Spring Contact and Test Socket with Built-in Spring Contact

Abstract

The present invention relates to a test socket with a thin structure and a spring contact applicable thereto, which can improve the decline in the self-durability of the contact, has excellent electronic characteristics in processing high-speed signals, and can extend the service life. The test socket of the present invention includes a plurality of spring contacts, the plurality of spring contacts having an upper contact pin (110), a lower contact pin (120) cross-assembled with the upper contact pin (110) and capable of linear operation with each other, and a helical spring (130) elastically supporting the upper contact pin (110) and the lower contact pin (120); a main board formed with a plurality of receiving holes (1111) for receiving and arranging each spring contact (100), and formed with a first opening (1113) having a diameter (d2) smaller than the diameter (d1) of each receiving hole (1111), so that each upper contact pin (110) is supported by a stepped portion (1112) protruding from the upper opening end of each receiving hole (1111) and horizontally formed; a membrane board provided below the main board (1110) and having a second opening (1121), the second opening (1121) being formed at a position corresponding to each receiving hole (1111), having a diameter (d3) smaller than the diameter (d1) of the receiving hole (1111) and supporting each lower contact pin (120).

Description

Technical Field

[0001] The present invention relates to a spring contact and a test socket with a built-in spring contact. More specifically, it relates to a spring contact for electrically connecting one-to-one multiple terminals (leads) provided on an IC for testing a semiconductor device (IC) to pads (PADs) on a PCB, or for electrically connecting a PCB inside an electronic product such as a personal computer (PC) or a mobile phone to the terminals (leads) of an IC of a CPU, and a test socket with the spring contact built therein. Background Art

[0002] Generally, a spring contact functions to electrically connect a PCB to the terminals of an IC and is a core component of a socket for testing an IC.

[0003] Figures 1 to 3 The spring contact of the prior art is shown. Figure 4 and Figure 5 The socket with the spring contact built therein is shown.

[0004] Figure 1 (a) and (b) of are respectively a three-dimensional configuration diagram and an exploded three-dimensional configuration diagram of the spring contact of the prior art. The spring contact includes: an upper contact pin 10, a lower contact pin 20 assembled to cross the upper contact pin 10 in the length direction, and a spring 30 inserted between the upper contact pin 10 and the lower contact pin 20 to elastically support the upper contact pin 10 and the lower contact pin 20.

[0005] Figure 2 (a) and (b) of are respectively a plan configuration diagram of the upper contact pin of the prior art and a sectional configuration diagram taken along line A-A. The upper contact pin 10 includes a contact portion 11 protruding from the upper end, a pair of fixing protrusions 12 protruding from the left and right, a main body portion 13 provided with a floating groove 13a recessed in the length direction, a pair of elastic portions 14 symmetrically extended from the left and right of the main body portion 13, and locking protrusions 15 provided at the front ends of the respective elastic portions 14. In addition, the lower contact pin has the same shape as the upper contact pin.

[0006] Figure 3 (a) and (b) of respectively show working examples of the spring contact of the prior art. The left and right sides of (a) show before and after the spring is compressed, and the left and right sides of (b) show the positions between the upper contact pin and the lower contact pin before and after the spring is compressed.

[0007] Refer to Figure 3, the upper contact pin 10 and the lower contact pin 20 are inserted into the spring 30, and the elastic parts 14 and 24 are assembled orthogonally to each other in the length direction. Specifically, the locking protrusion 15 of the upper contact pin 10 is inserted into the floating groove 23a of the lower contact pin 20, and the locking protrusion 24 of the lower contact part 20 is inserted into the floating groove 13a of the upper contact pin 10. Therefore, when an external force acts in the length direction of the spring contact, the locking protrusions 15 and 25 move along the floating grooves 13a and 23a, and the upper contact pin 10 and the lower contact pin 20 are compressed by a certain length S.

[0008] See Figure 3 (b) of, the maximum variable (Smax) between the upper contact pin 10 and the lower contact pin 20 depends on the support positions (left side in the figure) of the locking protrusions 15 and 25 of the upper contact pin 10 and the lower contact pin 20 at the front ends of the opposing floating grooves 13a and 23a in the state before spring compression, and the positions (right side in the figure) where the end portions 13b and 23b of the main body portions 13 and 23 of the upper contact pin 10 and the lower contact pin 20 contact each other in the spring compression state.

[0009] Figure 4 is a plan configuration diagram of a prior art socket, Figure 5 is Figure 4 a sectional configuration diagram taken along line B - B of

[0010] See Figure 4 and Figure 5 , the prior art socket includes: an upper side plate 40, a lower side plate 50 sleeved and assembled with the upper side plate 40, and a spring contact 1 is fixed between the upper side plate 40 and the lower side plate 50. The upper side plate 40 and the lower side plate 50 are respectively formed with receiving holes 41 and 51 for fixedly arranging the spring contact 1. The spring contact 1 is located in the receiving holes 41 and 51 between the upper side plate 40 and the lower side plate 50, and the upper end portion and the lower end portion protrude outward from the receiving holes 41 and 51 to electrically connect the terminals of the IC and the pads of the PCB.

[0011] The upper side plate and the lower side plate of this prior art socket are made of synthetic resin. In particular, the upper side plate 40 has a flange portion 42 that protrudes from the upper side plate 40 by a predetermined height and is formed with a first receiving hole 41 in order to receive and arrange the spring contact 1 of a predetermined height.

[0012] Therefore, when manufacturing such a thin - plate - type plate with a flange portion formed with a first receiving hole by injection molding of synthetic resin, the processing cost is high, and there is a limit in processing the thickness of the plate to less than 1.0 mm. Therefore, it is difficult to manufacture a high - speed test socket for processing high - speed signals of 40 GHz or higher.

[0013] In addition, as another prior art, there is a rubber-type socket, which includes: a stretchable insulating body formed by curing insulating silica powder, and a conductive silica portion vertically penetrating the insulating body corresponding to the terminals of the device.

[0014] For such a rubber-type socket, a silica mixture obtained by mixing insulating silica and conductive powder in a predetermined ratio is placed in a mold, and in the case of forming a strong magnetic field at the position where the conductive silica portion is to be arranged, the conductive powder of the silica mixture is aggregated to the magnetic field forming position, and finally the cured and melted silica mixture forms a conductive silica portion arranged in a predetermined pattern on the insulating body.

[0015] Such a rubber-type socket has defects that the elastic induction speed is slower than that of a needle-type contact (spring contact), and the elasticity is lost during repeated tests, resulting in a significant reduction in service life. Therefore, the short service life and frequent replacement will increase the cost. And due to the characteristic that the elastic persistence decreases with time, when performing continuous compression tests for a long time (more than one week), the elastic repulsive force will become zero or significantly decrease, resulting in a short circuit, so it is difficult to use in the case of long-term tests.

