Fault prediction method, device, computer equipment, and storage medium for switching power supply

Abstract

This application relates to a method, device, computer device, storage medium, and computer program product for predicting the faults of a switching power supply. The method includes: obtaining a plurality of voltage signals of the switching power supply within a preset time period, where the start time point of the preset time period is earlier than the start point of the load transient process, and the end time point of the preset time period is later than the end point of the load transient process; obtaining a voltage overshoot value according to the plurality of voltage signals; obtaining a plurality of the voltage overshoot values of the switching power supply within a plurality of the preset time periods in a preset time sequence to obtain a voltage overshoot time series; and predicting the remaining normal working time of the switching power supply according to the voltage overshoot time series and a preset parameter threshold. By using this method, the remaining normal working time of the switching power supply can be predicted.

Description

Technical Field

[0001] The present application relates to the field of electronic and electrical technology, and in particular to a switching power supply fault prediction method, device, computer equipment, storage medium and computer program product. Background Art

[0002] In modern society, the normal operation of various electronic and electrical equipment cannot be separated from a reliable power supply. With the development of power electronics technology, switching power supplies are widely used due to their high conversion efficiency, high power density, good stability, and small size and weight. Switching power supplies use modern power electronics technology to control the duty cycle of the power switch tube to maintain a stable output voltage. Compared with traditional linear power supplies, they have obvious conversion efficiency advantages.

[0003] As the power supply unit of many electronic and electrical equipment, DC-DC switching power supply is often one of the components with the highest failure rate and the lowest reliability. Once a failure occurs, it will usually directly cause the entire electronic and electrical equipment to stop working. Therefore, there is an urgent need to predict the failure of the switching power supply to carry out preventive maintenance and reduce its failure rate.

[0004] Generally, the fault prediction method for switching power supplies is to place the switching power supply under normal rated load working state in a high temperature test chamber with automatic temperature adjustment and control at regular intervals. First, the temperature of the high temperature test chamber is controlled from the ambient temperature T 1 Start, heat up for 1 to 1.5 hours to the design temperature T 2 After running for 2 to 2.5 hours, measure and record the output voltage value of the switching power supply; then control the temperature of the high temperature test chamber from the design temperature T 2 Start, heat up for 1 to 1.5 hours to the limit temperature T 3 After running for 2 to 2.5 hours, measure and record the output voltage of the switching power supply, and then stop the test; finally, turn T 2 and T 3 The voltage values ​​measured at the temperature are subtracted to obtain the relative change value, and then a curve of the relative change of the voltage value over time is drawn. If the relative change exceeds 10% relative to the initial state, it means that the switching power supply is about to fail and should be repaired or replaced.

[0005] However, this method requires that the switching power supply be placed in a high-temperature test chamber for testing and testing from time to time. The testing and testing process is complex and time-consuming. In addition, the steady-state value of the switching power supply output voltage is used as a characteristic quantity for fault prediction. The premise is that the steady-state value of the output voltage can show a degradation trend. However, in fact, switching power supplies generally have closed-loop control, and their output voltage steady-state values ​​are usually difficult to show a more obvious degradation trend. At this time, fault prediction cannot be performed. Summary of the invention

[0006] Based on this, it is necessary to provide a method, device, computer device, computer-readable storage medium, and computer program product capable of predicting the faults of a switching power supply for the above technical problems.

[0007] In a first aspect, the present application provides a method for predicting faults of a switching power supply, the method including:

[0008] Obtain a plurality of voltage signals of the switching power supply within a preset time period, where the starting time point of the preset time period is earlier than the starting point of the load transient process, and the ending time point of the preset time period is later than the ending point of the load transient process;

[0009] Obtain a voltage overshoot value according to the plurality of voltage signals;

[0010] Obtain the plurality of voltage overshoot values of the switching power supply within a plurality of the preset time periods according to a preset time sequence to obtain a voltage overshoot time series;

[0011] Predict the remaining normal operating time of the switching power supply according to the voltage overshoot time series and a preset parameter threshold.

