DCS panel cabinet automatic testing method, equipment, system and readable storage medium

Abstract

The present application discloses a method, device, system and readable storage medium for automatic testing of a DCS panel cabinet. The DCS panel cabinet includes a first controller and a plurality of card components. The method for automatic testing of the DCS panel cabinet includes: the test end obtains the DCS panel cabinet design drawing information; obtains the configuration information of the plurality of card components through the first controller; verifies whether the configuration information matches the DCS panel cabinet design drawing information setting; if not, issues an error message so as to adjust the configuration information and verify again; if yes, creates a test sequence logic according to the configuration information and generates a test instruction; according to the test instruction, according to the test sequence logic, automatically performs a card function test on the plurality of card components. The method for automatic testing of the DCS panel cabinet provided by the present application automatically completes the card function test according to the test sequence logic by automatically identifying the card type. Through the automation control of the industrial process, the efficiency of the factory test of the DCS panel cabinet is improved.

Description

Technical Field

[0001] The present invention relates to the field of industrial process automation control, and in particular to a DCS panel cabinet automatic testing method, equipment, system and readable storage medium. Background Art

[0002] DCS (Distributed Control System) is short for distributed control system, also known as a distributed control system. A DCS system is a new control system developed from the perspective of integrated automation to meet the requirements of large-scale industrial production and increasingly complex process control. It combines process control and process monitoring, incorporating the 4C technologies of computer, communication, display (CRT), and control.

[0003] The basic structure of a DCS system consists of four levels: field level, control level, monitoring level, and management level. The field level mainly includes various process channel cards or modules, so the DCS system exists in the form of panel cabinet assembly on site.

[0004] DCS cabinets need to pass strict testing before leaving the factory. However, the inventors have found that the current factory testing of DCS cabinets has the following problems.

[0005] 1. There are many types and quantities of IO cards inside the DCS panel cabinet. The test platform needs to identify the address and type of the IO plug-in in each slot. Therefore, the test platform needs to integrate multiple plug-ins / devices accordingly. The operation is relatively cumbersome and costly.

[0006] 2. The DCS panel cabinet contains a large number of interfaces with multiple terminals and different functions. During the testing process, the test platform requires too many connecting wires, which is not only prone to errors in the tedious wiring, but also requires manual verification after the wiring is completed, which is time-consuming and labor-intensive.

[0007] 3. The DCS panel cabinet is in default configuration / empty configuration during factory testing, without data collection, transmission and other functions. Therefore, the test platform needs to provide additional corresponding configuration. Summary of the Invention

[0008] The present application discloses a DCS panel cabinet automatic testing method, equipment, system and readable storage medium, which can perform automated factory testing on DCS panel cabinets.

[0009] According to one aspect of the present application, a DCS panel cabinet automatic testing method is provided.

[0010] The method includes: a DCS panel cabinet includes a first controller and multiple cards, and the method includes: a test end obtains DCS panel cabinet design drawing information; obtains configuration information of the multiple cards through the first controller; verifies whether the configuration information matches the DCS panel cabinet design drawing information setting; if not, issues an error prompt so as to adjust the configuration information and perform verification again; if yes, creates a test sequence logic according to the configuration information and generates a test instruction; and automatically performs a card function test on the multiple cards according to the test instruction and the test sequence logic.

[0011] According to some embodiments of the present application, the test end is provided with multiple wiring terminals, multiple switching boards, multiple card type switching boards and multiple card type test sources, and the multiple wiring terminals are connected one-to-one with the multiple cards; the multiple wiring terminals are also connected one-to-one with the multiple switching boards, the switching boards are connected to the card type switching boards, and the card type switching boards are connected to the card type test sources to establish a test environment for the card to be tested; according to the test instructions, according to the test sequence logic, the card function test is automatically performed on the multiple cards, including: the test end executes the instructions in the test instruction set corresponding to the card type of the card to be tested in the test environment of the card to be tested according to the test instructions and the test sequence logic.

[0012] According to some embodiments of the present application, the card types of the plurality of cards include AO card types, AI card types, DO card types, DI card types and thermal resistance acquisition card types; the switching boards of the plurality of card types include AO switching boards, AI switching boards, DO switching boards, DI switching boards and RTD switching boards; the test sources of the plurality of card types include AO test sources, AI test sources, DO test sources, DI test sources and RTD test sources; the test instruction set of the AO card type includes: switching board closing instruction, AI switching board closing instruction, AO card output instruction, AI test source delayed sampling instruction, AI switching board disconnect instruction and switching board disconnect instruction; the test instruction set of the AI ​​card type includes: switching board closing instruction, AO switching board closing instruction, A O test source output instruction, AI card delayed reading instruction, AO switching board disconnect instruction and switching board closing instruction; the test instruction set for DO card types includes: switching board closing instruction, DI switching board closing instruction, DO card output instruction, DI test source delayed sampling instruction, DI switching board disconnect instruction and switching board disconnect instruction; the test instruction set for DI card types includes: switching board closing instruction, DO switching board closing instruction, DO test source output instruction, DI card delayed reading instruction, DO switching board disconnect instruction and switching board closing instruction; the test instruction set for thermal resistor acquisition card types includes: switching board closing instruction, RTD switching board closing instruction, thermal resistor acquisition card reading instruction, switching board disconnect instruction and RTD switching board disconnect instruction.

[0013] According to some embodiments of the present application, the configuration information includes a card branch number, a slot number, and a card type code.

[0014] According to another aspect of the present application, a DCS panel cabinet automatic testing device is provided. The DCS panel cabinet includes a first controller and multiple cards. The device includes: an information acquisition device, which acquires DCS panel cabinet design drawing information and sends the DCS panel cabinet design drawing information; a control and measurement center, which is communicated with the information acquisition device and receives the DCS panel cabinet design drawing information. The control and measurement center is also communicated with the first controller and acquires configuration information of multiple cards through the first controller; the control and measurement center also verifies whether the configuration information matches the DCS panel cabinet design drawing information. If the verification result is no, an error prompt is issued so that the configuration information can be adjusted and verified again; if the verification result is yes, a test sequence logic is created according to the configuration information, and a test instruction is generated; a testing device, which is communicated with the control and measurement center, receives the test instruction, and automatically performs card function testing on multiple cards according to the test sequence logic.

