Parameter Setting Method, Device, System, and Storage Medium

Abstract

The present application provides a parameter setting method, apparatus, system, and storage medium, which obtain first setting values of multiple memory parameters and storage locations of the multiple memory parameters in a non-volatile memory, generate a first parameter setting instruction according to the first setting value and storage location of each memory parameter, and send the first parameter setting instruction to a test device, so that the test device sets the memory parameters stored at the storage location in the non-volatile memory to the first setting values. By obtaining the storage locations of the memory parameters, this solution can achieve setting the memory parameters stored in the non-volatile memory of the test device through a host computer, without setting through the BIOS program interface, and can set multiple memory parameters at one time, improving the parameter setting efficiency.

Description

Technical Field

[0001] This application relates to the field of integrated circuit testing, and more particularly, to a parameter setting method, apparatus, system, and storage medium. Background Art

[0002] Double Data Rate Synchronous Dynamic Random Access Memory (DDR SDRAM) is a SDRAM with a double data transfer rate. Its data transfer speed is twice the system clock frequency, and it is a memory with relatively strong performance.

[0003] During the design and production process of DDR SDRAM, test equipment is required to test the performance of DDR SDRAM. During the testing process of DDR SDRAM, it is necessary to test the performance of DDR SDRAM under different parameters. The test equipment is usually a device such as a computer. The existing test method is usually to manually operate the test equipment for testing. The tester uses the program interface of the corresponding program in the Basic Input Output System (BIOS) in the computer to set the parameters in DDR SDRAM, and then test DDR SDRAM.

[0004] However, when DDR SDRAM needs to test the performance under multiple sets of parameters, the existing test method needs to switch to the program interfaces of different BIOSs to input parameters and then perform tests. The parameter setting process is complex, resulting in low parameter setting efficiency. Summary of the Invention

[0005] This application provides a parameter setting method, apparatus, system, and storage medium, aiming to provide a more efficient parameter setting solution.

[0006] In a first aspect, this application provides a parameter setting method. The method is applied to a host computer, and the host computer is connected to a test device. The test device includes a non-volatile memory. The method includes:

[0007] Obtain the first setting values of multiple memory parameters and the storage locations of the multiple memory parameters in the non-volatile memory;

[0008] Generate a first parameter setting instruction according to the first setting value and the storage location of each memory parameter;

[0009] Send the first parameter setting instruction to the test device, so that the test device sets the memory parameters stored at the storage location in the non-volatile memory to the first setting values.

[0010] Optionally, obtain the storage locations of multiple memory parameters in the non-volatile memory, specifically including:

[0011] For each memory parameter, obtain the first data and the second data, where the first data is the data stored in the non-volatile memory before setting the memory parameter, and the second data is the data stored in the non-volatile memory after setting the memory parameter;

[0012] Based on the first data and the second data, obtain the storage location of the memory parameter in the non-volatile memory.

[0013] Optionally, obtain the second data, specifically including:

[0014] Control the test device to obtain the second set value of the memory parameter input through the display interface;

[0015] Generate a second parameter setting instruction according to the second set value and the preset instruction template, where the second parameter setting instruction is used to set the memory parameter stored in the non-volatile memory;

[0016] Obtain the second data stored in the non-volatile memory after the test device executes the second parameter setting instruction.

[0017] Optionally, obtain the second data stored in the non-volatile memory after being set by the second parameter setting instruction, including:

[0018] Obtain the second data stored in the first memory area and the second memory area after the test device executes the second parameter setting instruction;

[0019] Among them, the non-volatile memory includes a first memory area and a second memory area. The first memory area is used to store control parameters, and the second memory area is used to store system variables.

[0020] Optionally, obtain the first data, specifically including:

[0021] Obtain the first data stored in the first memory area and the second memory area before setting the memory parameter.

[0022] Optionally, based on the first data and the second data, obtain the storage location of the memory parameter in the non-volatile memory, specifically including:

[0023] Perform a comparison process on the first data and the second data to obtain a change parameter;

[0024] Based on the storage location of the change parameter in the first data or the second data, obtain the storage location of the memory parameter in the non-volatile memory.

[0025] Optionally, the first set value of the obtained multiple memory parameters and the storage locations of the multiple memory parameters in the non-volatile memory specifically include:

[0026] Obtain the first set value of some memory parameters stored in the non-volatile memory and the storage locations in the non-volatile memory.

