Sphere height measurement method, readable medium, computer program product and system

Abstract

The present invention provides a method for measuring the height of a sphere, a readable medium, a computer program product, and a system, comprising a top-view camera device, a side-view camera device, and a processing device. The top-view camera device takes a top-view image of a spherical object to be measured to obtain a top-view image of the sphere. The side-view camera device takes a side-view image of the spherical object to be measured to obtain a side-view image of the sphere. The processing device defines a top circle feature and a spherical projection boundary on the top-view image and the side-view image of the sphere. The processing device defines a first reference width between the top circle feature and the spherical projection boundary on the top-view image of the sphere, and defines a second reference width between the top circle feature and the spherical projection boundary on the side-view image of the sphere, thereby obtaining the spherical height of the spherical object to be measured.

Description

Technical Field

[0001] The present invention relates to a sphere height measurement system, and more particularly to a sphere height measurement method, a readable medium, and a measurement system. Background Art

[0002] Currently, there are four basic methods on the market for measuring the solder quality of solder balls in ball grid array (BGA) packages: spectral confocal sensor measurement, X-ray measurement, penetrant red dye test, and section test.

[0003] Of the four measurement methods mentioned above, spectral confocal sensor measurement and X-ray measurement are non-destructive inspection methods. They can be used to analyze the solderability of solder balls in solder ball array packages without damaging the solder balls themselves. The spectral confocal sensor measurement method primarily measures the wavelength of reflected light to determine the precise distance between the object under test and the lens, thereby analyzing the solder ball structure and its solderability. X-ray inspection machines actively irradiate the object under test with X-rays, which appear as varying grayscale levels in the detector based on differences in the amount of X-ray energy absorbed.

[0004] Both the penetrant red dye test and the sectioning method are destructive tests, typically used on defective boards that cannot be uncovered by non-destructive testing. They are used for final inspection of defective products, with the results used to improve yield. The penetrant red dye test primarily involves filling the entire bottom of the solder ball array package with red medicine, exploiting its ability to penetrate even small cracks. After the solder ball array package is removed from the circuit board, the red medicine distribution and solder ball results are inspected. The sectioning method primarily involves first electrically testing the problematic solder balls, then individually sectioning the problematic solder balls for detailed cross-sectional inspection. Summary of the Invention

[0005] The main purpose of the present invention is to provide a sphere height measurement method for measuring a spherical object to be measured, comprising: defining a top circle feature and a sphere projection boundary on a top-view image of the sphere and a side-view image of the sphere; defining a first reference width between the top circle feature and the sphere projection boundary on the top-view image of the sphere; and defining a second reference width between the top circle feature and the sphere projection boundary on the side-view image of the sphere; and obtaining the sphere height of the spherical object to be measured via the first reference width and the second reference width.

[0006] In the sphere height measurement method as described above, optionally, the sphere height of the spherical object to be measured is obtained according to the Pythagorean theorem or trigonometric function relationship between the first reference width, the second reference width and the sphere height.

[0007] In the sphere height measurement method as described above, optionally, the sphere height of the sphere to be measured is obtained based on the first reference width, the shooting angle of the sphere side view image, and the projection width from the top circle feature in the sphere side view image to the sphere projection boundary.

[0008] The sphere height measurement method as described above may optionally include utilizing a light source to illuminate the top of the sphere to be measured, thereby forming the top circle feature.

[0009] The sphere height measurement method as described above may optionally include generating the top circle feature in the top view image and the side view image of the sphere based on the visual features of the sphere to be measured.

[0010] In the sphere height measurement method as described above, optionally, the first reference width is the distance between the boundary of the top circle feature in the top view image of the sphere and the projection boundary of the sphere; wherein the second reference width is the distance between the boundary of the top circle feature in the side view image of the sphere and the projection boundary of the sphere.

