Circuit board test structure and circuit board test fixture

Abstract

The present disclosure relates to the field of circuit board testing technology, and in particular to a circuit board testing structure and a circuit board testing fixture, wherein the circuit board testing structure includes a test platform, a test assembly, and a cover assembly; the first side of the test platform is provided with a test position for mounting a circuit board to be tested; the test assembly includes a control board, a first switch, and a second switch, and the control board, the first switch, and the second switch are connected to form a control circuit; the cover assembly includes a first cover and a second cover, the first cover is provided with a first trigger device for triggering the first switch, and the second cover is provided with a second trigger device for triggering the second switch, the first cover and the second cover are sequentially stacked above the test position, and sequentially trigger the first switch and the second switch. The technical solution of the embodiment of the present disclosure can be adapted to a wider variety of circuit boards to be tested, and has a fool-proof effect for operators, effectively reducing the burn-in situation during the test process, and ensuring the accuracy of the operation during the test process.

Description

Technical Field

[0001] The present disclosure relates to the technical field of circuit board testing, and in particular to a circuit board testing structure and a circuit board testing fixture. Background Art

[0002] In existing circuit board testing, testers directly plug live adapters into the circuit board under test. This method can easily cause short circuits in circuit board components and ultimately burn out the circuit board. Therefore, existing testing methods and simple test fixtures cannot prevent personnel from making mistakes, nor can they prevent mistakes in the order in which personnel plug and unplug interfaces.

[0003] The current solution is to use a needle-planting fixture, that is, in the circuit board testing process, the probe is used to contact the TP test point of the circuit board, and then the test interface is transferred out by winding wires on the probe. This method can reduce the operation of personnel to achieve the effect of preventing personnel from making mistakes. However, there is attenuation of large current and high-frequency signals in the probe, and false detection frequently occurs during the test. In addition, some high-power chips on the circuit board require a large heat sink for heat dissipation during the test process, which will also cause some test needle points to be unable to be planted, resulting in the inability to test. If the circuit board to be tested is inserted into the accompanying test circuit board through a card slot for testing, there is no way to plant the needle, and the needle points on the front and back of the circuit board will be blocked by the accompanying test circuit board. Summary of the Invention

[0004] To solve at least the above technical problems in the prior art, embodiments of the present disclosure provide a circuit board test structure and a circuit board test fixture.

[0005] On the one hand, an embodiment of the present disclosure provides a circuit board testing structure, including a test platform, a test assembly and a cover assembly; the first surface of the test platform is provided with a test position for mounting a circuit board to be tested; the test assembly includes a control board, a first switch and a second switch, and the control board, the first switch and the second switch are connected to form a control circuit; the cover assembly includes a first cover and a second cover, the first cover is provided with a first trigger device for triggering the first switch, and the second cover is provided with a second trigger device for triggering the second switch, the first cover and the second cover are stacked in sequence above the test position, and trigger the first switch and the second switch in sequence.

[0006] In some embodiments, the test platform is provided with a first support column and a second support column, the height of the second support column is greater than the height of the first support column; one end of the first cover plate is rotatably connected to the first support column, and one end of the second cover plate is rotatably connected to the second support column.

[0007] In some embodiments, the first support column and the second support column are located on a set of opposite sides of the test platform; an intermediate support column for supporting the first cover plate and the second cover plate is provided on the test platform between the first support column and the second support column.

[0008] In some embodiments, the control panel, the first switch and the second switch are located on the side of the second surface of the test platform; a through hole is provided on the test platform, the first switch and the second switch are provided in the through hole or at the end of the through hole, the first trigger device and the second trigger device are columnar and are used to pass through the through hole to trigger the first switch and the second switch respectively.

[0009] In some embodiments, the first cover plate is provided with a through hole for housing the heat dissipation structure on the circuit board to be tested; and the second cover plate is provided with a heat dissipation fan at a position opposite to the through hole.

[0010] In some embodiments, the test assembly also includes a battery adapter, which is arranged on the first side of the test platform, and the battery adapter includes a first battery connector and a second battery connector; the first battery connector is used to connect to the control board, and the second battery connector is used to connect to the circuit board to be tested.

[0011] In some embodiments, the test component also includes a power adapter, which is arranged on the first surface of the test platform, and the power adapter includes a first power connector and a second power connector; the first power connector is used to connect to the control board, and the second power connector is used to connect to the circuit board to be tested.

[0012] In some embodiments, the test platform is further provided with a support frame for supporting the display device.

[0013] Another aspect of the present disclosure provides a circuit board test fixture, including the above-mentioned circuit board test structure.

[0014] In some embodiments, a box is further included, the test platform is located on the top of the box, and the test assembly is located inside the box.

