Solar cell testing equipment

Abstract

The present invention provides a solar cell testing device, comprising an illumination component, a test bench, a drive component and a probe component, wherein the test bench is used to carry solar cells; the illumination component is used to provide illumination to the solar cells on the test bench; the drive component is used to drive the probe component located above the test bench to reciprocate along a first horizontal direction or to move up and down along a vertical direction, so that a plurality of probes of the probe component sequentially contact a plurality of electrodes of the solar cell. In the present invention, the drive component can drive the probe component to reciprocate along a first horizontal direction or to move up and down along a vertical direction, so that the probes descend and contact the corresponding electrodes, and then rise and align with the position of the next group of electrodes, so that the probes sequentially contact the plurality of electrodes of the solar cell, so that the solar cell can be tested by the probes, thereby realizing automatic testing of the solar cell and improving the testing efficiency of the solar cell.

Description

Technical Field

[0001] The present invention relates to the field of semiconductor process equipment, and in particular to a solar cell testing device. Background Art

[0002] With the advancement of a low-carbon economic development model, the supply and demand of the solar energy industry continues to grow, and the market demand for high-capacity, high-efficiency, and low-loss solar cells and photovoltaic production equipment is also growing. With the advancement of solar cell technology, various types of solar cells have become larger and thinner, and the market demand for the industrialization of emerging process production and testing equipment is imminent. However, solar cell manufacturers and equipment R&D companies have high investments in production equipment, but significantly insufficient investment in closely related testing equipment.

[0003] In the existing technology, a multi-probe measurement method is usually used to measure photovoltaic performance parameters such as the open-circuit voltage Voc, short-circuit current Isc, and photoelectric conversion efficiency η of solar cells. However, in the existing solar cell production process, the probe test of photoelectric conversion efficiency (IV) is usually limited to manual operation using a fixed probe row to test a single cell.

[0004] In the existing solar cell testing process, both the probe and the cell need to be moved manually. When the probe is manually operated for measurement, it takes about one working day to test 100 component samples (for example, 100 cells including multiple sub-cells), and the testing efficiency is extremely low. Therefore, this testing process is usually limited to random sampling tests on cell samples, and it is difficult to achieve comprehensive testing of the product. In addition, a single probe device can only measure cells of a single specification and cannot cope with the measurement of multiple specifications and types of cells. The actual application is relatively limited. For example, only the original two-probe measurement method is used, and it is impossible to test copper indium gallium selenide (CIGS) thin-film sub-cells that require four-probe measurement. It is also impossible to perform uniformity testing and analysis on large-size and multi-type cell samples.

[0005] Therefore, how to provide a solar cell testing device that can improve the testing efficiency of solar cells has become a technical problem that needs to be solved urgently in this field. Summary of the Invention

[0006] The present invention aims to provide a solar cell testing device, which can improve the testing efficiency of solar cells.

[0007] To achieve the above-mentioned objectives, the present invention provides a solar cell testing device, which includes an illumination component, a test bench, a drive component and a probe component, wherein the test bench is used to carry solar cells; the illumination component is used to provide light to the solar cells on the test bench; and the drive component is used to drive the probe component located above the test bench to reciprocate in a first horizontal direction or to move up and down in a vertical direction, so that multiple probes of the probe assembly contact multiple electrodes of the solar cell in turn.

[0008] Optionally, the driving assembly includes a horizontal transfer driving unit and a probe lifting driving unit, the probe lifting driving unit is used to drive the probe assembly to move up and down in the vertical direction, and the horizontal transfer driving unit is used to drive the probe lifting driving unit to drive the probe assembly to reciprocate along the first horizontal direction.

[0009] Optionally, the horizontal transfer drive unit includes a drive member, a lead screw, a first connecting seat and at least one guide rail, the guide rail and the lead screw both extend along the first horizontal direction, the probe lifting drive unit is fixedly connected to the first connecting seat, the first connecting seat is movably arranged on the guide rail, and the first connecting seat has a threaded mating through hole, the threaded mating through hole is sleeved on the lead screw and cooperates with the lead screw, the drive member is used to drive the lead screw to rotate around its own axis, so as to drive the first connecting seat to drive the probe lifting drive unit to move along the guide rail.

[0010] Optionally, the horizontal transfer drive unit includes a pair of guide rails, the two guide rails are respectively arranged on both sides of the lead screw along the second horizontal direction, the second horizontal direction is perpendicular to the first horizontal direction, the first connecting seat includes a driving connector and a pair of connecting plates fixedly connected to the driving connector, the two connecting plates are movably arranged on the two guide rails in a one-to-one correspondence, and the threaded mating through hole is formed in the driving connector;

[0011] The horizontal transfer drive unit also includes a second connecting seat and two groups of connecting columns. The first connecting seat is located below the test bench, and the second connecting seat is located above the test bench. The two groups of connecting columns extend in the vertical direction and are respectively located on both sides of the test bench along the second horizontal direction. Each of the connecting plates is fixedly connected to the second connecting seat through a group of connecting columns, and the probe lifting drive unit is fixedly set on the second connecting seat.

