Embedded device detection method, device, equipment and storage medium

Abstract

The present invention provides an embedded device detection method, which includes: obtaining the current working data of the embedded device; comparing the current working data with the standard working data to obtain a comparison result; if the comparison result is abnormal, obtaining the target monitoring image of the embedded device; and detecting the embedded device according to the comparison result and the target monitoring image to obtain a detection result. By detecting the working data of the embedded device and the current monitoring image of the embedded device, and comprehensively judging in combination with the operating state and the external structure, the abnormal problems occurring in the embedded device can be quickly and accurately located, and comprehensive fault information can be provided for maintenance. In addition, the present invention also provides an embedded device detection device, equipment and storage medium.

Description

Technical Field

[0001] The present invention relates to the field of embedded devices, and in particular, to a method, device, equipment and storage medium for detecting embedded devices. Background Art

[0002] During the development, debugging and running of embedded devices, it is generally necessary to be able to track or simulate the status and execution of the main CPU and peripherals in real time. There are special hardware monitoring devices on the market that can detect embedded devices.

[0003] However, the detection of existing monitoring devices has limitations and cannot detect the hardware environment scenario, resulting in poor detection effects. Summary of the Invention

[0004] Based on this, in view of the above problems, it is necessary to provide a method, device, equipment and storage medium for detecting embedded devices.

[0005] In a first aspect, an embodiment of the present invention provides a method for detecting an embedded device, the method including:

[0006] Obtain the current working data of the embedded device;

[0007] Compare the current working data with the standard working data to obtain a comparison result;

[0008] If the comparison result is abnormal, obtain the target monitoring image of the embedded device;

[0009] Detect the embedded device according to the comparison result and the target monitoring image to obtain a detection result.

[0010] Optionally, before the step of obtaining the current working data of the embedded device, it further includes:

[0011] Obtain the first working data corresponding to the initial working parameters set by the embedded device;

[0012] If the first working data does not meet the preset range, adjust the working parameters of the embedded device, and obtain the second working data corresponding to the adjusted working parameters of the embedded device;

[0013] If the second working data does not meet the preset range, adjust the working parameters of the embedded device again, and obtain the working data corresponding to the working parameters adjusted again by the embedded device until the obtained working data meets the preset range, and determine the last obtained working data as the standard working data.

[0014] Optionally, obtaining the target monitoring image of the embedded device includes:

[0015] Obtain the current monitoring image captured by the camera for the embedded device, analyze the current monitoring image, and obtain the analysis result;

[0016] When the analysis result does not meet the preset requirements, obtain the defect type in the analysis result;

[0017] Adjust the working parameters of the camera according to the defect type;

[0018] Based on the adjusted working parameters, re - photograph the embedded device to obtain a new monitoring image. Take the new monitoring image as the current monitoring image, and enter the step of analyzing the current monitoring image to obtain the analysis result until the analysis result meets the preset requirements. Take the monitoring image whose analysis result meets the preset requirements as the target monitoring image.

[0019] Optionally, compare the current working data with the standard working data to obtain the comparison result, including:

[0020] Obtain the comparison difference between the current working data and the standard working data;

[0021] If the comparison difference meets the first preset difference or the second preset difference, it is determined that the comparison result is abnormal, where the first preset difference is less than the second preset difference; otherwise, it is determined that the comparison result is normal.

[0022] Optionally, detect the embedded device according to the comparison result and the target monitoring image to obtain the detection result, including:

[0023] If it is detected that the comparison difference meets the first preset difference and it is detected that there is no abnormal phenomenon in the structure of the embedded device in the target monitoring image, it is determined that the detection result is adjustable;

[0024] Otherwise, it is determined that the detection result is not adjustable.

[0025] Optionally, after the step of detecting the embedded device according to the comparison result and the target monitoring image to obtain the detection result, it further includes:

[0026] If the detection result of the embedded device is adjustable, perform parameter adjustment or restart on the embedded device;

[0027] If the detection result of the embedded device is not adjustable, issue a fault alarm.

[0028] Optionally, the method further includes:

[0029] Receive the control instruction from the maintenance personnel;

[0030] Adjust the working parameters of the camera according to the control instruction, and obtain the monitoring image after the parameters are adjusted;

[0031] Export the working log according to the control instruction, so that the maintenance personnel can analyze and maintain based on the monitored image after adjusting the parameters and the content of the exported working log.

[0032] Through the above-mentioned embedded device detection method, by detecting the working data of the embedded device and the current monitored image of the embedded device, and comprehensively judging in combination with the operating state and the external structure conditions, the abnormal problems occurring in the embedded device can be quickly and accurately located, and comprehensive abnormal information is provided for maintenance.

