Leakage protection device, electrical connection device and electrical appliance

Abstract

The application provides an electric leakage protection device, which comprises a switch module, a leakage current detection module, a coil detection module, a self-checking module, a detection driving module and a trip driving module. The switch module controls the electric connection between the input end and the output end. The leakage current detection module detects the leakage current signal on the power supply line and generates a leakage fault signal. The trip driving module drives the switch module to disconnect the electric connection in response to the leakage fault signal. The trip driving module comprises a first coil and a first semiconductor element. The first coil generates electromagnetic force for driving the switch module. The first semiconductor element makes the first coil generate electromagnetic force under the action of the leakage fault signal. The coil detection module generates a coil fault signal when detecting that the first coil has a fault. The self-checking module generates a self-checking fault signal when detecting that the leakage detection module and / or the first semiconductor element has a fault. The detection driving module drives the switch module to disconnect the electric connection in response to the coil fault signal or the self-checking fault signal. The scheme disconnects the electric connection when the main circuit trip coil or the semiconductor element has a fault, thereby improving safety.

Description

Technical Field

[0001] The present invention belongs to the electrical field, and in particular relates to a leakage protection device, an electrical connection device and an electrical appliance with a self-checking function. Background Art

[0002] Currently, an increasing number of household and industrial electrical appliances are being adopted across various fields. For electrical safety, leakage protectors (RCDs) are often installed at the power grid output or the input of some household appliances. These devices are prominently labeled with the message "Test before use" to urge users to verify proper function. However, even after conducting a pre-use test, the RCD may still fail to protect during use, potentially leading to dangerous situations, depending on the operating environment or installation factors.

[0003] For these reasons, leakage protection devices (RCDs) have been designed that offer both leakage detection and self-testing functions. However, most RCDs with self-testing functions currently only provide audible and visual alarms when a fault occurs in the main circuit's trip coil or semiconductor components (such as thyristors). This presents a potential safety hazard if users are unable to immediately detect and stop using the RCD. Summary of the Invention

[0004] Based on the above problems, the present invention proposes a leakage protection device, which can disconnect the power connection when a fault occurs in the trip coil or semiconductor component of the main circuit without the user having to perform an operation to stop use, thereby increasing the convenience of use and further improving safety.

[0005] A first aspect of the present invention provides a leakage protection device, comprising: a switch module coupled between an input end and an output end of a power supply line and configured to control a power connection between the input end and the output end; a leakage current detection module configured to detect a leakage current signal on the power supply line and thereby generate a leakage fault signal; a trip drive module configured to drive the switch module to disconnect the power connection in response to the leakage fault signal, the trip drive module comprising: a first coil generating an electromagnetic force for driving the switch module; and a first semiconductor element coupled in series to the first coil, which causes the first coil to generate the electromagnetic force under the action of the leakage fault signal; a coil detection module configured to generate a coil fault signal upon detecting a fault in the first coil; a self-test module configured to generate a self-test fault signal upon detecting a fault in the leakage detection module and / or the first semiconductor element; and a detection drive module configured to drive the switch module to disconnect the power connection in response to the coil fault signal and / or the self-test fault signal.

[0006] In one embodiment, the detection and driving module includes: a second coil, which generates an electromagnetic force for driving the switching module; and a second semiconductor element, which is coupled in series to the second coil and causes the second coil to generate the electromagnetic force under the action of the coil fault signal or the self-test fault signal.

[0007] In one embodiment, the first semiconductor element and the second semiconductor element are selected from one of the following: a thyristor, a bipolar transistor, a field effect transistor, and a photocoupler element.

[0008] In one embodiment, the coil detection module includes: a third semiconductor element, a control electrode of which is coupled to the first coil, and a first electrode of which is coupled to the detection drive module; and a first resistor, one end of which is coupled to the input end of the power supply line, and the other end of which is coupled to the first electrode of the third semiconductor element. When a fault occurs in the first coil, the coil detection module generates the coil fault signal via the first resistor.

[0009] In one embodiment, the first semiconductor element and the third semiconductor element are selected from one of the following: a thyristor, a bipolar transistor, a field effect transistor, and a photocoupler element.

