A statistical method, device, medium and equipment for trap elements

Abstract

An embodiment of the present application discloses a method, device, medium and equipment for counting trap elements. Among them, the method includes: determining the structural type of the trap to be counted according to the trap to be counted obtained in advance; the structural type includes simple structure and complex structure; if the trap to be counted is a complex structure, then based on the preset search step, at least two depth values between the starting depth and the ending depth determined in advance are used to determine the trap area data corresponding to the depths; the trap elements of the trap to be counted are determined by using the ratio of the trap area data corresponding to adjacent depths. This technical solution can design the trap element counting method separately by distinguishing the structural types of traps, and can accurately count the trap elements by the area ratio method, thereby improving the counting accuracy and counting efficiency.

Description

Technical Field

[0001] Embodiments of the present application relate to the field of geophysical technologies, and in particular, to a method, device, medium, and equipment for counting trap elements. Background Art

[0002] With the continuous improvement of the degree of oil and gas exploration, counting trap elements is a routine and important task in the oil and gas exploration stage.

[0003] Trap elements include the lowest trap line, trap area, depth of the highest point, closure amplitude, trap volume, flattened thickness, etc. Among them, the key to counting trap elements is to determine the depth of the lowest trap line and the depth of the highest point. The traditional method is to pre-determine the initial grid, manually find the lowest trap line and the depth of the highest point, draw the lowest trap line, and finally calculate trap elements such as the closure amplitude, trap area, and flattened thickness of the trap.

[0004] The existing method has a cumbersome process, depends on manual operation at each step, has low statistical efficiency, and is prone to statistical errors. Summary of the Invention

[0005] Embodiments of the present application provide a method, device, medium, and equipment for counting trap elements. The trap element counting method can be designed separately by distinguishing the structural types of traps, and the trap elements can be accurately counted by the area ratio method, so as to achieve the purpose of improving the statistical accuracy and statistical efficiency.

[0006] In a first aspect, embodiments of the present application provide a method for counting trap elements, the method including:

[0007] Determine the structural type of the trap to be counted according to the trap to be counted obtained in advance; the structural type includes simple structure and complex structure;

[0008] If the trap to be counted is a complex structure, determine at least two trap area data corresponding to depths between the starting depth and the ending depth based on a preset search step according to the starting depth and the ending depth determined in advance;

[0009] Determine the trap elements of the trap to be counted by using the ratio of the trap area data corresponding to adjacent depths.

[0010] In a second aspect, embodiments of the present application provide a device for counting trap elements, the device including:

[0011] A structural type determination module, configured to determine the structural type of the trap to be counted according to the trap to be counted obtained in advance; the structural type includes simple structure and complex structure;

[0012] The trap area data determination module is configured to, if the trap to be counted is a complex structure, determine the trap area data corresponding to at least two depths between the starting depth and the ending depth based on a preset search step according to the pre-determined starting depth and ending depth;

[0013] The trap element determination module is configured to determine the trap elements of the trap to be counted by using the ratio of the trap area data corresponding to adjacent depths.

[0014] In a third aspect, an embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored, and when the program is executed by a processor, the statistical method of trap elements as described in the embodiments of the present application is implemented.

[0015] In a fourth aspect, an embodiment of the present application provides an electronic device, including a memory, a processor, and a computer program stored on the memory and executable on the processor. When the processor executes the computer program, the statistical method of trap elements as described in the embodiments of the present application is implemented.

[0016] The technical solution provided by the embodiments of the present application determines the structure type of the trap to be counted according to the trap to be counted obtained in advance. If the trap to be counted is a complex structure, the trap area data corresponding to at least two depths between the starting depth and the ending depth is determined based on a preset search step according to the pre-determined starting depth and ending depth. The trap elements of the trap to be counted are determined by using the ratio of the trap area data corresponding to adjacent depths. This solution can design the statistical method of trap elements separately by distinguishing the structure type of the trap, and can accurately count the trap elements by the area ratio method, which is beneficial to improving the statistical accuracy and statistical efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1A is a flowchart of the statistical method of trap elements provided by Embodiment 1 of the present application;

[0018] Figure 1B is a schematic diagram of the trap structure provided by Embodiment 1 of the present invention;

[0019] Figure 2A is a flowchart of the statistical method of trap elements provided by Embodiment 2 of the present invention;