[0027] Optionally, the method further includes:

[0028] Generate a configuration file according to the first set value and storage location of each memory parameter;

[0029] Send the configuration file to the test device, and the first parameter setting instruction is used to instruct the test device to set the memory parameters based on the configuration file.

[0030] Optionally, the test device is connected to the memory under test; after setting the memory parameters stored in the non-volatile memory according to the first parameter setting instruction, the method further includes:

[0031] Obtain the test result of the test device for testing the memory under test, where the test result is obtained by the test device testing the memory under test based on the set memory parameters.

[0032] In a second aspect, the present application provides a parameter setting device, which includes:

[0033] An acquisition module, configured to acquire the first set value of multiple memory parameters and the storage locations of the multiple memory parameters in the non-volatile memory;

[0034] A processing module, configured to generate a first parameter setting instruction according to the first set value and storage location of each memory parameter;

[0035] A sending module, configured to send the first parameter setting instruction to the test device, so that the test device sets the memory parameters stored at the storage location in the non-volatile memory to the first set value.

[0036] In a third aspect, the present application provides a test system, which is characterized by including:

[0037] A host computer, which includes an instruction memory and a processor. The instruction memory is used to store processor-executable instructions, and the processor is configured to implement the parameter setting method according to any one of claims 1 to 9;

[0038] At least one test device, the test device is connected to the host computer, and the test device includes a non-volatile memory.

[0039] Optionally, the non-volatile memory includes an EEPROM, and the EEPROM is used to store the BIOS.

[0040] Optionally, the system further includes: a memory under test, which is connected to the test device.

[0041] In a third aspect, the present application provides a computer-readable storage medium, in which computer-executable instructions are stored. When the computer-executable instructions are executed by a processor, they are used to implement the parameter setting method involved in the first aspect and the optional solutions.

[0042] The present application provides a parameter setting method, apparatus, system, and storage medium. The host computer generates a first parameter setting instruction according to the first setting value of multiple memory parameters and the storage location in the non-volatile memory, and sends the first parameter setting instruction to the test device, so that the test device sets the memory parameters stored at the storage location in the non-volatile memory to the first setting value. Compared with the prior art, the present application obtains the storage location of the memory parameters, and can implement setting the memory parameters stored in the non-volatile memory through the host computer, without setting through the BIOS program interface, and can set multiple memory parameters at one time, improving the parameter setting efficiency. In addition, by comparing the data in the non-volatile memory before and after setting the memory parameters, the storage location of the memory parameters can be obtained, so that the host computer can generate a parameter setting instruction according to the storage location and the setting value to implement the setting of multiple memory parameters. Description of the Drawings

[0043] Figure 1 It is a schematic structural diagram of a test system provided by an embodiment of the present application;

[0044] Figure 2 It is a schematic flowchart of a parameter setting method provided by another embodiment of the present application;

[0045] Figure 3 It is a schematic diagram of data storage in a non-volatile memory provided by another embodiment of the present application;

[0046] Figure 4 It is a schematic flowchart of a parameter setting method provided by another embodiment of the present application;

[0047] Figure 5 It is a schematic structural diagram of a parameter setting apparatus provided by another embodiment of the present application;

[0048] Figure 6 It is a schematic structural diagram of a host computer provided by another embodiment of the present application. Detailed Embodiments

[0049] To make the objectives, technical solutions, and advantages of this application clearer, the following will clearly and completely describe the technical solutions in this application in conjunction with the accompanying drawings in this application. Obviously, the described embodiments are part of the embodiments of this application, rather than all of them. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope protected by this application.

[0050] A test system for testing DDR SDRAM is usually a computer device. In the prior art, testing DDR SDRAM is usually manual operation of the test device. The existing test method is usually to manually operate the test device, and the tester uses the computer BIOS program interface to set the parameters in the DDR SDRAM. After setting the parameters, the test device is then run to test the DDR SDRAM.

[0051] However, when the DDR SDRAM needs to test the performance under multiple sets of parameters, the existing test method needs to be adjusted to the program interfaces of different BIOSs to input parameters, and the operation process is complex, resulting in low parameter setting efficiency.