[0015] According to some embodiments of the present application, the testing device includes: a second controller, which receives test instructions; a first signal switching device, which includes multiple wiring terminals and multiple switching boards, the multiple wiring terminals are connected one-to-one with multiple card components, and the multiple wiring terminals are also connected one-to-one with multiple switching boards; a first control board, which controls the closing and disconnection of the multiple switching boards of the first signal switching device according to the instructions of the second controller; a second signal switching device, which includes multiple card type switching boards, and the second signal switching device is connected to the first signal switching device; the second control board, which controls the closing and disconnection of the multiple switching boards of the first signal switching device according to the instructions of the second controller; multiple card type test sources, and the card type switching boards are connected to the card type test sources; the testing device executes the instructions in the test instruction set corresponding to the card types of the multiple cards through the first controller or the second controller in accordance with the test sequence logic according to the test instructions.

[0016] According to some embodiments of the present application, the card types of multiple cards include AO card types, AI card types, DO card types, DI card types and thermal resistance acquisition card types; the switching boards of multiple card types include AO switching boards, AI switching boards, DO switching boards, DI switching boards and RTD switching boards; the test sources of multiple card types include AO test sources, AI test sources, DO test sources, DI test sources and RTD test sources; when the test card type is AO card type, the control and measurement center sends out the switching board closing instruction, AI switching board closing instruction, AO card output instruction, AI test source delayed sampling instruction, AI switching board disconnect instruction and switching board disconnect instruction in sequence, and the first controller or the second controller executes the corresponding instructions; when the test card type is AI card type, the control and measurement center sends out the switching board closing instruction, AO switching board closing instruction, AO test source output instruction, AI card delayed reading instruction, AO switching board disconnect instruction and disconnect instruction in sequence. The switch board closing instruction is issued, and the first controller or the second controller executes the corresponding instruction; when the test card type is a DO card type, the control and measurement center sequentially issues the switch board closing instruction, the DI switch board closing instruction, the DO card output instruction, the DI test source delayed sampling instruction, the DI switch board disconnect instruction and the switch board disconnect instruction, and the first controller or the second controller executes the corresponding instruction; when the test card type is a DI card type, the control and measurement center sequentially issues the switch board closing instruction, the DO switch board closing instruction, the DO test source output instruction, the DI card delayed reading instruction, the DO switch board disconnect instruction and the switch board closing instruction, and the first controller or the second controller executes the corresponding instruction; when the test card type is a thermal resistor acquisition card type, the control and measurement center sequentially issues the switch board closing instruction, the RTD switch board closing instruction, the thermal resistor acquisition card reading instruction, the switch board disconnect instruction and the RTD switch board disconnect instruction, and the first controller or the second controller executes the corresponding instruction.

[0017] According to some embodiments of the present application, the DCS panel cabinet automatic test equipment further includes: a switch for performing instruction / data exchange between the control and measurement center and the first controller, and between the control and measurement center and the second controller.

[0018] According to some embodiments of the present application, the first signal switching device and the second signal switching device are integrated into one through a bus backplane; or the first signal switching device and the second signal switching device are separately provided and connected through a bus.

[0019] According to another aspect of the present application, a non-volatile computer-readable storage medium is provided, on which a computer program is stored. The computer program enables the DCS panel cabinet automatic test equipment to implement the method described above.

[0020] According to another aspect of the present application, a DCS panel cabinet automatic testing system is also provided, comprising: one or more processors; a storage device for storing one or more programs; when the one or more programs are executed by one or more processors, the one or more processors implement the method described above.

[0021] The DCS panel cabinet automatic testing method provided in this application can automatically identify the configuration information of the card components of each branch in the DCS panel cabinet, and automatically create a test sequence logic based on the configuration information of the card components. Through the test sequence logic, the card component function test is completed in sequence for the card components of each branch, and a test report is generated based on the test results.

[0022] The automated DCS panel cabinet testing method provided in this application eliminates the need for complex wiring and manual verification. Instead, the test sequence logic calculated by an intelligent computer completes the functional testing of the card components. This enables automated control of industrial processes, saves manpower, and improves the efficiency of DCS panel cabinet factory testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0024] Figure 1 A schematic structural diagram 1000 of a conventional DCS panel cabinet is shown;

[0025] Figure 2 A flowchart 2000 of a DCS panel cabinet automatic testing method according to an exemplary embodiment of the present application is shown;

[0026] Figure 3 A structural schematic diagram 3000 of a DCS panel cabinet automatic test device according to an exemplary embodiment of the present application is shown;

[0027] Figure 4 A schematic diagram 4000 is shown of a connection between a DCS panel cabinet automatic test device and a DCS panel cabinet according to an exemplary embodiment of the present application;

[0028] Figure 5 A structural schematic diagram 5000 of a testing device according to an exemplary embodiment of the present application is shown.

[0029] Description of Reference Numerals

[0030] DCS panel cabinet 1; first controller 10; first branch 11; second branch 12; third branch 13;

[0031] DCS panel cabinet automatic test equipment 2; information acquisition device 21; control and measurement center 23; switch 25; test device 27;

[0032] Second controller 271; first signal switching device 273; connection terminal 2731; switching board 2733; second signal switching device 275; card type switching board 2751;

[0033] First control board 277; second control board 279; card type test source 270. DETAILED DESCRIPTION

[0034] Example embodiments will now be described more fully with reference to the accompanying drawings. However, example embodiments can be embodied in many forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete and will fully convey the concepts of the example embodiments to those skilled in the art. Like reference numerals in the drawings represent like or similar parts, and thus repetitive description thereof will be omitted.

[0035] The described features, structures or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, many specific details are provided to provide a full understanding of the embodiments of the present disclosure. However, those skilled in the art will appreciate that the technical solutions of the present disclosure may be practiced without one or more of these specific details, or other methods, components, materials, devices, etc. may be employed. In these cases, well-known structures, methods, devices, implementations, materials or operations will not be shown or described in detail.

[0036] Furthermore, the terms "include," "comprise," and "have," and any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or apparatus comprising a series of steps or elements is not limited to the listed steps or elements, but may optionally include steps or elements not listed, or may optionally include other steps or elements inherent to the process, method, product, or apparatus.

[0037] The terms "first", "second" and the like in the specification, claims and drawings of this application are used to distinguish different objects rather than to describe a specific order.

[0038] The following is a clear and complete description of the technical solution of this application in conjunction with the drawings in the embodiments of this application. Obviously, the embodiments described are part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without making any creative efforts are within the scope of protection of this application.

[0039] The DCS (Distributed Control System) is a distributed control system. The DCS system is an instrument control system based on a microprocessor and adopts the design principles of decentralized control functions, centralized display operations, and taking into account both division and autonomy and comprehensive coordination.

[0040] In industrial applications, a DCS system exists in the form of a DCS cabinet, which primarily includes various process channel cards or modules. The DCS cabinet also includes a first controller that connects to the multiple cards in the DCS cabinet to control their operation.

