Electronic devices

Abstract

This invention provides an electronic device comprising a substrate, an electronic unit, a data line, a control unit, a test pad, and a test switch element. The substrate includes a first surface and a second surface opposite to the first surface, wherein the first surface includes an active region. The electronic unit is disposed on the substrate and located within the active region. The data line is disposed on the substrate. The control unit is disposed on the substrate and located within the active region, and the control unit is electrically connected between the electronic unit and the data line. The test pad is disposed on the second surface of the substrate. The test switch element is disposed on the substrate and located within the active region, and the test switch element is electrically connected between the data line and the test pad.

Description

Technical Field

[0001] This invention relates to an electronic device, and more particularly to an electronic device having a test switch element. Background Technology

[0002] In the manufacturing process of light-emitting devices, test elements are typically used to test whether the light-emitting elements (such as light-emitting diodes) are damaged, and then replace the malfunctioning elements. In traditional light-emitting devices, test elements are located in the peripheral area or non-display area of ​​the device. However, placing test elements in the non-display area of ​​the device leads to a decrease in the screen-to-body ratio, thus affecting the display effect. Therefore, how to improve the configuration of test elements in light-emitting devices remains an important issue in this field. Summary of the Invention

[0003] In some embodiments, the present invention provides an electronic device. The electronic device includes a substrate, an electronic unit, a data line, a control unit, a test pad, and a test switch element. The substrate includes a first surface and a second surface opposite the first surface, wherein the first surface includes an active region. The electronic unit is disposed on the substrate and located within the active region. The data line is disposed on the substrate. The control unit is disposed on the substrate and located within the active region, and the control unit is electrically connected between the electronic unit and the data line. The test pad is disposed on the second surface of the substrate. The test switch element is disposed on the substrate and located within the active region, and the test switch element is electrically connected between the data line and the test pad. Attached Figure Description

[0004] Figure 1 This is a top view schematic diagram of the electronic device according to the first embodiment of the present invention.

[0005] Figure 2 This is a bottom view schematic diagram of the electronic device according to the first embodiment of the present invention.

[0006] Figures 3 to 4 This is a schematic diagram of the configuration of the test switch element of the electronic device according to the first embodiment of the present invention.

[0007] Figure 5 This is a circuit diagram of an electronic device according to a first embodiment of the present invention.

[0008] Figures 6 to 7 This is a schematic diagram of the configuration of the test switch element of the electronic device according to the second embodiment of the present invention.

[0009] Figure 8 This is a circuit diagram of an electronic device according to a second embodiment of the present invention.

[0010] Figure 9 This is a functional block diagram of an electronic device according to a third embodiment of the present invention.

[0011] Figure 10 This is a circuit diagram of an electronic device according to a third embodiment of the present invention.

[0012] Explanation of reference numerals: 100 - Light-emitting device; BA1, BA2 - Bonding areas; BP - Bonding pads; CP - Capacitor element; CU, CU1, CU2, CU3 - Control unit; DA - Active area; DE, DR - Drain; DL, DL1, DL2, DL3 - Data lines; DR1 - First direction; DR2 - Second direction; DRU - Drive unit; ED - Electronic device; EU - Electronic unit; FS - First surface; GE, GA - Gate; LEU - Light-emitting unit; LEU1 - First light-emitting unit; LEU2 - Second light-emitting unit; LEU3 - Third light-emitting unit; PA - Array; PC - Pixel column; PC1 - First pixel column; PC2 - Second pixel column; PC3 - Third pixel column; PE - Antistatic element; P L - Power line; PR - Pixel row; PR1 - First pixel row; PR2 - Second pixel row; PR3 - Third pixel row; PU, PU1, PU2, PU3, PU4, PU5, PU6, PU7, PU8, PU9 - Pixel area; RS - Second surface; SB - Substrate; SE, SO - Source; SL - Scan line; SPU1 - First sub-pixel area; SPU2 - Second sub-pixel area; SPU3 - Third sub-pixel area; SS - Side; SW - Switch control unit; TL, Q1, QV, Q2, Q3 - Test signal lines; TP - Test pad; TU, TU1, TU2, TU3 - Test switch element; TUa - First test switch element; TUb - Second test switch element; TUc - Third test switch element. Detailed Implementation

[0013] The present invention can be understood by referring to the following detailed description in conjunction with the accompanying drawings. It should be noted that, for ease of understanding and for the sake of brevity, many of the accompanying drawings depict only a portion of the electronic device, and specific elements in the drawings are not drawn to scale. Furthermore, the number and size of the elements in the drawings are for illustrative purposes only and are not intended to limit the scope of the present invention.

[0014] Throughout this specification and claims, certain terms are used to refer to specific elements. Those skilled in the art will understand that electronic device manufacturers may use different names to refer to the same elements. This document is not intended to distinguish between elements that function identically but have different names.

[0015] In the following description and claims, the words "containing" and "including" are open-ended terms, and therefore should be interpreted as "containing but not limited to...".

[0016] It should be understood that when an element or membrane is referred to as being "set" on or "connected" to another element or membrane, it can be directly on or directly connected to the other element or membrane, or there may be an inserted element or membrane between them (indirect cases). Conversely, when an element is referred to as being "directly" on or "directly connected" to another element or membrane, there may be no inserted element or membrane between them. When an element or membrane is referred to as being "electrically connected" to another element or membrane, it can be interpreted as a direct electrical connection or an indirect electrical connection.

[0017] The terms “approximately,” “equal to,” “same as,” “substantially,” or “roughly” are generally interpreted as being within plus or minus 20% of the given value, or within plus or minus 10%, plus or minus 5%, plus or minus 3%, plus or minus 2%, plus or minus 1%, or plus or minus 0.5% of the given value.

[0018] While the terms "first," "second," "third," etc., can be used to describe multiple components, the components are not limited to these terms. These terms are used only to distinguish a single component from other components in the specification. The same terms may not be used in the claims, but rather replaced by "first," "second," "third," etc., in the order of the elements declared in the claims. Therefore, in the following description, a first component may be a second component in the claims.

