A sample analysis system and control method thereof

Abstract

A sample analysis system and a control method thereof, the method comprising: obtaining identification information of a sample to be tested; determining a test item of the sample to be tested according to the identification information of the sample to be tested; determining a scheduling plan for the sample to be tested according to the test item of the sample to be tested, wherein the scheduling plan at least includes a target analysis device that needs to perform its test item on the sample to be tested; when the scheduling plan for the sample to be tested is determined, the target analysis device of the sample to be tested is also controlled to start pre-test preparation work. Since the pre-test preparation work of the target analysis device is started while the scheduling plan for the sample to be tested is determined, the waiting time after the sample to be tested arrives at the target analysis device is reduced, and the test efficiency and test throughput of the sample analysis system are improved.

Description

Technical Field

[0001] The invention relates to a sample analysis system and a control method thereof. Background Art

[0002] The analysis equipment for samples is a type of instrument used to measure samples, which may include cell analyzers, coagulation meters, urine analyzers, biochemical analyzers, and immunoassay analyzers. A common test process is that the analysis equipment first adds samples and reagents to an empty reaction cup, and then needs to mix the samples and reagents. After a period of incubation, the solution formed by the samples and reagents is measured to obtain the measurement results. Generally, the process of adding samples and reagents to the reaction cup and mixing them has a great impact on the test speed of the analysis equipment. At present, research on improving, rationally planning and speeding up the above process has been relatively sufficient. For example, technicians introduce multiple syringes for sucking samples and reagents and rationally plan their timing to ultimately improve the test speed, test throughput and test efficiency of the analysis equipment.

[0003] Another factor that limits the test speed, test throughput and test efficiency of the analysis equipment is the sample injection. Generally, the user puts the samples into the analysis equipment in batches, and always pays attention to whether the analysis equipment has completed the test of the current batch of samples. If the test is completed, the user needs to put the next batch of samples into the analysis equipment in time, otherwise, the analysis equipment will be idle, which reduces the test throughput and test efficiency of the analysis equipment; in addition, in actual situations, samples often undergo the required test items on multiple analysis equipment respectively, for example, the sample needs to be put into the biochemical analyzer for its biochemical test items, and into the immunoassay analyzer for its immunoassay items. In this case, the user needs to put the sample into one of the analysis equipment for testing first, and always pay attention to the completion of the test on the current analysis equipment. If the test is completed, the sample needs to be taken out in time and put into another analysis equipment for the remaining items. This requires a lot of time and energy from the user, and once the user does not take the sample out of the analysis equipment in time and put it into another analysis equipment for continued testing, the time for the final result of the sample will be greatly delayed.

[0004] Therefore, with the demand for a large number of samples to be measured, in order to meet high throughput and reduce time, a sample analysis system that tests samples in a pipeline has also emerged. This sample analysis system cascades multiple analysis devices, which are connected by tracks. Its main feature is that the samples to be tested are uniformly placed in an input module, and the samples are scanned by the input module to determine which test items the samples need to undergo. The samples are then dispatched to the corresponding analysis devices in turn through the track for testing. After the test is completed in one analysis device, if the sample needs to be tested in other analysis devices, the system will automatically dispatch the sample to the corresponding other analysis devices for testing until all items of the sample are tested.

[0005] As for how to improve the testing efficiency of sample analysis systems, which are pipeline test systems, technicians mainly focus on how to reasonably plan and schedule samples, and some progress has been made in this regard. Summary of the invention

[0006] The present application provides a sample analysis system and a control method thereof.

[0007] According to the first aspect, an embodiment provides a sample analysis system, comprising:

[0008] An input module is used to receive the sample to be tested put in by the user and obtain the identification information of the sample to be tested;

[0009] The pre-processing module is used to pre-process the sample to be tested received by the input module, and the pre-processing module includes one or more of a centrifugation module, a serum detection module, a decapping module and a dispensing module; the centrifugation module is used to centrifuge the sample to be centrifuged; the serum detection module is used to detect whether the serum volume of the sample is sufficient and / or whether the serum quality of the sample is qualified; the decapping module is used to decap the sample after centrifugation; and the dispensing module is used to divide the sample;

[0010] A plurality of analysis devices are used to test samples to be tested; the analysis devices include a sample component, a sample dispensing mechanism, a reagent component, a reagent dispensing mechanism, a reaction component, a determination component and a cleaning mechanism; the sample component is used to carry samples; the sample dispensing mechanism is used to draw samples from the sample component and discharge them into a reaction cup to be added with samples; the reagent component is used to carry reagents; the reagent dispensing mechanism is used to draw reagents from the reagent component and discharge them into the reaction cup to be added with reagents; the reaction component has at least one placement position, which is used to place the reaction cup and incubate the reaction liquid in the reaction cup; the determination component is used to measure the reaction liquid after incubation to obtain the test data of the sample; the cleaning mechanism is used to clean the reaction cup;

[0011] A post-processing module, the post-processing module includes one or more of a filming / capping module, a cold storage module, and a film removal / capping module; the filming / capping module is used to film or cap the sample; the cold storage module is used to store the sample; the film removal / capping module is used to remove the film or cap from the sample;

[0012] A track for sequentially connecting an input module, a pre-processing module, a plurality of sample analysis devices, and a post-processing module;

[0013] A scheduling device, used for scheduling the samples to be tested through the track according to the scheduling plan of the samples to be tested; and

[0014] The processor is used to determine the test items of the samples to be tested according to the identification information of the samples to be tested obtained by the input module, and determine the scheduling plan of the samples to be tested according to the test items of the samples to be tested, wherein the scheduling plan includes all target analysis devices that need to perform their test items on the samples to be tested, and the path for the samples to be tested to reach their target analysis devices; when determining the scheduling plan of the samples to be tested, the processor also determines whether the target analysis device of the samples to be tested is an analysis device that is not closest to the pre-processing module on the track connection, and if so, the processor also controls the corresponding target analysis device to start its cleaning mechanism to clean the reaction cup.

[0015] According to the second aspect, an embodiment provides a sample analysis system, comprising:

[0016] An input module is used to receive the sample to be tested put in by the user and obtain the identification information of the sample to be tested;

[0017] Multiple cascaded analytical devices for testing samples to be tested;

[0018] A track for connecting the input module and the plurality of analysis devices;

[0019] A scheduling device, used for scheduling the samples to be tested through the track according to the scheduling plan of the samples to be tested;

[0020] The processor is used to determine the test items of the samples to be tested based on the identification information of the samples to be tested obtained by the input module, and determine the scheduling plan of the samples to be tested based on the test items of the samples to be tested, wherein the scheduling plan at least includes the target analysis equipment that needs to perform the test items on the samples to be tested; when determining the scheduling plan of the samples to be tested, the processor also controls the target analysis equipment of the samples to be tested to start pre-test preparations.

