A power tube test crimping device

By designing a power tube test crimping device with high-temperature resistant materials and a double-layer crimping structure, the sintering problem during power tube testing is solved, the test efficiency and heat dissipation effect are improved, and the stable RF performance is ensured.

CN112540201BActive Publication Date: 2025-09-23GUOBO ELECTRONICS CO LTD +1
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Patent Information

Application Number
CN202011430353.7
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2020-12-07
Publication Date
2025-09-23
Estimated Expiration
2040-12-07

AI Technical Summary

Technical Problem

In the prior art, power tubes are prone to sintering during testing, and the test crimping device has high requirements for heat dissipation and test efficiency, which affects the radio frequency performance.

Method used

A power tube test crimping device was designed. It uses high-temperature resistant materials and a double-layer crimping structure, combined with spring pressure feet, to achieve a tight fit between the power tube and the test base. Heat dissipation holes are set in the device body to improve test efficiency and heat dissipation effect.

Benefits of technology

It effectively reduces the risk of power tube sintering, improves test efficiency, and avoids the impact on RF performance through self-heating function.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention relates to a power tube test crimping device, comprising a test base, a groove being provided on the surface of the test base, and a power tube being placed in the groove; a test crimping device body is covered on the surface of the power tube, and the test crimping device body presses the pins and tube cap of the power tube to achieve fixation of the power tube in the groove on the surface of the test base; the test crimping device body provided in the present application can achieve close fit between the power tube and the test base, thereby improving test efficiency; at the same time, the test crimping device body can self-dissipate heat to avoid affecting the radio frequency performance of the power tube.
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Description

Technical Field

[0001] The invention relates to a power tube testing and crimping device, belonging to the technical field of wireless communications. Background Art

[0002] With the development of wireless communication technology, RF power amplifiers have become a key technology in wireless transmission systems. On the one hand, they need to output high power to external loads, and on the other hand, their own energy consumption also poses a challenge to the entire wireless communication system. Therefore, how to improve the efficiency of RF power amplifiers and reduce their energy consumption is crucial to the stability and sustainability of the entire system.

[0003] The design performance of power device tubes is the core of RF power amplifiers. The current mainstream design uses gallium nitride electron mobility transistors. Due to their wide bandgap semiconductor characteristics, they have good linearity, power and bandwidth. However, the test power tubes on the market cannot be sintered during testing in some occasions, and have high requirements for pressing. The use of special test pressing devices is of great significance to improving heat dissipation and enhancing test efficiency. Summary of the Invention

[0004] The present invention provides a power tube test crimping device, which can achieve close fitting of the power tube and the test base, thereby improving the test efficiency. At the same time, the test crimping device body can self-dissipate heat to avoid affecting the radio frequency performance of the power tube.

[0005] The technical solution adopted by the present invention to solve its technical problem is:

[0006] A power tube test crimping device includes a test base, a groove is provided on the surface of the test base, and the power tube is placed in the groove;

[0007] A test crimping device body is provided on the surface of the power tube, and the test crimping device body presses the pins and cap of the power tube to fix the power tube in the groove on the surface of the test base;

[0008] As a further preferred embodiment of the present invention, the aforementioned test crimping device body comprises an upper laminate block and a lower laminate block, wherein the upper laminate block is arranged on the surface of the lower laminate block;

[0009] As a further preferred embodiment of the present invention,

[0010] The aforementioned upper laminate block includes an upper laminate block seat and an upper laminate block plate. The upper laminate block seat is arranged in a square structure, and the two symmetrical side walls of the upper laminate block seat are recessed toward the center of the square structure to form a U shape; through upper screw holes are provided at the four corners of the upper laminate block seat, and through holes are provided at the center positions of the other two side edges of the upper laminate block seat respectively; six outer edge screw holes are also provided on the upper laminate block seat, and the six outer edge screw holes are distributed on a circumference with the center of the upper laminate block seat as the center;

[0011] The shape of the upper laminate plate matches the upper laminate seat and is covered on the surface of the upper laminate seat. Six upper laminate plate screw holes are provided on the upper laminate plate. The distribution positions of the six upper laminate plate screw holes match the positions of the outer edge screw holes. Among them, the four upper laminate plate screw holes close to the non-recessed side of the upper laminate plate do not penetrate;

