Device fluency testing method, device, electronic device and storage medium

Abstract

The embodiment of the present application provides a method, device, electronic device and storage medium for testing the fluency of a device. The method includes: sliding a test information list according to a preset sliding speed and a preset sliding direction; obtaining the average frame rate of image frames during the sliding of the test information list, and the standard deviation of the generation time difference between each two adjacent image frames during the sliding of the test information list; based on the average frame rate and the standard deviation, determining the test result of the fluency of the device. The technical solution provided by the embodiment of the present application can accurately determine the fluency of the device and improve the accuracy of the evaluation of the device performance.

Description

Technical Field

[0001] The present application relates to the field of computer technology, and in particular to a method, device, electronic device and storage medium for testing device fluency. Background Art

[0002] For electronic devices, especially mobile devices, Frame Per Second (FPS), also known as frame rate, is an important indicator for evaluating the fluency of the device. In dynamic scenes, the higher the frame rate, the better the rendering performance of the device and the better the fluency of the device. The lower the frame rate, the worse the rendering performance of the device and the worse the fluency of the device. When the device has poor fluency, the device is prone to freeze when playing pictures.

[0003] Based on the above problems, there is an urgent need for a device fluency testing method based on frame rate to accurately determine the fluency of the device and then accurately evaluate the performance of the device. Summary of the invention

[0004] The purpose of the embodiments of the present application is to provide a method, apparatus, electronic device and storage medium for testing the fluency of a device, so as to accurately determine the fluency of the device and improve the accuracy of the evaluation of the device performance.

[0005] The specific technical solutions are as follows:

[0006] In a first aspect, an embodiment of the present application provides a method for testing the fluency of a device, the method comprising:

[0007] Slide test information list according to preset sliding speed and preset sliding direction;

[0008] Obtaining an average frame rate of image frames during the sliding of the test information list, and a standard deviation of a generation time difference between every two adjacent image frames during the sliding of the test information list;

[0009] Based on the average frame rate and the standard deviation, a test result of the device fluency is determined.

[0010] Optionally, the step of sliding the test information list according to a preset sliding speed and a preset sliding direction includes:

[0011] Start from the top of the test information list and slide down to the bottom of the test information list at the preset sliding speed;

[0012] According to the preset sliding speed, start from the bottom of the test information list and slide upward to the top of the test information list.

[0013] Optionally, the method further includes:

[0014] In the first set, the generation time of each image frame during the sliding process of the test information list is recorded;

[0015] Calculate the generation time difference between every two adjacent image frames and record it in the second set;

[0016] The step of obtaining the average frame rate of the image frames during the sliding of the test information list and the standard deviation of the generation time difference between each two adjacent image frames during the sliding of the test information list includes:

[0017] Calculate the difference between the generation time of the last record in the first set and the generation time of the first record as the monitoring duration; determine the average frame rate according to the number of elements included in the first set and the monitoring duration, as the average frame rate of the image frame during the sliding process of the test information list;

[0018] The standard deviation of the generation time differences included in the second set is determined as the standard deviation of the generation time differences between every two adjacent image frames during the sliding process of the test information list.

[0019] Optionally, the method further includes:

[0020] Before sliding the test information list, generating a listener;

[0021] During the sliding of the test information list, the generation of each image frame during the sliding of the test information list is monitored through the listener to obtain the generation time of each image frame.

[0022] Optionally, the method further includes:

[0023] After the test information list slides, the listener is removed.

[0024] Optionally, the step of determining the test result of the device fluency based on the average frame rate and the standard deviation includes:

[0025] The following formula is used to determine the test score of the device fluency:

[0026] Q = A_FPS*(1-σ / 100);

[0027] Wherein, Q is the test score of the device fluency, A_FPS is the average frame rate, and σ is the standard deviation;

[0028] The test score is used as a test result of the fluency of the device.