[0011] In the sphere height measurement method as described above, optionally, the first reference width is the distance between the center of the top circle feature in the top view image of the sphere and the projection boundary of the sphere; wherein the second reference width is the distance between the center of the top circle feature in the side view image of the sphere and the projection boundary of the sphere.

[0012] Another object of the present invention is to provide a non-transitory computer-readable medium storing a computer program, which implements the above-mentioned sphere height measurement method after being loaded and executed by a processing device or a computer.

[0013] Another object of the present invention is to provide a computer program product suitable for being stored in a computer-readable medium. When a processing device or a computer loads and executes the computer program product, the above-mentioned sphere height measurement method is implemented.

[0014] Another object of the present invention is to provide a spherical height measurement system, comprising a top-view camera device, a side-view camera device, and a processing device. The top-view camera device takes a top-view image of a spherical object to be measured to obtain a top-view image of the spherical object. The side-view camera device takes a side-view image of the spherical object to be measured to obtain a side-view image of the spherical object. The processing device is coupled to the top-view camera device and the side-view camera device, and defines a top circle feature and a spherical projection boundary on the top-view image and the side-view image of the spherical object. The processing device defines a first reference width between the top circle feature and the spherical projection boundary on the top-view image of the spherical object, and defines a second reference width between the top circle feature and the spherical projection boundary on the side-view image of the spherical object, thereby obtaining the spherical height of the spherical object to be measured.

[0015] In the sphere height measurement system as described above, optionally, the processing device obtains the sphere height of the sphere to be measured based on the Pythagorean theorem or trigonometric function relationship between the first reference width, the second reference width and the sphere height.

[0016] In the sphere height measurement system as described above, optionally, the processing device obtains the sphere height of the sphere to be measured based on the first reference width, the shooting angle of the side-view camera device, and the projection width from the top circle feature in the side-view image of the sphere to the projection boundary of the sphere.

[0017] The sphere height measurement system as described above may optionally further include a light source device, which illuminates the top of the sphere to be measured to form the top circle feature.

[0018] In the sphere height measurement system as described above, optionally, the processing device forms the top circle feature in the top view image and the side view image of the sphere based on the visual features of the sphere to be measured.

[0019] In the sphere height measurement system as described above, optionally, the first reference width is the distance between the boundary of the top circle feature in the top view image of the sphere and the boundary of the sphere projection; wherein the second reference width is the distance between the boundary of the top circle feature in the side view image of the sphere and the boundary of the sphere projection.

[0020] In the sphere height measurement system as described above, optionally, the first reference width is the distance between the center of the top circle feature in the top view image of the sphere and the projection boundary of the sphere; wherein the second reference width is the distance between the center of the top circle feature in the side view image of the sphere and the projection boundary of the sphere.

[0021] In summary, the present invention can simply detect a spherical object or a spherical component on the object using a camera of an existing automatic optical inspection device, and measure the height of the sphere and other reference data. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 FIG. 4 is a block diagram of a sphere height measurement system according to an embodiment of the present invention.

[0023] Figure 2 FIG. 1 is a simplified schematic diagram of the appearance of one embodiment of the sphere height measurement system of the present invention.

[0024] Figure 3 FIG. 4 is a simplified schematic diagram of the appearance of another embodiment of the sphere height measurement system of the present invention.

[0025] Figure 4 Schematic diagram (1) of a top view image of a sphere in the present invention.

[0026] Figure 5 Schematic diagram (1) of the side view image of a sphere in the present invention.

[0027] Figure 6 Schematic diagram of the cross section of the spherical object to be tested in the present invention (1).

[0028] Figure 7 Schematic diagram of the cross section of the spherical object to be tested in the present invention (II).

[0029] Figure 8 Schematic diagram (2) of a top view image of a sphere in the present invention.

[0030] Figure 9 Schematic diagram (2) of the side view image of the sphere in the present invention.

[0031] Figure 10 Schematic diagram of the cross section of the spherical object to be tested in the present invention (3).

