A sample analysis system and its sample scheduling method

Abstract

A sample analysis and its sample scheduling method. When a second-type sample rack needs to enter the second sample injection track of an analysis device at a distance for sample injection, it is determined whether there is a second-type sample rack to be injected by the analysis device at the nearby location on the second sample injection track of the nearby analysis device. If it is determined that there is such a sample rack, the second-type sample rack to be injected is controlled to finally enter the second sample injection track of the analysis device at the distance through the first sample injection track of the nearby analysis device. The present invention improves the sample scheduling scheme by introducing the idea of borrowing a track.

Description

Technical Field

[0001] The present invention relates to a sample analysis and its sample scheduling method. Background Art

[0002] With the demand for a large number of samples to be measured, in order to meet high throughput and reduce time, a sample analysis system composed of multiple sample analysis devices has emerged. For such a system including multiple analysis devices, generally, the samples to be tested are uniformly input at the front end of the system (such as the input module at the front end of the system), and then the system sequentially distributes the samples to the corresponding one or more analysis devices for testing. Specifically, the system generally introduces a track to connect the input module and each analysis device, so that the sample can reach any analysis device through the track from the input module for testing.

[0003] When multiple samples are scheduled on the track, it is possible that the samples interfere with each other, resulting in the samples not reaching the corresponding analysis device in time for testing. Therefore, some existing sample scheduling schemes need to be improved. Summary of the Invention

[0004] The present application provides a sample analysis and its sample scheduling method.

[0005] According to a first aspect, in one embodiment, a sample analysis system is provided, including:

[0006] An input component for receiving and scheduling samples to be tested;

[0007] At least two analysis devices arranged in sequence from near to far from the input component for testing the samples; each analysis device is provided with a corresponding front-end track area; each front-end track area is provided with a first sample injection track and a second sample injection track; the first sample injection track of the front-end track area is provided with a sample suction position for the analysis device corresponding to the front-end track area to suck samples on the first type of sample rack; the second sample injection track of the front-end track area is provided with a sample suction position for the analysis device corresponding to the front-end track area to suck samples on the second type of sample rack; for the analysis device adjacent to the input component, its front-end track area is used to receive the samples scheduled by the input component; the first sample injection tracks in the front-end track areas of adjacent analysis devices are interconnected so that the first type of sample rack enters the first sample injection track of the distant analysis device from the first sample injection track of the nearby analysis device; the second sample injection tracks in the front-end track areas of adjacent analysis devices are interconnected so that the second type of sample rack enters the second sample injection track of the distant analysis device from the second sample injection track of the nearby analysis device;

[0008] A track-changing mechanism for changing the track of the sample rack on the first sample injection track of the analysis device to enter the second sample injection track of the adjacent analysis device; and

[0009] A processor, when a second - type sample rack needs to enter the second sample injection track of a distant analysis device for sample injection, determines whether there is a second - type sample rack to be aspirated by the second sample injection track of the nearby analysis device. If it is determined that there is, the second - type sample rack to be injected is controlled to finally enter the second sample injection track of the distant analysis device through the first sample injection track of the nearby analysis device.

[0010] In one embodiment, when a first - type sample rack needs to enter the first sample injection tracks of multiple analysis devices for sample injection respectively, the processor controls the first - type sample rack to inject samples into the first sample injection tracks of the multiple analysis devices in sequence from far to near.

[0011] In one embodiment, when a first - type sample rack needs to enter the first sample injection track of a nearby analysis device for sample injection, the processor determines whether there is a second - type sample rack / first - type sample rack that needs to enter the second sample injection track / first sample injection track of a distant analysis device through the first sample injection track of the nearby analysis device. When it is determined that there is, the processor first controls the second - type sample rack / first - type sample rack that needs to enter the distant analysis device to enter the second sample injection track / first sample injection track of the distant analysis device, and then controls the first - type sample rack that needs to enter the nearby analysis device to enter the first sample injection track of the nearby analysis device.

[0012] In one embodiment, before the processor first controls the second - type sample rack / first - type sample to enter the second sample injection track / first sample injection track of the distant analysis device, it also determines whether the second sample injection track / first sample injection track of the distant analysis device is full. If it is not full, then it controls the second - type sample rack / first - type sample to enter the second sample injection track / first sample injection track of the distant analysis device. Otherwise, it controls the second - type sample rack / first - type sample to wait in the input component.

[0013] In one embodiment, the first sample injection track is an emergency sample injection track, and the first - type sample rack is an emergency sample rack; the second sample injection track is a regular sample injection track, and the second - type sample rack is a regular sample rack.

[0014] In one embodiment, each front - end track area further includes a return track. The return tracks in the front - end track areas of adjacent analysis devices are interconnected, so that the sample rack after sample injection enters the return track of the nearby analysis device from the return track of the distant analysis device; for the analysis device adjacent to the input component, its return track is connected to the input component.

[0015] In one embodiment, the input component includes:

[0016] A loading area for carrying sample racks to be sampled;

[0017] A recycling area for receiving sample racks to be recycled;

[0018] A buffer area for buffering sample racks;

[0019] A scheduling mechanism for scheduling the sample racks in the loading area to the first sampling track or the second sampling track in the front-end track area adjacent to the input component; and receiving the sample racks coming from the return channel in the front-end track area adjacent to the input component and scheduling them to the recycling area.

[0020] According to a second aspect, an embodiment provides a sample scheduling method for a sample analysis system, the sample analysis system including an input component and at least two analysis devices arranged in sequence from near to far relative to the input component. The sample scheduling method includes:

[0021] If there is an emergency sample rack to be sampled, determine whether the emergency sample rack needs to enter the emergency sampling tracks of multiple analysis devices for sampling respectively;

[0022] If so, control the emergency sample rack to sample in the emergency sampling tracks of the multiple analysis devices in sequence from far to near.

[0023] In one embodiment, the sample scheduling method further includes:

[0024] When there is a regular sample rack that needs to enter the regular sampling track of a distant analysis device for sampling, determine whether there is a regular sample rack to be aspirated by the nearby analysis device on the regular sampling track of the nearby analysis device;

[0025] If it is determined that there is, control the regular sample rack to be sampled to finally enter the regular sampling track of the distant analysis device through the emergency sampling track of the nearby analysis device.

[0026] According to a third aspect, an embodiment provides a sample scheduling method for a sample analysis system, the sample analysis system including an input component and at least two analysis devices arranged in sequence from near to far relative to the input component. The sample scheduling method includes:

[0027] When there is an emergency sample rack that needs to enter the emergency sampling track of a nearby analysis device for sampling, determine whether there are other sample racks that need to enter a distant analysis device for sampling;

[0028] When it is determined that there are other sample racks that need to enter the sampling track of a distant analysis device for sampling, after avoiding the other sample racks that need to enter the distant analysis device, then control the emergency sample rack to enter the emergency sampling track of the corresponding analysis device.

[0029] In one embodiment, avoiding other sample racks that need to enter a remote analysis device includes: first controlling other sample racks that need to enter a remote analysis device to move to the sampling track corresponding to the remote analysis device through the emergency sampling track of a nearby analysis device;

[0030] The sample scheduling method further includes: before first controlling other sample racks that need to enter a remote analysis device to move to the sampling track corresponding to the remote analysis device through the emergency sampling track of a nearby analysis device, it is also determined whether the sampling track corresponding to the remote analysis device is full. If it is not full, then control the sample rack to enter the sampling track corresponding to the remote analysis device, otherwise, control the sample rack to wait.

[0031] In one embodiment, the sample scheduling method further includes:

[0032] When a conventional sample rack needs to enter the conventional sampling track of a remote analysis device for sampling, it is determined whether there is a conventional sample rack to be aspirated by the nearby analysis device on the conventional sampling track of the nearby analysis device;

[0033] If it is determined that there is one, then control the conventional sample rack to be sampled to finally enter the conventional sampling track of the remote analysis device through the emergency sampling track of the nearby analysis device.

[0034] In one embodiment, the number of other sample racks that need to enter a remote analysis device to be avoided is not greater than N, where N is an integer not less than 1.

[0035] In one embodiment, N = 1.

[0036] According to the fourth aspect, an embodiment provides a computer-readable storage medium including a program that can be executed by a processor to implement the method described in any of the embodiments herein.