[0033] In a second aspect, an embodiment of the present invention provides an embedded device detection device, and the device includes:

[0034] A first acquisition module, configured to acquire the current working data of the embedded device;

[0035] A data comparison module, configured to compare the current working data with the standard working data to obtain a comparison result;

[0036] A second acquisition module, configured to acquire the target monitored image of the embedded device if the comparison result is abnormal;

[0037] A detection module, configured to detect the embedded device according to the comparison result and the target monitored image to obtain a detection result.

[0038] Through the above-mentioned embedded device detection device, the embedded device detection method is realized. By detecting the working data of the embedded device and the current monitored image of the embedded device, and comprehensively judging in combination with the operating state and the external structure conditions, the abnormal problems occurring in the embedded device can be quickly and accurately located, and comprehensive abnormal information is provided for maintenance.

[0039] In a third aspect, an embodiment of the present invention provides an embedded device detection device, including a processor, a memory, and a camera component. A computer program is stored in the memory. When the computer program is executed by the processor, the processor executes the following steps:

[0040] Acquire the current working data of the embedded device;

[0041] Compare the current working data with the standard working data to obtain a comparison result;

[0042] If the comparison result is abnormal, acquire the target monitored image of the embedded device;

[0043] Detect the embedded device according to the comparison result and the target monitored image to obtain a detection result.

[0044] By detecting the computer program stored and executed by the processor in the above-mentioned embedded device, the embedded device detection method is realized. By detecting the working data of the embedded device and the current monitoring image of the embedded device, and comprehensively judging in combination with the operating state and the external structure conditions, the abnormal problems occurring in the embedded device can be quickly and accurately located, and comprehensive abnormal information can be provided for maintenance.

[0045] In a fourth aspect, an embodiment of the present invention provides a storage medium storing a computer program, and when the computer program is executed by a processor, the processor is caused to execute the following steps:

[0046] Obtain the current working data of the embedded device;

[0047] Compare the current working data with the standard working data to obtain a comparison result;

[0048] If the comparison result is abnormal, obtain the target monitoring image of the embedded device;

[0049] Detect the embedded device according to the comparison result and the target monitoring image to obtain a detection result.

[0050] By executing the computer program stored in the above storage medium by the processor, the embedded device detection method is realized. By detecting the working data of the embedded device and the current monitoring image of the embedded device, and comprehensively judging in combination with the operating state and the external structure conditions, the abnormal problems occurring in the embedded device can be quickly and accurately located, and comprehensive abnormal information can be provided for maintenance. BRIEF DESCRIPTION OF THE DRAWINGS

[0051] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present invention, and for those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0052] Among them:

[0053] Figure 1 is a flowchart of the embedded device detection method in an embodiment;

[0054] Figure 2 is a schematic diagram of the camera layout in an embodiment;

[0055] Figure 3 is a flowchart of determining the standard working data in an embodiment;

[0056] Figure 4 is a flowchart of determining the target monitoring image in an embodiment;

[0057] Figure 5 It is a flowchart for specifically determining whether the comparison result is abnormal in an embodiment;

[0058] Figure 6 It is a flowchart for specifically detecting according to the comparison result and the target monitoring image in an embodiment;

[0059] Figure 7 It is a flowchart for the maintenance personnel to control and query abnormal situations in an embodiment;

[0060] Figure 8 It is a flowchart for the overall specific implementation of the solution in an embodiment;

[0061] Figure 9 It is a schematic structural diagram of an embedded device detection device in an embodiment;

[0062] Figure 10 It is a schematic internal structure diagram of an embedded device detection device in an embodiment. Detailed implementation manners

[0063] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0064] In order to make the purpose, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention.

[0065] As Figure 1 shown, in an embodiment, an embedded device detection method is proposed, and the method includes:

[0066] Step 102, obtaining the current working data of the embedded device.

[0067] Among them, an embedded device refers to other devices different from general-purpose computers, and it is an independent "device" integrating software and hardware. The embedded processor mainly consists of a single-chip microcomputer or a microcontroller (MCU). The relevant supporting hardware includes display cards, storage media (such as ROM and RAM), communication devices, reading devices for IC cards or credit cards, and other mechanical structures. In this embodiment, the embedded device specifically refers to a device that can independently control other mechanical structures based on its own operating system and software in the system to complete corresponding tasks. The current working data refers to the working data of the embedded device at a certain detection time point. The working data specifically refers to the values reflecting the working state of the embedded device project execution, such as A / D values, signal values, analog values, etc. The working data can be recorded by the embedded device itself and then sent to the detection device, or can be directly collected by the detection device. In another embodiment, simulated working data can also be directly input. The program module inside the detection device can be based on the processor in the embedded device or on the upper industrial control computer, and can be reasonably set according to the needs of the actual application scenario.

[0068] Step 104: Compare the current working data with the standard working data to obtain a comparison result.