[0015] The embodiments of the present disclosure provide a circuit board test structure and a circuit board test fixture. When conducting a circuit board test, the circuit board to be tested is placed on the test position, and then the first cover and the second cover are closed in sequence, so that the first switch and the second switch are triggered at intervals in sequence, wherein the first switch is used to control the battery switch of the circuit board to be tested, and the second switch is used to control the power switch of the circuit board to be tested. This method ensures that the battery is connected first and then the power is connected, which can avoid the situation where the power is connected first and then the battery, resulting in short circuit of parts and burn-in of the circuit board. In the technical solution disclosed in the present disclosure, there is no pinpoint interference, and it can be adapted to more types of circuit boards to be tested. The first switch and the second switch are triggered in sequence through two covers, which has a fool-proof effect for the operator, effectively reduces the burn-in situation during the test, and ensures the accuracy of the operation during the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The above and other objects, features and advantages of the exemplary embodiments of the present disclosure will become readily understood by reading the detailed description below with reference to the accompanying drawings, in which several embodiments of the present disclosure are shown by way of example and not limitation, wherein:

[0017] In the drawings, the same or corresponding reference numerals denote the same or corresponding parts.

[0018] Figure 1 This is a schematic structural diagram of a circuit board test structure according to an embodiment of the present disclosure;

[0019] Figure 2 This is a top view of a circuit board test structure according to an embodiment of the present disclosure;

[0020] Figure 3 A circuit diagram of a circuit board test structure according to an embodiment of the present disclosure;

[0021] Figure 4 This is a cross-sectional view of a first switch / second switch in a circuit board test structure according to an embodiment of the present disclosure.

[0022] In the picture:

[0023] 1: Test platform; 2: Control panel; 3: First switch; 4: Second switch; 5: First cover; 6: Second cover; 7: First trigger device; 8: Second trigger device; 9: First support column; 10: Second support column; 11: Middle support column; 12: Cooling fan; 13: Battery adapter; 14: Power adapter; 15: Support frame; 16: Box; 17: Fan switch button; 18: Circuit board to be tested. DETAILED DESCRIPTION

[0024] To make the purposes, features, and advantages of the present disclosure more apparent and understandable, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present disclosure, not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of the present disclosure without creative work shall fall within the scope of protection of the present disclosure.

[0025] like Figure 1 and Figure 2 As shown, the present disclosure provides a circuit board test structure, including a test platform 1, a test assembly and a cover assembly; the first surface of the test platform 1 is provided with a test position for installing a circuit board 18 to be tested; the test assembly includes a control board 2, a first switch 3 and a second switch 4, and the control board 2, the first switch 3 and the second switch 4 are connected to form a control circuit; the cover assembly includes a first cover 5 and a second cover 6, the first cover 5 is provided with a first trigger device 7 for triggering the first switch 3, and the second cover 6 is provided with a second trigger device 8 for triggering the second switch 4, the first cover 5 and the second cover 6 are stacked in sequence above the test position, and trigger the first switch 3 and the second switch 4 in sequence.

[0026] When testing a circuit board, the circuit board to be tested is mounted on the test position, and then the first cover 5 and the second cover 6 are sequentially closed. The foolproof structure in the disclosed embodiment is that when the first cover 5 is closed, the first switch 3 is triggered, and when the second cover 6 is closed, the second switch 4 is triggered. In other words, the first switch 3 and the second switch 4 must be operated in sequence and cannot be changed or closed simultaneously.

[0027] For example, triggering the first switch 3 first connects the battery of the circuit board 18 to be tested, and triggering the second switch 4 then connects the power supply of the circuit board 18 to be tested. There is an interval between the connection of the battery and the power supply, for example, an interval of 1 second. In this way, during the circuit board test, it is possible to avoid the situation where the power supply is turned on first and then the battery, causing some components of the circuit board to be tested to short-circuit and cause burn-in, thereby achieving a fool-proof effect.

[0028] In some embodiments, as Figure 3 As shown, the first switch 3 (K1) is connected to the battery, and the second switch 4 (K2) is connected to the power supply. The circuit also includes two relays, which are connected to the control board 2 and are used to control the conduction of the battery and the power supply respectively. When in use, the control board 2 controls the switch of the relay to power the circuit board 18 to be tested. This method effectively reduces the burn-in situation during the test process and ensures the accuracy of the test operation.

[0029] Continue to refer Figure 3A fuse is also provided in the circuit. The rated current of the fuse is configured according to the maximum current that the circuit board 18 to be tested can withstand during the test. If the current is too large and the machine burns out during the test, the fuse will directly blow, effectively protecting the circuit board 18 to be tested.

[0030] like Figures 1 to 4 As shown, in some embodiments, the control board 2, the first switch 3 and the second switch 4 are located on the side where the second surface of the test platform 1 is located; a through hole is provided on the test platform 1, and the first switch 3 and the second switch 4 are provided in the through hole or at the end of the through hole, and the first trigger device 7 and the second trigger device 8 are columnar and are used to pass through the through hole to trigger the first switch 3 and the second switch 4 respectively.