[0010] In one embodiment, the self-test module includes: an analog leakage current trigger module, which is coupled to the first semiconductor element and configured to generate an analog leakage trigger signal, and the first semiconductor element turns off the analog leakage trigger signal under the action of the leakage fault signal; an analog leakage current generation module, which is configured to generate an analog leakage current signal through the triggering of the analog leakage current trigger module; a fault signal generation module, which is coupled to the analog leakage current trigger module and configured to generate the self-test fault signal when a fault occurs in the leakage current detection module and / or the first semiconductor element.

[0011] In one embodiment, the analog leakage current trigger module includes: a trigger tube, which generates the analog leakage trigger signal when turned on; and a second resistor and a first capacitor connected in series and coupled to the trigger tube, the second resistor and the first capacitor controlling the conduction of the trigger tube, wherein the first semiconductor element is turned on under the control of the leakage fault signal, and the charge on the first capacitor is discharged through the first semiconductor element, thereby turning off the analog leakage trigger signal.

[0012] A second aspect of the present invention provides a leakage protection device, comprising: a switch module coupled between an input end and an output end of a power supply line and configured to control the power connection between the input end and the output end; a leakage current detection module configured to detect a leakage current signal on the power supply line and thereby generate a leakage fault signal; a trip drive module configured to drive the switch module to disconnect the power connection in response to the leakage fault signal, the trip drive module comprising: a first coil generating an electromagnetic force for driving the switch module; and a first semiconductor element coupled in series to the first coil, which causes the first coil to generate the electromagnetic force under the action of the leakage fault signal; a self-test module configured to generate a self-test fault signal when a fault is detected in the leakage detection module, the first coil and / or the first semiconductor element; and a detection drive module configured to drive the switch module to disconnect the power connection in response to the self-test fault signal.

[0013] In one embodiment, the detection drive module includes: a second coil for generating electromagnetic force to drive the switch module; and a second semiconductor element coupled in series to the second coil, which enables the second coil to generate the electromagnetic force under the action of the self-detection fault signal.

[0014] In one embodiment, the first semiconductor element and the second semiconductor element are selected from one of the following: a thyristor, a bipolar transistor, a field effect transistor, and a photocoupler element.

[0015] In one embodiment, the self-test module includes: an analog leakage current trigger module, which is coupled to the first coil and the first semiconductor element and is configured to generate an analog leakage trigger signal, and the first coil and the first semiconductor element turn off the analog leakage trigger signal under the action of the leakage fault signal; an analog leakage current generation module, which is configured to generate an analog leakage current signal through the triggering of the analog leakage current trigger module; a fault signal generation module, which is coupled to the analog leakage current trigger module and is configured to generate the self-test fault signal when a fault occurs in the leakage detection module, the first coil and / or the first semiconductor element.

[0016] In one embodiment, the analog leakage current trigger module includes: a trigger tube, which generates the analog leakage trigger signal when turned on; and a second resistor and a first capacitor connected in series and coupled to the trigger tube, the second resistor and the first capacitor controlling the conduction of the trigger tube, wherein the first semiconductor element is turned on under the control of the leakage fault signal, and the charge on the first capacitor is discharged through the series path of the first coil and the first semiconductor element, thereby turning off the analog leakage trigger signal.

[0017] A third aspect of the present invention provides an electrical connection device, comprising: a housing; and a leakage protection device according to any one of the embodiments of the first and second aspects, wherein the leakage protection device is accommodated in the housing.

[0018] A fourth aspect of the present invention provides an electrical appliance, comprising: a load device; and an electrical connection device coupled between a power supply line and the load device, for supplying power to the load device, wherein the electrical connection device comprises a leakage protection device according to any one of the embodiments of the first and second aspects.

[0019] The leakage protector of the present invention can disconnect the power connection when a trip coil or semiconductor element of the main circuit fails, without the user having to perform an operation to stop use, thereby increasing the convenience of use and further improving safety. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] The embodiments are shown and explained with reference to the accompanying drawings. These drawings are intended to illustrate the basic principles and only show aspects necessary for understanding the basic principles. The drawings are not to scale. In the drawings, the same reference numerals represent similar features. In addition, a connecting line between each block in the architectural diagram indicates that the two blocks are electrically or magnetically coupled; the absence of a connecting line between two blocks does not indicate that the two blocks are not coupled.

