Screen testing method and device

By pre-installing or downloading the test program on the PCB board, determining the target GPIO interface identifier based on the screen model to be tested, and directly conducting tests, solving the problem of inefficiency of traditional screen testing methods, improving testing efficiency and simplifying the process.

CN112835757BActive Publication Date: 2024-12-27SHENZHEN ATEKO PHOTOELECTRICITY CO LTD
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Patent Information

Application Number
CN202110178879.9
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2021-02-08
Publication Date
2024-12-27
Estimated Expiration
2041-02-08

AI Technical Summary

Technical Problem

Traditional screen testing methods are inefficient, and it is necessary to configure the GPIO interface according to different models of PCB boards and write the initialization code repeatedly, resulting in a cumbersome test process.

Method used

Provide a screen testing method, by pre-installing or downloading the test program on the main control chip of the PCB board, obtaining the model of the screen to be tested to determine the target GPIO interface identifier, and directly conducting tests through the target GPIO to avoid repeated writing of the test program.

Benefits of technology

Improves the efficiency of screen testing, reduces the repeated configuration and writing process of different models of PCB boards, and simplifies the testing process.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present application is applicable to the field of screen testing technology, and provides a screen testing method applied to a test system, wherein the test system includes a test printed circuit board PCB, the test PCB includes a main control chip and a general serial input and output interface GPIO, and the test method includes: obtaining a test program for testing the screen to be tested; receiving an operation instruction for testing the screen to be tested, and in response to the operation instruction, the main control chip runs the test program; obtaining the interface identifier of the target GPIO for the main control chip to communicate with the screen to be tested; determining the target GPIO based on the interface identifier, and the main control chip tests the screen to be tested through the target GPIO. Through the method of the present application, the problem of low efficiency of traditional screen testing can be solved and the efficiency of screen testing can be improved.
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Description

Technical Field

[0001] The present application belongs to the field of screen testing technology, and in particular, relates to a screen testing method and device. Background Art

[0002] Before screens are released to the market, engineers test them to identify and fix any problems they may have.

[0003] During the test, the screen and printed circuit board (PCB) are connected together, where the PCB board includes a main control chip, a general-purpose serial input / output interface (GPIO), etc., and the screen includes a screen integrated circuit (IC). The PCB board communicates with the screen and other peripherals through the GPIO soldered thereon.

[0004] Usually, engineers need to first configure the target GPIO for communicating with the screen, then write the test code according to the specific target GPIO interface identifier, compile the test code and burn it to the main control chip of the PCB board, then the PCB board simulates the serial peripheral interface (SPI) signal according to the compiled test program, and sends the SPI signal to the screen IC through the aforementioned target GPIO, and the screen performs an initialization test according to the SPI signal.

[0005] However, since different manufacturers may produce different types of PCB boards, when using different types of PCB boards to test the screen, engineers need to configure the GPIO of each PCB board according to the model of the screen, and then rewrite the initialization code according to the configured target GPIO interface identifier. When there are a large number of different types of PCB boards, the above process of writing initialization code must be repeated many times, resulting in low screen testing efficiency. Summary of the invention

[0006] The embodiments of the present application provide a testing method and device, which can solve the problem of low testing efficiency of traditional screen testing methods.

[0007] In a first aspect, an embodiment of the present application provides a screen testing method, which is applied to a test system, wherein the test system includes a test printed circuit board PCB, wherein the test PCB includes a main control chip and a general serial input and output interface GPIO, and the method includes: obtaining a test program for testing a screen to be tested; receiving an operation instruction for testing the screen to be tested, and in response to the operation instruction, the main control chip runs the test program; obtaining an interface identifier of a target GPIO for communication between the main control chip and the screen to be tested; determining the target GPIO based on the interface identifier, and the main control chip tests the screen to be tested through the target GPIO.

[0008] In one possible implementation, the above-mentioned test program can be pre-installed in the main control chip of the PCB board (or test PCB) when the PCB board (or test PCB) leaves the factory, or it can be downloaded from other electronic devices (for example, the cloud, server, etc.) according to specific screen test requirements when performing screen testing.

[0009] Optionally, the test program pre-installed in the main control chip of the PCB board may be a test program for a variety of screens to be tested, and the test program may be one or more, which is not limited in the present application.

[0010] It should be understood that the screen test has a certain process, that is, the PCB board main control chip will load and run the test program only when it receives an operation instruction (for example, a start instruction) from the user to test the screen to be tested.

