Infrared light heating with wide temperature range, atmosphere controllable, visual electrical test system

Abstract

The present invention relates to an infrared light heating system with a wide temperature range, controllable atmosphere and visual electrical testing, which belongs to the field of electrical testing technology, and includes a protective shell, a measuring fixture installed in the protective shell, used to load the sample to be tested and put it in a gas protection atmosphere; a heating element installed in the protective shell, used to heat the sample to be tested; a temperature recorder connected to the measuring fixture, used to detect the temperature of the sample to be tested; an electrical tester connected to the measuring fixture, used to detect the test signal of the sample to be tested; and a camera, used to monitor the state of the sample to be tested in real time. The present invention installs a halogen lamp at the focus of an ellipsoidal reflector, focuses the light on the sample after being converged by the ellipsoidal reflector, and then heats the sample, and the heating temperature is as high as 2200°C; the stability and real-time monitorability of the sample can be guaranteed while reaching 2200°C.

Description

Technical Field

[0001] The invention relates to the technical field of electrical testing, in particular to an infrared light heating system with a wide temperature range, controllable atmosphere and visual electrical testing. Background Art

[0002] With the development of science and technology, the demand for miniaturization, integration and stabilization of electronic devices is becoming increasingly prominent. New requirements have also been put forward for the study of the electrical properties of electronic devices. The temperature field has a very important influence on the electrical properties of the sample, and it is also one of the "field factors" that are first considered in studying materials. Under different temperature environments, even the electrical properties, microstructures and action mechanisms of the same sample will be different. When the temperature reaches the critical point, the phase structure of some samples will mutate, resulting in huge differences in the performance of the samples before and after the critical point temperature. Therefore, electrical performance measurements over a wide temperature range are more helpful in understanding the performance of the sample.

[0003] Industries such as aerospace and nuclear reactors require operations at higher temperatures. In complex high-temperature environments, performance testing of samples is technically difficult. Currently, the highest measurement temperature is 1900°C, but it can only be kept warm for a short time (see Chinese patent, application number 201910243502.X), and it is difficult to maintain the temperature at 1900°C for a long time. Secondly, most of the existing high-temperature electrical heating furnaces heat the samples through heating wires and seal the furnaces intact (see Chinese patent, application number 201920415639.4), which will make it impossible to observe the state of the samples at the current temperature, and thus the reliability of the test results cannot be guaranteed. In addition, samples are prone to react with gases at high temperatures. For example, metal samples are prone to react with oxygen in the air at high temperatures to form oxide films. Some oxides are prone to reduction reactions at high temperatures. Therefore, to ensure the stability of samples at high temperatures, protective gas needs to be introduced. On the other hand, the introduction of gas is more conducive to exploring the chemical reactions between gases and samples at high temperatures and detecting the effects of the reactions on sample performance.

[0004] The temperature test range of existing variable temperature electrical testing systems is far from meeting the increasing exploration of material properties under extreme temperatures; conventional testing methods cannot simultaneously observe the color and morphology changes of the samples under test. Summary of the invention

[0005] The object of the present invention is to provide an infrared light heating system with a wide temperature range, controllable atmosphere and visual electrical testing to solve the problems raised in the above-mentioned background technology.

[0006] To achieve the above object, the present invention provides the following technical solutions:

[0007] An infrared light heating system with wide temperature range, controlled atmosphere and visual electrical testing, comprising:

[0008] Protective case,

[0009] A measuring fixture, installed in the protective shell, used to load the sample to be tested and place it in a gas protective atmosphere;

[0010] A heating element, installed in the protective shell, used to heat the sample to be tested;

[0011] A temperature recorder, connected to the measuring fixture, for detecting the temperature of the sample to be measured;

[0012] An electrical tester, connected to the measuring fixture, for detecting a test signal of the sample to be tested;

[0013] The camera is used to monitor the status of the sample to be tested in real time.

[0014] As a further technical solution of the present invention, the measuring fixture comprises an upper probe part and a lower probe part matching therewith, and the upper probe part is connected to the lower probe part through a quartz tube.