[0020] Figure 2B is a schematic diagram of the trap B structure provided by Embodiment 2 of the present invention;

[0021] Figure 2C is a schematic diagram of the grid block distribution of the trap A structure provided by Embodiment 2 of the present invention;

[0022] Figure 2DIt is a schematic diagram of the distribution of polygon groups of trap A structure provided in the second embodiment of the present invention;

[0023] Figure 2E It is a schematic diagram of the lowest trap line grid block of trap A structure provided in the second embodiment of the present invention;

[0024] Figure 3 It is a schematic diagram of the structure of a statistical device for trap elements provided in the third embodiment of the present invention;

[0025] Figure 4 It is a schematic diagram of the structure of an electronic device provided in the fifth embodiment of the present application. Detailed implementation manners

[0026] The present application will be further described in detail below with reference to the accompanying drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the present application, rather than limiting the present application. Additionally, it should be noted that for the sake of description, only parts related to the present application are shown in the drawings instead of all the structures.

[0027] Before discussing the exemplary embodiments in more detail, it should be mentioned that some exemplary embodiments are described as processes or methods depicted as flowcharts. Although the flowcharts describe the steps as sequential processes, many of the steps can be implemented in parallel, concurrently, or simultaneously. In addition, the order of the steps can be rearranged. The process can be terminated when its operations are completed, but it can also have additional steps not included in the drawings. The process can correspond to a method, function, procedure, subroutine, subprogram, and so on.

[0028] Embodiment 1

[0029] Figure 1A It is a flowchart of a statistical method for trap elements provided in the first embodiment of the present application. This embodiment is applicable to any statistical scenario of trap elements. This method can be executed by the statistical device for trap elements provided in the embodiments of the present application. The device can be implemented in software and / or hardware and can be integrated into an electronic device.

[0030] As Figure 1A shown, the statistical method for trap elements includes:

[0031] S110, determine the structural type of the trap to be statistically analyzed according to the trap to be statistically analyzed obtained in advance; the structural type includes simple structure and complex structure.

[0032] This solution can be executed by electronic devices such as computers. According to the actual exploration scenario, the electronic device can obtain the structural traps to be counted, analyze the traps to be counted, and determine whether the structure of the traps to be counted is complex. The standard for determining the structural type of the traps to be counted can be to judge the complexity of the structure of the traps to be counted in the trap structure image.

[0033] Specifically, determining the structural type of the traps to be counted according to the previously obtained traps to be counted includes:

[0034] If the trap to be counted is a self-trap, or the trap to be counted contains a number of faults lower than the preset quantity threshold, it is determined that the trap to be counted has a simple structure;

[0035] If the trap to be counted contains a number of faults higher than the preset quantity threshold, it is determined that the trap to be counted has a complex structure.

[0036] Based on the image features of self-traps, the electronic device can identify which ones are self-traps in the trap structure image. The electronic device can also identify the faults in the trap structure image, count the number of faults, and then determine whether the number of faults contained in the trap to be counted exceeds the preset quantity threshold. If the trap to be counted contains a large number of faults, it is considered that the trap structure is relatively complex and it is not easy to intuitively determine the depth of the lowest trap line. If the trap to be counted contains a small number of faults, it is considered that the trap structure is relatively simple and it is easy to intuitively determine the depth of the lowest trap line. In addition, the electronic device can also identify the position and / or trend of the faults, and determine the complexity of the trap to be counted according to the fault position and / or trend.

[0037] Figure 1B It is a schematic diagram of the trap structure provided by Embodiment 1 of the present invention. In a specific example, the trap structure image of a certain area is as Figure 1B shown. Among them, trap A is a self-trap, and its structure is relatively simple. The approximate position of the depth of the lowest trap line of trap A can be intuitively observed. Trap B is a faulted anticline complicated by multiple faults and develops multiple structural highs. The structure is relatively complex and it is difficult to intuitively distinguish the position of the depth of the lowest trap line.

[0038] This solution can evaluate the complexity of the traps to be counted by identifying whether the traps to be counted are self-traps or the number of faults exceeds the threshold, and then realize the classification of the structural types of the traps to be counted. This solution can effectively classify the trap structure types, which is beneficial to designing reasonable trap element statistical schemes for traps of different structural types.