[0011] When the test program starts running, the user needs to input the interface identifier of the target GPIO for the main control chip to communicate with the screen to be tested, and then determine the target GPIO based on the interface identifier, and test the screen to be tested through the target GPIO.

[0012] The difference between the above method and the traditional method is that during the screen test, the user does not need to configure the GPIO interface that communicates with the screen to be tested in advance, and then write the test program according to the configured GPIO interface. The user only needs to directly burn the test program to the PCB board first, and then when the test program starts running, input the target GPIO according to the specific screen model to be tested, so that the main control chip can test the screen to be tested through the target GPIO. In this way, when it is necessary to use multiple PCB boards of different board types to test the same model of screen to be tested or different models of screen to be tested, the user does not need to repeatedly write the test program, which improves the efficiency of screen testing.

[0013] In combination with the first aspect, in a possible implementation method of the first aspect, obtaining the interface identifier of the target GPIO for communication between the main control chip and the screen to be tested includes: obtaining the model of the test screen; and determining the interface identifier of the target GPIO for communication between the main control chip and the screen to be tested according to the model of the screen to be tested.

[0014] In a possible implementation method, a mapping relationship between the model of the screen to be tested and the GPIO interface identifier can be established based on the model of the screen to be tested and the GPIO interface identifier; and the interface identifier of the target GPIO for communication between the main control chip and the screen to be tested is obtained, including: according to the model of the screen to be tested, based on the mapping relationship, determining the interface identifier of the target GPIO for communication between the main control chip and the screen to be tested.

[0015] In combination with the first aspect, in a possible implementation manner of the first aspect, the interface identifier is an interface identifier input by a user.

[0016] In a possible implementation, the user can manually determine which target GPIO interface to use to test the screen to be tested according to the specific model of the screen to be tested.

[0017] Optionally, big data analysis can also be used to obtain the GPIO interface identifiers of various models of screens to be tested and their commonly used PCB boards, and then establish a mapping relationship between the models of screens to be tested and the GPIO interface identifiers. When it is necessary to test a specific model of screen to be tested, the target GPIO corresponding to the model of screen to be tested can be determined based on the mapping relationship.

[0018] In the above method, the main control chip can not only test the screen to be tested according to the target GPIO corresponding to the target GPIO identifier input by the user, but also determine the target GPIO to test the screen to be tested according to the established mapping relationship between the screen model to be tested and the GPIO interface identifier. In this way, when the target GPIO of the screen to be tested is occupied or fails, a new target GPIO can be re-determined manually.

[0019] In a second aspect, an embodiment of the present application provides a screen testing device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements a screen testing method as described in any one of the first aspects above when executing the computer program.

[0020] In a third aspect, an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, wherein when the computer program is executed by a processor, the screen testing method as described in any one of the first aspects above is implemented.

[0021] In a fourth aspect, an embodiment of the present application provides a computer program product. When the computer program product is run on a terminal device, the terminal device executes the screen testing method described in any one of the above-mentioned first aspects.

[0022] It can be understood that the beneficial effects of the second to fourth aspects mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0024] Figure 1 is a schematic diagram of using a test system to test a screen to be tested according to an embodiment of the present application;

[0025] Figure 2 is a flow chart of a screen testing method provided according to some embodiments of the present application;

[0026] Figure 3 is a schematic diagram of a graphical user interface provided according to some embodiments of the present application;

[0027] Figure 4 This is a schematic diagram of a mapping relationship between a screen model and a GPIO interface identifier provided according to some embodiments of the present application;

[0028] Figure 5 This is a schematic diagram of a graphical user interface provided according to some embodiments of the present application. DETAILED DESCRIPTION

[0029] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0030] It should be understood that when used in the present specification and the appended claims, the term "comprising" indicates the presence of described features, wholes, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or combinations thereof.

[0031] It should also be understood that the term “and / or” used in the specification and appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0032] As used in the specification and appended claims of this application, the term "if" can be interpreted as "when" or "uponce" or "in response to determining" or "in response to detecting", depending on the context. Similarly, the phrase "if it is determined" or "if [described condition or event] is detected" can be interpreted as meaning "uponce it is determined" or "in response to determining" or "uponce [described condition or event] is detected" or "in response to detecting [described condition or event]", depending on the context.

[0033] In addition, in the description of the present application specification and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the descriptions and cannot be understood as indicating or implying relative importance.

