An embedded computer system architecture for implementing software testing

Abstract

The present invention provides an embedded computer system architecture for implementing software testing, which includes a chassis, functional modules arranged in the chassis, a test interface module, and an acquisition module for acquiring data on the functional modules through the test interface module. A detachable cover plate is provided on the chassis, and the detachable cover plate is used to protect the test interface module; the test interface module includes test interfaces arranged on the detachable cover plate and is connected to the functional modules through the test interfaces; the acquisition module includes a software defect location device, a source code coverage statistical analysis device, and an object code structure coverage statistical analysis device. Without changing the functional performance of the prototype embedded computer product or the original system structure, this architecture increases the coverage rate of full acquisition of the original values of signals and CPU operation state testing by adding a generalized test interface and configurable test modules, and realizes software analysis and testing with high real-time performance, high reliability, multi-dimensions, high generality, and high test coverage rate.

Description

Technical Field

[0001] The present invention belongs to the field of testing, and particularly relates to an embedded computer system architecture for implementing software testing. Background Art

[0002] Adding a test interface to an embedded computer to form an embedded computer system architecture for implementing software testing is a general technology for improving product testability, reducing the test cycle, and enhancing product reliability, and is commonly used in electronic control fields such as aviation, aerospace, navigation, and automobiles.

[0003] Currently, the methods for adding a software test interface to an embedded product are as follows: using a portable embedded software interface test tool, all hardware boards of which adopt the USB interface form, and using various communication boards such as CAN and RS232 to form an adaptation interface suitable for the embedded device to be tested, and transmitting through the test execution client software to the test execution service software, so as to realize the monitoring, analysis, and evaluation of test data; designing and developing a test adapter board by using the parallel signal extraction technology, parallelly extracting the signals required for testing a certain device to the test adapter board to form a dedicated test interface, and connecting this dedicated test interface to the test device through a test cable, but this method requires relevant analysis to be carried out at the beginning of the design of the device to be tested, reserving a dedicated test interface, and selecting appropriate test points to reliably and effectively meet the testability requirements of the device. Summary of the Invention

[0004] In order to solve the above technical problems, the present invention proposes a new embedded computer system architecture for implementing software testing, which increases the coverage rate of full acquisition of the original values of signals and CPU operating status testing without changing the functional performance of the original embedded computer product or the original system structure.

[0005] The object of the present invention is to provide an embedded computer system architecture for implementing software testing, the architecture including a chassis, a functional module arranged in the chassis, a test interface module, and an acquisition module for acquiring data on the functional module through the test interface module, wherein,

[0006] The chassis is provided with a detachable cover plate for protecting the test interface module;

[0007] The test interface module includes a test interface arranged on the detachable cover plate and is connected to the functional module through the test interface; the acquisition module includes a software defect location device, a source code coverage statistical analysis device, and an object code structure coverage statistical analysis device.

[0008] The embedded computer system architecture for implementing software testing provided by the present invention further has the following characteristics. The functional modules include an SI matching circuit, a bus buffer circuit, a serial bus driving circuit, a buck-boost conditioning circuit, a micro-rectangular connector, a micro-macro connector with locking, and a flexible cable.

[0009] The embedded computer system architecture for implementing software testing provided by the present invention further has the following characteristics. The micro-rectangular connector is connected to the embedded computer through a flexible cable, and the micro-rectangular connector is arranged on one side close to the inside of the chassis. The test interface module is connected to the acquisition module through DIP pins, a DB9 standard connector, and a micro-rectangular connector with locking. The DIP pins, the DB9 standard connector, and the micro-rectangular connector with locking are arranged on one side close to the outside of the chassis.

[0010] The embedded computer system architecture for implementing software testing provided by the present invention further has the following characteristics. The software defect location device is used for the original data of the external electrical interface before CPU capture.

[0011] The embedded computer system architecture for implementing software testing provided by the present invention further has the following characteristics. The source code coverage statistical analysis device is used for the original data of the external parallel address and data bus of the CPU.

[0012] The embedded computer system architecture for implementing software testing provided by the present invention further has the following characteristics. The object code structure coverage statistical analysis device is used for the serial port print information of the target machine.

[0013] The embedded computer system architecture for implementing software testing provided by the present invention further has the following characteristics. The embedded computer and the acquisition module share the same ground.

[0014] The embedded computer system architecture for implementing software testing provided by the present invention further has the following characteristics. The computer system architecture further includes a dedicated conversion device, and the dedicated conversion device is used to supplement the test requirements of the functional modules.

[0015] The embedded computer system architecture for implementing software testing provided by the present invention further has the following characteristics. The system architecture further includes an acquisition signal interface conversion box. The acquisition signal interface conversion box transfers the signals collected by the functional modules to independent 2mm lantern-shaped test jacks through wires, for adapting to multimeter pens and oscilloscope connectors.