[0039] S120. If the trap to be counted is a complex structure, at least two trap area data corresponding to depths between the starting depth and the ending depth are determined based on a preset search step according to the pre-determined starting depth and ending depth.

[0040] If the trap to be counted is a simple structure, that is, it is easy to intuitively determine the depth of the lowest trap line, the electronic device can determine the lowest trap line and the highest point depth according to the depth of the lowest trap line, and then determine trap elements such as trap area, closure amplitude, trap volume, and flattened thickness. If the trap to be counted is a complex structure, that is, it is not easy to intuitively determine the depth of the lowest trap line of the trap to be counted. At this time, the electronic device can determine the depth of the lowest trap line within a pre-determined depth range. Specifically, the electronic device sets a search step according to the scenario requirements. For example, if the depth lines within the trap to be counted are very dense, a smaller search step can be set to accurately locate the depth of the lowest trap line. The electronic device can determine multiple depths between the starting depth and the ending depth based on the search step, and determine the trap area corresponding to each depth according to the multiple depths to find the depth of the lowest trap line.

[0041] Specifically, the electronic device can use the multiple depths as the depth of the lowest trap line and determine the trap elements corresponding to each depth one by one. Similar to the statistical method of trap elements for simple structures, the electronic device sequentially uses the given depths as the depth of the lowest trap line, determines the lowest trap line and the highest point depth, and then determines trap elements such as trap area, closure amplitude, trap volume, and flattened thickness.

[0042] S130. Determine the trap elements of the trap to be counted by using the ratio of the trap area data corresponding to adjacent depths.

[0043] The electronic device can arrange the depths from small to large and calculate the ratio of the trap area corresponding to the latter depth to the trap area corresponding to the previous depth in sequence. According to the trap overflow concept, the electronic device can use the ratio of the trap area data corresponding to adjacent depths to determine the lowest trap line of the trap to be counted, and then determine other trap elements. The trap overflow concept is: the trap line with a larger depth value can contain more trap area than the previous trap line with a smaller depth value. When the depth is higher than the lowest trap line, the area increases relatively slowly. When the depth is lower than the lowest trap line, the trap area will increase significantly.

[0044] The electronic device can, as described in S120, sequentially use the given depth as the lowest trap line depth, determine the lowest trap line and the highest point depth, and then determine trap elements such as trap area, closure amplitude, trap volume, and flattened thickness. To save calculations, the electronic device can also sequentially use the given depth as the lowest trap line depth and only determine the lowest trap line and the trap area. After determining the lowest trap line depth through S130, it can then determine trap elements such as the highest point depth, closure amplitude, trap volume, and flattened thickness according to actual needs.

[0045] The technical solution provided by the embodiments of the present application determines the structural type of the trap to be counted according to the trap to be counted obtained in advance. If the trap to be counted is a complex structure, then based on the starting depth and ending depth determined in advance and a preset search step size, trap area data corresponding to at least two depths between the starting depth and the ending depth are determined. The trap elements of the trap to be counted are determined using the ratio of the trap area data corresponding to adjacent depths. This solution can design trap element statistical methods separately by distinguishing the structural types of traps, and can accurately count trap elements through the area ratio method, which is beneficial to improving the statistical accuracy and statistical efficiency.

[0046] Embodiment 2

[0047] Figure 2A is a flowchart of the statistical method for trap elements provided by Embodiment 2 of the present invention. This embodiment is refined based on the above embodiment. Compared with Embodiment 1, this solution has a wider scope of application. This embodiment can be applied to the case where the trap to be counted includes multiple sub-traps.

[0048] As Figure 2A shown, the method of this embodiment specifically includes the following steps:

[0049] S210, determine the structural type of the trap to be counted according to the trap to be counted obtained in advance; the structural type includes a simple structure and a complex structure.

[0050] S220, if the trap to be counted is a complex structure, then based on the starting depth and ending depth determined in advance and a preset search step size, determine trap area data corresponding to at least two depths between the starting depth and the ending depth.

[0051] S230, calculate the ratio of the trap area at the current depth to the trap area at the previous depth in ascending order of depth, and obtain a depth sorting result and area ratio data.

[0052] The electronic device can sort according to the depth between the starting depth and the ending depth, and calculate the ratio of the current depth trap area to the previous depth trap area in sequence, so as to obtain the depth sorting result and the area ratio data.