[0021] In one embodiment, when determining the scheduling plan for the sample to be tested, the processor first determines whether there is an analysis device among the target analysis devices of the sample to be tested that is not closest to the input module on the track connection before controlling the target analysis device of the sample to be tested to start the pre-test preparation work. If so, the processor then controls the corresponding target analysis device to start the pre-test preparation work.

[0022] In one embodiment, when determining the scheduling plan for the sample to be tested, the processor also controls the target analysis device of the sample to be tested to start pre-test preparations, including: when there are multiple target analysis devices for the sample to be tested in the scheduling plan, the processor controls these multiple target analysis devices to start pre-test preparations at the same time.

[0023] In one embodiment, the analysis device includes a sample component, a sample dispensing mechanism, a reagent component, a reagent dispensing mechanism, a reaction component, a determination component and a cleaning mechanism; the sample component is used to carry the sample; the sample dispensing mechanism is used to draw the sample from the sample component and discharge it into a reaction cup to be added with the sample; the reagent component is used to carry the reagent; the reagent dispensing mechanism is used to draw the reagent from the reagent component and discharge it into the reaction cup to be added with the reagent; the reaction component has at least one placement position, and the placement position is used to place the reaction cup and incubate the reaction liquid in the reaction cup; the determination component is used to measure the reaction liquid after incubation to obtain the test data of the sample; the cleaning mechanism is used to clean the reaction cup;

[0024] The processor controls the target analysis device of the sample to be tested to start the pre-test preparation work, including: the processor controls the target analysis device of the sample to be tested to start its cleaning mechanism to clean the reaction cup.

[0025] In one embodiment, the target analysis device controls its cleaning mechanism to clean the reaction cup according to a cleaning mode, and the cleaning mode includes a sequential cleaning mode and a simultaneous cleaning mode.

[0026] In one embodiment, for any target analysis device, the processor obtains the number of samples to be tested of the target analysis device, and determines the cleaning mode of the target analysis device according to the number of samples to be tested of the target analysis device;

[0027] When the number of samples to be tested of the target analysis device is greater than a preset number, the processor determines that the cleaning mode of the target analysis device is a simultaneous cleaning mode; otherwise, the processor determines that the cleaning mode of the target analysis device is a sequential cleaning mode.

[0028] In one embodiment, for any target analysis device, the processor sets the cleaning mode of the target analysis device in response to a user's command to set the cleaning mode of the target analysis device.

[0029] In one embodiment, when it is determined that a target analysis device is restored from a shielded state to a normal state, the processor first controls the target analysis device to start the device, and then controls the target analysis device to start pre-test preparation work.

[0030] According to a third aspect, an embodiment provides a control method for a sample analysis system, the sample analysis system comprising a plurality of cascaded analysis devices, the control method comprising:

[0031] Obtaining identification information of the sample to be tested;

[0032] Determine the test items of the sample to be tested according to the identification information of the sample to be tested;

[0033] Determine the scheduling plan of the sample to be tested according to the test items of the sample to be tested; wherein the scheduling plan at least includes the target analysis equipment required to perform the test items of the sample to be tested;

[0034] When the scheduling plan of the samples to be tested is determined, the target analysis equipment of the samples to be tested is also controlled to start the pre-test preparation work.

[0035] In one embodiment, when determining the scheduling plan for the samples to be tested, before controlling the target analysis equipment for the samples to be tested to start pre-test preparations, it is first determined whether there is an analysis equipment among the target analysis equipment for the samples to be tested that is not closest to the input module on the track connection; if so, the corresponding target analysis equipment is then controlled to start pre-test preparations.

[0036] In one embodiment, when the scheduling plan for the sample to be tested is determined, the target analysis device of the sample to be tested is also controlled to start pre-test preparation work, including: when there are multiple target analysis devices for the sample to be tested in the scheduling plan, these multiple target analysis devices are controlled to start pre-test preparation work at the same time.

[0037] In one embodiment, controlling the target analysis device of the sample to be tested to start preparatory work before testing includes: controlling the target analysis device of the sample to be tested to start cleaning of the reaction cup.

[0038] In one embodiment, controlling a target analysis device of a sample to be tested to start cleaning a reaction cup includes:

[0039] Acquire a cleaning mode of a target analysis device, wherein the cleaning mode includes a sequential cleaning mode and a simultaneous cleaning mode;

[0040] The target analysis device is controlled to clean the cuvette according to its cleaning mode.

[0041] In one embodiment, obtaining a cleaning mode of a target analysis device includes:

[0042] Obtaining the number of samples to be tested of the target analysis device, and determining a cleaning mode of the target analysis device according to the number of samples to be tested of the target analysis device;

[0043] When the number of samples to be tested of the target analysis device is greater than a preset number, the cleaning mode of the target analysis device is determined to be a simultaneous cleaning mode; otherwise, the cleaning mode of the target analysis device is determined to be a sequential cleaning mode.

[0044] In one embodiment, acquiring the cleaning mode of the target analysis device includes: in response to a user's command for setting the cleaning mode of the target analysis device, setting the cleaning mode of the target analysis device.

[0045] In one embodiment, when it is determined that a target analysis device is restored from a shielded state to a normal state, the target analysis device is first controlled to start the device, and then the target analysis device is controlled to start the pre-test preparation work.

[0046] According to a fourth aspect, an embodiment provides a computer-readable storage medium, including a program, which can be executed by a processor to implement a method as described in any embodiment of the present invention.

[0047] According to the sample analysis system and its control method and computer-readable storage medium of the above-mentioned embodiment, the identification information of the sample to be tested is obtained; the test items of the sample to be tested are determined according to the identification information of the sample to be tested; the scheduling plan of the sample to be tested is determined according to the test items of the sample to be tested, wherein the scheduling plan at least includes the target analysis equipment that needs to perform its test items on the sample to be tested; when the scheduling plan of the sample to be tested is determined, the target analysis equipment of the sample to be tested is also controlled to start the pre-test preparation work. Since the pre-test preparation work of the target analysis equipment is started while the scheduling plan of the sample to be tested is determined, the waiting time after the sample to be tested arrives at the target analysis equipment is reduced, and the test efficiency and test throughput of the sample analysis system are improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] Figure 1 A schematic diagram of the structure of a sample analysis system according to an embodiment;

[0049] Figure 2 A schematic diagram of the structure of an analysis device according to an embodiment;

[0050] Figure 3 A schematic diagram of the structure of a cleaning mechanism according to an embodiment;

[0051] Figure 4 is a schematic structural diagram of a sample analysis system according to another embodiment;

[0052] Figure 5 A schematic diagram of the structure of a pre-processing module according to an embodiment;

[0053] Figure 6 is a structural schematic diagram of a post-processing module of an embodiment;

[0054] Figure 7 is a structural schematic diagram of a sample analysis system according to another embodiment;

[0055] Figure 8 A flow chart of a control method of a sample analysis system according to an embodiment;

[0056] Fig. 9 The present invention is a flow chart of a control method of a sample analysis system according to another embodiment. DETAILED DESCRIPTION

[0057] The present invention is further described in detail below by specific embodiments in conjunction with the accompanying drawings. Wherein similar elements in different embodiments adopt associated similar element numbers. In the following embodiments, many detailed descriptions are for making the present application better understood. However, those skilled in the art can easily recognize that some features can be omitted in different situations, or can be replaced by other elements, materials, methods. In some cases, some operations related to the present application are not shown or described in the specification, this is to avoid the core part of the present application being overwhelmed by too much description, and for those skilled in the art, it is not necessary to describe these related operations in detail, and they can fully understand the related operations according to the description in the specification and the general technical knowledge in the art.