[0016] Moreover, the rubber-type socket has the problem that the elastic characteristics are greatly affected by temperature, and there is also a defect that the resistance characteristic uniformity of individual conductive silica portions decreases.

[0017] Prior art documents

[0018] Patent documents

[0019] Patent Document 1: Korean Patent Publication No. 10-2011-0051668 (Publication Date: May 2011) Summary of the invention

[0020] Problems to be solved by the invention

[0021] The present invention aims to improve the problems of such prior art, and aims to provide a socket with a thin structure that can improve the decline in the durability of the contact itself, has excellent electrical characteristics in processing high-speed signals, and can extend the service life, and a spring contact applicable thereto.

[0022] Means for solving the problems

[0023] The test socket according to one aspect of the present invention includes: a plurality of spring contacts, each including an upper contact pin, a lower contact pin that is cross-assembled with the upper contact pin and can linearly operate with each other, and a helical spring that elastically supports the upper contact pin and the lower contact pin; a main board formed with a plurality of receiving holes for receiving and arranging each of the spring contacts, and formed with first openings each having a diameter (d2) smaller than the diameter (d1) of each of the receiving holes, so that each of the upper contact pins is supported by a stepped portion that protrudes from the upper open end of each of the receiving holes and is horizontally formed; and a membrane board provided below the main board and having a second opening formed at a position corresponding to each of the receiving holes, having a diameter (d3) smaller than the diameter (d1) of the receiving hole and supporting each of the lower contact pins.

[0024] Moreover, the test socket according to another aspect of the present invention includes: a plurality of spring contacts, each including an upper contact pin, a lower contact pin that is cross-assembled with the upper contact pin and can linearly operate with each other, and a helical spring that elastically supports the upper contact pin and the lower contact pin; a main board formed with a plurality of receiving holes for receiving and arranging each of the spring contacts, and formed with first openings each having a diameter (d2) smaller than the diameter (d1) of each of the receiving holes, so that each of the upper contact pins is supported by a stepped portion that protrudes from the upper open end of each of the receiving holes; and a silicone caulking portion inserted into the lower open end of each of the receiving holes to fix each of the lower contact pins to the main board.

[0025] The test socket according to still another aspect includes: a plurality of spring contacts, each including an upper contact pin, a lower contact pin that is cross-assembled with the upper contact pin and can linearly operate with each other, and a helical spring that elastically supports the upper contact pin and the lower contact pin; a lower membrane board formed with a plurality of first through-holes for passing through and arranging each of the spring contacts; an assembly portion located above the lower membrane board; an insulating main body portion disposed above the assembly portion and having second through-holes for receiving and arranging the spring contacts corresponding to the first through-holes; an upper membrane board located on the upper surface of the insulating main body portion and having third through-holes formed corresponding to the second through-holes; and a first silicone caulking portion inserted into the upper part of each of the second through-holes of the insulating main body portion to fix each of the upper contact pins to the insulating main body portion.

[0026] A test socket according to another aspect includes: a plurality of cylindrical spring contacts integrally formed by rolling a metal plate with a strip pattern formed by stamping into a cylindrical shape; a lower membrane plate formed with a plurality of first through holes for penetrating and arranging each of the spring contacts; an assembly part located above the lower membrane plate; an insulating main body part arranged above the assembly part and having second through holes for receiving and arranging the spring contacts corresponding to the first through holes; an upper membrane plate located on the upper surface of the insulating main body part and having third through holes formed corresponding to the second through holes; and a first silicone caulking part inserted into the upper part of each of the second through holes of the insulating main body part to fix the upper ends of the spring contacts to the insulating main body part.

[0027] A spring contact according to one aspect of the invention includes: a first contact pin, a second contact pin cross-assembled with the first contact pin, and a helical spring elastically supporting the first contact pin and the second contact pin. Among them, the first contact pin and the second contact pin respectively include: a main body part with grooves recessed along the length direction formed on both sides; a pair of shoulder protrusion parts respectively protruding from the left and right side ends of the main body part to support the helical spring; a first end contact part extending from the upper end of the main body part; a pair of elastic parts symmetrically extending along the length direction of the main body part and respectively having guiding surfaces protruding inward from the ends of the elastic parts and facing each other; and a second end contact part formed by a plate-shaped strip and protruding at the front ends of the elastic parts. Among them, at least any one of the first contact pin and the second contact pin has a head formed at the upper end of the main body part. The strip has the same length on the left and right with respect to the center of the main body part. The first end contact part is formed at the upper end of the main body part. The strip includes: a first strip part located in the same plane as the main body part and set to have the same distance from the center of the main body part on the left and right, and a second strip part rolled from both ends of the first strip part and in a semi-circular arc shape. The first strip part is located in the diameter direction of the cylindrical shape formed by the entire second strip part.

[0028] Advantages of the Invention

[0029] The test socket of the present invention has a structure with built-in spring contacts and can be manufactured into a thin structure with a relatively thin thickness, thus having excellent electrical characteristics in processing high-speed signals and being able to extend the service life.

[0030] Moreover, the spring contact of the present invention has a structure suitable for a thin test socket and takes into account the form of the terminals of the device, thus having the effect of being able to reduce the contact resistance. Description of the Drawings

[0031] Figure 1Figs. (a) and (b) are respectively the three-dimensional composition diagram and the exploded three-dimensional composition diagram of the spring contact of the prior art.

[0032] Figure 2 Figs. (a) and (b) are respectively the plan composition diagram of the upper contact pin of the prior art and the sectional composition diagram taken along line A-A.

[0033] Figure 3 Figs. (a) and (b) are respectively schematic diagrams showing the working examples of the spring contact of the prior art.

[0034] Figure 4 is the plan composition diagram of the socket of the prior art.

[0035] Figure 5 is Figure 4 the sectional composition diagram taken along line B-B of

[0036] Figure 6 is the exploded three-dimensional composition diagram of the spring contact of the embodiment of the present invention.

[0037] Figure 7 Figs. (a) and (b) are respectively the plan and side composition diagrams of the upper contact pin of the first embodiment of the present invention.

[0038] Figure 8 Figs. (a), (b), and (c) are schematic diagrams showing the extended state of the spring contact of the first embodiment of the present invention.

[0039] Figure 9 Figs. (a), (b), and (c) are schematic diagrams showing the compressed state of the spring contact of the first embodiment of the present invention.

[0040] Figure 10 Figs. (a), (b), and (c) are schematic diagrams showing the spring contact of the variant of the first embodiment of the present invention.

[0041] Figures 11 to 14 is a schematic diagram showing the spring contact of the second embodiment of the present invention.