[0031] For example, the first switch 3 and the second switch 4 are micro switches. The first trigger device 7 penetrates the through hole and presses on the first switch 3, thereby triggering the first switch 3. The second trigger device 8 penetrates the through hole and presses on the second switch 4, thereby triggering the second switch 4.

[0032] Continue to refer Figure 1 and Figure 2 In some embodiments, a first support column 9 and a second support column 10 are provided on the test platform 1, and the height of the second support column 10 is greater than the height of the first support column 9; one end of the first cover plate 5 is rotatably connected to the first support column 9, and one end of the second cover plate 6 is rotatably connected to the second support column 10.

[0033] The first cover plate 5 and the second cover plate 6 are set to have a height difference through the first support column 9 and the second support column 10. When the cover plates are closed, the first cover plate 5 with a lower height is closed first, and then the second cover plate 6 with a higher height is closed.

[0034] For example, the first cover 5 is provided with a through hole for fitting over the heat dissipation structure of the circuit board 18 under test; and the second cover 6 is provided with a cooling fan 12 opposite the through hole. When the first cover 5 is closed, the through hole fits over the heat dissipation structure of the circuit board 18 under test, for example, a heat sink, and the cooling fan 12 on the second cover 6 then dissipates heat.

[0035] In the disclosed embodiment, the first cover plate 5 is in direct contact with the heat dissipation structure of the circuit board under test 18, enabling heat conduction and heat dissipation. This heat dissipation is also accelerated by the cooling fan 12 on the second cover plate 6. Separating the heat dissipation structure (the first cover plate) from the cooling fan 12 not only meets the heat dissipation requirements but also avoids the use of high-power fans, minimizing fan-induced vibrations.

[0036] For example, the first support column 9 and the second support column 10 are located on a set of opposite sides of the test platform 1; an intermediate support column 11 for supporting the first cover plate 5 and the second cover plate 6 is provided between the first support column 9 and the second support column 10 on the test platform 1.

[0037] Continue to refer Figure 1 and Figure 2 In some embodiments, the test assembly further includes a battery adapter 13, which is disposed on the first surface of the test platform 1. The battery adapter 13 includes a first battery connector and a second battery connector; the first battery connector is used to connect to the control board 2, and the second battery connector is used to connect to the circuit board 18 to be tested.

[0038] In some embodiments, the test component also includes a power adapter 14, which is arranged on the first surface of the test platform 1. The power adapter 14 includes a first power connector and a second power connector; the first power connector is used to connect to the control board 2, and the second power connector is used to connect to the circuit board 18 to be tested.

[0039] During the test, the circuit board 18 to be tested is placed on the test position. Before closing the two covers, the circuit board 18 to be tested is first connected to the test device through the battery adapter 13 and the power adapter 14. The connection order of the battery adapter 13 and the power adapter 14 is not restricted.

[0040] Continue to refer Figure 1 and Figure 2 In some embodiments, a support frame 15 for supporting a display device is further provided on the test platform 1. When the circuit board 18 to be tested is tested, when the circuit board 18 to be tested is connected to a display device, for example, if the display device is an LCD, the display device can be supported by the support frame 15.

[0041] For example, a fan switch button 17 is also provided on the test platform 1, and the fan can be manually turned on during testing. For example, a cooling fan 12 can also be provided on one side of the test platform 1 or below the test platform 1 to assist in cooling the heat during testing.

[0042] The present disclosure provides a circuit board test fixture including the aforementioned circuit board test structure. For example, the circuit board test fixture further includes a housing 16, with the test platform 1 positioned on top of the housing 16 and the test assembly positioned within the housing 16. For example, a power switch or other component interfaces may be positioned on the side of the housing 16.

[0043] When using the circuit board test fixture, first open the first cover 5 and the second cover 6, then turn on the power, place the circuit board 18 to be tested on the test position, and plug in components such as RAM, WLAN card, SSD and LCD; then connect one end of the battery adapter 13 to the battery of the circuit board 18 to be tested, and the other end to the interface reserved in the fixture (control board 2), connect one end of the power adapter 14 to the power supply of the circuit board 18 to be tested, and the other end to the interface reserved in the fixture (control board 2). Then, close the first cover 5 and trigger the first switch 3, close the second cover 6, and trigger the second switch 4. At this time, after the two switches are triggered in succession, the control board 2 starts to work and controls the order of current power-on through the relay to achieve the test sequence of first connecting the battery and then connecting the power supply during the test. After the test, the power supply is first disconnected and then the battery is disconnected to avoid short-circuit burning of the circuit board. Then start the fan switch button 17 on the fixture, start the cooling fan 12, and then perform the test according to the normal test process. After the test is completed, open the second cover 6 and the first cover 5, and finally take out the circuit board, and the test is over.