[0032] Figure 11 FIG. 4 is a flow chart of another embodiment of the method for measuring the height of a sphere according to the present invention.

[0033] Description of reference numerals:

[0034] 100 Sphere Height Measurement System

[0035] 10. Detection Platform

[0036] 20 Overhead camera

[0037] 30 Side view camera device

[0038] 40 Processing device

[0039] 41 processors

[0040] 42 storage units

[0041] 50 light source output device

[0042] BT sphere test object

[0043] A1 spherical overhead image

[0044] S1 top circle feature

[0045] E1 spherical projection boundary

[0046] SH1 Projected shadow area

[0047] W1 first reference width

[0048] M1 Central Axis

[0049] SP1 sampling point

[0050] SP2 sampling point

[0051] W3 first reference width

[0052] SP5 sampling point

[0053] SP6 sampling point

[0054] A2 sphere side view image

[0055] S2 top circle feature

[0056] E2 spherical projection boundary

[0057] SH2 Projected Shadow Area

[0058] W2 Second reference width

[0059] M2 Central Axis

[0060] SP3 sampling point

[0061] SP4 sampling point

[0062] W4 Second reference width

[0063] SP7 sampling point

[0064] SP8 sampling point

[0065] M3 Central Axis

[0066] OX Optical axis direction

[0067] CL Online

[0068] S sphere side view width

[0069] PW sphere side view width

[0070] α perspective

[0071] A Projection angle

[0072] H sphere height DETAILED DESCRIPTION

[0073] The detailed description and technical content of the present invention are now explained in conjunction with the accompanying drawings. In addition, for the convenience of explanation, the drawings in the present invention may not be drawn to the actual scale. These drawings and their scales are not intended to limit the scope of the present invention. This is explained in advance.

[0074] See also Figure 1 and Figure 2 , which is a block diagram and a simplified schematic diagram of the appearance of one embodiment of the sphere height measurement system of the present invention.

[0075] This embodiment discloses a sphere height measurement system 100 for measuring a spherical object under test (BT). The sphere height measurement system 100 can be configured as a single, standalone inspection station, or, in another embodiment, can be directly deployed on an automated optical inspection apparatus (AOI) to simultaneously perform optical inspection on the object and detect various data regarding the spherical component within the object from the captured image of the object. These configurations are not intended to be limiting of the present invention.

[0076] The sphere height measurement system 100 mainly includes a detection platform 10 , a top-view camera device 20 , a side-view camera device 30 , and a processing device 40 coupled to the top-view camera device 20 and the side-view camera device 30 .

[0077] The detection platform 10 is mainly used for setting the spherical object to be tested BT, and for adjusting the relative position relationship between the spherical object to be tested BT, the overhead camera device 20, and the side camera device 30. In a feasible embodiment, the detection platform 10 can be a jig, which fixes the spherical object to be tested BT on a fixed position on the platform so that the specific angle of the object to be tested is aligned to the shooting position. In another feasible embodiment, the detection platform 10 can be a vacuum device, which is used to adsorb the object to be tested and, on the other hand, remove dust, debris, etc. on the surface of the object to be tested. In another feasible embodiment, the detection platform 10 can also be a transfer device (such as a mobile platform or a robotic arm), which moves the spherical object to be tested BT from the collection station or the collection box to the shooting position via the transfer device. In addition to the above embodiments, the detection platform can also be any platform for setting the spherical object to be tested BT, which is not limited in the present invention.

[0078] The spherical test object BT described herein is not limited to a spherical object itself. The spherical test object BT may also include a spherical component within or partially within the structure of the test object. This is important to note. In practice, the spherical test object BT or the spheres within the spherical test object BT may be multiple, allowing for testing of multiple spheres in a single image. The present invention does not limit the configuration of the spherical test objects BT or the number of spheres.