[0021] Figure 1 A structural diagram of a leakage protection device according to an embodiment of the present invention is shown;

[0022] Figure 2 A structural diagram of another leakage protection device according to an embodiment of the present invention is shown;

[0023] Figure 3 A schematic diagram showing the principle of a leakage protection device according to a first embodiment of the present invention is shown;

[0024] Figure 4 A schematic diagram showing the principle of a leakage protection device according to a second embodiment of the present invention is shown;

[0025] Figure 5 A schematic diagram showing the principle of a leakage protection device according to a third embodiment of the present invention is shown;

[0026] Figure 6 FIG. 4 is a schematic diagram showing the principle of a leakage protection device according to a fourth embodiment of the present invention. DETAILED DESCRIPTION

[0027] In the following detailed description of preferred embodiments, reference will be made to the accompanying drawings, which form a part of the present invention. The accompanying drawings illustrate, by way of example, specific embodiments that can implement the present invention. The illustrative embodiments are not intended to be exhaustive of all embodiments according to the present invention. It will be understood that other embodiments may be utilized, and structural or logical modifications may be made, without departing from the scope of the present invention. Therefore, the following detailed description is not restrictive, and the scope of the present invention is defined by the appended claims.

[0028] Before introducing the embodiments of the present invention, some of the terms involved in the present invention are first explained to better understand the present invention. In the present invention, a transistor may refer to a transistor of any structure, such as a field effect transistor (FET), a bipolar junction transistor (BJT) or a thyristor. When the transistor is a field effect transistor, its control electrode refers to the gate of the field effect transistor, the first electrode may be the drain or source of the field effect transistor, and the corresponding second electrode may be the source or drain of the field effect transistor; when the transistor is a bipolar transistor, its control electrode refers to the base of the bipolar transistor, the first electrode may be the collector or emitter of the bipolar transistor, and the corresponding second electrode may be the emitter or collector of the bipolar transistor; when the transistor is a thyristor, its control electrode refers to the control electrode G of the thyristor, the first electrode is the anode, and the second electrode is the cathode. The simulated leakage current signal is a periodic signal generated by the self-test module, and its duration is short. Therefore, although the leakage current detection module can detect the simulated leakage current signal, it is not necessary for the leakage protection device to disconnect the power connection.

[0029] The present invention aims to provide a leakage protection device that can disconnect the power connection when a trip coil or semiconductor element of the main circuit fails without the user having to perform a stop operation, thereby increasing the convenience of use and further improving safety.

[0030] Figure 1 A structural diagram of a leakage protection device according to an embodiment of the present invention is shown.

[0031] like Figure 1As shown in FIG, the leakage protection device 100 includes a switch module 1, a leakage current detection module 2, a tripping drive module 3, a coil detection module 4, a self-test module 5, and a detection drive module 6. The switch module 1 is coupled between the input and output ends of the power supply line and is used to control the power connection between the input and output ends. The leakage current detection module 2 is coupled between the input and output ends and is used to detect the leakage current signal on the power supply line and generate a leakage fault signal when the leakage current signal is detected. In response to the leakage fault signal, the tripping drive module 3 drives the switch module 1 to disconnect the power connection between the input and output ends. The tripping drive module 3 includes a first coil and a first semiconductor element. The first semiconductor element is coupled in series to the first coil and is turned on by the leakage fault signal, causing current to flow through the first coil, thereby generating electromagnetic force and driving the switch module 1 to disconnect the power connection. The coil detection module 4 is used to detect whether the first coil has a fault and, upon detecting a fault in the first coil, generates a coil fault signal. The self-test module 5 is coupled to the leakage current detection module 2 and the first semiconductor element. It periodically generates a simulated leakage current signal to detect whether the leakage current detection module 2 or the first semiconductor element has failed. If one or both of the leakage current detection module 2 and the first semiconductor element fail, the self-test module 5 generates a self-test fault signal. In response to the coil fault signal and / or the self-test fault signal, the detection drive module 6 drives the switch module 1 to disconnect the power connection between the input and output terminals.