[0042] Figure 15 Figs. (a) and (b) are schematic diagrams showing the variant of the second embodiment of the present invention.

[0043] Figures 16 to 18 is a schematic diagram showing the spring contact of the third embodiment of the present invention.

[0044] Figure 19 and Figure 20 are schematic diagrams showing the variant of the third embodiment of the present invention.

[0045] Figure 21 is the plan composition diagram of the test socket of the first embodiment of the present invention.

[0046] Figure 22 is Figure 21 a sectional view composition diagram of the E-E line of

[0047] Figure 23 a sectional view composition diagram of the test socket according to the second embodiment of the present invention.

[0048] Figure 24 a sectional view composition diagram of the test socket according to the third embodiment of the present invention.

[0049] Figure 25 and Figure 26 a sectional view composition diagram of the test socket according to the fourth embodiment of the present invention.

[0050] Figure 27 a sectional view composition diagram of the test socket according to the fifth embodiment of the present invention.

[0051] Figure 28 a sectional view composition diagram of the test socket according to the sixth embodiment of the present invention.

[0052] Figure 29 a sectional view composition diagram of the test socket according to the seventh embodiment of the present invention. Detailed Description of the Preferred Embodiments

[0053] First, the terms and vocabulary used in this specification and the scope of the claims should not be construed in accordance with their ordinary or dictionary meanings. Instead, based on the principle that the inventor can appropriately define the concept of the terms in order to best describe his invention, they should be construed as meanings and concepts consistent with the technical idea of the present invention.

[0054] Therefore, the embodiments described in this specification and the configurations shown in the accompanying drawings are only one of the most preferred embodiments of the present invention and do not represent all the technical ideas of the present invention. Therefore, it should be understood that there can be various equivalents and variations that can replace one or more exemplary embodiments.

[0055] Hereinafter, the embodiments of the present invention will be described in detail with reference to the accompanying drawings.

[0056] First Embodiment

[0057] Figure 6 is an exploded three-dimensional composition diagram of the spring contact according to the first embodiment of the present invention. The spring contact 100 of this embodiment includes an upper contact pin 110, a lower contact pin 120 cross-assembled with the upper contact pin 110, and a spring 130 that elastically supports the upper contact pin 110 and the lower contact pin 120.

[0058] In particular, the upper contact pin 110 and the lower contact pin 120 of the present invention are provided by contact pins having the same size and shape. The two contact pins 110 and 120 assembled crosswise in the length direction are distinguished as upper and lower according to the assembly position. Therefore, in the following description, the upper contact pin 110 will be taken as the center for explanation.

[0059] The spring 130 is provided by a coil-type compression spring that resists compressive force, and is disposed between the upper contact pin 110 and the lower contact pin 120. When the upper contact pin 110 and the lower contact pin 120 are compressed in the length direction, the spring 130 provides a restoring force for restoring the upper contact pin 110 and the lower contact pin 120 to their original positions.

[0060] Figure 7 Figures (a) and (b) are respectively the plan view and side view constitution diagrams of the upper contact pin of the first embodiment of the present invention.

[0061] See Figure 7 , the upper contact pin 110 of the present embodiment is provided by a contact pin having a plate-like structure with a predetermined length L1, width w1, and thickness t1. Specifically, the upper contact pin 110 includes a main body portion 112 having grooves 111 recessed in the length direction formed on both sides, shoulder protrusion portions 113 vertically protruding from the left and right side ends of the main body portion 112, a pair of first end contact portions 114 integrally extended symmetrically on both sides of the upper end of the main body portion 112 across the groove 111, a pair of elastic portions 115 symmetrically extended in the length direction of the main body portion 112, second end contact portions 116 formed at the front ends of the respective elastic portions 115, and guiding surfaces 117 protruding inward and opposite from the respective ends of the elastic portions 115.

[0062] Grooves 111 are provided on both sides of the main body portion 112, recessed along the central axis with a predetermined width and depth in the length direction. The upper end of the groove 111 opens to the upper end of the main body portion 112, and the lower end includes a hook locking step 111a having a step. The main body portion 112 has a predetermined thickness t1 as a whole, and the thickness t2 of the groove portion of the main body portion 112 where the groove 111 is formed is thinner (t2 < t1).

[0063] The main body portion 112 is provided with a pair of shoulder protrusion portions 113 extended and protruding to the left and right side ends, and the shoulder protrusion portions 113 support the spring. In addition, the maximum width of the upper contact pin 110 depends on the width w1 between the two shoulder protrusion portions 113.

[0064] The first terminal contact part 114 is integrally extended symmetrically left and right at the upper end of the main body part 112. Preferably, the first terminal contact part 114 includes an edge line formed by the joining of two different contact surfaces. In this embodiment, it is shown that in the first terminal contact part 114, the first contact surfaces 114a and 114b formed by two curved surfaces are joined to form an upper edge line. Here, the contact surface can be a curved surface with a predetermined curvature or an inclined surface with a predetermined angle. Such a first terminal contact part 114 contacts the terminal wire of the IC.

[0065] The elastic parts 115 are arranged symmetrically left and right in such a way that they are spaced apart by a predetermined width w2 along the length direction of the main body part 112. The ends of the respective elastic parts 115 have guide surfaces 117 that protrude inward and face each other. The bent ends 117a extending from the ends of the elastic parts 115 to the guide surfaces 117 function as hooks that limit the up and down movement between the two contact pins.

[0066] Therefore, the width w3 between the guide surfaces 117 of the respective elastic parts 115 is smaller than the width w2 between the two elastic parts 115 (w3 < w2). Preferably, the width w3 between the two guide surfaces 117 is greater than or equal to the thickness t2 of the groove part of the groove 111 of the main body part 112 (t2 ≤ w3). And the width w2 between the two elastic parts 115 is greater than or equal to the thickness t1 of the main body part 112 (t1 ≤ w2).

[0067] When the upper contact pin and the lower contact pin are assembled, the guide surface 117 of the upper contact pin is inserted into the groove of the lower contact pin and the guide surface of the lower contact pin is inserted into the groove 111 of the upper contact pin. Each guide surface contacts the bottom surface of the groove to function as a connection for the upper contact pin and the lower contact pin to conduct electricity.

[0068] At the lower end corners of the main body part 112 adjacent between the two elastic parts 115, there are formed chamfered inclined surfaces 112a with an inclination, so that when the two contact pins are assembled, it is easy to assemble between the elastic parts 115.

[0069] The second terminal contact part 116 is vertically extended from the front ends of the respective elastic parts 115. Preferably, the second terminal contact part 116 includes an edge line formed by the joining of two different contact surfaces. The second terminal contact part 116 shown in this embodiment is formed by the joining of the second contact surfaces 116a and 116b formed by two curved surfaces to form an upper edge line. Here, the contact surface can be a curved surface with a predetermined curvature or an inclined surface with a predetermined angle. Such a second terminal contact part 116 contacts the terminal wire of the IC.