[0019] It should be understood that the technical features of several different embodiments can be replaced, reorganized, or mixed to complete other embodiments without departing from the spirit of the present invention.

[0020] Please refer to Figure 1 and Figure 2 , Figure 1 This is a top view schematic diagram of the electronic device according to the first embodiment of the present invention. Figure 2 This is a bottom view schematic diagram of an electronic device according to a first embodiment of the present invention. According to the present invention, Figure 1 and Figure 2 The illustrated electronic device ED may include, for example, a light-emitting device 100, and may display static or dynamic images or screens according to the user's needs and operation, but is not limited thereto. The electronic device ED of the present invention may be applied, for example, to laptops, public displays, video wall displays, automotive displays, touch displays, televisions, monitors, smartphones, tablets, light source modules, lighting equipment, or, for example, to electronic devices applied to the aforementioned products, but is not limited thereto. According to some embodiments, the electronic device ED may include non-light-emitting devices. According to some embodiments, the electronic device ED may be a light-emitting device, a display device, a sensing device, a video wall device, or an antenna device, but is not limited thereto.

[0021] According to this embodiment, as Figure 1 and Figure 2 As shown, the electronic device ED may include a substrate SB, an electronic unit EU, a control unit CU, a data line DL, a test pad TP, and a test switch element TU, but is not limited thereto. The substrate SB may include a first surface FS and a second surface RS, wherein the first surface FS of the substrate SB may include an active region DA, and the second surface RS may be the other surface of the substrate SB opposite to the first surface FS. The electronic unit EU may be disposed on the first surface FS of the substrate SB and located within the active region DA. The data line DL may be disposed on the first surface FS of the substrate SB. The control unit CU may be disposed on the first surface FS of the substrate SB and may be located within the active region DA of the substrate SB.

[0022] like Figure 1 As shown, the control unit CU can be electrically connected between the electronic unit EU and the data line DL; that is, the electronic unit EU can be electrically connected to the data line DL through the control unit CU. The test pad TP can be disposed on the second surface RS of the substrate SB. According to this embodiment, the test switch element TU of the electronic device ED can be disposed on the first surface FS of the substrate SB and located within the active region DA. Furthermore, as... Figure 1 As shown, the test switch element TU can be electrically connected between the data line DL and the test pad TP. That is, the electronic unit EU can be electrically connected to the test pad TP via the data line DL and the test switch element TU. The components and / or films included in the electronic device ED will be described in detail below. It should be noted that the components and / or wires included in the electronic device ED of this embodiment are not limited to those described above, and any suitable components and / or wires may be included according to the design requirements of the electronic device ED.

[0023] like Figure 1 As shown, the electronic device ED in this embodiment can be, for example, a light-emitting device 100, and the electronic unit EU can be, for example, a light-emitting unit LEU, but is not limited thereto. For ease of explanation, the following description and the accompanying drawings will use the electronic device ED as a light-emitting device 100 and the electronic unit EU as a light-emitting unit LEU as an example, but the present invention is not limited thereto. According to this embodiment, a plurality of electronic units EU can be disposed on the first surface FS of the substrate SB and located within the active area DA. When the electronic unit EU is a light-emitting unit LEU, the active area DA can be, for example, a display area, wherein the display area can be the light-emitting area of ​​the light-emitting device 100 or the area for displaying a screen. That is, a plurality of light-emitting units LEU can be disposed within the display area for displaying a screen. In some embodiments, such as Figure 1As shown, among multiple light-emitting units (LEUs), the area enclosed by the connection of the outermost light-emitting units (LEUs) can be defined as the active region DA. In some embodiments, all light-emitting units (LEUs) on the substrate can be lit, and the area enclosed by the connection of the outermost light-emitting region can be defined as the active region DA. In some embodiments, the area enclosed by the connection of the outermost control unit (CU) can be defined as the active region DA. Figure 1 The shape of the active region DA shown is merely exemplary, and the invention is not limited thereto. In some embodiments, the active region DA may have any suitable shape.

[0024] In some embodiments, the electronic device ED may be a non-light-emitting device. In this case, the electronic device ED may include a plurality of electronic units EU, wherein the electronic units EU may be non-light-emitting units, and the first surface FS of the substrate SB may include an active region DA. Figure 1 As shown, in a plurality of electronic units EU, the area enclosed by the connections of the outermost electronic unit EU can be defined as the active region DA. In some embodiments, the area enclosed by the connections of the outermost control unit CU can be defined as the active region DA. Figure 1 The shape of the active region DA shown is merely exemplary, and the invention is not limited thereto. In some embodiments, the active region DA may have any suitable shape.

[0025] The substrate SB of this embodiment may include, for example, a rigid substrate, a flexible substrate, or a combination of the above substrates, but is not limited thereto. The material of the rigid substrate may include, for example, glass, ceramic, quartz, sapphire, or a combination of the above materials. The material of the flexible substrate may include, for example, polyimide (PI), polycarbonate (PC), polyethylene terephthalate (PET), other suitable materials, or a combination of the above materials. It should be noted that, although... Figure 1 and Figure 2 The substrate SB shown is a single-layer structure, but this embodiment is not limited thereto. In some embodiments, the substrate SB may include a multilayer structure, such as a stacked structure formed of organic / inorganic / organic layers, but is not limited thereto.