[0069] Among them, the standard working data refers to the best output situation when the embedded device executes each project. The standard working data is stored in the system of the detection device. After obtaining the current working data, it is input into the system and compared with the standard working data to obtain the corresponding comparison result.

[0070] Step 106: If the comparison result is abnormal, obtain the target monitoring image of the embedded device.

[0071] Among them, an abnormal comparison result means that the difference between the current working data and the standard working data exceeds a certain range, which will affect the subsequent working ability of the embedded device. The target monitoring image refers to an image that meets the analysis requirements and contains the current structural state of the embedded device, taken by a camera set around the embedded device. The image includes a single frame image and a video stream formed by multiple frame images. For example Figure 2As shown, the camera is set according to the position of the observation point of the embedded device. The observation point refers to the position where the embedded device is prone to failure. For each observation point, one camera can be set, or multiple cameras can be set for multi-angle shooting. In addition, the camera component also includes a fill light, which facilitates shooting in low ambient light conditions. In addition, when setting the camera, the volume of the camera needs to be considered, and sufficient space should be reserved in the planning and design based on the volume of the camera to accommodate the camera component. When data anomalies occur in the embedded device, it may be a content program execution problem, such as execution errors, system crashes, etc., or it may be an external structure problem, such as damage to a certain structure, part falling off, etc. Therefore, when an anomaly is detected, the current image is retrieved in a timely manner and a comprehensive judgment is made based on the image.

[0072] Step 108, detect the embedded device according to the comparison result and the target monitoring image to obtain a detection result.

[0073] Among them, according to the obtained comparison result and the target monitoring image, the embedded device can be subjected to basic detection to judge the degree of the abnormal situation, and then corresponding operations can be made according to the selection. For example, if it is detected that the abnormal situation is relatively minor according to the comparison result and the target monitoring image, it can be directly adjusted internally. If the abnormal situation is relatively serious, then it needs to be notified and waiting for manual repair.

[0074] By detecting the working data of the embedded device and the current monitoring image of the embedded device, and comprehensively judging in combination with the operating state and the external structure situation, the abnormal problems occurring in the embedded device can be quickly and accurately located, and comprehensive fault information can be provided for maintenance. The camera is set accordingly according to the needs, concentrated on the prone observation points, improving the flexibility of detection and excluding the interference of other observation points. In addition, the detection device is a virtual program module inside, and there is no need to set additional expansion interfaces. Existing expansion interfaces, etc., have small batch production and high costs. Therefore, by directly virtualizing the program module inside the embedded device or industrial control computer, the detection cost is reduced.

[0075] As Figure 3 shown, in one embodiment, before the step of obtaining the current working data of the embedded device, it further includes:

[0076] Step 302, obtain the first working data corresponding to the initial working parameters set for the embedded device.

[0077] Among them, the above-mentioned standard working data is the better output situation of each project. The embedded device sets parameters, and then executes the program based on the set working parameters to complete the project. Different parameters correspond to different outputs. Therefore, it is necessary to continuously adjust the working parameters and record the corresponding output situation in real time until the best output situation is determined. In the initial state, the embedded device starts working by setting the initial working parameters, and records the first working data corresponding to the working parameters.

[0078] Step 304, if the first working data does not meet the preset range, adjust the working parameters of the embedded device, and obtain the second working data corresponding to the adjusted working parameters of the embedded device.

[0079] Among them, if the obtained first working data does not meet the preset range, it means that the best output situation has not been achieved. Therefore, analyze the parts that need to be adjusted based on the first working data, and then adjust the working parameters of the embedded device, and record the second working data obtained after the adjustment.

[0080] Step 306, if the second working data does not meet the preset range, adjust the working parameters of the embedded device again, obtain the working data corresponding to the working parameters after the embedded device is adjusted again, until the obtained working data meets the preset range, and determine the finally obtained working data as the standard working data.

[0081] Among them, similarly, if the obtained working data still does not meet the preset range, continue to analyze and adjust until a set of working data that meets the preset range is obtained, and then determine the working data at this time as the standard working data. The determined standard working data is used as the benchmark for subsequent abnormality judgment.

[0082] By continuously adjusting and optimizing the working parameters, working data that meets the preset range is obtained, so that the obtained standard working data can provide a relatively accurate and highly applicable judgment standard for the detection of whether there is an abnormality.

[0083] Such as Figure 4 shown, in one embodiment, obtaining the target monitoring image of the embedded device includes:

[0084] Step 402, obtain the current monitoring image captured by the camera of the embedded device, and analyze the current monitoring image to obtain the analysis result.

[0085] Among them, the target monitoring image specifically refers to an image that meets the preset requirements. The preset requirements also include: clarity, angle, brightness, etc. Only when the obtained monitoring image meets the preset requirements can detection and judgment be performed based on the image. However, the monitoring image obtained for the first time may not meet the preset requirements. Therefore, it is necessary to analyze the obtained image to see if it meets the preset requirements.