[0029] In a second aspect, an embodiment of the present application provides a device for testing fluency of a device, the device comprising:

[0030] A sliding unit, used for sliding the test information list according to a preset sliding speed and a preset sliding direction;

[0031] An acquisition unit, used to acquire an average frame rate of image frames during the sliding of the test information list, and a standard deviation of a generation time difference between every two adjacent image frames during the sliding of the test information list;

[0032] A determination unit is used to determine a test result of the device fluency based on the average frame rate and the standard deviation.

[0033] Optionally, the sliding unit is specifically used for:

[0034] Start from the top of the test information list and slide down to the bottom of the test information list at the preset sliding speed;

[0035] According to the preset sliding speed, start from the bottom of the test information list and slide upward to the top of the test information list.

[0036] Optionally, the device further comprises:

[0037] A recording unit, used to record, in the first set, the generation time of each image frame during the sliding process of the test information list; calculate the generation time difference between each two adjacent image frames, and record it in the second set;

[0038] The acquisition unit is specifically used to calculate the difference between the generation time of the last record in the first set and the generation time of the first record as the monitoring duration; determine the average frame rate according to the number of elements included in the first set and the monitoring duration, as the average frame rate of the image frames during the sliding of the test information list; determine the standard deviation of the generation time differences included in the second set, as the standard deviation of the generation time differences between each two adjacent image frames during the sliding of the test information list.

[0039] Optionally, the device further comprises:

[0040] The monitoring unit is used to generate a monitor before sliding the test information list; during the sliding of the test information list, the monitor is used to monitor the generation of each image frame during the sliding of the test information list to obtain the generation time of each image frame.

[0041] Optionally, the device further comprises:

[0042] The removal unit is used to remove the listener after the sliding of the test information list ends.

[0043] Optionally, the determining unit is specifically configured to:

[0044] The following formula is used to determine the test score of the device fluency:

[0045] Q = A_FPS*(1-σ / 100);

[0046] Wherein, Q is the test score of the device fluency, A_FPS is the average frame rate, and σ is the standard deviation;

[0047] The test score is used as a test result of the fluency of the device.

[0048] In a third aspect, an embodiment of the present application provides an electronic device, including a processor, a communication interface, a memory, and a communication bus, wherein the processor, the communication interface, and the memory communicate with each other through the communication bus;

[0049] The memory is used to store computer programs;

[0050] The processor is used to implement any of the steps of the device fluency testing method when executing the program stored in the memory.

[0051] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the computer program implements any of the steps of the device fluency testing method.

[0052] The embodiment of the present application also provides a computer program, which, when executed on a computer, enables the computer to execute any of the steps of the device fluency testing method.

[0053] Beneficial effects of the embodiments of the present application:

[0054] In the technical solution provided by the embodiment of the present application, the average frame rate and standard deviation of the image frame during the sliding of the test information list are used to score the device fluency and determine the test result of the device fluency. Since the standard deviation is taken into account when scoring the device fluency, that is, the distribution law of the generation time of the image frame is taken into account, the determined test result of the device fluency can accurately determine the fluency of the device, thereby improving the accuracy of the device performance evaluation.

[0055] Of course, implementing any product or method of the present application does not necessarily require achieving all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0056] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other embodiments can be obtained based on these drawings without paying any creative work.

[0057] Figure 1 A first flow chart of a method for testing device fluency provided in an embodiment of the present application;

[0058] Figure 2 A schematic diagram of a news list provided in an embodiment of the present application;

[0059] Figure 3 A schematic diagram of a device screen provided in an embodiment of the present application;

[0060] Figure 4 A second flow chart of the device fluency testing method provided in the embodiment of the present application;

[0061] Figure 5 A third flow chart of the device fluency testing method provided in the embodiment of the present application;

[0062] Figure 6 A schematic diagram of a structure of a device fluency testing device provided in an embodiment of the present application;

[0063] Figure 7 A flow chart of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0064] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0065] The following is an explanation of the terms that appear in the embodiments of the present application.

[0066] Frame rate is an indicator used to measure the rendering capability of a device. The higher the frame rate, the stronger the rendering capability of the device, and the more image frames the device can render in 1 second.