[0012] In one embodiment, the obtaining a voltage overshoot value according to the plurality of voltage signals includes:

[0013] Obtain a voltage change amount between every two adjacent voltage signals according to the plurality of voltage signals, where the voltage change amount is the change amount of the voltage signal corresponding to the later moment relative to the voltage signal corresponding to the previous moment;

[0014] Screen out target change amounts, where the target change amounts are the voltage change amounts greater than a preset threshold;

[0015] Sum up the target change amounts to obtain the voltage overshoot value.

[0016] In one embodiment, the obtaining a plurality of voltage signals of the switching power supply within a preset time period includes:

[0017] Set the load current of the switching power supply at the starting time point to a first current, and collect a plurality of first voltage signals of the switching power supply between the starting time point and the starting point of the load transient process;

[0018] Change the load current to a second current at the starting point of the load transient process, and collect a plurality of second voltage signals of the switching power supply between the starting point of the load transient process and the ending time point, where the second current is less than the first current; the plurality of voltage signals include a plurality of first voltage signals and a plurality of the second voltage signals.

[0019] In one embodiment, the sampling frequency of the second voltage signal is greater than 5 times the reciprocal of the duration of the load transient process; the preset time period is greater than or equal to 1.2 times the duration of the load transient process.

[0020] In one embodiment, predicting the remaining normal operating time of the switching power supply according to the voltage overshoot time series and the preset parameter threshold includes:

[0021] Using a time series fitting algorithm to fit the voltage overshoot time series to obtain a fitting curve;

[0022] Predicting the remaining normal operating time of the switching power supply according to the fitting curve and the preset parameter threshold.

[0023] In one embodiment, obtaining the voltage overshoot time series by obtaining multiple voltage overshoot values of the switching power supply within multiple preset time periods according to a preset time sequence includes:

[0024] Repeatedly setting the load current of the switching power supply at the starting time point to a first current according to a preset time sequence, collecting multiple first voltage signals, and changing the load current to a second current at the starting point of the load transient process, and collecting multiple second voltage signals;

[0025] Obtaining the voltage overshoot value corresponding to each load transient process according to the first voltage signal and the second voltage signal respectively;

[0026] Arranging the voltage overshoot values corresponding to each load transient process in sequence according to a preset time sequence to obtain the voltage overshoot time series.

[0027] In a second aspect, the present application also provides a switching power supply fault prediction device, and the device includes:

[0028] A signal acquisition module, configured to acquire multiple voltage signals of the switching power supply within a preset time period, where the starting time point of the preset time period is earlier than the starting point of the load transient process, and the ending time point of the preset time period is later than the ending point of the load transient process;

[0029] A voltage overshoot acquisition module, configured to acquire a voltage overshoot value according to the multiple voltage signals;

[0030] A time series acquisition module, configured to acquire multiple voltage overshoot values of the switching power supply within multiple preset time periods according to a preset time sequence to obtain a voltage overshoot time series;

[0031] A prediction module, configured to predict the remaining normal operating time of the switching power supply according to the voltage overshoot time series and a preset parameter threshold.

[0032] In a third aspect, the present application further provides a computer device, including a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, the steps of any one of the foregoing switching power supply fault prediction methods are implemented.

[0033] In a fourth aspect, the present application further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of any one of the foregoing switching power supply fault prediction methods are implemented.

[0034] In a fifth aspect, the present application further provides a computer program product, including a computer program. When the computer program is executed by a processor, the steps of any one of the foregoing switching power supply fault prediction methods are implemented.

[0035] The foregoing switching power supply fault prediction method, device, computer device, storage medium, and computer program product obtain multiple voltage signals of the switching power supply and obtain voltage overshoot values based on the voltage signals, obtain a voltage overshoot sequence according to a preset time sequence, and predict the remaining normal operating time of the switching power supply according to the voltage overshoot sequence and a preset parameter threshold. This method conforms to the failure physics and degradation characteristics of the DC-DC switching power supply, requires fewer parameters to be monitored, has a low requirement for the parameter sampling rate, and has good versatility, which helps the DC-DC switching power supply to carry out non-invasive degradation characteristic detection and fault prediction. Description of the Drawings

[0036] Figure 1 It is a schematic diagram of the load transient process of the switching power supply in an embodiment;

[0037] Figure 2 It is a schematic flowchart of the switching power supply fault prediction method in an embodiment;

[0038] Figure 3 It is a schematic flowchart of the switching power supply fault prediction steps in an embodiment;