[0053] S240. Determine the overflow area ratio data in the area ratio data according to the comparison relationship between the area ratio data and the preset overflow threshold.

[0054] For the actual scenario statistics, the electronic device can set the overflow threshold corresponding to the scenario, compare the area ratio data with the overflow threshold, and record all the area ratio data of the overflow.

[0055] S250. Determine the trap elements of the trap to be counted according to the overflow area ratio data and the depth sorting result.

[0056] When the trap to be counted has a complex structure, there may be multiple sub-traps in the trap to be counted. Figure 2B It is a schematic diagram of the trap B structure provided in the second embodiment of the present invention. Figure 2B is Figure 1B the enlarged image of the trap B in. Due to the influence of multiple faults, the trap B can be further divided, that is, it can be considered that the trap B contains 3 sub-traps, namely trap a, trap b and trap c. When counting the trap B, due to the influence of multiple faults, there may be more than one area ratio of the overflow in the area ratio data. At this time, the electronic device can not only determine the lowest trap line depth of the trap to be counted according to the overflow area ratio data and the depth sorting result, but also further determine the lowest trap line depth of each sub-trap, and then can determine other trap elements of each sub-trap.

[0057] Specifically, the determining the trap elements of the trap to be counted according to the overflow area ratio data and the depth sorting result includes:

[0058] Take the depth before the maximum depth in the depth sorting result corresponding to the overflow area ratio in the overflow area ratio data as the lowest trap line depth, and determine the trap elements of the trap to be counted according to the lowest trap line depth.

[0059] Taking a specific example, the starting depth of trap B is predetermined to be 3045 meters, the ending depth is 3080 meters, and the search step is 1 meter. Table 1 below shows the trap element data corresponding to each depth of trap B determined based on the preset search step. According to the spillover threshold of 1.11 in the scenario where trap B is located, the electronic device can determine that the area ratio overflows at depths of 3053 meters, 3070 meters, and 3073 meters. Based on the above spillover area ratio data and the concept of trap spillover, the electronic device can use the depth before the depth corresponding to the third spillover, that is, 3072 meters, which is the depth before 3073 meters, as the lowest trap line depth of trap B, and determine other trap elements of trap B based on the lowest trap line depth. Specifically, after obtaining the lowest trap line depth, the electronic device can determine the trap elements of complex structures according to the trap element determination method of the simple structure in S260 - S270. That is, compared with the trap element determination method of the simple structure, the trap element determination method of the complex structure adds the determination process of the lowest trap line depth.

[0060] In addition, the electronic device can also use the depth before the depth corresponding to the first spillover, that is, 3052 meters, which is the depth before 3053 meters, as the lowest trap line depth of trap a. The electronic device can also use the depth before the depth corresponding to the second spillover, that is, 3069 meters, which is the depth before 3070 meters, as the lowest trap line depth of the combined trap of trap a and trap b.

[0061] This solution can be applied to traps with complex structures. It can not only quickly and accurately determine the trap elements of the trap to be counted, but also determine the trap elements of the sub - traps in the trap to be counted. This solution has a wide range of application scenarios and can greatly improve the statistical accuracy and efficiency.

[0062] Table 1:

[0063]

[0064]

[0065] S260, if the trap to be counted is a simple structure, then based on the predetermined lowest trap line depth, initial grid, and initial trap line, the lowest trap line and the highest point depth are obtained.

[0066] If the trap to be counted is a simple structure, the electronic device uses professional software to obtain the lowest trap line and the highest point depth based on the predetermined lowest trap line depth, initial grid, and initial trap line.

[0067] Specifically, obtaining the lowest trap line and the highest point depth based on the predetermined lowest trap line depth, initial grid, and initial trap line includes;

[0068] Truncate the initial grid according to the depth of the lowest closure line to generate a grid block with a depth higher than the lowest closure line;

[0069] Generate a polygon group according to the boundaries of the grid block;

[0070] Calculate the intersection area of each polygon in the polygon group and the polygon formed by the initial closure line in sequence to obtain intersection area data;

[0071] Determine the lowest closure line according to the intersection area data;

[0072] Determine the highest point depth according to the grid block enclosed by the lowest closure line.