[0012] As a further preferred embodiment of the present invention, the aforementioned lower laminate block is also arranged in a square structure, and its two symmetrical side walls protrude outward to form large turnbuckles for fixing the lower laminate block to the test base, and the large turnbuckles correspond to the concave portion of the upper laminate block seat;

[0013] Six through holes are provided on the lower laminate block, and their distribution positions match the screw holes of the upper laminate block plate;

[0014] The four corners of the lower layer block are provided with lower layer screw holes that are not through, and the upper layer screw holes match the positions of the lower layer screw holes;

[0015] As a further preferred embodiment of the present invention, the six outer edge screw holes on the upper laminated block seat are drilled starting from the bottom of the upper laminated block seat, the outer edge screw holes do not penetrate the upper laminated block seat, and the length of their closed ends from the surface of the upper laminated block seat is one quarter of the height of the entire upper laminated block seat;

[0016] As a further preferred embodiment of the present invention, the pins of the power tube include four tube leg pins, and springs are respectively arranged at the positions of the four tube leg pins and the two tube cap positions of the power tube. Screw sleeves are sleeved on the springs to form spring pressure feet. The positions of the springs are matched with the six through holes opened on the lower laminate block. After the springs pass through the through holes, they are embedded in the matching outer edge screw holes.

[0017] As a further preferred embodiment of the present invention, the height of the spring pressure foot at the tube cap position is 2 mm lower than the height of the spring pressure foot at the tube leg position;

[0018] As a further preferred embodiment of the present invention, the upper laminate block and the lower laminate block are both made of acrylic material.

[0019] Through the above technical solution, compared with the existing technology, the present invention has the following beneficial effects:

[0020] 1. The test crimping device provided by the present invention is made of high-temperature resistant material, which can reduce the risk of sintering of the power tube during testing. Heat dissipation holes are also provided in the structure itself to achieve heat dissipation effect, and the RF performance of the power tube will not be affected by overheating.

[0021] 2. The test crimping device provided by the present invention adopts a double-layer crimping setting, which can tightly fit the power tube and the test base, and at the same time fit the pins of the power tube through the spring pressure foot, thereby improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] The present invention will be further described below with reference to the accompanying drawings and examples.

[0023] Figure 1 This is an overall schematic diagram of the test crimping device provided by the present invention fixing the power tube on the test base;

[0024] Figure 2a-2b This is a schematic diagram of the structure of the power tube provided by the present invention, wherein Figure 2a For a three-dimensional image, Figure 2b It is a top view;

[0025] Figure 3a-Figure 3b This is a schematic diagram of the test base structure provided by the present invention, wherein Figure 3a This is a three-dimensional diagram of the test base. Figure 3b This is a schematic diagram of the structure in which the power tube is installed in the groove of the test base;

[0026] Figure 4a-4b This is a schematic diagram of the test crimping device provided by the present invention, wherein Figure 4a For a three-dimensional image, Figure 4b is a side view;

[0027] Figure 5a-5b This is a schematic diagram of the upper layer of the test crimping device body provided by the present invention, wherein Figure 5a Schematic diagram of the upper block seat structure. Figure 5b Schematic diagram of the upper laminated board;

[0028] Figure 6a-6b This is a schematic diagram of the upper layer of the test crimping device body provided by the present invention, wherein Figure 6a For a three-dimensional image, Figure 6b It is a top view;

[0029] Figure 7a-7b This is a schematic diagram of the spring presser foot structure provided by the present invention, wherein Figure 7a For a three-dimensional image, Figure 7b This is a top view.

[0030] In the figure: 101 is the test crimping device body, 102 is the test base, 103 is the power tube, 104 is the pin, 105 is the upper pressing block, 106 is the lower pressing block, 107 is the through hole, 108 is the outer edge screw hole, 109 is the upper screw hole, 110 is the upper pressing block plate screw hole, 111 is the screw sleeve, 112 is the large turnbuckle, and 113 is the spring. DETAILED DESCRIPTION

[0031] The present invention will now be described in further detail with reference to the accompanying drawings, which are simplified schematic diagrams that illustrate the basic structure of the present invention in a schematic manner.