[0026] The light-emitting unit (LEU) may include, for example, any suitable self-emissive or non-self-emissive element, but is not limited thereto. Self-emissive elements may include, for example, organic light-emitting diodes (OLEDs), quantum dot diodes (QLEDs), inorganic light-emitting diodes (LEDs), any other suitable light-emitting element, or combinations thereof. Inorganic light-emitting diodes may include, for example, mini LEDs or micro LEDs, but are not limited thereto. In one embodiment, the chip size of the light-emitting diode is approximately 300 micrometers (μm) to 10 millimeters (mm), the chip size of the mini LED is approximately 100 micrometers to 300 micrometers, and the chip size of the micro LED is approximately 1 micrometer to 100 micrometers, but is not limited thereto. Non-self-emissive elements may include, for example, liquid crystal cells, but are not limited thereto. In this embodiment, the light-emitting unit (LEU) of the light-emitting device 100 may include, for example, light-emitting elements that emit light of multiple colors. Figure 1 As shown, the electronic unit EU of the electronic device ED can be a light-emitting unit LEU, wherein the light-emitting unit LEU may include a plurality of first light-emitting units LEU1, a plurality of second light-emitting units LEU2, and a plurality of third light-emitting units LEU3. The first light-emitting units LEU1, second light-emitting units LEU2, and third light-emitting units LEU3 may extend along a first direction DR1 parallel to the surface of the substrate SB (e.g., the first surface FS) and be disposed on the substrate SB, but are not limited thereto. According to this embodiment, the first light-emitting units LEU1, second light-emitting units LEU2, and third light-emitting units LEU3 may, for example, emit red, green, and blue light respectively, and may mix to produce white light, but are not limited thereto. In some embodiments, the light-emitting device 100 may include a light-emitting unit LEU emitting a single color of light. Features of the light-emitting unit LEU in the following embodiments are referenced to the content of this embodiment and will not be repeated here.

[0027] like Figure 1 As shown, the light-emitting device 100 may include multiple data lines DL, which may extend along the first direction DR1. The light-emitting device 100 may also include multiple scan lines SL (such as... Figure 5 As shown), the data lines DL are interleaved on the substrate SB. The scan lines SL may extend along a second direction DR2. The first direction DR1 and the second direction DR2 may be different; for example, they may be perpendicular, but are not limited thereto. The materials of the data lines DL and scan lines SL may include any suitable conductive material. According to this embodiment, as... Figure 1As shown, the extension direction DR1 of the data line DL can be approximately parallel to the extension directions of the first light-emitting unit LEU1, the second light-emitting unit LEU2, and / or the third light-emitting unit LEU3, i.e., the first direction DR1. In this embodiment, light-emitting units LEU located in the same column on the first direction DR1 can be electrically connected to the same data line DL. For example, such as Figure 1 As shown, in the first direction DR1, the first light-emitting units LEU1 located in the same column can all be electrically connected to data line DL1; the second light-emitting units LEU2 located in the same column can all be electrically connected to data line DL2; and the third light-emitting units LEU3 located in the same column can all be electrically connected to data line DL3, but this is not a limitation. Furthermore, in this embodiment, the light-emitting units LEU located in the same row in the second direction DR2 can be electrically connected to the same scan line SL (e.g., ...). Figure 5 (As shown), but not limited to this. It should be noted that... Figure 1 The number and arrangement of the light-emitting units (LEU) and data lines (DL) shown are merely exemplary and are not intended to limit the invention.

[0028] like Figure 5 As shown, in detail, the control unit CU may, for example, include a thin-film transistor element and include a gate GE, a source SE, and a drain DE. The light-emitting device 100 may include multiple control units CU. According to this embodiment, one control unit CU in the light-emitting device 100 may, for example, be electrically connected between a light-emitting unit LEU and a data line DL, thereby controlling the light emission of the light-emitting unit LEU. For example, the source SE of the control unit CU may be electrically connected to the data line DL, the drain DE of the control unit CU may be electrically connected to the light-emitting unit LEU, and the gate GE of the control unit CU may be electrically connected to the scan line SL. When the scan line SL transmits a switch signal to the control unit CU and turns on the control unit CU, the data line DL can transmit a brightness signal to the light-emitting unit LEU through the control unit CU, thereby controlling the light emission of the light-emitting unit LEU, but this is not limited to this. Figure 1 As shown, the data line DL1 can be electrically connected to all first light-emitting units LEU1 located in the same column on the first direction DR1, so the brightness signal of the first light-emitting units LEU1 in that column can be transmitted through the data line DL1, but this is not a limitation. In addition, the light-emitting device 100 of this embodiment may also include a power line PL for electrically connecting a voltage source (not shown) to the light-emitting units LEU to provide voltage or current, but this is not a limitation.

[0029] like Figure 1 and Figure 2As shown, according to this embodiment, the data line DL and power line PL of the light-emitting device 100 can extend from the first surface FS of the substrate SB to the edge of the substrate SB, and through the side surface SS of the substrate SB to the second surface RS of the substrate SB. The data line DL and power line PL can each be electrically connected to a corresponding bonding pad BP at the second surface RS of the substrate SB, wherein the position of the bonding pad BP can substantially define the bonding area BA1 of the light-emitting device 100, or the position of the bonding area BA1 can substantially overlap with the position of the bonding pad BP. In this embodiment, the bonding area BA1 can be the area where any suitable external electronic component is bonded to the light-emitting device 100. That is, an external electronic component (not shown) can be disposed on the second surface RS of the substrate SB of the light-emitting device 100. For example, the external electronic component may include a brightness control chip electrically connected to the data line DL to provide the aforementioned brightness signal, but is not limited thereto. In some embodiments, although Figure 1 Not shown, the bonding pad BP of the second surface RS of the light-emitting device 100 may be electrically connected to the scan line SL, and the external electronic components may include a gate switch control chip electrically connected to the scan line SL to provide the aforementioned switching signal. In some embodiments, the external electronic components may include other electronic components suitable for application to the light-emitting device 100.

[0030] Please refer to Figures 3 to 5 , Figures 3 to 4 This is a schematic diagram showing the configuration of the test switch element of the electronic device according to the first embodiment of the present invention. Figure 5 This is a circuit diagram of an electronic device according to a first embodiment of the present invention. For the sake of simplicity, the accompanying drawings are... Figure 3 and Figure 4 The signal lines (data line DL, scan line SL), test signal line TL, etc., are omitted. Figure 3 As shown, the light-emitting device 100 can be divided into multiple pixel areas PU, which can be an array PA composed of pixels arranged along the first direction DR1 and pixels arranged along the second direction DR2.

