A production test fixture TP test optimization method and system

Abstract

The present invention discloses a production test fixture TP test optimization method, comprising the steps of: establishing a communication connection between the production test fixture and the mobile phone touch screen through FPC; the data reading unit in the production test fixture reads the firmware data information through the communication connection; the production test marking unit in the production test fixture marks the data reading process; the production test control unit in the production test fixture delays and compensates the mobile phone TP test time according to the marked content. An optimization system is also disclosed. The implementation of the present invention solves the problem that the IIC line of the TP test between the mobile phone touch screen and the production test fixture is too long, resulting in data reading failure, or the production test fixture driver IC command cannot be fully executed and TP test errors occur, thereby improving the efficiency of mobile phone TP testing.

Description

Technical Field

[0001] The present invention relates to the field of touch screen production and testing technology, and in particular to a production and testing fixture TP test optimization method and system. Background Art

[0002] Touch screens are widely used in various electronic products such as mobile phones, laptops, MP3 and MP4. As an input medium, it is currently the simplest, most convenient and natural way of human-computer interaction. Common touch screens on the market can be divided into resistive screens and capacitive screens according to their working principles. Capacitive screens are the mainstream touch screens due to their long life and high light transmittance.

[0003] The touch screen mainly includes a functional chip and a circuit board connected to the functional chip. In order to ensure the quality of the touch screen, the function of the touch screen needs to be tested before the touch screen is put on the market.

[0004] In the production and testing of mobile phone screens, the test of touch function, namely TP test, is a very important part. The basic process of existing tests is: initialization--TP firmware burning--FW version reading judgment (if PASS, start subsequent tests)--other specific TP test items. However, during the TP test process, due to the differences in production test tools and production test fixtures, differences sometimes occur, resulting in different test results.

[0005] Among them, the TP test, the TP of the display screen and the fixture communicate through IIC, and its specific circuit is formed by connecting the FPC circuit of the display screen, the production test transfer FPC circuit, and the production test board circuit in sequence. The production test board circuit is finally connected to the core board in the production test fixture for communication. Since the communication line is relatively long and the production test tools and production test fixtures are different, the speed of data transmission through IIC may be different, and the data transmission time may be different.

[0006] For some display driver ICs, the TP test data reading may fail because the time is too long; or the previous command of the driver IC may be interrupted by the next instruction before it is processed because the time is too short, resulting in errors in subsequent test data. Summary of the invention

[0007] In the prior art, the IIC line of the TP test between the mobile phone touch screen and the production test fixture is long, which makes the test data transmission time longer and compresses the TP test data reading time, which may cause data reading failure or the production test fixture driver IC command cannot be fully executed, resulting in TP test errors.

[0008] In view of the above problems, a production test fixture TP test optimization method and system are proposed. By comparing the read firmware data information with the standard firmware information, it is judged whether there is an abnormality in the data transmission in the mobile phone TP test according to the comparison result, and a delay mark is made. According to the content of the delay mark, it is determined whether the production test fixture delays other TP test items. The problem that the IIC line of the TP test between the mobile phone touch screen and the production test fixture is long, which makes the test data transmission time long, is solved, and the TP test data reading time is compressed, which may cause data reading failure or the production test fixture driver IC command cannot be fully executed, and TP test errors occur. The efficiency of mobile phone TP testing is improved.

[0009] In a first aspect, a production test fixture TP test optimization method includes:

[0010] Step 100, establish a communication connection between the production test fixture and the mobile phone touch screen through the FPC;

[0011] Step 200: The data reading unit in the production test fixture reads the firmware data information through the communication connection;

[0012] Step 300: The production test marking unit in the production test fixture marks the data reading process;

[0013] Step 400: The production test control unit in the production test fixture performs delay compensation on the mobile phone TP test time according to the content of the mark.

[0014] In conjunction with the production test fixture TP test optimization method of the present invention, in a first possible implementation manner, step 100 includes:

[0015] Step 110: Establish an IIC connection between the mobile phone touch screen and the production test fixture;

[0016] Step 120: The production test fixture burns firmware data through the IIC connection and performs TP testing.

[0017] In combination with the first possible implementation manner of the present invention, in a second possible implementation manner, step 110 includes:

[0018] Step 111, electrically connecting the mobile phone touch screen FPC circuit to the production test board circuit through the production test transfer FPC circuit;

[0019] Step 112: connect the production test board circuit to the control unit of the production test fixture.

[0020] In combination with the second possible implementation manner of the present invention, in a third possible implementation manner, step 300 includes:

[0021] Step 310: Compare the read firmware data with the standard firmware data;

[0022] Step 320: If there is an abnormality in the data reading, a delay mark is performed on the TP test;

[0023] Step 330: If the data reading is normal, mark the TP test as normal.

