Infrared temperature measurement method, device, system, computer equipment and storage medium

Abstract

This application relates to an infrared temperature measurement method, apparatus, computer equipment, and storage medium. The method includes: acquiring a visible light image of a target and temperature data of the target fed back by an infrared temperature measurement device; performing identification processing on the visible light image of the target to determine the type information of the target; querying and determining the reflectivity of each component corresponding to the type information of the target; determining the corresponding region of each component in the visible light image and the reflectivity of the corresponding region; and correcting the temperature data of the target based on the reflectivity of each component, the reflectivity of the corresponding region of each component in the visible light image, and the interaction factor. This method avoids the possibility of missed settings or inappropriate reflectivity parameter values ​​that may result from manual setting, thereby improving the accuracy of the actual measured temperature value.

Description

Technical Field

[0001] The present application relates to the field of infrared temperature measurement technology, and in particular to an infrared temperature measurement method, device, system, computer equipment and storage medium. Background Art

[0002] With the development of infrared temperature measurement technology, infrared thermal imaging technology has emerged. This is a passive, non-contact detection and identification technology that can use the infrared radiation characteristic images of the target and background to discover and identify the target, and can achieve non-contact long-distance temperature measurement and fault detection. It can also detect and identify targets in the absence of light. Therefore, it is widely used in the field of power inspection. However, in order to improve the accuracy of the measured temperature value, the infrared thermal imagers commonly used in the field of power inspection need to correctly set the reflectivity parameter value, otherwise the accuracy of the measured temperature value will be reduced. Most of the existing technologies use the method of manually setting the reflectivity parameter value, which may result in the phenomenon of missing the setting operation and setting the improper reflectivity parameter value, thereby failing to guarantee the accuracy of the measured temperature value. Summary of the invention

[0003] Based on this, it is necessary to provide an infrared temperature measurement method, device, system, computer equipment and storage medium that can improve the accuracy of measured temperature values ​​in response to the above technical problems.

[0004] An infrared temperature measurement method, the method comprising:

[0005] Acquire a visible light image of the measured target and temperature data of the measured target fed back by an infrared temperature measuring device;

[0006] Performing recognition processing on the visible light image of the measured object to determine the type information of the measured object;

[0007] Query and determine the reflectivity of each component corresponding to the type information of the measured target;

[0008] Determine the corresponding area of ​​each component in the visible light image and the reflectivity of the corresponding area;

[0009] The temperature data of the measured object is corrected according to the reflectivity of each component of the measured object, the reflectivity of the corresponding area of ​​each component in the visible light image and the action factor.

[0010] In one embodiment, acquiring the visible light image of the measured target includes:

[0011] Get shooting location information;

[0012] Determine the preset position of the best shooting location of the measured object and the preset contour information of the measured object according to the shooting position information;

[0013] When the shooting position information is consistent with the preset best shooting location of the target to be measured, and the contour information presented by the target to be measured on the visible light shooting device is consistent with the preset contour information, a visible light image of the target to be measured is acquired.

[0014] In one embodiment, querying and determining the reflectivity corresponding to the type information of the measured target includes:

[0015] Determining material information of each component of the measured object according to the type information of the measured object;

[0016] The material information is queried to obtain the reflectivity corresponding to each component of the measured target.

[0017] In one of the embodiments, the type information of the measured target includes the device type, device model and device code of the measured target.

[0018] In one embodiment, determining the corresponding area of ​​each component in the visible light image includes:

[0019] The positional relationship between the components of the measured object is identified, and the corresponding area of ​​each component in the visible light image is determined according to the positional relationship between the components of the measured object.

[0020] In one embodiment, the correcting the temperature data of the measured object according to the reflectivity of each component of the measured object, the reflectivity of the corresponding area of ​​each component in the visible light image and the action factor includes:

[0021] Correcting the temperature data of the measured object according to the reflectivity of each component of the measured object and the reflectivity of the corresponding area of ​​each component in the visible light image, and outputting first corrected temperature data of the measured object;

[0022] The first corrected temperature data of the measured object is corrected according to the action factor.