[0012] Optionally, the second connecting base includes a second transverse plate, a light shield and a pair of connecting plates, the probe lifting drive unit is fixedly arranged on the second transverse plate, the second transverse plate is vertically arranged and extends along the second horizontal direction, and both sides of the second transverse plate are respectively fixedly connected to the top ends of the corresponding connecting columns through two connecting plates;

[0013] The horizontal transfer drive unit also includes a light shielding plate, which is fixedly arranged on the connecting plate and extends in the horizontal direction. The edge of the light shielding plate facing the probe assembly is connected to the second horizontal plate for blocking the light above it; the light shield is fixedly arranged on the second horizontal plate and is located above the probe lifting drive unit for blocking the light irradiated by the illumination assembly to the area between the probe assembly and the light shielding plate.

[0014] Optionally, the probe assembly includes a beam and at least one group of probes fixedly arranged on the beam, the beam is connected to the probe lifting drive unit and extends along the second horizontal direction, and each group of probes is spaced apart along the second horizontal direction.

[0015] Optionally, the probe includes a probe rod, a probe clamping tube and a probe sleeve, the probe clamping tube is sleeved on the outside of the probe rod and fixedly connected to the crossbeam, the probe sleeve is sleeved on the outside of the probe clamping tube, the position of the probe rod in the probe clamping tube is fixed, and the bottom end of the probe rod extends out of the bottom end opening of the probe clamping tube, the probe clamping tube is movably arranged in the probe sleeve, and a driving spring is arranged in the probe sleeve, the top end of the driving spring is fixedly connected to the probe sleeve, and the bottom end of the driving spring is fixedly connected to the top end of the probe clamping tube, for maintaining the length of the probe clamping tube extending from the bottom end opening of the probe sleeve by elastic force.

[0016] Optionally, a plurality of limiting members are fixedly provided on the bearing surface of the test bench, each limiting member having a limiting contact surface corresponding to the edge shape of the solar cell, and the plurality of limiting members are used to limit the edge of the solar cell through the limiting contact surface.

[0017] Optionally, at least one adsorption component is provided on the carrying surface of the test bench corresponding to the area defined by the plurality of limit members, and the adsorption component is used to extract gas between the solar cell and the carrying surface to adsorb the solar cell.

[0018] Optionally, a heater is provided at the bottom of the test bench, and the heater includes a containing box and a plurality of heating wires arranged in the containing box, the containing box has a plurality of heating zones distributed in sequence along the second horizontal direction, and the plurality of heating wires are bent and distributed in the plurality of heating zones in a one-to-one correspondence, and a temperature test piece is also provided in each of the heating zones, and the heater is used to adjust the heating power of the corresponding heating wire according to the temperature test value of each temperature test piece, so as to maintain the temperature test values ​​of the plurality of temperature test pieces at a preset temperature.

[0019] The solar cell testing equipment provided by the present invention includes a control device and a drive component. The drive component can drive the probe component located above the test bench to reciprocate along a first horizontal direction or to move up and down along a vertical direction, so that multiple probes of the probe assembly descend and contact the corresponding multiple electrodes on the solar cell, and then the probe is raised and moved along the first horizontal direction to be aligned with the position of the next group of electrodes, so that it can contact the next group of electrodes after descending, so that the probe contacts the multiple electrodes of the solar cell in turn, so that the solar cell can be tested by the probe, automatic testing of the solar cell is realized, and the testing efficiency of the solar cell is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the following detailed description, they are used to explain the present invention but do not constitute a limitation of the present invention. In the accompanying drawings:

[0021] Figure 1 is a structural diagram of a solar cell testing device provided by an embodiment of the present invention;

[0022] Figure 2 is a schematic diagram of a portion of the structure of a solar cell testing device provided by an embodiment of the present invention;

[0023] Figure 3 yes Figure 2 Schematic diagram of the structure shown from another perspective

[0024] Figure 4 yes Figure 3 a schematic diagram of a portion of the structure shown;

[0025] Figure 5 is a schematic top view of part of the structure of a solar cell testing device provided by an embodiment of the present invention;

[0026] Figure 6 Schematic diagram of the principle of testing a solar cell by a solar cell testing device provided in an embodiment of the present invention;

[0027] Figure 71 is a schematic structural diagram of a probe in a solar cell testing device provided by an embodiment of the present invention;

[0028] Figure 8 Schematic diagram of the positional relationship between various components and solar cells in a solar cell testing device provided by an embodiment of the present invention;

[0029] Figure 9 1 is a schematic structural diagram of a heater in a solar cell testing device provided by an embodiment of the present invention;

[0030] Figure 10 Schematic diagram of an equivalent circuit of an electrical measurement circuit of a solar cell testing device provided by an embodiment of the present invention.

[0031] Description of reference numerals:

[0032] 100: Lighting component 200: Test bench

[0033] 210: Limiting parts 310: Host computer

[0034] 320: Lower machine 400: Horizontal transfer drive unit

[0035] 410: driving part 411: motor

[0036] 412: Coupling 413: Fixed end bearing seat

[0037] 420: Screw 430: First connecting seat

[0038] 431: Drive connector 431a: Free end bearing seat

[0039] 431b: first horizontal plate 432: connecting plate

[0040] 440: Guide rail 450: Second connecting seat

[0041] 451: Connecting plate 452: Second horizontal plate

[0042] 453: Light shield 460: Connecting column

[0043] 470: Light shielding plate 500: Probe lifting drive unit

[0044] 600: Probe assembly 610: Beam

[0045] 620: Probe 621: Probe rod

[0046] 622: Probe clamping tube 623: Probe sleeve

[0047] 624: Lead terminal 700: Heater

[0048] 710: Storage box 720: Heating wire

[0049] 730: Temperature test piece 800: Rack

[0050] 810: Horizontal mounting seat 820: Baffle DETAILED DESCRIPTION

[0051] The following describes the specific embodiments of the present invention in detail with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are only used to illustrate and explain the present invention and are not intended to limit the present invention.