[0031] The light-emitting device 100 may include multiple light-emitting units (LEUs), multiple control units (CUs), and multiple test switching elements (TUs). According to some embodiments, at least one light-emitting unit (LEU), at least one control unit (CU), and at least one test switching element (TU) are disposed within a pixel region (PU), and their connection relationships are as described above and will not be repeated here. The multiple pixel regions (PUs) may include multiple pixel columns (PCs) arranged along a first direction DR1, for example, a first pixel column PC1, a second pixel column PC2, and a third pixel column PC3 arranged along the first direction DR1, but are not limited thereto. The first pixel column PC1 may include pixel regions PU1, PU2, and PU3; the second pixel column PC2 may include pixel regions PU4, PU5, and PU6; and the third pixel column PC3 may include pixel regions PU7, PU8, and PU9. According to this embodiment, at least one test switching element (TU) may be provided in each pixel column PC to test the light-emitting units (LEUs) of all pixel regions (PUs) in that pixel column PC. Specifically, as... Figure 3 As shown, the test switch element TU may include a first test switch element TUa, a second test switch element TUb, and a third test switch element TUc. The first test switch element TUa may be located within the first pixel column PC1, the second test switch element TUb may be located within the second pixel column PC2, and the third test switch element TUc may be located within the third pixel column PC3, but is not limited thereto. Therefore, the first test switch element TUa can be used to test the light-emitting units (LEUs) of all pixel areas PU in the first pixel column PC1, the second test switch element TUb can be used to test the light-emitting units (LEUs) of all pixel areas PU in the second pixel column PC2, and the third test switch element TUc can be used to test the light-emitting units (LEUs) of all pixel areas PU in the third pixel column PC3.

[0032] In addition, such as Figure 3 As shown, the pixel area PU may include multiple pixel rows PR arranged along the second direction DR2, for example, including a first pixel row PR1, a second pixel row PR2, and a third pixel row PR3. The first pixel row PR1 includes, for example, pixel areas PU1, PU4, PU7, and the pixel area to its right (not shown); the second pixel row PR2 includes, for example, pixel areas PU2, PU5, PU8, and the pixel area to its right (not shown); and the third pixel row PR3 includes, for example, pixel areas PU3, PU6, PU9, and the pixel area to its right (not shown). According to this embodiment, test switch elements TU located in different pixel columns PC can be disposed in different pixel rows PR. For example, such as... Figure 3As shown, the first test switch element TUa can be located within the first pixel row PR1, the second test switch element TUb can be located within the second pixel row PR2, and the third test switch element TUc can be located within the third pixel row PR3, but is not limited thereto. Since the test switch elements TU in different pixel columns PC can be set in different pixel rows PR, the flexibility in setting other components of the light-emitting device 100 can be increased, thereby improving the spatial configuration of the light-emitting device 100. For example... Figure 3 As shown, the first test switch element TUa can be disposed within the pixel area PU1, the second test switch element TUb can be disposed within the pixel area PU5, and the third test switch element TUc can be disposed within the pixel area PU9, but is not limited thereto. According to some embodiments, the test switch elements TU can be disposed without overlapping or staggered in the first direction DR1 and the second direction DR2, that is, the space occupied by the test switch elements TU in the display area DA can be more dispersed, thus increasing the flexibility of the placement of other components of the light-emitting device 100, thereby improving the spatial configuration of the light-emitting device 100.

[0033] According to some embodiments, the first test switch element TUa and the second test switch element TUb can be arranged in different columns, for example, Figure 3 As shown, the first test switch element TUa can be disposed within the first pixel column PC1, and the second test switch element TUb can be disposed within the second pixel column PC2. According to some embodiments, the first test switch element TUa and the second test switch element TUb can be disposed in different rows, for example, Figure 3 As shown, the first test switch element TUa can be disposed within the first pixel row PR1, and the second test switch element TUb can be disposed within the second pixel row PR2. According to some embodiments, the first test switch element TUa and the second test switch element TUb can be disposed within different pixel columns but the same pixel row. According to some embodiments, the first test switch element TUa and the second test switch element TUb can be disposed within different pixel rows but the same pixel column.

[0034] like Figure 3 As shown, the plurality of pixel regions PU may include a first pixel row PR1 and a second pixel row PR2 arranged along the second direction DR2. According to some embodiments, the first test switch element TUa and the second test switch element TUb may be arranged in different columns, for example, Figure 3 As shown, the first test switch element TUa can be disposed within the first pixel column PC1, and the second test switch element TUb can be disposed within the second pixel column PC2. According to some embodiments, the first test switch element TUa and the second test switch element TUb can be disposed in different rows, for example, Figure 3As shown, the first test switch element TUa can be disposed within the first pixel row PR1, and the second test switch element TUb can be disposed within the second pixel row PR2. According to some embodiments, the first test switch element TUa and the second test switch element TUb can be disposed within different pixel columns but the same pixel row. According to some embodiments, the first test switch element TUa and the second test switch element TUb can be disposed within different pixel rows but the same pixel column.