[0023] An infrared temperature measuring device, comprising:

[0024] An acquisition module, used to acquire a visible light image of a measured target and temperature data of the measured target fed back by an infrared temperature measuring device;

[0025] An identification module is used to identify and process the visible light image of the target to be measured, and determine the type information of the target to be measured;

[0026] A query module, used to query and determine the reflectivity of each component corresponding to the type information of the measured target;

[0027] A determination module, used to determine the corresponding area of ​​each component in the visible light image and the reflectivity of the corresponding area;

[0028] The correction module is used to correct the temperature data of the measured target according to the reflectivity of each component of the measured target, the reflectivity of the corresponding area of ​​each component in the visible light image and the action factor.

[0029] A computer-readable storage medium stores a computer program, which implements the steps of the above method when executed by a processor.

[0030] An infrared temperature measurement system, the system comprising:

[0031] An infrared temperature measuring device, used to perform infrared temperature measurement on the measured object and output temperature data of the measured object;

[0032] A visible light camera is communicatively connected to the infrared temperature measuring device. The visible light camera comprises a memory and a processor. The memory stores a computer program. When the processor executes the computer program, the steps of the above method are implemented.

[0033] In one embodiment, the visible light shooting device is a smart mobile device.

[0034] In one of the embodiments, the system further includes a wired communication device, and the wired communication device is respectively connected to the visible light shooting device and the infrared temperature measuring device.

[0035] The infrared temperature measurement method, device, system, computer equipment and storage medium obtain the visible light image of the measured target and the temperature data of the measured target fed back by the infrared temperature measurement device, use a deep neural network to recognize and process the visible light image of the measured target, identify and determine the device type, device model and device code of the measured target, and determine the material information of each component of the measured target according to the device type, device model and device code of the measured target; query the material information to obtain the reflectivity corresponding to each component of the measured target; identify the positional relationship between the components of the measured target, and determine the corresponding area of ​​each component in the visible light image according to the positional relationship between the components of the measured target; determine the reflectivity of the corresponding area according to the corresponding reflectivity of each component and the corresponding area of ​​each component in the visible light image, correct the temperature data of the measured target according to the reflectivity of each component of the measured target and the reflectivity of the corresponding area of ​​each component in the visible light image, and output the first corrected temperature data of the measured target; correct the first corrected temperature data of the measured target according to the action factor, that is, automatically correct the temperature data fed back by the infrared temperature measurement device for the second time. The measured temperature value is accurately corrected by automatically correcting the reflectivity, thereby avoiding the phenomenon of missing setting operations and setting inappropriate reflectivity parameter values ​​that may occur when setting reflectivity parameters manually, thereby improving the accuracy of the actual measured temperature value. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 An application environment diagram of an infrared temperature measurement method in an embodiment;

[0037] Figure 2 A schematic diagram of a flow chart of an infrared temperature measurement method in an embodiment;

[0038] Figure 3 A schematic diagram of a flow chart of a step of obtaining a visible light image of the target under test in one embodiment;

[0039] Figure 4 A schematic flow chart of a step of querying and determining the reflectivity of each component corresponding to the type information of the measured target in an embodiment;

[0040] Figure 5 is a flow chart of a step of correcting the temperature data of the measured object according to the reflectivity of each component of the measured object, the reflectivity of the corresponding area of ​​each component in the visible light image, and the action factor in one embodiment;

[0041] Figure 6 is a structural block diagram of an infrared temperature measuring device in one embodiment;

[0042] Figure 7 is an internal structure diagram of a computer device in one embodiment;

[0043] Figure 8 1 is a structural block diagram of an infrared temperature measurement system in one embodiment. DETAILED DESCRIPTION

[0044] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0045] The infrared temperature measurement method provided in this application can be applied to Figure 1 In the application environment shown, the infrared temperature measuring device 102 communicates with the visible light shooting device 104. The infrared temperature measuring device 102 includes but is not limited to an infrared camera, and the visible light shooting device 104 can be but is not limited to a smart phone, a tablet computer, etc.