[0052] The embodiments of this application provide a parameter setting method, device, system, and storage medium, aiming to provide a more efficient parameter setting solution. The inventive concept of the embodiments of this application is: the host computer obtains the storage locations of multiple memory parameters in the non-volatile memory and the specific setting values of the parameters, then generates a parameter setting instruction according to the storage locations and the setting data, and sends the parameter setting instruction to the test device to achieve setting the memory parameters by the host computer. Compared with the prior art, there is no need to modify the parameters through the BIOS program interface, and multiple memory parameters can be modified at one time, improving the parameter setting efficiency.

[0053] In addition, since the data arrangement methods stored in the non-volatile memories produced by different manufacturers are different, the storage locations of the memory parameters cannot be directly obtained through the parameters given by the manufacturers. In the embodiments of this application, by comparing the data in the non-volatile memory before and after the memory parameters are set, the storage locations of the memory parameters are obtained, and then the parameter setting instruction can be generated, thereby improving the parameter setting efficiency.

[0054] Such as Figure 1As shown in the figure, a test system provided by an embodiment of the present application is used to test the performance of a memory under test. The test system includes a host computer 101 and multiple test devices 102, where the host computer 101 is communicatively connected to each test device 102. Each test device 102 includes a non-volatile memory. Optionally, the non-volatile memory is an Electrically Erasable Programmable Read Only Memory (EEPROM for short), and the non-volatile memory is used to store the BIOS program.

[0055] When using this test system to test the device under test, connect the device under test to the test device. Optionally, when the test device is a desktop computer device or a portable computer device, the memory is installed in the built-in card slot of the computer device or installed in the computer device by means of chip bonding.

[0056] The test process of the test system is divided into a parameter setting process before the test and a performance test process. In the parameter setting process before the test, the host computer obtains the storage location of the memory parameters in the non-volatile memory, then generates a parameter setting instruction according to the storage location and the set value of the memory parameters, and sends the parameter setting instruction to the test device, so that the test device executes the parameter setting instruction to set the memory parameters in the non-volatile memory. In the performance test process, the host computer sends a test instruction to enable the test device to perform a performance test on the memory under test.

[0057] As Figure 2 shown in the figure, another embodiment of the present application provides a parameter setting method, which is applied to the above test system. The method includes the following steps:

[0058] S201. The host computer obtains the first set value of multiple memory parameters and the storage locations of the multiple memory parameters in the non-volatile memory.

[0059] Among them, the memory parameters refer to the parameters of the memory under test. The memory parameters include the timing parameters of the memory, such as the latency of the Column Address Strobe (CAS Latency, abbreviated as tCL), the Row Active Delay (abbreviated as tRAS), the delay time from the Row Address Strobe (Rolumn AddressStrobe, abbreviated as CAS) to the Column Address Strobe (RAS to CAS Delay, abbreviated as tRCD), etc.

[0060] The memory parameters are located in the non-volatile memory. The first set value of the memory parameters is determined according to the test requirements and can be changed as the test requirements change.

[0061] S202. The host computer generates a first parameter setting instruction according to the first set value and storage location of each memory parameter.

[0062] Among them, the host computer compiles the first set value and storage location of each memory parameter through a preset compilation method to obtain the first parameter setting instruction.

[0063] S203. The host computer sends the first parameter setting instruction to the test device.

[0064] S204. The test device sets the memory parameters stored at the storage location in the non-volatile memory to the first set value.

[0065] Among them, after receiving the large first parameter setting instruction, the test device parses the first parameter setting instruction to obtain the storage location of the memory parameter and the set value of the memory parameter. Then, the data value at this storage location in the non-volatile memory is set to the first set value, so as to implement setting the memory parameter stored at this storage location to the first set value. Restart the test device, and the parameter setting will take effect.

[0066] In the parameter setting method provided in the embodiment of the present application, by obtaining the storage locations of multiple memory parameters, a parameter setting instruction is generated according to the storage location and the set value of the memory parameter, so as to implement setting the memory parameters by the host computer. Compared with the prior art, multiple memory parameters can be set at one time, improving the parameter setting efficiency.

[0067] Another embodiment of the present application provides a parameter setting method, which is also applied to the above test system. The method includes the following steps:

[0068] S301. The host computer obtains the first set values of multiple memory parameters and the storage locations of the multiple memory parameters in the non-volatile memory.