[0035] like Figure 4 As shown, the light-emitting device can be divided into multiple sub-pixel regions. A pixel region PU may include at least two sub-pixel regions. For example, the aforementioned first pixel column PC1 may include multiple first sub-pixel regions SPU1 and multiple second sub-pixel regions SPU2 arranged along a first direction DR1. According to some embodiments, more specifically, the aforementioned first pixel column PC1 may include multiple first sub-pixel regions SPU1, multiple second sub-pixel regions SPU2, and multiple third sub-pixel regions SPU3 arranged along a first direction DR1. Figure 5 As shown, at least one first light-emitting unit LEU1, at least one control unit CU1, and at least one test switch element TUa can be disposed within a first sub-pixel region SPU1, and their connection relationship is as described above, and will not be repeated here. The first light-emitting unit LEU1 included in the first sub-pixel region SPU1 and the second light-emitting unit LEU2 included in the second sub-pixel region SPU2 can be the same color or different colors, and the present invention is not limited thereto. According to some embodiments, the first light-emitting unit LEU1 included in the first sub-pixel region SPU1, the second light-emitting unit LEU2 included in the second sub-pixel region SPU2, and the third light-emitting unit LEU3 included in the third sub-pixel region SPU3 can be different colors, for example, they can emit red light, green light, and blue light respectively, and the present invention is not limited thereto. A first sub-pixel region SPU1, a second sub-pixel region SPU2, and a third sub-pixel region SPU3 can constitute a pixel region PU of the light-emitting device 100.

[0036] like Figure 1 As shown, according to this embodiment, the test switch element TU can be electrically connected to the data line DL, and then electrically connected to the control unit CU and the light-emitting unit LEU via the data line DL. Specifically, the test switch element TU in this embodiment may include, for example, a thin-film transistor element, and may include a gate GA, a source SO, and a drain DR, wherein the drain DR of the test switch element TU can be electrically connected to the data line DL, and then electrically connected to the control unit CU and the light-emitting unit LEU electrically connected to the data line DL, but is not limited thereto. In addition, the light-emitting device 100 in this embodiment may also include multiple test signal lines TL, disposed on the substrate SB, wherein the gate GA and the source SO of the test switch element TU can be electrically connected to their respective test signal lines TL. Figure 1 and Figure 2 As shown, the test signal line TL, electrically connected to the test switch element TU, can extend from the first surface FS of the substrate SB to the edge of the substrate SB, and then downwards along the side surface SS of the substrate SB to the second surface RS of the substrate SB. The material of the test signal line TL can be referenced to the materials of the data line DL and the scan line SL described above, and therefore will not be repeated. Furthermore, as... Figure 2 As shown, in this embodiment, the test signal lines TL at the second surface RS of the substrate SB can each be electrically connected to the corresponding test pad TP via bonding pad BP. That is, the test signal line TL can be electrically connected between the test pad TP and the test switch element TU. Therefore, the test pad TP can be electrically connected to the light-emitting unit LEU via the test signal line TL, the test switch element TU, the data line DL, and the control unit CU, but is not limited thereto. Furthermore, as Figure 2 As shown, the second surface RS of the substrate SB may include a bonding area BA2 in addition to the bonding area BA1 mentioned above. The position of the bonding area BA2 may roughly correspond to the position of the bonding pad BP between the test pad TP and the test signal line TL, so that when external electronic components are placed in the bonding area BA2, they can be electrically connected to the bonding pad BP and the test signal line TL, but this is not a limitation.

[0037] like Figure 1 As shown, in this embodiment, a test switch element TU can be electrically connected to a data line DL, thereby testing all light-emitting units (LEUs) electrically connected to the data line DL. More specifically, as... Figure 1As shown, the drain DR of test switch element TU1 can be electrically connected to data line DL1, the source SO of test switch element TU1 can be electrically connected to test signal line Q1, and the gate GA of test switch element TU1 can be electrically connected to test signal line QV. When testing the light-emitting unit LEU, test signal line QV can transmit a switching signal (e.g., a voltage signal or a current signal) to the gate GA of test switch element TU1, thereby turning on test switch element TU1. At this time, a test signal can be transmitted through test signal line Q1, which can be transmitted through test signal line Q1, test switch element TU1, data line DL1, and control unit CU1 to all first light-emitting units LEU1 electrically connected to data line DL1, thereby testing all first light-emitting units LEU1 electrically connected to data line DL1. That is, during the testing phase, the test signal transmitted by test switch element TU1 can replace the brightness signal transmitted by data line DL1. When not testing, test switch element TU1 can be turned off. Similarly, during the testing phase of the light-emitting units (LEUs), the test signal line QV can transmit a switching signal to the gate GA of the test switching element TU2, and through the test signal line Q2, the test switching element TU2, the data line DL2, and the control unit CU2, transmit a test signal to all the second light-emitting units (LEU2s) electrically connected to the data line DL2, thereby testing all the second light-emitting units (LEU2s) electrically connected to the data line DL2; while the test signal line QV can transmit a switching signal to the gate GA of the test switching element TU3, and through the test signal line Q3, the test switching element TU3, the data line DL3, and the control unit CU3, transmit a test signal to all the third light-emitting units (LEU3s) electrically connected to the data line DL3, thereby testing all the third light-emitting units (LEU3s) electrically connected to the data line DL3. The aforementioned switching signals and test signals can be provided, for example, by external electronic components, which can be, for example, installed in... Figure 2 The bonding area BA2 shown is electrically connected to the test signal line TL, but this is not a limitation. Furthermore, the test pad TP, located on the second surface RS of the substrate SB, can be used to perform a light-on test after the light-emitting unit (LEU) is placed on the substrate SB to confirm whether the LEU is damaged, thereby improving the pass rate of the light-emitting device 100.