[0037] Based on the sample analysis, its sample scheduling method, and computer-readable storage medium of the above embodiments, the sample scheduling scheme is improved, and the idea of borrowing a path is introduced. When a second-type sample rack needs to enter the second sampling track of a remote analysis device for sampling, it is determined whether there is a second-type sample rack to be sampled by the nearby analysis device on the second sampling track of the nearby analysis device. If it is determined that there is one, then control the second-type sample rack to be sampled to finally enter the second sampling track of the remote analysis device through the first sampling track of the nearby analysis device. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 It is a schematic structural diagram of a sample analysis system according to an embodiment;

[0039] FIG. 2(a) is a schematic structural diagram of an input component of an embodiment and a scheduling path; FIG. 2(b) is a schematic structural diagram of an input component of an embodiment and a scheduling path;

[0040] Figure 3 is a schematic structural diagram of an input component of another embodiment;

[0041] Figure 4 is a schematic structural diagram of an input component of yet another embodiment;

[0042] Figure 5 is a schematic structural diagram of a sample analysis system of another embodiment;

[0043] Figure 6 is a schematic structural diagram of a sample analysis system of yet another embodiment;

[0044] Figure 7 is a flowchart of a sample scheduling method of an embodiment;

[0045] Figure 8 is a flowchart of a sample scheduling method of another embodiment;

[0046] Figure 9 is a flowchart of a sample scheduling method of yet another embodiment;

[0047] Figure 10 is a flowchart of a sample scheduling method of still another embodiment;

[0048] Figure 11 is a flowchart of a sample scheduling method of yet another embodiment. Detailed Embodiments

[0049] The present invention will be further described in detail below in conjunction with the accompanying drawings through specific embodiments. Similar elements in different embodiments are labeled with related similar element numbers. In the following embodiments, many detailed descriptions are provided to enable a better understanding of the present application. However, those skilled in the art can easily recognize that some of the features can be omitted in different situations, or can be replaced by other elements, materials, or methods. In some cases, some operations related to the present application are not shown or described in the specification to avoid overwhelming the core part of the present application with excessive descriptions. For those skilled in the art, it is not necessary to describe these related operations in detail, and they can fully understand the related operations based on the descriptions in the specification and the general technical knowledge in the art.

[0050] In addition, the features, operations, or characteristics described in the specification can be combined in any suitable manner to form various embodiments. At the same time, the steps or actions in the method description can also be reordered or adjusted in a manner obvious to those skilled in the art. Therefore, the various sequences in the specification and drawings are only for clearly describing a certain embodiment and do not mean a necessary sequence, unless it is otherwise stated that a certain sequence must be followed.

[0051] The serial numbers assigned to the components herein, such as "first", "second", etc., are only used to distinguish the described objects and do not have any sequential or technical meaning. And as used in this application, "connection" and "coupling", unless otherwise specified, both include direct and indirect connection (coupling).

[0052] The sample analysis system has various structural forms. Please refer to Figure 1 , a sample analysis system according to an embodiment may include an input component 10, at least two analysis devices 30, and a processor 50, which will be specifically described below.

[0053] The input component 10 is used to receive and schedule the samples to be tested. The input component 10 is generally the area where the user places the samples. When the sample analysis system is working, the input component 10 can automatically scan the samples placed therein to obtain the identification information of the samples. Through the identification information of the samples, information such as the sample number and the items to be tested can be obtained. There are various implementation schemes for the input component 10. For example, the input component 10 can have a placement area and a recycling area. The placement area is used to carry the sample racks to be sampled, and the recycling area is used to receive the sample racks to be recycled. The operator can recycle the sample racks from the recycling area. In order to achieve the batch placement, transfer, recycling, and removal of the sample racks, the input component 10 can be provided with multiple placement areas and multiple recycling areas. For the purpose of saving space and simplifying the design, etc., these placement areas can share a section of the transportation channel, and these recycling areas can also share a section of the transportation channel. Even these placement areas and recycling areas can share the same section of the transportation channel. Hereinafter, the input component 10 with two placement areas and two recycling areas will be taken as an example for illustration.

[0054] Please refer to FIG. 2. The input component 10 includes a number of loading areas and a number of recycling areas, and also includes a scheduling mechanism (not shown in the figure). The example shown in FIG. 2 is of two loading areas and two recycling areas. The two loading areas P1 and P2 share a section of transportation channel, which may be named the first channel; the two recycling areas R1 and R2 also share a section of transportation channel, which may be named the second channel. As shown in FIG. 2(a), it is a schematic diagram of the sample rack injection scheduling transfer route in the input component 10. The sample rack in the loading area is pushed upward by the scheduling mechanism into the first channel. As for whether the sample rack in loading area P1 or P2 is being scheduled, it depends on the current process. Generally, the input component 10 first schedules and transfers all the sample racks in one loading area before starting to schedule and transfer the sample racks in the next loading area - in the figure, it shows that the sample rack in loading area P2 is in the process of injection; then the sample rack is pushed by the scheduling mechanism to move leftward in the first channel. When the sample rack is scheduled and transported to position 1, it is then continuously scheduled and transported downward by the scheduling mechanism to position 2, and then transported leftward to the sampling position corresponding to each analysis device 10. The sample tubes on the sample rack are sampled at the sampling position. After all the sample tubes on the sample rack are sampled, the sample rack needs to be scheduled and transferred to the recycling area. As shown in FIG. 2(b), it is a schematic diagram of the sample rack recycling scheduling transfer route in the input component 10. The sample rack after sampling is scheduled and transferred back to position 2 from the sampling position by the scheduling mechanism, and then continuously scheduled and transported upward from position 2 to position 3, and then transported rightward to the second channel for subsequent entry into the recycling area. As for whether it is recycling area R1 or recycling area R2, it depends on the current process. Generally, the input component 10 first schedules and transfers the sampled sample racks to one recycling area. When that recycling area is full of sample racks, the scheduling mechanism then schedules and transfers the sampled sample racks to the next recycling area - in the figure, it shows that recycling area R2 is the current recycling area for receiving the sample racks to be recycled. Therefore, the scheduling mechanism transfers the sample rack from position 3 rightward to position 4, and then pushes the sample rack downward into recycling area R2 to complete the recycling of this sample rack. Generally, a scanner (not shown in the figure) can be set on the first channel to scan the passing sample racks and / or each sample on the sample rack to obtain corresponding information, such as the information of the sample rack, the identification information of the sample, etc. It should be noted that the up, down, left, and right directions involved in the sample rack scheduling transfer are directions described with reference to the attached drawings and do not necessarily mean the real up, down, left, and right.

[0055] Figure 3 FIG. 4 is a schematic structural diagram of the input component 10 of another embodiment. Compared with FIG. 2, Figure 3The input component 10 is provided with a buffer area. The buffer area can be arranged on the same layer as the loading area and the recycling area, or on a different layer. For example, in order to make the structure of the input component 10 more compact and occupy less floor space, if the layer where the loading area and the recycling area are located is named the first layer, the buffer area can be arranged on the minus first layer, that is, the layer below the first layer. The buffer area is used to cache sample racks. For example, the buffer area can have one or more of the following functions. Function 1: The buffer area can cache samples before sample testing. Specifically, the scheduling mechanism first schedules the sample racks in the loading area to the buffer area in sequence. During this process, the input component 10 can scan and obtain the label information of each sample temporarily stored in the buffer area, etc., and then can uniformly perform scheduling planning for each sample to be tested. The scheduling planning includes at least the target analysis device that the sample to be tested needs to go to. Function 2: The buffer area can cache the samples after being aspirated by the analysis device. The samples wait for test results in the buffer area to determine whether retesting is required. If retesting is required, the samples will be scheduled to the corresponding analysis device for retesting. Otherwise, the samples will be scheduled to the recycling area for the user to recycle.

[0056] Please refer to Figure 4 , in Figure 2 or Figure 3 On the basis of the input component 10, the input component 10 of some embodiments can also be provided with an emergency channel, and users can directly place the samples that need to be expedited through the emergency channel for priority testing. Of course, in some embodiments, the input component 10 can also be used to scan and identify ordinary sample racks (or non-emergency sample racks) and emergency sample racks, so as to determine the priority order of scheduling and testing.