[0086] Step 404: when the analysis result does not meet the preset requirement, the defect type in the analysis result is obtained.

[0087] Among them, when the analysis result does not meet the preset requirements, it means that the acquired image has defects, such as insufficient brightness, angle deviation, insufficient clarity, etc., and then the defect type in the analysis result is obtained for adjustment.

[0088] Step 406, adjusting the operating parameters of the camera according to the defect type.

[0089] Among them, after obtaining the defect type, the corresponding parameters of the camera are adjusted based on the defect type. For example, when it is analyzed that the brightness of the acquired image is dark, the light intensity of the fill light is adjusted; if it is analyzed that the angle of the acquired image deviates to the right, the shooting angle of the camera is adjusted to the left.

[0090] Step 408, based on the adjusted working parameters, re-photograph the embedded device to obtain a new monitoring image, use the new monitoring image as the current monitoring image, and enter the step of analyzing the current monitoring image to obtain the analysis result, until the analysis result meets the preset requirements, and use the monitoring image whose analysis result meets the preset requirements as the target monitoring image.

[0091] Similarly, after adjusting the working parameters, the embedded device is re-photographed to obtain a new monitoring image, and the new monitoring image is analyzed again to analyze whether it meets the preset requirements. If it still does not meet the requirements, the adjustment and acquisition are repeated until the monitoring image meets the preset requirements, and the monitoring image is identified as the target monitoring image.

[0092] By continuously analyzing the acquired images, the target monitoring images that meet the preset requirements are determined, so that the images used for detection are accurate and reliable, thereby improving the detection accuracy.

[0093] like Figure 5 As shown, in one embodiment, the current working data is compared with the standard working data to obtain a comparison result, including:

[0094] Step 502, obtaining a comparison difference between the current working data and the standard working data.

[0095] When the current working data is compared with the identification working data, specifically, the difference between the two is compared, and then the corresponding comparison result is determined according to the difference.

[0096] Step 504: if the comparison difference meets the first preset difference or the second preset difference, it is determined that the comparison result is abnormal, and the first preset difference is less than the second preset difference; otherwise, it is determined that the comparison result is normal.

[0097] Among them, in the actual operation of the embedded device, the real-time working data fluctuates dynamically within a certain range, and the fluctuations within this range do not affect its working ability. Therefore, when the difference does not exceed this dynamic fluctuation range, it is determined that the comparison result is normal; when the difference exceeds the aforementioned dynamic fluctuation range, it is determined to be abnormal. Specifically, the first preset difference and the second preset difference respectively refer to multiple values within a range, and the maximum value represented by the first preset difference is less than the minimum value of the second preset difference. The exceeded part is divided into two stages. One is from exceeding the dynamic fluctuation range to the first preset difference, and the other is from exceeding the dynamic fluctuation range to the second preset difference. The first preset difference and the second preset difference respectively represent the degree of abnormality of the embedded device, so as to adopt different adjustment schemes according to the degree of abnormality.

[0098] By specifically analyzing the comparison result, the abnormal or normal result can be obtained, and based on the abnormal situation, it is further refined. The degree of abnormality is judged according to the size of the comparison difference, which is convenient for adopting different adjustment schemes according to the degree of abnormality, making the detection result clear and specific, and facilitating further measures.

[0099] Such as Figure 6 shown, in one embodiment, the embedded device is detected according to the comparison result and the target monitoring image, and the detection result is obtained, including:

[0100] Step 602, if it is detected that the comparison difference conforms to the first preset difference, and it is detected that there is no abnormal phenomenon in the structure of the embedded device in the target monitoring image, then it is determined that the detection result is adjustable.

[0101] Among them, when it is detected that the comparison difference conforms to the first preset difference, it means that at this time, according to the comparison difference judgment, this abnormality can be adjusted, but the external structure situation needs to be considered. Because if the abnormality is caused by an external structure problem, it cannot be restored by internal adjustment. Therefore, it is further detected whether there is an abnormal phenomenon in the target monitoring image. Abnormal phenomena include structural damage, detachment, jamming, etc. If it is detected that there is no abnormal phenomenon in the external structure, it means that the abnormality of the embedded device can be restored by internal adjustment at this time.

[0102] Step 604, otherwise it is determined that the detection result is not adjustable.

[0103] Among them, if it is detected that the comparison difference conforms to the second preset difference or there is an abnormal phenomenon in the target monitoring image, it is determined to be not adjustable.

[0104] By comprehensively judging according to the size of the comparison difference and whether there is an abnormal situation in the target monitoring image, different schemes are adopted for different results, so that the abnormal situation can be solved in time.