[0044] The embodiment of the present disclosure provides a circuit board test structure and a circuit board test fixture. When conducting a circuit board test, the circuit board 18 to be tested is placed on the test position, and then the first cover 5 and the second cover 6 are closed in sequence, so that the first switch 3 and the second switch 4 are triggered in sequence, wherein the first switch 3 is used to control the battery switch of the circuit board 18 to be tested, and the second switch 4 is used to control the power switch of the circuit board 18 to be tested. This method can avoid the situation where the power is turned on first and then the battery, which may cause a short circuit of parts and burn-in of the circuit board. In the technical solution disclosed in the present disclosure, there is no pinpoint interference, and it can be adapted to more types of circuit boards 18 to be tested. The first switch 3 and the second switch 4 are triggered in sequence through two covers, which has a fool-proof effect for the operator, effectively reduces the burn-in situation during the test, and ensures the accuracy of the operation during the test.

[0045] In the description of this specification, the reference terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples" mean that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present disclosure. Moreover, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. In addition, those skilled in the art may combine and integrate different embodiments or examples described in this specification, as well as features of different embodiments or examples, unless they are mutually inconsistent.

[0046] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. Throughout the present disclosure, "plurality" means two or more, unless otherwise specifically defined.

[0047] The above are only specific embodiments of the present disclosure, but the scope of protection of the present disclosure is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this disclosure should be included in the scope of protection of the present disclosure. Therefore, the scope of protection of the present disclosure should be based on the scope of protection of the claims.

Claims

1. A circuit board test structure, wherein: It includes a test platform (1), a test assembly and a cover assembly; The first surface of the test platform (1) is provided with a test position for mounting a circuit board (18) to be tested; The test assembly comprises a control board (2), a first switch (3) and a second switch (4), wherein the control board (2), the first switch (3) and the second switch (4) are connected to form a control circuit; The cover plate assembly comprises a first cover plate (5) and a second cover plate (6); the first cover plate (5) is provided with a first trigger device (7) for triggering the first switch (3); the second cover plate (6) is provided with a second trigger device (8) for triggering the second switch (4); the first cover plate (5) and the second cover plate (6) are sequentially stacked above the test position and sequentially trigger the first switch (3) and the second switch (4); The test platform (1) is provided with a first support column (9) and a second support column (10), wherein the height of the second support column (10) is greater than the height of the first support column (9); one end of the first cover plate (5) is rotatably connected to the first support column (9), and one end of the second cover plate (6) is rotatably connected to the second support column (10).

2. The circuit board test structure according to claim 1, wherein: The first support column (9) and the second support column (10) are located on a set of opposite sides of the test platform (1); An intermediate support column (11) for supporting the first cover plate (5) and the second cover plate (6) is provided between the first support column (9) and the second support column (10) on the test platform (1).

3. The circuit board test structure according to claim 1, wherein: The control panel (2), the first switch (3) and the second switch (4) are located on the side where the second surface of the test platform (1) is located; The test platform (1) is provided with a through-hole, the first switch (3) and the second switch (4) are arranged in the through-hole or at the end of the through-hole, and the first trigger device (7) and the second trigger device (8) are columnar and are used to pass through the through-hole to trigger the first switch (3) and the second switch (4) respectively.

4. The circuit board test structure according to any one of claims 1 to 3, wherein: The first cover plate (5) is provided with a through hole for sleeve-mounting the heat dissipation structure on the circuit board (18) to be tested; A heat dissipation fan (12) is provided on the second cover plate (6) at a position opposite to the through hole.

5. The circuit board test structure according to any one of claims 1 to 3, wherein: The test assembly further comprises a battery adapter (13), the battery adapter (13) being arranged on a first surface of the test platform (1), the battery adapter (13) comprising a first battery connector and a second battery connector; The first battery connector is used to connect to the control board (2), and the second battery connector is used to connect to the circuit board (18) to be tested.

6. The circuit board test structure according to claim 5, wherein: The test assembly further comprises a power adapter (14), wherein the power adapter (14) is arranged on the first surface of the test platform (1), and the power adapter (14) comprises a first power connector and a second power connector; The first power connector is used to connect to the control board (2), and the second power connector is used to connect to the circuit board (18) to be tested.

7. The circuit board test structure according to any one of claims 1 to 3, wherein: The test platform (1) is also provided with a support frame (15) for supporting the display device.

8. A circuit board test fixture, wherein: The circuit board test structure comprises the circuit board test structure according to any one of claims 1 to 7.

9. The circuit board test fixture according to claim 8, wherein: It also includes a box (16), the test platform (1) is arranged on the top of the box (16), and the test component is arranged in the box (16).

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