[0069] Among them, as Figure 3 shown, the non-volatile memory is provided with a first storage area and a second storage area. The first storage area is used to store control parameters, and stores control parameters such as fast start control parameters, voltage control parameters, and data scrambling control parameters. The second storage area is used to store system variables, and stores tCL variables, frequencies, and tRAS variables respectively. That is, the memory parameters are also located in the first storage area and the second storage area.

[0070] Before setting the memory parameters of the non-volatile memory, the values in the storage area where the memory parameters are located are displayed as Auto. Therefore, by comparing the values in two storage areas of the non-volatile memory, the storage locations of the memory parameters in the non-volatile memory can be obtained.

[0071] The storage locations of multiple memory parameters in the non-volatile memory can be obtained in the following way: For each memory parameter, obtain the first data and the second data. Among them, the first data is the data stored in the non-volatile memory before setting the memory parameter, and the second data is the data stored in the non-volatile memory after setting the memory parameter. The storage location of the memory parameter in the non-volatile memory is obtained based on the first data and the second data. The first data and the second data can be obtained by directly performing parameter setting operations on the test device 102, or by the host computer 101 remotely connecting to control the test device 102 to perform parameter setting operations on the test device 102 to obtain the first data and the second data.

[0072] Optionally, the first data and the second data are compared and processed to obtain the change parameters, and the storage location of the memory parameter in the non-volatile memory is obtained based on the storage location of the change parameters in the first data or the second data.

[0073] S302. The host computer generates a first parameter setting instruction according to the first setting value and the storage location of each memory parameter.

[0074] Among them, the host computer compiles the first setting value and the storage location of each memory parameter to obtain the first parameter setting instruction.

[0075] S303. The host computer sends the first parameter setting instruction to the test device.

[0076] S304. The test device sets the memory parameter stored at the storage location in the non-volatile memory to the first setting value.

[0077] Among them, the test device parses the first parameter setting instruction to obtain the storage location and the setting value of the memory parameter, and then sets the data at the storage location in the non-volatile memory to the first setting value, so as to implement setting the memory parameter stored at the storage location to the first setting value.

[0078] In the parameter setting method provided in the embodiment of the present application, based on the data before and after setting the parameters of the memory under test in the non-volatile memory, the storage locations of multiple memory parameters are obtained, and then parameter setting instructions can be generated according to the storage locations and the setting values of the multiple memory parameters, so as to implement the host computer setting multiple memory parameters at the same time and improve the parameter setting efficiency.

[0079] Another embodiment of the present application provides a parameter setting method, which is also applied to the above test system. The method includes the following steps:

[0080] S401. The host computer obtains the first setting values of multiple memory parameters and the storage locations of the multiple memory parameters in the non-volatile memory.

[0081] Among them, when obtaining the storage locations of the multiple memory parameters in the non-volatile memory, for each memory parameter, the first data and the second data are obtained. The storage location of the memory parameter in the non-volatile memory is obtained according to the first data and the second data.

[0082] The non-volatile memory is provided with a first storage area and a second storage area. The first storage area is used to store control parameters, and the second storage area is used to store system variables.

[0083] Optionally, the first data can be obtained in the following manner: Obtain the first data stored in the first memory area and the second memory area before setting the memory parameter.

[0084] Optionally, the second data can be obtained in the following manner. Control the test device to obtain the second setting value of the memory parameter input through the display interface. The display interface is the display interface of the test device. The user inputs the second setting value of the memory parameter on the display interface. Generate a second parameter setting instruction according to the second setting value and the preset instruction template. The second parameter setting instruction is used to set the memory parameter stored in the non-volatile memory. Then restart the test device, and the parameter setting will take effect. Obtain the second data stored in the non-volatile memory after the test device executes the second parameter setting instruction.

[0085] Optionally, obtain the second data stored in the first memory area and the second memory area after the test device executes the second parameter setting instruction.

[0086] After obtaining the first data and the second data, compare the first data and the second data to obtain the changed parameter, and determine the position of the memory parameter according to the position of the changed parameter in the first data or the second data.

[0087] S402. The host computer generates a first parameter setting instruction according to the first setting value and the storage location of each memory parameter.

[0088] S403. The host computer sends the first parameter setting instruction to the test device.

[0089] S404. The test device sets the memory parameter stored at the storage location in the non-volatile memory to the first setting value.

[0090] Among them, S402 to S404 have been described in detail in the above embodiments and will not be described here again.