[0038] In conventional light-emitting devices, test elements are typically located in the peripheral area. However, such a configuration can result in an excessively large peripheral area, thus reducing the screen-to-body ratio. In contrast, since the test switch element TU of this invention can be located within the display area DA of the substrate SB, the space requirement of the peripheral area of ​​the light-emitting device 100 can be reduced. Furthermore, since the components included in the light-emitting device 100 (e.g., light-emitting unit LEU, control unit CU, and / or test switch element TU) can be located within the display area DA, and external electronic components and signal lines, test signal lines TL, etc., can extend to the second surface RS of the substrate SB, the light-emitting device 100 may not include a peripheral area or may include only a very small peripheral area. In other words, the display area DA of the light-emitting device 100 can substantially overlap with the surface area of ​​the substrate SB, thereby increasing the screen-to-body ratio of the light-emitting device 100 and improving its display effect. It should be noted that the phrase "the display area DA can substantially overlap with the surface area of ​​the substrate SB" means that the area of ​​the display area DA is approximately the same as the area of ​​the surface area of ​​the substrate SB, but may include differences caused by manufacturing tolerances of the light-emitting device 100. Furthermore, when conventional light-emitting devices are used in splicing display devices, the placement of test elements in the peripheral area may hinder splicing, or the resulting splicing display device may exhibit gaps, thus affecting the display. Alternatively, to reduce the gaps in the splicing display device, the peripheral area (including the test elements) of the conventional light-emitting device may be removed before splicing. However, this approach prevents the testing of the light-emitting units in subsequent processes, thereby affecting the yield rate of the splicing display device. In contrast, in this embodiment, since the test switch element TU can be placed within the display area DA, the space requirement of the peripheral area of ​​the light-emitting device 100 is reduced. Therefore, when the light-emitting device 100 is used in a splicing display device, the gaps in the resulting splicing display device can be reduced, thereby improving the user experience. In addition, after the light-emitting devices 100 are spliced, the test switch element TU placed within the display area DA can also test the light-emitting units LEU. In this way, the yield rate of the splicing display device formed by the light-emitting device 100 of the present invention can be improved.

[0039] It should be noted that, Figure 1 The structure of the test switch element TU arranged within the display area DA is shown only as an example, and the arrangement of the test switch element TU in this embodiment is not necessarily the same. Figure 1 The arrangement shown is for illustrative purposes only. The placement of the test switch element TU within the display area DA in this embodiment will be described in detail below.

[0040] It should be noted that the number of test switch elements TU included in each pixel column PC in this embodiment can be adjusted according to the design of the pixel area PU, and is not fixed. Figure 3 The above is for reference only. For example, such as... Figure 4 As shown, when the pixel region PU includes the aforementioned first sub-pixel region SPU1, second sub-pixel region SPU2, and third sub-pixel region SPU3, each pixel column PC may include a plurality of first sub-pixel regions SPU1, a plurality of second sub-pixel regions SPU2, and a plurality of third sub-pixel regions SPU3 arranged along the first direction DR1. In this case, each pixel column PC may, for example, include three test switch elements TU, respectively located in one of the first sub-pixel regions SPU1, one of the second sub-pixel regions SPU2, and one of the third sub-pixel regions SPU3 of the pixel column PC. Taking the first pixel column PC1 as an example, the first pixel column PC1 may include three test switch elements TU, respectively located in the first sub-pixel regions SPU1, second sub-pixel regions SPU2, and third sub-pixel regions SPU3 of the pixel region PU1, but this is not a limitation. According to this embodiment, the test switch elements TU disposed in the first sub-pixel regions SPU1 of the pixel region PU1 may be electrically connected to all the first sub-pixel regions SPU1 in the first pixel column PC1 and used to test the first light-emitting unit LEU1 in the plurality of first sub-pixel regions SPU1. Similarly, the test switch element TU disposed in the second sub-pixel area SPU2 of pixel area PU1 can be used to test the second light-emitting unit LEU2 of all second sub-pixel areas SPU2 in the first pixel column PC1, while the test switch element TU disposed in the third sub-pixel area SPU3 of pixel area PU1 can be used to test the third light-emitting unit LEU3 of all third sub-pixel areas SPU3 in the first pixel column PC1.

[0041] Figure 5 A circuit diagram of the pixel region PU, including the test switching element TU, is shown in this embodiment. For example, Figure 5 For example, Figure 4 The circuit diagram of pixel area PU1 shown is not limited to this. Figure 5 As shown, pixel area PU1 may include a first sub-pixel area SPU1, a second sub-pixel area SPU2, and a third sub-pixel area SPU3. The first sub-pixel area SPU1 includes a first light-emitting unit LEU1 and a control unit CU1; the second sub-pixel area SPU2 may include a second light-emitting unit LEU2 and a control unit CU2; and the third sub-pixel area SPU3 may include a third light-emitting unit LEU3 and a control unit CU3. Furthermore, the first light-emitting unit LEU1 can be electrically connected to data line DL1 via control unit CU1, the second light-emitting unit LEU2 can be electrically connected to data line DL2 via control unit CU2, and the third light-emitting unit LEU3 can be electrically connected to data line DL3 via control unit CU3. According to this embodiment, as... Figure 5As shown, the first sub-pixel area SPU1, the second sub-pixel area SPU2, and the third sub-pixel area SPU3 may also include a capacitor element CP, a driving unit DRU, and a switch control unit SW, respectively. The driving unit DRU and the switch control element SW may be electrically connected between the light-emitting unit LEU and the control unit CU, but are not limited thereto. The capacitor element CP can be used to maintain the voltage of the light-emitting unit LEU to ensure its normal display. One end of the capacitor element CP may be electrically connected to the gate of the driving unit DRU, and the other end may be electrically connected to the source of the driving unit DRU, but are not limited thereto. The gate of the driving unit DRU may be electrically connected to the drain DE of the control unit CU, the source of the driving unit DRU may be electrically connected to a voltage source (e.g., power line PL), and the drain of the driving unit DRU may be electrically connected to the source of the switch control unit SW. When the control unit CU transmits a brightness signal to the gate of the driving unit DRU and turns on the driving unit DRU, the driving unit DRU may transmit a voltage signal or a current signal to the drain of the switch control unit SW. The gate of the switch control unit SW is connected to the brightness control line EM, and the drain of the switch control unit SW is connected to the light-emitting unit LEU. By controlling the switch control unit SW via the brightness control line EM, the light emission of the light-emitting unit LEU can be controlled. It should be noted that the driving circuit in the light-emitting device 100 of this invention does not... Figure 5 The description is limited to what is shown, but may include any suitable drive circuit.