[0057] The analysis device 30 is used to test samples. Generally, in order to improve efficiency and test throughput, the sample analysis system has multiple analysis devices 30, such as biochemical analysis devices, immunoassay analysis devices, coagulation analysis devices, etc. These analysis devices 30 can be of the same model or different models, which can be configured according to the needs of users and departments. Please refer to Figure 5 , each analysis device 30 is provided with a corresponding front-end track area, and each front-end track is provided with a first sampling track 31 and a second sampling track 32. The first sampling track 31 in the front-end track area is provided with a sampling position for the analysis device 30 corresponding to the front-end track area to aspirate samples on the first type of sample rack; the second sampling track 32 in the front-end track area is provided with a sampling position for the analysis device 30 corresponding to the front-end track area to aspirate samples on the second type of sample rack. There are at least two analysis devices 30, which are arranged in sequence from near to far with the input component 10. For example Figure 5 In, the analysis devices M1, M2,..., Mn are arranged in sequence from near to far with the input component 10. The analysis device 30 adjacent to the input component 10 - for exampleFigure 5 Among them, it refers to the analysis device M1, and its front-end track area is used to receive samples dispatched by the input component 10; the first sample injection tracks 31 in the front-end track areas of adjacent analysis devices 30 are interconnected, so that the first type of sample racks enter the first sample injection track 31 of the distant analysis device from the first sample injection track 31 of the nearby analysis device - for example Figure 5 Among them, the first sample injection tracks 31 of the analysis device M1 and the analysis device M2 are interconnected. The first type of sample racks that need to reach the analysis device M2 for testing can first enter the first sample injection track 31 of the analysis device M1 through the input component 10, and then be transported from the first sample injection track 31 of the analysis device M1 to the first sample injection track 31 of the analysis device M2; similarly, the second sample injection tracks 32 in the front-end track areas of adjacent analysis devices 30 are interconnected, so that the second type of sample racks enter the second sample injection track 32 of the distant analysis device from the second sample injection track 32 of the nearby analysis device - for example Figure 5 Among them, the second sample injection tracks 32 of the analysis device M1 and the analysis device M2 are interconnected. The first type of sample racks that need to reach the analysis device M2 for testing can first enter the second sample injection track 32 of the analysis device M1 through the input component 10, and then be transported from the second sample injection track 32 of the analysis device M1 to the second sample injection track 32 of the analysis device M2. In some embodiments, each front-end track area further includes a return track 33, and the return tracks 33 in the front-end track areas of adjacent analysis devices 30 are interconnected, so that the sample racks after sample injection enter the return track 33 of the nearby analysis device 30 from the return track 33 of the distant analysis device 30, and the return track 33 of the analysis device 30 adjacent to the input component 10 is connected to the input component 10 - for example Figure 5 Among them, the return tracks 33 of the analysis device M1 and the analysis device M2 are interconnected, and the analysis device M1 is also connected to the input component 10.

[0058] The sample analysis device is further provided with a track-changing mechanism 34. The track-changing mechanism 43 can change the track of the sample rack on the first sample injection track 31 of the analysis device 30 to enter the second sample injection track 33 of the adjacent analysis device 33. For example, it can change the track of the sample rack on the first sample injection track 31 of the analysis device M1 to enter the second sample injection track 33 of the analysis device M2. In some embodiments, the track-changing mechanism 34 can also change the track of the sample rack on the second sample injection track 32 of the analysis device 30 to enter the first sample injection track 31 of the adjacent analysis device 33; in some embodiments, the track-changing mechanism 34 can also change the track of the sample rack on the first sample injection track 31 and / or the second sample injection track 32 of the analysis device 30 to enter the return track 33 of this analysis device 30.

[0059] The first sample injection track 31, the second sample injection track 32, the first type of sample rack, and the second type of sample rack are mentioned above. In some embodiments, the first sample injection track 31 is an emergency track, and the second sample injection track 32 is a regular track or a non-emergency track. Correspondingly, the first type of sample rack is an emergency sample rack, and the second type of sample rack is a regular sample rack or a non-emergency sample rack. The identification of the first type of sample rack and the second type of sample rack can be achieved by the input component 10 through a scanner, or by the input component 10 through the position where the sample rack is placed. Taking the first type of sample rack as an emergency sample rack and the second type of sample rack as a regular sample rack as an example, the sample rack placed in the placement area of the input component 10 is a regular sample rack, and the sample rack placed in the emergency channel of the input component 10 is an emergency sample rack.

[0060] The following describes how the sample rack is scheduled on the track.

[0061] In some embodiments, when a second type of sample rack needs to enter the second sample injection track 32 of the distant analysis device 30 for sample injection, the processor 50 is used to determine whether there is a second type of sample rack to be aspirated by the second sample injection track 32 of the nearby analysis device 30. If it is determined that there is such a sample rack, the second type of sample rack to be injected is controlled to finally enter the second sample injection track 32 of the distant analysis device 30 through the first sample injection track 31 of the nearby analysis device 30. It should be noted that the terms "distant" and "near" mentioned herein are relative. For example, taking Figure 6 the three analysis devices M1, M2, and M3 as an example, the analysis device M1 is adjacent to the input component 10, and the analysis device M1 and the analysis device M2 are adjacent, and the analysis device M2 and the analysis device M3 are adjacent; the analysis device M1 is near the analysis devices M2 and M3. Correspondingly, the analysis devices M2 and M3 are distant from the analysis device M1; similarly, the analysis device M2 is near the analysis device M3, and the analysis device M3 is distant from the analysis device M2; of course, it can be understood that the analysis device M1 adjacent to the input component 10 cannot be a distant analysis device because the analysis device M1 is near regardless of which analysis device it is compared with. The following takes Figure 6 the three analysis devices as an example to illustrate how to perform the orbit change scheduling of the sample rack.

[0062] In one example, when a second-type sample rack S2 needs to enter the second sample injection track 32 of the analysis device M2 for sample injection, if there is no second-type sample rack waiting for sample aspiration on the second sample injection track 32 of the nearby analysis device, i.e., M1, then the above-mentioned second-type sample rack S2 directly enters the second sample injection track 32 of the analysis device M2 via the second sample injection track 32 of the analysis device M1. Conversely, if there is a second-type sample rack waiting for sample aspiration on the second sample injection track 32 of the nearby analysis device M1, then the above-mentioned second-type sample rack S2 bypasses through the first sample injection track 31 of the analysis device M1 and is then re-routed to the second sample injection track 32 of the analysis device M2.

[0063] In one example, when a second-type sample rack S2 needs to enter the second sample injection track 32 of the analysis device M3 for sample injection, if there is no second-type sample rack waiting for sample aspiration on the second sample injection track 32 of the nearby analysis device, i.e., M1, and there is no second-type sample rack waiting for sample aspiration on the second sample injection track 32 of the nearby analysis device, i.e., M2, then the above-mentioned second-type sample rack S2 directly enters the second sample injection track 32 of the analysis device M3 via the second sample injection tracks 32 of the analysis devices M1 and M2 in sequence; if there is no second-type sample rack waiting for sample aspiration on the second sample injection track 32 of the nearby analysis device, i.e., M1, but there is a second-type sample rack waiting for sample aspiration on the second sample injection track 32 of the nearby analysis device, i.e., M2, then in one way, the above-mentioned second-type sample rack S2 first enters the second sample injection track 32 of the analysis device M1, then changes tracks from the second sample injection track 32 of the analysis device M1 to the first sample injection track 31 of the analysis device M2, and then changes tracks from the first sample injection track 31 of the analysis device M2 to the second sample injection track 32 of the analysis device M3, or in another way, the above-mentioned second-type sample rack S2 first enters the first sample injection track 31 of the analysis device M1, then enters the first sample injection track 31 of the analysis device M2, and then changes tracks from the first sample injection track 31 of the analysis device M2 to the second sample injection track 32 of the analysis device M3; if there is a second-type sample rack waiting for sample aspiration on the second sample injection track 32 of the nearby analysis device M1, and there is no second-type sample rack waiting for sample aspiration on the second sample injection track 32 of the nearby analysis device M2, then in one way, the above-mentioned second-type sample rack S2 first enters the first sample injection track 31 of the analysis device M1, then enters the first sample injection track 31 of the analysis device M2 from the first sample injection track 32 of the analysis device M1, and then changes tracks from the first sample injection track 31 of the analysis device M2 to the second sample injection track 32 of the analysis device M3, or in another way, the above-mentioned second-type sample rack S2 first enters the first sample injection track 31 of the analysis device M1, then changes tracks from the first sample injection track 32 of the analysis device M1 to the second sample injection track 32 of the analysis device M2, and then enters the second sample injection track 32 of the analysis device M3 from the second sample injection track 32 of the analysis device M2;If the second sample introduction track 32 of the nearby analysis device M1 has a second type sample rack to be sampled on the analysis device M1, and the second sample introduction track 32 of the nearby analysis device M2 also has a second type sample rack to be sampled on the analysis device M2, then the second type sample rack S2 first enters the first sample introduction track 31 of the analysis device M1, then enters the first sample introduction track 31 of the analysis device M2 from the first sample introduction track 32 of the analysis device M1, and then changes track from the first sample introduction track 31 of the analysis device M2 to the second sample introduction track 32 of the analysis device M3. ;

