pin array on the back side of the simulated CPU load board, the first pin is used to connect to the pin on the CPU chip seat on the motherboard under test, and the pin is the pin corresponding to the output voltage signal of the power supply under test; The current feedback signal port includes a first voltage feedback signal port and a second voltage feedback signal port. The first end of the sampling circuit module is connected to the first voltage feedback signal port, and the second end of the sampling circuit module is connected to the second voltage feedback signal port. The first output end of the power circuit module is also connected to the first end of the sampling circuit module, and the second end of the sampling circuit module is grounded.

4. The testing device according to claim 3, characterized in that The analog CPU load board further includes: a power supply voltage setting pin, a power supply voltage feedback pin, and a power supply control signal pin. The power supply voltage setting pin, the power supply voltage feedback pin, and the power supply control signal pin are arranged on the front surface of the analog CPU load board. The power supply voltage setting signal port on the cable interface is connected to the power supply voltage setting pin via the cable. The power supply voltage feedback port on the cable interface is connected to the power supply voltage feedback pin. The power supply control signal port on the cable interface is connected to the power supply control signal pin via the cable. The power supply voltage setting pin, the power supply voltage feedback pin and the control signal pin are respectively connected to the second pin, the third pin and the fourth pin in the pin array on the back of the CPU load board in a one-to-one correspondence; the second pin, the third pin and the fourth pin are respectively used to be connected to the CPU chip seat on the tested motherboard and the pins corresponding to the voltage setting interface, the power supply voltage feedback interface and the control signal interface of the power supply on the tested motherboard in a one-to-one correspondence.

5. The testing device according to claim 3, characterized in that: The power circuit module includes a metal-oxide semiconductor field-effect transistor, wherein the gate of the metal-oxide semiconductor field-effect transistor is connected to the load control signal port on the cable interface, the drain of the metal-oxide semiconductor field-effect transistor is used to be connected to the first pin in the back pin array of the analog CPU load board, and the source of the metal-oxide semiconductor field-effect transistor is connected to the sampling circuit module.

6. The testing device according to claim 3, characterized in that: The sampling circuit module includes: a sampling resistor, wherein a first end of the sampling resistor is respectively connected to the first output end of the power circuit module and the first voltage feedback signal port, a second end of the sampling resistor is grounded, and the second end of the sampling resistor is also connected to the second voltage feedback signal port.

7. The testing device according to claim 3, characterized in that: The size of the printed circuit board is equal to the size of the real CPU, and the real CPU is the CPU corresponding to the tested motherboard during actual use; the number of the power circuit modules is equal to the number of grain dies on the real CPU, and the position of the power circuit module on the printed circuit board corresponds to the position of the grain dies on the real CPU on the real CPU.

8. The testing device according to claim 1, wherein: Also includes: A host computer is connected to the first end of the USB interface.

9. The testing device according to claim 1, wherein: Also includes: A radiator is arranged on the simulated CPU load board.

10. A motherboard adjustable power supply test system, characterized in that: include: A host computer, a mainboard, and the mainboard adjustable power supply test device according to any one of claims 1 to 9; The host computer is connected to a USB interface in the mainboard adjustable power supply test device, and the simulated CPU load board in the mainboard adjustable power supply test device is installed on a CPU chip seat on the mainboard.

11. A method for testing a motherboard adjustable power supply, characterized in that: include: The host computer sends a voltage setting instruction, which includes a preset voltage value; The field programmable logic gate array module parses the voltage setting instruction to obtain the preset voltage value; The field programmable logic gate array module sends the preset voltage value to the adjustable power supply on the mainboard via the VR serial bus; The adjustable power supply on the mainboard receives the preset voltage value and sets the output voltage value of the adjustable power supply according to the preset voltage value to power the simulated CPU load board; The field programmable logic gate array module receives a voltage feedback signal from the mainboard adjustable power supply, and determines an output voltage value of the mainboard adjustable power supply according to the voltage feedback signal; The host computer sends a current setting instruction, wherein the current setting instruction includes a preset current value; The field programmable logic gate array module parses the current setting instruction to obtain the preset current value; The field programmable logic gate array module sends a load control signal to the analog CPU load board according to the preset current value to adjust the resistance of the analog CPU load board; The field programmable logic gate array module receives a current feedback signal on the simulated CPU load board, and determines a current on the simulated CPU load board according to the current feedback signal; The power supply characteristics of the mainboard adjustable power supply are determined according to the output voltage value of the mainboard adjustable power supply and the current on the simulated CPU load board.

12. The testing method according to claim 11, characterized in that: The preset current includes a first preset current value and a second preset current value; the field programmable logic gate array module parses the current setting instruction to obtain the preset current value, specifically: the field programmable logic gate array module parses the current setting instruction to obtain the first preset current value and the second preset current value; The field programmable logic gate array module sends a load control signal to the analog CPU load board according to the preset current value to adjust the resistance of the analog CPU load board; the field programmable logic gate array module receives a current feedback signal on the analog CPU load board and determines the current on the analog CPU load board according to the current feedback signal, specifically: the field programmable logic gate array module sends a first load control signal to the analog CPU load board according to a first preset current value to adjust the resistance of the analog CPU load board; the field programmable logic gate array module receives a first current feedback signal on the analog CPU load board and determines a first current on the analog CPU load board according to the first current feedback signal; the field programmable logic gate array module sends a second load control signal to the analog CPU load board according to a second preset current value to adjust the resistance of the analog CPU load board; the field programmable logic gate array module receives a second current feedback signal on the analog CPU load board and determines a second current on the analog CPU load board according to the second current feedback signal; The determining of the power supply characteristics of the mainboard adjustable power supply based on the output voltage value of the mainboard adjustable power supply and the current on the simulated CPU load board is specifically as follows: determining the power supply characteristics of the mainboard adjustable power supply based on the output voltage value of the mainboard adjustable power supply and the first current and the second current on the simulated CPU load board.

13. The testing method according to claim 11, characterized in that: After determining the output voltage value of the mainboard adjustable power supply according to the voltage feedback signal and before the host computer sends the current setting instruction, the method further includes: The field programmable logic gate array module determines whether the output voltage value is within a preset power supply voltage range. If so, the step of the host computer sending a current setting instruction is executed; if not, the process ends.

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