[0046] In one embodiment, Figure 2 As shown, an infrared temperature measurement method is provided, which is applied to Figure 1 The visible light shooting device in the embodiment is taken as an example to illustrate, and the following steps are included:

[0047] Step 202: Acquire a visible light image of the target to be measured and temperature data of the target to be measured fed back by an infrared temperature measuring device.

[0048] In one embodiment, the temperature data of the measured target (such as a transformer) is measured by an infrared temperature measuring device, and a visible light shooting device (such as a smart phone) shoots a visible light image and obtains the temperature data of the transformer.

[0049] Step 204: perform recognition processing on the visible light image of the target to be measured to determine the type information of the target to be measured.

[0050] The type information of the measured target is used to characterize the specific type of the measured target. In one embodiment, the type information includes the device type, device model and device code, so as to more accurately find the material information corresponding to the measured target. The device type refers to the category of the measured target, for example, the types of transformers include open, potted and sealed; the device model refers to the specification model of the measured target, for example, transformers produced by different manufacturers have different specifications and models; the device code refers to whether the measured target is the number of the same type in the database, for example, the measured transformer is the 25th transformer of the same type. The type information of all measured targets is stored in the database of the server. In addition, the database also stores visible light images of all power equipment.

[0051] In one embodiment, infrared system analysis software is installed in a visible light camera (such as a smart phone), and a database is included in the visible light camera; the deep neural network in the infrared system analysis software identifies visible light images or videos and determines the type, model, and number of the transformer under test by comparing and querying visible light images of the transformer in the database.

[0052] Step 206: query and determine the reflectivity of each component corresponding to the type information of the measured object.

[0053] Different materials have different reflectivities, and the database stores the reflectivities corresponding to all power equipment materials.

[0054] In one embodiment, after the infrared system analysis software determines the type, model, and number of the transformer under test, the material information of different components of the transformer can be obtained by querying the database. The material information of a certain component of the transformer includes the material name of the component, the physical properties of the material, etc., and then the reflectivity corresponding to each component is determined by querying the database based on the material information of each component.

[0055] Step 208: Determine the corresponding area of ​​each component in the visible light image and the reflectivity of the corresponding area.

[0056] Among them, various components of the target to be measured are distributed in different areas of the visible light image, the visible light shooting device can display different areas, and the visible light image can be identified by infrared analysis software to determine the corresponding area of ​​each component in the visible light image.

[0057] In one embodiment, the infrared analysis software can obtain the positional relationship of each component of the target to be measured (such as a transformer) by identifying the visible light image of the target to be measured, and obtain the corresponding area of ​​each component in the visible light image based on the positional relationship of each component; then determine the reflectivity of the corresponding area of ​​each component in the visible light image based on the reflectivity of each component of the target to be measured and the corresponding area of ​​each component in the visible light image.

[0058] In the above infrared temperature measurement method, by obtaining the visible light image of the measured target and the temperature data of the measured target fed back by the infrared temperature measurement device, the visible light image of the measured target is recognized and processed by using a deep neural network, the device type, device model and device code of the measured target are identified and determined, and the material information of each component of the measured target is determined according to the device type, device model and device code of the measured target; the software infrared analysis system determines the reflectivity of the corresponding area according to the reflectivity corresponding to each component and the corresponding area of ​​each component in the visible light image, corrects the temperature data of the measured target according to the reflectivity of each component of the measured target and the reflectivity of the corresponding area of ​​each component in the visible light image, and outputs the first corrected temperature data of the measured target; the first corrected temperature data of the measured target is corrected according to the environmental factors, that is, the temperature data fed back by the infrared temperature measurement device is automatically corrected for the second time. By automatically correcting the reflectivity, the measured temperature value is accurately corrected, avoiding the phenomenon of missing setting operations and improper setting of reflectivity parameter values ​​that may be caused by manually setting the reflectivity parameters, thereby improving the accuracy of the actual measured temperature value.

[0059] In one embodiment, Figure 3 As shown, obtaining the visible light image of the measured target includes:

[0060] Step 302, obtaining shooting location information.