[0064] In order to facilitate the borrowing of passage during scheduling, for example, a second type of sample rack that needs to enter the second injection track 32 of a distant analysis device borrows the first injection track 31 of a nearby analysis device. In some embodiments, when the scheduling of sample injection is controlled, the principle of from far to near is implemented to facilitate the borrowing of passage for other samples. Specifically, in some embodiments, when a first type of sample rack needs to enter the first injection track 31 of multiple analysis devices 30 for injection, the processor 50 controls the first type of sample rack to inject the sample in the first injection track 31 of the multiple analysis devices from far to near in sequence. It can be understood that injecting the sample in the first injection track 31 of multiple analysis devices 30 from far to near in sequence here means that the sample is first injected into the analysis devices 30 that need to be tested according to the distance between the analysis device 30 and the input component 10, for example, the sample is first injected into the first injection track 31 of the farthest analysis device 30 among the analysis devices 30 that need to be tested, and finally the sample is injected into the first injection track 31 of the closest analysis device 30 among the analysis devices 30 that need to be tested. Might as well Figure 6 For example, when a first-type sample rack S1 needs to enter the first sampling track 31 of the analysis equipment M1, M2 and M3 for sampling, since the three analysis equipment 30 that the first-type sample rack S1 needs to sample are respectively the analysis equipment M3, the analysis equipment M2 and the analysis equipment M1, the first-type sample rack S1 first directly goes to the first sampling track 31 of the analysis equipment M3 for sampling, and then the first-type sample rack S1 goes from the first sampling track 31 of the analysis equipment M3 to the first sampling track 31 of the analysis equipment M2 for sampling, and finally the first-type sample rack S1 goes from the first sampling track 31 of the analysis equipment M2 to the first sampling track 31 of the analysis equipment M1 for sampling. By scheduling the sampling from far to near, the first sampling track 31 corresponding to the nearby analysis equipment can be kept as unblocked as possible, so as to facilitate other sample racks to use the first sampling track 31 corresponding to the nearby analysis equipment.

[0065] In order not to block the path for borrowing the lane, in some other embodiments, when there is a sample rack only sampling on the track of the nearby analysis device, then it is possible to first check if there are any other sample racks going to the distant analysis device. Specifically, in some embodiments, when a first type of sample rack needs to enter the first sampling track 31 of the nearby analysis device 30 - that is, this first type of sample rack only needs to enter the first sampling track 31 of this analysis device 30 for sampling, the processor 50 determines whether there are any other sample racks that need to enter the distant analysis device through the first sampling track 31 of the above-mentioned nearby analysis device 30 - here, the distant analysis device 30 is relative to the nearby analysis device 30 where the first type of sample rack needs to enter - corresponding sampling track for sampling. When it is determined that there are, the processor 50 first controls the sample rack that needs to enter the distant analysis device 30 to enter the corresponding sampling track of the distant analysis device 30, and then controls the first type of sample rack that needs to enter the above-mentioned nearby analysis device 30 to enter the first sampling track 31 of this nearby analysis device 30. It can be understood that the processor 50 determines whether there is a sample rack that needs to enter the corresponding sampling track of the distant analysis device through the first sampling track 31 of the above-mentioned nearby analysis device 30, which means whether there is a second type of sample rack that needs to enter the second sampling track 32 of the distant analysis device through the first sampling track 31 of the above-mentioned nearby analysis device 30, and / or whether there are any other first type of sample racks that need to enter the first sampling track 31 of the distant analysis device through the first sampling track 31 of the above-mentioned nearby analysis device 30.

[0066] Let's still take Figure 6Taking the three analysis devices M1, M2, and M3 as an example, when there is a first - type sample rack S1 that only needs to be loaded into the first sample - injection track 31 of the analysis device M1, that is, the first - type sample rack S1 does not need to be loaded into the first sample - injection tracks 31 of the analysis devices M2 and M3. Therefore, before the first - type sample rack S1 is loaded into the first sample - injection track 31 of the analysis device M1, it is first determined whether there are other sample racks that need to enter the sample - injection tracks of the distant analysis devices M2 or M3 through the first sample - injection track 31 of the analysis device M1. Specifically, for example, it is determined whether there is a second - type sample rack that needs to enter the second sample - injection track 32 of the distant analysis device M2 or M3 through the first sample - injection track 31 of the analysis device M1, and / or it is determined whether there are other first - type sample racks that need to enter the first sample - injection track 31 of the distant analysis device M2 or M3 through the first sample - injection track 31 of the analysis device M1. If so - for example, if there is a second - type sample rack S2 that needs to enter the second sample - injection track 32 of the distant analysis device M3 through the first sample - injection track 31 of the analysis device M1, then the second - type sample rack S2 is first scheduled to the second sample - injection track 32 of the distant analysis device M3, and then the first - type sample rack S1 is sent to the first sample - injection track 31 of the analysis device M1. For example, if there is a first - type sample rack S3 that needs to enter the first sample - injection track 31 of the distant analysis device M3 through the first sample - injection track 31 of the analysis device M1, then the first - type sample rack S3 is first scheduled to the first sample - injection track 31 of the distant analysis device M3, and then the first - type sample rack S1 is sent to the first sample - injection track 31 of the analysis device M1. In some embodiments, on the basis of the above implementation, before the processor 50 controls the second - type sample rack / first sample rack that needs to enter the distant analysis device to enter the second sample - injection track / first sample - injection track of the distant analysis device, some additional judgments are made to see whether the distant analysis device can bear the load of the continued incoming sample racks. The following is a specific description.

[0067] In some embodiments, when a first - type sample rack needs to be loaded into the first sample - injection track 31 of the nearby analysis device 30 for sample injection, the processor 50 determines whether there are other sample racks - such as other first - type sample racks and / or second - type samples that need to enter the distant analysis device 30 through the first sample - injection track 31 of the above - mentioned nearby analysis device 30. When it is determined that there are, the processor 50 then determines whether the corresponding sample - injection track of the distant analysis device 30 is full. If it is not full, then the sample rack that needs to enter the distant analysis device 30 is controlled to enter the corresponding sample - injection track of the distant analysis device. Otherwise, the sample rack that needs to enter the distant analysis device 30 is controlled to wait in the input component, and the first - type sample rack that needs to enter the first sample - injection track 31 of the above - mentioned nearby analysis device 30 is controlled to enter the first sample - injection track 31 of the nearby analysis device 30. Still taking Figure 6Taking the three analysis devices M1, M2, and M3 as an example, when there is a first type of sample rack S1 that only needs to enter the first sample injection track 31 of the analysis device M1 for sample injection, before the first type of sample rack S1 enters the first sample injection track 31 of the analysis device M1 for sample injection, it is first determined whether there are other sample racks that need to enter the sample injection tracks of the distant analysis devices M2 or M3 through the first sample injection track 31 of the analysis device M1. For example, specifically, it is determined whether there is a second type of sample rack that needs to enter the second sample injection track 32 of the distant analysis devices M2 or M3 through the first sample injection track 31 of the analysis device M1, and / or it is determined whether there are other first type of sample racks that need to enter the first sample injection track 31 of the distant analysis devices M2 or M3 through the first sample injection track 31 of the analysis device M1; if so - for example, if there is a second type of sample rack S2 that needs to enter the second sample injection track 32 of the distant analysis device M3 through the first sample injection track 31 of the analysis device M1, then it is further determined whether the second sample injection track 32 of the distant analysis device M3 is full - for example, the second sample injection track 32 can have a certain length, such as it can carry 3 sample racks. If the second sample injection track 32 of the analysis device M3 already has three sample racks being aspirated or waiting to be aspirated at this time, then the second sample injection track 32 of the analysis device M3 is full; if the second sample injection track 32 of the distant analysis device M3 is not full, then the second type of sample rack S2 is first scheduled to the second sample injection track 32 of the distant analysis device M3, and then the first type of sample rack S1 is sent to the first sample injection track 31 of the analysis device M1; if the second sample injection track 32 of the distant analysis device M3 is full, then the second type of sample rack S2 is controlled not to be scheduled to the second sample injection track 32 of the distant analysis device M3 - for example, it can wait or be temporarily stored in the input component 10, and the first type of sample rack S1 is controlled to be sent to the first sample injection track 31 of the analysis device M1.