[0052] In order to solve the above technical problems, the present invention provides a solar cell testing device, such as Figure 1 As shown, the solar cell testing equipment includes an illumination component 100, a test bench 200, a drive component (including a horizontal transfer drive unit 400 and a probe lifting drive unit 500) and a probe component 600, wherein the test bench 200 is used to carry solar cells, the illumination component 100 is used to provide light to the solar cells 10 on the test bench 200, and the control drive component is used to drive the probe component 600 located above the test bench 200 to reciprocate in a first horizontal direction or to lift and lower in a vertical direction, so that the multiple probes 620 of the probe component 600 contact the multiple electrodes of the solar cell 10 in turn.

[0053] Optionally, the solar cell testing equipment further includes a control device (including a host computer 310 and a slave computer 320) for controlling the driving component to perform corresponding actions, and testing the solar cell 10 through the probes 620 each time the multiple probes 620 contact the multiple electrodes of the solar cell 10.

[0054] In an embodiment of the present invention, the driving assembly can drive the probe assembly 600 located above the test bench 200 to reciprocate along the first horizontal direction or to move up and down along the vertical direction, so that the multiple probes 620 of the probe assembly 600 descend and contact the corresponding multiple electrodes on the solar cell 10, and then the probe 620 rises and moves along the first horizontal direction to be aligned with the position of the next group of electrodes, so that it can contact the next group of electrodes after descending, so that the probe 620 can contact the multiple electrodes of the solar cell 10 in turn, so as to test the solar cell 10 through the probe 620. Compared with the prior art, the solar cell testing equipment provided by the present invention can realize automatic testing of solar cells and improve the testing efficiency of solar cells.

[0055] Moreover, in the solar cell testing equipment provided by the present invention, the probe 620 can move fully automatically, and the test of all areas of the solar cell 10 can be completed by clamping the solar cell 10 once, and the measurement efficiency is greatly improved. In addition to testing the photoelectric conversion efficiency of the solar cell, it can also be used to automatically sort the solar cell 10, that is, to accurately grade the solar cell 10 according to the level of photoelectric conversion efficiency (for example, solar cells with a photoelectric conversion efficiency of more than 20% are screened as first-class products, and the rest of the solar cells are screened as second-class products).

[0056] As an optional embodiment of the present invention, Figures 1 to 3 As shown, the driving assembly includes a horizontal transfer driving unit 400 and a probe lifting driving unit 500. The probe lifting driving unit 500 is used to drive the probe assembly 600 to move up and down in the vertical direction, and the horizontal transfer driving unit 400 is used to drive the probe lifting driving unit 500 to drive the probe assembly 600 to reciprocate along the first horizontal direction.

[0057] When testing a solar cell 10, the horizontal transfer drive unit 400 is used to drive the probe lifting drive unit 500 to drive the probe assembly 600 to move along a first horizontal direction, so that the horizontal position of the probe 620 is aligned with each group of electrodes corresponding to each unit (such as a sub-cell) of the solar cell 10. The probe lifting drive unit 500 then drives the probe assembly 600 downward to bring the probe 620 into contact with the corresponding electrode, allowing the control device to test each unit through the probe 620. Alternatively, after each unit test is completed, the probe assembly 600 is driven upward to prevent the probe 620 from colliding with or scratching the solar cell 10 while moving to align with the next group of electrodes.

[0058] As an optional embodiment of the present invention, Figure 2 、 Figure 3 、 Figure 5 As shown, the probe assembly 600 includes a beam 610 and at least one group of probes 620 fixedly arranged on the beam 610. The beam 610 is connected to the probe lifting drive unit 500 and extends along the second horizontal direction. Each group of probes 620 is spaced apart along the second horizontal direction, and the second horizontal direction is perpendicular to the first horizontal direction.

[0059] It is understandable that the units (e.g., sub-cells) on the solar cell 10 and the electrodes corresponding to each unit are usually distributed in an array. The solar cell testing equipment provided by the present invention can test solar cells of various layout types, and it is only necessary to change the distribution pattern of the probes 620 along the horizontal plane in the probe assembly 600 accordingly. For example, the solar cell testing equipment can be applied to the automated measurement of four types of conventional batteries: modules, sub-modules, sub-cells, and mini-cells. The module mode is used to measure the various parameters of the entire battery module, the sub-module mode is used to measure the various parameters of the battery module in a local area, and the sub-cell mode and the mini-cell mode are used to measure the various parameters of the sub-cells in each area.

[0060] For the convenience of technical personnel to understand, Figure 6 The figure shows a schematic diagram of the principle of implementing a sub-cell mode measurement method using the solar cell testing equipment provided by an embodiment of the present invention. The solar cell 20 includes multiple sub-cells (only four sub-cells, Cell A, Cell B, Cell C, and Cell D, are shown in the figure). Conductive tapes 11 are arranged between sub-cells in different columns. The probe 620 is used to contact the test points on the conductive tape 11 to test the sub-cells.