[0070] Preferably, the length L3 of the elastic portion 115 including the second end contact portion 116 is greater than the length L2 from the first end contact portion 114 to the lower end of the main body portion 112 (L2 < L3).

[0071] Figure 8 The (a), (b), and (c) of are schematic diagrams showing the extended state of the spring contact of the first embodiment of the present invention. (a) is a three-dimensional configuration diagram, and (b) and (c) are cross-sectional configuration diagrams in mutually perpendicular directions respectively.

[0072] See Figure 8 , the upper contact pin 110 and the lower contact pin 120 are assembled in the length direction such that the respective elastic portions 115 and 125 cross each other, and the spring 130 is supported by the shoulder protrusions 113 and 123 of the upper contact pin 110 and the lower contact pin 120, so that the upper contact pin 110 and the lower contact pin 120 are maintained in an extended state.

[0073] In the spring contact 100 in the above extended state, the first end contact portion 114 of the upper contact pin 110 is in a state of being exposed from the upper end of the spring 130, while the second end contact portion 126 of the lower contact pin 120 is located inside the spring 130. On the contrary, the first end contact portion 124 of the lower contact pin 120 is in a state of being exposed from the lower end of the spring 130, while the second end contact portion 116 of the upper contact pin 110 is located inside the spring 130.

[0074] Figure 9 The (a), (b), and (c) of are schematic diagrams showing the compressed state of the spring contact of the first embodiment of the present invention. (a) is a three-dimensional configuration diagram, and (b) and (c) are cross-sectional configuration diagrams in mutually perpendicular directions respectively. In Figure 9 In the (b) and (c) of, the upper end plane of the spring contact shows the spherical terminals of the IC, and shows the contact portions of the end contact portions with the spherical terminals.

[0075] See Figure 9 , in the compressed state, the overall height L1 of the spring contact 100 is the same as the height L1 of one contact pin (see Figure 7 ). Here, the first end contact portion 114 of the upper contact pin 110 and the second end contact portion 126 of the lower contact pin 120, which are the upper end portions of the spring contact 100, contact the spherical terminals 1 of the IC simultaneously in the vertical direction at the four positions of 114A and 126A.

[0076] Similarly, the same is true for the lower end portion of the spring contact 100. The second end contact portion 116 of the upper contact pin 110 and the first end contact portion 124 of the lower contact pin 120 contact the terminals (not shown) of the PCB simultaneously.

[0077] As described above, the spring contact 100 of the present invention is in electrical contact with the spherical terminal 1 at four or more positions in the compressed state, and the length L1 of the designed spring contact can be reduced, thereby minimizing the resistance.

[0078] Figure 10 (a), (b), and (c) of are schematic diagrams showing a spring contact of a modified example of the first embodiment of the present invention. (a) is a sectional configuration diagram, (b) is a plan configuration diagram of the upper contact pin, and (c) is a sectional configuration diagram along line D-D. In Figure 10 In (a) of, the upper end of the spring contact is a top view showing the land type terminal 2 of the IC in a planar manner, showing the contact portion between the end contact portion and the terminal.

[0079] See Figure 10 , the spring contact 200 of the present embodiment includes an upper contact pin 210, a lower contact pin 220 cross-assembled with the upper contact pin 210, and a helical spring 230 that elastically supports the upper contact pin 210 and the lower contact pin 120. The upper contact pin 210 and the lower contact pin 220 are usually provided by one contact pin, which is the same as the above embodiment.

[0080] The upper contact pin 210 includes a main body portion 212 formed with grooves 211 on both sides, shoulder protrusion portions 213 extending and protruding from the left and right side ends of the main body portion 212, a pair of elastic portions 215 extending symmetrically in the length direction of the main body portion 112, second end contact portions 216 provided at the ends of the respective elastic portions 215, and a guide surface 217, which is the same as the above embodiment. In particular, in the present embodiment, the upper contact pin 210 has a first end contact portion 214 extending along the central axis.

[0081] The first end contact portion 214 includes two different edge lines formed by joining inclined contact surfaces. Here, the contact surface can be provided by a curved surface. In addition, the height k from the shoulder protrusion portion 213 to the first end contact portion 214 can be determined in consideration of the height of the terminal of the IC.

[0082] The overall height of the spring contact 200 of the present embodiment configured as above when compressed is the same as the height of a single contact pin. Here, the first end contact portion 214 of the upper contact pin 210, which is the upper end portion of the spring contact 200, and the second end contact portion 226 of the lower contact pin 220 are in contact with the terminal 2 of the IC at three positions 214A and 226A simultaneously.

[0083] As described above, the first end contact portion of the upper contact pin 210 may include one edge line or two or more edge lines according to the terminal of the IC.

[0084] Second Embodiment

[0085] Figure 11 Figures (a) and (b) respectively show the plan view and front view of the spring contact of the second embodiment of the present invention. Figure 12 Figure is the exploded view of the spring contact of the second embodiment of the present invention.

[0086] Refer to Figure 11 and Figure 12 In this embodiment, the spring contact 300 includes an upper contact pin 310, a lower contact pin 320 cross-assembled with the upper contact pin 310, and a spring 330 that elastically supports the upper contact pin 310 and the lower contact pin 320.

[0087] Preferably, the upper contact pin 310 includes a head 314 having a cylindrical shape with a predetermined outer diameter d at its upper part. This head 314 is integrally formed on the main body part constituting the upper contact pin 310 and is provided in a substantially "S" shape by stamping a sheet. The outer diameter d of the head 314 is appropriately determined in consideration of the size of the terminal (ball) of the device. Preferably, the width between the two shoulder protrusions 313 that horizontally protrude from the left and right of the main body part 312 to support the spring 330 is greater than the outer diameter d of the head 314.

[0088] In this embodiment, the lower contact pin 320 is substantially the same as the plate-shaped contact pin of the first embodiment, so repeated description is omitted.

[0089] The spring 330 is provided by a coil-type compression spring that resists compression force and is disposed between the upper contact pin 310 and the lower contact pin 320. When the upper contact pin 310 and the lower contact pin 320 are compressed in the length direction, the spring 130 provides a restoring force for restoring the upper contact pin 310 and the lower contact pin 320 to their original positions.

[0090] Figure 13 Figures (a) and (b) respectively show the front view and side view of the unfolded state of the upper contact pin of the spring contact of the second embodiment of the present invention.

[0091] Refer to Figure 13 The plate-shaped upper contact pin 310' includes a band 314' horizontally and integrally provided on the upper part of the main body part 312, and a first end contact part 314a is provided at the upper end of the band 314'.