[0032] In the above embodiment, coil detection module 4 detects whether the first coil of trip driver module 3 (i.e., the trip coil of the main circuit) has failed and generates a coil fault signal when a fault occurs. Simultaneously, self-test module 5 detects whether the first semiconductor element of trip driver module 3 has failed and generates a self-test fault signal when a fault occurs. In response to the coil fault signal and / or the self-test fault signal, switch module 1 disconnects the power connection, thereby avoiding potential safety risks.

[0033] Figure 2 A structural diagram of another leakage protection device according to an embodiment of the present invention is shown.

[0034] like Figure 2As shown in FIG, the leakage protection device 200 includes a switch module 1, a leakage current detection module 2, a tripping drive module 3, a self-test module 5, and a detection drive module 6. The switch module 1 is coupled between the input and output ends of the power supply line and is used to control the power connection between the input and output ends. The leakage current detection module 2 is coupled between the input and output ends and is used to detect leakage current signals on the power supply line and generate a leakage fault signal when the leakage current signal is detected. In response to the leakage fault signal, the tripping drive module 3 drives the switch module 1 to disconnect the power connection between the input and output ends. The tripping drive module 3 includes a first coil and a first semiconductor element. The first semiconductor element is coupled in series to the first coil. When the leakage fault signal is applied, the first semiconductor element conducts, causing current to flow through the first coil, thereby generating an electromagnetic force that drives the switch module 1 to disconnect the power connection. The self-test module 5 is coupled to the leakage current detection module 2, the first coil, and the first semiconductor element. It periodically generates a simulated leakage current signal to detect whether the leakage current detection module 2, the first coil, and the first semiconductor element have failed. When any one or more of the leakage current detection module 2, the first coil, and the first semiconductor element fails, the self-test module 5 generates a self-test fault signal. In response to the self-test fault signal, the detection drive module 6 drives the switch module 1 to disconnect the power connection between the input and output terminals.

[0035] In the above embodiment, the self-test module 5 detects whether the first coil (i.e., the trip coil of the main circuit) and the first semiconductor element of the trip drive module 3 are faulty, and generates a self-test fault signal when a fault occurs, thereby driving the switch module 1 to disconnect the power connection, thereby avoiding potential safety risks.

[0036] Figure 3 FIG. 1 is a schematic diagram showing the principle of a leakage protection device according to a first embodiment of the present invention.

[0037] The leakage protection device 300 is coupled between the input terminal LINE and the load device LOAD. It includes a switch module 1, a leakage current detection module 2, a tripping drive module 3, a coil detection module 4, a self-test module 5, and a detection drive module 6. The switch module 1 is used to control the power connection of the power supply line. The leakage current detection module 2 includes a leakage detection coil CT1 through which the power supply line passes and a processor U1. The tripping drive module 3 includes a diode D1, a solenoid SOL1 (a first coil), and a transistor Q1 (a first semiconductor element) coupled in series.

[0038] When the leakage protection device 300 performs leakage detection, the switch of the switch module 1 is closed. When the currents of the phase line (HOT) and the neutral line (WHITE) are balanced, the leakage detection loop CT1 will not generate current imbalance. When there is a current imbalance between the phase line and the neutral line, that is, when there is a leakage current signal, a corresponding induced voltage will be generated on the leakage detection coil CT1. The leakage detection coil CT1 is coupled to pins 1, 3 and 7 of the processor U1. When the voltage output by the leakage detection coil CT1 is greater than the threshold, the pin 5 of U1 outputs a high level (that is, a leakage fault signal), otherwise it outputs a low level. The high level of pin 5 of U1 is provided to the control electrode of the transistor Q1, triggering the transistor Q1 to turn on, thereby causing a current change in the solenoid SOL1, thereby generating an electromagnetic force, driving the switch module 1 to disconnect the power connection on the power supply line.

[0039] Continue to refer Figure 3 The coil detection module 4 includes a transistor Q3 (a third semiconductor element), a resistor R6 (a first resistor), and a diode D4. The detection drive module 6 includes a transistor Q2 and a solenoid SOL2 coupled in series. One end of resistor R6 is coupled to the phase line, and the other end is coupled to the collector of transistor Q3. Together, they are coupled to the control electrode of transistor Q2 via diode D4. The control electrode of transistor Q3 is coupled to solenoid SOL1 via current-limiting resistor R9.