[0067] In dynamic scenes, if the FPS is too low, it will cause "stuttering" and the device fluency will be low. There are many factors that lead to low FPS, such as poor performance of the central processing unit (CPU), graphics processing unit (GPU), memory and flash memory, and low code efficiency of applications (Applications, Apps).

[0068] In order to accurately determine the fluency of a device and then accurately evaluate the performance of the device, the present application embodiment provides a method for testing the fluency of a device, which can be applied to electronic devices such as mobile phones, tablet computers, and personal computers. For ease of understanding, the following description is made using an electronic device as an example, which is not limiting.

[0069] In the device fluency test method provided in the embodiment of the present application, the average frame rate and standard deviation of the image frame during the sliding of the test information list are used to score the device fluency and determine the device fluency test result. Since the standard deviation is taken into account when scoring the device fluency, that is, the distribution law of the generation time of the image frame is taken into account, the determined device fluency test result can accurately determine the fluency of the device, thereby improving the accuracy of the device performance evaluation.

[0070] The following is a detailed description of the device fluency testing method provided in the embodiments of the present application through specific examples.

[0071] refer to Figure 1 As shown, Figure 1 A first flow chart of a method for testing device fluency provided in an embodiment of the present application is provided, and the method comprises the following steps.

[0072] Step S11, sliding the test information list according to a preset sliding speed and a preset sliding direction.

[0073] In an embodiment of the present application, the test information list includes multiple test information, such as 120, 130, or 150 test information. The height of each test information is the same, such as the height of each test information is 100 pixels, 150 pixels, or 200 pixels. The test information can be news, search information, etc. Correspondingly, the test information list can be a pre-set news list, search information list, etc.

[0074] Take the test information as news, and the test information list as a news list as an example for explanation. The news list includes multiple news items, and each news item includes a title, news introduction, source, and release time, etc. Figure 2 shown.

[0075] In addition, the height of the test information list is greater than the screen height of the electronic device. Figure 3 The screen of the electronic device shown shows part of the information of the test information list.

[0076] The preset sliding speed and preset sliding direction can be set according to actual needs. For example, the preset sliding speed can be set according to the sliding speed at which the user can see the text clearly. The preset sliding direction can be sliding downward, or sliding downward first and then sliding upward, etc.

[0077] In one embodiment, the test information list may include 120 test information, and the preset sliding direction is to slide down first and then slide up. The entire test process of sliding the test information list at the preset sliding speed takes 18 seconds. In this case, the test time is neither too long nor too short, which enables the user to clearly observe the entire test process and further understand the fluency performance of the device.

[0078] Step S12, obtaining an average frame rate of the image frames during the sliding of the test information list, and a standard deviation of the generation time difference between every two adjacent image frames during the sliding of the test information list.

[0079] During the sliding process of the test information list, the electronic device continuously generates image frames and displays them on the screen. After the sliding process of the test information list ends, the electronic device can obtain the average frame rate of the image frames during the sliding process of the test information list and the standard deviation of the generation time difference between each two adjacent image frames during the sliding process of the test information list.

[0080] For example, during the sliding of the test information list, the electronic device generates 10 image frames, namely image frames 1-10. The electronic device can obtain the average frame rate of the generated image frames 1-10, and in addition, calculate the generation time difference between each two adjacent image frames, obtain 9 generation time differences, and calculate the standard deviation of these 9 generation time differences. At this time, the electronic device obtains the average frame rate of the image frames during the sliding of the test information list and the standard deviation of the generation time difference between each two adjacent image frames.

[0081] Step S13, determining the test result of the device fluency based on the average frame rate and the standard deviation.

[0082] In the embodiment of the present application, based on the average frame rate and standard deviation obtained in the above step S12, the test result of the device fluency is determined.

[0083] In one embodiment of the present application, the electronic device may determine the test score of the device fluency using the following formula:

[0084] Q = A_FPS*(1-σ / 100);

[0085] Among them, Q is the test score of device fluency, A_FPS is the average frame rate, and σ is the standard deviation;

[0086] The electronic device may use the test score Q as a test result of the fluency of the device.