[0092] This band 314' has the same length on the left and right with respect to the center C1 of the main body part 312 and is rolled into a cylindrical shape.

[0093] Specifically, the belt 314' forms a head 314 in a cylindrical shape including a first belt portion 3411 and a second belt portion 3142. The first belt portion 3411 is arranged in the same plane as the main body portion 312 and has the same distance from the center C1 of the main body portion 312 on both the left and right sides. The second belt portion 3142 is rolled from both end portions of the first belt portion 3411 in the clockwise direction (or counterclockwise direction) to have a semi-circular arc shape. The head 314 with this structure has a substantially "S" shape on the plane (see Figure 11 of (a)). In addition, along the rolling direction of the second belt portion 3142, the head 314 may have a shape that is symmetric about the left and right of "S" on the plane.

[0094] The first belt portion 3411 is located in the diameter direction of the cylindrical head 314, and its length d is approximately equivalent to the diameter of the cylindrical shape. The sum of the lengths (R / 2) of the respective second belt portions 3142 provided at both ends of the first belt portion 3411 is equivalent to the outer circumference (R) of the cylindrical shape of the head 314. Therefore, the length d of the first belt portion 3411 and the sum (R) of the two second belt portions 3412 have a relationship of R (length of the outer circumference of the circle) = d (diameter of the circle) × π (radius).

[0095] The upper contact pin 310' includes: a main body portion 312 formed with grooves 311 along the length direction of both sides, shoulder protrusion portions 313 for supporting springs at the left and right side ends, a pair of elastic portions 315 symmetrically extending downward along the length direction of the main body portion 312, and second end protrusion portions 315a formed at the front ends of the respective elastic portions 315. This configuration is substantially the same as that of the above-described first embodiment.

[0096] Figure 14 Figures (a) and (b) of

[0097] Figure 14 show the front view configuration diagrams of the spring contact of the first embodiment of the present invention, and (a) and (b) are the plane configuration diagrams of the spring contact in mutually perpendicular directions.

[0098] Figure 15 Figures (a) and (b) of

[0099] As described above, it should be understood that in each embodiment, the upper contact pin and the lower contact pin may be assembled in the same shape with each other, or the upper contact pin and the lower contact pin may be combined as two different types of contact pins having end portions with structures suitable for them according to the type of the terminal.

[0100] Third Embodiment

[0101] Figures 16 to 18 is a schematic view of a spring contact of the third embodiment of the present invention, Figure 16 is a front view in a partially cut state, Figure 17 shows a rolling process Figure 16 is a front configuration view of an unfolded state before the spring contact is formed, Figure 18 is a side configuration view thereof.

[0102] As Figure 16 shown, the spring contact 500 of the present embodiment is characterized in that a strip pattern formed of a stamped metal plate is rolled into a cylindrical shape to be integrally formed.

[0103] Specifically, referring to Figure 17 and Figure 18 , the strip pattern 500' of the spring contact includes a unit strip 511 formed of a horizontal strip 511a and a vertical strip 511b, an elastic portion 511 in which the unit strips 511a, 511b are connected in a zigzag pattern, an upper head 512 provided with an upper end portion 512a protruding upward and extending from the uppermost end of the elastic portion 511, and a lower head 513 provided with a lower end portion 513a protruding downward and extending from the lowermost end of the elastic portion 511.

[0104] For such a spring contact, it is possible to form a predetermined pattern by stamping a plate mainly made of beryllium copper (Be Cu), copper alloy or stainless steel (SUS) or the like and bend it into a cylindrical shape to manufacture the contact, and it is possible to plate gold, palladium (Pd), palladium nickel (Pd Ni) or palladium cobalt (Pd Co) or the like on the surface of the contact.

[0105] The elastic portion 511 includes unit strips 511a, 511b formed of a horizontal strip 511a and a vertical strip 511b extending vertically from one end of the horizontal strip 511a and having a length shorter than that of the horizontal strip 511a, and a plurality of unit strips 511a, 511b are connected in a zigzag pattern.

[0106] The upper head 512 and the lower head 513 are respectively provided with a plurality of toothed upper end portions 512a and lower end portions 513b along the edges for contacting the terminals of the device and the terminals of the PCB.

[0107] In this embodiment, it is illustrated that the upper head 512 and the lower head 513 are the same as the horizontal band 511a of the elastic part 511, but this is not limited thereto, and the width and length may also be different.

[0108] This plate-shaped strip pattern 510' is bent into a cylindrical shape and bent into a cylindrical shape with the center of the horizontal band 511a as the vertical axis C2.

[0109] In addition, the spring contact 500 of this embodiment can be provided by various strip patterns. For example, a plurality of closed loops are connected along the length direction of the elastic part or a strip pattern in a spiral shape, etc., and there can also be various modification examples.

[0110] Figure 19 and Figure 20 It is a schematic diagram showing a modification example of the third embodiment of the present invention.

[0111] See Figure 19 , the spring contact 600 of the modification example includes: a contact unit 610 integrally formed by rolling a strip pattern formed by stamping a metal plate into a cylindrical shape, and a spiral spring 620 inserted into the contact unit 610.

[0112] Preferably, the outer diameter of the spiral spring 620 is smaller than the inner diameter of the contact unit 610. Therefore, the contact unit 610 and the spiral spring 620 have an appropriate clearance so that they do not interfere with each other during operation.

[0113] See Figure 20 , the spring contact 700 of another modification example includes: a first contact unit 710 integrally formed by rolling a strip pattern formed by stamping a metal plate into a cylindrical shape, and a second contact unit 720 inserted into the first contact unit 710. The second contact unit 720 is also configured to roll a strip pattern formed by stamping a metal plate into a cylindrical shape.

[0114] The first contact unit 710 and the second contact unit 720 can be provided by the same strip pattern, or the first contact unit 710 and the second contact unit 720 can have different strip patterns.

[0115] The outer diameter of the second contact unit 720 is smaller than the inner diameter of the first contact unit 710. Therefore, the first contact unit 710 and the second contact unit 720 have an appropriate clearance so that they do not interfere with each other during operation.

[0116] Hereinafter, a test socket incorporating such a spring contact will be described in detail.

[0117] First Embodiment

[0118] Figure 21 It is a plan configuration diagram of the test socket according to the first embodiment of the present invention.Figure 22 The Figure 21 cross-sectional configuration diagram of the E-E line. For reference, Figure 21 in the upper contact pin 210 and the lower contact pin 220 that constitute the spring contact 200 are cross-assembled perpendicular to each other, but for ease of understanding, the upper contact pin 210 and the lower contact pin 220 are shown assembled in the same plane.