[0040] The self-test module 5 includes an analog leakage current trigger module 51, an analog leakage current generation module 52, and a fault signal generation module 53. The analog leakage current trigger module 51 includes a trigger tube ZD1 and a resistor R3 (second resistor) and a capacitor C1 (first capacitor) connected in series. The trigger tube ZD1 generates an analog leakage trigger signal when it is turned on. The trigger tube can be any electronic component with a voltage threshold as a trigger condition. Node A between the resistor R3 and the capacitor C1 is coupled to the trigger tube ZD1 and coupled to the node B between the solenoid SOL1 and the transistor Q1 via the diode D3. The analog leakage current generation module 52 includes a resistor R2, which is coupled to the trigger tube ZD1. The fault signal generation module 53 includes a resistor R4 and a capacitor C9 connected in series, and the node C between them is coupled to the control electrode of the transistor Q2. The neutral line charges the capacitor C1 through the diode D5 and the resistor R3. When the upper plate potential of capacitor C1 (the potential at node A) rises to the trigger voltage of trigger tube ZD1, trigger tube ZD1 turns on, causing current to flow through resistor R2 and through leakage detection coil CT1, generating a simulated leakage current signal. It can be understood that this simulated leakage current signal is actively generated by self-test module 2 and is used to simulate the leakage current signal generated when a power supply line fault occurs. At the same time, current flows through resistor R4 to charge capacitor C9.

[0041] Under normal circumstances, processor U1 detects this simulated leakage current signal, and its pin 5 outputs a high level, triggering transistor Q1 to turn on, thereby providing a discharge path for the charge on capacitor C1 and, in turn, shutting off the simulated leakage trigger signal. That is, the upper plate potential of capacitor C1 falls below the trigger voltage of trigger tube ZD1, turning off trigger tube ZD1. Accordingly, the simulated leakage current signal is no longer generated across resistor R2. At this point, the phase line is in its second half-cycle, so solenoid SOL1 is not energized. Furthermore, because trigger tube ZD1's on-time is short, the lower plate potential of capacitor C9 is insufficient to trigger transistor Q2 to turn on, thus preventing solenoid SOL2 from energizing.

[0042] When the leakage detection module 2 fails, the processor U1 cannot detect the simulated leakage current signal, and its pin 5 will not output a high level, which cannot trigger the transistor Q1 to turn on, so the transistor Q1 is in the cut-off state. Alternatively, when the transistor Q1 fails, even if the pin 5 of the processor U1 outputs a high level, the transistor Q1 will not turn on. In both cases, the transistor Q1 cannot provide a discharge path for the charge on the capacitor C1, and thus cannot turn off the simulated leakage trigger signal. At this time, the trigger tube ZD1 is continuously in the on state, so the simulated leakage current signal also continues to flow. As the capacitor C9 is continuously charged, the potential of its lower plate continues to rise. When this potential is sufficient to trigger the transistor Q2 to turn on, a current change occurs in the solenoid SOL2, thereby generating an electromagnetic force, driving the switch module 1 to disconnect the power connection.

[0043] Meanwhile, when solenoid SOL1 and diode D1 are both in a normal state, current flows through diode D1, solenoid SOL1, and current-limiting resistor R9, turning on transistor Q3. At this point, the collector voltage of transistor Q3 is insufficient to turn on transistor Q2 via diode D4, thus preventing solenoid SOL2 from being energized. If solenoid SOL1 or diode D1 fails, current cannot flow through diode D1 and solenoid SOL1, thus failing to trigger transistor Q3, which is in the off state. At this point, current flows through resistor R6 and, through diode D4, triggers transistor Q2 to turn on. This causes a change in current in solenoid SOL2, generating an electromagnetic force that drives switch module 1 to disconnect the power connection.

[0044] It should be noted that failures of the leakage current detection module 1 include, but are not limited to, the following: open circuit or short circuit of electronic components in the leakage detection module 1 (e.g., leakage detection coil CT1, resistor R1, etc.), or damage to the processor U1. Failures of the solenoid SOL1, transistor Q1, and diode D1 include, but are not limited to, damage, open circuit, or short circuit of the solenoid SOL1, transistor Q1, and diode D1 themselves.