[0015] As a further technical solution of the present invention, the upper probe part includes:

[0016] An upper load-bearing device, fixedly installed in the protective shell;

[0017] An upper locking device is installed in the upper load-bearing device, and an upper rod is installed in the upper locking device;

[0018] The upper corundum tube has one end connected to the upper rod through the upper connecting device and the other end is equipped with an upper electrode sheet;

[0019] An air inlet valve is installed on the upper connecting device and is used to inflate the quartz tube.

[0020] As a further technical solution of the present invention, the lower probe part includes:

[0021] A lower load-bearing device, fixedly installed in the protective shell;

[0022] A lower locking device is installed in the lower load-bearing device, and a lower rod is installed in the lower locking device;

[0023] A lower corundum tube, one end of which is connected to the lower rod through a lower connecting device, and the other end of which is provided with a corundum plate;

[0024] A lower electrode sheet is mounted on a side of the corundum plate away from the lower corundum tube and cooperates with the upper electrode sheet;

[0025] An air outlet valve, mounted on the lower connecting device, for exhausting air from the quartz tube to the outside;

[0026] One end of the quartz tube is connected to the upper connecting device, and the other end is connected to the lower connecting device, which is used to seal the upper corundum tube and the lower corundum tube inside;.

[0027] As a further technical solution of the present invention, the upper connecting device includes:

[0028] An upper flange, one side of which is connected to the upper rod, and the other side of which is connected to the quartz tube;

[0029] An upper connector is installed inside the quartz tube, one end of the upper connector is fixedly connected to the upper rod, and the other end of the upper connector is fixedly connected to the upper corundum tube.

[0030] As a further technical solution of the present invention, the lower connecting device comprises:

[0031] A lower flange, one side of which is connected to the lower rod, and the other side of which is connected to the quartz tube;

[0032] A lower connector is installed inside the quartz tube, one end of which is fixedly connected to the lower rod, and the other end is fixedly connected to the lower corundum tube.

[0033] As a further technical solution of the present invention, the heating element comprises:

[0034] An ellipsoid reflector is fixedly mounted on the lower load-bearing device;

[0035] The halogen lamp is fixedly installed in the ellipsoid reflector. When the halogen lamp is working, the light emitted is focused by the ellipsoid reflector to heat the sample to be tested.

[0036] As a further technical solution of the present invention, a plurality of ellipsoidal reflectors are provided, and the plurality of ellipsoidal reflectors are evenly distributed outside the quartz tube.

[0037] As a further technical solution of the present invention, through holes are provided in both the upper corundum tube and the lower corundum tube, and metal wires are installed in the through holes.

[0038] As a further technical solution of the present invention, the protective shell is provided with a fan for exchanging heat for the heating element.

[0039] As a further technical solution of the present invention, a probe assembly for connecting an external power supply connector and an internal electrical appliance is provided at the bottom of the protective shell.

[0040] Compared with the prior art, the present invention has the following beneficial effects:

[0041] 1. By installing a halogen lamp at the focus of the ellipsoid reflector, the light is focused on the sample after being converged by the ellipsoid reflector, and then the sample is heated to a temperature of up to 2200°C; this heating method has a large temperature gradient. A camera is installed at a certain distance from the sample to be tested, which can monitor the color and morphology changes of the sample at high temperature in real time, and have a further understanding of the real-time high-temperature state of the sample.

[0042] 2. Insert a quartz tube over the sample to be tested, control the inlet and outlet valves, and allow different atmospheres (vacuum, oxygen, hydrogen, argon, etc.) to flow in, thereby ensuring the stability of the sample or exploring the chemical reaction between the gas and the sample at high temperature, and detecting the effect of the reaction on the sample performance;

[0043] 3. It can ensure the stability and real-time monitoring of samples at up to 2200°C. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] Figure 1 A top view of the infrared light heating wide temperature range, atmosphere controllable, visible electrical test system;

[0045] Figure 2 Front view of infrared light heating with wide temperature range, controlled atmosphere and visual electrical test system;

[0046] Figure 3 Schematic diagram of the internal structure of the infrared light heating wide temperature range, atmosphere controllable, and visual electrical testing system;

[0047] Figure 4 This is a schematic diagram of the partial structure of the infrared light heating system with a wide temperature range, controllable atmosphere, and visual electrical testing.