[0034] References to "one embodiment" or "some embodiments" etc. described in the specification of this application mean that one or more embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Therefore, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways.

[0035] The embodiments of the present application will be described in detail below with reference to the accompanying drawings.

[0036] Figure 1 It is a schematic diagram of an example of using a test system 100 to perform a screen test on a screen 200 to be tested according to an embodiment of the present application.

[0037] like Figure 1 As shown, the test system 100 includes a PCB 110 , and the PCB 110 includes a main control chip 1102 and a GPIO 1102 (the GPIO includes many interfaces, such as interfaces 1-12).

[0038] The screen to be tested 200 includes a screen IC 210 of the screen to be tested. During the test process, the main control chip 1101 of the PCB 110 tests the screen to be tested through a specific interface of the GPIO 1102 .

[0039] Optionally, in some embodiments of the present application, the screen test system may include more devices or apparatuses, for example, the screen test system may also include a power supply, a storage device, etc. The present application does not limit the type and quantity of the devices or apparatuses included in the screen test system.

[0040] As mentioned in the background technology, in the previous screen testing process, engineers need to first configure the target GPIO for communicating with the screen to be tested, and then write the test code according to the interface identifier of the specific target GPIO, compile the test code and burn it to the main control chip of the PCB board, and then the PCB board simulates the serial peripheral interface (serial peripheral interface, SPI) signal according to the compiled test program, and sends the SPI signal to the screen IC of the screen to be tested through the aforementioned target GPIO. The screen to be tested is initialized according to the SPI signal, and then the staff determines whether the screen to be tested 200 is normal based on whether the screen to be tested 200 can be displayed normally.

[0041] However, the above method has the following disadvantages: Taking Table 1 as an example, it includes 3 PCB boards of different types and the screen to be tested ScreenD. The steps of screen testing include configuring the target GPIO, writing the test code of the screen to be tested, compiling and generating a binary file, and burning the binary file to the main control chip.

[0042] Optionally, in some embodiments of the present application, the number of the above-mentioned PCB boards of different types may be less or more, for example, 1, 2, 4, 5, etc. The present application is applicable to any number of PCB boards.

[0043] Table 1

[0044]

[0045] Among them, Y means execution, and N means no execution. As shown in Table 1, when using 3 different types of PCB boards to test the screen D, the above steps of "configure target GPIO", "write the test code for the screen to be tested", and "compile and generate binary files" need to be executed 3 times respectively, and due to the different configured target GPIO interfaces, 3 different binary files (BIN A, BIN B, BIN C) will be generated.

[0046] It is understandable that, when the number of PCB boards of different types increases, the above process needs to be repeated more times, which is not conducive to improving the efficiency of screen testing.

[0047] In order to solve the above problems, this application proposes a testing method. Figure 2 To Attachment Figure 5 , the technical solution of this application is elaborated in detail.

[0048] Figure 2 It is a flowchart of a screen testing method 200 provided according to some embodiments of the present application.

[0049] like Figure 2As shown, the test method 200 includes:

[0050] 201: Obtain a test program for testing the screen to be tested.

[0051] In one possible implementation, the above-mentioned test program can be pre-installed in the main control chip of the PCB board (or test PCB) when the PCB board (or test PCB) leaves the factory, or it can be downloaded from other electronic devices (for example, the cloud, server, etc.) according to specific screen test requirements when performing screen testing.

[0052] Optionally, the test program pre-installed in the main control chip of the PCB board may be a test program for a variety of screens to be tested, and the test program may be one or more, which is not limited in the present application.

[0053] Optionally, in some embodiments of the present application, the test program includes some test data required for testing the screen to be tested. For example, if it is necessary to test whether the screen to be tested can be displayed normally, the test program may include data (such as text, numerical values, etc.) that are expected to be displayed on the screen to be tested. Exemplarily, the test program may include a "helloworld" string. When "helloworld" is displayed on the screen to be tested, it is determined that the screen can be displayed normally.

[0054] In other embodiments of the present application, the test program can also control the screen to be tested to open or close a specific communication interface. For example, the test program can control the screen to be tested to open an interface for connecting to peripherals (e.g., headphones, cameras, microphones, etc.). It should be understood that the present application does not limit the functions of the test program.