[0119] Refer to Figure 21 and Figure 22 , the test socket 1100 of this embodiment includes a plurality of spring contacts 200, the plurality of spring contacts 200 having an upper contact pin 210, a lower contact pin 220 cross-assembled with the upper contact pin 210 so as to be linearly operable with each other, and a helical spring 230 elastically supporting the upper contact pin 210 and the lower contact pin 220; a main board 1110 formed with a plurality of receiving holes 1111 for receiving and arranging each spring contact 200; and a lower diaphragm 1120 located on the main board 1110.

[0120] Preferably, in the main board 1110, in order to support the upper contact pin 210 by a stepped portion 1112 horizontally protruding from the upper opening end of the receiving hole 1111, a first opening 1113 having a diameter d2 smaller than the diameter d1 of the receiving hole 1111 is formed. Specifically, the diameter d2 of the first opening 1113 is smaller than the width of the shoulder protrusion 213 formed on the upper contact pin 210.

[0121] The diaphragm 1120 is attached to the lower part of the main board 1110, and a second opening 1121 having a diameter d3 smaller than the diameter d1 of the receiving hole 1111 is formed at a position corresponding to the receiving hole 1111. Specifically, the diameter d3 of the second opening 1121 is smaller than the width of the shoulder protrusion 223 of the lower contact pin 220. The test socket 1100 may be provided with at least one or more fitting holes 1101 for fitting the socket and guide holes 1102 for accurately positioning the socket. In this embodiment, the fitting holes 1101 and the guide holes 1102 are shown to penetrate through the main board 1110 and the diaphragm 1120.

[0122] According to such a test socket 1100, the upward movement of the upper contact pin 210 is restricted by the stepped portion 1112 in the receiving hole 1111, the downward movement of the lower contact pin 220 is restricted by the diaphragm 1120, and the terminals of the device and the terminals of the PCB are elastically connected by the helical spring 230.

[0123] For the assembly process of the spring contact 200 and the test socket 1100, the spring contact 200 can first be inserted into the lower opening of the receiving hole 1111, and then the membrane plate 1120 can be attached to the lower surface of the main board 1110 for assembly. Alternatively, the membrane plate 1120 can first be attached to the main board 1110, and then the spring contact 200 can be forcibly inserted into the second opening 1121 of the membrane plate 1120 for assembly.

[0124] Second Embodiment

[0125] Figure 23 It is a cross-sectional configuration diagram of the test socket according to the second embodiment of the present invention.

[0126] See Figure 23 , the test socket 1200 of this embodiment includes: a spring contact 100, including two contact pins 110, 120 that are elastically supported by a coil spring 130 and assembled to cross each other; a main board 1210 for receiving the spring contact 100; and a membrane plate 1220, and the above configuration is the same as that of the above first embodiment.

[0127] In this embodiment, the main board 1210 is characterized in that a slot hole 1214 wider than the diameter d2 of the first opening 1213 is formed on the upper surface to receive the spherical terminal 71 of the device.

[0128] The height and diameter of the slot hole 1214 can be determined in consideration of the size of the spherical terminal 71 of the device. A curved surface is formed at the upper opening end of the slot hole 1214. During the process of the device being carried by the test socket 1200, the spherical terminal 71 is guided to each slot hole 1214, so that the spherical terminal 71 and the spring contact 100 can contact at an accurate position.

[0129] In the spring contact 100 shown in this embodiment, end contact portions of a pair of upper contact pins 110 are formed, but the shapes of the end contact portions of each contact pin can be different according to the terminals of the device.

[0130] Third Embodiment

[0131] Figure 24 It is a cross-sectional configuration diagram of the test socket according to the third embodiment of the present invention. As Figure 24 shown, the test socket 1300 of this embodiment includes: a spring contact 200, including two contact pins 210, 220 that are elastically supported by a coil spring 230 and assembled to cross each other; a main board 1310 formed with a plurality of receiving holes 1311 for receiving and arranging each spring contact 200; and a silicone caulking portion 1320 inserted into the lower opening end of the receiving hole 1311 to fix the lower contact pin 220 to the main board 1310.

[0132] Similarly to the first embodiment, in the main board 1310, in order to support the upper contact pin 210 by means of a stepped portion 1312 formed to horizontally protrude from the upper opening end of the receiving hole 1311, a first opening 1313 having a diameter smaller than that of the receiving hole 1311 is formed.

[0133] After the spring contact 200 is inserted into the lower opening of the receiving hole 1311 and temporarily assembled to the main board 1310, the silicone caulking portion 132 is inserted to a predetermined depth inside the receiving hole 1311, thereby fixing the lower contact pin 220 to the main board 1310.

[0134] Such a silicone caulking portion 1320 can be provided by elastic silicone. While being compressed within the elastic force range of its own material, the lower end of the lower contact pin 220 is fixed.

[0135] Preferably, the insertion depth of the silicone caulking portion 1320 is preferably the depth reaching the shoulder protrusion 223 of the lower contact pin 220. This is because, when the insertion depth is greater than the depth of the shoulder protrusion 223, the elastic deformation of the coil spring 230 will be hindered.

[0136] In addition, in this embodiment, a slot hole for receiving the spherical terminals of the device may be provided in the upper part of the main board 1310 (see the second embodiment).

[0137] Fourth Embodiment

[0138] Figure 25 It is a cross-sectional configuration diagram of a test socket according to the fourth embodiment of the present invention.

[0139] See Figure 25 , the test socket 1400 of this embodiment includes: a plurality of spring contacts 200, including two contact pins 210 and 220 that are elastically supported by a coil spring 230 and assembled to cross each other; a lower diaphragm 1410, formed with a plurality of first through holes 1411 for passing through and arranging each spring contact 100; an assembly portion 1420, located on the upper side of the lower diaphragm 1410; an insulating main body portion 1430, disposed on the upper side of the assembly portion 1420 and having second through holes 1431 for receiving and arranging the spring contacts 100 corresponding to the first through holes 1411; an upper diaphragm 1440, located on the upper surface of the insulating main body portion 1430 and having third through holes 1441 formed corresponding to and passing through the second through holes 1431; a first silicone caulking portion 1451, inserted into the upper part of the second through holes 1431 of the insulating main body portion 1430, thereby fixing the upper contact pin 110 to the insulating main body portion 1430.

[0140] The lower template 1410, the insulating main body 1430, and the upper template 1430 are integrally formed to have a predetermined thickness. Through holes 1411, 1431, and 1441 are respectively formed in a predetermined pattern corresponding to the terminal positions of the device. The spring contact 100 is inserted into the through holes 1411, 1431, and 1441. The upper contact pin 110 is fixed to the insulating main body 1430 integrally through the first silicone caulking portion 1451. The first through hole 1411, the second through hole 1431, and the third through hole 1441 have the same inner diameter. Preferably, at least the second through hole 1431 has an inner diameter larger than the maximum outer diameter of the spring contact 100, so that the spring contact 100 can be accommodated without interfering with the up and down movement.