[0079] In a feasible embodiment, the inspection platform 10 further includes a camera moving device 50 (such as an XY stage, a robotic arm, etc.) for carrying and moving the top-view camera device 20 and / or the side-view camera device 30, or placing the top-view camera device 20 and the side-view camera device 30 on the same platform, and adjusting the shooting directions of the top-view camera device 20 and the side-view camera device 30 on the platform so that the top-view camera device 20 and the side-view camera device 30 can focus on the same position.

[0080] The overhead camera device 20 is disposed on the overhead azimuth side of the detection platform 10, and is used to shoot the spherical object to be tested BT from above to obtain a spherical overhead image. The overhead azimuth side refers to a position near the top of the detection platform, so that the shooting direction of the overhead camera device 20 is orthogonal (with an error value of ±5 degrees) to the plane where the detection platform 10 or the spherical object to be tested is located. The overhead camera device 20 includes, but is not limited to, a color camera, for shooting the spherical object to be tested BT on the detection platform 10. In one embodiment, the image capture device 10 can be an area scan camera or a line scan camera, which is not limited in the present invention.

[0081] The side-view camera device 30 is arranged on the side-view azimuth side of the detection platform 10, and shoots the spherical object to be tested BT from the side to obtain a spherical side-view image. The side-view azimuth side refers to a position near the upper side of the detection platform, so that the side-view camera device 30 shoots the spherical object to be tested in an oblique direction to obtain the spherical side-view image. The shooting direction of the side-view camera device and the orthogonal direction of the detection platform or the orthogonal direction of the plane where the spherical object to be tested is an angle between 0 and 180 degrees, which is not limited in the present invention. The side-view camera device 30 includes but is not limited to, for example, a color camera, which is used to shoot the spherical object to be tested BT on the detection platform 10. In one embodiment, the image capture device 10 can be a plane scan camera (Area Scan Camera) or a line scan camera (Line Scan Camera), which is not limited in the present invention.

[0082] The processing device 40 can be a computer, a server, an automatic control device or any other device or equipment with image processing functions, which is not limited in the present invention. In a feasible embodiment, the processing device 40 mainly includes a processor 41 and a storage unit 42 configured to cooperate with the processor 41. In a feasible embodiment, the processor 41 and the storage unit 42 can together constitute a computer or processor, such as a personal computer, a workstation, a mainframe computer or other type of computer or processor, and their types are not limited here. The processor 41 can be, for example, a central processing unit (CPU), or other programmable general-purpose or special-purpose microprocessor (Microprocessor), digital signal processor (DSP), programmable controller, application specific integrated circuits (ASIC), programmable logic device (PLD) or other similar devices or a combination of these devices.

[0083] The processing device 40 obtains a spherical top-view image and a spherical side-view image of the spherical object to be tested BT through the top-view camera device 20 and the side-view camera device 30, and defines a top circle feature and a spherical projection boundary in the image features of the spherical top-view image and the spherical side-view image, obtains spherical parameters through the top circle feature, and further calculates the spherical height of the spherical object to be tested BT.

[0084] In a feasible embodiment, the processing device 40 can set the top circle feature based on the visual features of the spherical object to be tested BT as a reference, for example, by setting the position, size and coverage range of the top circle feature according to the coverage area ratio based on the projection boundary of the sphere, or directly based on the printing, ink, or stripes on the sphere as the top circle feature, which is not limited in the present invention.

[0085] See also Figure 3 The figure is a simplified schematic diagram of the appearance of one embodiment of the sphere height measurement system of the present invention. In another feasible embodiment, the present invention may further include a light source device 60, which illuminates the top of the spherical object to be measured BT via the light source output device 60 to form the top circle feature. The light source output device 60 in this embodiment is a coaxial light source provided in conjunction with the overhead camera device; in addition to being a coaxial light source, the light source output device 60 can also be a point light source or a ring light source, and the types of such light sources are not within the scope of the present invention. It can be understood that the smaller the area of ​​the top circle feature on the spherical object to be measured BT is mapped to the light source, the more accurate the obtained sphere height will be.