[0042] Please refer to Figures 6 to 8 , Figures 6 to 7 This is a schematic diagram showing the configuration of the test switch element in the electronic device according to the second embodiment of the present invention. Figure 8 This is a circuit diagram of an electronic device according to a second embodiment of the present invention. For the sake of simplicity, the accompanying drawings are... Figure 6 and Figure 7 The signal lines (data line DL, scan line SL), test signal line TL, and other components are omitted. Furthermore, Figure 6 , Figure 7 and Figure 8 The features of the components shown can be referred to the above. Figure 3 , Figure 4 and Figure 5 The content is already covered, so I won't repeat it here. For example... Figure 7 As shown, the pixel area PU in this embodiment may include a first sub-pixel area SPU1, a second sub-pixel area SPU2, and a third sub-pixel area SPU3. In a pixel column PC, three test switch elements TU can be provided, which may be located respectively within one of the first sub-pixel areas SPU1, one of the second sub-pixel areas SPU2, and one of the third sub-pixel areas SPU3 in the pixel column PC. According to this embodiment, the three test switch elements TU in a pixel column PC may be respectively provided in different pixel rows PR of the pixel column PC. For example, as... Figure 6 and Figure 7 As shown, in the first pixel column PC1, the first test switch element TUa can be located within the first sub-pixel area SPU1, and the third test switch element TUc can be located within the second sub-pixel area SPU2. In the second pixel column PC1, the second test switch element TUb can be located within the first pixel row PR1. The first test switch element TUa can also be located within the first pixel row PR1. The first test switch element TUa can be located within the first pixel row PR1, while the third test switch element TUc can be located within a second pixel row PR2, which is different from the first pixel row PR1, but this is not a limitation.

[0043] like Figure 7 As shown, in addition, in the first pixel column PC1, a test switch element TU can also be set in the third sub-pixel area SPU3, and it can be located in the third pixel row PR3, which is different from the first pixel row PR1 and the second pixel row PR2. The setting method of the test switch element TU in the second pixel column PC2 and the third pixel column PC3 is similar to that in the first pixel column PC1, so it will not be described again. In some embodiments, the three test switch elements TU in the first pixel column PC1 (or the second pixel column PC2 and the third pixel column PC3) can be located in any three pixel areas PU of the first pixel column PC1 (or the second pixel column PC2 and the third pixel column PC3), and are not necessarily located in the same position. Figure 6 and Figure 7 The above is the limit.

[0044] Furthermore, according to the arrangement of the test switch element TU in this embodiment, test switch elements TU located in different pixel columns PC can be located in the same pixel row PR in the second direction DR2. For example, such as Figure 6 and Figure 7 As shown, the first test switch element TUa located in the first sub-pixel area SPU1 in the first pixel column PC1 and the second test switch element TUb located in the first sub-pixel area SPU1 in the second pixel column PC2 can also be located in the first pixel row PR1, but are not limited thereto.

[0045] According to some embodiments, such as Figure 7As shown, the first pixel column PC1 includes a plurality of first sub-pixel areas SPU1 and a plurality of second sub-pixel areas SPU2 arranged along a first direction DR1. A first test switch element TUa may be disposed in one of the plurality of first sub-pixel areas SPU1, and a third test switch element TUc may be disposed in one of the plurality of second sub-pixel areas SPU2. According to some embodiments, the first test switch element TUa and the third test switch element TUc may be disposed in different pixel rows. For example, the first test switch element TUa may be disposed in the first pixel row PR1, and the third test switch element TUc may be disposed in the second pixel row PR2. Furthermore, within the first pixel column PC1, the test switch element TUa may be disposed in the third pixel row PR3. According to some embodiments, within the first pixel column PC1, a first light-emitting unit may be disposed in the first sub-pixel area SPU1, a second light-emitting unit may be disposed in the second sub-pixel area SPU2, and a third light-emitting unit may be disposed in the third sub-pixel area SPU3. The first, second, and third light-emitting units may be different colors, for example, emitting red, green, and blue light, but are not limited thereto. According to some embodiments, the first, second, and third light-emitting units may, for example, emit the same light.

[0046] Figure 8 It shows Figure 6 and Figure 7 The circuit structure of pixel areas PU1, PU2, and PU3. (Example) Figure 8 As shown, the test switch element TU (i.e., the first test switch element TUa) located in the first sub-pixel area SPU1 of pixel area PU1 can be electrically connected to the first light-emitting unit LEU1 of all first sub-pixel areas SPU1 in pixel column PC1 via data line DL1, thereby testing the plurality of first light-emitting units LEU1. Similarly, the test switch element TU (i.e., the third test switch element TUc) located in the second sub-pixel area SPU2 of pixel area PU2 can be electrically connected to the second light-emitting unit LEU2 of all second sub-pixel areas SPU2 in pixel column PC1 via data line DL2, thereby testing the plurality of second light-emitting units LEU2; and the test switch element TU located in the third sub-pixel area SPU3 of pixel area PU3 can be electrically connected to the third light-emitting unit LEU3 of all third sub-pixel areas SPU3 in pixel column PC1 via data line DL3, thereby testing the plurality of third light-emitting units LEU3. It should be noted that, although Figures 6 to 8 In the illustrated structure, different pixel columns PC have the same configuration of the test switch element TU, but this invention is not limited thereto. In this invention, different pixel columns PC can have different configurations of the test switch element TU. For example, in some embodiments, the test switch element TU in the first pixel column PC1 can be... Figures 6 to 8The setup is as shown, and the test switch element TU in the second pixel column PC2 can... Figures 3 to 5 The settings are as shown, but not limited to them.

[0047] According to this embodiment, since different test switch elements TU in the same pixel column PC may not be located in the same pixel row PR in the second direction DR2, the test switch elements TU can be more dispersed in the display area DA, thereby increasing its design flexibility. In addition, the impact of the test switch elements TU on the display effect of the light-emitting device 100 can be reduced. Furthermore, since different test switch elements TU in the same pixel column PC can be respectively set to correspond to the sub-pixel area including the light-emitting unit LEU they are testing, the design of the test switch elements TU and related wiring can be simplified, thereby simplifying the manufacturing process of the light-emitting device 100.