[0068] As described above, in order not to block the path for borrowing the lane, in some embodiments, when there is a sample rack only sampling on the track of the nearby analysis device, then it is possible to first check if there are other sample racks going to the distant analysis device; in these embodiments, taking the example that the emergency sample rack does not block the regular sample rack from borrowing the emergency sampling track, considering the emergency nature of the emergency sample rack, in some embodiments, only one sample rack is allowed to jump the queue to borrow the lane. For example, in some embodiments, when a first type of sample rack needs to enter the first sampling track 31 of the nearby analysis device 30 - that is, the first type of sample rack only needs to enter the first sampling track 31 of this analysis device 30, the processor 50 determines whether there are other sample racks that need to enter the corresponding sampling track of the distant analysis device through the first sampling track 31 of the nearby analysis device. When it is determined that there are and there are multiple other sample racks, then the processor 50 only controls one of these multiple other sample racks to enter the corresponding sampling track of the distant analysis device 30, and then immediately controls the first type of sample rack that needs to enter the nearby analysis device 30 to enter the first sampling track 31 of the corresponding analysis device 30. Still taking Figure 6 the three analysis devices M1, M2, and M3 in it as an example, when a first type of sample rack S1 only needs to enter the first sampling track 31 of the analysis device M1 for sampling, that is, the first type of sample rack S1 does not need to enter the first sampling tracks 31 of the analysis devices M2 and M3. Therefore, before the first type of sample rack S1 goes to the first sampling track 31 of the analysis device M1 for sampling, first check if there are other sample racks that need to enter the sampling tracks of the distant analysis devices M2 or M3 through the first sampling track 31 of the analysis device M1. Specifically, for example, it is to check if there is a second type of sample rack that needs to enter the second sampling track 32 of the distant analysis devices M2 or M3 through the first sampling track 31 of the analysis device M1, and / or, check if there are other first type of sample racks that need to enter the first sampling track 31 of the distant analysis devices M2 or M3 through the first sampling track 31 of the analysis device M1; if so and there are multiple, for example, there are multiple other sample racks that need to enter the corresponding sampling tracks of the distant analysis devices M2 or M3 for sampling, then only control one of these other sample racks to enter the corresponding sampling track of the corresponding analysis device, and then immediately control the first type of sample rack S1 that needs to enter the analysis device M1 to go to the first sampling track 31 of the analysis device M1.

[0069] The above describes the lane-changing strategy during scheduling. Understandably, whether it is for the first type of sample rack or the second type of sample rack, when they need to go to an analytical device far away, they prefer to use their corresponding sample injection tracks. For example, when the second type of sample rack needs to go to an analytical device far away, if the second sample injection tracks of all nearby analytical devices are unobstructed, then the second type of sample rack directly enters the second sample injection track of the corresponding far-away analytical device through the second sample injection tracks of all nearby analytical devices, without the need to borrow the first sample injection track of the nearby analytical device.

[0070] The above is the description of the sample analysis system in some embodiments of this application. In some embodiments of the present invention, a sample scheduling method for the sample analysis system is also disclosed. The structure of the sample analysis system involved here can be the sample analysis system disclosed in any of the embodiments herein. For example, the sample analysis system includes an input component 10 and at least two analysis devices 30 arranged in sequence from near to far relative to the above input component 10. For another example, the sample analysis system may further include a rail-changing mechanism 34; each analysis device 30 is provided with a corresponding front-end rail area; each front-end rail area is provided with a first sample injection rail 31 and a second sample injection rail 32; the first sample injection rail 31 in the front-end rail area is provided with a sample suction position for the analysis device 30 corresponding to the front-end rail area to suck samples on the first type of sample rack; the second sample injection rail 32 in the front-end rail area is provided with a sample suction position for the analysis device 30 corresponding to the front-end rail area to suck samples on the second type of sample rack; for the analysis device 30 adjacent to the input component 10, its front-end rail area is used to receive samples scheduled by the input component 10; the first sample injection rails 31 in the front-end rail areas of adjacent analysis devices 30 are interconnected so that the first type of sample rack enters the first sample injection rail 31 of the distant analysis device 30 from the first sample injection rail 31 of the nearby analysis device; the second sample injection rails 32 in the front-end rail areas of adjacent analysis devices 30 are interconnected so that the second type of sample rack enters the second sample injection rail 32 of the distant analysis device from the second sample injection rail 32 of the nearby analysis device 30; the rail-changing mechanism 34 is used to change the track of the sample rack on the first sample injection rail of the analysis device 30 to enter the second sample injection rail of the adjacent analysis device. In some embodiments, the rail-changing mechanism 34 can also change the track of the sample rack on the second sample injection rail 32 of the analysis device 30 to enter the first sample injection rail 31 of the adjacent analysis device 33; in some embodiments, the rail-changing mechanism 34 can also change the track of the sample rack on the first sample injection rail 31 and / or the second sample injection rail 32 of the analysis device 30 to enter the return rail 33 of the analysis device 30. In the above text, the first sample injection rail 31, the second sample injection rail 32, the first type of sample rack, and the second type of sample rack are mentioned. In some embodiments, the first sample injection rail 31 is an emergency rail, and the second sample injection rail 32 is a regular rail or a non-emergency rail. Correspondingly, the first type of sample rack is an emergency sample rack, and the second type of sample rack is a regular sample rack or a non-emergency sample rack. The identification of the first type of sample rack and the second type of sample rack can be that the input component 10 identifies through a scanner, or the input component 10 identifies through the position where the sample rack is placed. Taking the first type of sample rack as an emergency sample rack and the second type of sample rack as a regular sample rack as an example, the sample rack placed in the placement area of the input component 10 is a regular sample rack, and the sample rack placed in the emergency channel of the input component 10 is an emergency sample rack.

[0071] In some embodiments, please refer toFigure 7 , the sample scheduling method includes the following steps:

[0072] Step 100: When a second-type sample rack needs to enter the second sample injection track of a remote analysis device for sample injection, determine whether there is a second-type sample rack to be aspirated by the nearby analysis device on the second sample injection track of the nearby analysis device.

[0073] Step 110: If it is determined that there is one, control the second-type sample rack to be injected, and finally enter the second sample injection track of the remote analysis device through the first sample injection track of the nearby analysis device.

[0074] For example, when a regular sample rack needs to enter the regular sample injection track of a remote analysis device for sample injection, determine whether there is a regular sample rack to be aspirated by the nearby analysis device on the regular sample injection track of the nearby analysis device; if it is determined that there is one, control the regular sample rack to be injected, and finally enter the regular sample injection track of the remote analysis device through the emergency sample injection track of the nearby analysis device.

[0075] For the convenience of borrowing a path during scheduling - for example, a second-type sample rack that needs to enter the second sample injection track 32 of a remote analysis device borrows the first sample injection track 31 of a nearby analysis device. In some embodiments, when scheduling the control of sample injection, the principle of from far to near is executed to facilitate other samples to borrow a path. Specifically, in some embodiments, please refer to Figure 8 , the sample scheduling method includes the following steps:

[0076] Step 200: Determine whether there is a first-type sample rack that needs to enter the first sample injection tracks of multiple analysis devices for sample injection respectively.

[0077] Step 210: When there is a first-type sample rack that needs to enter the first sample injection tracks of multiple analysis devices for sample injection respectively, control the first-type sample rack to inject samples in the first sample injection tracks of the multiple analysis devices in sequence from far to near. For example Figure 6Taking the three analysis devices M1, M2, and M3 as an example, when there is a first type of sample rack S1 that needs to be injected into the first injection tracks 31 of the analysis devices M1, M2, and M3 respectively, since the three analysis devices 30 that the first type of sample rack S1 needs to be injected into are, in the order from far to near, the analysis device M3, the analysis device M2, and the analysis device M1, therefore, the first type of sample rack S1 first directly goes to the first injection track 31 of the analysis device M3 for injection, and then the first type of sample rack S1 goes from the first injection track 31 of the analysis device M3 to the first injection track 31 of the analysis device M2 for injection, and finally the first type of sample rack S1 goes from the first injection track 31 of the analysis device M2 to the first injection track 31 of the analysis device M1 for injection. Through such an injection scheduling from far to near, it is possible to avoid blocking the first injection tracks 31 corresponding to the nearby analysis devices as much as possible, so as to facilitate other sample racks to borrow the first injection tracks 31 corresponding to the nearby analysis devices.