[0086] By the above method, the top circle feature S1 and the top circle feature S2 can be formed in the sphere top view image A1 and the sphere side view image A2 respectively. Figure 4 and Figure 5 , which is a schematic diagram of a top view image (1) and a side view image (1) of a sphere in the present invention.

[0087] After obtaining the top circle feature from the sphere top view image A1 and the sphere side view image A2, the processing device 40 obtains the top circle feature width T and the width of the sphere projection area B from the sphere top view image A1, and obtains the sphere side view width S from the sphere side view image A2, and obtains the sphere height H through these values.

[0088] Regarding the spherical overhead image A1, Figure 4 As shown, after obtaining a spherical overhead image A1, the processing device 40 defines a first reference width W1 between the top circle feature S1 and the spherical projection boundary E1 on the spherical overhead image A1. In one feasible embodiment, the first reference width W1 can be obtained by setting a sampling point SP1 on the boundary of the top circle feature S1 and a sampling point SP2 on the spherical projection boundary E1 along an axis M1 that spans the boundary of the top circle feature S1 and the spherical projection boundary E1. When a coaxial light source is input, a projected shadow area SH1 is formed on the bottom side of the spherical object under test BT, and the spherical projection boundary E1 represents the edge of the sphere.

[0089] Regarding the spherical side view image A2, Figure 5 As shown, after obtaining the spherical side view image A2, the processing device 40 defines a second reference width W2 (eg, Figure 6 As shown). In a feasible embodiment, the sampling point SP3 of the top circle feature S2 boundary and the sampling point SP4 of the spherical projection boundary E2 can be set on the axis M2 that spans the boundary of the top circle feature S2 and the spherical projection boundary E2 to obtain the spherical side-view width S, and then the second reference width W2 is obtained through the spherical side-view width S. In this embodiment, the spherical projection boundary E2 is mainly the image of the spherical object to be tested BT including the projected shadow area SH1, and the sampling point SP4 is sampled at the boundary with the projected shadow area SH1. Under the condition of reasonable optical configuration, the error generated by the projected shadow area SH1 can also be minimized and the edge of the spherical object to be tested BT can be directly used as the spherical projection boundary E2, which is not limited in the present invention.

[0090] It should be noted that the first reference width W1 and the second reference width W2 must be adjusted based on the shooting angle and distance of the top-view camera device 20 and the side-view camera device 30 by substituting the correction formula and correction parameters. This is not within the scope of the present invention and is not further described. Since the top-view camera device 20 may not be completely orthogonal to the surface of the inspection platform 10, this error can be ignored within a reasonable error range or corrected using the correction formula and correction parameters. This is not within the scope of the present invention and is not further described.

[0091] For the calculation method of the sphere height, please refer to Figure 6 , is a schematic cross-sectional view of a spherical object to be tested in the present invention (I). In one embodiment, when the optical axis direction OX of the side-view camera device 30 is substantially orthogonal to the line CL from the top circle feature of the spherical object to the projection boundary of the sphere on the cross-sectional view, the sphere side-view width S (e.g. Figure 5 The second reference width W2 is calculated by the distance matching ratio shown in FIG. Subsequently, the height H of the sphere can be obtained through the first reference width W1 and the second reference width W2.

[0092] After the processing device 40 obtains the first reference width W1 and the second reference width W2 of the spherical object to be tested BT from the top view image and the side view image of the sphere, it can further obtain the sphere height H on the spherical object to be tested BT. The processing device 40 obtains the sphere height H of the spherical object to be tested BT based on the Pythagorean theorem or trigonometric function relationship between the first reference width W1, the second reference width W2, and the sphere height H. Specifically, the processing device 40 obtains the sphere height H of the spherical object to be tested BT based on the following formula: W2 2 When the coverage area of ​​the top circle feature region S3 is small enough, the generated error can be basically ignored.