[0058] In addition, the features, operations or characteristics described in the specification can be combined in any appropriate manner to form various implementations. At the same time, the steps or actions in the method description can also be interchanged or adjusted in a manner that is obvious to those skilled in the art. Therefore, the various sequences in the specification and the drawings are only for the purpose of clearly describing a certain embodiment and are not meant to be a required sequence, unless otherwise specified that a certain sequence must be followed.

[0059] The serial numbers of the components in this document, such as "first", "second", etc., are only used to distinguish the objects described and do not have any order or technical meaning. The "connection" and "coupling" mentioned in this application, unless otherwise specified, include direct and indirect connections (couplings).

[0060] When studying how to improve the test efficiency of a sample analysis system, which is a system for testing samples in an assembly line, the applicant did not follow the current mainstream improvement direction, that is, how to reasonably regulate and schedule samples, but found that there are still some problems when the current analysis equipment is cascaded into a sample analysis system. Therefore, the applicant studied and improved the test efficiency of the assembly line test system from another aspect. When the analysis equipment is tested as a single machine, the analysis equipment generally scans the sample in its sample component (such as a sample tray or a track-type sample introduction mechanism, etc.), then controls the sample to be sucked and discharged into the reaction cup, and sucks the reagent and discharges it into the reaction cup, completing the process of adding the sample and the reagent to the reaction cup. In this process, the analysis equipment generally starts to clean the reaction cup after scanning the sample - in order to ensure that the sample will not be contaminated, the reaction cup used for testing needs to be cleaned before the test. This is a very natural, reasonable and scientific process design when testing a single machine, that is, the sample is scanned first, so as to determine that there is a test to be performed, so the cleaning of the reaction cup is immediately started when the sample is scanned. When testing a single machine, the reaction cup is generally not cleaned in advance, because if the reaction cup is cleaned without confirming that there is a test to be performed, it will lead to a waste of cleaning reagents. In the assembly line sample analysis system, when multiple analysis devices are cascaded, each analysis device actually follows the same process as the single machine when testing. For example, when the user puts the sample in the input module of the sample analysis system, the input module scans the sample and then determines the test items of the sample, and plans which analysis devices to dispatch these samples to for testing, and then dispatches the samples to the corresponding analysis devices for testing according to the planned plan. For any analysis device on the assembly line, the analysis device will only start cleaning the reaction cup when the sample enters the analysis device and the analysis device scans the sample (the analysis device needs to scan the sample to determine which items the sample needs to be tested on this device). At this time, the sample can only wait for the analysis device to clean the reaction cup before starting the test, which wastes a lot of time. After the applicant discovered this problem, he immediately started to make improvements and proposed that when the input module where the samples are uniformly placed scans and determines that the samples need to be dispatched to the analysis equipment for testing, the corresponding analysis equipment is immediately started to clean the reaction cup, so that when the user arrives at the corresponding equipment, there is no need to waste time waiting for the analysis equipment to clean the reaction cup - a typical scenario, for example, there are two analysis equipment in cascade, and the user puts a batch of samples into the input module. When the input module scans and determines that the batch of samples need to be dispatched to the two analysis equipment for testing respectively, the two analysis equipment are immediately controlled to start the cleaning of the reaction cup. In this way, after the sample is tested in the first analysis equipment, the second analysis equipment has also prepared a clean reaction cup for testing. The sample does not need to wait and can start testing immediately, saving time and improving test efficiency.

[0061] The present invention is described below.

[0062] Please refer to Figure 1 , a sample analysis system of an embodiment may include an input module 10, a plurality of cascaded analysis devices 20, a track 30, a scheduling device 40 and a processor 50, which are described in detail below.

[0063] The input module 10 can be used to receive the sample to be tested put in by the user and obtain the identification information of the sample to be tested. The user can put the sample to be tested into the input module 10, and the input module 10 can, for example, scan the barcode or QR code on the sample to be tested through a scanning device to obtain the identification information of the sample to be tested. The identification information may include, for example, the sample number, sample category, sample source information, etc.

[0064] Multiple analysis devices 20 are cascaded through the track 30. For example, the figure shows that there are more than three analysis devices 20, but it is understandable that this is only for illustration and is not used to limit the number of sample analysis systems. It is understandable that the multiple analysis devices 20 in the present invention can be the same type of analysis devices, that is, analysis devices used to measure the same items, or different types of analysis devices, that is, analysis devices used to measure different items. This can be configured according to user needs, and the present invention does not limit this. Please refer to Figure 2 The analysis device 20 of one embodiment may include a sample component 21 , a sample dispensing mechanism 22 , a reagent component 23 , a reagent dispensing mechanism 24 , a reaction component 25 , a determination component 26 and a cleaning mechanism 27 .

[0065] The sample component 21 is used to carry samples. In some examples, the sample component 21 may include a sample delivery module (SDM) and a front track; in other examples, the sample component 21 may also be a sample tray, which includes a plurality of sample positions such as sample tubes, and the sample tray can dispatch samples to corresponding positions, such as positions for the sample dispensing mechanism 22 to absorb samples, by rotating its tray structure.

[0066] The sample dispensing mechanism 22 is used to absorb the sample and discharge it into the reaction cup to be loaded with the sample. For example, the sample dispensing mechanism 22 may include a sample needle, and the sample needle performs two-dimensional or three-dimensional movement in space through a two-dimensional or three-dimensional driving mechanism, so that the sample needle can move to absorb the sample carried by the sample component 21, and move to the reaction cup to be loaded with the sample, and discharge the sample into the reaction cup.

[0067] The reagent component 23 is used to carry the reagent. In one embodiment, the reagent component 23 may be a reagent disk, which is a disk-shaped structure with multiple positions for carrying reagent containers. The reagent component 23 can rotate and drive the reagent container it carries to rotate, and is used to rotate the reagent container to a specific position, such as a position where the reagent is sucked by the reagent dispensing mechanism 24. The number of the reagent components 23 may be one or more.

[0068] The reagent dispensing mechanism 24 is used to absorb the reagent and discharge it into the reaction cup to be added with the reagent. In one embodiment, the reagent dispensing mechanism 24 may include a reagent needle, which is moved in two dimensions or three dimensions in space by a two-dimensional or three-dimensional driving mechanism, so that the reagent needle can move to absorb the reagent carried by the reagent component 23, move to the reaction cup to be added with the reagent, and discharge the reagent into the reaction cup.