[0061] Specifically, if Figure 6 As shown, the crossbeam 610 moves to position a, position b, and position c in sequence, so that the probes 620 fixed on the crossbeam 610 contact the four test points d corresponding to each row of sub-cells in sequence (i.e., four-wire method). For example, the probes 620 can be connected to the four test points d (U + 、U - , I + , I - ) to measure the sub-battery Cell A. The four probes 620 form an electrical measurement circuit for the sub-battery Cell A. The four probes 620 are connected to the source meter of the control device (the host computer) to obtain the open circuit voltage V oc , short-circuit current I sc , photoelectric conversion efficiency η, filling factor FF and other physical quantities.

[0062] The equivalent circuit of the electrical measurement circuit is as follows Figure 10 As shown, a method for testing the current and voltage circuits independently is adopted. R1 and R2 are the resistances of the current test instrument line, R3 and R4 are the resistances of the voltage test instrument line, and RL is an adjustable resistor. In the embodiment of the present invention, a four-wire method is adopted for testing. The current test instrument and the voltage test instrument are respectively connected to the corresponding test point d (U through two independent probes 620). + 、U- , I + , I - ) connection, compared with the traditional manual two-wire test, the short-circuit current I sc , filling factor FF and other physical quantities are more accurate.

[0063] Each time the beam 610 reaches a position, the control device tests all the sub-cells in the horizontal direction at the current position at one time. The advantage of this test method is that the photovoltaic parameters of each sub-cell can be measured separately, and the photovoltaic parameters of different areas (such as short-circuit current I sc , open circuit voltage V oc The differences in uniformity (such as those in FIG) are detected, and the recipe settings of the upstream process equipment are adjusted accordingly to ensure the consistency of the performance of different units on the solar cell 10.

[0064] In order to improve the accuracy of the position of the probe along the first horizontal direction and the stability of the movement, as a preferred embodiment of the present invention, Figures 2 to 4 As shown, the horizontal transfer drive unit 400 includes a drive member 410 (for example, it can include a motor, a rotating motor, etc.), a screw 420, a first connecting seat 430 and at least one guide rail 440. The guide rail 440 and the screw 420 both extend along the first horizontal direction. The probe lifting drive unit 500 is fixedly connected to the first connecting seat 430. The first connecting seat 430 is movably arranged on the guide rail 440, and the first connecting seat 430 has a threaded mating through hole. The threaded mating through hole is sleeved on the screw 420 and cooperates with the screw 420. The drive member 410 is used to drive the screw 420 to rotate around its own axis to drive the first connecting seat 430 to drive the probe lifting drive unit 500 to move along the guide rail 440.

[0065] In an embodiment of the present invention, the horizontal transfer drive unit 400 adopts a screw transmission structure, which drives the first connecting seat 430 to move horizontally through the threaded cooperation between the screw 420 and the threaded cooperation through hole of the first connecting seat 430, and accurately converts the rotation angle output by the driving member 410 into the feed amount of the first connecting seat 430 along the first horizontal direction. At the same time, the movement direction of the first connecting seat 430 is limited to the first horizontal direction by at least one guide rail 440, thereby ensuring the accuracy of the position of the probe along the second horizontal direction and ensuring the smooth movement of the first connecting seat 430 and the probe fixed thereon.

[0066] Considering that the horizontal transfer drive unit 400 adopts a structure such as a lead screw and a guide rail, and has a relatively large overall volume, in order to improve the accuracy of testing the solar cell 10, as a preferred embodiment of the present invention, the horizontal transfer drive unit 400 is located below the test table 200. Specifically, Figures 2 to 4As shown, the horizontal transfer drive unit 400 includes a pair of guide rails 440, which are respectively arranged on both sides of the lead screw 420 along the second horizontal direction. The first connecting seat 430 includes a driving connector 431 and a pair of connecting plates 432 fixedly connected to the driving connector 431. The two connecting plates 432 are movably arranged on the two guide rails 440 in a one-to-one correspondence. A threaded through hole is formed in the driving connector 431.

[0067] The horizontal transfer drive unit 400 also includes a second connecting seat 450 and two groups of connecting columns 460. The first connecting seat 430 is located below the test bench 200, and the second connecting seat 450 is located above the test bench 200. The two groups of connecting columns 460 extend in the vertical direction and are respectively located on both sides of the test bench 200 along the second horizontal direction. Each connecting plate 432 is fixedly connected to the second connecting seat 450 through a group of connecting columns 460, and the probe lifting drive unit 500 is fixedly set on the second connecting seat 450.

[0068] In an embodiment of the present invention, the screw 420, guide rail 440 and first connecting seat 430 of the horizontal transfer drive unit 400 are all arranged below the test bench 200. The two connecting plates 432 of the first connecting seat 430 are respectively movably connected to the guide rails 440 on both sides, and are fixedly connected to the second connecting seat 450 above through the connecting column 460. Therefore, while the probe lifting drive unit 500 and the probe assembly 600 are driven to move along the first horizontal direction through the second connecting seat 450, the main power structure of the horizontal transfer drive unit 400 is transferred to the bottom of the test bench 200, thereby avoiding these structures from blocking the simulated sunlight signal provided by the illumination assembly 100, thereby improving the accuracy of testing the solar cell 10.