[0093] In another embodiment, please refer to Figure 7, is a cross-sectional schematic diagram of the spherical object to be tested in the present invention (II). When the optical axis direction OX of the side-view camera device 30 and the connection from the top circle feature of the spherical object to be tested to the projection boundary of the sphere are non-orthogonal, the spherical side-view width PW can be corrected according to the viewing angle of the side-view camera device 30 to obtain the actual second reference width W2. Specifically, the processing device 40 can obtain the spherical height H of the spherical object to be tested BT based on the first reference width, the shooting angle α of the side-view camera device 30, and the projection width from the top circle feature to the projection boundary of the sphere in the spherical side-view image (i.e., the spherical side-view width PW). In the actual calculation process, the projection angle A is first obtained through the shooting angle α of the spherical side-view image, and the second reference height W2 is calculated and obtained using the projection angle A, the spherical side-view width S, and the first reference width W1. Finally, the spherical height H is obtained through the first reference height W1 and the second reference height W2. It should be noted that since the spherical test object BT may have a symmetrical or asymmetrical shape, in order to obtain accurate values, the first reference width W1 and the second reference width W2 should be calculated based on two sets of parameters on the same side at the same cross-sectional position (for example, sampling points SP2 and SP4 are located at the same position on the spherical test object BT). However, the present invention does not exclude implementation in cases where the spherical test object BT is nearly symmetrical or where reasonable errors are acceptable. Such implementations should still fall within the scope of the present invention without departing from the core technical features of the present invention, and must be explained here.

[0094] In another feasible embodiment, the center position of the top circle feature can be directly set as the sampling point to calculate the sphere height. Figure 8 and, Figure 9 , which is a schematic diagram of the top view image (2) and the side view image (2) of the sphere in the present invention.

[0095] like Figure 8 As shown, after obtaining a spherical overhead image A1, the processing device 40 obtains a first reference width W3 from the center of the top circle feature S1 to the spherical boundary E1 from the spherical overhead image A1. A sampling point SP5 is set at the center of the top circle feature S1. A sampling point SP6 on the spherical boundary E1 can be located anywhere on the closed line of the spherical boundary E1. The first reference width W3 is obtained by calculating the distance between the sampling points SP5 and SP6. In the case of a coaxial light source, a projected shadow area SH2 is formed on the bottom side of the spherical object under test BT, and the spherical projection boundary E1 is the edge of the sphere.

[0096] like Figure 9As shown, after obtaining the spherical side-view image A2, the processing device 40 obtains the second reference width W4 between the center of the top circle feature S2 and the spherical boundary E2 from the spherical side-view image A2. In one feasible embodiment, a sampling point SP7 is set at the center of the top circle feature S2. A sampling point SP8 at the intersection with the spherical boundary E2 is obtained by setting a central axis M3 in the spherical side-view image A2 that passes through the center of the sphere and the center of the top circle feature S2. The spherical side-view width S' is calculated by calculating the distance between the sampling points SP7 and SP8, and the second reference width W4 is then obtained from the spherical side-view width S'. In this embodiment, the spherical projected boundary E2 is the image of the spherical object to be tested BT including the projected shadow area SH2, and the sampling point SP8 is sampled at the boundary with the projected shadow area SH2. With a reasonable optical configuration, the error generated by the projected shadow area SH2 can be minimized, and the edge of the spherical object to be tested BT can be directly used as the spherical projected boundary E2. This is not a limitation in the present invention.

[0097] For the calculation method of the sphere height, please refer to Figure 10 , which is a schematic cross-sectional view of a spherical object to be tested (II). After the processing device 40 obtains the first reference width W3 and the second reference width W4 of the spherical object to be tested BT from the spherical top view image and the spherical side view image, it can further obtain the sphere height H on the spherical object to be tested BT. The processing device 40 obtains the sphere height H of the spherical object to be tested BT according to the following formula: 2 Wherein, W3 is the first reference width, W4 is the second reference width, and H is the height of the sphere.