[0045] Therefore, when any one or more of the leakage detection module 2, the transistor Q1 and the solenoid SOL1 fails, the transistor Q2 will be triggered to turn on, thereby causing a current change in the solenoid SOL2 and driving the switch module 1 to disconnect the power connection.

[0046] Figure 4 FIG. 1 is a schematic diagram showing the principle of a leakage protection device according to a second embodiment of the present invention.

[0047] exist Figure 4 In the embodiment, Figure 3 The main difference is that the transistor Q2 of the detection drive module 6 is connected to the lower end of the solenoid SOL2. The components and working principle of the leakage protection device 400 are the same as those of the Figure 3 The leakage protection device 300 is the same as that of FIG. 3 and will not be described in detail here.

[0048] Figure 5 FIG. 1 is a schematic diagram showing the principle of a leakage protection device according to a third embodiment of the present invention.

[0049] exist Figure 5 In the embodiment of the present invention, the leakage protection device 500 includes a switch module 1, a leakage current detection module 2, a tripping drive module 3, a self-test module 5 and a detection drive module 6. Figure 4 Similarly, switch module 1 is used to control the power connection of the power supply line. Leakage current detection module 2 includes a leakage detection coil CT1 through which the power supply line passes and a processor U1. Trip drive module 3 includes a diode D1, a solenoid SOL1 (a first coil), and a transistor Q1 (a first semiconductor element) coupled in series.

[0050] The principle of leakage detection by leakage protection device 500 is the same as Figure 3The self-test module 5 is similar to the leakage protection device 300 and will not be described in detail here. The self-test module 5 includes a simulated leakage current trigger module 51, a simulated leakage current generation module 52, and a fault signal generation module 53. The simulated leakage current trigger module 51 includes a trigger tube ZD1 and a resistor R3 (second resistor) and a capacitor C1 (first capacitor) connected in series. Node A between resistor R3 and capacitor C1 is coupled to the trigger tube ZD1 and is coupled to node D between diode D1 and solenoid SOL1 via diode D3. The simulated leakage current generation module 52 includes a resistor R2, which is coupled to the trigger tube ZD1. The fault signal generation module 53 includes a resistor R4 and a capacitor C9 connected in series, and a node C between them is coupled to the control electrode of transistor Q2. The neutral line charges capacitor C1 through diode D5 and resistor R3. When the upper plate potential of capacitor C1 (the potential at node A) rises to the trigger voltage of trigger tube ZD1, trigger tube ZD1 is turned on, causing current to flow through the leakage detection coil CT1 via resistor R2, generating a simulated leakage current signal. At the same time, the current charges the capacitor C9 through the resistor R4.

[0051] Under normal circumstances, processor U1 detects this simulated leakage current signal, and its pin 5 outputs a high level, triggering transistor Q1 to turn on. The charge on capacitor C1 is discharged through the series path of solenoid SOL1 and transistor Q1, thereby shutting off the simulated leakage trigger signal. In other words, the upper plate potential of capacitor C1 falls below the trigger voltage of trigger tube ZD1, and trigger tube ZD1 is cut off. Accordingly, the simulated leakage current signal is no longer generated on resistor R2. At this time, the phase line is in the second half-cycle, so solenoid SOL1 is not energized. In addition, because the on-time of trigger tube ZD1 is short, the lower plate potential of capacitor C9 is insufficient to trigger transistor Q2 to turn on, and thus solenoid SOL2 is not energized.

[0052] When leakage detection module 2 fails, processor U1 cannot detect the simulated leakage current signal, and its pin 5 does not output a high level, which cannot trigger transistor Q1 to turn on, so transistor Q1 is in the off state. Alternatively, when transistor Q1 fails, even if pin 5 of processor U1 outputs a high level, transistor Q1 will not turn on. Alternatively, when solenoid SOL1 fails, even if transistor Q1 turns on, it cannot discharge the charge on capacitor C1. In these cases, the series circuit of diode D3-solenoid SOL1-transistor Q1 cannot provide a discharge path for the charge on capacitor C1, and thus the simulated leakage trigger signal cannot be turned off. At this time, trigger tube ZD1 remains in the on state, and the simulated leakage current signal continues to flow. As capacitor C9 continues to charge, its lower plate potential continues to rise. When this potential is sufficient to trigger transistor Q2 to turn on, a current change occurs in solenoid SOL2, driving switch module 1 to disconnect the power connection.