[0069] Alternatively, as Figure 3 As shown, every two connecting columns 460 form a group. Figure 4 As shown, each connecting plate 432 is movably connected to the corresponding guide rail 440 through a plurality of (eg, two) sliders 441 to ensure the accuracy of the orientation of the connecting plate 432 .

[0070] As an optional embodiment of the present invention, Figures 1 to 4 As shown, the solar cell testing equipment also includes a frame 800, on which the illumination assembly 100, the test bench 200, the control device, and the drive assembly are all fixedly mounted. The control device includes a host computer 310 and a slave computer 320. The slave computer 320 is used to control the actions of the corresponding mechanisms in the drive assembly to perform different tests on the solar cell 10. The host computer 310 is used to communicate with the slave computer 320 and perform optical-to-digital conversion and analysis on the data collected by the slave computer 320.

[0071] Optionally, the illumination assembly 100 is a Class AAA solar simulator capable of emitting simulated sunlight toward the solar cell 10 to simulate the normal operating environment of the solar cell 10. A horizontal mounting base 810 is provided on the frame 800, opposite the solar cell 10. The test bench 200 and the drive assembly are both fixedly mounted on the horizontal mounting base 810. Baffles 820 are also provided on both sides of the horizontal mounting base 810 along the second horizontal direction to prevent dust and other contaminants from entering the interior of the drive assembly, thereby ensuring the cleanliness of the drive assembly and improving the smoothness of its operation.

[0072] like Figure 1 As shown, the lower computer 320 can be set at a position lower than the lighting component 100 and higher than the horizontal mounting seat 810, so that the operator can operate the buttons or touch screen on the lower computer 320 or view the feed amount and other data displayed on the screen of the lower computer 320 in real time. The upper computer 310 can be set below the horizontal mounting seat 810.

[0073] As an optional embodiment of the present invention, Figures 2 to 4 As shown, the driving member 410 includes a motor 411 (which can be an AC servo motor), a coupling 412 and a fixed-end bearing seat 413, and the driving connecting member 431 includes a free-end bearing seat 431a and a first transverse plate 431b. The motor 411 and the fixed-end bearing seat 413 are both fixedly mounted on the horizontal mounting base 810. The fixed-end bearing seat 413 is used to axially position the lead screw 420 (i.e., the lead screw 420 can rotate around its own axis in the fixed-end bearing seat 413, and the position of the lead screw 420 relative to the fixed-end bearing seat 413 along the axial direction remains unchanged). The free-end bearing seat 431a has a threaded through hole. The free-end bearing seat 431a is fixedly connected to the first transverse plate 431b, and is fixedly connected to the connecting plates 432 on both sides through the first transverse plate 431b. The output shaft of the motor 411 is connected to the end of the lead screw 420 through the coupling 412 , so that the motor 411 can drive the lead screw 420 to rotate, thereby driving the fixed end bearing seat 413 to move along the guide rail 440 .

[0074] As an optional embodiment of the present invention, Figure 3 As shown, the second connecting seat 450 includes a second horizontal plate 452 and a pair of connecting plates 451. The probe lifting drive unit 500 is fixedly set on the second horizontal plate 452. The second horizontal plate 452 is vertically set and extends along the second horizontal direction. The two sides of the second horizontal plate 452 are respectively fixedly connected to the top of the corresponding connecting column 460 through two connecting plates 451.

[0075] As a preferred embodiment of the present invention, Figure 3As shown, the horizontal transfer drive unit 400 further includes a light shielding plate 470, which is fixedly mounted on the connecting plate 451 and extends horizontally. The edge of the light shielding plate 470 facing the probe assembly 600 is connected to the second horizontal plate 452, and is used to block light from above. The second connecting base 450 further includes a light shielding cover 453, which is fixedly mounted on the second horizontal plate 452 and located above the probe lifting drive unit 500. The light shielding cover 453 is used to block light from the illumination assembly 100 to the area between the probe assembly 600 and the light shielding plate 470.

[0076] like Figure 3 As shown, the shading plate 470 and the shading cover 453 jointly block the light from the illumination assembly 100 to one side of the probe assembly 600, so that when the horizontal transfer drive unit 400 drives the probe lifting drive unit 500 to drive the probe assembly 600 to move toward the side of the shading plate 470 and detect the sub-cells row by row, the area to be tested (that is, after the probe assembly 600 completes the detection of the current area, it automatically moves to the next area position to be tested) is always blocked by the shading plate 470 to ensure the temperature consistency of each row of sub-cells when being tested, thereby ensuring the accuracy of testing the solar cell 10.

[0077] As an optional embodiment of the present invention, Figures 2 to 4 As shown, the probe lifting drive unit 500 includes a lifting cylinder, the cylinder body of the lifting cylinder is fixedly set on the second connecting seat 450 (specifically, it is set on the side of the second horizontal plate 452 away from the light shielding plate 470), and the output rod of the lifting cylinder is fixedly connected to the probe assembly 600. Under the push of the gas in the cylinder, the piston in the cylinder drives the output rod to move in the vertical direction, thereby realizing the lifting of the probe assembly 600.