[0039] Figure 4 It is a schematic flowchart of the switching power supply fault prediction steps in another embodiment;

[0040] Figure 5 It is a schematic flowchart of the switching power supply fault prediction steps in another embodiment;

[0041] Figure 6 It is a schematic flowchart of the switching power supply fault prediction steps in another embodiment;

[0042] Figure 7Flow schematic diagram of the fault prediction steps for a switching power supply in another embodiment;

[0043] Figure 8 Structural block diagram of the fault prediction device for a switching power supply in one embodiment;

[0044] Figure 9 Internal structure diagram of a computer device in one embodiment. Detailed implementation manners

[0045] In order to make the objectives, technical solutions and advantages of the present application more clear and understandable, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0046] The core component of a DC-DC switching power supply is a DC-DC converter, that is, a high-frequency switching power conversion circuit with both input and output being DC. It consists of control circuits such as a sampling network, a controller, a pulse width modulation section, and a driver to form a system closed-loop operation. Its main function is to perform energy transfer and conversion. The DC-DC switching power supply can be implemented through various topological structures, and typical ones include Buck, Boost, Buck-Boost, flyback, forward, push-pull, full-bridge, half-bridge and other topologies. In its output filter circuit, most of them will use aluminum electrolytic capacitors for energy storage and filtering, absorbing the current components of the switching frequency and its high-order harmonic frequencies and filtering out their ripple voltage components. The filtering function of the aluminum electrolytic capacitor is related to its main parameters, capacitance C and equivalent series resistance (ESR). During the use of the aluminum electrolytic capacitor, degradation will occur, mainly manifested as a decrease in capacitance C and an increase in ESR, etc.

[0047] When the ESR and C of the aluminum electrolytic capacitor change, the pole and zero positions of the power supply feedback loop will be changed, thereby affecting the working stability of the entire power supply. At this time, the pulse width modulation signal output by the control chip will cause the switching tube to deviate from the normal operating point, the response characteristic of the power supply will deteriorate accordingly, and the stability of the output DC voltage will decrease.

[0048] The transient response waveform of a typical topology (BUCK) power supply when the load suddenly decreases is as Figure 1 shown. At time t 0 , the load current suddenly decreases in a step, and the output voltage V o suddenly increases. Since the control gradually returns to the reference value, this process is the load transient process. The overshoot value ΔV of the output voltage 0It will increase significantly with the degradation of the ESR of the aluminum electrolytic capacitor. The voltage overshoot value can be used as a degradation characteristic parameter for fault prediction. In addition, since the time span of this load transient process is often on the order of dozens of milliseconds, a sampling rate of about 200 kHz can achieve acquisition, which is much lower than the sampling rate of the fault prediction method using ripple as the degradation characteristic parameter.

[0049] In one embodiment, as Figure 2 shown, a switching power supply fault prediction method is provided. Taking the application of this method to the Figure 1 load transient process in as an example for illustration, it includes steps 202 - step 208:

[0050] Step 202, obtain multiple voltage signals of the switching power supply within a preset time period, where the start time point of the preset time period is earlier than the start point of the load transient process, and the end time point of the preset time period is later than the end point of the load transient process.

[0051] Among them, the load transient process is a process that occurs when the load changes when the switching power supply is working with a load. In this application, when performing fault prediction, tests can be implemented through methods such as external controlled loads such as electronic loads or resistor switching; the preset time period is the time period for voltage signal acquisition and includes the time period corresponding to the load transient process. Specifically, the time period corresponding to the load transient process is as Figure 1 shown as t 0 -t 1 time period, and the preset time period is as Figure 1 shown as T 0 -T 1 time period; the multiple voltage signals are the output voltage signals of the switching power supply.

[0052] Step 204, obtain the voltage overshoot value according to the multiple voltage signals.

[0053] Among them, the voltage overshoot value is the increased amount of the output voltage during the load transient process relative to the output voltage during the non - load transient process. The voltage overshoot value can be obtained by processing the voltage signals.

[0054] Step 206, obtain the multiple voltage overshoot values of the switching power supply within multiple preset time periods according to a preset time sequence to obtain a voltage overshoot time series.