[0073] Among them, Figure 2C is a schematic diagram of the grid block after truncation of the trap A structure provided in the second embodiment of the present invention, Figure 2D is a schematic diagram of the distribution of the polygon group of the trap A structure provided in the second embodiment of the present invention, Figure 2E is a schematic diagram of the grid block of the lowest closure line of the trap A structure provided in the second embodiment of the present invention. Taking trap A as a specific example, truncate the initial grid according to the depth of the lowest closure line of the given trap A, which is 3120 meters, to generate a grid block with a depth higher than the lowest closure line, as Figure 2C shown. Among them, the grid block can be one or multiple. As Figure 2D shown, according to the boundaries of the grid block, an electronic device can generate a polygon group. Calculate the intersection area of each polygon in the polygon group and the polygon formed by the initial closure line in sequence, and the electronic device can obtain intersection area data. Further, as Figure 2E shown, according to the intersection area data, the electronic device can select the polygon with the largest intersection area as the lowest closure line, and determine the highest point depth according to the grid block enclosed by the lowest closure line.

[0074] This solution can accurately locate the lowest closure line, and then obtain information such as the depth of the lowest closure line and the highest point depth. This solution can realize automatic statistics of trap elements for traps with simple structures, greatly saving labor costs.

[0075] S270. Determine the trap elements of the trap to be statistically analyzed according to the lowest closure line and the highest point depth.

[0076] According to the lowest closure line and the highest point depth obtained in S260, the electronic device can further determine other trap elements of the trap to be statistically analyzed. Specifically, the trap elements may include the lowest closure line, trap area, highest point depth, closure amplitude, trap volume, flattened thickness, etc.

[0077] Correspondingly, determining the trap elements of the traps to be counted according to the lowest trap line depth, the lowest trap line, and the highest point depth includes:

[0078] Determining the closure amplitude according to the lowest trap line depth and the highest point depth; and determining the trap area according to the lowest trap line;

[0079] Determining the trap volume according to the trap area and the grid block formed by the lowest trap line;

[0080] Determining the flattened thickness according to the trap area and the trap volume.

[0081] It can be understood that the electronic device can determine the trap area according to the area surrounded by the lowest trap line. According to the difference between the highest point depth and the lowest trap depth, the electronic device can calculate the closure amplitude of the traps to be counted. It is easy to understand that based on the trap area and the grid block formed by the lowest trap line, the electronic device can calculate the trap volume of the traps to be counted. By dividing the trap volume by the trap area, the electronic device can obtain the flattened thickness of the traps to be counted.

[0082] This solution can determine other trap elements according to the lowest trap line depth, the lowest trap line, and the highest point depth, can achieve rapid counting of traps, and is beneficial to improving the counting efficiency and accuracy of simple structure traps.

[0083] The technical solution provided by the embodiments of the present application determines the structure type of the traps to be counted by pre-acquiring the traps to be counted. If the traps to be counted are complex structures, then based on the pre-determined starting depth and ending depth, at least two trap area data corresponding to the depths between the starting depth and the ending depth are determined based on a preset search step. The trap elements of the traps to be counted are determined by using the ratio of the trap area data corresponding to adjacent depths. This solution can design trap element counting methods separately by distinguishing the structure types of traps, and can accurately count trap elements by the area ratio method, which is beneficial to improving the counting accuracy and counting efficiency.

[0084] Embodiment III

[0085] Figure 3 It is a schematic structural diagram of a statistical device for trap elements provided by Embodiment III of the present invention. This device can execute the statistical method for trap elements provided by any embodiment of the present invention, and has corresponding functional modules and beneficial effects for executing the method.

[0086] As Figure 3 shown, this device may include:

[0087] A structural type determination module 310, configured to determine the structural type of the trap to be counted according to the trap to be counted obtained in advance; the structural type includes a simple structure and a complex structure;

[0088] A trap area data determination module 320, configured to, if the trap to be counted is a complex structure, determine trap area data corresponding to at least two depths between the starting depth and the ending depth based on a preset search step according to the starting depth and the ending depth determined in advance;

[0089] A trap element determination module 330, configured to determine the trap elements of the trap to be counted by using the ratio of the trap area data corresponding to adjacent depths.

[0090] In a feasible solution, optionally, the device further includes a simple structure trap element determination module, and the simple structure trap element determination module is configured to:

[0091] If the trap to be counted is a simple structure, obtain the lowest trap line and the highest point depth according to the lowest trap line depth, the initial grid, and the initial trap line determined in advance;

[0092] Determine the trap elements of the trap to be counted according to the lowest trap line and the highest point depth.