[0032] In the prior art, when a power tube is placed in a groove of a test base, welding is conventionally used to integrate the power tube and the test base. However, in some cases, sintering cannot occur during power tube testing, and high requirements are placed on the crimping. Therefore, a crimping device that matches the power tube needs to be designed. Figure 1 As shown, the present application provides a power tube test crimping device with matching degree, including a test base, a groove is provided on the surface of the test base 102, and the power tube 103 is placed in the groove; a test crimping device body 101 is covered on the surface of the power tube, and the test crimping device body presses the pin 104 of the power tube to achieve the fixation of the power tube in the groove on the surface of the test base; Figure 2a-2b From the schematic diagram of the power tube, we can see that the power tube is divided into three parts: source, gate, and drain. From the appearance provided in the figure, the power tube has four tube leg pins, so it is necessary to press the four pins at the same time to ensure that each pin fits the test frame to maximize performance.

[0033] Figure 3a-Figure 3b As can be seen from the schematic diagram of the test base structure, a groove is provided on the surface of the test base. In the preferred embodiment, the groove depth is 2 mm, and the groove width is 0.1 mm larger than the width of the power tube, thereby ensuring that the power tube can be placed in the groove. Screw holes are provided at both ends of the groove, and the surface of the test base is a copper-clad matching circuit.

[0034] Now we will give a detailed description of each part of the test crimping device body. Figure 4a-4b As shown, the test crimping device body includes an upper lamination block 105 and a lower lamination block 106, and the upper lamination block is arranged on the surface of the lower lamination block. Figure 5a-5b The schematic diagram of the specific structure of the upper layer block is divided into two parts. Figure 5a The upper block seat and Figure 5b The upper laminated block plate, the upper laminated block seat is arranged in a square structure, and the two symmetrical side walls of the upper laminated block seat are recessed toward the center of the square structure to form a U shape; through upper screw holes 109 are provided at the four corner positions of the upper laminated block seat, which are suitable for M3 screws, and through holes 107 are provided at the center positions of the other two side edges of the upper laminated block seat to play a role in heat dissipation; six outer edge screw holes 108 are also provided on the upper laminated block seat, which are suitable for M4 screws. The six outer edge screw holes are distributed on the circumference of a circle with the center of the upper laminated block seat as the center. It should be noted that the six outer edge screw holes on the upper laminated block seat are set starting from the bottom of the upper laminated block seat, and the outer edge screw holes do not penetrate the upper laminated block seat. The length of the closed end from the surface of the upper laminated block seat is one-fourth of the height of the entire upper laminated block seat;

[0035] The shape of the upper laminate plate matches the upper laminate seat, and is covered on the surface of the upper laminate seat. Six upper laminate plate screw holes 110 are provided on the upper laminate plate. The distribution positions of the six upper laminate plate screw holes match the positions of the outer edge screw holes, among which the four upper laminate plate screw holes close to the non-recessed side of the upper laminate plate are not penetrated.

[0036] Figure 6a-6b A schematic diagram of the structure of the lower laminate block is provided. The lower laminate block is also arranged in a square structure. Its two symmetrical side walls protrude outward to form large screw buckles 112, which are used to fix the lower laminate block to the test base. The large screw buckles correspond to the recessed portion of the upper laminate block seat.

[0037] Six through holes are provided on the lower laminate block, and their distribution positions match the screw holes of the upper laminate block plate;

[0038] The four corners of the lower laminate are provided with lower screw holes that are not penetrated, and the upper screw holes match the positions of the lower screw holes. The upper laminate and the lower laminate are fixed together by inserting appropriate M3 screws.

[0039] The pins of the power tube include four tube leg pins. Figure 7a-7b As shown, springs 113 are respectively arranged at the four leg pin positions and the two cap positions of the power tube. Screw sleeves 111 are mounted on the springs to form spring pressure feet. The positions of the springs match the six through holes opened on the lower laminate block. After passing through the through holes, the springs are embedded in the matching outer edge screw holes. According to the spring pressure calculation, the compression spring pressure calculation formula is: K=Gd^6 / 8nD^3. The spring selected is a helical spring that withstands positive pressure. The material used has a circular cross-section and a constant pitch. The spring is compressed to the load of a single test and the compression of the spring is recorded. However, the maximum compression force cannot exceed 1.5 times the constant compression load. Considering the bearing limit of the power tube cap, half of the spring compression amount is used as the actual compression amount. At the same time, the inherent thickness of the screw sleeve itself is added to obtain the distance between the bottom of the test pressure block and the base. Considering the thickness of the tube cap, the height of the spring pressure foot at the tube cap position is set to be 2mm lower than the height of the spring pressure foot at the tube leg position.