[0098] Similar to the previous embodiment, since the spherical object to be tested BT is not necessarily a completely symmetrical shape, in order to obtain accurate values, the first reference width W3 and the second reference width W4 should be calculated based on two sets of parameters on the same side at the same cross-sectional position (for example, sampling points SP6 and SP8 are located at the same position on the spherical object to be tested BT). However, the present invention does not exclude implementation in cases where the spherical object to be tested BT is nearly symmetrical or where reasonable errors are acceptable. Such implementations should still fall within the scope of the present invention without departing from the core technical features of the present invention, and must be explained here.

[0099] In another embodiment of the present invention, a method for measuring the height of a sphere is provided. Figure 11 , which is a flow chart of another embodiment of the method for measuring the height of a sphere according to the present invention, the method comprises the following steps:

[0100] The processing device receives an input spherical top-view image and an input spherical side-view image, and defines a top circle feature and a spherical projection boundary on the top-view image and the side-view image (step S21). In one embodiment, step S21 may further include illuminating the top of the spherical object to be measured using a light source to form the top circle feature. In another embodiment, step S21 may further include generating the top circle feature in the top-view image and the side-view image based on the visual features of the spherical object to be measured.

[0101] Next, the processing device defines a first reference width between the top circle feature and the projected boundary of the sphere on the top view image of the sphere (step S22). On the other hand, the processing device defines a second reference width between the top circle feature and the projected boundary of the sphere on the side view image of the sphere (step S23). In a feasible embodiment, the first reference width is the distance between the boundary of the top circle feature in the top view image of the sphere and the projected boundary of the sphere; the second reference width is the distance between the boundary of the top circle feature in the side view image of the sphere and the projected boundary of the sphere. In another feasible embodiment, the first reference width is the distance between the center of the top circle feature in the top view image of the sphere and the projected boundary of the sphere; the second reference width is the distance between the center of the top circle feature in the side view image of the sphere and the projected boundary of the sphere.

[0102] The above steps S22 and S23 do not necessarily have to be performed in a certain order. Step S22 can be performed first and then step S23, or step S22 and step S23 can be performed simultaneously. This is not limited in the present invention.

[0103] Finally, the processing device obtains the spherical height of the spherical object to be measured through the first reference width and the second reference width (step S24); in one embodiment, the processing device obtains the spherical height of the spherical object to be measured based on the first reference width, the shooting angle of the spherical side view image, and the projection width from the top circle feature in the spherical side view image to the spherical projection boundary; wherein the spherical height of the spherical object to be measured is obtained based on the Pythagorean theorem or trigonometric function relationship between the first reference width, the second reference width and the spherical height. Specifically, the height of the spherical object to be measured is obtained based on the following formula: W2 2 =W1 2 +H 2 Wherein, W1 is the first reference width, W2 is the second reference width, and H is the height of the sphere. In one possible embodiment, the second reference width W2 is obtained by modifying the first reference width W1 based on the projection width from the top circle feature in the side view image of the sphere to the projection boundary of the sphere, combined with the viewing angle of the side view image of the sphere.

[0104] The above-described method steps can be implemented via a computer-readable recording medium, such as a read-only memory, flash memory, floppy disk, hard disk, optical disk, pen drive, magnetic tape, a network-accessible database, or any other storage medium with similar functionality readily apparent to those skilled in the art. Once the program is loaded and executed by a processing device or computer, the sphere height measurement method of steps S21 through S24 described above is completed.

[0105] In addition to computer-readable media, the above-mentioned method steps can also be implemented as a computer program product for storage on a hard disk or memory device of a network server, such as an app store, Google Play, Windows Market, or other similar application online distribution platforms. After uploading the computer program product to the server, users can pay to download it for execution by a processing device or computer.