[0055] Obtain the voltage overshoot values of the voltage during multiple load transient processes according to a preset time sequence and arrange them according to the preset time sequence to obtain the voltage overshoot time series.

[0056] Step 208, predict the remaining normal working time of the switching power supply according to the voltage overshoot time series and preset parameter thresholds.

[0057] According to the voltage overshoot time series, a fitting curve of the voltage overshoot value changing with time can be obtained, and based on the fitting curve and a preset parameter threshold, the remaining normal working time of the switching power supply can be predicted.

[0058] In the above switching power supply fault prediction method, by acquiring multiple voltage signals of the switching power supply and obtaining the voltage overshoot value based on the voltage signals, the voltage overshoot sequence is acquired according to a preset time sequence, and the remaining normal working time of the switching power supply is predicted according to the voltage overshoot sequence and the preset parameter threshold. This method conforms to the failure physics and degradation characteristics of the DC-DC switching power supply, requires fewer parameters to be monitored, has a low requirement for the parameter sampling rate, and has good versatility, which helps the DC-DC switching power supply to carry out non-invasive degradation feature detection and fault prediction.

[0059] In one embodiment, as Figure 3 shown, obtaining the voltage overshoot value according to the multiple voltage signals includes steps 302 - step 306:

[0060] Step 302, obtaining the voltage change amount between every two adjacent voltage signals according to the multiple voltage signals, where the voltage change amount is the change amount of the voltage signal corresponding to the later moment relative to the voltage signal corresponding to the previous moment.

[0061] The voltage signal output by the switching power supply is a continuous signal, and the sampled signal is an output voltage signal sequence. Subtracting the voltage corresponding to the previous moment from the voltage corresponding to the later moment in the output voltage signal sequence obtains multiple voltage change amounts.

[0062] Step 304, screening out the target change amount, where the target change amount is the voltage change amount greater than the preset threshold.

[0063] Wherein, the preset threshold is a change amount judgment threshold greater than 0, and its initial value can be set manually and then modified according to the actual measurement situation.

[0064] Step 306, adding up each of the target change amounts to obtain the voltage overshoot value.

[0065] Wherein, the voltage overshoot value is the sum of each of the target change amounts.

[0066] In this embodiment, by processing the collected voltage signals to obtain voltage change amounts, screening out the target change amounts from each voltage change amount and adding them up, the voltage overshoot value, which is a degradation feature parameter required for fault prediction, can be calculated.

[0067] In one embodiment, as Figure 4As shown, obtaining multiple voltage signals of the switching power supply within a preset time period includes steps 402 to 404:

[0068] Step 402, set the load current of the switching power supply at the starting time point to a first current, and collect multiple first voltage signals of the switching power supply between the starting time point and the starting point of the load transient process.

[0069] Specifically, please continue to refer to Figure 1 , at the starting time point, set the DC-DC switching power supply to work at normal temperature and connected to the load, and the initial load current is the first current I 1 (Preferably I 1 > 0.5 * I f , I f is the full-load current), and collect multiple first voltage signals based on the first current.

[0070] Step 404, change the load current to a second current at the starting point of the load transient process, and collect multiple second voltage signals of the switching power supply between the starting point of the load transient process and the ending time point, where the second current is less than the first current; the multiple voltage signals include multiple first voltage signals and multiple second voltage signals.

[0071] At the starting point T 0 of the load transient process, change the load current to the second current I 2 (I 2 < I 1 , and preferably ΔI = I 1 - I 2 ≧ 0.5 * I f ). Collect the second output voltage signal based on the second current until the load transient process ends. Assume that the duration of the load transient process is T, then its sampling frequency should be higher than 5 / T, the sampling accuracy should be higher than 5 mV, and the single sampling time t c , that is, the preset time period is not less than 1.2 * T.

[0072] In this embodiment, by setting the load current of the switching power supply at the starting time point to the first current and changing its load current to the second current at a certain moment, the load transient process of the switching power supply can be simulated, and the purpose of collecting the output voltage signals of the switching power supply based on the first current and the second current respectively is achieved.

[0073] In one of the embodiments, as Figure 5 shown, predicting the remaining normal working time of the switching power supply according to the voltage overshoot time series and the preset parameter threshold includes steps 502 to 504:

[0074] Step 502: Fit the voltage overshoot time series using a time series fitting algorithm to obtain a fitted curve.