[0055] In another embodiment of the present application, the test program can also control the flipping of the screen through a specific target GPIO. For example, in a projection scene, based on the projection principle, the picture generated in the projection device is opposite to the picture finally projected onto the screen (or curtain) (flipped left and right, upside down). Therefore, the test program can control the picture generated in the projection device through a specific target GPIO to first flip left and right and upside down, and then project (or display) it on the screen.

[0056] Optionally, in some possible embodiments of the present application, the number of the screens to be tested may be one or more, and the models and types of the screens to be tested may be different or the same, for example, all are liquid crystal displays (LCD) or all are organic light-emitting diode (OLED), some are LCD screens and some are OLED screens.

[0057] 202: receiving an operation instruction for testing the screen to be tested, and in response to the operation instruction, the main control chip runs the test program.

[0058] In a possible implementation, the user may input a start instruction of the test program into the PCB board, and then the main control chip runs the test program according to the start instruction of the test program.

[0059] For example, Figure 3 This is a schematic diagram of a graphical user interface provided according to some embodiments of the present application.

[0060] like Figure 3 As shown, the user can run the test program by double-clicking the “test program.exe” 302 file on the interface 301 of the electronic device 300 .

[0061] Optionally, the electronic device 300 may be a mobile phone, a tablet computer, a notebook computer, an ultra-mobile personal computer (UMPC), etc. The embodiment of the present application does not impose any limitation on the specific type of the electronic device.

[0062] 203: Obtain an interface identifier of a target GPIO for communication between the main control chip and the screen to be tested.

[0063] Optionally, the interface identifier can be represented as an interface ID (identity document, ID) of the GPIO, or can be represented as a string, or represented in other forms. This application does not limit the representation form of the interface identifier. The following will be described by taking the representation form of the interface identifier as an interface ID as an example.

[0064] In a possible implementation, the model of the screen to be tested may be obtained first, and then the interface identifier of the target GPIO for the main control chip to communicate with the screen to be tested may be determined according to the model of the screen to be tested.

[0065] Specifically, the model of the screen to be tested may be obtained first, and then a mapping relationship between the screen model to be tested and its corresponding GPIO interface ID may be established. Then, based on the screen model and the mapping relationship, the interface ID of the target GPIO may be determined.

[0066] Optionally, a mapping relationship between the screen model to be tested and its corresponding GPIO interface ID can be established through big data analysis. For example, the interface ID of the GPIO commonly used by a certain model of the screen to be tested is obtained, and then a mapping relationship between the commonly used interface ID and the screen model to be tested is established.

[0067] Optionally, the model of the screen to be tested and the mapping relationship between the model of the screen to be tested and the interface identifier of the GPIO can be stored in Figure 1In the screen test system shown, it can also be stored in other electronic devices (eg, cloud, server, etc.). This application does not limit the storage method and location of the above-mentioned screen models to be tested and the mapping relationship.

[0068] Optionally, the model of the screen to be tested and the PCB type can be represented by letters (for example, uppercase letters A, B, C, D, E... or lowercase letters a, b, c, d, e..., or by numbers 1, 2, 3, 4...), and this application does not impose any restrictions on this.

[0069] For example, assuming that the GPIO interface IDs are from 1 to 10, Figure 4 This is a schematic diagram of a mapping relationship between a screen model and a GPIO interface identifier provided according to some embodiments of the present application.

[0070] Figure 4 Figure (a) is a schematic diagram of the mapping relationship between the GPIO interfaces in PCBs of different board types and the same screen D to be tested.

[0071] For example, Figure 4 As shown in Figure (a), the PCB board types are A, B, and C, and the target GPIOs communicating with the screen D to be tested are A: D (1, 2), B: D (3, 4), and C: D (5, 6).

[0072] Figure 4 Figure (b) is a schematic diagram of the mapping relationship between the GPIO interface in the same PCB and the different models of screens D, E, and F to be tested.

[0073] For example, Figure 4 As shown in Figure (b), the models of the screens to be tested are D, E, and F, and their target GPIOs for communicating with the PCB board of type A are D: A (1, 2), E: A (3, 4), and F: A (5, 6).

[0074] It should be understood that the above mapping relationship can be a one-to-many mapping relationship. For example, the same model of the screen to be tested can correspond to multiple GPIOs of the PCB board (see Figure 4 In (b), the screen to be tested with model D can correspond to interfaces 1, 2 or interfaces 3, 4 of the PCB board with model A). For another example, the same interface of the PCB board can also correspond to screens of different models to be tested (see Figure 4 In the figure (b), interfaces 1 and 2 of the PCB board of type A correspond to the screen to be tested of model D and the screen to be tested of model E respectively). The specific form of the mapping relationship in this application is not limited.