[0016] Compared with the prior art, the beneficial effects of the present invention:

[0017] The present invention provides an embedded computer system architecture for software testing. Without changing the functional performance of the prototype embedded computer product or the original system structure, by adding a generalized test interface and configurable test modules, the coverage rate of the full acquisition signal raw values and CPU operating status testing is increased. That is, the raw values of the acquisition signals and the CPU operating status can be provided to external user test devices in real time, achieving software analysis testing with high real-time performance, high reliability, multi-dimensions, high generality, and high test coverage rate. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the present invention, the accompanying drawings required for use in the embodiments will be briefly introduced below. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0019] Figure 1 Structural schematic diagram of the computer system architecture provided by the present invention and its external devices;

[0020] Figure 2 Connection schematic diagram of the test interface module;

[0021] Figure 3 Structural schematic diagram of the chassis appearance;

[0022] Figure 4 DIP pins for source code coverage statistical analysis on the test interface module;

[0023] Figure 5 Outer side view of the three types of interface chassis of the test interface module;

[0024] Figure 6 Design legend of the panel of the acquisition signal interface conversion box. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0025] In order to make the technical means, creative features, achieved objectives, and effects of the present invention easy to understand, the following embodiments will specifically describe the system architecture provided by the present invention in conjunction with the accompanying drawings.

[0026] In the description of the embodiments of the present invention, it should be understood that the orientation or positional relationships indicated by the terms "center", "longitudinal", "transverse", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. are based on the orientation or positional relationships shown in the accompanying drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present invention.

[0027] In addition, the terms "first", "second", "third", etc. are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first", "second", etc. may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, "plurality" means two or more.

[0028] The terms "installed", "connected" and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the invention can be understood according to specific circumstances.

[0029] like Figures 1-6 As shown, an embedded computer system architecture for implementing software testing is provided, the architecture includes a chassis, a functional module arranged in the chassis, a test interface module, and a collection module for collecting data on the functional module through the test interface module, wherein a detachable cover is provided on the chassis, the detachable cover is used to protect the test interface module; the test interface module includes a test interface arranged on the detachable cover, and is connected to the functional module through the test interface; the collection module includes a software defect location device, a source code coverage statistical analysis device, and a target code structure coverage statistical analysis device. The test interface module is used to protect the internal SRU of the chassis from being exposed to the test environment while leading out the internal interface for testing.

[0030] In the above embodiment, the problem that the existing embedded computer cannot increase the original value of the full acquisition signal and the CPU running status test coverage without changing its functional performance and original system structure is solved, and it is ensured that the external bus, serial port communication, and the original value of the acquisition signal are added without changing the basic appearance, system layout, PCBA layout, signal electrical characteristics, and electromagnetic compatibility characteristics of the embedded computer. Then, when the embedded computer executes the application, the real-time CPU status, interface status and other information during the operation of the product application software are collected through three external devices: software defect location tool, source code coverage statistical analysis tool, and target code structure coverage statistical analysis tool. The purpose of increasing test cases and improving test coverage in the software testing process is achieved.

[0031] In some embodiments, the functional modules include an SI matching circuit, a bus buffer circuit, a serial bus driver circuit, a buck-boost conditioning circuit, a micro-rectangular connector, a micro-sized connector with a locking mechanism, and a flexible cable. The bus buffer circuit / serial bus driver circuit / buck-boost conditioning circuit respectively correspond to three software testing means. The SI matching circuit uses a Thevenin termination match and ensures the integrity of the original circuit signals through design simulation.

[0032] In the above embodiments, the main functional modules of the embedded computer, namely the SRU module, mainly include a CPU-related functional circuit and an external signal acquisition interface functional circuit. An SI matching circuit and a bus buffer circuit are added to the CPU and its peripheral circuits in the CPU-related functional circuit. The address lines, data lines, unused chip select CS1 and write enable signals of the peripheral FLASH are led out; a serial bus signal of one channel is led out from the on-chip USART pin of the CPU; the unused GPIO signals, DGND ground signals, and RESET reset signals are led out via pins. Software test interfaces are added to the resolver secondary feedback signal conditioning circuit, LVDT sensor secondary feedback signal conditioning circuit, thermal resistance signal conditioning circuit, thermocouple signal conditioning circuit, piezoresistive silicon signal conditioning circuit, capacitance sensor signal conditioning circuit, phase difference input conditioning circuit, and frequency signal input conditioning circuit in the external signal acquisition interface functional circuit. The principle of adding a test interface circuit in the circuit is shown in Figure 1 .