[0091] In the parameter setting method provided by the embodiment of the present application, the memory parameters are set through the display interface of the test device to obtain the second data after the memory parameters are set. Furthermore, based on the data before and after the memory parameters are set, the storage location of the memory parameters can be finally obtained. The host computer can generate a parameter setting instruction according to the storage location and the set data, and set multiple memory parameters at the same time, improving the parameter setting efficiency.

[0092] As Figure 4 shown, another embodiment of the present application provides a parameter setting method, which is also applied to the above test system. The method includes the following steps:

[0093] S501. The host computer obtains the first setting value of some memory parameters stored in the non-volatile memory and the storage location in the non-volatile memory.

[0094] Among them, when analyzing the problems of the memory under test, only the values of some memory parameters in the memory under test and the storage locations of some memory parameters can be set. Furthermore, the influence of the set partial memory parameters on the performance of the memory under test can be analyzed.

[0095] S502. The host computer generates a first parameter setting instruction according to the first setting value and the storage location of each memory parameter.

[0096] Among them, the host computer compiles the first setting data and the storage location of some memory parameters to generate a first parameter setting instruction.

[0097] S503. The host computer sends the first parameter setting instruction to the test device.

[0098] S504. The host computer generates a configuration file according to the first setting value and the storage location of each memory parameter.

[0099] Among them, after receiving the configuration file and the first parameter setting instruction, the test device sets the memory parameters according to the first parameter setting instruction and the configuration file. That is, when executing the parameter setting instruction, the storage location and the first setting value of the memory parameters in the configuration file are read, and the memory parameters in the non-volatile memory are set according to the data read from the configuration file.

[0100] It should be noted that this step is not limited to being after S503, as long as it is between S501 and S506.

[0101] S505. The host computer sends the configuration file to the test device.

[0102] S506. The testing device sets the stored memory parameter at the storage location in the non-volatile memory to the first set value.

[0103] Among them, the testing device, when executing the parameter setting instruction, reads the storage location and the first set value of the memory parameter in the configuration file, and then sets the data at the corresponding storage location in the non-volatile memory to the first set value according to the data read from the configuration file, so as to realize the setting of some memory parameters.

[0104] S507. The host computer sends a generation test instruction.

[0105] Among them, after the testing device executes the first parameter setting instruction, it can restart the testing device, and the parameter setting will take effect. The host computer obtains the actual value of the memory parameter in the non-volatile memory of the testing device, and determines whether the actual value of the memory parameter is the same as the first set value. If it is determined that they are different, the steps of S501 to S506 need to be repeated to set the memory parameter again. If it is determined that they are the same, a test instruction can be issued.

[0106] S508. The testing device tests the memory under test based on the set memory parameter.

[0107] Among them, after the testing device receives the test instruction, it executes the test instruction and tests the memory under test based on the set memory parameter to obtain a test result.

[0108] S509. The testing device sends the test result.

[0109] It should be noted that in order to analyze the test result, usually, S501 to S507 are executed in a loop, and the set value of the same memory parameter will also increase, so as to obtain the test result of the memory parameter under each set value. By analyzing the test result, the influence of the parameter of the memory under test on the performance can be determined.

[0110] Taking the tCL parameter of DDR SDAM as an example, when S501 to S507 are executed for the first time, the set value of tCL is 10, and the test result of the memory under test when tCL = 10 is obtained. Then the set value of tCL is increased by 1, and S501 to S507 are executed again to obtain the test result of the memory under test when tCL = 11. S501 to S507 are iteratively executed in a loop until tCL = 20. Then by analyzing the obtained test results, the optimal value of tCL can be found. Or the influence of tCL on the performance of the memory under test can be analyzed. The same method can also be used to obtain the optimal value for other parameters.

[0111] In the parameter setting method provided by the embodiments of the present application, by obtaining the storage locations of multiple memory parameters and generating parameter setting instructions according to the storage locations and setting values, the setting of multiple parameters can be realized, the parameter setting efficiency can be improved, and further the test efficiency of the memory can be improved.