[0087] In another embodiment of the present application, the electronic device may determine the test score of the device fluency using the following formula:

[0088]

[0089] Among them, Q' is the test score of device fluency, A_FPS is the average frame rate, and σ is the standard deviation;

[0090] The electronic device may use the test score Q' as a test result of the fluency of the device.

[0091] In the embodiment of the present application, the electronic device may also determine the test result of the device fluency based on the average frame rate and the standard deviation in other ways, which is not limited to this.

[0092] In the technical solution provided by the embodiment of the present application, the average frame rate and standard deviation of the image frame during the sliding of the test information list are used to score the device fluency and determine the test result of the device fluency. Since the standard deviation is taken into account when scoring the device fluency, that is, the distribution law of the generation time of the image frame is taken into account, the determined test result of the device fluency can accurately determine the fluency of the device, thereby improving the accuracy of the device performance evaluation.

[0093] In one embodiment of the present application, the present application also provides a method for testing the fluency of a device. Figure 4 , Figure 4 This is a second flow chart of the method for testing the fluency of a device provided in an embodiment of the present application. In this method, step S11 can be refined into the following steps.

[0094] Step S111, sliding from the top of the test information list to the bottom of the test information list at a preset sliding speed.

[0095] Step S112, sliding upward from the bottom of the test information list to the top of the test information list at a preset sliding speed.

[0096] In the embodiment of the present application, the preset sliding direction is to slide downward first and then slide upward. The electronic device first presets the sliding speed, starts from the top of the test information list, slides downward to the bottom of the test information list, and then, according to the preset sliding speed, starts from the bottom of the test information list and slides upward to the top of the test information list. At this time, the user can intuitively preview all the test information included in the test information list from two sliding directions, and can more intuitively understand the entire test process.

[0097] In one embodiment of the present application, the present application also provides a method for testing the fluency of a device. Figure 5 , Figure 5 The third flow chart of the device fluency testing method provided in the embodiment of the present application, the method may also include steps S14 and S15. In this case, step S12 may be refined into the following steps S121, S122 and S123.

[0098] Step S11, sliding the test information list according to a preset sliding speed and a preset sliding direction.

[0099] Step S14: in the first set, the generation time of each image frame during the sliding process of the test information list is recorded.

[0100] Step S15, calculating the generation time difference between every two adjacent image frames and recording it in the second set.

[0101] In an embodiment of the present application, a first set and a second set are preset and created in the electronic device. In the process of sliding the test information list according to a preset sliding speed and a preset sliding direction, the electronic device continuously generates image frames, obtains the generation time of the image frames, and records them in the first set. In addition, based on the generation time recorded in the first set, the electronic device calculates the generation time difference between each two adjacent image frames and records them in the second set. At the end of the test information list sliding process, the first set records multiple generation times, and the second set records multiple generation time differences.

[0102] In one embodiment of the present application, in order to facilitate recording the generation time of each image frame, the electronic device generates a listener before sliding the test information list. In this way, during the sliding of the test information list, the electronic device monitors the generation of each image frame during the sliding of the test information list through the listener, obtains the generation time of each image frame, and records the generation time of each image frame in the first set.

[0103] In one embodiment, the electronic device may call a Choreographer (dance conductor) function (such as Choreographer.getInstance().postFrameCallback()) to generate a listener.

[0104] In one embodiment of the present application, in order to save storage space of the device, the electronic device removes the listener after the test information list slides to the end.

[0105] In one embodiment, the electronic device may call a Choreographer function (eg, Choreographer.getInstance().removeFrameCallback()) to remove the listener.

[0106] Step S121, calculating the difference between the generation time of the last record in the first set and the generation time of the first record as the monitoring duration.

[0107] In the embodiment of the present application, the first generation time recorded in the first set is the start time of monitoring, and the last generation time recorded in the first set is the end time of monitoring. The electronic device calculates the difference between the generation time of the last record in the first set and the generation time of the first record, and the obtained duration can be used as the monitoring duration.