[0075] Among them, the time series fitting algorithm can be a polynomial fitting algorithm and other time series data fitting algorithms, statistical algorithms, or artificial intelligence algorithms. By using the algorithm to fit the voltage overshoot time series, a fitted curve of the voltage overshoot value changing with time can be obtained, and the fitted curve can be represented by a specific expression.

[0076] Step 504: Predict the remaining normal operating time of the switching power supply according to the fitted curve and the preset parameter threshold.

[0077] The preset parameter threshold can be set according to historical experience or adjusted according to measured data. Specifically, it can be a voltage overshoot value threshold. According to the fitted curve and its expression, as well as the preset parameter threshold, the remaining normal operating time of the switching power supply can be predicted.

[0078] In this embodiment, by performing fitting processing on the voltage overshoot time series and combining the preset parameter threshold, the prediction of the remaining normal operating time of the switching power supply can be realized.

[0079] In one of the embodiments, as Figure 6 shown, obtaining the voltage overshoot time series by acquiring multiple voltage overshoot values of the switching power supply within multiple preset time periods according to a preset time sequence includes steps 602 - 606:

[0080] Step 602: Set the load current of the switching power supply at the starting time point to a first current according to a preset time sequence, and collect multiple first voltage signals. And change the load current to a second current at the starting point of the load transient process, and collect multiple second voltage signals.

[0081] Specifically, when the DC - DC switching power supply works for a period of time Δt each time, repeatedly change its load current multiple times, and collect the first voltage signal and the second voltage signal of the switching power supply within a preset time period.

[0082] Step 604: Obtain the voltage overshoot value corresponding to each load transient process according to the first voltage signal and the second voltage signal respectively.

[0083] According to the first voltage signal and the second voltage signal obtained corresponding to each preset time period, calculate the voltage change amount, and sum up the voltage change amounts greater than the preset threshold to obtain the voltage overshoot value corresponding to each preset time period.

[0084] Step 606, arrange the voltage overshoot values corresponding to each load transient process in sequence according to a preset time sequence to obtain the voltage overshoot time series.

[0085] Specifically, the output voltage overshoot time series of the DC-DC switching power supply load transient process can be denoted as ΔV 1 、ΔV 2 、…ΔV n 。

[0086] In this embodiment, by changing the load current of the switching power supply from the first current to the second current multiple times when the load current of the switching power supply is the first current, the load transient process can be simulated multiple times, multiple voltage overshoot values can be obtained, and the voltage overshoot sequence can be obtained.

[0087] In one embodiment, the fault prediction method for the switching power supply includes steps 702 - step 710:

[0088] Step 702, set the switching power supply to work at normal temperature and connected to a load at the starting point of a preset time period, with the initial load current being the first current I 1 ,at a certain moment T 0 ,change the load current to the second current I 2 ,and start collecting the output voltage signal V from the starting point of the preset time period until the load transient process ends.

[0089] Among them, if the duration of the load transient process is T, the sampling frequency should be higher than 5 / T, the sampling accuracy should be higher than 5 mV, and the single acquisition time t c should not be lower than 1.2T. Preferably, I 1 >0.5I f ,I f is the full-load current, I 2 <I 1 ,and preferably ΔI = I 1 -I 2 ≥0.5I f 。

[0090] In addition, the initial load current can also be set to I 2 ,preferably I 2 <0.5I f ,I f is the full-load current. At a certain moment T 0 ,change the load current to I 1 (I 1 >I 2 ,and preferably ΔI = I 1 -I 2 ≥0.5I f )。

[0091] Step 704, calculate the voltage overshoot value ΔV during the load transient process according to the output voltage signal.

[0092] Specifically, for the collected data sequence voltage signal V, calculate the change amount ΔV between adjacent points (the voltage corresponding to the latter moment minus the voltage corresponding to the previous moment) x (x = 1, 2, 3,... N), then the output voltage overshoot value ΔV = ΣΔV x (ΔV xth < ΔVx, x = 1, 2, 3,... N). Wherein, ΔV xth is a change amount judgment threshold greater than 0, and the initial value can be set manually and then modified according to the actual measurement value.