[0078] In order not to block the borrowing path, in some other embodiments, when there is a sample rack that only injects on the track of the nearby analysis device, then it can first check whether there are other sample racks that need to use the track of the nearby analysis device to go to the distant analysis device. Specifically, in some embodiments, please refer to Figure 9 , the sample scheduling method includes the following steps:

[0079] Step 300: When there is a first type of sample rack that needs to enter the first injection track of the nearby analysis device for injection, determine whether there are other sample racks that need to enter the corresponding injection track of the distant analysis device through the first injection track of the above-mentioned nearby analysis device. Specifically, step 300 determines whether there are other sample racks that need to enter the corresponding injection track of the distant analysis device through the first injection track of the above-mentioned nearby analysis device, which means whether there is a second type of sample rack that needs to enter the second injection track of the distant analysis device through the first injection track of the above-mentioned nearby analysis device, and / or whether there are other first type of sample racks that need to enter the first injection track of the distant analysis device through the first injection track of the above-mentioned nearby analysis device.

[0080] Step 310: When it is determined that there is none, directly control the first type of sample rack that needs to enter the nearby analysis device to enter the first injection track of the nearby analysis device.

[0081] Step 320: When it is determined that there is, first control the sample rack that needs to enter the distant analysis device to enter the corresponding injection track of the distant analysis device, and then control the first type of sample rack that needs to enter the nearby analysis device to enter the first injection track of the nearby analysis device. Still taking Figure 6Taking the three analysis devices M1, M2, and M3 as an example, when there is a first - type sample rack S1 that only needs to be sampled into the first sampling track of the analysis device M1, that is, the first - type sample rack S1 does not need to be sampled into the first sampling tracks of the analysis devices M2 and M3. Therefore, before the first - type sample rack S1 is sampled into the first sampling track of the analysis device M1, it is first determined whether there are other sample racks that need to enter the sampling tracks of the distant analysis devices M2 or M3 through the first sampling track 31 of the analysis device M1. Specifically, for example, it is determined whether there is a second - type sample rack that needs to enter the second sampling track of the distant analysis device M2 or M3 through the first sampling track 31 of the analysis device M1, and / or it is determined whether there are other first - type sample racks that need to enter the first sampling track of the distant analysis device M2 or M3 through the first sampling track 31 of the analysis device M1; if so - for example, if there is a second - type sample rack S2 that needs to enter the second sampling track of the distant analysis device M3 through the first sampling track 31 of the analysis device M1, then the second - type sample rack S2 is first scheduled to the second sampling track of the distant analysis device M3, and then the first - type sample rack S1 is sent to the first sampling track of the analysis device M1; for example, if there is a first - type sample rack S3 that needs to enter the first sampling track of the distant analysis device M3, then the first - type sample rack S3 is first scheduled to the first sampling track of the distant analysis device M3, and then the first - type sample rack S1 is sent to the first sampling track of the analysis device M1.

[0082] In some embodiments, when there is a first - type sample rack that needs to be sampled into the first sampling track of a nearby analysis device, in step 300, it is determined whether there are other sample racks - such as other first - type sample racks and / or second - type samples that need to enter a distant analysis device through the first sampling track 31 of the nearby device. When it is determined that there are, then in step 320, before controlling the sample rack that needs to enter the distant analysis device to enter the corresponding sampling track of the distant analysis device, it is first determined whether the corresponding sampling track of the distant analysis device is full. If it is not full, then the sample rack that needs to enter the distant analysis device is controlled to enter the corresponding sampling track of the distant analysis device; otherwise, the sample rack that needs to enter the distant analysis device is controlled to wait in the input component, and the first - type sample rack that needs to enter the nearby analysis device is controlled to enter the first sampling track of the nearby analysis device. Still taking... Figure 6Taking the three analytical devices M1, M2, and M3 as an example, when there is a first-type sample rack S1 that only needs to be injected into the first injection track of the analytical device M1. Therefore, before the first-type sample rack S1 is injected into the first injection track of the analytical device M1, it is first determined whether there is a sample rack that needs to enter the injection tracks of the distant analytical devices M2 or M3 through the first injection track of the analytical device M1. Specifically, for example, it is determined whether there is a second-type sample rack that needs to enter the second injection track of the distant analytical devices M2 or M3 through the first injection track of the analytical device M1, and / or it is determined whether there is any other first-type sample rack that needs to enter the first injection track of the distant analytical devices M2 or M3 through the first injection track of the analytical device M1; if so - for example, if there is a second-type sample rack S2 that needs to enter the second injection track of the distant analytical device M3 through the first injection track of the analytical device M1, then it is further determined whether the second injection track of the distant analytical device M3 is full - for example, the second injection track can have a certain length, such as it can carry 3 sample racks. If the second injection track of the analytical device M3 already has three sample racks being aspirated or waiting to be aspirated at this time, then the second injection track of the analytical device M3 is full; if the second injection track of the distant analytical device M3 is not full, then the second-type sample rack S2 is first scheduled to the second injection track of the distant analytical device M3, and then the first-type sample rack S1 is sent to the first injection track of the analytical device M1; if the second injection track of the distant analytical device M3 is full, then the second-type sample rack S2 is controlled not to be scheduled to the second injection track of the distant analytical device M3 - for example, it can wait or be temporarily stored in the input component, and the first-type sample rack S1 is controlled to be sent to the first injection track of the analytical device M1.

[0083] As described above, in order not to block the borrowed path, in some embodiments, when there is a sample rack that is only injected into the track of the nearby analytical device, then it can be first checked whether there is any other sample rack that needs to borrow the path to the distant analytical device; in these embodiments, taking the case where the emergency sample rack does not block the regular sample rack from borrowing the emergency injection track as an example, considering the emergency nature of the emergency sample rack, in some embodiments, only one sample rack can be allowed to jump the queue to borrow the path. For example, in some embodiments, when a first-type sample rack needs to be injected into the first injection track of the nearby analytical device - that is, this first-type sample rack only needs to be injected into the first injection track of this analytical device, it is determined whether there is any other sample rack that needs to enter the corresponding injection track of the distant analytical device through the first injection track of the above-mentioned nearby analytical device. When it is determined that there are multiple other sample racks, then only one of these multiple other sample racks is controlled to enter the corresponding injection track of the distant analytical device, and then immediately the first-type sample rack that needs to enter the nearby analytical device is controlled to enter the first injection track of the nearby analytical device. Let's still takeFigure 6 Taking the three analytical devices M1, M2, and M3 as an example, when there is a first type of sample rack S1 that only needs to be injected into the first injection track of the analytical device M1, that is, the first type of sample rack S1 does not need to be injected into the first injection tracks of the analytical devices M2 and M3. Therefore, before the first type of sample rack S1 is injected into the first injection track of the analytical device M1, it is first determined whether there are other sample racks that need to enter the injection tracks of the distant analytical devices M2 or M3 through the first injection track of the analytical device M1. For example, specifically, it is determined whether there is a second type of sample rack that needs to enter the second injection track of the distant analytical devices M2 or M3 through the first injection track of the analytical device M1, and / or it is determined whether there are other first type of sample racks that need to enter the first injection track of the distant analytical devices M2 or M3 through the first injection track of the analytical device M1; if so and there are multiple ones, for example, there are multiple other sample racks that need to enter the corresponding injection tracks of the distant analytical devices M2 or M3 for injection, then only one of these other sample racks is controlled to enter the corresponding injection track of the corresponding analytical device, and then immediately the above-mentioned first type of sample rack S1 is controlled to go to the first injection track of the analytical device M1.

[0084] Below, let's take the first injection track as the emergency injection track, the first type of sample rack as the emergency sample rack; the second injection track as the regular injection track, and the second type of sample rack as the regular sample rack as an example to illustrate.

[0085] In some embodiments, please refer to Figure 10 , the sample scheduling method may include the following steps:

[0086] Step 400: If there is an emergency sample rack to be injected, determine whether the emergency sample rack needs to be injected into the emergency injection tracks of multiple analytical devices respectively.

[0087] Step 410: If so, control the emergency sample rack to be injected into the emergency injection tracks of the multiple analytical devices in order from far to near. Let's still take Figure 6Taking the three analysis devices M1, M2, and M3 as an example, when an emergency sample rack S1 needs to be sampled into the emergency injection tracks 31 of the analysis devices M1, M2, and M3 respectively, since the three analysis devices 30 that the emergency sample rack S1 needs to sample into are, in order from far to near, the analysis device M3, the analysis device M2, and the analysis device M1, the emergency sample rack S1 first directly goes to the emergency injection track 31 of the analysis device M3 for sampling, and then the emergency sample rack S1 goes from the emergency injection track 31 of the analysis device M3 to the emergency injection track 31 of the analysis device M2 for sampling, and finally the emergency sample rack S1 goes from the emergency injection track 31 of the analysis device M2 to the emergency injection track 31 of the analysis device M1 for sampling. Through such an injection scheduling from far to near, it is possible to avoid blocking the first injection track 31 corresponding to the nearby analysis device as much as possible, so as to facilitate other sample racks to borrow the first injection track 31 corresponding to the nearby analysis device.