[0112] As Figure 5 shown, the present application provides a parameter setting device 600, and the device 600 includes:

[0113] An obtaining module 601, configured to obtain the first setting values of multiple memory parameters and the storage locations of the multiple memory parameters in the non-volatile memory;

[0114] A processing module 602, configured to generate a first parameter setting instruction according to the first setting value and the storage location of each memory parameter;

[0115] A sending module 603, configured to send the first parameter setting instruction to a test device, so that the test device sets the memory parameters stored at the storage location in the non-volatile memory to the first setting value.

[0116] Optionally, the obtaining module 601 is specifically configured to:

[0117] For each memory parameter, obtain first data and second data, where the first data is the data stored in the non-volatile memory before setting the memory parameter, and the second data is the data stored in the non-volatile memory after setting the memory parameter;

[0118] Obtain the storage location of the memory parameter in the non-volatile memory according to the first data and the second data.

[0119] Optionally, the obtaining module 601 is specifically configured to:

[0120] Control the test device to obtain the second setting value of the memory parameter input through the display interface;

[0121] Generate a second parameter setting instruction according to the second setting value and a preset instruction template, where the second parameter setting instruction is used to set the memory parameters stored in the non-volatile memory;

[0122] Obtain the second data stored in the non-volatile memory after the test device executes the second parameter setting instruction.

[0123] Optionally, the obtaining module 601 is specifically configured to:

[0124] Obtain the second data stored in the first memory area and the second memory area after the test device executes the second parameter setting instruction;

[0125] Among them, the non-volatile memory includes a first memory area and a second memory area. The first memory area is used to store control parameters, and the second memory area is used to store system variables.

[0126] Optionally, the obtaining module 601 is specifically configured to:

[0127] Obtain first data stored in the first memory area and the second memory area before setting the memory parameters.

[0128] Optionally, the obtaining module 601 is specifically configured to:

[0129] Compare and process the first data and the second data to obtain a change parameter;

[0130] Obtain the storage location of the memory parameter in the non-volatile memory according to the storage location of the change parameter in the first data or the second data.

[0131] Optionally, the obtaining module 601 is specifically configured to:

[0132] Obtain the first setting value of some memory parameters stored in the non-volatile memory and the storage location in the non-volatile memory.

[0133] Optionally, the processing module 601 is further configured to: generate a configuration file according to the first setting value and the storage location of each memory parameter;

[0134] The sending module 602 is further configured to send the configuration file to the test device, and the first parameter setting instruction is used to instruct the test device to set the memory parameters based on the configuration file.

[0135] Optionally, the test device is connected to the memory under test; the obtaining module 601 is further configured to:

[0136] Obtain the test result of the test device for testing the memory under test, and the test result is obtained by the test device testing the memory under test based on the set memory parameters.

[0137] As Figure 6 shown, the host computer 700 provided by another embodiment of the present application includes: a transmitter 701, a receiver 702, a memory 703, and a processor 704.

[0138] The transmitter 701 is used to send instructions and data;

[0139] The receiver 702 is used to receive instructions and data;

[0140] The memory 703 is used to store computer execution instructions;

[0141] A processor 704 is configured to execute computer-executable instructions stored in a memory to implement the respective steps performed by the parameter setting method in the above embodiments. For specific details, reference may be made to the relevant descriptions in the foregoing embodiments of the parameter setting method.

[0142] Optionally, the above-mentioned memory 703 may be either independent or integrated with the processor 704. When the memory 703 is independently provided, the host computer further includes a bus for connecting the memory 703 and the processor 704.

[0143] The present application provides a computer-readable storage medium storing computer-executable instructions, which are used to implement the respective steps performed by the parameter setting method in the above embodiments when executed by a processor. For specific details, reference may be made to the relevant descriptions in the foregoing embodiments of the parameter setting method.

[0144] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements on some or all of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the technical solutions of the embodiments of the present application.

Claims

1. A parameter setting method, characterized in that The method is applied to a host computer, which is connected to a test device. The test device includes a non-volatile memory. The method includes: Obtaining first setting values of a plurality of memory parameters and storage locations of the plurality of memory parameters in the non-volatile memory; Generating a first parameter setting instruction according to the first setting value and the storage location of each memory parameter; Sending the first parameter setting instruction to the test device, so that the test device sets the memory parameters stored at the storage location in the non-volatile memory to the first setting values; Wherein, obtaining the storage locations of the plurality of memory parameters in the non-volatile memory includes: For each of the memory parameters, obtaining first data and second data, where the first data is the data stored in the non-volatile memory before setting the memory parameter, and the second data is the data stored in the non-volatile memory after setting the memory parameter; Obtaining the storage location of the memory parameter in the non-volatile memory according to the first data and the second data; Wherein, obtaining the second data includes: Controlling the test device to obtain a second setting value of a memory parameter input through a display interface; Generating a second parameter setting instruction according to the second setting value and a preset instruction template, where the second parameter setting instruction is used to set the memory parameters stored in the non-volatile memory; Obtaining second data stored in the non-volatile memory after the test device executes the second parameter setting instruction.