[0093] On the basis of the above solution, optionally, the simple structure trap element determination module is specifically configured to:

[0094] Truncate the initial grid according to the lowest trap line depth to generate a grid block with a depth higher than the lowest trap line;

[0095] Generate a polygon group according to the boundary of the grid block;

[0096] Calculate the intersection area of the polygon formed by each polygon in the polygon group and the initial trap line in sequence to obtain intersection area data;

[0097] Determine the lowest trap line according to the intersection area data;

[0098] Determine the highest point depth according to the grid block surrounded by the lowest trap line.

[0099] On the basis of the above embodiment, optionally, the trap elements include the lowest trap line, trap area, highest point depth, closure amplitude, trap volume, and flattened thickness;

[0100] Correspondingly, the simple structure trap element determination module is specifically configured to:

[0101] Determine the closure amplitude according to the depth of the lowest trap line and the depth of the highest point; and determine the trap area according to the lowest trap line;

[0102] Determine the trap volume according to the trap area and the grid block enclosed by the lowest trap line;

[0103] Determine the flattened thickness according to the trap area and the trap volume;

[0104] In this solution, optionally, the structure type determination module 310 is configured to:

[0105] If the trap to be counted is a self-trap, or the trap to be counted contains a number of faults lower than a preset quantity threshold, determine that the trap to be counted is a simple structure;

[0106] If the trap to be counted contains a number of faults higher than a preset quantity threshold, determine that the trap to be counted is a complex structure.

[0107] In a preferred solution, optionally, the trap element determination module 330 is specifically configured to:

[0108] Calculate the ratio of the trap area at the current depth to the trap area at the previous depth in ascending order of depth, and obtain the depth sorting result and the area ratio data;

[0109] Determine the overflow area ratio data in the area ratio data according to the comparison relationship between the area ratio data and a preset overflow threshold;

[0110] Determine the trap elements of the trap to be counted according to the overflow area ratio data and the depth sorting result.

[0111] Based on the above solution, optionally, the trap element determination module 330 is specifically configured to:

[0112] Take the depth before the maximum depth in the depth sorting result corresponding to the overflow area ratio in the overflow area ratio data as the depth of the lowest trap line, and determine the trap elements of the trap to be counted according to the depth of the lowest trap line.

[0113] The above product can execute the trap element statistical method provided by the embodiments of the present application, and has the corresponding functional modules and beneficial effects of the execution method.

[0114] Embodiment 4

[0115] Embodiment 4 of the present invention provides a computer-readable storage medium, on which a computer program is stored, and when the program is executed by a processor, it implements the trap element statistical method provided by all the invention embodiments of the present application:

[0116] Based on the traps to be counted obtained in advance, determine the structural types of the traps to be counted; the structural types include simple structures and complex structures;

[0117] If the trap to be counted is a complex structure, then based on the starting depth and ending depth determined in advance, determine the trap area data corresponding to at least two depths between the starting depth and the ending depth based on a preset search step size;

[0118] Use the ratio of the trap area data corresponding to adjacent depths to determine the trap elements of the trap to be counted.

[0119] Any combination of one or more computer-readable media may be adopted. The computer-readable medium may be a computer-readable signal medium or a computer-readable storage medium. The computer-readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the above. More specific examples (non-exhaustive list) of the computer-readable storage medium include: an electrical connection having one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above. In this document, the computer-readable storage medium may be any tangible medium that contains or stores a program, and this program can be used by or in combination with an instruction execution system, apparatus, or device.

[0120] The computer-readable signal medium may include a data signal propagated in a baseband or as part of a carrier wave, which carries the computer-readable program code. Such a propagated data signal may take various forms, including - but not limited to - electromagnetic signals, optical signals, or any suitable combination of the above. The computer-readable signal medium may also be any computer-readable medium other than the computer-readable storage medium, and this computer-readable medium can send, propagate, or transmit a program for use by or in combination with an instruction execution system, apparatus, or device.

[0121] The program code contained on the computer-readable medium can be transmitted by any appropriate medium, including - but not limited to - wireless, wire, optical cable, RF, etc., or any suitable combination of the above.