[0088] In some embodiments, please refer to Figure 11 , the sample scheduling method may include the following steps:

[0089] Step 500: When an emergency sample rack needs to be sampled into the emergency injection track of a nearby analysis device, determine whether there are other sample racks that need to be sampled into a distant analysis device;

[0090] Step 510: When it is determined that there is none, directly control the emergency sample rack to enter the emergency injection track of the nearby analysis device.

[0091] Step 520: When it is determined that there are other sample racks that need to be sampled into the injection track of a distant analysis device, after avoiding the other sample racks that need to be sampled into the distant analysis device, then control the emergency sample rack to enter the emergency injection track of the nearby analysis device. Specifically, step 520 of avoiding the other sample racks that need to be sampled into the distant analysis device includes: first controlling the other sample racks that need to be sampled into the distant analysis device to move to the injection track corresponding to the distant analysis device through the emergency injection track of the nearby analysis device. That is, in step 520, when it is determined that there are other sample racks that need to be sampled into the injection track of a distant analysis device, first control the other sample racks that need to be sampled into the distant analysis device to move to the injection track corresponding to the distant analysis device through the emergency injection track of the nearby analysis device, and then control the emergency sample rack to enter the emergency injection track of the nearby analysis device. Still taking Figure 6Taking the three analysis devices M1, M2, and M3 as an example, when there is an emergency sample rack S1 that only needs to enter the emergency sampling track of the analysis device M1 for sampling, that is, the emergency sample rack S1 does not need to enter the emergency sampling tracks of the analysis devices M2 and M3. Therefore, before the emergency sample rack S1 enters the emergency sampling track of the analysis device M1 for sampling, it is first determined whether there are other sample racks that need to enter the sampling tracks of the distant analysis devices M2 or M3 for sampling. Specifically, for example, it is determined whether there is a regular sample rack that needs to enter the regular sampling track of the distant analysis device M2 or M3, and / or it is determined whether there is an emergency sample rack that needs to enter the emergency sampling track of the distant analysis device M2 or M3; if so - for example, if there is a regular sample rack S2 that needs to enter the regular sampling track of the distant analysis device M3 for sampling, then the entry of the regular sample rack S2 into the analysis device M3 is avoided. Specifically, the regular sample rack S2 is scheduled to the regular sampling track of the distant analysis device M3 through the emergency sampling track of the analysis device M1, and then the emergency sample rack S1 is scheduled to the emergency sampling track of the analysis device M1; for example, if there is an emergency sample rack S3 that needs to enter the emergency sampling track of the distant analysis device M3 for sampling, then the entry of the emergency sample rack S3 into the analysis device M3 is avoided. Specifically, the emergency sample rack S3 is scheduled to the emergency sampling track of the distant analysis device M3 through the emergency sampling track of the analysis device M1, and then the emergency sample rack S1 is scheduled to the emergency sampling track of the analysis device M1.

[0092] In some embodiments, before step 520 controls other sample racks that need to enter the distant analysis device to move to the corresponding sampling track of the distant analysis device through the emergency sampling track of the nearby analysis device, it is also determined whether the corresponding sampling track of the distant analysis device is full. If it is not full, then the sample rack is controlled to enter the corresponding sampling track of the distant analysis device; otherwise, the sample rack is controlled to wait. For example, in some embodiments, when there is an emergency sample rack that needs to enter the emergency sampling track of the nearby analysis device for sampling, step 500 determines whether there are other sample racks - such as regular sample racks and / or other emergency-type samples that need to enter the distant analysis device. When it is determined that there are, then before step 520 controls the sample rack to enter the corresponding sampling track of the distant analysis device, it is also first determined whether the corresponding sampling track of the distant analysis device is full. If it is not full, then the sample rack is controlled to enter the corresponding sampling track of the distant analysis device through the emergency sampling track of the nearby analysis device; otherwise, the sample rack is controlled to wait in the input component, and the emergency sample rack that needs to enter the above-mentioned nearby analysis device is controlled to enter the emergency sampling track of the above-mentioned nearby analysis device. Let's still take Figure 6Taking the three analysis devices M1, M2, and M3 as an example, when there is an emergency sample rack S1 that only needs to enter the emergency injection track of the analysis device M1 for injection, before the emergency sample rack S1 enters the emergency injection track of the analysis device M1 for injection, first determine whether there are other sample racks that need to enter the injection tracks of the distant analysis devices M2 or M3 for injection. Specifically, for example, determine whether there are regular sample racks that need to enter the regular injection tracks of the distant analysis devices M2 or M3 for injection, and / or determine whether there are other emergency sample racks that need to enter the emergency injection tracks of the distant analysis devices M2 or M3 for injection; if so - for example, if there is a regular sample rack S2 that needs to enter the regular injection track of the distant analysis device M3 for injection, then determine whether the regular injection track of the distant analysis device M3 is full - for example, the regular injection track can have a certain length, such as it can carry 3 sample racks. If the regular injection track of the analysis device M3 already has three sample racks being aspirated or waiting to be aspirated at this time, then the regular injection track of the analysis device M3 is full; if the regular injection track of the distant analysis device M3 is not full, then first dispatch the regular sample rack S2 to the regular injection track of the distant analysis device M3 through the emergency injection track of the analysis device M1, and then send the emergency sample rack S1 to the emergency injection track of the analysis device M1; if the regular injection track of the distant analysis device M3 is full, then control the regular sample rack S2 not to be dispatched to the regular injection track of the distant analysis device M3 - for example, it can wait or be temporarily stored in the input component, and control the emergency sample rack S1 to enter the emergency injection track of the analysis device M1.

[0093] As described above, in order not to block the borrowed path, in some embodiments, when there is a sample rack that only injects on the track of the nearby analysis device, then it can first be checked whether there are other sample racks going to the distant analysis device; in these embodiments, taking the case where the emergency sample rack does not block the regular sample rack from borrowing the emergency injection track as an example, considering the emergency nature of the emergency sample rack, in some embodiments, only one sample rack is allowed to cut in and borrow the path. Therefore, in some embodiments, the number of other sample racks that need to enter the distant analysis device to avoid in step 520 is not greater than N, where N is an integer not less than 1. In some embodiments, N can be 1. For example, in some embodiments, when there is an emergency sample rack that needs to enter the emergency injection track of the nearby analysis device for injection - that is, this emergency sample rack only needs to enter the emergency injection track of this analysis device for injection, determine whether there are other sample racks that need to enter the corresponding injection track of the distant analysis device for injection. When it is determined that there are and there are multiple other sample racks, then only control one of these multiple other sample racks to enter the corresponding injection track of the distant analysis device, and then immediately control the above-mentioned emergency sample rack that needs to enter the nearby analysis device to enter the emergency injection track of the above-mentioned nearby analysis device. Let's still take Figure 6Taking the three analytical devices M1, M2, and M3 as an example, when there is an emergency sample rack S1 that only needs to enter the emergency injection track of the analytical device M1 for injection, that is, the emergency sample rack S1 does not need to enter the emergency injection tracks of the analytical devices M2 and M3. Therefore, before the emergency sample rack S1 enters the emergency injection track of the analytical device M1 for injection, first determine whether there are other sample racks that need to enter the injection tracks of the distant analytical devices M2 or M3 through the emergency injection track of the nearby analytical device M1. For example, specifically, determine whether there are regular sample racks that need to enter the regular injection tracks of the distant analytical devices M2 or M3 through the emergency injection track of the nearby analytical device M1, and / or determine whether there are other emergency sample racks that need to enter the emergency injection tracks of the distant analytical devices M2 or M3 through the emergency injection track of the nearby analytical device M1; if so and there are multiple, for example, there are multiple other sample racks that need to enter the corresponding injection tracks of the distant analytical devices M2 or M3 for injection, then only control one of these other sample racks to enter the corresponding injection track of the corresponding analytical device, and then immediately control the above-mentioned emergency sample rack S1 to the first injection track of the analytical device M1.

[0094] This document is described with reference to various exemplary embodiments. However, those skilled in the art will recognize that changes and modifications can be made to the exemplary embodiments without departing from the scope of this document. For example, the various operating steps and the components used to perform the operating steps can be implemented in different ways according to a particular application or any number of cost functions associated with the operation of the system (e.g., one or more steps can be deleted, modified, or incorporated into other steps).