[0053] It should also be noted that failures of the leakage current detection module 1 include, but are not limited to, the following: open circuit or short circuit of electronic components in the leakage detection module 1 (e.g., leakage detection coil CT1, resistor R1, etc.), or damage to the processor U1. Failures of the solenoid SOL1 and transistor Q1 include, but are not limited to, damage, open circuit, or short circuit of the solenoid SOL1 and transistor Q1 themselves.

[0054] Therefore, when any one or more of the leakage detection module 2, the transistor Q1 and the solenoid SOL1 fails, the transistor Q2 will be triggered to turn on, thereby causing a current change in the solenoid SOL2 and driving the switch module 1 to disconnect the power connection.

[0055] Figure 6 FIG. 4 is a schematic diagram showing the principle of a leakage protection device according to a fourth embodiment of the present invention.

[0056] exist Figure 6 In the embodiment, Figure 5 The main difference is that the transistor Q2 of the detection drive module 6 is connected to the upper end of the solenoid SOL2. The components and working principle of the leakage protection device 600 are the same as those of the Figure 5 The leakage protection device 500 is the same as that of FIG. 5 , and will not be described in detail here.

[0057] In the above embodiment, the leakage protection device can disconnect the power connection when a trip coil or semiconductor element of the main circuit fails, without the user having to perform a stop operation, thereby increasing the convenience of use and further improving safety.

[0058] Although the above embodiments are described using transistors as an example, it is understandable that the transistors may also be other types of semiconductor elements, such as photoelectric coupling elements and any other switching elements with a voltage threshold as a trigger condition.

[0059] The present invention further provides an electrical connection device, comprising: a housing; and a leakage protection device according to any one of the above embodiments, wherein the leakage protection device is accommodated in the housing.

[0060] The present invention also proposes an electrical appliance, comprising: a load device; an electrical connection device coupled between a power supply line and the load device for supplying power to the load device, the electrical connection device comprising a leakage protection device according to any one of the above embodiments.

[0061] Therefore, although the present invention has been described with reference to specific examples, which are intended to be illustrative only and not limiting, it will be apparent to those skilled in the art that changes, additions, or deletions may be made to the disclosed embodiments without departing from the spirit and scope of the present invention.

Claims

1. A leakage protection device, comprising: a switch module coupled between an input end and an output end of the power supply line and configured to control a power connection between the input end and the output end; a leakage current detection module, configured to detect a leakage current signal on the power supply line and generate a leakage fault signal; A tripping drive module is configured to drive the switch module to disconnect the power connection in response to the leakage fault signal, and the tripping drive module includes: a first coil generating an electromagnetic force for driving the switch module; and a first semiconductor element, coupled in series to the first coil, which enables the first coil to generate the electromagnetic force under the action of the leakage fault signal; a coil detection module, configured to generate a coil fault signal when detecting a fault in the first coil; A self-test module configured to generate a self-test fault signal when detecting that a fault occurs in either the leakage current detection module or the first semiconductor element; and A detection drive module is configured to drive the switch module to disconnect the power connection in response to the coil fault signal and / or the self-test fault signal, wherein: The self-test module includes: The simulated leakage current trigger module is coupled to the first semiconductor element and is configured to generate a simulated leakage trigger signal. The first semiconductor element turns off the simulated leakage trigger signal under the action of the leakage fault signal.

2. The leakage protection device according to claim 1, wherein: The detection drive module includes: a second coil generating an electromagnetic force for driving the switch module; and The second semiconductor element is coupled in series to the second coil, and enables the second coil to generate the electromagnetic force under the action of the coil fault signal or the self-test fault signal.

3. The leakage protection device according to claim 2, wherein: The first semiconductor element and the second semiconductor element are selected from one of the following: a thyristor, a bipolar transistor, a field effect transistor, and a photocoupler element.

