A dual-station test fixture

By designing a dual-station test fixture and utilizing a dual-station loading mechanism driven by a lifting cylinder and a telescopic cylinder, board inspection and serial number scanning are automatically completed, solving the safety hazards and time waste of existing fixtures and achieving an efficient and safe testing process.

CN114397488BActive Publication Date: 2025-09-12FLEXTRONICS ELECTRONICS TECH SUZHOU
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Patent Information

Application Number
CN202210041569.7
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-01-14
Publication Date
2025-09-12
Estimated Expiration
2042-01-14

AI Technical Summary

Technical Problem

Existing test fixtures pose safety risks during the board placement process and waste test time, resulting in low efficiency.

Method used

A dual-station test fixture is designed, which adopts a dual-station loading mechanism driven by a lifting cylinder and a telescopic cylinder to realize automatic fixture opening and closing. Combined with sliding guide rails and positioning guide pillars, it automatically completes board detection and serial number scanning.

Benefits of technology

Improved work efficiency, reduced safety risks, fully utilized fixture testing time, and increased output by 40%.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention discloses a dual-station test fixture, comprising: a base, a cover, a safety grating, an emergency stop button, an operating button, a support frame, a lifting cylinder, a lifting frame, a needle plate, a positioning guide post, a test probe, and a dual-station loading mechanism. The cover, the emergency stop button, and the operating button are arranged on the base, the cover is provided with a loading port, and the safety grating is arranged on both sides of the loading port. Through the above method, the dual-station test fixture of the present invention can automatically open and close the fixture, improving work efficiency and safety. Moreover, during the test process, the operator can place the next board and complete the action of scanning the serial number at the same time, making full use of the fixture's testing time and increasing output by 40%.
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Description

Technical Field

[0001] The present invention relates to the technical field of electronic industry testing, and in particular to a double-station testing fixture. Background Art

[0002] Currently, when using a test fixture for product testing, the operator needs to place the tested board in the test completion area, and then place the second test board into the fixture for testing after scanning the barcode. However, manual operation has the following problems:

[0003] 1. Since the board is still in the fixture after the test is completed, you need to use the left hand to open the fixture with a quick clamp and use the right hand to pick up and place the board. However, there will be a needle plate or pressure rod on the upper cover of the fixture, and the gap between the needle plate and the product is limited. During the process of taking and placing the board, if you are not careful, the employee will be scratched by the needle, and it will also affect the time of taking the board to the fixture.

[0004] 2. Because this is a single-station test fixture, after completing the test, the operator needs to use a quick-release clamp with their left hand to open the fixture, remove the board with their right hand, and place it in the board storage area. They then take a new board, place it in the fixture, scan the serial number, and then test it. The entire process takes about 15 seconds. During this entire 15-second period, the test machine is idle and inactive. The test time for a single board is less than 40 seconds, meaning that 35% of the entire test time is wasted. Summary of the Invention

[0005] The main technical problem solved by the present invention is to provide a dual-station test fixture with the advantages of high reliability, precise positioning, compact structure, etc., and at the same time has broad market prospects in the application and popularization of electronic industry test equipment.

[0006] In order to solve the above technical problems, a technical solution adopted by the present invention is:

[0007] A double-station test fixture is provided, which includes: a base, a support frame, a lifting cylinder, an upper needle plate, a positioning guide column, a test probe, and a double-station loading mechanism.

[0008] The double-station loading mechanism is arranged on the top of the base, the support frame is connected to the base, the lifting cylinder is arranged on the support frame above the double-station loading mechanism, and drives the upper needle plate to move up and down, and the upper needle plate is provided with the positioning guide column and the test probe that contacts or connects with the product.

[0009] The double-station loading mechanism includes a telescopic cylinder, a sliding guide rail, a sliding seat, a loading plate, a contoured positioning groove, and a positioning hole. The top surface of the base is provided with the sliding guide rail, and multiple sliding seats are slidably connected to the sliding guide rail. The telescopic cylinder drives all the sliding seats to reciprocate synchronously on the sliding guide rail. The loading plate is elastically arranged on the sliding seat. The contoured positioning groove for placing the product to be inspected and the positioning hole connected to the positioning guide column are arranged on the loading plate.

[0010] In a preferred embodiment of the present invention, a cover, an emergency stop button and an operation button are provided on the base.

[0011] In a preferred embodiment of the present invention, a feeding port is provided on the cover body, and safety gratings are provided on both sides of the feeding port.

[0012] In a preferred embodiment of the present invention, the upper needle plate is connected to the lifting cylinder via a lifting frame.

[0013] In a preferred embodiment of the present invention, the top surface of the base is provided with a sliding opening for allowing the telescopic cylinder to extend and slide.

[0014] In a preferred embodiment of the present invention, the telescopic cylinder is arranged on a base below the sliding opening.

[0015] In a preferred embodiment of the present invention, the material carrying plate is connected to the sliding seat via an elastic mechanism.