[0033] A micro-rectangular connector connected to the SRU using a flexible cable is installed on the side of the test interface module close to the inside of the chassis, and DIP pins, a DB9 standard connector, and a micro-sized connector with a locking mechanism (see Figure 5 ) are installed on the side of the test interface module close to the outside of the chassis.

[0034] The address lines, data lines, and related signals led out from the CPU of the embedded computer are connected to the source code coverage statistical analysis tool through DIP pins on the test interface module, with the micro-rectangular connector and the adapted flexible cable as the bridge; a serial bus signal is led out from the CPU of the embedded computer and connected to the host computer of the object code structure coverage statistical analysis tool in the form of a standard serial port (DB9) female port on the test interface module; a fixed interface is led out externally in the form of a micro-sized connector with a locking device, and through the flexible cable adapted to the micro-rectangular connector and the acquisition signal interface conversion box, analog, digital, frequency, and switch signals are transferred to independent 2mm lantern-shaped test jacks for easy testing. In some embodiments, the software defect location device is used for the original data of the external electrical interface before CPU capture. The specific method is to collect the original data of the electrical interface at the dedicated conversion device end using a multimeter and an oscilloscope.

[0035] In some embodiments, the source code coverage statistical analysis device is used for the original data of the external parallel address and data bus of the CPU. The specific method is to use a logic analyzer to collect the original data of the external parallel address and data bus.

[0036] In some embodiments, the object code structure coverage statistical analysis device is used for the serial port printing information of the target machine. The specific method is to use a serial port debugging tool to collect the serial port printing information of the target machine.

[0037] In some embodiments, the embedded computer and the acquisition module share the same ground. In the above embodiment, sharing the ground between the embedded computer and the acquisition module makes the potential difference of the measured signal to the ground consistent at the embedded computer end and the test tool end.

[0038] In some embodiments, the computer system architecture further includes a dedicated conversion device, and the dedicated conversion device is used to supplement the test requirements of the internal functional modules.

[0039] In some embodiments, the system architecture further includes an acquisition signal interface conversion box, and the acquisition signal interface conversion box transfers the signals collected by the functional module to an independent 2mm lantern-shaped test jack through a wire. The acquisition signal interface conversion box transfers the analog signals, digital signals, frequency signals, and switch signals in the micro-distance type connector to an independent 2mm lantern-shaped test jack through a wire, for adapting to the multimeter pen and the oscilloscope connector.

[0040] The above are only the preferred embodiments of the present invention, and are not intended to limit the present invention. Any modifications, equivalent replacements, and improvements made within the spirit and principle of the present invention shall be included in the protection scope of the present invention. The above is only the preferred implementation manner of the present invention. It should be noted that for those of ordinary skill in the art, without departing from the technical principle of the present invention, several improvements and modifications can still be made, and these improvements and modifications should also be regarded as the protection scope of the present invention.

Claims

1. An embedded computer system architecture for implementing software testing, characterized in that, The architecture includes a chassis, a functional module arranged in the chassis, a test interface module, and a collection module for collecting data on the functional module through the test interface module. Among them, a detachable cover plate is provided on the chassis, and the detachable cover plate is used to protect the test interface module; the test interface module includes a test interface provided on the detachable cover plate and is connected to the functional module through the test interface; the collection module includes a software defect location device, a source code coverage statistical analysis device, and an object code structure coverage statistical analysis device. The functional module includes an SI matching circuit, a bus buffer circuit, a serial bus driver circuit, a step-up / step-down conditioning circuit, a micro-rectangular connector, a micro-macro connector with locking, and a flexible cable. The micro-rectangular connector is connected to an embedded computer through a flexible cable, and the micro-rectangular connector is arranged on one side close to the inside of the chassis; the test interface module is connected to the collection module through DIP pins, a DB9 standard connector, and a micro-rectangular connector with locking, and the DIP pins, the DB9 standard connector, and the micro-rectangular connector with locking are arranged on one side close to the outside of the chassis. The software defect location device is used for the original external electrical interface data before CPU capture. The source code coverage statistical analysis device is used for the original data of the external parallel address and data bus of the CPU. The object code structure coverage statistical analysis device is used for the serial port print information of the target machine.

2. The embedded computer system architecture for software testing according to claim 1, wherein The embedded computer and the collection module share the same ground.

3. The embedded computer system architecture for implementing software testing according to claim 1, wherein The computer system architecture further includes a dedicated conversion device, and the dedicated conversion device is used to supplement the test requirements of the functional module.

4. The embedded computer system architecture for software testing according to claim 1, wherein The system architecture further includes a collection signal interface conversion box, and the collection signal interface conversion box transfers the signals collected by the functional module to an independent 2mm lantern-shaped test jack through a wire.

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