[0061] Among them, the infrared system analysis software has an automatic positioning function, which can export the best shooting point for shooting the target from the server's database during shooting, that is, the best shooting location preset position.

[0062] In one embodiment, a visible light photographing device (such as a smart phone) obtains the position of the transformer under test located by infrared analysis software or photographs the position of the transformer under test input by a user.

[0063] Step 304: determine the preset position of the best shooting location of the target and the preset contour information of the target according to the shooting position information.

[0064] Among them, the contour information is the information describing the outer contour of the measured object, such as the contour information of the transformer can be a rectangle or other shapes describing the transformer contour. The preset contour information is the original equipment contour information in the database, which is obtained by recognizing the visible light image or obtaining the contour shape that the user can draw on the smartphone screen, and then saving the drawn equipment contour shape to the database, and displaying it on the screen of the visible light shooting device, and then exporting it from the database when determining the actual contour information.

[0065] In one embodiment, the infrared system analysis software determines the actual best shooting location preset position of the transformer by exporting the best shooting location preset position of a transformer in the database and comparing it with the acquired shooting location information. That is, when the best shooting location preset position in the database coincides with the acquired shooting location information, the actual best shooting location preset position is the best shooting location preset position in the database, and the preset equipment profile information of the transformer in the database is exported at the same time.

[0066] Step 306 , when the shooting position information is consistent with the preset optimal shooting location of the target, and the contour information of the target presented on the visible light shooting device is consistent with the preset contour information, a visible light image of the target is acquired.

[0067] In one embodiment, the screen of a visible light shooting device (such as a smart phone) will first display the preset position of the best shooting location and the acquired shooting position information. After determining the preset position of the best shooting location of the target to be measured, the contour information of the identified target to be measured and the preset contour information derived from the database will be displayed.

[0068] In one embodiment, when the preset position of the best shooting location of the transformer under test and the preset contour information in the database are displayed on the screen of the visible light shooting device (such as a smart phone), a visible light image of the transformer under test is obtained.

[0069] In this embodiment, after obtaining the position of the transformer under test located by the infrared analysis software or the position of the transformer under test input by the user, the visible light shooting device (such as a smart phone) determines the preset position of the best shooting location and preset contour information of the transformer under test through display on the smart phone, comparing it with the preset position of the best shooting location in the database, and then comparing it with the obtained shooting location information, and then obtains a visible light image of the visible light shooting device.

[0070] In one embodiment, Figure 4 As shown, the querying and determining the reflectivity of each component corresponding to the type information of the measured target includes:

[0071] Step 402: Determine material information of each component of the object to be measured according to the type information of the object to be measured.

[0072] Among them, the material information is a description of the name and physical properties of the materials of different components of the measured target (such as a transformer). The database stores the material information corresponding to all power equipment.

[0073] In one embodiment, the infrared system analysis software searches and confirms the material name, physical properties, etc. corresponding to each component of the transformer in the database according to the type, model and serial number of the transformer under test.

[0074] Step 404: query the material information to obtain the reflectivity corresponding to each component of the measured object.

[0075] Among them, different material information corresponds to different reflectivity, and the material information of all components of all power equipment and the corresponding reflectivity are stored in the database.

[0076] In one embodiment, the infrared system analysis software searches in a database according to the material names and physical properties corresponding to the components of the transformer under test and obtains the reflectivity corresponding to the components of the transformer.

[0077] In this embodiment, the infrared system analysis software searches and confirms the material information corresponding to each component of the transformer in the database according to the type, model and number of the transformer under test, and more accurately queries and obtains the reflectivity corresponding to each component of the transformer through the material information of the transformer.

[0078] In one embodiment, the type information of the measured object includes the type, model and code of the measured object.

[0079] In this embodiment, the type information facilitates the query of the material information corresponding to the measured object, such as accurately querying and determining the material information of the transformer in the database according to the type, model and code of the transformer.

[0080] In one embodiment, determining the corresponding area of ​​each component in the visible light image includes: identifying the positional relationship between the components of the measured target, and determining the corresponding area of ​​each component in the visible light image according to the positional relationship between the components of the measured target.