[0108] Step S122: determining an average frame rate according to the number of elements included in the first set and the monitoring duration, as the average frame rate of the image frames during the sliding process of the test information list.

[0109] In an embodiment of the present application, the number of elements included in the first set may represent the total number of image frames generated. The electronic device may determine an average frame rate based on the number of elements included in the first set and the monitoring duration. The average frame rate is the average frame rate of the image frames during the sliding of the test information list.

[0110] For example, the number of elements included in the first set is 100, and the monitoring duration is 5 seconds. Then, during the sliding process of the test information list, the average frame rate of the image frame is 100 / 5=20 frames / second.

[0111] Step S123: determining the standard deviation of the generation time differences included in the second set as the standard deviation of the generation time differences between every two adjacent image frames during the sliding process of the test information list.

[0112] In the embodiment of the present application, the electronic device can calculate the standard deviation of the generated time difference using the normal distribution formula, as follows:

[0113]

[0114] In the above formula, σ represents the standard deviation of the generation time difference between each two adjacent image frames during the sliding process of the test information list, N represents the number of generation time differences included in the second set, and x irepresents the i-th generation time difference in the second set, and μ represents the mean value of the generation time differences included in the second set.

[0115] Step S13, determining a test result of device fluency based on the average frame rate and the standard deviation.

[0116] In an embodiment of the present application, a first set and a second set are created in an electronic device. In the first set and the second set, the generation time of the image frame and the generation time difference between two adjacent image frames are recorded respectively. Subsequently, the average frame rate and the standard deviation are determined directly based on the information recorded in the first set and the second set, thereby improving the efficiency of the device fluency test.

[0117] In the embodiment of the present application, other methods may also be used to determine the average frame rate of the image frames and the standard deviation of the generated time difference during the sliding process of the test information list, and there is no limitation on this.

[0118] For example, the electronic device sets a timer. When the sliding test information list starts, the electronic device starts the timer. During the sliding process of the test information list, the electronic device accumulates the number of generated image frames, and uses the timer to determine the generation time difference between each two adjacent image frames. After the sliding process of the test information list ends, the electronic device uses the accumulated duration of the timer as the monitoring duration, and determines the average frame rate of the image frames during the sliding process of the test information list based on the accumulated number of image frames and the monitoring duration, and determines the generation time difference between each two adjacent image frames based on the determination, and determines the standard deviation of the generation time difference between each two adjacent image frames during the sliding process of the test information list.

[0119] Corresponding to the above-mentioned device fluency testing method, the present application embodiment also provides a device fluency testing device, see Figure 6 , Figure 6 A schematic diagram of a structure of a device fluency testing device provided in an embodiment of the present application, the device comprising:

[0120] A sliding unit 61, used for sliding the test information list according to a preset sliding speed and a preset sliding direction;

[0121] An acquisition unit 62 is used to acquire an average frame rate of image frames during the sliding of the test information list, and a standard deviation of a generation time difference between every two adjacent image frames during the sliding of the test information list;

[0122] The determination unit 63 is used to determine the test result of the device fluency based on the average frame rate and the standard deviation.

[0123] In one embodiment of the present application, the sliding unit 61 can be specifically used for:

[0124] Start from the top of the test information list and slide down to the bottom of the test information list at the preset sliding speed;

[0125] Start from the bottom of the test information list and slide upward to the top of the test information list at the preset sliding speed.

[0126] In one embodiment of the present application, the device for testing the fluency of the device may further include:

[0127] A recording unit, used to record, in the first set, the generation time of each image frame during the sliding process of the test information list; calculate the generation time difference between each two adjacent image frames, and record it in the second set;

[0128] The acquisition unit 62 can be specifically used to calculate the difference between the generation time of the last record in the first set and the generation time of the first record as the monitoring duration; determine the average frame rate according to the number of elements included in the first set and the monitoring duration, as the average frame rate of the image frames during the sliding of the test information list; determine the standard deviation of the generation time difference included in the second set, as the standard deviation of the generation time difference between each two adjacent image frames during the sliding of the test information list.