[0024] In combination with the third possible implementation manner of the present invention, in a fourth possible implementation manner, step 300 further includes:

[0025] Step 340: If there is an abnormality in the data reading, the data reading process is repeated;

[0026] Step 350: Delay the re-data reading process until the data reading is successful.

[0027] In combination with the fourth possible implementation manner of the present invention, in a fifth possible implementation manner, step 400 includes:

[0028] Step 410: If it is a delay mark, read the compensation time length of the delay mark;

[0029] Step 420: Use the compensation time to perform delay compensation on each remaining test item in the TP test.

[0030] In combination with the fourth possible implementation manner of the present invention, in a sixth possible implementation manner, step 400 further includes:

[0031] Step 430: If it is a normal mark, no delay compensation is performed on other test items of the mobile phone TP test.

[0032] In a second aspect, a production test fixture TP test optimization system, using the optimization method described in the first aspect, includes:

[0033] Production test fixture;

[0034] Mobile phone TP screen;

[0035] Production test adapter board;

[0036] Production test board;

[0037] FPC line;

[0038] The mobile phone TP screen is electrically connected to the production and test adapter board through the FPC circuit;

[0039] The production test adapter board is electrically connected to the production test board through the FPC circuit;

[0040] The production test board is electrically connected to the production test fixture; and the production test fixture includes:

[0041] a first data reading unit;

[0042] Production test marking unit;

[0043] Production test control unit;

[0044] Production test unit;

[0045] The first data reading unit is used to read the firmware data information in the TP screen of the mobile phone through the IIC connection;

[0046] The production test marking unit is used to mark the firmware data reading process;

[0047] The production test unit is used to perform production test on the mobile phone TP;

[0048] The production test control unit is used to output control instructions to each functional unit and perform delay compensation on the mobile phone TP test time according to the content of the mark.

[0049] In conjunction with the production test fixture TP test optimization system described in the second aspect, in a first possible implementation manner, the production test fixture further includes:

[0050] a second data reading unit;

[0051] The second data reading unit is used to read the marking content and transmit it to the production test control unit.

[0052] In combination with the first possible implementation manner of the second aspect, in a second possible implementation manner, the production testing jig further includes:

[0053] Comparison unit;

[0054] The comparison unit is used to compare the read firmware data with the standard firmware data, and transmit the comparison result to the production test control unit.

[0055] The production test fixture TP test optimization method and system described in the present invention are implemented to compare the read firmware data information with the standard firmware information, determine whether there is an abnormality in the data transmission in the mobile phone TP test according to the comparison result, and perform a delay mark, and determine whether the production test fixture delays other TP test items according to the content of the delay mark, thereby solving the problem that the IIC line of the TP test between the mobile phone touch screen and the production test fixture is long, resulting in a long test data transmission time, and compressing the TP test data reading time, which may cause data reading failure or the production test fixture driver IC command cannot be fully executed, and TP test errors occur, thereby improving the efficiency of mobile phone TP testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0056] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0057] Figure 1 It is a schematic diagram of a first embodiment of a production test fixture TP test optimization method of the present invention;

[0058] Figure 2 It is a schematic diagram of a second embodiment of the production test fixture TP test optimization method of the present invention;

[0059] Figure 3 It is a schematic diagram of a third embodiment of the production test fixture TP test optimization method of the present invention;

[0060] Figure 4 It is a schematic diagram of a fourth embodiment of the production test fixture TP test optimization method of the present invention;

[0061] Figure 5 It is a schematic diagram of a fifth embodiment of the production test fixture TP test optimization method of the present invention;

[0062] Figure 6 1 is a schematic diagram of a sixth embodiment of the production test fixture TP test optimization method of the present invention;

[0063] Figure 7 It is a schematic diagram of a first embodiment of a production test fixture TP test optimization system of the present invention;

[0064] Figure 8 It is a schematic diagram of a second embodiment of the production test fixture TP test optimization system of the present invention;

[0065] The names of the parts indicated by the numbers in the accompanying drawings are: 10 - mobile phone TP screen, 20 - production test adapter board, 30 - production test test board, 40 - production test fixture, 41 - production test control unit, 42 - first data reading unit, 43 - production test marking unit, 44 - production test unit, 45 - second data reading unit, 46 - comparison unit. DETAILED DESCRIPTION

[0066] The following will be combined with the accompanying drawings in the invention to clearly and completely describe the technical solutions in the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, other embodiments obtained by ordinary technicians in this field without creative work are all within the scope of protection of the present invention.