[0106] In summary, the present invention can simply detect a spherical object or a spherical component on the object using a camera of an existing automatic optical inspection device, and measure the height of the sphere and other reference data.

[0107] The present invention has been described in detail above. However, what has been described above is only a preferred embodiment of the present invention and should not be used to limit the scope of implementation of the present invention. In other words, all equivalent changes and modifications made according to the scope of the patent application of the present invention should still fall within the scope of the patent of the present invention.

Claims

1. A method for measuring the height of a sphere, for measuring a sphere to be measured, characterized in that: include: On a spherical top-view image and a spherical side-view image, a top circle feature and a spherical projection boundary are defined. The top circle feature is set based on the visual features of the spherical object to be measured. The spherical projection boundary is the position of the sphere's periphery projected in the spherical top-view image. A first reference width between the boundary of the top circle feature and the projection boundary of the sphere on the top-view image of the sphere; A second reference width defined between the boundary of the top circle feature and the boundary of the sphere projection on the sphere side view image; as well as The spherical height of the spherical object to be measured is obtained through the first reference width and the second reference width.

2. The method for measuring the height of a sphere according to claim 1, wherein: The spherical height of the spherical object to be measured is obtained according to the Pythagorean theorem or trigonometric function relationship between the first reference width, the second reference width and the spherical height.

3. The method for measuring the height of a sphere according to claim 1, wherein: The spherical height of the spherical object to be measured is obtained according to the first reference width, the shooting angle of the spherical side view image, and the projection width from the top circle feature in the spherical side view image to the spherical projection boundary.

4. The method for measuring the height of a sphere according to claim 1, wherein: The method comprises utilizing a light source to illuminate the top of the spherical object to be tested, thereby forming the top circle feature.

5. The method for measuring the height of a sphere according to claim 1, wherein: The method comprises generating the top circle feature in the top view image and the side view image of the sphere based on the visual feature of the sphere to be measured.

6. A non-transitory computer-readable medium, characterized in that A computer program is stored, and after being loaded and executed by a processing device or a computer, the computer program will implement the sphere height measurement method described in any one of claims 1 to 5.

7. A computer program product suitable for storage on a computer-readable medium, characterized in that When a processing device or a computer loads and executes the computer program product, the sphere height measurement method described in any one of claims 1 to 5 will be implemented.

8. A sphere height measurement system, characterized in that: include: a top-down camera device for shooting a spherical object to be measured from above to obtain a top-down image of the sphere; a side-view camera device for photographing the spherical object to be measured from the side to obtain a side-view image of the spherical object; and a processing device coupled to the top-view camera device and the side-view camera device, defining a top circle feature and a sphere projection boundary on the top-view image and the side-view image of the sphere, wherein the top circle feature is set based on the visual features of the spherical object to be measured, and the sphere projection boundary is the position of the outer periphery of the sphere projected in the top-view image of the sphere; The processing device defines a first reference width between the boundary of the top circle feature and the boundary of the sphere projection on the top view image of the sphere, and defines a second reference width between the boundary of the top circle feature and the boundary of the sphere projection on the side view image of the sphere, thereby obtaining the spherical height of the spherical object to be measured.

9. The sphere height measurement system according to claim 8, wherein: The processing device obtains the spherical height of the spherical object to be measured according to the Pythagorean theorem or trigonometric function relationship between the first reference width, the second reference width and the spherical height.

10. The sphere height measurement system according to claim 8, wherein: The processing device obtains the spherical height of the spherical object to be measured according to the first reference width, the shooting angle of the side-view camera device, and the projection width from the top circle feature to the spherical projection boundary in the side-view image of the spherical object.

11. The sphere height measurement system according to claim 8, wherein: The device also includes a light source device, which illuminates the top of the spherical object to be tested to form the top circle feature.

12. The sphere height measurement system according to claim 8, wherein: The processing device forms the top circle feature in the top view image and the side view image of the sphere based on the visual feature of the sphere to be measured.

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