[0105] In one embodiment, after the step of detecting the embedded device according to the comparison result and the target monitoring image to obtain a detection result, the method further includes: if the detection result of the embedded device is adjustable, adjusting the parameters of the embedded device or restarting it; if the detection result of the embedded device is not adjustable, issuing a fault alarm.

[0106] Among them, when the detection result is adjustable, although it exceeds the normal dynamic floating range at this time, it can still be restored through operations such as parameter adjustment or restart; when the detection result is not adjustable, it means that the deviation is too large at this time and cannot be restored through operations such as parameter adjustment or restart, or it is a structural damage and cannot be solved through internal adjustment either. Therefore, a fault alarm needs to be issued to inform the maintenance personnel to repair it in time.

[0107] According to the degree of abnormality, the abnormal conditions with a smaller degree are adjusted and solved by themselves, and the abnormal conditions with a larger degree are promptly informed to the maintenance personnel based on the fact that they cannot be adjusted and solved by themselves, so that the detected abnormal conditions can be quickly solved.

[0108] In one embodiment, the method further includes: generating and saving a work log for the relevant data obtained during the entire detection process.

[0109] By generating and saving the work log, subsequent maintenance personnel can retrieve the work log for analysis and backtracking, and solve the abnormal conditions based on the analysis results.

[0110] In one embodiment, the method further includes: classifying and pushing the abnormal conditions through a display component, making the detection results visual, and enabling the maintenance personnel to know the abnormal conditions in a timely and accurate manner.

[0111] As Figure 7 shown, in one embodiment, the method further includes:

[0112] Step 702, receiving a control instruction from the maintenance personnel.

[0113] Among them, for the non-adjustable abnormal conditions, after receiving the alarm, the maintenance personnel can manually control the detection device to perform relevant operations through software.

[0114] Step 704, adjusting the working parameters of the camera according to the control instruction, and obtaining a monitoring image after the parameters are adjusted.

[0115] Among them, the maintenance personnel can control the parameters of the camera according to the requirements and obtain an image based on the adjusted parameters.

[0116] Step 706, exporting the work log according to the control instruction, so that the maintenance personnel can analyze and maintain based on the monitoring image after the parameters are adjusted and the content of the exported work log.

[0117] Among them, the maintenance personnel can export the work logs recorded in real time, and conduct retrospective analysis based on the work logs and monitoring images to obtain the reasons for anomalies, so as to solve them.

[0118] Notify the maintenance personnel through an alarm and provide relevant data information on the abnormal situation, enabling the maintenance personnel to accurately analyze and solve the abnormal situation accordingly.

[0119] Such as Figure 8 As shown, in one embodiment, the specific implementation process of the present invention is provided. First, the entire life cycle of the embedded device is divided into three stages, namely the debugging stage (which is further specifically divided into the trial operation stage and the development and debugging stage), the stress testing stage, and the formal operation stage. In the debugging stage, mainly by continuously adjusting the working parameters of the embedded device and recording the corresponding working data to obtain standard working data; and adjusting the relevant parameters of the detection device to meet the detection requirements. Secondly, in the stress testing stage, mainly test the working state of the embedded device under different environmental conditions, and analyze and judge, so as to make improvements and optimizations according to the analysis results to achieve simulating relevant problems that may be encountered during real operation. Finally, in the formal operation stage, it is to monitor and detect in real time, adjust and report in real time, and record relevant data information.

[0120] Among them:

[0121] Trial operation stage: Set the initial working parameters and start the embedded device;

[0122] Development and debugging stage: Collect working data at multiple observation points, record the operation logs, and form standard working data;

[0123] Stress testing stage: During actual operation, the control program should record and compare the differences between the working data and the standard working data in real time. For abnormal situations, by adjusting and optimizing the working parameters of the monitoring camera, batch collecting the working images at the observation points, analyzing the reasons for the anomalies accordingly, and adjusting the structure, circuit, embedded firmware program, and control software algorithm of the target machine device to form the best software and hardware working environment;

[0124] Formal operation stage: At the abnormal site, without disassembling and destroying the site and the working state, collect the images at the observation points by using the control software, capture the real abnormal situation, record the abnormal information and the on-site information, generate a report, and exit the system. Through the analysis of the operation logs, the maintenance personnel can quickly and accurately locate the errors and solve the problems.

[0125] Such as Figure 9 As shown, in one embodiment, the present invention provides an embedded device detection device, and the device includes:

[0126] The first acquisition module 902 is used to acquire the current working data of the embedded device;

[0127] A data comparison module 904 is configured to compare the current working data with the standard working data to obtain a comparison result;

[0128] A second acquisition module 906 is configured to, if the comparison result is abnormal, acquire a target monitoring image of the embedded device;

[0129] A detection module 908 is configured to detect the embedded device according to the comparison result and the target monitoring image to obtain a detection result.