[0041] For example, Figure 1 A schematic diagram 1000 of the structure of a DCS panel cabinet in the prior art is shown. Figure 1 , Figure 1 The DCS panel cabinet 1 shown includes a first controller 10, which is connected to multiple branches. The multiple branches also include multiple card slots. Different types of cards can be set in the card slots. The first controller 10 is communicatively connected with the cards in the multiple card slots.

[0042] like Figure 1 As shown, the first controller 10 is connected to a first branch 11, a second branch 12, and a third branch 13. The first branch 11 has 10 card slots, such as slot 1 to slot 10, the second branch 12 has 8 card slots, such as slot 1 to slot 8, and the third branch 13 has 3 card slots, such as slot 1 to slot 3.

[0043] DCS cabinets must undergo factory testing before leaving the factory. This involves simulation testing and performance verification to ensure accurate configuration and proper functioning of all components. However, current factory testing of DCS cabinets relies on manual labor, requiring testing of multiple components and circuits within the cabinets. This leads to complex wiring, error-prone operation, and labor-intensive processes, resulting in inefficient DCS cabinet factory testing.

[0044] The present application provides a DCS panel cabinet automatic testing method and equipment thereof, which are used to perform automatic testing on DCS panel cabinets. The technical solution provided by the present application will be described in detail below in conjunction with the accompanying drawings of the specification.

[0045] According to one aspect of the present application, a DCS panel cabinet automatic testing method is provided. Figure 2 A flowchart 2000 of a DCS panel cabinet automatic testing method according to an exemplary embodiment of the present application is shown.

[0046] See also Figure 2 The method 2000 includes steps S100 to S600. Figure 1 and Figure 2 Flowchart 2000 describing the automatic testing method of a DCS panel cabinet.

[0047] In step S100, the test end obtains DCS panel cabinet design information.

[0048] For example, the test terminal can scan a graphic or number on the DCS cabinet 1 that can identify preset information, such as a cabinet QR code or barcode, and obtain DCS cabinet design information from the enterprise cloud by identifying the cabinet QR code. The DCS cabinet design information includes the design drawing data of the DCS cabinet. The DCS cabinet design drawing data includes information such as the types and location layout of multiple cards within the DCS cabinet.

[0049] In step S200, the test end obtains configuration information of multiple card components through the first controller.

[0050] According to an exemplary embodiment, the first controller 10 is in communication with the test end, and the test end obtains configuration information of multiple cards in each branch of the DCS panel cabinet through the first controller 10 .

[0051] Optionally, the configuration information of the card includes the card branch number (such as the first branch 11, the second branch 12 or the third branch 13, etc.), the slot number (such as slot1, solt2, solt3... etc.) and the card type code, and the card type code represents the type of the card.

[0052] In step S300, the test end verifies whether the obtained card configuration information matches the obtained DCS panel cabinet design drawing information.

[0053] In step S300, if the verification result is negative, the process proceeds to step S400, where the test terminal issues an error message so that the configuration information can be adjusted and the verification can be repeated.

[0054] According to an example embodiment, the test end matches the configuration information of the card component with the DCS panel cabinet design drawing information.

[0055] If the matching result is inconsistent, it means there is a problem with the assembly of the card inside the DCS cabinet, and the test end will issue an error prompt to remind the DCS cabinet tester that there is an error inside the DCS cabinet, so that the tester can adjust the relevant issues based on the error prompt content to correct the assembly discrepancy inside the DCS cabinet.

[0056] After the tester adjusts the configuration information of the DCS panel cabinet according to the error prompt, the test end verifies again until the configuration information of the card matches the DCS panel cabinet design information.

[0057] In step S300, if the verification result is yes, the process proceeds to step S500, where the test end creates a test sequence logic according to the configuration information and generates a test instruction.

[0058] In step S600, the test end automatically performs a card function test on multiple cards according to the test instruction and the test sequence logic.

[0059] According to an exemplary embodiment, if the verification result is positive, the test end automatically identifies the card type and sequence based on the configuration information and automatically creates a test sequence logic based on the card type and sequence. The test end then generates test instructions, using branches as the test unit and the cards within the branches as the basic unit for testing. The test end then completes the card function tests in a time-sharing manner according to the test sequence logic.

[0060] For example, the test end automatically identifies the card configuration combination of the first branch 11 as {slot 1: AI card, slot 2: AO card, slot 3: AI card, slot 4: AO card, slot 5: DI card, slot 6: DO card, slot 7: DI card, slot 8: DO card, slot 9: DI card, slot 10: DO card} through the first controller 10. The test end then generates the card test sequence logic for the first branch 11 based on the order of the cards in the card configuration combination: {AI card, AO card, AI card, AO card, DI card, DO card, DI card, DO card, DI card, DO card}.

[0061] The test end performs functional tests on the cards in the first branch 11 in a time-sharing manner according to the test instructions and the test sequence logic. The test end generates a test report based on the functional test results of the tested cards.

[0062] For example, a test report includes the DCS cabinet number, the branch and slot numbers of the tested card, and the functional test results. The test report can be indexed by the DCS cabinet number, branch number, and slot number of the tested card to query the test results for a specific card, making it easier for testers to review.

[0063] Through the above embodiment, the test end can automatically identify the configuration information of the card components of each branch in the DCS panel cabinet, and automatically create a test sequence logic based on the configuration information of the card components. Through the test sequence logic, the card component function test of each branch card component is completed in sequence, and a test report is generated based on the test results.

[0064] The test end automatically identifies the type of test card through an intelligent computer and generates a test sequence logic based on the card configuration combinations within the multiple branches of the DCS panel cabinet. The test end completes the card function test based on the test sequence logic, thereby realizing automated control of the industrial process, saving manpower, and improving the efficiency of DCS panel cabinet factory testing.

[0065] Optionally, the test end is provided with a plurality of wiring terminals, a plurality of switching boards, a plurality of card type switching boards and a plurality of card type test sources. The plurality of wiring terminals are connected to the plurality of cards in a one-to-one correspondence, and the plurality of wiring terminals are also connected to the plurality of switching boards in a one-to-one correspondence.

[0066] According to an exemplary embodiment, a branch in an existing DCS panel cabinet may have 10 card slots, so the test end can provide 10 wiring terminals. The wiring terminals are connected to the cards in the branch in a one-to-one correspondence. The principle of the line connection between the wiring terminals and the cards is that the wiring terminal sequence number corresponds to the card slot number in the branch.