[0078] The inventors of the present invention also found in their research that the probes in conventional battery testing equipment are relatively large in size and have restrictions on the width of the battery conductive strips. For example, when the width of the battery conductive strips needs to be greater than 2 mm, the existing technology cannot meet the measurement requirements of more sub-batteries. Moreover, if the width of the conductive strips is too large, the battery shading area will be too large, affecting the measurement effect of the current area, resulting in the measurement results being far smaller than the actual values, and the actual measurement accuracy is limited.

[0079] In order to solve this technical problem, as a preferred embodiment of the present invention, Figures 2 to 4As shown, the probe 620 includes a probe rod 621, a probe clamping tube 622 and a probe sleeve 623. The probe clamping tube 622 is sleeved on the outside of the probe rod 621 and fixedly connected to the crossbeam 610. The probe sleeve 623 is sleeved on the outside of the probe clamping tube 622. The position of the probe rod 621 in the probe clamping tube 622 is fixed, and the bottom end of the probe rod 621 extends out from the bottom end opening of the probe clamping tube 622. The probe clamping tube 622 is movably arranged in the probe sleeve 623. A driving spring is arranged in the probe sleeve 623. The top end of the driving spring is fixedly connected to the probe sleeve 623, and the bottom end of the driving spring is fixedly connected to the top end of the probe clamping tube 622, which is used to maintain the length of the probe clamping tube 622 extending from the bottom end opening of the probe sleeve 623 through elastic force.

[0080] It should be noted that the top and bottom here refer to the upper and lower positional relationship of the probe 620 when in use. In an embodiment of the present invention, the probe 620 adopts a telescopic sleeve structure, including a probe rod 621, a probe clamping tube 622 and a probe sleeve 623, wherein the probe clamping tube 622 is used to reinforce the probe rod 621 to ensure the overall rigidity of the structure and prevent the probe rod 621 with a smaller diameter from bending during the measurement process. When measuring the solar cell 10, the probe lifting drive unit 500 drives the crossbeam 610 to drive the probe sleeve 623 to move downward, and the bottom end of the probe rod 621 supports the lower solar cell 10 (and is electrically contacted with electrodes, conductive strips and other structures). The probe rod 621 and the probe clamping tube 622 are partially retracted into the probe sleeve 623. The driving spring is compressed and maintains a stable contact state between the bottom end of the probe rod 621 and the solar cell 10 through elastic force. After the measurement is completed, the probe lifting drive unit 500 drives the crossbeam 610 to lift the probe sleeve 623, and drives the spring to rebound, so that the probe rod 621 and the probe clamping tube 622 are reset. In an embodiment of the present invention, the projection of the probe rod 621 and the probe clamping tube 622 on the horizontal plane remains unchanged during the extension and retraction process, thereby reducing the area of ​​the probe 620 blocking the simulated sunlight (for example, when the diameter of the probe rod 621 is only 0.3 mm, the diameter of the shadow area formed by the probe 620 blocking the simulated sunlight on the solar cell 10 can be less than 0.1 mm). While ensuring that the probe 620 is in stable contact with the solar cell 10, the lighting effect on the test area is guaranteed, thereby improving the test accuracy of the solar cell.

[0081] Preferably, the probe rod 621, the probe clamping tube 622 and the probe sleeve 623 are all made of nickel-plated brass to ensure that the contact resistance between the components of the probe 620 itself in the probe measurement circuit is small. As an optional embodiment of the present invention, the probe rod 621 can be fixed in the probe clamping tube 622 by sheet metal processing. Specifically, Figure 7As shown, after the probe rod 621 is inserted into the probe clamping tube 622, the probe clamping tube 622 can be subjected to sheet metal processing at a position corresponding to the top of the probe rod 621, so that the tube walls around the probe clamping tube 622 at this position are all concave inward to form a concave structure 622a, thereby increasing the friction between the probe rod 621 and the inner wall of the probe clamping tube 622 through the deformation effect, thereby fixing the probe rod 621 in the probe clamping tube 622.

[0082] In order to further ensure the lighting effect of the test area and improve the test accuracy of the solar cell, as a preferred embodiment of the present invention, Figure 7 As shown, the top of the probe sleeve 623 has a lead end 624. The probe assembly 600 also includes an integrated substrate (e.g., a printed circuit board (PCB)) fixedly mounted on the crossbeam 610. The probe sleeve 623 is directly connected to the integrated substrate via the lead end 624, and is further connected to the control device via the integrated substrate. The grouped probe leads are integrated on the integrated substrate, which is then wired to the source meter of the control device (host computer). When the control device runs the stored test software, it can automatically control the switching of the corresponding circuit, realize the intelligent selection of the measurement channel, and complete the testing of the solar cell and the statistics and sorting of the data.

[0083] As a preferred embodiment of the present invention, Figures 2 to 4 As shown, a plurality of limiting members 210 are fixedly arranged on the bearing surface of the test bench 200. The limiting members 210 have limiting contact surfaces corresponding to the edge shapes of the solar cells 10. The plurality of limiting members 210 are used to limit the edges of the solar cells 10 through the limiting contact surfaces.

[0084] For example, Figure 8 As shown, when the solar cell 10 has a rectangular outer contour, four limiting members 210 can be fixedly arranged on the bearing surface of the test bench 200, and the positions of the four limiting members 210 correspond to the four corners of the solar cell 10 respectively. The limiting contact surface includes two limiting sub-surfaces that are perpendicular to each other, so that the four limiting members 210 can limit the four corners of the solar cell 10 to achieve circumferential positioning of the solar cell 10 and improve the alignment accuracy between the probe 620 and the electrode on the solar cell 10.