[0141] The first silicone caulking portion 1451 can be provided by elastic silicone. While being compressed within the elastic force range of the material itself, the first silicone caulking portion 1451 fixes the lower end of the lower contact pin 220. Preferably, the insertion depth of the first silicone caulking portion 1451 is preferably the depth reaching the shoulder protrusion 113 of the upper contact pin 110.

[0142] Preferably, the second silicone caulking portion 1452 can be inserted from the lower part of the second through hole 1431 to mold the insulating main body 1430, so as to fixedly support the insulating main body 1430 and the lower contact pin 120.

[0143] The insulating main body 1430 can be provided by an elastomer such as elastic silicone rubber. The insulating main body made of the elastomer can be made by injecting a liquid resin into another mold and curing it. Therefore, it is easier to manufacture compared with the conventional injection-molded synthetic resin.

[0144] The assembly part 1420 can be provided with an assembly hole for assembling the socket and a guide hole for guiding the socket into place. The reinforcing plate 350 can be provided by metal (SUS) or resin.

[0145] A first adjustment plate 1461 is provided on the lower surface of the lower template 1410 for adjusting the height. Also, the upper surface of the upper template 1440 can also have a second adjustment plate 1462 for adjusting the height.

[0146] Figure 26 Showing a modification of the fourth embodiment of the present invention, the test socket can include different types of spring contacts 100 and 200 to fit the terminals of a semiconductor device (IC) that is a hybrid of BGA type and LGA type.

[0147] The ball type terminals 71 and the land type terminals 72 of the composite device 70 have different heights d4 and d5. Correspondingly, the socket 1400 has a first spring contact 100 and a second spring contact 200 with different heights according to the types of the respective terminals.

[0148] The upper and lower ends of the first spring contact 100 and the second spring contact 200 are respectively inserted into the first silicone caulking portion 1451 and the second silicone caulking portion 1452 to be fixedly supported on the insulating main body portion 1430.

[0149] In this embodiment, it is illustrated that the first spring contact 100 having an upper contact pin is provided at the position of the spherical terminal 71, and the upper contact pin has a pair of first terminal contact portions 114. The second spring contact 200 is provided at the position of the land type terminal 72, and the second spring contact 200 has an upper contact pin, and the upper contact pin has a first terminal contact portion 214.

[0150] As described above, the spring contact of the present invention has a high degree of design freedom with respect to the height or shape of the first terminal contact portion at the upper end of the contact pin. Therefore, in the socket 1400, in order to compensate for the height difference d4 - d5 of different terminal types when carrying an IC, the dissimilar first spring contact 100 and the second spring contact 200 having a height difference d6 can be included.

[0151] Fifth Embodiment

[0152] Figure 27 It is a cross-sectional configuration diagram of a test socket according to the sixth embodiment of the present invention.

[0153] See Figure 27 , the test socket 1500 of this embodiment includes: a plurality of spring contacts 300 including two contact pins 310 and 320 that are elastically supported by a coil spring 330 and assembled to cross each other; a main board 1510 formed with a plurality of receiving holes 1511 for receiving and arranging each spring contact 300; and a lower membrane plate 1520 located on the main board 1510. The configuration other than the spring contact 300 is substantially the same as that of the test socket of the first embodiment.

[0154] The spring contact 300 of this embodiment includes a head 314 having a cylindrical shape for the upper contact pin 310.

[0155] In such a spring contact 300, the shoulder protrusion portion 313 of the upper contact pin 310 contacts the step portion 1512 and is restricted from moving upward, and the shoulder protrusion portion (not shown) of the lower contact pin 320 is supported by the membrane plate 1520 and is restricted from moving downward, so as to be received in the receiving hole. In addition, the head 314 of the upper contact pin 310 is smaller than the inner diameter of the step portion 1512, so the upper end of the head 314 of the upper contact pin 310 is located in the slot hole 1514, so that it can contact the spherical terminal 81.

[0156] In particular, when the terminal of the device is spherical, a cylindrical head 314 is provided at the upper end of the upper contact pin 310, making the contact with the spherical terminal 81 more stable, thus having the advantage of being able to reduce the contact resistance.

[0157] In addition, in this embodiment, it is described that the template 1520 is attached to the lower part of the main board 1510 to fixedly support the lower end of the spring contact 300. However, as described in the above embodiments, the additional template can be removed and the silicone caulking part can be directly injected into the lower end opening of the main board to fix the lower end of the spring contact.

[0158] Sixth Embodiment

[0159] Figure 28 It is a cross-sectional configuration diagram of the test socket according to the sixth embodiment of the present invention.

[0160] As Figure 28 shown, in the structure of the spring contact in the above fourth embodiment (see Figure 25 ), the spring contact 300 having a cylindrical head 314 can also be similarly applied.

[0161] Specifically, the test socket 1600 of this embodiment is configured such that, in a state where the spring contact 300 is received in the second through hole 1631 of the insulating main body portion

[0162] 1630, the first silicone caulking part 1651 and the second silicone caulking part 1652 are respectively injected

[0163] into the upper and lower open ends of the through holes 1611, 1631, and 1641, and the upper end of the upper contact pin 310 and the lower end of the lower contact pin 320 are fixedly supported by the insulating main body portion 1630.

[0164] Seventh Embodiment

[0165] Figure 29 It is a cross-sectional configuration diagram of the test socket according to the seventh embodiment of the present invention.

[0166] As Figure 29 shown, in the structure of the spring contact in the above fourth embodiment (see Figure 25 ), the spring contact having a structure bent into a cylindrical shape (the spring contact 300 having a cylindrical head 314) can also be similarly applied.

[0167] Specifically, according to the test socket 1700 of this embodiment, in a state where the spring contact 500 bent into a cylindrical shape is received in the second through hole of the insulating main body portion 1730, the first silicone caulking part 1751 and the second silicone caulking part 1752 are respectively injected into the upper and lower open ends of the through hole, and the upper and lower ends of the spring contact 500 are respectively fixed by the insulating main body portion 1730.

[0168] This test socket 1700 is not subject to special restrictions in the case where the spring contact 300 as a whole has a cylindrical shape and a member that provides elastic force in the axial direction. For example, in Figure 19 the Figure 20 also applicable is the one with a double-cylinder structure described in

[0169] As described above, although the present invention has been described through limited embodiments and drawings, the present invention is not limited thereto, and it is obvious that those of ordinary skill in the technical field to which the present invention pertains can make various modifications and variations within the equivalent scope of the technical idea of the present invention and the scope of the appended claims.

