integrated circuit test equipment

Through the innovative design of the integrated circuit testing device and the use of the transmission shaft linkage mechanism, the integrated circuit chip can be quickly fixed and the test position exposed, solving the problem of cumbersome operation in the existing technology and significantly improving the test efficiency.

CN113484736BActive Publication Date: 2025-09-19SUZHOU ASEN SEMICON CO LTD
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Patent Information

Application Number
CN202110909287.X
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2021-08-09
Publication Date
2025-09-19
Estimated Expiration
2041-08-09

AI Technical Summary

Technical Problem

The existing integrated circuit chip testing process is cumbersome and lengthy, resulting in low work efficiency.

Method used

The integrated circuit test device is adopted, and the first moving part and the second moving part are linked through the transmission shaft to achieve rapid fixation of the integrated circuit chip and exposure of the test position, thereby simplifying the operation process.

Benefits of technology

It significantly shortens the time for integrated circuit chip fixing and test preparation, improves work efficiency, and saves about 70% of time.

✦ Generated by Eureka AI based on patent content.

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Abstract

An integrated circuit testing device includes a first moving portion, a second moving portion, and a base. The first moving portion is configured to move in a first direction. The second moving portion is configured to be linked to the first moving portion via a transmission shaft. When the second moving portion moves in a second direction different from the first direction, the transmission shaft links the first moving portion to cause the first moving portion to move in the first direction. The base is configured to support an integrated circuit test board, wherein the first moving portion is detachably mounted on the base. When the first moving portion moves in the first direction, a test position on the integrated circuit test board for placing an integrated circuit chip is exposed.
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Citation Information

Patent Citations

  • Integrated circuit testing device

    CN215493976U

  • Socket

    US20030100201A1