[0085] Preferably, the limiting member 210 is made of polyetheretherketone (Peek), and the edge where the top surface of the limiting member 210 intersects with the limiting contact surface can be chamfered to prevent the limiting member 210 from scratching the edge of the solar cell 10 and ensure the product yield of the solar cell 10.

[0086] Preferably, the position of the limiting member 210 on the test bench 200 is adjustable so as to accommodate solar cells 10 of different specifications.

[0087] As a preferred embodiment of the present invention, Figures 2 to 4 As shown, at least one adsorption component is provided on the carrying surface of the test bench 200 corresponding to the area defined by the plurality of limit members 210 , and the adsorption component is used to extract the gas between the solar cell 10 and the carrying surface to adsorb the solar cell 10 .

[0088] In an embodiment of the present invention, an adsorption component is provided on the carrying surface of the test bench 200, which can maintain good seamless contact between the carrying surface of the test bench 200 and the bottom of the solar cell 10 through vacuum adsorption. The solar cell 10 is adsorbed from the back, and when the probe 620 touches the solar cell 10, it causes horizontal displacement of the solar cell 10. In addition, the vacuum adsorption fixing method can realize rapid loading and unloading of the solar cell 10, thereby further improving the battery testing efficiency while ensuring the alignment accuracy between the probe 620 and the solar cell 10.

[0089] As an optional embodiment of the present invention, Figure 8 As shown, the test bench 200 further has tool clamping introduction notches 220 on both sides along the second horizontal direction for allowing battery clamping tools to enter and exit.

[0090] It should be noted that, in order to prevent the solar cell 10 from vibrating up and down during the test, in addition to the limit member 210, different structures of tooling fixtures can be configured for different types of solar cells 10 to fix the solar cell 10 on the test bench 200. For example, a commonly used H-type silicon solar cell fixture can be configured, or other new non-standard battery sample fixtures in the industry can be flexibly configured, such as a thin-film battery fixture, a HIT battery fixture, an MWT full-back contact battery fixture, a double-sided battery fixture, etc.

[0091] As a preferred embodiment of the present invention, a heater 700 is provided at the bottom of the test bench 200. Figure 9As shown, the heater 700 includes a containing box 710 and a plurality of heating wires 720 arranged in the containing box 710. The containing box 710 has a plurality of heating zones distributed in sequence along the second horizontal direction. The plurality of heating wires 720 are bent and distributed in the plurality of heating zones in a one-to-one correspondence. A temperature test piece 730 (optionally a thermocouple) is also provided in each heating zone. The temperature test piece 730 is fixedly provided on the bottom wall of the containing box 710. The heater 700 is used to adjust the heating power of the corresponding heating wire 720 according to the temperature test value of each temperature test piece 730, so as to maintain the temperature test values ​​of the plurality of temperature test pieces 730 at a preset temperature, thereby maintaining the temperature of the solar cell 10 at a constant value (for example, to meet the specific constant temperature requirements of the IEC60904 standard, the temperature of the solar cell 10 can be maintained at 25°C), thereby improving the accuracy of testing the solar cell.

[0092] Furthermore, the solar cell testing device provided by the present invention includes a heater 700 capable of maintaining a constant temperature of the solar cell 10 , thereby enabling efficiency testing to be performed after a high-temperature aging test of the solar cell 10 , thereby expanding the process range to which the solar cell testing device can adapt.

[0093] Alternatively, as Figure 9 As shown, the outer wall of the container 710 is provided with a plurality of lead-out terminals 721 corresponding to the positions of the plurality of heating zones. Both ends of the heating wire 720 are connected to the corresponding lead-out terminals 721 and are connected to the temperature control system corresponding to the heater 700 through the lead-out terminals 721. The bottom wall of the container 710 is also fixedly provided with a plurality of groups of insulating columns 722 (optionally made of ceramic material) corresponding to the plurality of heating wires 720. Each group of insulating columns 722 is arranged at intervals along the extension path of the corresponding heating wire 720 and is fixedly connected to the heating wire 720 to maintain the shape of the heating wire 720.

[0094] Alternatively, as Figure 9 As shown, the heating wire 720 is bent and extended into an "M" shape, that is, the end connected to the lead-out end 721 extends in a direction away from the lead-out end 721, then bends 180° and extends toward the lead-out end 721, bends 180° again at a position near the lead-out end 721 and extends away from the lead-out end 721, and then bends 180° again and extends toward the lead-out end 721 until the other end of the heating wire 720 is connected to the lead-out end 721. Optionally, as Figure 9 As shown, the heater 700 includes three heating wires 720 .

[0095] As a preferred embodiment of the present invention, the temperature control system of the heater 700 adjusts the heating power of the corresponding heating wire 720 according to the temperature test value of each temperature test piece 730 through a proportional integral differential (PID) temperature control method to achieve high-precision temperature control within an error range of ±0.2°C, thereby ensuring accurate and reliable test data, so that the machine meets the IEC60904 standard, and can be used for the calibration of first-level standard cells in the solar cell industry.

[0096] It will be understood that the above embodiments are merely exemplary embodiments for illustrating the principles of the present invention, and the present invention is not limited thereto. Those skilled in the art will appreciate that various modifications and improvements can be made without departing from the spirit and substance of the present invention, and such modifications and improvements are also considered to be within the scope of protection of the present invention.