[0069] The reaction component 25 has at least one placement position, and the placement position is used to place the reaction cup and incubate the reaction liquid in the reaction cup. For example, the reaction component 25 can be a reaction disk, which is arranged in a disc-shaped structure and has one or more placement positions for placing the reaction cup. The reaction disk can rotate and drive the reaction cup in its placement position to rotate, and is used to arrange the reaction cup in the reaction disk and incubate the reaction liquid in the reaction cup.

[0070] The measuring component 26 is used to perform light measurement on the reaction solution after incubation to obtain the reaction data of the sample. For example, the measuring component 26 detects the luminous intensity of the reaction solution to be measured, and calculates the concentration of the component to be measured in the sample through the calibration curve. In one embodiment, the measuring component 26 is separately arranged outside the reaction component 25.

[0071] The cleaning mechanism 27 can be used to clean the reaction cup. Typically, the cleaning mechanism 27 cleans the reaction cup before the reaction cup needs to be tested. The cleaning mechanism 27 can be implemented by an existing cleaning structure, or by a cleaning structure that will appear in the future. In one embodiment, the cleaning mechanism 27 can include one or more stages of cleaning needles, and each stage of cleaning needles will decide whether to clean or not based on the cleaning state of the reaction cup, thereby performing the corresponding cleaning operation. Figure 3The 4-stage cleaning needle shown is used as an example for explanation. Each reaction cup to be cleaned, such as a reaction cup marked as dirty, must be cleaned in sequence by the 1st-stage cleaning needle (hereinafter referred to as the 1st-stage needle), the 2nd-stage cleaning needle (hereinafter referred to as the 2nd-stage needle), the 3rd-stage cleaning needle (hereinafter referred to as the 3rd-stage needle), and the 4th-stage cleaning needle (hereinafter referred to as the 4th-stage needle), wherein the 1st-stage needle is used to inject cleaning liquid and absorb waste liquid, the 2nd-stage needle and the 3rd-stage needle are both used to inject cleaning water and absorb waste liquid, and the 4th-stage needle does not inject liquid but absorbs waste liquid. The liquid circuit components are connected by liquid pipelines inside the analysis equipment 20 to realize the circulation of cleaning liquid and cleaning water, as well as the discharge of waste water. There are many specific ways of connecting liquid pipelines. For example, in method one, the first-order needle can absorb cleaning liquid from the cleaning agent container and absorb the waste liquid after cleaning into the waste liquid container; the second-order and third-order needles are independent of each other and do not affect each other. They can control the injection and absorption of waste liquid separately, that is, they can absorb cleaning water from the cleaning water container and absorb the waste liquid after cleaning into the waste liquid container; the fourth-order needle can absorb the waste liquid into the waste liquid container; for example, in method two, the liquid path connection method of the first-order needle and the fourth-order needle remains unchanged; the second-order and third-order needles are controlled to inject liquid and absorb waste liquid at the same time, that is, they can absorb cleaning water from the cleaning water container and absorb the waste liquid after cleaning into the waste liquid container. The so-called simultaneous control of injection and absorption of waste liquid means that when the second-order needle is injecting liquid, the third-order needle is also injecting liquid at the same time, and when the second-order needle is absorbing waste liquid, the third-order needle is also absorbing waste liquid at the same time.

[0072] The above is some description of the analysis device 20.

[0073] The track 30 is used to connect various devices. For example, the track 30 connects the input module 10 and a plurality of analysis devices 20, so that the sample can be dispatched from the input module 10 to each analysis device 20 through the track 30 for testing.

[0074] The scheduling device 40 is used to schedule samples through the track 30, for example, scheduling samples from the input module 10 to the analysis device 20, and then scheduling from one analysis device 20 to another analysis device 20. Generally, the scheduling device 40 can schedule the samples to be tested to the corresponding analysis devices through the track 30 according to the scheduling plan of the samples to be tested.

[0075] The above is a description of the structure of the sample analysis system. Before testing, the sample generally needs to be pre-processed, such as centrifuging the sample, etc. Some sample analysis systems also integrate pre-processing functions. Please refer to Figure 4 The sample analysis system of an embodiment may further include a pre-processing module 60 and / or a post-processing module 70, which will be described in detail below.

[0076] The pre-processing module 60 is used to pre-process the sample to be tested received by the input module. Generally, after the user puts the sample into the input module 10, the input module 10 scans the sample, and the scheduling device 40 will then schedule the sample to the pre-processing module 60 for pre-processing. The pre-processed sample will then be scheduled from the pre-processing module 60 to the corresponding analysis device 20 for testing. In one embodiment, please refer to Figure 5 , the pre-treatment module 60 may include one or more of a centrifugal module 61, a serum detection module 62, a decapping module 63 and a dispensing module 64. The centrifugal module 61 is used to centrifuge the sample to be centrifuged, and the number of the centrifugal modules 61 can be one or more. The serum detection module 62 is used to detect whether the amount of serum in the sample is sufficient and / or whether the serum quality of the sample is qualified, so as to determine whether the sample after centrifugation can be used for subsequent determination. The decapping module 63 is used to decap the sample after centrifugation - it can be understood that the capping, filming, decapping and demembraning of the sample in this article refers to the capping, filming, decapping and demembraning of the sample tube containing the sample; generally, the sample needs to be decapped after centrifugation for subsequent dispensing module 24 or analysis equipment to perform sample division or sample suction. The dispensing module 64 is used to divide the sample, for example, to divide a sample into multiple samples, so as to send them to different analysis equipment 20 for determination. A common pre-processing process of the pre-processing module 60 is as follows: the centrifugation module 61 receives the sample dispatched by the input module 10 and centrifuges the sample; the serum detection module 62 detects the serum of the sample after centrifugation to determine whether it can be used for subsequent measurements. If the serum amount is insufficient or the quality is unqualified, it cannot be used for subsequent measurements; if the test passes, the sample is dispatched to the decapping module 63, and the decapping module 63 removes the cover of the sample. If there is a dispensing module 64, the dispensing module 64 divides the removed sample and then dispatches the divided sample to the corresponding analysis device 20 for measurement. If there is no dispensing module 64, the sample is dispatched from the decapping module 63 to the corresponding analysis device 20 for measurement.

[0077] The post-processing module 70 is used to complete the post-processing of the sample. Figure 6The post-processing module 70 includes one or more of a filming / capping module 71, a cold storage module 72, and a film removal / capping module 73. The filming / capping module 71 is used to film or cap the sample; the cold storage module 72 is used to store the sample; and the film removal / capping module 73 is used to remove the film or cap from the sample. A common post-processing flow of the post-processing module 70 is: after the sample is sucked into all the analysis devices 20 that need to be measured, it will be dispatched to the filming / capping module 71, and the filming / capping module 71 will film or cap the sample after the measurement, and then dispatch it to the cold storage module 72 for storage; if the sample needs to be re-measured, the sample will be dispatched from the cold storage module 72, and will be removed from the film removal / capping module 73, and then dispatched to the corresponding analysis device 20 for measurement.