[0081] In one embodiment, the deep neural network in the infrared system analysis software obtains the positional relationship between the components of the target to be measured (such as a transformer) by identifying the visible light image of the target to be measured, and determines the corresponding area of ​​each component in the visible light image according to the positional relationship between the components of the target to be measured, wherein the position in the visible light image can be displayed by a visible light shooting device.

[0082] In one embodiment, Figure 5 As shown, the correction of the temperature data of the measured target according to the reflectivity of each component of the measured target, the reflectivity of the corresponding area of ​​each component in the visible light image and the action factor includes:

[0083] Step 502: Correct the temperature data of the target under test according to the reflectivity of each component of the target under test and the reflectivity of the corresponding area of ​​each component in the visible light image, and output first corrected temperature data of the target under test.

[0084] Among them, the components of the measured target are distributed in different areas of the visible light image, and the reflectivity of the corresponding area of ​​each component of the measured target in the visible light image is determined according to the reflectivity of each component of the measured target and the corresponding area of ​​each component in the visible light image; the reflectivity of each component of the measured target (such as a transformer) and the reflectivity of the corresponding area of ​​each component in the visible light image have a certain influence on the temperature data. If both change, new temperature data can be obtained by calculation.

[0085] In one embodiment, the temperature data of the measured target fed back by the infrared temperature measuring device is automatically corrected according to the reflectivity of each component of the measured target (such as a transformer) and the reflectivity of the corresponding area of ​​each component in the visible light image, and the first corrected temperature data of the measured target is output.

[0086] Step 504: correct the first corrected temperature data of the measured target according to the action factor.

[0087] Among them, the influencing factors include ambient temperature, reflected temperature and emissivity of the target under test. Different material information of the target under test corresponds to different reflected temperatures and emissivities. The database stores the material information of all power equipment and its corresponding reflected temperature and emissivity. The ambient temperature, reflected temperature and emissivity of the target under test have a certain influence on the temperature data of the target under test. If the ambient temperature, reflected temperature and emissivity of the target under test change, new temperature data can be obtained by calculation. The infrared system analysis software can determine the ambient temperature by obtaining the weather conditions in the visible light shooting device (such as a smart phone); the reflected temperature and emissivity of the target under test can be determined by querying in the database according to the type information of the target under test (such as a transformer). The database stores the reflected temperature and emissivity corresponding to the materials of all power equipment.

[0088] In one embodiment, the infrared system analysis software corrects the first corrected temperature data according to the acquired ambient temperature, the reflected temperature and the emissivity of the measured target, and outputs a final measured temperature value.

[0089] In this embodiment, the software infrared analysis system determines the reflectivity of the corresponding area according to the reflectivity corresponding to each component and the corresponding area of ​​each component in the visible light image, corrects the temperature data of the measured target according to the reflectivity of each component of the measured target and the reflectivity of the corresponding area of ​​each component in the visible light image, and outputs the first corrected temperature data of the measured target; corrects the first corrected temperature data of the measured target according to the acquired ambient temperature, the reflected temperature and emissivity of the measured target, that is, automatically corrects the temperature data fed back by the infrared temperature measuring device for the second time. By automatically correcting the reflectivity twice, the process of manually setting the reflectivity parameters is omitted, and the accuracy of the actual measured temperature value is improved.

[0090] It should be understood that although Figure 2-5The steps in the flowchart are shown in sequence as indicated by the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified in this document, there is no strict order restriction for the execution of these steps, and these steps can be executed in other orders. Moreover, Figure 2-5 At least part of the steps may include multiple steps or multiple stages. These steps or stages are not necessarily performed at the same time, but can be performed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed in turn or alternately with other steps or at least part of the steps or stages in other steps.