[0067] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0068] For TP testing, the TP of the display screen and the fixture communicate through IIC. The specific circuit is formed by connecting the FPC circuit of the display screen, the production test transfer FPC circuit, and the production test board circuit in sequence. The production test board circuit is finally connected to the core board in the production test fixture for communication. Since the communication line is relatively long and the production test tools and production test fixtures are different, the speed of data transmission through IIC may be different, and the data transmission time may be different.

[0069] The IIC line of the TP test between the mobile phone touch screen and the production test fixture 40 is long, which makes the test data transmission time longer and compresses the TP test data reading time, which may cause data reading failure or the production test fixture 40 driver IC command cannot be fully executed, resulting in TP test errors.

[0070] In view of the above problems, a 40TP test optimization method and system for production test fixture are proposed.

[0071] First, as Figure 1 , Figure 1 It is a schematic diagram of the first embodiment of the production test fixture 40TP test optimization method in the present invention, a production test fixture 40TP test optimization method, including: step 100, establishing a communication connection between the production test fixture 40 and the mobile phone touch screen through the FPC; step 200, the data reading unit in the production test fixture 40 reads the firmware data information through the communication connection; step 300, the production test marking unit 43 in the production test fixture 40 marks the data reading process; step 400, the production test control unit 41 in the production test fixture 40 delays the mobile phone TP test time according to the marked content.

[0072] By marking the firmware data with abnormal data reading, re-reading it, and delaying the time compensation for other test items of this mobile phone TP test, the problem of a long IIC line for the TP test between the mobile phone touch screen and the production test fixture 40, which makes the test data transmission time longer, is solved, and the TP test data reading time is compressed, which may cause data reading failure or the production test fixture 40 driver IC command cannot be fully executed, and TP test errors occur. The efficiency of the mobile phone TP test is improved.

[0073] Preferably, if Figure 2 , Figure 2It is a schematic diagram of the second embodiment of the TP test optimization method of the production test fixture 40 in the present invention, and step 100 includes: step 110, establishing an IIC connection between the mobile phone touch screen and the production test fixture 40; step 120, the production test fixture 40 burns firmware data through the IIC connection and performs TP testing.

[0074] Preferably, if Figure 3 , Figure 3 It is a schematic diagram of the third embodiment of the production test fixture 40TP test optimization method in the present invention, and step 110 includes: step 111, connecting the mobile phone touch screen FPC line to the production test test board 30 line through the production test adapter FPC line; step 112, connecting the production test board 30 line to the control unit of the production test fixture 40.

[0075] The mobile phone TP screen 10 communicates with the production test fixture 40 through the IIC protocol to transmit firmware data and production test.

[0076] Preferably, if Figure 4 , Figure 4 It is a schematic diagram of the fourth embodiment of the production test fixture 40TP test optimization method of the present invention, and step 300 includes: step 310, comparing the read firmware data with the standard firmware data; step 320, if there is an abnormality in the data reading, delay marking the TP test; step 330, if the data reading is normal, marking the TP test as normal.

[0077] Mark the test process with abnormal data reading, re-perform the reading test, record the required delay time, and make corresponding time compensation for the remaining other production test items.

[0078] Preferably, if Figure 5 , Figure 5 It is a schematic diagram of the fifth embodiment of the production test fixture 40TP test optimization method of the present invention. Step 300 also includes: step 340, if there is an abnormality in data reading, re-performing the data reading process; step 350, delaying the re-performing data reading process until the data reading is successful.

[0079] Preferably, if Figure 6 , Figure 6 It is a schematic diagram of the sixth embodiment of the TP test optimization method of the production test fixture 40 of the present invention. Step 400 includes: Step 410, if it is a delay mark, read the compensation time of the delay mark; Step 420, use the compensation time to perform delay compensation for each remaining test item in the TP test. By performing delay compensation on the mobile phone TP test, the test efficiency is improved.

[0080] Preferably, step 400 also includes: step 430, if it is a normal mark, then no delay compensation is performed on other test items of the mobile phone TP test.

[0081] Second, as Figure 7 , Figure 7 It is a schematic diagram of the first embodiment of the production test fixture 40TP test optimization system in the present invention, a production test fixture 40TP test optimization system, using the optimization method of the first aspect, including: a production test fixture 40, a mobile phone TP screen 10, a production test adapter board 20, a production test board 30, and an FPC circuit;

[0082] The mobile phone TP screen 10 is electrically connected to the production test adapter board 20 through the FPC line;

[0083] The production test adapter board 20 is electrically connected to the production test board 30 through an FPC line;

[0084] The production test board 30 is electrically connected to the production test fixture 40; Figure 8 , Figure 8 It is a schematic diagram of the second embodiment of the production test fixture 40TP test optimization system in the present invention, the production test fixture 40 includes a first data reading unit 42, a production test marking unit 43, a production test control unit 41, and a production test test unit 44; the first data reading unit 42 is used to read the firmware data information in the mobile phone TP screen 10 through the IIC connection; the production test marking unit 43 is used to mark the firmware data reading process; the production test test unit 44 is used to perform production testing on the mobile phone TP; the production test control unit 41 is used to output control instructions to each functional unit and delay compensation for the mobile phone TP test time according to the marked content.