[0067] For example, Figure 1 The following illustrates an embodiment in which the first controller 10 is located above each branch. If the first controller 10 is located above each branch, when the test terminal is testing a card in the first branch 11, terminals 1 through 10 are connected to solt1 through solt10, respectively. When the test terminal is testing a card in the second branch 12, terminals 1 through 8 are connected to solt1 through solt8, respectively, with terminals 9 and 10 left unused. When the test terminal is testing a card in the third branch 13, terminals 1 through 3 are connected to solt1 through solt3, respectively, with terminals 4 through 10 left unused.

[0068] According to an exemplary embodiment, if the first controller 10 in the DCS cabinet is located below each branch, when the test end is testing a card in the first branch 11, the 1st to 10th wiring terminals are connected to solt10 to solt1, respectively. When the test end is testing a card in the second branch 12, the 1st to 8th wiring terminals are connected to solt8 to solt1, respectively, and the 9th and 10th wiring terminals are left vacant. When the test end is testing a card in the third branch 13, the 1st to 3rd wiring terminals are connected to solt3 to solt1, respectively, and the 4th to 10th wiring terminals are left vacant.

[0069] According to an example embodiment, the plurality of connection terminals are further connected to the plurality of switch boards in a one-to-one correspondence.

[0070] For example, the test end also includes up to 10 switching boards, which have a one-to-one correspondence with the wiring terminals. When the wiring terminals are connected to the test card components in the DCS panel cabinet under test according to the line connection principle, the 10-way wiring terminals are connected to the 10 switching boards of the test end, thus establishing a physical connection between the DCS panel cabinet under test and the test end.

[0071] The test end establishes a closed-loop test environment with the designated card to be tested by controlling the closing and opening of the switching board. During the detection process, only one switching board is in the closed state.

[0072] According to an example embodiment, the switching board is connected to a card type switching board, and the card type switching board is connected to a card type test source.

[0073] According to an exemplary embodiment, the card types include AO cards, AI cards, DO cards, DI cards, and thermal resistance acquisition cards. The multiple card types include switching boards including AO switching boards, AI switching boards, DO switching boards, DI switching boards, and RTD switching boards. The multiple card types include test sources including AO test sources, AI test sources, DO test sources, DI test sources, and RTD test sources.

[0074] The test end is connected to the card to be tested through the wiring terminal. When the test end identifies the card type of the card to be tested, it controls the switching board to connect to the corresponding card type switching board, and controls the card type switching board to connect to the corresponding card type test source to establish a test environment for the card to be tested.

[0075] For example, when the test end identifies that the type of card to be tested is an AO card, it controls the switching board to connect to the AI ​​switching board, and controls the AI ​​switching board to connect to the AI ​​test source to establish a test environment between the test end and the AO card.

[0076] According to an example embodiment, the test end executes instructions in a test instruction set corresponding to the card type in sequence on different card types according to the test instruction and the test sequence logic.

[0077] Optionally, the test instruction set corresponding to the AO card type includes {switch board closing instruction, AI switch board closing instruction, AO card output instruction, AI test source delayed sampling instruction, AI switch board disconnect instruction and switch board disconnect instruction}.

[0078] For example, when the test end identifies that the type of the card to be tested is an AO card, it controls the switching board to connect to the AI ​​switching board, and controls the AI ​​switching board to connect to the AI ​​test source.

[0079] The test end executes the switch board closing instruction and the AI ​​switch board closing instruction in sequence according to the instructions in the AO card type test instruction set, and closes the switch board and the AI ​​switch board connected to the AO card. At this time, the detection environment of the AO card has been established.

[0080] The test end sends the AO card output instruction to the first controller 10, and the AO card executes the signal output. The test end executes the AI ​​test source delayed sampling instruction, controls the AI ​​test source to perform delayed sampling, and enables the AI ​​test source to obtain the signal output by the AO card and obtain the test result.

[0081] After the test end obtains the test result, it continues to execute the AI ​​switch board disconnect command and the switch board disconnect command in sequence, disconnecting the AI ​​switch board and the switch board connected to the card to be tested, and completing the card function test of the AO card to be tested.

[0082] According to an example embodiment, the number of AO card output instructions and AI test source delayed sampling instructions can be adjusted, and a linear analysis of the AO card function can be obtained through multiple sets of data.

[0083] Optionally, the test instruction set corresponding to the AI ​​card type includes: {switching board closing instruction, AO switching board closing instruction, AO test source output instruction, AI card delayed reading instruction, AO switching board disconnect instruction and switching board closing instruction}.

[0084] The test instruction set corresponding to the DO card type includes: {switch board closing instruction, DI switch board closing instruction, DO card output instruction, DI test source delayed sampling instruction, DI switch board disconnect instruction and switch board disconnect instruction}.

[0085] The test instruction set corresponding to the DI card type includes: {switch board closing instruction, DO switch board closing instruction, DO test source output instruction, DI card delayed reading instruction, DO switch board disconnect instruction and switch board closing instruction}.

[0086] According to the exemplary embodiment, the AI ​​card type, the DO card type, and the DI card type have the same testing principles as the above-mentioned AO card type, and therefore, are not described in detail herein.

[0087] According to an example embodiment, when the card to be tested is a thermal resistor acquisition card, the wiring terminal is connected to the thermal resistor acquisition card, and the wiring terminal is also connected to the RTD switching board, and the RTD switching board is connected to the RTD test source.

[0088] The RTD test source includes multiple resistance boxes. The RTD test source controls the thermal resistance acquisition card through a test instruction set to read data from the resistance boxes and perform a functional test on the thermal resistance acquisition card.

[0089] Optionally, the test instruction set corresponding to the type of thermal resistor acquisition card includes: {switching board closing instruction, RTD switching board closing instruction, thermal resistor acquisition card reading instruction, switching board disconnection instruction and RTD switching board disconnection instruction}.

[0090] For example, an RTD may include four resistor boxes, such as Resistor Box 1, Resistor Box 2, Resistor Box 3, and Resistor Box 4, each containing four different types of high-precision resistors. The test terminal includes four RTD switches, one for each resistor box. The RTD acquisition card is connected to the wiring terminal, which connects to resistor boxes of different resistance values ​​by connecting different RTD switches. The RTD acquisition card's functional test is then completed according to the test instruction set.

[0091] When the test end identifies that the type of the card to be tested is a thermal resistor acquisition card, it controls the switching board to connect to the RTD switching board, and controls the RTD switching board to connect to the resistance box 1 in the RTD test source.

[0092] The test end executes the switch board closing instruction and the RTD switch board closing instruction in sequence according to the instructions in the test instruction set of the thermal resistor acquisition card type, closes the switch board connected to the card to be tested and the RTD switch board closed. At this time, the detection environment of the thermal resistor acquisition card has been established.

[0093] The test end sends a reading instruction of the thermal resistor acquisition card to the first controller 10, controls the thermal resistor acquisition card to be tested to perform the reading and obtain the test result.