[0091] This embodiment provides an infrared temperature measuring device, such as Figure 6 As shown, the infrared temperature measuring device includes an acquisition module 602, an identification module 604, a query module 606, a determination module 608 and a correction module 610. Among them, the acquisition module 602 is used to acquire the visible light image of the measured target and the temperature data of the measured target fed back by the infrared temperature measuring device, the identification module 604 is used to identify and process the visible light image of the measured target and determine the type information of the measured target, the query module 606 is used to query and determine the reflectivity of each component corresponding to the type information of the measured target, the determination module 608 is used to determine the corresponding area of ​​each component in the visible light image and the reflectivity of the corresponding area, and the correction module 610 is used to correct the temperature data of the measured target according to the reflectivity of each component of the measured target, the reflectivity of the corresponding area of ​​each component in the visible light image and the action factor.

[0092] In one embodiment, the acquisition module 602 acquires the visible light image of the target under test, including: acquiring shooting position information; determining the preset position of the best shooting location of the target under test and the preset contour information of the target under test according to the shooting position information; when the shooting position information is consistent with the preset position of the best shooting location of the target under test, and the contour information presented by the target under test on the visible light shooting device is consistent with the preset contour information, acquiring the visible light image of the target under test.

[0093] In one embodiment, the type information of the target under test determined by the identification module 604 includes the device type, device model and device code of the target under test.

[0094] In one embodiment, the query module 606 queries and determines the reflectivity corresponding to the type information of the measured target, including: determining the material information of each component of the measured target according to the type information of the measured target; and querying the material information to obtain the reflectivity corresponding to each component of the measured target.

[0095] In one embodiment, the determination module 608 determines the corresponding area of ​​each component in the visible light image, including: identifying the positional relationship between the components of the measured object, and determining the corresponding area of ​​each component in the visible light image according to the positional relationship between the components of the measured object.

[0096] In one embodiment, the correction module 610 corrects the temperature data of the target under test according to the reflectivity of each component of the target under test, the reflectivity of the corresponding area of ​​each component in the visible light image, and the action factor, including: correcting the temperature data of the target under test according to the reflectivity of each component of the target under test and the reflectivity of the corresponding area of ​​each component in the visible light image, and outputting the first corrected temperature data of the target under test; correcting the first corrected temperature data of the target under test according to the action factor.

[0097] For the specific definition of the infrared temperature measuring device, please refer to the definition of the infrared temperature measuring method above, which will not be repeated here. Each module in the above infrared temperature measuring device can be implemented in whole or in part by software, hardware and a combination thereof. The above modules can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute the operations corresponding to the above modules.

[0098] In one embodiment, a visible light shooting device is provided. The visible light shooting device may be a terminal, and its internal structure diagram may be as follows: Figure 7 As shown. The visible light shooting device includes a processor, a memory, a communication interface, a display screen and an input device connected through a system bus. Among them, the processor of the visible light shooting device is used to provide computing and control capabilities. The memory of the visible light shooting device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The communication interface of the visible light shooting device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be achieved through WIFI, an operator network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, an infrared temperature measurement method is implemented. The display screen of the visible light shooting device can be a liquid crystal display screen or an electronic ink display screen, and the input device of the visible light shooting device can be a touch layer covered on the display screen, or a key, trackball or touchpad set on the housing of the computer device, or an external keyboard, touchpad or mouse, etc.

[0099] Those skilled in the art will understand that Figure 7The structure shown in the figure is only a block diagram of a part of the structure related to the scheme of the present application, and does not constitute a limitation on the computer device to which the scheme of the present application is applied. The specific visible light shooting device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0100] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0101] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory or optical memory, etc. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0102] In one embodiment, Figure 8 As shown, an infrared temperature measurement system includes an infrared temperature measurement device 802 and a visible light shooting device 804. The infrared temperature measurement device 802 is used to perform infrared temperature measurement on the measured target and output the temperature data of the measured target. The infrared temperature measurement device 802 is connected to the visible light shooting device 804 for communication. The visible light shooting device includes a memory and a processor. The memory stores a computer program. When the processor executes the computer program, the steps in the above-mentioned method embodiments are implemented.

[0103] In one embodiment, the visible light shooting device is a smart mobile device, such as a smart phone, a tablet computer, etc.

[0104] In one embodiment, the infrared temperature measurement system further includes a wired communication device, and the wired communication device is respectively connected to the visible light communication device and the infrared temperature measurement device.