[0016] The beneficial effects of the present invention are: the fixture can be opened and closed automatically, which improves work efficiency and safety. Moreover, during the test process, the operator can place the next board and complete the action of scanning the serial number at the same time, making full use of the fixture test time and increasing the output by 40%. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for describing the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. Those skilled in the art can also derive other drawings based on these drawings without inventive work, among which:

[0018] Figure 1 This is a structural diagram of a preferred embodiment of a dual-station test fixture of the present invention;

[0019] Figure 2 It is a structural schematic diagram of a preferred embodiment of a dual-station test fixture of the present invention. DETAILED DESCRIPTION

[0020] The following is a clear and complete description of the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0021] See also Figure 1-2 , embodiments of the present invention include:

[0022] A double-station test fixture, whose structure includes: a base 1, a cover 2, a safety grating, an emergency stop button 4, an operating button 5, a support frame 6, a lifting cylinder 7, a lifting frame 8, an upper needle plate 9, a positioning guide column 10, a test probe 11, and a double-station loading mechanism. The cover, the emergency stop button and the operating button are arranged on the base, the cover is provided with a loading port, and the safety grating is arranged on both sides of the loading port.

[0023] The double-station loading mechanism is arranged on the top of the base, the support frame is connected to the base, the lifting cylinder is arranged on the support frame above the double-station loading mechanism, the lifting frame is connected to the lifting cylinder, the upper needle plate is fixedly arranged on the bottom surface of the lifting frame, and the upper needle plate is provided with a plurality of positioning guide columns and the test probe that contacts or connects with the product. The lifting cylinder drives the upper needle plate and the test probe to move up and down for detection.

[0024] The double-station loading mechanism includes a telescopic cylinder, a sliding guide rail 13, a sliding seat 14, a loading plate 15, a contoured positioning groove 16, and a positioning hole 17. The top surface of the base is provided with a sliding opening. The sliding guide rail is arranged on one side or both sides of the sliding opening. Two or more sliding seats are movably connected to the sliding guide rail through sliders. The telescopic cylinder is arranged on the base below the sliding opening, and its output end is connected to the sliding seat to drive all sliding seats to reciprocate synchronously on the sliding guide rail. The loading plate is connected to the sliding seat through elastic mechanisms such as springs, spring pins / bolts, etc. The contoured positioning groove for placing the product to be inspected and the positioning hole connected to the positioning guide column are arranged on the loading plate.

[0025] When used for the first time, the telescopic cylinder moves, causing two or more sliding seats to move to the outside of the upper needle plate; the operator places the product in each contoured positioning slot and scans the serial number of the product close to the upper needle plate; the telescopic cylinder drives the sliding seat to move, causing a loading plate to move to the inspection station below the upper needle plate; the lifting cylinder drives the upper needle plate to descend, allowing the detection probe to inspect the product, and at the same time, the operator scans the serial number of the product to be inspected; after the inspection is completed, the lifting cylinder drives the upper needle plate and the probe to rise; the telescopic cylinder drives the sliding seat to move, causing the inspected product to leave the inspection station, and at the same time, another product to be inspected is moved to the inspection station; the lifting cylinder repeats the above inspection operation, and the operator removes the inspected product and puts in a new product to be inspected, and scans its serial number. In this way, the operator does not need to reach into the fixture to pick up and place the product to avoid the risk of being hit or scratched by the probe, and the idle time of the test fixture can be minimized.

[0026] The beneficial effects of the dual-station test fixture of the present invention are:

[0027] 1. No need to manually pull the quick clamp to open and close the clamp, which improves work efficiency;

[0028] 2. Employees do not need to put their palms into the clamp when placing products, which avoids the risk of palm injuries and improves safety;

[0029] 3. During the test process, the operator can place the next board and scan the serial number at the same time, making full use of the fixture's test time and increasing output by 40%.

[0030] The above descriptions are merely embodiments of the present invention and are not intended to limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made using the contents of the present invention specification, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A dual-station test fixture, characterized in that: include: Base, support frame, lifting cylinder, upper needle plate, positioning guide column, test probe, double-station loading mechanism, The double-station loading mechanism is arranged on the top of the base, the support frame is connected to the base, the lifting cylinder is arranged on the support frame above the double-station loading mechanism, and drives the upper needle plate to move up and down, and the upper needle plate is provided with the positioning guide column and the test probe that contacts or connects with the product. The double-station loading mechanism includes a telescopic cylinder, a sliding guide rail, a sliding seat, a loading plate, a contoured positioning groove, and a positioning hole. The sliding guide rail is provided on the top surface of the base, and multiple sliding seats are slidably connected to the sliding guide rail. The telescopic cylinder drives all the sliding seats to reciprocate synchronously on the sliding guide rail. The loading plate is elastically arranged on the sliding seat, and the contoured positioning groove for placing the product to be inspected and the positioning hole connected to the positioning guide column are arranged on the loading plate; a cover, an emergency stop button and an operation button are provided on the base, and the upper needle plate is connected to the lifting cylinder through a lifting frame.

2. A dual-station test fixture according to claim 1, characterized in that: The cover body is provided with a feeding port, and safety gratings are provided on both sides of the feeding port.

3. The dual-station test fixture according to claim 1, characterized in that: The top surface of the base is provided with a sliding opening for allowing the telescopic cylinder to extend and slide.

4. A dual-station test fixture according to claim 3, characterized in that: The telescopic cylinder is arranged on a base below the sliding opening.

5. The dual-station test fixture according to claim 1, characterized in that: The material carrying plate is connected to the sliding seat through an elastic mechanism.

Citation Information

Patent Citations

  • Double-station test fixture

    CN217034029U