[0040] In this application, both the upper laminate block and the lower laminate block are made of acrylic glass material. This is because acrylic glass has higher light transmittance and strength than glass, and its tensile and impact resistance are 7-18 times higher than ordinary glass. It is also resistant to high temperatures, has good stability, is resistant to corrosion from a variety of chemicals, is firm and reliable, and will not affect test performance.

[0041] It will be understood by those skilled in the art that, unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by those skilled in the art to which this application belongs. It should also be understood that terms such as those defined in common dictionaries should be understood to have meanings consistent with their meanings in the context of the prior art and, unless defined as such, will not be interpreted in an idealized or overly formal sense.

[0042] The meaning of "and / or" in this application means that both situations where each exists alone or both exist at the same time are included.

[0043] The term “connection” as used in this application may mean a direct connection between components or an indirect connection between components via other components.

[0044] With the above-described preferred embodiments of the present invention as a guide, and with reference to the above description, relevant personnel are fully capable of making various changes and modifications without departing from the technical scope of this invention. The technical scope of this invention is not limited to the contents of the specification and must be determined according to the scope of the claims.

Claims

1. A power tube test crimping device, characterized by: The test base comprises a test base, a groove is provided on the surface of the test base, and the power tube is placed in the groove; A test crimping device body is provided on the surface of the power tube, and the test crimping device body presses the pins and cap of the power tube to fix the power tube in the groove on the surface of the test base; The aforementioned test crimping device body comprises an upper lamination block and a lower lamination block, wherein the upper lamination block is arranged on the surface of the lower lamination block; The aforementioned upper laminate block includes an upper laminate block seat and an upper laminate block plate. The upper laminate block seat is arranged in a square structure, and the two symmetrical side walls of the upper laminate block seat are recessed toward the center of the square structure to form a U shape; through upper screw holes are provided at the four corners of the upper laminate block seat, and through holes are provided at the center positions of the other two side edges of the upper laminate block seat respectively; six outer edge screw holes are also provided on the upper laminate block seat, and the six outer edge screw holes are distributed on a circumference with the center of the upper laminate block seat as the center; The shape of the upper laminate plate matches the upper laminate seat and is covered on the surface of the upper laminate seat. Six upper laminate plate screw holes are provided on the upper laminate plate. The distribution positions of the six upper laminate plate screw holes match the positions of the outer edge screw holes. Among them, the four upper laminate plate screw holes close to the non-recessed side of the upper laminate plate do not penetrate; The aforementioned lower laminate block is also arranged in a square structure, and its two symmetrical side walls protrude outward to form large turnbuckles for fixing the lower laminate block to the test base. The large turnbuckles correspond to the concave portion of the upper laminate block seat; Six through holes are provided on the lower laminate block, and their distribution positions match the screw holes of the upper laminate block plate; The four corners of the lower layer block are provided with lower layer screw holes that are not through, and the upper layer screw holes match the positions of the lower layer screw holes; The pins of the power tube include four tube leg pins. Springs are respectively arranged at the four tube leg pin positions and the two tube cap positions of the power tube. Screw sleeves are set on the springs to form spring pressure feet. The positions of the springs are matched with the six through holes opened on the lower laminate block. After passing through the through holes, the springs are embedded in the matching outer edge screw holes. The upper and lower laminates are both made of acrylic.

2. The power tube test crimping device according to claim 1, characterized in that: The six outer edge screw holes located on the upper pressing block seat are drilled starting from the bottom of the upper pressing block seat. The outer edge screw holes do not penetrate the upper pressing block seat, and the length of their closed ends from the surface of the upper pressing block seat is one quarter of the entire upper pressing block seat height.

3. The power tube test crimping device according to claim 2, characterized in that: The height of the spring pressure foot at the pipe cap position is 2 mm lower than that at the pipe leg position.

Citation Information

Patent Citations

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    CN210550674U

  • Micro-channel semiconductor laser testing and aging clamp

    CN211014488U

  • Power tube test crimping device

    CN213933946U