[0095] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware, or any combination thereof. Additionally, as understood by those skilled in the art, the principles herein can be embodied in a computer program product on a computer-readable storage medium that is pre-loaded with computer-readable program code. Any tangible, non-transitory computer-readable storage medium can be used, including magnetic storage devices (hard disks, floppy disks, etc.), optical storage devices (CD-ROMs, DVDs, Blu-ray discs, etc.), flash memories, and / or the like. These computer program instructions can be loaded onto a general-purpose computer, a special-purpose computer, or other programmable data processing devices to form a machine, such that the instructions executed on the computer or other programmable data processing devices can generate a device for implementing the specified functions. These computer program instructions can also be stored in a computer-readable memory, which can direct the computer or other programmable data processing devices to operate in a specific manner, so that the instructions stored in the computer-readable memory can form a manufactured article, including an implementation device for implementing the specified functions. The computer program instructions can also be loaded onto a computer or other programmable data processing devices, thereby performing a series of operational steps on the computer or other programmable devices to generate a computer-implemented process, such that the instructions executed on the computer or other programmable devices can provide steps for implementing the specified functions.

[0096] Although the principles herein have been shown in various embodiments, many modifications of the structures, arrangements, proportions, elements, materials, and components that are particularly applicable to specific environments and operational requirements can be used without departing from the principles and scope of this disclosure. The above modifications and other changes or revisions will be included within the scope of this document.

[0097] The foregoing detailed description has been presented with reference to various embodiments. However, those skilled in the art will recognize that various modifications and changes can be made without departing from the scope of this disclosure. Therefore, the consideration of this disclosure will be in an illustrative rather than a restrictive sense, and all such modifications will be included within its scope. Similarly, the advantages, other advantages, and solutions to problems of the various embodiments have been described above. However, the benefits, advantages, solutions to problems, and any elements that can produce these, or solutions that make them more explicit, should not be construed as critical, essential, or necessary. The term "comprising" and any other variants used herein are non-exclusive inclusions, such that a process, method, article, or device that includes a list of elements not only includes those elements but also other elements not expressly listed or that do not belong to the process, method, system, article, or device. Additionally, the term "coupled" and any other variants used herein refer to physical connection, electrical connection, magnetic connection, optical connection, communication connection, functional connection, and / or any other connection.

[0098] Those skilled in the art will recognize that many changes may be made to the details of the above-described embodiments without departing from the basic principles of the invention. Thus, the scope of the invention should be determined only by the claims.

Claims

1. A sample analysis system, characterized in that, Comprising: An input component for receiving and scheduling samples to be tested; At least two analysis devices arranged in sequence from near to far with respect to the input component, for testing the samples; each analysis device is provided with a corresponding front-end track area; Each front-end track area is provided with a first sample injection track and a second sample injection track; the first sample injection track of the front-end track area is provided with a sample suction position for the analysis device corresponding to the front-end track area to suck samples on the first type of sample rack; the second sample injection track of the front-end track area is provided with a sample suction position for the analysis device corresponding to the front-end track area to suck samples on the second type of sample rack; for the analysis device adjacent to the input component, its front-end track area is used to receive samples dispatched by the input component; the first sample injection tracks in the front-end track areas of adjacent analysis devices are interconnected so that the first type of sample rack enters the first sample injection track of the far analysis device from the first sample injection track of the near analysis device; The second sample injection tracks in the front-end track areas of adjacent analysis devices are interconnected so that the second type of sample rack enters the second sample injection track of the far analysis device from the second sample injection track of the near analysis device; A track-changing mechanism for changing the track of the sample rack on the first sample injection track of the analysis device to enter the second sample injection track of the adjacent analysis device; And A processor, when a second type of sample rack needs to enter the second sample injection track of the far analysis device for sample injection, determines whether there is a second type of sample rack to be sucked by the near analysis device on the second sample injection track of the near analysis device. If it is determined that there is, it controls the second type of sample rack to be injected to finally enter the second sample injection track of the far analysis device through the first sample injection track of the near analysis device; and when a first type of sample rack needs to enter the first sample injection track of the near analysis device for sample injection, the processor determines whether there is a second type of sample rack / first type of sample rack that needs to enter the second sample injection track / first sample injection track of the far analysis device through the first sample injection track of the near analysis device. When it is determined that there is, the processor first controls the second type of sample rack / first type of sample rack that needs to enter the far analysis device to enter the second sample injection track / first sample injection track of the far analysis device through the first sample injection track of the near analysis device, and then controls the first type of sample rack that needs to enter the near analysis device to enter the first sample injection track of the near analysis device; Before the processor first controls the second type of sample rack / first type of sample that needs to enter the far analysis device to enter the second sample injection track / first sample injection track of the far analysis device through the first sample injection track of the near analysis device, it also determines whether the second sample injection track / first sample injection track of the far analysis device is full. If it is not full, it then controls the second type of sample rack / first type of sample to enter the second sample injection track / first sample injection track of the far analysis device through the first sample injection track of the near analysis device. Otherwise, it controls the second type of sample rack / first type of sample to wait in the input component.

2. The sample analysis system according to claim 1, characterized in that, When a first type sample rack needs to enter the first sampling tracks of a plurality of analysis devices for sampling, the processor controls the first type sample rack to sequentially sample in the first sampling tracks of the plurality of analysis devices from far to near.

3. The sample analysis system according to claim 1, characterized in that, The first sample introduction track is an emergency sample introduction track, and the first type of sample rack is an emergency sample rack; the second sample introduction track is a conventional sample introduction track, and the second type of sample rack is a conventional sample rack.

4. The sample analysis system according to any one of claims 1 to 3, characterized in that, Each front track area also includes a return track, and the return tracks in the front track areas of adjacent analysis devices are interconnected, so that the sample rack after injection is entered from the return track of the analysis device at a distance into the return track of the analysis device at a nearby location; An analysis device adjacent to the input component has its return track connected to the input component.

5. The sample analysis system according to any one of claims 1 to 3, characterized in that, The input component comprises: A loading area for holding sample racks to be loaded; A recovery area for receiving sample racks to be recovered; A buffer area, used for caching sample racks; The dispatching mechanism is used to dispatch the sample rack in the placement area to the first sample introduction track or the second sample introduction track in the front track area adjacent to the input component; and to receive the sample rack from the return channel of the front track area adjacent to the input component and dispatch it to the recovery area.

6. A sample scheduling method for a sample analysis system, the sample analysis system comprising an input component and at least two analysis devices arranged in sequence from near to far relative to the input component, characterized in that, The sample scheduling method comprises: When a conventional sample rack needs to enter the conventional sampling track of a distant analysis device for sampling, it is determined whether there is a conventional sample rack for the nearby analysis device to be sampled on the conventional sampling track of the nearby analysis device; If it is determined that there is, the conventional sample rack to be injected is controlled to enter the conventional injection track of the distant analysis device via the emergency injection track of the nearby analysis device; and when an emergency sample rack needs to enter the emergency injection track of the nearby analysis device for injection, it is determined whether there are other sample racks that need to enter the distant analysis device via the emergency injection track of the nearby analysis device; if it is determined that there are other sample racks that need to enter the distant analysis device, the emergency sample rack is controlled to enter the emergency injection track of the nearby analysis device after avoiding the other sample racks that need to enter the distant analysis device; The avoiding of other sample racks that need to enter the distant analysis equipment includes: first controlling other sample racks that need to enter the distant analysis equipment to move from the emergency sample introduction track of the nearby analysis equipment to the sample introduction track corresponding to the distant analysis equipment; The sample scheduling method also includes: before controlling other sample racks that need to enter the remote analysis device to move to the injection track corresponding to the remote analysis device via the emergency injection track of the nearby analysis device, it is also determined whether the injection track corresponding to the remote analysis device is fully loaded; if not, the sample rack is controlled to enter the injection track corresponding to the remote analysis device via the emergency injection track of the nearby analysis device; otherwise, the sample rack is controlled to wait.

7. The sample scheduling method according to claim 6, characterized in that, The number of sample racks that need to avoid other analysis equipment that needs to enter the distant area is no more than N, where N is an integer no less than 1.

8. The sample scheduling method according to claim 7, characterized in that, N=1。 9. The sample scheduling method according to claim 6, characterized in that, The sample scheduling method further includes: If there is an emergency sample rack to be sampled, determine whether the emergency sample rack needs to enter the emergency sample injection tracks of multiple analysis devices for separate sample injection; If so, the emergency sample rack is controlled to inject samples in the emergency injection tracks of the multiple analysis devices in sequence from far to near.

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