[0078] Figure 7 A schematic diagram of the structure of a sample analysis system including a pre-processing module 60 and a post-processing module 70 provided by the present invention. Figure 7 As shown, each device or module may also be provided with a module buffer, the track 30 may also have a track buffer, and the entire track may be a circulating track. It should be noted that each type of module shown in the figure is one, but those skilled in the art can understand that there is no limitation on the number, for example, there may be multiple centrifugal modules 61, there may also be multiple decapping modules 63, etc.

[0079] The above is a description of some structures of the sample analysis system according to some embodiments of the present invention.

[0080] In one embodiment of the present invention, after the input module 10 obtains the identification information of the sample to be tested, the processor 50 can determine the test items of the sample to be tested according to the identification information of the sample to be tested obtained by the input module 10, and determine the scheduling plan of the sample to be tested according to the test items of the sample to be tested, wherein the scheduling plan at least includes the target analysis equipment that needs to perform its test items on the sample to be tested. In some examples, the scheduling plan also includes the path of the sample to reach each target analysis equipment. Typically, this can include the order in which the sample reaches each target analysis equipment, such as which target analysis equipment to reach first for testing, and which target analysis equipment to reach next for testing. It should be noted that the target analysis equipment in this article refers to the analysis equipment that the sample needs to be scheduled to test. For example, there are three analysis equipments, and the sample S only needs to perform the test items on the second and third analysis equipments, and does not need to perform the test items on the first analysis equipment. Then the second and third analysis equipments are the target analysis equipment of the sample S, and the first analysis equipment is not the target analysis equipment of the sample S. In some embodiments, when the processor 50 determines the scheduling plan of the sample to be tested according to the test items of the sample to be tested, it can also comprehensively consider the load conditions of multiple analysis devices cascaded in the sample analysis system to achieve load balancing and further improve the test efficiency. The processor 50 can be, for example, a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), etc. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc.

[0081] In one embodiment, when the scheduling plan for the sample to be tested is determined, the processor 50 also controls the target analysis device of the sample to be tested to start pre-test preparations. It can be understood that in actual situations, for the same sample, its target analysis device may be one or more, which depends on the project test that the sample actually needs to be tested. Once the processor 50 determines the target analysis device of the sample to be tested, it controls the target analysis device to start pre-test preparations, and then schedules the sample to be tested to the target analysis device for testing. In some embodiments, for the case where it is determined that there are multiple target analysis devices, that is, when there are multiple target analysis devices for the sample to be tested in the scheduling plan, the processor 50 controls these multiple target analysis devices to start pre-test preparations at the same time.

[0082] For Figure 1In the sample analysis system shown in the figure, if the target analysis devices for the sample include the first analysis device, that is, the analysis device closest to the input module on the track connection, and some subsequent analysis devices that are relatively not so close to the input module, then in terms of improving the test efficiency of the system, starting the subsequent analysis devices for pre-test preparations when the scheduling plan is determined will have a relatively high benefit, that is, it will be of great help in improving the test efficiency of the system. This is because after the scheduling plan is determined, the sample will be quickly scheduled to the first analysis device for testing. At this time, starting the first analysis device for pre-test preparations in advance is relatively short compared to when the sample enters the first analysis device and the first analysis device starts pre-test preparations again. That is, the pre-test preparations of the first analysis device have not been advanced for a long time; but for For those target analysis devices that are not so close to the input module, when the scheduling plan is determined, the analysis devices behind are started to perform pre-test preparation work, and the benefits are relatively high, that is, it is of great help to improve the test efficiency of the system. This is because after the scheduling plan is determined, the sample may be tested first in the front analysis device (such as the first analysis device), or, even if the front analysis device is not needed for testing, it takes a relatively long time for the sample to be scheduled to the back analysis device, so the target analysis devices behind can make full use of the time to perform pre-test preparation work; that is, the pre-test preparation work of the target analysis device can be carried out in parallel with the scheduling process of the sample to be tested from the input module to the target analysis device, which will shorten the TAT of the sample to be tested and improve the test efficiency and test throughput of the sample analysis system. Therefore, in some examples, when the scheduling plan of the sample to be tested is determined, the sample analysis system needs to at least start the pre-test preparation work of the analysis device that is not so close to the input module in the target analysis device, and the analysis device closest to the input module can start or not start the pre-test preparation work in some cases. Therefore, in one embodiment, when determining the scheduling plan for the samples to be tested, the processor 50 first determines whether there are any target analysis devices for the samples to be tested that are not closest to the input module on the track connection before controlling the target analysis devices for the samples to be tested to start pre-test preparations. If so, the processor 50 then controls the corresponding target analysis devices, that is, those target analysis devices that are not closest to the input module, to start pre-test preparations.

[0083] And for Figure 4For these sample analysis systems including the pre-processing module 60, when determining the scheduling plan of the samples, the samples need to be first scheduled to the pre-processing module 60 for pre-processing, such as centrifugation, and then scheduled to the corresponding target analysis equipment for testing. Therefore, in this case, when the scheduling plan of the samples to be tested is determined, the sample analysis system starts the pre-test preparation work of all target analysis equipment, and the benefits are very high, that is, it helps to improve the test efficiency of the system, because this at least utilizes the time when the samples are in pre-processing, so that the pre-processing of the samples and the pre-test preparation work of the target analysis equipment are carried out in parallel, and when the samples reach the target analysis equipment after pre-processing, the samples can be tested quickly.

[0084] In general, the sample analysis system of the present invention controls the target analysis device of the sample to be tested to start the pre-test preparation work when determining the scheduling plan of the sample to be tested, so that the pre-test preparation work of the target analysis device can be carried out in parallel with the scheduling process of the sample to be tested from the input module to the target analysis device, thereby reducing the waiting time after the sample to be tested arrives at the target analysis device, shortening the TAT time of the sample to be tested, and thereby improving the test efficiency and test throughput of the sample analysis system.

[0085] Pre-test preparation refers to some work done by the analysis device before the formal test of the sample, such as sample aspiration. Typically, the pre-test preparation may be cleaning the reaction cup, reagent needle, and sample needle used for the test. Among them, cleaning the reaction cup used for the test generally takes a relatively long time. Therefore, in one embodiment, the processor 50 controls the target analysis device of the sample to be tested to start the pre-test preparation, which may include: the processor 50 controls the target analysis device of the sample to be tested to start its cleaning mechanism 27 to clean the reaction cup.