[0093] Step 706, obtain the output voltage overshoot time sequence of the switching power supply load transient process.

[0094] Every time the DC-DC switching power supply works for a period of time Δt, repeat the steps 702 - step 704 to obtain the output voltage overshoot time sequence of the DC-DC switching power supply load transient process, denoted as ΔV 1 、ΔV 2 、…ΔV n .

[0095] Step 708, fit the output voltage overshoot time sequence to obtain a fitting curve.

[0096] Among them, methods such as polynomial fitting algorithm, statistical algorithm, artificial intelligence algorithm, etc. can be used to fit the output voltage overshoot value time sequence of the DC-DC switching power supply load transient process to obtain a fitting curve, and the fitting curve can be expressed by a specific expression.

[0097] Step 710, calculate the remaining normal working time of the switching power supply according to the preset voltage overshoot threshold and the fitting curve.

[0098] Determine the output voltage overshoot threshold of the load transient process in the fault state of the DC-DC switching power supply as ΔV according to historical experience failure , combined with the fitting curve and the voltage overshoot threshold ΔV failure The remaining normal working time of the switching power supply can be calculated.

[0099] In this embodiment, by changing the load current of the switching power supply multiple times and obtaining the output voltage signal, calculating the voltage overshoot time sequence according to the output voltage signal, fitting the voltage overshoot time sequence, and analyzing in combination with the preset voltage overshoot threshold, the detection parameters are few, and the detection can be carried out in the no-load state when the switching power supply is turned on, and the service life of all DC-DC switching power supplies using aluminum electrolytic capacitors for filtering can be predicted.

[0100] It should be understood that although the steps in the flowcharts involved in the above-described embodiments are sequentially shown according to the indications of the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless there is a clear indication in this document, there is no strict order restriction for the execution of these steps, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-described embodiments may include multiple steps or multiple stages. These steps or stages are not necessarily executed at the same moment, but can be executed at different moments. The execution order of these steps or stages is not necessarily sequential, but can be executed alternately or in turn with at least a part of other steps or steps or stages in other steps.

[0101] Based on the same inventive concept, an embodiment of the present application further provides a switching power supply fault prediction device for implementing the above-mentioned switching power supply fault prediction method. The solution provided by this device to solve the problem is similar to the solution described in the above method. Therefore, the specific limitations in one or more embodiments of the following switching power supply fault prediction device can refer to the limitations on the switching power supply fault prediction method in the above text, and will not be repeated here.

[0102] In one embodiment, as Figure 8 shown, a switching power supply fault prediction device is provided, including a signal acquisition module 802, a voltage overshoot acquisition module 804, a time series acquisition module 806, and a prediction module 808, where:

[0103] The signal acquisition module 802 is configured to acquire a plurality of voltage signals of the switching power supply within a preset time period, where the start time point of the preset time period is earlier than the start point of the load transient process, and the end time point of the preset time period is later than the end point of the load transient process.

[0104] The voltage overshoot acquisition module 804 is configured to acquire a voltage overshoot value according to the plurality of voltage signals.

[0105] The time series acquisition module 806 is configured to acquire the plurality of voltage overshoot values of the switching power supply within a plurality of the preset time periods according to a preset time sequence, and obtain a voltage overshoot time series.

[0106] The prediction module 808 is configured to predict the remaining normal working time of the switching power supply according to the voltage overshoot time series and a preset parameter threshold.

[0107] In this embodiment, a plurality of voltage signals of the switching power supply are acquired by the signal acquisition module, the voltage overshoot acquisition module acquires the voltage overshoot value based on the voltage signals, the time series acquisition module acquires the voltage overshoot sequence according to a preset time sequence, and the prediction module predicts the remaining normal operating time of the switching power supply according to the voltage overshoot sequence and the preset parameter threshold, so as to perform non-invasive degradation feature detection and fault prediction on the DC-DC switching power supply.

[0108] In one embodiment, the signal acquisition module 802 is configured to acquire a plurality of voltage signals of the switching power supply within a preset time period, including:

[0109] Set the load current of the switching power supply at the starting time point to the first current, and collect a plurality of first voltage signals of the switching power supply between the starting time point and the starting point of the load transient process.