[0130] In one embodiment, the embedded device detection apparatus further includes:

[0131] A standard working data determination module is configured to acquire first working data corresponding to initial working parameters set for the embedded device; if the first working data does not meet a preset range, adjust the working parameters of the embedded device to acquire second working data corresponding to the adjusted working parameters of the embedded device; if the second working data does not meet the preset range, adjust the working parameters of the embedded device again to acquire working data corresponding to the working parameters after the embedded device is adjusted again until the obtained working data meets the preset range, and determine the finally obtained working data as the standard working data.

[0132] In one embodiment, the second acquisition module is further configured to acquire a current monitoring image of the embedded device captured by a camera, analyze the current monitoring image to obtain an analysis result; when the analysis result does not meet a preset requirement, acquire a defect type in the analysis result; adjust the working parameters of the camera according to the defect type; re-capture the embedded device based on the adjusted working parameters to obtain a new monitoring image, use the new monitoring image as the current monitoring image, and enter the step of analyzing the current monitoring image to obtain an analysis result until the analysis result meets the preset requirement, and use the monitoring image whose analysis result meets the preset requirement as the target monitoring image.

[0133] In one embodiment, the data comparison module is further configured to acquire a comparison difference between the current working data and the standard working data; if the comparison difference meets a first preset difference or a second preset difference, determine that the comparison result is abnormal, the first preset difference is less than the second preset difference; otherwise, determine that the comparison result is normal.

[0134] In one embodiment, the detection module is further configured to, if it is detected that the comparison difference meets the first preset difference and it is detected that there is no abnormal phenomenon in the structure of the embedded device in the target monitoring image, determine that the detection result is adjustable; otherwise, determine that the detection result is non-adjustable.

[0135] In one embodiment, the embedded device detection apparatus further includes:

[0136] A processing module, configured to, if the detection result of the embedded device is adjustable, adjust the parameters of the embedded device or restart it; if the detection result of the embedded device is not adjustable, issue a fault alarm.

[0137] In one embodiment, the embedded device detection apparatus further includes:

[0138] A control module, configured to receive a control instruction from a maintenance personnel, control and adjust the working parameters of a camera, obtain a monitored image after parameter adjustment, and export a work log, so that the maintenance personnel can perform analysis and maintenance based on the monitored image after parameter adjustment and the content of the exported work log.

[0139] In one embodiment, the present invention provides an embedded device detection apparatus, and the internal structure diagram of the embedded device detection apparatus is as Figure 10 shown. The embedded device detection apparatus includes a processor, a memory, and a communication interface connected through a system bus. The communication interface includes: an I2C communication interface, a USB interface, a CAN interface, etc. Among them, the memory includes a non-volatile storage medium and an internal memory. The non-volatile storage medium of the embedded device detection apparatus stores an operating system and may also store a computer program, and when the computer program is executed by the processor, the processor can implement the embedded device detection method. The internal memory may also store a computer program, and when the computer program is executed by the processor, the processor can execute the embedded device detection method. Those skilled in the art can understand that Figure 10 the structure shown in is only a block diagram of some structures related to the solution of the present application, and does not constitute a limitation on the embedded device detection apparatus to which the solution of the present application is applied. The specific embedded device detection apparatus may include more or fewer components than those shown in the figure, or combine some components, or have a different component layout.

[0140] In one embodiment, an embedded device detection method provided can be implemented in the form of a computer program, and the computer program can run on an embedded device detection apparatus as Figure 10 shown. Each program module constituting an embedded device detection apparatus can be stored in the memory of the embedded device detection apparatus. For example, a first acquisition module 902, a data comparison module 904, a second acquisition module 906, and a detection module 908.

[0141] An embedded device detection device, including a memory, a processor, and a camera component. A computer program is stored in the memory. When the computer program is executed by the processor, the processor performs the following steps: obtaining the current working data of the embedded device; comparing the current working data with the standard working data to obtain a comparison result; if the comparison result is abnormal, obtaining the target monitoring image of the embedded device; detecting the embedded device according to the comparison result and the target monitoring image to obtain a detection result.

[0142] In one embodiment, before the step of obtaining the current working data of the embedded device, when the computer program is executed by the processor, the processor further performs the following steps: obtaining the first working data corresponding to the initial working parameters set by the embedded device; if the first working data does not meet the preset range, adjusting the working parameters of the embedded device, and obtaining the second working data corresponding to the adjusted working parameters of the embedded device; if the second working data does not meet the preset range, adjusting the working parameters of the embedded device again, and obtaining the working data corresponding to the working parameters after the embedded device is adjusted again until the obtained working data meets the preset range, and determining the last obtained working data as the standard working data.