[0086] In some embodiments, when each analysis device 20 controls its cleaning mechanism 27 to clean the reaction cup, it can specifically clean it according to its cleaning mode, and the cleaning mode includes a sequential cleaning mode and a simultaneous cleaning mode. In the sequential cleaning mode, the cleaning mechanism 27 can clean the reaction cups to be cleaned one by one according to a preset order; in the simultaneous cleaning mode, the cleaning mechanism 27 can clean multiple reaction cups to be cleaned at the same time.

[0087] In some embodiments, for any target analysis device, the processor 50 obtains the number of samples to be tested of the target analysis device, and determines the cleaning mode of the target analysis device according to the number of samples to be tested of the target analysis device; when the number of samples to be tested of the target analysis device is greater than the preset number, the processor determines that the cleaning mode of the target analysis device is a simultaneous cleaning mode; otherwise, the processor determines that the cleaning mode of the target analysis device is a sequential cleaning mode. For the case where the number of samples to be tested is large, the simultaneous cleaning mode is used to clean the reaction cup, which can shorten the time for cleaning the reaction cup, reduce the time-consuming pre-test preparation work, and improve the test efficiency; and for the case where the number of samples to be tested is small, the sequential cleaning mode is used to clean the reaction cup, which can achieve on-demand cleaning, effectively save the consumption of cleaning liquid and cleaning agent, etc., and reduce the cost of use. In order to improve the user experience, the analysis device can also receive a user's setting command for the cleaning mode. In one embodiment, for any target analysis device, the processor 50 sets the cleaning mode of the target analysis device in response to the user's setting command for the cleaning mode of the target analysis device.

[0088] When the analysis device in the sample analysis system is shielded, for example, a failure occurs or a quality control item is out of control, it cannot perform the test work on the sample to be tested. When it is determined that a target analysis device has recovered from the shielded state to the normal state, the processor 50 first controls the target analysis device to start the device, and then controls the target analysis device to start the pre-test preparation work.

[0089] The above are some descriptions of the sample analysis system of the present invention. Some embodiments of the present invention also disclose a control method of the sample analysis system (hereinafter referred to as the control method), and the sample analysis system involved may be the sample analysis system disclosed above.

[0090] Please refer to Figure 8 , the control method of some embodiments may include:

[0091] Step 100: Obtain identification information of the sample to be tested.

[0092] In this embodiment, for example, a barcode or QR code on a sample to be tested may be scanned by a scanning device of the sample analysis system to obtain identification information of the sample to be tested; or identification information of the sample to be tested input by a user may be received. The identification information may include, for example, sample number, sample category, sample source information, etc.

[0093] Step 110: Determine the test items of the sample to be tested according to the identification information of the sample to be tested.

[0094] In this embodiment, after the identification information of the sample to be tested is determined, the test items of the sample to be tested can be determined according to the identification information of the sample to be tested. One sample to be tested can have multiple test items.

[0095] Step 120: Determine a scheduling plan for the sample to be tested according to the test items of the sample to be tested, wherein the scheduling plan at least includes target analysis equipment required to perform the test items on the sample to be tested.

[0096] In this embodiment, after determining the test items of the sample to be tested, the scheduling plan of the sample to be tested can be determined according to the test items of the sample to be tested. The sample analysis system can schedule the sample to be tested according to the scheduling plan of the sample to be tested. The scheduling plan may include the target analysis device that needs to perform the test items on the sample to be tested, and may also include the path for the sample to be tested to reach its target analysis device.

[0097] Optionally, when determining the scheduling plan for the sample to be tested, the load status of each analysis device in the sample analysis system can be further considered to achieve load balancing and further improve the test efficiency. For example, if there are multiple analysis devices in the sample analysis system that can perform the test items of the sample to be tested, the analysis device with a smaller load can be preferentially selected as the target analysis device for the sample to be tested.

[0098] Step 130: When the scheduling plan of the sample to be tested is determined, the target analysis equipment of the sample to be tested is controlled to start the pre-test preparation work.

[0099] In this embodiment, when determining the scheduling plan of the samples to be tested, the target analysis equipment of the samples to be tested is controlled to start the pre-test preparation work, so that the target analysis equipment can start the pre-test preparation work in time to reduce the waiting time after the samples to be tested arrive.

[0100] It can be understood that when the scheduling plan of the samples to be tested is determined, the target analysis equipment of the samples to be tested is controlled to start the pre-test preparation work. After the scheduling plan of the samples to be tested is determined, the samples to be tested are scheduled to the target analysis equipment according to the scheduling plan of the samples to be tested, so that the pre-test preparation work of the target analysis equipment can be carried out in parallel with the scheduling process of the samples to be tested. Compared with the serial method of first scheduling the samples to be tested and then executing the pre-test preparation work of the target analysis equipment, the total test time can be shortened.

[0101] Pre-test preparations may include, for example, cleaning the reaction cup, cleaning the reagent needle, cleaning the sample needle, etc. In this embodiment, controlling the target analysis device of the sample to be tested to start the pre-test preparations may include: controlling the target analysis device of the sample to be tested to start cleaning the reaction cup.

[0102] The control method of the sample analysis system provided in the present embodiment obtains identification information of the sample to be tested, determines the test items of the sample to be tested according to the identification information of the sample to be tested, and determines the scheduling plan of the sample to be tested according to the test items of the sample to be tested. At the same time, when determining the scheduling plan of the sample to be tested, the target analysis device of the sample to be tested is controlled to start the pre-test preparation work, thereby reducing the waiting time after the sample to be tested arrives at the target analysis device, shortening the TAT time of the sample to be tested, and thereby improving the test efficiency and test throughput of the sample analysis system.

[0103] A sample to be tested can have multiple test items, so a sample to be tested can also have multiple target analysis devices; in the case of using a sample rack to carry the samples to be tested, since a sample rack can carry multiple samples to be tested, the test items of multiple samples to be tested can be the same or different, so a sample rack may need to be dispatched to multiple target analysis devices for testing in sequence.

[0104] In view of the situation where there are multiple target analysis devices for the samples to be tested, in order to further improve the test efficiency, based on the above embodiments, in the control method of the sample analysis system provided in this embodiment, when the scheduling plan of the samples to be tested is determined, the target analysis devices of the samples to be tested are also controlled to start the pre-test preparation work, which may include: when there are multiple target analysis devices for the samples to be tested in the scheduling plan, the multiple target analysis devices are controlled to start the pre-test preparation work at the same time. By starting the pre-test preparation work of multiple target analysis devices at the same time, the waiting time after the samples to be tested arrive at each target analysis device can be effectively reduced, thereby improving the test efficiency.

[0105] Optionally, when determining the scheduling rules for the samples to be tested, before controlling the target analysis device for the samples to be tested to start pre-test preparations, first determine whether the target analysis device for the samples to be tested has an analysis device that is not closest to the input module on the track connection; if so, then control the corresponding target analysis device to start pre-test preparations.