[0048] In the figure: 1-protective shell, 2-halogen lamp, 3-quartz tube, 4-sample to be tested, 5-temperature recorder, 6-electrical tester, 7-metal wire, 8-camera, 9-upper load-bearing device, 10-upper locking device, 11-upper rod, 12-inlet valve, 13-upper connecting device, 14-ellipsoidal reflector, 15-upper corundum tube, 16-lower corundum tube, 17-lower load-bearing device, 18-lower connecting device, 19-exhaust valve, 20-lower locking device, 21-lower rod, 22-upper flange, 23-upper connector, 24-lower connector, 25-lower flange, 26-upper electrode sheet, 27-corundum plate, 28-lower electrode sheet, A-upper probe part, B-lower probe part. DETAILED DESCRIPTION

[0049] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the accompanying drawings in the embodiments of the present invention.

[0050] The embodiment of the present invention is implemented as follows: Figures 1 to 4The infrared light heating wide temperature range, atmosphere controlled, visual electrical test system shown includes:

[0051] Protective shell 1,

[0052] A measuring fixture, installed in the protective shell 1, used to load the sample 4 to be tested and place it in a gas protective atmosphere;

[0053] A heating element, installed in the protective shell 1, used to heat the sample 4 to be tested;

[0054] A temperature recorder 5, connected to the measuring fixture, for detecting the temperature of the sample 4 to be measured;

[0055] An electrical tester 6, connected to the measuring fixture, for detecting a test signal of the sample 4 to be tested;

[0056] The camera 8 is used to monitor the status of the sample 4 in real time.

[0057] In actual application, the present invention places the sample 4 to be tested on a measuring fixture, controls the atmosphere to be introduced, keeps the sample stable, and then heats it through a heating element. At this time, the temperature is monitored in real time under the action of a temperature recorder 5, an electrical tester 6 detects the test signal, and a camera 8 monitors the sample status in real time. It is also possible to explore chemical reactions between different atmospheres (vacuum, oxygen, hydrogen, argon, etc.) and the sample 4 to be tested at high temperatures, and detect the effects of the reactions on the performance of the sample 4 to be tested, thereby achieving high-temperature stability and real-time monitorability of the sample 4 to be tested, which is more practical.

[0058] like Figures 2 to 4 As shown, as a preferred embodiment of the present invention, the measuring fixture includes an upper probe part A and a lower probe part B matched therewith, the upper probe part A is connected to the lower probe part B through a quartz tube 3, and the upper probe part A includes:

[0059] An upper load-bearing device 9 is fixedly installed in the protective shell 1;

[0060] An upper locking device 10 is installed in the upper load-bearing device 9, and an upper rod 11 is installed in the upper locking device 10;

[0061] The upper corundum tube 15 has one end connected to the upper rod 11 through the upper connecting device 13 and the other end is provided with an upper electrode sheet 26;

[0062] The air inlet valve 12 is installed on the upper connecting device 13 and is used to inflate the quartz tube 3 .

[0063] The lower probe part B comprises:

[0064] A lower load-bearing device 17, fixedly installed in the protective shell 1;

[0065] A lower locking device 20 is installed in the lower load-bearing device 17, and a lower rod 21 is installed in the lower locking device 20;

[0066] A lower corundum tube 16, one end of which is connected to the lower rod 21 through a lower connecting device 18, and a corundum plate 27 is installed at the other end;

[0067] The lower electrode sheet 28 is mounted on the side of the corundum plate 27 away from the lower corundum tube 16 and cooperates with the upper electrode sheet 26;

[0068] An outlet valve 19, mounted on the lower connecting device 18, for exhausting gas from the quartz tube 3 to the outside;

[0069] One end of the quartz tube 3 is connected to the upper connecting device 13 , and the other end is connected to the lower connecting device 18 , so as to seal the upper corundum tube 15 and the lower corundum tube 16 inside.