[0105] In one embodiment, a visible light communication device (such as a smart phone) is connected to an infrared temperature measuring device (such as an infrared camera) via a wired communication device, and the wired communication device includes data cables with various common interfaces (including typeA, typeC, Apple interface), USB cables, etc.

[0106] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0107] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. An infrared temperature measurement method, characterized in that: The method comprises: Acquire a visible light image of the measured target and temperature data of the measured target fed back by an infrared temperature measuring device; Performing recognition processing on the visible light image of the measured object to determine the type information of the measured object; Query and determine the reflectivity of each component corresponding to the type information of the measured target; Determine the corresponding area of ​​each component in the visible light image and the reflectivity of the corresponding area; The temperature data of the target to be measured is corrected according to the reflectivity of each component of the target to be measured, the reflectivity of the corresponding area of ​​each component in the visible light image, and an action factor, including: correcting the temperature data of the target to be measured according to the reflectivity of each component of the target to be measured and the reflectivity of the corresponding area of ​​each component in the visible light image, and outputting first corrected temperature data of the target to be measured; correcting the first corrected temperature data of the target to be measured according to the action factor, and outputting a final measured temperature value, wherein the action factor includes the ambient temperature, the reflected temperature and the emissivity of the target to be measured.

2. The method according to claim 1, characterized in that The step of acquiring a visible light image of the target comprises: Get shooting location information; Determine the preset position of the best shooting location of the measured object and the preset contour information of the measured object according to the shooting position information; When the shooting position information is consistent with the preset best shooting location of the target, and the contour information of the target presented on the visible light shooting device is consistent with the preset contour information, a visible light image of the target is acquired.

3. The method according to claim 1, characterized in that The querying and determining the reflectivity of each component corresponding to the type information of the measured target includes: Determining material information of each component of the measured object according to the type information of the measured object; The material information is queried to obtain the reflectivity of each component of the measured target.

4. The method according to any one of claims 1 to 3, characterized in that The type information of the measured target includes the device type, device model and device code of the measured target.

5. The method according to claim 1, characterized in that Determining the corresponding area of ​​each component in the visible light image includes: The positional relationship between the components of the measured object is identified, and the corresponding area of ​​each component in the visible light image is determined according to the positional relationship between the components of the measured object.

6. The method according to claim 1, characterized in that The reflectivity of the corresponding area of ​​each component of the measured object in the visible light image is determined according to the reflectivity of each component of the measured object and the corresponding area of ​​each component in the visible light image.

7. An infrared temperature measuring device, characterized in that: The device comprises: An acquisition module, used to acquire a visible light image of a measured target and temperature data of the measured target fed back by an infrared temperature measuring device; An identification module, used to identify and process the visible light image of the target to be measured, and determine the type information of the target to be measured; A query module, used to query and determine the reflectivity of each component corresponding to the type information of the measured target; A determination module, used to determine the corresponding area of ​​each component in the visible light image and the reflectivity of the corresponding area; The correction module is used to correct the temperature data of the measured target according to the reflectivity of each component of the measured target, the reflectivity of the corresponding area of ​​each component in the visible light image and the action factor, including: correcting the temperature data of the measured target according to the reflectivity of each component of the measured target and the reflectivity of the corresponding area of ​​each component in the visible light image, and outputting the first corrected temperature data of the measured target; correcting the first corrected temperature data of the measured target according to the action factor, and outputting the final measured temperature value, wherein the action factor includes the ambient temperature, the reflected temperature and the emissivity of the measured target.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

9. An infrared temperature measurement system, characterized in that: The system comprises: An infrared temperature measuring device, used to perform infrared temperature measurement on a measured object and output temperature data of the measured object; A visible light camera is communicatively connected to the infrared temperature measuring device, wherein the visible light camera comprises a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the steps of the method described in any one of claims 1 to 6 are implemented.

10. The system according to claim 9, characterized in that The visible light shooting device is a smart mobile device.

11. The system according to claim 9, characterized in that It also includes a wired communication device, which is connected to the visible light shooting device and the infrared temperature measuring device respectively.

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