[0085] Preferably, the production test fixture 40 further includes: a second data reading unit 45 ; the second data reading unit 45 is used to read the marking content and transmit it to the production test control unit 41 .

[0086] Preferably, the production test fixture 40 further includes a comparison unit 46 ; the comparison unit 46 is used to compare the read firmware data with the standard firmware data, and transmit the comparison result to the production test control unit 41 .

[0087] The production test fixture 40TP test optimization method and system described in the present invention are implemented. By comparing the read firmware data information with the standard firmware information, it is determined whether there is an abnormality in the data transmission in the mobile phone TP test according to the comparison result, and a delay mark is performed. According to the content of the delay mark, it is determined whether the production test fixture 40 delays other TP test items. This solves the problem that the IIC line of the TP test between the mobile phone touch screen and the production test fixture 40 is long, which makes the test data transmission time long, compresses the TP test data reading time, which may cause data reading failure or the production test fixture 40 driver IC command cannot be fully executed, TP test errors occur, and the efficiency of mobile phone TP testing is improved.

[0088] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A production test fixture TP test optimization method, characterized in that: include: Step 100, establish a communication connection between the production test fixture and the mobile phone touch screen through the FPC; Step 200: The data reading unit in the production test fixture reads the firmware data information through the communication connection; Step 300: The production test marking unit in the production test fixture marks the data reading process; Step 400: The production test control unit in the production test fixture performs delay compensation on the mobile phone TP test time according to the content of the mark.

2. The production test fixture TP test optimization method according to claim 1 is characterized in that: The step 100 comprises: Step 110: Establish an IIC connection between the mobile phone touch screen and the production test fixture; Step 120: The production test fixture burns firmware data through the IIC connection and performs TP testing.

3. The production test fixture TP test optimization method according to claim 2 is characterized in that: The step 110 includes: Step 111, electrically connecting the mobile phone touch screen FPC circuit to the production test board circuit through the production test transfer FPC circuit; Step 112: connect the production test board circuit to the control unit of the production test fixture.

4. The production test fixture TP test optimization method according to claim 3 is characterized in that: The step 300 includes: Step 310: Compare the read firmware data with the standard firmware data; Step 320: If there is an abnormality in the data reading, a delay mark is performed on the TP test; Step 330: If the data reading is normal, mark the TP test as normal.

5. The production test fixture TP test optimization method according to claim 4 is characterized in that: The step 300 further includes: Step 340: If there is an abnormality in the data reading, the data reading process is repeated; Step 350: Delay the re-data reading process until the data reading is successful.

6. The production test fixture TP test optimization method according to claim 5 is characterized in that: The step 400 includes: Step 410: If it is a delay mark, read the compensation time length of the delay mark; Step 420: Use the compensation time to perform delay compensation on each remaining test item in the TP test.

7. The production test fixture TP test optimization method according to claim 5 is characterized in that: The step 400 further includes: Step 430: If it is a normal mark, no delay compensation is performed on other test items of the mobile phone TP test.

8. A production test fixture TP test optimization system, using the optimization method described in any one of claims 1-7 to perform system optimization, characterized in that: include: Production test fixture; Mobile phone TP screen; Production test adapter board; Production test board; FPC line; The mobile phone TP screen is electrically connected to the production and test adapter board through the FPC circuit; The production test adapter board is electrically connected to the production test board through the FPC circuit; The production test board is electrically connected to the production test fixture; And the production test fixture includes: a first data reading unit; Production test marking unit; Production test control unit; Production test unit; The first data reading unit is used to read the firmware data information in the TP screen of the mobile phone through the IIC connection; The production test marking unit is used to mark the firmware data reading process; The production test unit is used to perform production test on the mobile phone TP; The production test control unit is used to output control instructions to each functional unit and perform delay compensation on the mobile phone TP test time according to the content of the mark.

9. The production test fixture TP test optimization system according to claim 8, characterized in that: The production test fixture also includes: a second data reading unit; The second data reading unit is used to read the marking content and transmit it to the production test control unit.

10. The production test fixture TP test optimization system according to claim 9, characterized in that: The production test fixture also includes: Comparison unit; The comparison unit is used to compare the read firmware data with the standard firmware data, and transmit the comparison result to the production test control unit.

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