[0170] Description of Reference Numerals

[0171] 100, 200, 300, 400, 500, 600, 700: Spring contacts

[0172] 110, 210, 310, 410: Upper contact pins

[0173] 130, 230, 330, 430: Helical springs

[0174] 120, 220, 320, 420: Lower contact pins

[0175] 1100, 1200, 1300, 1400, 1500, 1600, 1700: Test sockets.

Claims

1. A test socket with built-in contacts, characterized in that Comprising: A plurality of spring contacts, each including an upper contact pin, a lower contact pin that is cross-assembled with the upper contact pin and can linearly operate with each other, and a helical spring that elastically supports the upper contact pin and the lower contact pin; A main board, formed with a plurality of receiving holes for receiving and arranging each of the spring contacts, and formed with first openings each having a diameter (d2) smaller than the diameter (d1) of each of the receiving holes, such that each of the upper contact pins is supported by a stepped portion that protrudes from the upper opening end of each of the receiving holes and is horizontally formed; And A diaphragm plate, provided below the main board and having a second opening, the second opening being formed at a position corresponding to each of the receiving holes, having a diameter (d3) smaller than the diameter (d1) of the receiving holes and supporting each of the lower contact pins; Wherein, the upper contact pin and the lower contact pin respectively include: A main body portion, with grooves recessed along the length direction formed on both sides; A pair of shoulder protrusions, respectively protruding from the left and right side ends of the main body portion to support the helical spring; A first end contact portion, extending from the upper end of the main body portion; A pair of elastic portions, symmetrically extending along the length direction of the main body portion on the left and right, and each having guide surfaces protruding inward from the ends of each of the elastic portions and facing each other; and A second end contact portion, protruding from the front ends of each of the elastic portions.

2. A test socket with built-in contacts, characterized in that, Comprising: A plurality of spring contacts, each including an upper contact pin, a lower contact pin that is cross-assembled with the upper contact pin and can linearly operate with each other, and a helical spring that elastically supports the upper contact pin and the lower contact pin; A main board, formed with a plurality of receiving holes for receiving and arranging each of the spring contacts, and formed with first openings each having a diameter (d2) smaller than the diameter (d1) of each of the receiving holes, such that each of the upper contact pins is supported by a stepped portion that protrudes from the upper opening end of each of the receiving holes and is horizontally formed; And A silicone caulking portion, inserted into the lower opening end of each of the receiving holes, thereby fixing each of the lower contact pins to the main board; Wherein, the upper contact pin and the lower contact pin respectively include: A main body portion, with grooves recessed along the length direction formed on both sides; A pair of shoulder protrusions, respectively protruding from the left and right side ends of the main body portion to support the helical spring; A first end contact portion, extending from the upper end of the main body portion; A pair of elastic portions, symmetrically extending along the length direction of the main body portion on the left and right, and each having guide surfaces protruding inward from the ends of each of the elastic portions and facing each other; and A second end contact portion, protruding from the front ends of each of the elastic portions.

3. The contact built-in test socket according to claim 1 or 2, characterized in that A slot hole wider than the diameter (d2) of each of the first openings is formed on the upper surface of the main board to receive each terminal of the device.

4. A test socket with built-in contacts, characterized in that Comprising: A plurality of spring contacts, each including an upper contact pin, a lower contact pin that is cross-assembled with the upper contact pin and can linearly operate with each other, and a helical spring that elastically supports the upper contact pin and the lower contact pin; The lower template is formed with a plurality of first through holes for penetrating and disposing each of the spring contacts; The assembly part is located on the upper side of the lower template; The insulating main body part is disposed on the upper side of the assembly part and has second through holes for receiving and disposing the spring contacts corresponding to the first through holes; The upper template is located on the upper surface of the insulating main body part and has third through holes formed corresponding to the second through holes; and The first silicone caulking part is inserted into the upper part of each of the second through holes of the insulating main body part, so as to fix each of the upper contact pins to the insulating main body part.

5. The contact pin built-in test socket according to any one of claims 1, 3, and 4, wherein Each of the contact pins further includes a cylindrical head, and an upper end part is prominently formed at the front end of the head in contact with the spherical terminal.

6. A test socket with built-in contacts, characterized in that, Comprising: A plurality of cylindrical spring contacts are integrally formed by rolling a metal plate formed with a strip pattern into a cylindrical shape respectively; The lower template is formed with a plurality of first through holes for penetrating and disposing each of the spring contacts; The assembly part is located on the upper side of the lower template; The insulating main body part is disposed on the upper side of the assembly part and has second through holes for receiving and disposing the spring contacts corresponding to the first through holes; The upper template is located on the upper surface of the insulating main body part and has third through holes formed corresponding to the second through holes; And a first silicone caulking part is inserted into the upper part of each of the second through holes of the insulating main body part, so as to fix the upper ends of each of the spring contacts to the insulating main body part.

7. The contact built-in test socket according to claim 4 or 6, characterized in that Further comprising: A second silicone caulking part is inserted into the lower part of each of the second through holes of the insulating main body part, so as to fix the lower ends of each of the spring contacts to the insulating main body part.

8. The contact pin built-in test socket according to claim 6, wherein Each of the spring contacts includes: a cylindrical first contact unit formed by rolling a metal plate with a strip pattern and having elasticity and conductivity in the axial direction, and a second contact unit inserted into the first contact unit and having elasticity and conductivity in the axial direction.

9. A spring contact includes a first contact pin, a second contact pin cross-assembled with the first contact pin, and a spiral spring elastically supporting the first contact pin and the second contact pin. The characteristics are that The first contact pin and the second contact pin respectively include: A main body part, with grooves recessed along the length direction formed on both surfaces respectively; A pair of shoulder protrusion parts respectively protrude from the left and right side ends of the main body part to support the spiral spring; A first end contact part extends from the upper end of the main body part; A pair of elastic parts extend symmetrically in the length direction of the main body part and respectively have guiding surfaces protruding inward from the ends of each of the elastic parts and facing each other; and A second end contact part protrudes from the front ends of each of the elastic parts, Among them, at least any one of the first contact pin and the second contact pin has a head, the head is formed at the upper end of the main body portion, the head is composed of a plate-shaped strip, the strip has the same length on the left and right with respect to the center of the main body portion, and the first end contact portion is formed at the upper end of the main body portion. The strip includes: a first strip portion that is in the same plane as the main body portion and is set to have the same distance on the left and right from the center of the main body portion, and a second strip portion that is rolled from both end portions of the first strip portion and has a semi-circular arc shape. The first strip portion is located in the diameter direction of the cylindrical shape formed by the entire second strip portion.

10. The spring contact according to claim 9, wherein the first contact pin and the second contact pin have the same shape.

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