[0094] The test end continues to execute the switching board disconnection command and the RTD switching board disconnection command in sequence, disconnecting the RTD switching board connected to the card to be tested and the switching board disconnection, and obtains the test results of the thermal resistance acquisition card with resistance box 1 as the RTD test source.

[0095] The functional test principles of the thermal resistance acquisition cards using resistance box 2 as the RTD test source, resistance box 3 as the RTD test source, and resistance box 4 as the RTD test source are the same and will not be described in detail here.

[0096] According to the exemplary embodiment, the number of resistor boxes can be adjusted to perform functional tests on the thermal resistor acquisition card according to different types of high-precision resistors, and a linear analysis of the thermal resistor acquisition card function can be obtained through multiple sets of data.

[0097] Through the above embodiment, the test terminal sequentially executes the instructions within the test instruction set corresponding to each card type according to the test instructions and test sequence logic. The test terminal automatically connects to the corresponding card type test source based on the test sequence logic and controls the closing and opening of the corresponding switch and card type switch according to the test instruction set, performing automated intelligent testing.

[0098] In the current existing technology, the factory test of DCS panel cabinets has a high error rate due to the large number and types of terminals in the DCS panel cabinets. After the wiring is completed, manual verification is required one by one.

[0099] The proposed automated DCS cabinet testing method eliminates the need for complex wiring layouts and simply connects the test terminal's 10-way terminals to multiple cards within the DCS cabinet, eliminating the need for manual verification. Testers simply connect the 10-way test terminal's wiring terminals to the corresponding DCS cabinet, and the test terminal automatically verifies the card's functionality. This enables automated industrial control, reduces labor costs, and improves the efficiency of DCS cabinet factory testing.

[0100] According to another aspect of the present application, a DCS panel cabinet automatic testing device is also provided. Figure 3 A structural schematic diagram 3000 of a DCS panel cabinet automatic test device according to an exemplary embodiment of the present application is shown.

[0101] See also Figure 3 The DCS panel cabinet automatic test equipment 2 includes an information acquisition device 21, a control and measurement center 23 and a test device 27.

[0102] Figure 4 A schematic diagram 4000 of the connection between a DCS panel cabinet automatic test device and a DCS panel cabinet according to an exemplary embodiment of the present application is shown. Figure 4 The DCS panel cabinet 1 shown can be Figure 1 The DCS panel cabinet shown.

[0103] according to Figure 4 As shown, the DCS panel cabinet automatic test equipment includes an information acquisition device 21, which acquires DCS panel cabinet design drawing information and sends the DCS panel cabinet design drawing information.

[0104] For example, the information acquisition device 21 is a scanning device that scans a graphic or number on a DCS cabinet that can identify preset information, such as a cabinet QR code or barcode. The scanning device obtains DCS cabinet design information from the enterprise cloud by identifying the cabinet QR code or barcode. The DCS cabinet design information includes the design drawing data of the DCS cabinet, which includes information such as the types and location layout of multiple cards within the DCS cabinet.

[0105] The DCS panel cabinet automatic test equipment further includes a control and measurement center 23 , which is in communication with the information acquisition device 21 and receives DCS panel cabinet design drawing information.

[0106] The control and measurement center 23 is also communicatively connected to the first controller 10 , and obtains configuration information of the plurality of card components through the first controller 10 .

[0107] According to an example embodiment, the configuration information of the card includes the card branch number (eg Figure 1 The first branch 11, the second branch 12 or the third branch 13, etc. shown), the slot number (such as Figure 1 slot1, solt2, solt3, etc.) and card type code, where the card type code represents the type of card.

[0108] The control and measurement center 23 also verifies whether the configuration information matches the DCS panel cabinet design information. If the verification result is negative, an error message is issued so that the configuration information can be adjusted and verified again. If the verification result is positive, the test sequence logic is created based on the configuration information and test instructions are generated.

[0109] According to an exemplary embodiment, the control and measurement center 23 matches the configuration information of the card with the DCS panel cabinet design drawing information.

[0110] If the matching result is inconsistent, there is a problem with the assembly of the card components inside the DCS cabinet. The control and measurement center issues an error message to alert the DCS cabinet tester of the internal error. This allows the tester to adjust the relevant issues based on the error message to correct the assembly discrepancy inside the DCS cabinet.

[0111] After the tester adjusts the configuration information of the DCS panel cabinet according to the error prompt, the control and measurement center 23 performs verification again until the configuration information of the card matches the DCS panel cabinet design information.

[0112] If the match is positive, the control and testing center 23 automatically identifies the card type and sequence based on the configuration information and automatically creates a test sequence logic based on the card type and sequence. The control and testing center 23 then generates test instructions, using branches as the testing unit and the cards within the branches as the basic unit for testing. The control and testing center 23 then completes the card function tests in a time-sharing manner according to the test sequence logic.

[0113] according to Figure 4 As shown, the DCS panel cabinet automatic test equipment also includes a test device 27, which is connected to the control and test center 23 for communication, receives test instructions, and automatically performs card function tests on multiple cards according to the test sequence logic.

[0114] For example, the control and testing center 23 automatically identifies the card configuration combination of the first branch 11 as {slot1: AI card, slot2: AO card, slot3: AI card, slot4: AO card, slot5: DI card, slot6: DO card, slot7: DI card, slot8: DO card, slot9: DI card, slot10: DO card} through the first controller 10. The control and testing center 23 then generates the card test sequence logic for the first branch 11 based on the order of the cards in the card configuration combination of the first branch 11: {AI card, AO card, AI card, AO card, DI card, DO card, DI card, DO card, DI card, DO card}.

[0115] The test device 27 performs functional tests on the cards in the card test sequence logic of the first branch 11 in sequence and in a time-sharing manner according to the test instructions. The test device 27 generates a test report based on the card function results.

[0116] For example, a test report includes the DCS cabinet number, the branch and slot numbers of the tested card, and the functional test results. The test report can be indexed by the DCS cabinet number, branch number, and slot number of the tested card to query the test results for a specific card, making it easier for testers to review.

[0117] Through the above embodiment, the control and testing center 23 can automatically identify the configuration information of the card components in each branch of the DCS panel cabinet and automatically create test sequence logic and test instructions based on the card configuration information. The test device 27 performs card function tests on the card components in each branch in sequence according to the test sequence logic and generates a test report based on the test results.

[0118] The DCS cabinet automatic test equipment provided in this application uses an intelligent computer to automatically identify the type of test card and generates a test sequence logic based on the card configuration combinations within multiple branches within the DCS cabinet. The DCS cabinet automatic test equipment completes the card function test based on the test sequence logic, thereby achieving automated control of the industrial process, saving manpower, and improving the efficiency of DCS cabinet factory testing.