2. The parameter setting method according to claim 1, wherein Obtaining the second data stored in the non-volatile memory after being set by the second parameter setting instruction includes: Obtaining the second data stored in a first memory area and a second memory area after the test device executes the second parameter setting instruction; Wherein, the non-volatile memory includes the first memory area and the second memory area. The first memory area is used to store control parameters, and the second memory area is used to store system variables.

3. The parameter setting method according to claim 2, characterized in that The obtaining the first data includes: Obtaining first data stored in the first memory area and the second memory area before setting the memory parameter.

4. The parameter setting method according to any one of claims 1 to 3, characterized in that, Obtaining the storage location of the memory parameter in the non-volatile memory according to the first data and the second data includes: Performing a comparison process on the first data and the second data to obtain a changed parameter; Obtaining the storage location of the memory parameter in the non-volatile memory according to the storage location of the changed parameter in the first data or the second data.

5. The parameter setting method according to any one of claims 1 to 3, characterized in that Obtaining the first setting values of the plurality of memory parameters and the storage locations of the plurality of memory parameters in the non-volatile memory includes: Obtaining the first setting values and the storage locations in the non-volatile memory of some of the memory parameters stored in the non-volatile memory.

6. The parameter setting method according to any one of claims 1 to 3, characterized in that, The method further includes: Generating a configuration file according to the first setting value and the storage location of each memory parameter; Send the configuration file to the test device, where the first parameter setting instruction is used to instruct the test device to set memory parameters based on the configuration file.

7. The parameter setting method according to any one of claims 1 to 3, characterized in that The test device is connected to the memory under test; After setting the memory parameters stored in the non-volatile memory according to the first parameter setting instruction, the method further includes: Obtain the test result of the test device testing the memory under test, where the test result is obtained by the test device testing the memory under test based on the set memory parameters.

8. A parameter setting device, characterized in that, The device includes: An obtaining module, configured to obtain the first setting values of multiple memory parameters and the storage locations of the multiple memory parameters in the non-volatile memory; A processing module, configured to generate a first parameter setting instruction according to the first setting value of each memory parameter and the storage location; A sending module, configured to send the first parameter setting instruction to the test device, so that the test device sets the memory parameters stored at the storage location in the non-volatile memory to the first setting values; Wherein, the obtaining module obtaining the storage locations of multiple memory parameters in the non-volatile memory includes: For each of the memory parameters, the obtaining module obtains first data and second data, where the first data is the data stored in the non-volatile memory before setting the memory parameter, and the second data is the data stored in the non-volatile memory after setting the memory parameter; Obtain the storage location of the memory parameter in the non-volatile memory according to the first data and the second data; Wherein, the obtaining module obtaining the second data includes: Control the test device to obtain the second setting value of the memory parameter input through the display interface; Generate a second parameter setting instruction according to the second setting value and a preset instruction template, where the second parameter setting instruction is used to set the memory parameters stored in the non-volatile memory; Obtain the second data stored in the non-volatile memory after the test device executes the second parameter setting instruction.

9. A test system, characterized in that, Includes: A host computer, the host computer includes an instruction memory and a processor, the instruction memory is used to store instructions executable by the processor, and the processor is configured to implement the parameter setting method according to any one of claims 1 to 7; At least one test device, the test device is connected to the host computer, and the test device includes a non-volatile memory.

10. The test system according to claim 9, wherein The non-volatile memory includes an EEPROM, and the EEPROM is used to store the BIOS.

11. The test system according to claim 9, wherein The system further includes: a memory under test, and the memory under test is connected to the test device.

12. A computer-readable storage medium, characterized in that, Computer-executable instructions are stored in the computer-readable storage medium, and when the computer-executable instructions are executed by a processor, they are used to implement the parameter setting method according to any one of claims 1 to 7.

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