[0110] Change the load current to the second current at the starting point of the load transient process, and collect a plurality of second voltage signals of the switching power supply between the starting point of the load transient process and the ending time point, where the second current is less than the first current; the plurality of voltage signals include a plurality of first voltage signals and a plurality of the second voltage signals.

[0111] In one embodiment, the voltage overshoot acquisition module 804 is configured to acquire the voltage overshoot value according to the plurality of voltage signals, including:

[0112] Obtain the voltage change amount between every two adjacent voltage signals according to the plurality of voltage signals, where the voltage change amount is the change amount of the voltage signal corresponding to the later moment relative to the voltage signal corresponding to the previous moment.

[0113] Screen out the target change amount, where the target change amount is the voltage change amount greater than the preset threshold.

[0114] Sum up the target change amounts to obtain the voltage overshoot value.

[0115] In one embodiment, the time series acquisition module 806 is configured to acquire the plurality of voltage overshoot values of the switching power supply within a plurality of the preset time periods according to a preset time sequence to obtain a voltage overshoot time series, including:

[0116] Repeat setting the load current of the switching power supply at the starting time point to the first current according to a preset time sequence, and collect a plurality of the first voltage signals, and change the load current to the second current at the starting point of the load transient process, and collect a plurality of the second voltage signals.

[0117] Obtain the voltage overshoot value corresponding to each load transient process according to the first voltage signal and the second voltage signal respectively.

[0118] Arrange the voltage overshoot values corresponding to each load transient process in sequence according to a preset time sequence to obtain the voltage overshoot time series.

[0119] In one embodiment, the prediction module 808 is configured to predict the remaining normal operating time of the switching power supply according to the voltage overshoot time series and a preset parameter threshold, including:

[0120] Use a time series fitting algorithm to fit the voltage overshoot time series to obtain a fitting curve.

[0121] Predict the remaining normal operating time of the switching power supply according to the fitting curve and the preset parameter threshold.

[0122] Each module in the above-mentioned switching power supply fault prediction device can be implemented in whole or in part by software, hardware, and their combination. The above-mentioned modules can be embedded in the processor in the computer device in hardware form or be independent of it, or can be stored in the memory in the computer device in software form, so as to facilitate the processor to call and execute the operations corresponding to the above-mentioned modules.

[0123] In one embodiment, a computer device is provided. The computer device can be a terminal, and its internal structure diagram can be as Figure 9 shown. The computer device includes a processor, a memory, a communication interface, a display screen, and an input device connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, NFC (Near Field Communication), or other technologies. The computer program, when executed by the processor, implements a switching power supply fault prediction method. The display screen of the computer device can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covering the display screen, or a button, a trackball, or a touchpad provided on the housing of the computer device, or an external keyboard, touchpad, or mouse, etc.

[0124] Those skilled in the art can understand, Figure 9The structure shown is only a block diagram of some structures related to the solution of this application, and does not constitute a limitation on the computer device to which the solution of this application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine some components, or have different component arrangements.

[0125] In one embodiment, a computer device is further provided, including a memory and a processor. A computer program is stored in the memory, and when the processor executes the computer program, the steps in the above method embodiments are implemented.

[0126] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0127] In one embodiment, a computer program product is provided, including a computer program. When the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0128] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, database, or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memories. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc. The databases involved in the embodiments provided in the present application can include at least one of relational databases and non-relational databases. Non-relational databases can include distributed databases based on blockchain, etc., without limitation. The processors involved in the embodiments provided in the present application can be general-purpose processors, central processors, graphics processors, digital signal processors, programmable logic devices, data processing logics based on quantum computing, etc., without limitation.

[0129] The technical features of the above embodiments can be combined arbitrarily. For the sake of concise description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope recorded in this specification.