[0122] Computer program code for performing the operations of the present invention can be written in one or more programming languages or combinations thereof. The programming languages include object-oriented programming languages such as Java, Smalltalk, C++, and also include conventional procedural programming languages such as the "C" language or similar programming languages. The program code can be executed entirely on the user's computer, partially on the user's computer, executed as an independent software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer can be connected to the user's computer through any type of network including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computer (e.g., through the Internet using an Internet service provider).

[0123] Embodiment Five

[0124] Embodiment Five of the present application provides an electronic device. Figure 4 is a schematic structural diagram of an electronic device provided in Embodiment Five of the present application. As Figure 4 shown, this embodiment provides an electronic device 400, which includes: one or more processors 420; a storage device 410 for storing one or more programs, when the one or more programs are executed by the one or more processors 420, enabling the one or more processors 402 to implement the statistical method of trap elements provided in the embodiments of the present application. The method includes:

[0125] Determine the structural type of the trap to be statistically analyzed according to the trap to be statistically analyzed obtained in advance; the structural type includes simple structure and complex structure;

[0126] If the trap to be statistically analyzed is a complex structure, then based on the starting depth and ending depth determined in advance, determine the trap area data corresponding to at least two depths between the starting depth and the ending depth based on a preset search step size;

[0127] Use the ratio of the trap area data corresponding to adjacent depths to determine the trap elements of the trap to be statistically analyzed.

[0128] Of course, those skilled in the art can understand that the processor 420 also implements the technical solution of the statistical method of trap elements provided in any embodiment of the present application.

[0129] Figure 4 The electronic device 400 shown is only an example and should not impose any limitations on the functions and usage scope of the embodiments of the present application.

[0130] As Figure 4As shown, the electronic device 400 includes a processor 420, a storage device 410, an input device 430, and an output device 440; the number of processors 420 in the electronic device can be one or more, Figure 4 and one processor 420 is taken as an example herein; the processor 420, the storage device 410, the input device 430, and the output device 440 in the electronic device can be connected through a bus or other means, Figure 4 and taking the connection through the bus 450 as an example herein.

[0131] The storage device 410, as a computer-readable storage medium, can be used to store software programs, computer-executable programs, and module units, such as the program instructions corresponding to the statistical method of trap elements in the embodiments of the present application.

[0132] The storage device 410 mainly includes a program storage area and a data storage area. Among them, the program storage area can store an operating system and application programs required for at least one function; the data storage area can store data created according to the use of the terminal, etc. In addition, the storage device 410 can include a high-speed random access memory, and can also include a non-volatile memory, such as at least one disk storage device, a flash memory device, or other non-volatile solid-state storage devices. In some instances, the storage device 410 can further include a memory remotely set relative to the processor 420, and these remote memories can be connected through a network. Examples of the above network include but are not limited to the Internet, an enterprise intranet, a local area network, a mobile communication network, and combinations thereof.

[0133] The input device 430 can be used to receive input digital, character information, or voice information, and generate key signal inputs related to the user settings and function control of the electronic device. The output device 440 can include electronic devices such as a display screen and a speaker.

[0134] The electronic device provided by the embodiments of the present application can separately design the statistical method of trap elements by distinguishing the structural types of traps, and can accurately count trap elements through the area ratio method, which is beneficial to improving the statistical accuracy and statistical efficiency.

[0135] The statistical device, medium, and equipment of trap elements provided in the above embodiments can execute the statistical method of trap elements provided in any embodiment of the present application, and have corresponding functional modules and beneficial effects for executing the method. Technical details not described in detail in the above embodiments can be referred to the statistical method of trap elements provided in any embodiment of the present application.

[0136] Note that the above is only the preferred embodiment of the present invention and the technical principles applied. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein. Various obvious changes, re-adjustments, and substitutions can be made by those skilled in the art without departing from the protection scope of the present invention. Therefore, although the present invention has been described in more detail through the above embodiments, the present invention is not limited to the above embodiments. Without departing from the concept of the present invention, more other equivalent embodiments can be included, and the scope of the present invention is determined by the scope of the appended claims.