[0075] It should be understood that in some embodiments of the present application, when performing screen testing, the commonly used GPIO interface may be faulty or already occupied. In this case, the above mapping relationship may also include a mapping relationship between the screen model to be tested and the GPIO interface arranged according to the number of times used. Specifically, the interface ID of the GPIO interface commonly used by a certain specific model of the screen to be tested can be obtained, and the commonly used interface IDs can be arranged according to the number of times they are used. The commonly used interface IDs with more times of use have a higher priority, that is, when a commonly used interface ID is occupied, other commonly used interface IDs can be used according to priority.

[0076] Exemplarily, as shown in Table 2 below, the mapping relationship and priority between the screen to be tested of model D and the GPIO interface ID of PCB A can be expressed by a three-dimensional array ([screen to be tested model, GPIO interface, priority]) as follows: [D, (7, 8), 1], [D, (1, 2), 2]; the mapping relationship and priority between the GPIO interface ID of PCB B are [D, (6, 9), 1], [D, (3, 4), 2]; the mapping relationship and priority between the GPIO interface ID of PCB C are [D, (1, 2), 1], [D, (5, 6), 2].

[0077] Table 2

[0078]

[0079] In one possible implementation, since the PCB board may be a new type of PCB board or the screen to be tested is a new type of screen, or based on actual needs (for example, the user wants to test the screen to be tested through other GPIO interfaces other than the above-mentioned commonly used GPIO interfaces), the interface identifier input by the user can also be used as the interface identifier of the GPIO interface for testing the screen to be tested.

[0080] Assume that SPIRL represents the GPIO interface that controls the left-right flipping of the screen, SPIUD represents the GPIO interface that controls the up-down flipping of the screen, TSPICLK represents the GPIO interface that passes the clock signal, TSPICS identifies the GPIO interface that the chip select signal passes, TSPIRST represents the GPIO interface that passes the reset signal, TSPISDI represents the GPIO interface that transmits data, and TPANELINDEX represents the model of the screen to be tested. For example, Figure 5 This is a schematic diagram of a graphical user interface provided according to some embodiments of the present application.

[0081] like Figure 5As shown in (a) of FIG. 1 , the user can enter the corresponding screen model and the interface identifier of the target GPIO corresponding to the screen to be tested in the interface 501. For example, the user enters: SPIRL=50, SPIUD=49, TSPICLK=48, TSPICS=44, TSPIRST=45, TSPISDI=43, TPANELINDEX=4 (see Figure 5 In the 502 interface of (b) figure), after the user enters the above information, he can click Enter to confirm that the input is complete, and the test program continues to run until the data or content contained in the test program (or the data or content corresponding to the test program) is displayed on the screen to be tested or the action corresponding to the test program is executed (for example, the screen is lit or flashed, etc.).

[0082] It should be understood that the user can also indicate confirmation through other buttons, for example, other buttons on interface 501 or 502 (e.g., Run, Confirm, etc.). In some embodiments of the present application, the test program can also prompt the user to enter the aforementioned relevant information in the form of a pop-up window, and then after the user enters the information, he can click the confirmation button in the pop-up window to indicate that the input is complete. The present application does not limit this.

[0083] 204: Determine the target GPIO based on the interface identifier, and the main control chip tests the screen to be tested through the target GPIO.

[0084] In an embodiment of the present application, the main control chip can generate an SPI analog signal according to the above test program, and then send it to the screen IC to be tested through the target GPIO. The screen IC of the screen to be tested then performs a screen test based on the received SPI signal.

[0085] Exemplarily, assuming that the interface identifier of the target GPIO is x, y, z, q, then the correspondence between the target GPIO and the SPI analog signal and the function of the SPI analog signal can be as shown in Table 3, the clock signal (SPICLK) is simulated through the GPIO interface x, the data (SPISDI) is transmitted through the GPIO interface y, the chip select signal (SPICS) is simulated through the GPIO interface z, and the reset signal (SPIpRST) is simulated through the GPIO interface q.