[0143] In one embodiment, obtaining the target monitoring image of the embedded device includes: obtaining the current monitoring image captured by the camera of the embedded device, analyzing the current monitoring image to obtain an analysis result; when the analysis result does not meet the preset requirements, obtaining the defect type in the analysis result; adjusting the working parameters of the camera according to the defect type; re - photographing the embedded device based on the adjusted working parameters to obtain a new monitoring image, taking the new monitoring image as the current monitoring image, and entering the step of analyzing the current monitoring image to obtain an analysis result until the analysis result meets the preset requirements, and taking the monitoring image whose analysis result meets the preset requirements as the target monitoring image.

[0144] In one embodiment, comparing the current working data with the standard working data to obtain a comparison result includes: obtaining the comparison difference between the current working data and the standard working data; if the comparison difference meets the first preset difference or the second preset difference, determining that the comparison result is abnormal, where the first preset difference is less than the second preset difference; otherwise, determining that the comparison result is normal.

[0145] In one embodiment, detecting the embedded device according to the comparison result and the target monitoring image to obtain a detection result includes: if it is detected that the comparison difference meets the first preset difference and it is detected that there is no abnormal phenomenon in the structure of the embedded device in the target monitoring image, determining that the detection result is adjustable; otherwise, determining that the detection result is non - adjustable.

[0146] In one embodiment, after the step of detecting the embedded device based on the comparison result and the target monitoring image to obtain a detection result, when the computer program is executed by the processor, the processor is further caused to perform the following steps: If the detection result of the embedded device is adjustable, adjust the parameters of the embedded device or restart it; if the detection result of the embedded device is not adjustable, issue a fault alarm.

[0147] In one embodiment, when the computer program is executed by the processor, the processor is further caused to perform the following steps: Receive a control instruction from a maintenance personnel; Adjust the working parameters of the camera according to the control instruction, and obtain a monitoring image after the parameters are adjusted; Export a work log according to the control instruction, so that the maintenance personnel can perform analysis and maintenance based on the monitoring image after the parameters are adjusted and the content of the exported work log.

[0148] In one embodiment, the present invention provides a storage medium storing a computer program, which when executed by a processor, causes the processor to perform the following steps: Obtain the current working data of the embedded device; Compare the current working data with the standard working data to obtain a comparison result; If the comparison result is abnormal, obtain the target monitoring image of the embedded device; Detect the embedded device based on the comparison result and the target monitoring image to obtain a detection result.

[0149] In one embodiment, before the step of obtaining the current working data of the embedded device, when the computer program is executed by the processor, the processor is further caused to perform the following steps: Obtain the first working data corresponding to the initial working parameters set for the embedded device; If the first working data does not meet the preset range, adjust the working parameters of the embedded device, and obtain the second working data corresponding to the adjusted working parameters of the embedded device; If the second working data does not meet the preset range, adjust the working parameters of the embedded device again, and obtain the working data corresponding to the working parameters after the embedded device is adjusted again, until the obtained working data meets the preset range, and determine the last obtained working data as the standard working data.

[0150] In one embodiment, obtaining the target monitoring image of the embedded device includes: Obtain the current monitoring image captured by the camera for the embedded device, and analyze the current monitoring image to obtain an analysis result; When the analysis result does not meet the preset requirements, obtain the defect type in the analysis result; Adjust the working parameters of the camera according to the defect type; Re-capture the embedded device based on the adjusted working parameters to obtain a new monitoring image, use the new monitoring image as the current monitoring image, and enter the step of analyzing the current monitoring image to obtain an analysis result, until the analysis result meets the preset requirements, and use the monitoring image whose analysis result meets the preset requirements as the target monitoring image.

[0151] In one embodiment, the current working data is compared with the standard working data to obtain a comparison result, including: obtaining the comparison difference between the current working data and the standard working data; if the comparison difference meets the first preset difference or the second preset difference, it is determined that the comparison result is abnormal, where the first preset difference is less than the second preset difference; otherwise, it is determined that the comparison result is normal.

[0152] In one embodiment, the embedded device is detected according to the comparison result and the target monitoring image to obtain a detection result, including: if it is detected that the comparison difference meets the first preset difference and no abnormal phenomenon is detected in the structure of the embedded device in the target monitoring image, it is determined that the detection result is adjustable; otherwise, it is determined that the detection result is non-adjustable.

[0153] In one embodiment, after the step of detecting the embedded device according to the comparison result and the target monitoring image to obtain a detection result, when the computer program is executed by the processor, the processor is further caused to perform the following steps: if the detection result of the embedded device is adjustable, the parameters of the embedded device are adjusted or the embedded device is restarted; if the detection result of the embedded device is non-adjustable, a fault alarm is issued.

[0154] In one embodiment, when the computer program is executed by the processor, the processor is further caused to perform the following steps: receiving a control instruction from a maintenance personnel; adjusting the working parameters of the camera according to the control instruction, and obtaining a monitoring image after the parameters are adjusted; exporting a work log according to the control instruction, so that the maintenance personnel can perform analysis and maintenance based on the monitoring image after the parameters are adjusted and the content of the exported work log.