Claims

1. A statistical method for trap elements, characterized in that, The method includes: Determining the structural type of the trap to be counted according to the trap to be counted obtained in advance; the structural type includes simple structure and complex structure; If the trap to be counted is a complex structure, then based on the starting depth and ending depth determined in advance, at least two trap area data corresponding to the depths between the starting depth and the ending depth are determined based on a preset search step size; Using the ratio of the trap area data corresponding to adjacent depths to determine the trap elements of the trap to be counted; Among them, determining the structural type of the trap to be counted according to the trap to be counted obtained in advance includes: If the trap to be counted is a self-trap, or the trap to be counted contains a number of faults lower than a preset quantity threshold, then determine that the trap to be counted is a simple structure; If the trap to be counted contains a number of faults higher than a preset quantity threshold, then determine that the trap to be counted is a complex structure; Among them, using the ratio of the trap area data corresponding to adjacent depths to determine the trap elements of the trap to be counted includes: Sequentially calculating the ratio of the trap area at the current depth to the trap area at the previous depth in ascending order of depth, to obtain a depth sorting result and area ratio data; Determining the overflow area ratio data in the area ratio data according to the comparison relationship between the area ratio data and a preset overflow threshold; Determining the trap elements of the trap to be counted according to the overflow area ratio data and the depth sorting result.

2. The method according to claim 1, wherein After determining the structural type of the trap to be counted, the method further includes: If the trap to be counted is a simple structure, then based on the lowest trap line depth, initial grid, and initial trap line determined in advance, obtain the lowest trap line and the highest point depth; Determining the trap elements of the trap to be counted according to the lowest trap line and the highest point depth.

3. The method according to claim 2, wherein The obtaining the lowest trap line and the highest point depth according to the lowest trap line depth, initial grid, and initial trap line determined in advance includes: Truncating the initial grid according to the lowest trap line depth to generate a grid block with a depth higher than the lowest trap line; Generating a polygon group according to the boundary of the grid block; Sequentially calculating the intersection area of each polygon in the polygon group and the polygon formed by the initial trap line, to obtain intersection area data; Determining the lowest trap line according to the intersection area data; Determining the highest point depth according to the grid block surrounded by the lowest trap line.

4. The method according to claim 3, characterized in that, The trap elements include the lowest trap line, trap area, highest point depth, closure amplitude, trap volume, and flattened thickness; Correspondingly, determining the trap elements of the trap to be counted according to the lowest trap line depth, lowest trap line, and highest point depth includes: Determining the closure amplitude according to the lowest trap line depth and the highest point depth; and determining the trap area according to the lowest trap line; Determining the trap volume according to the trap area and the grid block surrounded by the lowest trap line; Determining the flattened thickness according to the trap area and the trap volume.

5. The method according to claim 1, wherein Determining the trap elements of the trap to be counted according to the overflow area ratio data and the depth sorting result includes: Taking the depth immediately preceding the maximum depth in the depth sorting result corresponding to the overflow area ratio in the overflow area ratio data as the lowest trap line depth, and determining the trap elements of the trap to be counted according to the lowest trap line depth.

6. A statistical device for trap elements, characterized in that, The device includes: A structural type determination module, configured to determine the structural type of the trap to be counted according to the trap to be counted obtained in advance; the structural type includes a simple structure and a complex structure; A trap area data determination module, configured to, if the trap to be counted is a complex structure, determine trap area data corresponding to at least two depths between the starting depth and the ending depth based on a preset search step according to the starting depth and the ending depth determined in advance; A trap element determination module, configured to determine the trap elements of the trap to be counted by using the ratio of the trap area data corresponding to adjacent depths; Among them, the structural type determination module is specifically configured to: If the trap to be counted is a self-trap, or the trap to be counted contains a number of faults lower than a preset quantity threshold, determine that the trap to be counted is a simple structure; If the trap to be counted contains a number of faults higher than a preset quantity threshold, determine that the trap to be counted is a complex structure; Among them, the trap element determination module is specifically configured to: Calculate the ratio of the trap area at the current depth to the trap area at the previous depth in sequence in ascending order of depth, to obtain a depth sorting result and area ratio data; Determine the overflow area ratio data in the area ratio data according to the comparison relationship between the area ratio data and a preset overflow threshold; Determine the trap elements of the trap to be counted according to the overflow area ratio data and the depth sorting result.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by a processor, it implements the trap element statistical method according to any one of claims 1-5.

8. An electronic device, comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the trap element statistical method according to any one of claims 1-5.

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