[0070] In one case of the present embodiment, the upper probe part A fixes the upper corundum tube 15 to the upper rod 11, one end of the metal wire 7 passes through the through hole of the upper corundum tube 15 and is connected to the upper electrode sheet 26 at the lower end of the upper corundum tube 15, and the other end is connected to the electrical tester 6; the lower probe part B fixes the lower corundum tube 16 to the lower rod 21, and a corundum plate 27 is placed on the upper end of the lower corundum tube 16 to accommodate the sample 4 to be tested, and an electrode sheet 28 is placed on the upper end of the corundum plate 27, one end of a metal wire 7 passes through a through hole in the lower corundum tube 16 and the corundum plate 27 and is connected to the electrode sheet, and the other end is connected to the electrical tester 6, and one end of another metal wire 7 passes through another through hole in the lower corundum tube 16 and is connected to the corundum plate 27, and the other end is connected to the temperature recorder 5; when working, a quartz tube 3 is loaded outside the sample 4 to be tested, and air inlets are set at both ends. Valve 12 and outlet valve 19 are used to control the introduction of different atmospheres. This is because materials are easily reacted with gases at high temperatures. For example, metal materials are easily reacted with oxygen in the air at high temperatures to form oxide films, and some oxides are easily reduced at high temperatures. Therefore, different atmospheres are introduced to ensure the stability of the material at high temperatures. In addition, the introduction of gas can explore the chemical reaction between the gas and the sample to be tested 4 at high temperatures, and detect the impact of the reaction on the performance of the sample to be tested 4. Furthermore, in the preparation process of the sample to be tested 4, the electrodes are arranged according to the target temperature of the sample to be tested 4. If the sample is to be measured to 400°C, the material of the upper electrode sheet 26 and the lower electrode sheet 28 can be silver sheet, and the metal wire 7 is silver wire; if the sample to be tested 4 is to be measured to 1500°C, platinum sheets are selected as the upper electrode sheet 26 and the lower electrode sheet 28, and the metal wire 7 is platinum wire.

[0071] like Figure 3 As shown, as another preferred embodiment of the present invention, the upper connecting device 13 includes:

[0072] An upper flange 22, one side of which is connected to the upper rod 11, and the other side of which is connected to the quartz tube 3;

[0073] An upper connector 23 is installed inside the quartz tube 3, one end of the upper connector 23 is fixedly connected to the upper rod 11, and the other end is fixedly connected to the upper corundum tube 15;

[0074] The lower connecting device 18 comprises:

[0075] A lower flange 25, one side of which is connected to the lower rod 21, and the other side of which is connected to the quartz tube 3;

[0076] The lower connector 24 is installed inside the quartz tube 3 , one end of the lower connector 24 is fixedly connected to the lower rod 21 , and the other end of the lower connector 24 is fixedly connected to the lower corundum tube 16 .

[0077] In one case of this embodiment, the connection stability of the upper end is improved and the sealing is maintained by connecting the upper flange 22 and the upper connecting head 23, and the connection stability of the lower end is improved and the sealing is maintained by connecting the lower flange 25 and the lower connecting head 24. The overall structure is more stable and the sealing effect is good.

[0078] like Figure 2 , Figure 3 As shown, as another preferred embodiment of the present invention, the heating element comprises:

[0079] The ellipsoid reflector 14 is fixedly mounted on the lower load-bearing device 17;

[0080] The halogen lamp 2 is fixedly installed in the ellipsoid reflector 14. When the halogen lamp 2 is working, the light emitted is focused by the ellipsoid reflector 14 to heat the sample 4 to be tested.

[0081] In one case of the present embodiment, a plurality of ellipsoidal reflectors 14 are provided, and the plurality of ellipsoidal reflectors 14 are evenly distributed outside the quartz tube 3, and in the present embodiment, there are four ellipsoidal reflectors. The halogen lamp 2 is located at the focus of the ellipsoidal reflector 14, and the light emitted by the light source is focused by the ellipsoidal reflector 14 and converged on the sample to be tested 4, and serves as a heat source to heat the sample to be tested 4, and the heating temperature is as high as 2200°C. Preferably, a fan for heat exchange of the heating element is provided on the protective shell 1, and a probe assembly for connecting an external power supply connector and an internal electrical appliance is provided at the bottom of the protective shell 1; when working, the halogen lamp 2 is started, the power is slowly increased, and the readings of the temperature recorder 5 and the electrical tester 6 are recorded in real time.