[0119] Figure 5 A structural schematic diagram 5000 of a testing device according to an exemplary embodiment of the present application is shown.

[0120] according to Figure 5 As shown, the testing device 27 includes a second controller 271 , which receives a testing instruction from the control and testing center 23 .

[0121] Optionally, the DCS panel cabinet automatic test equipment 2 further includes a switch 25 , which performs instruction / data exchange between the control and measurement center 23 and the first controller 10 , and between the control and measurement center 23 and the second controller 271 .

[0122] The test device 27 further includes a first signal switching device 273 and a second signal switching device 275. The first signal switching device 273 includes a plurality of connection terminals 2731 and a plurality of switching boards 2733. The plurality of connection terminals 2731 are connected to the plurality of cards in a one-to-one correspondence.

[0123] For example, see Figure 5 The first signal switching device 273 includes 10 wiring terminals 2731. A branch in an existing DCS panel cabinet has a maximum of 10 card slots, so the first signal switching device 273 can provide 10 wiring terminals 2731. The principle of connecting the wiring terminals 2731 to the card slots is that the serial numbers of the wiring terminals 2731 correspond one-to-one with the card slot numbers in the branch.

[0124] For example, Figure 1 The following illustrates an embodiment in which the first controller 10 is located above each branch. When the first controller 10 is located above each branch and the test device 27 is testing a card within the first branch 11, the 1st to 10th wiring terminals 2731 are connected to solt1 to solt10, respectively. When the test device 27 is testing a card within the second branch 12, the 1st to 8th wiring terminals 2731 are connected to solt1 to solt8, respectively, with the 9th and 10th wiring terminals 2731 left vacant. When the test device 27 is testing a card within the third branch 13, the 1st to 3rd wiring terminals 2731 are connected to solt1 to solt3, respectively, with the 4th to 10th wiring terminals 2731 left vacant.

[0125] According to the exemplary embodiment, if the first controller 10 in the DCS cabinet is located below each branch, when the test device 27 tests the card in the first branch 11, the 1st to 10th wiring terminals 2731 are connected to solt10 to solt1, respectively. When the test device 27 tests the card in the second branch 12, the 1st to 8th wiring terminals 2731 are connected to solt8 to solt1, respectively, and the 9th and 10th wiring terminals 2731 are left vacant. When the test device 27 tests the card in the third branch 13, the 1st to 3rd wiring terminals 2731 are connected to solt3 to solt1, respectively, and the 4th to 10th wiring terminals 2731 are left vacant.

[0126] According to an exemplary embodiment, the plurality of connection terminals 2731 are also connected to the plurality of switch boards 2733 in a one-to-one correspondence.

[0127] For example, see Figure 5The first signal switching device 273 also includes 10 switching boards 2733, which have a one-to-one correspondence with the wiring terminals 2731. When the wiring terminals 2731 are connected to the test components in the DCS panel cabinet under test according to the line connection principle, the 10-way wiring terminals 2731 are connected to the corresponding 10 switching boards 2733, thereby establishing a physical connection between the DCS panel cabinet under test and the test device 27.

[0128] The test device 27 establishes a closed-loop test environment with the designated card to be tested by controlling the closing and opening of the switch board 2733. During the test process, only one switch board 2733 is in the closed state.

[0129] According to an example embodiment, the second signal switching device 275 includes a plurality of card type switching boards 2751 , and the first signal switching device 273 is connected to the second signal switching device 275 .

[0130] Optionally, the first signal switching device 273 and the second signal switching device 275 are integrated into one body via a bus backplane. Alternatively, the first signal switching device 273 and the second signal switching device 275 are separately provided and connected via a bus.

[0131] For example, the switching board 2733 and the card type switching board 2751 of the first signal switching device 273 and the second signal switching device 275 can be inserted into a chassis and connected through a 37-core bus backplane, which can improve the integration of the DCS panel cabinet automatic test equipment 2.

[0132] Alternatively, the switching board 2733 and the card type switching board 2751 of the first signal switching device 273 and the second signal switching device 275 can be inserted into two different chassis, and the two chassis are connected through a line to facilitate the later application expansion of the DCS panel cabinet automatic test equipment 2.

[0133] According to an example embodiment, see Figure 5 The testing device 27 also includes a first control board 277 and a second control board 279 .

[0134] The first control board 277 controls the closing and opening of the plurality of switch boards 2733 of the first signal switching device 273 according to the instruction of the second controller 271 .

[0135] The second control board 279 controls the closing and opening of the plurality of card type switching boards 2751 of the second signal switching device 275 according to the instruction of the second controller 271 .

[0136] According to an exemplary embodiment, the testing device 27 further includes a plurality of card type test sources 270 , and the card type switching board 2751 is connected to the card type test sources 270 .

[0137] For example, see Figure 5 The card type switching board 2751 in the second signal switching device 275 includes an AO switching board, an AI switching board, a DO switching board, a DI switching board, and an RTD switching board.

[0138] The card type test source 270 includes an AO test source, an AI test source, a DO test source, a DI test source, and an RTD test source.

[0139] The test device 27 controls the switching board 2733 to connect to the corresponding card type switching board 2751, and controls the card type switching board 2751 to connect to the corresponding card type test source 270 to establish a test environment for the test device 27 and the card to be tested.

[0140] For example, when the card type to be tested is an AO card, the test device 27 controls the switch board 2733 to connect to the AI ​​switch board, and controls the AI ​​switch board to connect to the AI ​​test source to establish a test environment for the test device 27 and the AO card.

[0141] According to an exemplary embodiment, the test device 27 executes instructions in a test instruction set corresponding to the card type in sequence through the first controller 10 or the second controller 271 according to the test instruction and the test sequence logic.

[0142] Optionally, the test instruction set corresponding to the AO card type includes {switch board closing instruction, AI switch board closing instruction, AO card output instruction, AI test source delayed sampling instruction, AI switch board disconnect instruction and switch board disconnect instruction}.

[0143] For example, when the control and testing center 23 identifies that the type of the card to be tested is an AO card, it controls the switch board 2731 connected to the card to be tested in the test device 27 to connect to the AI ​​switch board, and controls the AI ​​switch board to connect to the AI ​​test source.

[0144] The second controller 271 executes the switch board closing instruction and the AI ​​switch board closing instruction in sequence according to the instructions in the AO card type test instruction set, closes the switch board 2731 connected to the AO card and closes the AI ​​switch board. At this time, the detection environment of the AO card has been established.