Claims

1. A solar cell testing device, characterized in that: The solar cell testing equipment includes an illumination assembly, a test bench, a drive assembly, and a probe assembly, wherein the test bench is used to carry solar cells; the illumination assembly is used to provide light to the solar cells on the test bench; and the drive assembly is used to drive the probe assembly located above the test bench to reciprocate in a first horizontal direction or to move up and down in a vertical direction, so that multiple probes of the probe assembly sequentially contact multiple electrodes of the solar cell. The driving assembly includes a horizontal transfer driving part and a probe lifting driving part, wherein the probe lifting driving part is used to drive the probe assembly to move up and down in the vertical direction, and the horizontal transfer driving part is used to drive the probe lifting driving part to drive the probe assembly to reciprocate along the first horizontal direction; The horizontal transfer drive unit includes a drive member, a lead screw, a first connecting seat and at least one guide rail, wherein the guide rail and the lead screw both extend along the first horizontal direction, the probe lifting drive unit is fixedly connected to the first connecting seat, the first connecting seat is movably arranged on the guide rail, and the first connecting seat has a threaded mating through hole, the threaded mating through hole is sleeved on the lead screw and matched with the lead screw, the drive member is used to drive the lead screw to rotate around its own axis, so as to drive the first connecting seat to drive the probe lifting drive unit to move along the guide rail; The horizontal transfer drive unit includes a pair of guide rails, the two guide rails are respectively arranged on both sides of the lead screw along the second horizontal direction, the second horizontal direction is perpendicular to the first horizontal direction, the first connecting seat includes a driving connector and a pair of connecting plates fixedly connected to the driving connector, the two connecting plates are movably arranged on the two guide rails in a one-to-one correspondence, and the threaded mating through hole is formed in the driving connector; The horizontal transfer drive unit also includes a second connecting seat and two groups of connecting columns. The first connecting seat is located below the test bench, and the second connecting seat is located above the test bench. The two groups of connecting columns extend in the vertical direction and are respectively located on both sides of the test bench along the second horizontal direction. Each of the connecting plates is fixedly connected to the second connecting seat through a group of connecting columns, and the probe lifting drive unit is fixedly set on the second connecting seat.

2. The solar cell testing device according to claim 1, characterized in that: The second connecting base includes a second transverse plate, a light shield and a pair of connecting plates, the probe lifting drive unit is fixedly arranged on the second transverse plate, the second transverse plate is vertically arranged and extends along the second horizontal direction, and both sides of the second transverse plate are fixedly connected to the top ends of the corresponding connecting columns through two connecting plates; The horizontal transfer drive unit also includes a light shielding plate, which is fixedly arranged on the connecting plate and extends in the horizontal direction. The edge of the light shielding plate facing the probe assembly is connected to the second horizontal plate for blocking the light above it; the light shield is fixedly arranged on the second horizontal plate and is located above the probe lifting drive unit for blocking the light irradiated by the illumination assembly to the area between the probe assembly and the light shielding plate.

3. The solar cell testing device according to claim 1, wherein: The probe assembly includes a beam and at least one group of probes fixedly arranged on the beam. The beam is connected to the probe lifting drive unit and extends along the second horizontal direction. Each group of probes is spaced apart along the second horizontal direction.

4. The solar cell testing device according to claim 3, characterized in that: The probe includes a probe rod, a probe clamping tube and a probe sleeve. The probe clamping tube is sleeved on the outside of the probe rod and fixedly connected to the crossbeam. The probe sleeve is sleeved on the outside of the probe clamping tube. The position of the probe rod in the probe clamping tube is fixed, and the bottom end of the probe rod extends out of the bottom end opening of the probe clamping tube. The probe clamping tube is movably arranged in the probe sleeve. A driving spring is arranged in the probe sleeve. The top end of the driving spring is fixedly connected to the probe sleeve. The bottom end of the driving spring is fixedly connected to the top end of the probe clamping tube, and is used to maintain the length of the probe clamping tube extending out of the bottom end opening of the probe sleeve by elastic force.

5. The solar cell testing device according to any one of claims 1 to 4, characterized in that: A plurality of limiting members are fixedly provided on the bearing surface of the test bench, each of the limiting members having a limiting contact surface corresponding to the edge shape of the solar cell, and the plurality of limiting members are used to limit the edge of the solar cell through the limiting contact surface.

6. The solar cell testing device according to claim 5, characterized in that: At least one adsorption component is provided on the carrying surface of the test bench corresponding to the area defined by the plurality of limit members, and the adsorption component is used to extract the gas between the solar cell and the carrying surface to adsorb the solar cell.

7. The solar cell testing device according to any one of claims 1 to 4, characterized in that: A heater is provided at the bottom of the test bench, and the heater includes a containing box and a plurality of heating wires arranged in the containing box. The containing box has a plurality of heating zones distributed in sequence along the second horizontal direction. The plurality of heating wires are bent and distributed in the plurality of heating zones in a one-to-one correspondence. A temperature test piece is also provided in each of the heating zones. The heater is used to adjust the heating power of the corresponding heating wire according to the temperature test value of each temperature test piece, so as to maintain the temperature test values ​​of the plurality of temperature test pieces at a preset temperature.

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