[0082] It will be apparent to those skilled in the art that the invention is not limited to the details of the exemplary embodiments described above and that the invention can be implemented in other specific forms without departing from the spirit or essential features of the invention. Therefore, the embodiments should be considered exemplary and non-limiting in all respects, and the scope of the invention is defined by the appended claims rather than the foregoing description, and it is intended that all variations falling within the meaning and scope of the equivalent elements of the claims be included in the invention. Any reference numeral in a claim should not be considered as limiting the claim to which it relates.

[0083] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

Claims

1. Infrared light heating with wide temperature range, atmosphere controllable, visual electrical testing system, characterized by: include: Protective case, A measuring fixture, installed in the protective shell, used to load the sample to be tested and place it in a gas protective atmosphere; A heating element, installed in the protective shell, used to heat the sample to be tested; A temperature recorder, connected to the measuring fixture, for detecting the temperature of the sample to be measured; An electrical tester, connected to the measuring fixture, for detecting a test signal of the sample to be tested; Camera, used to monitor the status of the sample to be tested in real time; The measuring fixture comprises an upper probe part and a lower probe part matched therewith, and the upper probe part is connected to the lower probe part through a quartz tube; The upper probe portion comprises: An upper load-bearing device, fixedly installed in the protective shell; An upper locking device is installed in the upper load-bearing device, and an upper rod is installed in the upper locking device; The upper corundum tube has one end connected to the upper rod through the upper connecting device and the other end is equipped with an upper electrode sheet; an air inlet valve, mounted on the upper connecting device, for inflating the quartz tube; The lower probe part comprises: A lower load-bearing device, fixedly installed in the protective shell; A lower locking device is installed in the lower load-bearing device, and a lower rod is installed in the lower locking device; A lower corundum tube, one end of which is connected to the lower rod through a lower connecting device, and the other end of which is provided with a corundum plate; A lower electrode sheet is mounted on a side of the corundum plate away from the lower corundum tube and cooperates with the upper electrode sheet; An air outlet valve, mounted on the lower connecting device, for exhausting air from the quartz tube to the outside; One end of the quartz tube is connected to the upper connecting device, and the other end is connected to the lower connecting device, so as to seal the upper corundum tube and the lower corundum tube inside; The heating element comprises: An ellipsoid reflector is fixedly mounted on the lower load-bearing device; A halogen lamp is fixedly installed in the ellipsoid reflector. When the halogen lamp is working, the light emitted is focused by the ellipsoid reflector to heat the sample to be tested. There are multiple ellipsoid reflectors, and the multiple ellipsoid reflectors are evenly distributed outside the quartz tube. By installing a halogen lamp at the focus of the ellipsoidal reflector, the light is focused on the sample after being converged by the ellipsoidal reflector, and then the sample is heated to a temperature of up to 2200°C. This heating method has a large temperature gradient, and a camera is installed at a certain distance from the sample to be tested, which can monitor the color and morphology changes of the sample at high temperature in real time.

2. The infrared light heating wide temperature range, atmosphere controllable, visual electrical testing system according to claim 1 is characterized in that: The upper connecting device comprises: An upper flange, one side of which is connected to the upper rod, and the other side of which is connected to the quartz tube; An upper connector is installed inside the quartz tube, one end of the upper connector is fixedly connected to the upper rod, and the other end of the upper connector is fixedly connected to the upper corundum tube.

3. The infrared light heating wide temperature range, atmosphere controllable, visual electrical testing system according to claim 1 is characterized in that: The lower connecting device comprises: A lower flange, one side of which is connected to the lower rod, and the other side of which is connected to the quartz tube; The lower connector is installed inside the quartz tube, one end of the lower connector is fixedly connected to the lower rod, and the other end of the lower connector is fixedly connected to the lower corundum tube.

4. The infrared light heating wide temperature range, atmosphere controllable, visual electrical testing system according to claim 1 is characterized in that: The upper corundum tube and the lower corundum tube are both provided with through holes, and metal wires are installed in the through holes.

5. The infrared light heating wide temperature range, atmosphere controllable, visual electrical testing system according to claim 1, characterized in that: The protective shell is provided with a fan for exchanging heat for the heating element.

6. The infrared light heating wide temperature range, atmosphere controllable, visual electrical testing system according to claim 1 or 5, characterized in that: A probe assembly for connecting an external power supply connector and internal electrical appliances is provided at the bottom of the protective shell.

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