4. The leakage protection device according to claim 1, wherein: The coil detection module includes: a third semiconductor element, a control electrode of which is coupled to the first coil, and a first electrode of which is coupled to the detection and driving module; and a first resistor, one end of which is coupled to the input end of the power supply line, and the other end of which is coupled to the first electrode of the third semiconductor element, wherein: When the first coil fails, the coil detection module generates the coil failure signal via the first resistor.

5. The leakage protection device according to claim 4, wherein: The first semiconductor element and the third semiconductor element are selected from one of the following: a thyristor, a bipolar transistor, a field effect transistor, and a photocoupler element.

6. The leakage protection device according to claim 1, wherein: The self-test module further includes: a simulated leakage current generating module, configured to generate a simulated leakage current signal via triggering of the simulated leakage current triggering module; A fault signal generating module is coupled to the simulated leakage current triggering module and is configured to generate the self-test fault signal when a fault occurs in either the leakage current detecting module or the first semiconductor element.

7. The leakage protection device according to claim 6, wherein: The analog leakage current trigger module includes: a trigger tube, which generates the simulated leakage trigger signal when turned on; and A second resistor and a first capacitor are connected in series and coupled to the trigger tube, and the second resistor and the first capacitor control the conduction of the trigger tube, wherein: The first semiconductor element is turned on under the control of the leakage fault signal, and the charge on the first capacitor is discharged through the first semiconductor element, thereby turning off the simulated leakage trigger signal.

8. A leakage protection device comprising: a switch module coupled between an input end and an output end of the power supply line and configured to control a power connection between the input end and the output end; a leakage current detection module, configured to detect a leakage current signal on the power supply line and generate a leakage fault signal; a tripping drive module, configured to drive the switch module to disconnect the power connection in response to the leakage fault signal, the tripping drive module comprising: a first coil generating an electromagnetic force for driving the switch module; and a first semiconductor element, coupled in series to the first coil, which enables the first coil to generate the electromagnetic force under the action of the leakage fault signal; a self-test module configured to generate a self-test fault signal when detecting a fault in any one of the leakage current detection module, the first coil, and the first semiconductor element; and A detection drive module is configured to drive the switch module to disconnect the power connection in response to the self-test fault signal, wherein: The self-test module includes: The simulated leakage current trigger module is coupled to the first coil and the first semiconductor element and is configured to generate a simulated leakage trigger signal. The first coil and the first semiconductor element turn off the simulated leakage trigger signal under the action of the leakage fault signal.

9. The leakage protection device according to claim 8, wherein: The detection drive module includes: a second coil, configured to generate electromagnetic force for driving the switch module; and The second semiconductor element is coupled in series to the second coil, and enables the second coil to generate the electromagnetic force under the action of the self-test fault signal.

10. The leakage protection device according to claim 9, wherein: The first semiconductor element and the second semiconductor element are selected from one of the following: a thyristor, a bipolar transistor, a field effect transistor, and a photocoupler element.

11. The leakage protection device according to claim 8, wherein: The self-test module further includes: a simulated leakage current generating module, configured to generate a simulated leakage current signal via triggering of the simulated leakage current triggering module; A fault signal generating module is coupled to the simulated leakage current triggering module and is configured to generate the self-test fault signal when any one of the leakage current detecting module, the first coil and the first semiconductor element fails.

12. The leakage protection device according to claim 11, wherein: The analog leakage current trigger module includes: a trigger tube, which generates the analog leakage trigger signal when turned on; and A second resistor and a first capacitor are connected in series and coupled to the trigger tube, and the second resistor and the first capacitor control the conduction of the trigger tube, wherein: The first semiconductor element is turned on under the control of the leakage fault signal, and the charge on the first capacitor is discharged through the series path of the first coil and the first semiconductor element, thereby turning off the simulated leakage trigger signal.

13. An electrical connection device comprising: case; as well as The leakage protection device according to any one of claims 1 to 12, wherein the leakage protection device is accommodated in the housing.

14. An electrical appliance, comprising: load equipment; An electrical connection device is coupled between a power supply line and the load device, and is used to supply power to the load device, wherein the electrical connection device comprises a leakage protection device according to any one of claims 1 to 12.

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