[0129] In one embodiment of the present application, the device for testing the fluency of the device may further include:

[0130] The monitoring unit is used to generate a monitor before sliding the test information list; during the sliding of the test information list, the monitor monitors the generation of each image frame during the sliding of the test information list to obtain the generation time of each image frame.

[0131] In one embodiment of the present application, the device for testing the fluency of the device may further include:

[0132] The removal unit is used to remove the listener after the test information list slides.

[0133] In one embodiment of the present application, the determining unit 63 may be specifically configured to:

[0134] Use the following formula to determine the test score of device fluency:

[0135] Q = A_FPS*(1-σ / 100);

[0136] Among them, Q is the test score of device fluency, A_FPS is the average frame rate, and σ is the standard deviation;

[0137] The test score is used as the test result of the device fluency.

[0138] In the technical solution provided by the embodiment of the present application, the average frame rate and standard deviation of the image frame during the sliding of the test information list are used to score the device fluency and determine the test result of the device fluency. Since the standard deviation is taken into account when scoring the device fluency, that is, the distribution law of the generation time of the image frame is taken into account, the determined test result of the device fluency can accurately determine the fluency of the device, thereby improving the accuracy of the device performance evaluation.

[0139] Corresponding to the above-mentioned device fluency testing method, the present application embodiment also provides an electronic device, such as Figure 7 As shown, it includes a processor 71, a communication interface 72, a memory 73 and a communication bus 74, wherein the processor 71, the communication interface 72, and the memory 73 communicate with each other through the communication bus 74.

[0140] A memory 73, for storing computer programs;

[0141] The processor 71 is used to execute the program stored in the memory 73 to achieve the above Figure 1-5 Any of the above-mentioned testing methods and steps for device fluency.

[0142] The communication bus mentioned in the above electronic device can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. The communication bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, only one thick line is used in the figure, but it does not mean that there is only one bus or one type of bus.

[0143] The communication interface is used for communication between the above electronic device and other devices.

[0144] The memory may include a random access memory (RAM) or a non-volatile memory (NVM), such as at least one disk memory. Optionally, the memory may also be at least one storage device located away from the aforementioned processor.

[0145] The above-mentioned processor can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0146] In another embodiment provided in the present application, a computer-readable storage medium is further provided, wherein a computer program is stored in the computer-readable storage medium, and when the computer program is executed by a processor, the above-mentioned Figure 1-5 Any of the above-mentioned testing methods and steps for device fluency.

[0147] In another embodiment provided by the present application, a computer program is also provided, which, when executed on a computer, enables the computer to execute the above Figure 1-5 Any of the above-mentioned testing methods and steps for device fluency.

[0148] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented using software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions may be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium, for example, the computer instructions may be transmitted from a website site, computer, server or data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) mode to another website site, computer, server or data center. The computer-readable storage medium may be any available medium that a computer can access or a data storage device such as a server or data center that includes one or more available media integrated. The available medium may be a magnetic medium, (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state drive Solid State Disk (SSD)), etc.

[0149] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0150] Each embodiment in this specification is described in a related manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the device, electronic device, computer-readable storage medium, and computer program embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiments.

[0151] The above description is only a preferred embodiment of the present application and is not intended to limit the protection scope of the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application are included in the protection scope of the present application.