[0106] Optionally, controlling the target analysis device of the sample to be tested to start cleaning the reaction cup may include:

[0107] Acquire a cleaning mode of a target analysis device, wherein the cleaning mode includes a sequential cleaning mode and a simultaneous cleaning mode; and control the target analysis device to clean the reaction cup according to the cleaning mode.

[0108] How to obtain the cleaning mode of the target analysis device is described below through two specific embodiments.

[0109] Fig. 9 Flow chart of an embodiment of a method for determining a cleaning mode of a target analysis device provided by the present invention. Fig. 9As shown, in this embodiment, determining the cleaning mode of the target analysis device may include:

[0110] Step 131: Obtain the number of samples to be tested of the target analysis device.

[0111] Step 132, determine whether the number of samples to be tested of the target analysis device is greater than a preset number, if so, execute step 133, otherwise execute step 134.

[0112] Step 133: Determine that the cleaning mode of the target analysis device is a simultaneous cleaning mode.

[0113] Step 134: Determine that the cleaning mode of the target analysis device is a sequential cleaning mode.

[0114] In this embodiment, the cleaning mode of the target analysis device is determined according to the number of samples to be tested of the target analysis device. When the number of samples to be tested is large, the reaction cup is cleaned in a simultaneous cleaning mode, which can shorten the time for cleaning the reaction cup, reduce the time spent on pre-test preparations, and improve test efficiency. When the number of samples to be tested is small, the reaction cup is cleaned in a sequential cleaning mode, which can meet the test requirements and achieve on-demand cleaning, effectively saving the consumption of cleaning fluids and cleaning agents, and reducing the cost of use.

[0115] The target analysis device can receive a user's command to set the cleaning mode, for example, through a button or a touch interface. Therefore, in this embodiment, obtaining the cleaning mode of the target analysis device may include: setting the cleaning mode of the target analysis device in response to the user's command to set the cleaning mode of the target analysis device.

[0116] When the analysis device in the sample analysis system is shielded or fails, the test work on the sample to be tested cannot be performed. When the shielding is cancelled or the failure is restored, in order to enable the analysis device to perform the test work as soon as possible, when it is determined that a target analysis device has recovered from the shielded state to the normal state, the target analysis device is first controlled to start the device, and then the target analysis device is controlled to start the pre-test preparation work.

[0117] This document is described with reference to various exemplary embodiments. However, those skilled in the art will recognize that changes and modifications may be made to the exemplary embodiments without departing from the scope of this document. For example, various operating steps and components for performing the operating steps may be implemented in different ways (e.g., one or more steps may be deleted, modified, or incorporated into other steps) depending on the specific application or considering any number of cost functions associated with the operation of the system.

[0118] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. In addition, as understood by those skilled in the art, the principles of this article can be reflected in a computer program product on a computer-readable storage medium, which is pre-installed with a computer-readable program code. Any tangible, non-temporary computer-readable storage medium can be used, including magnetic storage devices (hard disks, floppy disks, etc.), optical storage devices (CD to ROM, DVD, Blu Ray disks, etc.), flash memory and / or the like. These computer program instructions can be loaded onto a general-purpose computer, a special-purpose computer or other programmable data processing device to form a machine, so that these instructions executed on a computer or other programmable data processing device can generate a device that implements a specified function. These computer program instructions can also be stored in a computer-readable memory, which can instruct a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory can form a manufactured product, including an implementation device that implements a specified function. Computer program instructions can also be loaded onto a computer or other programmable data processing device, so that a series of operating steps are performed on a computer or other programmable device to generate a computer-implemented process, so that the instructions executed on a computer or other programmable device can provide steps for implementing a specified function.

[0119] Although the principles of this invention have been shown in various embodiments, many modifications of structures, arrangements, proportions, elements, materials and components particularly suitable for specific environments and operational requirements can be used without departing from the principles and scope of this invention. The above modifications and other changes or amendments will be included in the scope of this invention.

[0120] The foregoing specific description has been described with reference to various embodiments. However, those skilled in the art will recognize that various modifications and changes can be made without departing from the scope of the present disclosure. Therefore, the consideration of the present disclosure will be illustrative rather than restrictive, and all these modifications will be included in its scope. Similarly, the advantages, other advantages and solutions to the problems of various embodiments have been described above. However, the benefits, advantages, solutions to the problems and any elements that can produce these, or make them more clear, should not be interpreted as critical, necessary or necessary. The term "include" and any other variants used in this article are all non-exclusive inclusions, so that the process, method, article or device including the list of elements not only includes these elements, but also includes other elements that are not explicitly listed or do not belong to the process, method, system, article or device. In addition, the term "coupled" and any other variants used in this article refer to physical connections, electrical connections, magnetic connections, optical connections, communication connections, functional connections and / or any other connections.

[0121] Those skilled in the art will appreciate that many changes may be made to the details of the above-described embodiments without departing from the basic principles of the invention. Therefore, the scope of the present invention should be determined solely by the following claims.

Claims

1. A sample analysis system, characterized in that: include: An input module is used to receive the sample to be tested put in by the user and obtain the identification information of the sample to be tested; A pre-processing module is used to pre-process the sample to be tested received by the input module, and the pre-processing module includes one or more of a centrifugation module, a serum detection module, a decapping module and a dispensing module; the centrifugation module is used to centrifuge the sample to be centrifuged; the serum detection module is used to detect whether the serum volume of the sample is sufficient and / or whether the serum quality of the sample is qualified; the decapping module is used to decap the sample after centrifugation; and the dispensing module is used to sample the sample; A plurality of analysis devices are used to test samples to be tested; the analysis devices include a sample component, a sample dispensing mechanism, a reagent component, a reagent dispensing mechanism, a reaction component, a determination component and a cleaning mechanism; the sample component is used to carry samples; the sample dispensing mechanism is used to draw samples from the sample component and discharge them into a reaction cup to be loaded with samples; the reagent component is used to carry reagents; the reagent dispensing mechanism is used to draw reagents from the reagent component and discharge them into the reaction cup to be loaded with reagents; the reaction component has at least one placement position, the placement position is used to place the reaction cup and incubate the reaction liquid in the reaction cup; the determination component is used to measure the reaction liquid after incubation to obtain the test data of the sample; the cleaning mechanism is used to clean the reaction cup; A post-processing module, the post-processing module comprising one or more of a filming / capping module, a cold storage module and a film / capping removal module; the filming / capping module is used to film or cap the sample; the cold storage module is used to store the sample; the film / capping removal module is used to remove the film or cap from the sample; A track, used to sequentially connect the input module, the pre-processing module, the plurality of analysis devices and the post-processing module; A scheduling device, used for scheduling the samples to be tested through the track according to the scheduling plan of the samples to be tested; as well as The processor is used to determine the test items of the sample to be tested according to the identification information of the sample to be tested obtained by the input module, and determine the scheduling plan of the sample to be tested according to the test items of the sample to be tested, wherein the scheduling plan includes all target analysis devices that need to perform their test items on the sample to be tested, and the path for the sample to be tested to reach its target analysis device; according to the target analysis device of the sample to be tested determined in the scheduling plan, the processor also determines whether the target analysis device of the sample to be tested has an analysis device that is not closest to the pre-processing module on the track connection, and if so, the processor also controls the corresponding target analysis device to start its cleaning mechanism to clean the reaction cup, so that the cleaning and the scheduling process of scheduling the sample to be tested to the corresponding target analysis device are carried out in parallel.