[0086] Table 3

[0087] SPI Signal Names SPI signal function GPIO interface identification SPICLK Clock signal x SPISDI data y SPICS Chip select signal z SPIpRST Reset signal q

[0088] It should be understood that the type of analog signal generated by the main control chip is related to the type of signal that the screen to be tested can receive, and the present application does not limit the type of analog signal generated by the main control chip.

[0089] It should also be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0090] To summarize, the method of the present application first obtains a test program for testing the screen to be tested, and then determines the interface identifier of the target GPIO in the PCB board that communicates with the screen to be tested according to the model of the screen to be tested, and then determines the corresponding target GPIO according to the interface identifier of the target GPIO, and the main control chip tests the screen to be tested through the target GPIO.

[0091] In the above process, since the test program has been written before the target GPIO is determined, and when the test program is executed, the interface identifier of the target GPIO that communicates with the screen to be tested can prompt the user to input it according to the specific model of the screen to be tested in the form of a graphical user interface, or directly determine it according to the model of the screen to be tested and the mapping relationship between the screen model to be tested and the GPIO interface, so the present application can simplify the process of writing test programs in the traditional screen testing process and improve the efficiency of screen testing.

[0092] Exemplarily, as shown in Table 4, the above-mentioned use of three PCB boards (PCB A, PCB B, and PCBC) of different board types to test the screen D to be tested is continued as an example.

[0093] Table 4

[0094]

[0095]

[0096] Among them, Y represents execution and N represents non-execution.

[0097] Compared with Table 1, it can be seen from Table 4 that when using 3 PCB boards of different board types to test the screen D to be tested, through the testing method of the present application, it is only necessary to write the test program once, and the corresponding compilation process is also only required once, so the efficiency of the screen test is improved.

[0098] An embodiment of the present application also provides a screen testing device, which includes: at least one processor, a memory, and a computer program stored in the memory and executable on the at least one processor, wherein the processor implements the steps in any of the above-mentioned method embodiments when executing the computer program.

[0099] An embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in the above-mentioned method embodiments can be implemented.

[0100] An embodiment of the present application provides a computer program product. When the computer program product runs on a mobile terminal, the mobile terminal can implement the steps in the above-mentioned method embodiments when executing the computer program product.

[0101] It should be noted that the information interaction, execution process, etc. between the above-mentioned devices / units are based on the same concept as the method embodiment of the present application. Their specific functions and technical effects can be found in the method embodiment part and will not be repeated here.

[0102] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0103] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, which can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may at least include: any entity or device that can carry the computer program code to the camera / terminal device, recording medium, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium. For example, a USB flash drive, a mobile hard disk, a magnetic disk or an optical disk. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electric carrier signals and telecommunication signals.

[0104] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0105] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0106] In the embodiments provided in the present application, it should be understood that the disclosed devices / network equipment and methods can be implemented in other ways. For example, the device / network equipment embodiments described above are merely schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0107] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0108] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A screen testing method, applied to a testing system, characterized in that: The test system includes a test printed circuit board PCB, wherein the test PCB includes a main control chip and a general serial input and output interface GPIO, and the method includes: Acquire a test program for testing a screen to be tested, wherein the test program is a test program for multiple screens to be tested; receiving an operation instruction for testing the screen to be tested, and in response to the operation instruction, the main control chip runs the test program; Obtaining the interface identifier of the target GPIO for the main control chip to communicate with the screen to be tested; The target GPIO is determined based on the interface identifier, and the main control chip tests the screen to be tested through the target GPIO; The step of obtaining the interface identifier of the target GPIO for communication between the main control chip and the screen to be tested includes: Obtain the model of the test screen; According to the model of the screen to be tested, the interface identifier of the target GPIO for the main control chip to communicate with the screen to be tested is determined.

2. The method according to claim 1, characterized in that The method further includes: establishing a mapping relationship between the model of the screen to be tested and the GPIO interface identifier based on the model of the screen to be tested and the GPIO interface identifier; and The step of obtaining the interface identifier of the target GPIO for communication between the main control chip and the screen to be tested includes: According to the model of the screen to be tested and based on the mapping relationship, the interface identifier of the target GPIO for the main control chip to communicate with the screen to be tested is determined.

3. The method according to claim 1, characterized in that The interface identifier is an interface identifier input by a user.

4. The method according to any one of claims 1 to 3, characterized in that The test program may be stored in the test system, or may be obtained by the test system from other electronic devices.

5. A screen testing device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the method according to any one of claims 1 to 4 is implemented.

6. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 1 to 4 is implemented.