[0145] The control and testing center 23 sends the AO card output instruction to the first controller 10, and the AO card executes the signal output. The second controller 271 executes the AI ​​test source delayed sampling instruction, controls the AI ​​test source to perform delayed sampling, and enables the AI ​​test source to obtain the signal output by the AO card and obtain the test result.

[0146] After obtaining the test results, the second controller 271 continues to execute the AI ​​switching board disconnection instruction and the switching board disconnection instruction in sequence, disconnecting the AI ​​switching board and the switching board corresponding to the AO card to be tested, and completing the card function test of the AO card to be tested.

[0147] According to an example embodiment, the number of AO card output instructions and AI test source delayed sampling instructions can be adjusted, and a linear analysis of the AO card function can be obtained through multiple sets of data.

[0148] Optionally, the test instruction set corresponding to the AI ​​card type includes: {switching board closing instruction, AO switching board closing instruction, AO test source output instruction, AI card delayed reading instruction, AO switching board disconnect instruction and switching board closing instruction}.

[0149] The test instruction set corresponding to the DO card type includes: {switch board closing instruction, DI switch board closing instruction, DO card output instruction, DI test source delayed sampling instruction, DI switch board disconnect instruction and switch board disconnect instruction}.

[0150] The test instruction set corresponding to the DI card type includes: {switch board closing instruction, DO switch board closing instruction, DO test source output instruction, DI card delayed reading instruction, DO switch board disconnect instruction and switch board closing instruction}.

[0151] According to the exemplary embodiment, the AI ​​card type, DO card type, and DI card type have the same testing principles as the aforementioned AO card type, and thus are not described in detail herein.

[0152] According to an example embodiment, when the card to be tested is a thermal resistor acquisition card, the connection terminal 2731 is connected to the thermal resistor acquisition card, and the connection terminal 2731 is also connected to the RTD switching board, and the RTD switching board is connected to the RTD test source.

[0153] The RTD test source includes multiple resistance boxes. The RTD test source controls the thermal resistance acquisition card through a test instruction set to read data from the resistance boxes and perform a functional test on the thermal resistance acquisition card.

[0154] Optionally, the test instruction set corresponding to the type of thermal resistor acquisition card includes: {switching board closing instruction, RTD switching board closing instruction, thermal resistor acquisition card reading instruction, switching board disconnection instruction and RTD switching board disconnection instruction}.

[0155] For example, the RTD may include four resistor boxes, such as Resistor Box 1, Resistor Box 2, Resistor Box 3, and Resistor Box 4, each containing four different types of high-precision resistors. The test terminal includes four RTD switches, each corresponding to a resistor box. The thermal resistor acquisition card is connected to terminal block 2731. Terminal block 2731 is connected to resistor boxes of different resistance values ​​by connecting different RTD switches. The thermal resistor acquisition card is then functionally tested according to the test instruction set.

[0156] When the card type to be tested is a thermal resistance acquisition card, the second controller 271 controls the switching board 2733 to connect to the RTD switching board, and controls the RTD switching board to connect to the resistance box 1 in the RTD test source.

[0157] The second controller 271 executes the switch board closing instruction and the RTD switch board closing instruction in sequence according to the instructions in the thermal resistor acquisition card type test instruction set, and closes the switch board and the RTD switch board corresponding to the thermal resistor acquisition card to be tested. At this time, the detection environment of the thermal resistor acquisition card has been established.

[0158] The control and measurement center 23 sends a reading instruction of the thermal resistor acquisition card to the first controller 10, controls the thermal resistor acquisition card to be measured to perform the reading and obtain the test result.

[0159] The second controller 271 continues to execute the switching board disconnection instruction and the RTD switching board disconnection instruction in sequence, disconnecting the RTD switching board connected to the card to be tested, and disconnecting the switching board to obtain the test results of the thermal resistor acquisition card with the resistor box 1 as the RTD test source.

[0160] The functional test principles of the thermal resistance acquisition cards using resistance box 2 as the RTD test source, resistance box 3 as the RTD test source, and resistance box 4 as the RTD test source are the same and will not be described in detail here.

[0161] According to the exemplary embodiment, the number of resistance boxes can be adjusted to perform functional testing on the thermal resistor acquisition card according to different types of high-precision resistors, and linear analysis of the thermal resistor acquisition card function can be performed using multiple sets of data.

[0162] Through the above embodiment, the DCS cabinet automatic test device 2 executes the instructions within the test instruction set corresponding to each card type in sequence according to the test instructions and test sequence logic. Second controller 271 automatically connects to the corresponding card type test source 270 based on the test sequence logic and controls the closing and opening of the corresponding switch 2733 and card type switch 2751 according to the test instruction set, performing automated intelligent testing.

[0163] In the current existing technology, the factory test of DCS cabinets is prone to high error rates when all wiring is completed at one time due to the large number and variety of terminals in the DCS cabinets, and manual verification is required after the wiring is completed. However, the DCS cabinet automatic detection equipment provided by this application does not require complex wiring layouts. It only requires connecting up to 10 terminals of the test end to multiple cards in the DCS cabinet, so there is no need for manual verification. The test personnel only need to connect the wiring terminals of up to 10 test ends to the DCS cabinets, and the DCS cabinet automatic detection equipment can fully realize automatic detection of the card functions. This realizes industrial automation control, saves labor, and improves the factory test efficiency of DCS cabinets.

[0164] According to another aspect of the present application, a non-volatile computer-readable storage medium is provided, on which a computer program is stored. The computer program can implement the DCS panel cabinet automatic testing method as described above.

[0165] According to another aspect of the present application, a DCS panel cabinet automatic testing system is also provided, which includes: one or more processors; a storage device for storing one or more programs, which, when the one or more programs are executed by one or more processors, enables the one or more processors to implement the DCS panel cabinet automatic testing method as described above.

[0166] Finally, it should be noted that the above description is merely a preferred embodiment of the present application and is not intended to limit the present application. Although the present application is described in detail with reference to the aforementioned embodiments, those skilled in the art will be able to modify the technical solutions of the aforementioned embodiments or replace some of the technical features therein with equivalents. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application shall be included within the scope of protection of the present application.