[0155] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The program can be stored in a non-volatile computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, storage, database, or other medium used in the various embodiments provided in the present application can include non-volatile and / or volatile memories. Non-volatile memories can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memories can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), Rambus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and Rambus dynamic RAM (RDRAM), etc.

[0156] The technical features of the above embodiments can be combined arbitrarily. For the sake of concise description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope described in this specification.

[0157] The above-described embodiments merely represent several implementation manners of the present application. The description is relatively specific and detailed, but it should not be construed as a limitation on the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the appended claims. Please enter the specific implementation content part.

Claims

1. An embedded device detection method, characterized in that, Including: Obtain the current working data of the embedded device; Compare the current working data with the standard working data to obtain a comparison result; If the comparison result is abnormal, obtain the target monitoring image of the embedded device; Detect the embedded device according to the comparison result and the target monitoring image to obtain a detection result; Among them, the step of comparing the current working data with the standard working data to obtain a comparison result includes: Obtain the comparison difference between the current working data and the standard working data; If the comparison difference meets the first preset difference or the second preset difference, it is determined that the comparison result is abnormal, where the first preset difference is less than the second preset difference; otherwise, it is determined that the comparison result is normal; Among them, the step of detecting the embedded device according to the comparison result and the target monitoring image to obtain a detection result includes: If it is detected that the comparison difference meets the first preset difference and it is detected that there is no abnormal phenomenon in the structure of the embedded device in the target monitoring image, it is determined that the detection result is adjustable; Otherwise, it is determined that the detection result is not adjustable; If the detection result is adjustable, adjust the parameters of the embedded device or restart it; If the detection result of the embedded device is not adjustable, a fault alarm is issued.

2. The method according to claim 1, characterized in that, Before the step of obtaining the current working data of the embedded device, it further includes: Obtain the first working data corresponding to the initial working parameters set by the embedded device; If the first working data does not meet the preset range, adjust the working parameters of the embedded device, and obtain the second working data corresponding to the adjusted working parameters of the embedded device; If the second working data does not meet the preset range, adjust the working parameters of the embedded device again, and obtain the working data corresponding to the working parameters adjusted again of the embedded device until the obtained working data meets the preset range, and determine the finally obtained working data as the standard working data.

3. The method according to claim 1, characterized in that The step of obtaining the target monitoring image of the embedded device includes: Obtain the current monitoring image captured by the camera of the embedded device, and analyze the current monitoring image to obtain an analysis result; When the analysis result does not meet the preset requirements, obtain the defect type in the analysis result; Adjust the working parameters of the camera according to the defect type; Based on the adjusted working parameters, re-capture the embedded device to obtain a new monitoring image, use the new monitoring image as the current monitoring image, and enter the step of analyzing the current monitoring image to obtain an analysis result until the analysis result meets the preset requirements, and use the monitoring image whose analysis result meets the preset requirements as the target monitoring image.

4. The method according to claim 1, characterized in that The method further includes: Receive the control instruction of the maintenance personnel; Adjust the working parameters of the camera according to the control instruction, and obtain the monitoring image after adjusting the parameters; Export the work log according to the control instruction, so that the maintenance personnel can analyze and maintain according to the monitoring image after adjusting the parameters and the content of the exported work log.

5. An embedded device detection device, characterized in that, The device includes: A first acquisition module, configured to acquire current working data of the embedded device; A data comparison module, configured to compare the current working data with standard working data to obtain a comparison result; A second acquisition module, configured to acquire a target monitoring image of the embedded device if the comparison result is abnormal; A detection module, configured to detect the embedded device according to the comparison result and the target monitoring image to obtain a detection result; The data comparison module is further configured to acquire a comparison difference between the current working data and the standard working data; If the comparison difference meets a first preset difference or a second preset difference, it is determined that the comparison result is abnormal, where the first preset difference is less than the second preset difference; otherwise, it is determined that the comparison result is normal; The detection module is further configured to determine that the detection result is adjustable if it is detected that the comparison difference meets the first preset difference and it is detected that there is no abnormal phenomenon in the structure of the embedded device in the target monitoring image; Otherwise, it is determined that the detection result is non-adjustable; The device is further configured to, if the detection result is adjustable, perform parameter adjustment or restart on the embedded device; if the detection result of the embedded device is non-adjustable, issue a fault alarm.

6. An embedded device detection device, comprising a processor, a memory, and a camera component, wherein a computer program is stored in the memory, and is characterized in that, When the computer program is executed by the processor, the processor is caused to execute the steps of any one of the methods as claimed in claims 1 to 4.

7. A storage medium stores a computer program, characterized in that, When the computer program is executed by the processor, the processor is caused to execute the steps of any one of the methods as claimed in claims 1 to 4.

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