Claims

1. A method for testing device fluency, characterized in that: Applied to electronic equipment, the method comprises: Slide the test information list according to a preset sliding speed and a preset sliding direction; the height of the test information list is greater than the height of the electronic device; In the first set, the generation time of each image frame during the sliding process of the test information list is recorded; Calculate the generation time difference between every two adjacent image frames and record it in the second set; Obtain the average frame rate of the image frames during the sliding of the test information list, and the standard deviation of the generation time difference between each two adjacent image frames during the sliding of the test information list; the step of obtaining the average frame rate of the image frames during the sliding of the test information list, and the standard deviation of the generation time difference between each two adjacent image frames during the sliding of the test information list, comprises: calculating the difference between the generation time of the last record and the generation time of the first record in the first set as the monitoring duration; determining the average frame rate according to the number of elements included in the first set and the monitoring duration as the average frame rate of the image frames during the sliding of the test information list; determining the standard deviation of the generation time difference included in the second set as the standard deviation of the generation time difference between each two adjacent image frames during the sliding of the test information list; the average frame rate is the ratio of the number of elements included in the first set to the monitoring duration; Based on the average frame rate and the standard deviation, a test result of the device fluency is determined.

2. The method according to claim 1, characterized in that The step of sliding the test information list according to the preset sliding speed and the preset sliding direction includes: Start from the top of the test information list and slide down to the bottom of the test information list at the preset sliding speed; According to the preset sliding speed, start from the bottom of the test information list and slide upward to the top of the test information list.

3. The method according to claim 1, characterized in that The method further comprises: Before sliding the test information list, generating a listener; During the sliding of the test information list, the generation of each image frame during the sliding of the test information list is monitored through the listener to obtain the generation time of each image frame.

4. The method according to claim 3, characterized in that The method further comprises: After the test information list slides, the listener is removed.

5. The method according to any one of claims 1 to 4, characterized in that: The step of determining the test result of the device fluency based on the average frame rate and the standard deviation includes: The following formula is used to determine the test score of the device fluency: Q = A_FPS*(1-σ / 100); Wherein, Q is the test score of the device fluency, A_FPS is the average frame rate, and σ is the standard deviation; The test score is used as a test result of the fluency of the device.

6. A device for testing the fluency of an equipment, characterized in that: Applicable to electronic equipment; the device comprises: A sliding unit, used to slide the test information list according to a preset sliding speed and a preset sliding direction; the height of the test information list is greater than the height of the electronic device; A recording unit, used to record, in the first set, the generation time of each image frame during the sliding process of the test information list; calculate the generation time difference between each two adjacent image frames, and record it in the second set; An acquisition unit, used for acquiring an average frame rate of image frames during the sliding of the test information list, and a standard deviation of the generation time difference between each two adjacent image frames during the sliding of the test information list; the acquisition unit is specifically used for calculating the difference between the generation time of the last record and the generation time of the first record in the first set as the monitoring duration; determining an average frame rate according to the number of elements included in the first set and the monitoring duration as the average frame rate of image frames during the sliding of the test information list; determining the standard deviation of the generation time difference included in the second set as the standard deviation of the generation time difference between each two adjacent image frames during the sliding of the test information list; the average frame rate is the ratio of the number of elements included in the first set to the monitoring duration; A determination unit is used to determine a test result of the device fluency based on the average frame rate and the standard deviation.

7. The device according to claim 6, characterized in that The sliding unit is specifically used for: Start from the top of the test information list and slide down to the bottom of the test information list at the preset sliding speed; According to the preset sliding speed, start from the bottom of the test information list and slide upward to the top of the test information list.

8. The device according to claim 6, characterized in that The device also includes: The monitoring unit is used to generate a monitor before sliding the test information list; during the sliding of the test information list, the monitor is used to monitor the generation of each image frame during the sliding of the test information list to obtain the generation time of each image frame.

9. The device according to claim 8, characterized in that The device also includes: The removal unit is used to remove the listener after the sliding of the test information list ends.

10. The device according to any one of claims 6 to 9, characterized in that: The determining unit is specifically configured to: The following formula is used to determine the test score of the device fluency: Q = A_FPS*(1-σ / 100); Wherein, Q is the test score of the device fluency, A_FPS is the average frame rate, and σ is the standard deviation; The test score is used as a test result of the fluency of the device.

11. An electronic device, characterized in that: It includes a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other through the communication bus; The memory is used to store computer programs; The processor is used to implement the method described in any one of claims 1-5 when executing the program stored in the memory.

12. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method according to any one of claims 1 to 5 is implemented.

Images