Claims

1. A DCS panel cabinet automatic testing method, characterized in that: The DCS panel cabinet includes a first controller and a plurality of card components, and the method includes: The test end obtains DCS panel cabinet design information; Acquiring configuration information of the plurality of cards through the first controller; Verify whether the configuration information matches the DCS panel cabinet design information setting; If not, an error message is issued so that the configuration information can be adjusted and verified again; If yes, creating a test sequence logic according to the configuration information and generating a test instruction; Automatically perform card function testing on the multiple cards according to the test instruction and the test sequence logic; The test end is provided with a plurality of connection terminals, a plurality of switching boards, a plurality of card type switching boards and a plurality of card type test sources, and the plurality of connection terminals are connected to the plurality of cards in a one-to-one correspondence; The plurality of connection terminals are further connected to a plurality of switching boards in a one-to-one correspondence, the switching boards are connected to the card type switching boards, and the card type switching boards are connected to the card type test sources to establish a test environment for the card to be tested; The automatically performing the card function test on the plurality of cards according to the test instruction and the test sequence logic includes: The test end executes instructions in a test instruction set corresponding to the card type of the card to be tested in sequence on the card to be tested according to the test instruction and the test sequence logic in the test environment of the card to be tested.

2. The DCS panel cabinet automatic testing method according to claim 1 is characterized in that: The card types of the plurality of cards include AO card types, AI card types, DO card types, DI card types and thermal resistance acquisition card types; The multiple card type switching boards include AO switching boards, AI switching boards, DO switching boards, DI switching boards and RTD switching boards; the multiple card type test sources include AO test sources, AI test sources, DO test sources, DI test sources and RTD test sources; The test instruction set of the AO card type includes: switch board closing instruction, AI switch board closing instruction, AO card output instruction, AI test source delayed sampling instruction, AI switch board disconnect instruction and switch board disconnect instruction; The test instruction set of the AI ​​card type includes: switch board closing instruction, AO switch board closing instruction, AO test source output instruction, AI card delayed reading instruction, AO switch board disconnect instruction and switch board disconnect instruction; The test instruction set of the DO card type includes: switch board closing instruction, DI switch board closing instruction, DO card output instruction, DI test source delayed sampling instruction, DI switch board disconnect instruction and switch board disconnect instruction; The test instruction set of the DI card type includes: switch board closing instruction, DO switch board closing instruction, DO test source output instruction, DI card delayed reading instruction, DO switch board disconnect instruction and switch board disconnect instruction; The test instruction set of the thermal resistance acquisition card type includes: a switch board closing instruction, an RTD switch board closing instruction, a thermal resistance acquisition card reading instruction, a switch board disconnect instruction and an RTD switch board disconnect instruction.

3. The DCS panel cabinet automatic testing method according to claim 1 is characterized in that: The configuration information includes a card branch number, a slot number, and a card type code.

4. A DCS panel cabinet automatic test equipment, characterized in that: The DCS panel cabinet includes a first controller and a plurality of card components, and the device includes: An information acquisition device acquires DCS panel cabinet design information and sends the DCS panel cabinet design information; A control and measurement center is connected in communication with the information acquisition device to receive the DCS panel cabinet design information. The control and measurement center is also connected in communication with the first controller to obtain the configuration information of the plurality of cards through the first controller. The control and testing center also verifies whether the configuration information matches the DCS panel cabinet design information. If the verification result is negative, an error message is issued to adjust the configuration information and verify again. If the verification result is positive, a test sequence logic is created according to the configuration information and a test instruction is generated. A testing device, connected to the control and testing center for communication, receives the test instruction, and automatically performs a card function test on the plurality of cards according to the test sequence logic; The testing device comprises: A second controller receives the test instruction; A first signal switching device includes a plurality of connection terminals and a plurality of switching boards, wherein the plurality of connection terminals are connected to the plurality of card members in a one-to-one correspondence, and the plurality of connection terminals are also connected to the plurality of switching boards in a one-to-one correspondence; a first control board, controlling the closing and opening of the plurality of switch boards of the first signal switching device according to an instruction of the second controller; A second signal switching device, comprising a plurality of card type switching boards, the second signal switching device being connected to the first signal switching device; a second control board, controlling the closing and opening of the plurality of card type switching boards of the second signal switching device according to instructions of the second controller; A plurality of card type test sources, wherein the card type switching board is connected to the card type test sources; The testing device executes instructions in a test instruction set corresponding to the card types of the multiple cards in sequence through the first controller or the second controller according to the test instruction and the test sequence logic.

5. The DCS panel cabinet automatic test equipment according to claim 4 is characterized in that: The card types of the multiple cards include AO card types, AI card types, DO card types, DI card types and thermal resistance acquisition card types; the multiple card type switching boards include AO switching boards, AI switching boards, DO switching boards, DI switching boards and RTD switching boards; the multiple card type test sources include AO test sources, AI test sources, DO test sources, DI test sources and RTD test sources; When the test card type is the AO card type, the control and measurement center sequentially issues a switch board closing instruction, an AI switch board closing instruction, an AO card output instruction, an AI test source delayed sampling instruction, an AI switch board disconnect instruction, and a switch board disconnect instruction, and the first controller or the second controller executes the corresponding instruction; When the test card type is the AI ​​card type, the control and measurement center sequentially issues a switch board closing instruction, an AO switch board closing instruction, an AO test source output instruction, an AI card delayed reading instruction, an AO switch board disconnect instruction, and a switch board disconnect instruction, and the first controller or the second controller executes the corresponding instruction; When the test card type is the DO card type, the control and measurement center sequentially issues a switch board closing instruction, a DI switch board closing instruction, a DO card output instruction, a DI test source delayed sampling instruction, a DI switch board disconnect instruction, and a switch board disconnect instruction, and the first controller or the second controller executes the corresponding instruction; When the test card type is the DI card type, the control and measurement center sequentially issues a switch board closing instruction, a DO switch board closing instruction, a DO test source output instruction, a DI card delayed reading instruction, a DO switch board disconnect instruction, and a switch board disconnect instruction, and the first controller or the second controller executes the corresponding instruction; When the test card type is the thermal resistor acquisition card type, the control and measurement center sequentially issues a switching board closing instruction, an RTD switching board closing instruction, a thermal resistor acquisition card reading instruction, a switching board disconnection instruction, and an RTD switching board disconnection instruction, and the first controller or the second controller executes the corresponding instruction.

6. The DCS panel cabinet automatic test equipment according to claim 4 is characterized in that: Also includes: The switch exchanges instructions and data between the control and measurement center and the first controller, and between the control and measurement center and the second controller.

7. The DCS panel cabinet automatic test equipment according to claim 4 is characterized in that: The first signal switching device and the second signal switching device are integrated into one through a bus backplane; or The first signal switching device and the second signal switching device are separately provided and connected via a bus.

8. A non-volatile computer-readable storage medium having a computer program stored thereon, characterized in that: The computer program enables the DCS panel cabinet automatic test equipment to implement the method according to any one of claims 1 to 3.

9. A DCS panel cabinet automatic test system, characterized in that: include: one or more processors; a storage device for storing one or more programs; When the one or more programs are executed by the one or more processors, the one or more processors implement the method according to any one of claims 1 to 3.

Images