[0048] Please refer to Figure 9 and Figure 10 , Figure 9 This is a functional block diagram of the electronic device according to the third embodiment of the present invention. Figure 10 This is a circuit diagram of an electronic device according to a third embodiment of the present invention. It should be noted that, although... Figure 9 The setup of the test switch element TU shown is the same as Figures 6 to 8 The illustrated embodiments are the same, but the present invention is not limited thereto. According to this embodiment, the light-emitting device 100 may include an anti-static element PE in addition to the elements described above, disposed on the first surface FS of the substrate SB. Specifically, the anti-static element PE of this embodiment may be disposed at the outermost edge of the display area DA. For example, the anti-static element PE may be disposed outside the outermost pixel area PU. According to some embodiments, the anti-static element PE may surround all multiple pixel areas PU and form a frame structure. According to some embodiments, the anti-static element PE and the display area DA may have a distance between them. Specifically, the anti-static element PE may surround the test switch element TU within the pixel area PU. The anti-static element PE of this embodiment may include any suitable type of electrostatic discharge (ESD) protection element, such as an ESD diode, but is not limited thereto. Figure 10 One embodiment of an ESD protection element is shown. It should be noted that, for the sake of simplicity, the accompanying drawings... Figure 10 Only the anti-static element PE on one side of the display area DA is shown, but the invention is not limited thereto. Figure 10 As shown, the signal lines (e.g., data line DL, but not limited thereto) and test signal lines TL of the light-emitting device 100 can be electrically connected to the anti-static element PE (ESD protection circuit). In this way, the signal lines and test signal lines TL can be protected by the anti-static element PE, thereby reducing the probability of damage to the signal lines and test signal lines TL due to electrostatic discharge. It should be noted that although... Figure 10 Not shown, the scan line SL of the light-emitting device 100 can also be electrically connected to the anti-static element PE, thereby protecting the scan line SL through the anti-static element. According to some embodiments, the anti-static element PE can be disposed on the first surface FS of the substrate SB, in an area other than the display area DA.

[0049] In summary, this invention provides a light-emitting device including a test switch element disposed within a display area. Accordingly, the space requirement of the light-emitting device in the surrounding area can be reduced, or the light-emitting device may not include a surrounding area, thereby increasing the screen-to-body ratio of the light-emitting device. Furthermore, the gaps in the spliced ​​display device formed by the light-emitting device of this invention can be reduced, thereby improving the user experience. Moreover, after splicing the light-emitting devices of this invention, the light-emitting elements can be tested using the test switch element disposed within the display area. In this way, the pass rate of the spliced ​​display device formed by the light-emitting device of this invention can be improved.

[0050] The above description is merely an embodiment of the present invention and is not intended to limit the invention. Those skilled in the art will recognize that the present invention can have various modifications and variations. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. An electronic device, characterized by comprising: The electronic device comprises: a substrate comprising a first surface and a second surface opposite to the first surface, wherein the first surface comprises an active area; an electronic unit disposed on the substrate and located in the active area; a data line disposed on the substrate; a control unit disposed on the substrate and located in the active area, the control unit being electrically connected between the electronic unit and the data line; a test pad disposed on the second surface of the substrate; and a test switch element disposed on the substrate and located in the active area, the test switch element being electrically connected between the data line and the test pad. 2.The electronic device of claim 1, wherein, The electronic device comprises: a plurality of test switch elements, the plurality of test switch elements comprising a first test switch element and a second test switch element; wherein the electronic device is divided into a plurality of pixel areas, the plurality of pixel areas comprising a first pixel column and a second pixel column arranged along a first direction, wherein the first test switch element is disposed in the first pixel column and the second test switch element is disposed in the second pixel column. 3.The electronic device of claim 2, wherein, The plurality of pixel areas comprise a first pixel row and a second pixel row arranged along a second direction, wherein the first direction and the second direction are different, the first test switch element is disposed in the first pixel row, and the second test switch element is disposed in the second pixel row. 4.The electronic device of claim 2, wherein, The plurality of pixel areas comprise a first pixel row arranged along a second direction, wherein the first direction and the second direction are different, and the first test switch element and the second test switch element are disposed in the first pixel row. 5.The electronic device of claim 2, wherein, The first pixel column comprises a plurality of first sub-pixel areas and a plurality of second sub-pixel areas arranged along the first direction, and the plurality of test switch elements further comprise a third test switch element, wherein the first test switch element is disposed in one of the plurality of first sub-pixel areas, and the third test switch element is disposed in one of the plurality of second sub-pixel areas. 6.The electronic device of claim 5, wherein, The plurality of pixel areas comprise a first pixel row and a second pixel row arranged along a second direction, wherein the first direction and the second direction are different, the first test switch element is disposed in the first pixel row, and the third test switch element is disposed in the second pixel row. 7.The electronic device of claim 5, wherein, The electronic device comprises a plurality of electronic units, the plurality of electronic units comprising a first light-emitting unit and a second light-emitting unit, wherein the first light-emitting unit is located in one of the plurality of first sub-pixel areas, the second light-emitting unit is located in one of the plurality of second sub-pixel areas, and the first light-emitting unit and the second light-emitting unit are light-emitting units of different colors. 8.The electronic device of claim 5, wherein, The electronic device comprises a plurality of first electronic units, each disposed in one of the plurality of first sub-pixel areas of the first pixel column, and the plurality of first electronic units are electrically connected to the first test switch element. 9.The electronic device of claim 1, wherein, The electronic device further comprises a test signal line electrically connected between the test switch element and the test pad. 10.The electronic device of claim 1, wherein, The electronic unit is a light-emitting unit.

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