2. A sample analysis system, characterized in that: include: An input module is used to receive the sample to be tested put in by the user and obtain the identification information of the sample to be tested; At least two cascaded analytical devices for testing the sample to be tested; A track for connecting the input module and the plurality of analysis devices; A scheduling device, used for scheduling the samples to be tested through the track according to the scheduling plan of the samples to be tested; A processor is used to determine the test items of the samples to be tested based on the identification information of the samples to be tested obtained by the input module, and determine the scheduling plan of the samples to be tested based on the test items of the samples to be tested, wherein the scheduling plan at least includes the target analysis equipment that needs to perform its test items on the samples to be tested; based on the target analysis equipment of the samples to be tested determined in the scheduling plan, the processor also controls the target analysis equipment that is not closest to the input module on the track connection to start pre-test preparation work before scheduling the samples to be tested to the target analysis equipment.

3. The sample analysis system according to claim 2, characterized in that: When determining the scheduling plan for the samples to be tested, the processor first determines whether there is an analysis device among the target analysis devices of the samples to be tested that is not closest to the input module on the track connection before controlling the target analysis device of the samples to be tested to start the pre-test preparation work. If so, the processor then controls the corresponding target analysis device to start the pre-test preparation work.

4. The sample analysis system according to claim 1 or 2, characterized in that: When there are multiple target analysis devices for the samples to be tested in the scheduling plan, the processor controls the multiple target analysis devices to start the pre-test preparation work simultaneously.

5. The sample analysis system according to claim 1 or 2, characterized in that: The analysis device comprises a sample component, a sample dispensing mechanism, a reagent component, a reagent dispensing mechanism, a reaction component, a determination component and a cleaning mechanism; the sample component is used to carry samples; the sample dispensing mechanism is used to draw samples from the sample component and discharge them into a reaction cup to be added with samples; the reagent component is used to carry reagents; the reagent dispensing mechanism is used to draw reagents from the reagent component and discharge them into a reaction cup to be added with reagents; the reaction component has at least one placement position, and the placement position is used to place the reaction cup and incubate the reaction liquid in the reaction cup; the determination component is used to measure the reaction liquid after incubation to obtain the test data of the sample; the cleaning mechanism is used to clean the reaction cup; The processor controls the target analysis device of the sample to be tested to start the pre-test preparation work, including: the processor controls the target analysis device of the sample to be tested to start its cleaning mechanism to clean the reaction cup.

6. The sample analysis system according to claim 5, characterized in that: The target analysis device controls its cleaning mechanism to clean the reaction cup according to a cleaning mode, and the cleaning mode includes a sequential cleaning mode and a simultaneous cleaning mode.

7. The sample analysis system according to claim 6, characterized in that: For any target analysis device, the processor obtains the number of samples to be tested of the target analysis device, and determines a cleaning mode of the target analysis device according to the number of samples to be tested of the target analysis device; When the number of samples to be tested of the target analysis device is greater than a preset number, the processor determines that the cleaning mode of the target analysis device is a simultaneous cleaning mode; Otherwise, the processor determines that the cleaning mode of the target analysis device is a sequential cleaning mode.

8. The sample analysis system according to claim 6, characterized in that: For any target analysis device, the processor sets the cleaning mode of the target analysis device in response to a user's command to set the cleaning mode of the target analysis device.

9. The sample analysis system according to claim 1 or 2, characterized in that: When it is determined that a target analysis device is restored from a shielded state to a normal state, the processor first controls the target analysis device to start the device, and then controls the target analysis device to start pre-test preparation work.

10. A control method for a sample analysis system, the sample analysis system comprising a plurality of cascaded analysis devices, characterized in that: The control method comprises: Obtaining identification information of the sample to be tested; Determine the test items of the sample to be tested according to the identification information of the sample to be tested; Determine a scheduling plan for the sample to be tested according to the test items of the sample to be tested; wherein the scheduling plan at least includes a target analysis device required to perform the test items on the sample to be tested; The target analysis device that is not closest to the input module on the track connection is controlled to start the pre-test preparation work before dispatching the sample to be tested to the target analysis device.

11. The control method according to claim 10, characterized in that: When determining the scheduling plan for the samples to be tested, before controlling the target analysis equipment for the samples to be tested to start pre-test preparations, first determine whether the target analysis equipment for the samples to be tested has an analysis equipment that is not closest to the pre-processing module on the track connection. If so, then control the corresponding target analysis equipment to start pre-test preparations.

12. The control method according to claim 11, characterized in that: When the scheduling plan of the sample to be tested is determined, the target analysis device of the sample to be tested is also controlled to start the pre-test preparation work, including: when there are multiple target analysis devices for the sample to be tested in the scheduling plan, the multiple target analysis devices are controlled to start the pre-test preparation work simultaneously.

13. The control method according to any one of claims 10 to 12, characterized in that: Controlling the target analysis device of the sample to be tested to start the preparatory work before the test includes: controlling the target analysis device of the sample to be tested to start the cleaning of the reaction cup.

14. The control method according to claim 13, characterized in that: The control of the target analysis device of the sample to be tested to start cleaning the reaction cup includes: Acquire a cleaning mode of a target analysis device, wherein the cleaning mode includes a sequential cleaning mode and a simultaneous cleaning mode; The target analysis device is controlled to clean the cuvette according to its cleaning mode.

15. The control method according to claim 14, characterized in that: The step of obtaining the cleaning mode of the target analysis device includes: Obtaining the number of samples to be tested of the target analysis device, and determining a cleaning mode of the target analysis device according to the number of samples to be tested of the target analysis device; When the number of samples to be tested of the target analysis device is greater than a preset number, the cleaning mode of the target analysis device is determined to be a simultaneous cleaning mode; otherwise, the cleaning mode of the target analysis device is determined to be a sequential cleaning mode.

16. The control method according to claim 14, characterized in that: The acquiring the cleaning mode of the target analysis device includes: responding to a setting command for the cleaning mode of the target analysis device from a user, setting the cleaning mode of the target analysis device.

17. The control method according to claim 10, characterized in that: When it is determined that a target analysis device is restored from a shielded state to a normal state, the target analysis device is first controlled to start the device, and then the target analysis device is controlled to start the pre-test preparation work.

18. A computer-readable storage medium, characterized in that: The method comprises a program which can be executed by a processor to implement the method according to any one of claims 10 to 17.

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