[0130] The above-described embodiments merely represent several implementation manners of the present application. The description is relatively specific and detailed, but it should not be construed as a limitation on the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A method for predicting the failure of a switching power supply, characterized in that, the method includes: Obtain a plurality of voltage signals of the switching power supply within a preset time period, wherein the starting time point of the preset time period is earlier than the starting point of the load transient process, and the ending time point of the preset time period is later than the ending point of the load transient process; Obtain the voltage change amount between every two adjacent voltage signals according to the plurality of voltage signals, wherein the voltage change amount is the change amount of the voltage signal corresponding to the later moment relative to the voltage signal corresponding to the previous moment; the voltage signal output by the switching power supply is a continuous signal, and the sampled signal is an output voltage signal sequence, and subtract the voltage corresponding to the previous moment from the voltage corresponding to the later moment in the output voltage signal sequence to obtain a plurality of voltage change amounts; Screen out the target change amount, where the target change amount is the voltage change amount greater than the preset threshold; Sum up each of the target change amounts to obtain a voltage overshoot value; Obtain a plurality of the voltage overshoot values of the switching power supply within a plurality of the preset time periods according to a preset time sequence to obtain a voltage overshoot time series; Predict the remaining normal operating time of the switching power supply according to the voltage overshoot time series and a preset parameter threshold.

2. The method according to claim 1, characterized in that, the obtaining of a plurality of voltage signals of the switching power supply within a preset time period includes: Set the load current of the switching power supply at the starting time point to a first current, and collect a plurality of first voltage signals of the switching power supply between the starting time point and the starting point of the load transient process; Change the load current to a second current at the starting point of the load transient process, and collect a plurality of second voltage signals of the switching power supply between the starting point of the load transient process and the ending time point, wherein the second current is less than the first current; the plurality of voltage signals include a plurality of first voltage signals and a plurality of the second voltage signals.

3. The method according to claim 2, characterized in that, the sampling frequency of the voltage signal is greater than 5 times the reciprocal of the duration of the load transient process; the preset time period is greater than or equal to 1.2 times the duration of the load transient process.

4. The method according to claim 1, characterized in that, the predicting of the remaining normal operating time of the switching power supply according to the voltage overshoot time series and a preset parameter threshold includes: Use a time series fitting algorithm to fit the voltage overshoot time series to obtain a fitting curve; Predict the remaining normal operating time of the switching power supply according to the fitting curve and a preset parameter threshold.

5. The method according to claim 4, characterized in that, the time series fitting algorithm includes a polynomial fitting algorithm.

6. The method according to claim 2, characterized in that, the obtaining of a plurality of the voltage overshoot values of the switching power supply within a plurality of the preset time periods according to a preset time sequence to obtain a voltage overshoot time series includes: Repeatably set the load current of the switching power supply at the starting time point as the first current according to a preset time sequence, collect a plurality of the first voltage signals, and change the load current to the second current at the starting point of the load transient process, and collect a plurality of the second voltage signals; Obtain the voltage overshoot value corresponding to each load transient process according to the first voltage signal and the second voltage signal respectively; Arrange the voltage overshoot values corresponding to each load transient process in sequence according to a preset time sequence to obtain the voltage overshoot time series.

7. A switching power supply fault prediction device, characterized in that, the device includes: a signal acquisition module, configured to acquire a plurality of voltage signals of the switching power supply within a preset time period, wherein the starting time point of the preset time period is earlier than the starting point of the load transient process, and the ending time point of the preset time period is later than the ending point of the load transient process; a voltage overshoot acquisition module, configured to obtain the voltage change amount between every two adjacent voltage signals according to a plurality of voltage signals, wherein the voltage change amount is the change amount of the voltage signal corresponding to the later moment relative to the voltage signal corresponding to the previous moment; the voltage signal output by the switching power supply is a continuous signal, and the sampled signal is an output voltage signal sequence, and subtract the voltage corresponding to the previous moment from the voltage corresponding to the later moment in the output voltage signal sequence to obtain a plurality of voltage change amounts; screen out the target change amount, and the target change amount is the voltage change amount greater than a preset threshold; sum up each target change amount to obtain the voltage overshoot value; a time series acquisition module, configured to obtain a plurality of the voltage overshoot values of the switching power supply within a plurality of the preset time periods according to a preset time sequence to obtain a voltage overshoot time series; a prediction module, configured to predict the remaining normal working time of the switching power supply according to the voltage overshoot time series and a preset parameter threshold.

8. A computer device, including a memory and a processor, and the memory stores a computer program, characterized in that, when the processor executes the computer program, the steps of the method according to any one of claims 1 to 6 are implemented.

9. A computer-readable storage medium, on which a computer program is stored, characterized in that, when the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

10. A computer program product, including a computer program, characterized in that, when the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

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