Capacitive sensing device, proximity measurement method

Abstract

The application provides a capacitive sensing device and a proximity measurement method, which comprises: obtaining capacitive data; determining whether a capacitive sample value in the capacitive data is within a current proximity measurement range; the current proximity measurement range is a measurement range corresponding to a current compensation capacitive value in the capacitive data; if the capacitive sample value is within the current proximity measurement range, determining a current proximity according to the capacitive data; if the capacitive sample value is beyond the current proximity measurement range, adjusting the compensation capacitive value to adjust the proximity measurement range, and determining the current proximity according to the adjusted compensation capacitive information; thereby realizing dynamic adjustment of the proximity measurement range, and measuring a case where a proximity change range is greater than a range of the capacitive sensor, and meeting a test requirement of simultaneously testing far and near proximities.

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of sensor, more particularly, it relates to a kind of capacitive sensing device and proximity measurement method. BACKGROUND

[0002] Currently, based on the different distance between the plates of capacitive sensor has different capacitance value characteristics, detect its relative state between close or away from human body or other objects these reference objects. Since the parasitic capacitance capacitance value is often greater than the detection capacitance change value caused by the object close to the sensor; When there is no object close, there will be a larger initial capacitance sampling value, which can compensate the problem of large initial capacitance sampling value by the method of capacitive cancellation parasitic capacitance.

[0003] However, due to the measurement process of capacitive sensor, the measurement range of proximity in the traditional scheme is consistent with the range of capacitive sensor. Further, in the process of gradually approaching the object to the sensor, once the measurement of proximity exceeds the measurement range of the sensor, the proximity value remains the full-scale value of the sensor at this time, which cannot effectively distinguish different actual proximity, and the measurement accuracy is low. SUMMARY

[0004] Therefore, the purpose of the present application is to provide a kind of capacitive sensing device and proximity measurement method, which can measure the case where the proximity change range is greater than the range of capacitive sensor by dynamically adjusting the proximity measurement range.

[0005] The first aspect of the present application discloses a proximity measurement method, which comprises:

[0006] obtaining capacitive data; wherein the capacitive data comprises a capacitive sampling value and a compensation capacitance value;

[0007] determining whether the capacitive sampling value is within the current proximity measurement range; the current proximity measurement range is the measurement range corresponding to the current compensation capacitance value;

[0008] if the capacitive sampling value is within the current proximity measurement range, then determining the current proximity according to the capacitive data;

[0009] if the capacitive sampling value exceeds the current proximity measurement range, then adjusting the compensation capacitance value to adjust the proximity measurement range, and then determining the current proximity according to the adjusted capacitive data.

[0010] Optionally, before determining whether the capacitive sampling value is within the current proximity measurement range, it further comprises:

[0011] determining whether the current collection action is initial collection;

[0012] If not, a step of judging whether the capacitance sampling value is within a current proximity measurement range is performed.

[0013] Optionally, after judging whether the current acquisition action is initial acquisition, if yes, further comprising:

[0014] Determining an initial compensation capacitance value.

[0015] Optionally, before determining the current proximity according to the adjusted capacitance data, further comprising:

[0016] Determining a predicted proximity according to the adjusted compensation capacitance information;

[0017] Judging whether the predicted proximity is within a proximity valid range; the proximity valid range is a valid range corresponding to a compensation capability of the compensation capacitance, and the proximity measurement range is a subset of the proximity valid range.

[0018] If the predicted proximity is within the proximity valid range, the step of determining the current proximity according to the adjusted capacitance data is performed.

[0019] Optionally, after judging whether the predicted proximity is within the proximity valid range, if the predicted proximity is beyond the proximity valid range, further comprising:

[0020] Determining a proximity abnormal state.

[0021] Optionally, a lower limit value of the proximity valid range is greater than or equal to a lower limit value of the actual valid range, and an upper limit value of the proximity valid range is less than or equal to an upper limit value of the actual valid range.

[0022] The actual valid range is an actual range corresponding to the compensation capability of the compensation capacitance.

[0023] Optionally, a lower limit value of the proximity measurement range is greater than or equal to a lower limit value of an actual measurement range, and

[0024] An upper limit value of the proximity measurement range is less than or equal to an upper limit value of the actual measurement range.

[0025] The actual measurement range is an actual range corresponding to the current compensation capacitance value.

[0026] A second aspect of the present application discloses a capacitance sensing device, comprising: a capacitance sensor, an MCU program processing module;

[0027] The capacitance sensor is configured to provide capacitance data for the MCU program processing module.

[0028] The inductance sensor and the MCU program processing module are combined to realize the proximity measurement method according to any one of the first aspect of the application.

[0029] Optionally, the capacitance sensor comprises a compensation capacitor and a detection capacitor unit.

[0030] The compensation capacitor is used to offset the parasitic capacitance in the capacitance sensor.

[0031] The input end of the detection capacitor unit is connected with the compensation capacitor, and is used to detect capacitance data.

[0032] The output end of the detection capacitor unit is used as the output end of the capacitance sensor.

[0033] Optionally, the MCU program processing module comprises a proximity measurement module and a data processing module.

[0034] The proximity measurement module is used to receive the capacitance sampling value and the compensation capacitor value provided by the capacitance sensor, dynamically adjust the compensation capacitor value, and provide proximity data and proximity abnormality flag to the data processing module.

[0035] The data processing module is used to judge the approaching and moving away state according to the proximity data and the proximity abnormality flag provided by the proximity measurement module.

[0036] According to the above technical solution, the proximity measurement method provided by the application comprises the following steps: real-time acquisition of capacitance data; judgment of whether the capacitance sampling value in the capacitance data is within the current proximity measurement range; the current proximity measurement range is the measurement range corresponding to the current compensation capacitor value in the capacitance data; if the capacitance sampling value is within the current proximity measurement range, the current proximity is determined according to the capacitance data; if the capacitance sampling value is beyond the current proximity measurement range, the compensation capacitor value is adjusted to adjust the proximity measurement range, and the current proximity is determined according to the adjusted compensation capacitor information; thus, whether within the current proximity measurement range or beyond the current proximity measurement range, the proximity can be accurately measured, that is, the measurement accuracy is improved; in addition, the proximity measurement range is dynamically adjusted, the case that the proximity change range is greater than the range of the capacitance sensor can be measured, and the test requirements of testing the far and near proximity at the same time are met. BRIEF DESCRIPTION OF DRAWINGS

[0037] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings described below are some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained from these drawings without creative labor.

[0038] Figure 1 is a flow chart of a proximity measurement method provided by an embodiment of the present application;

[0039] Figure 2 is a flow chart of another proximity measurement method provided by an embodiment of the present application;

[0040] Figure 3 is a flow chart of another proximity measurement method provided by an embodiment of the present application;

[0041] Figure 4 is a flow chart of another proximity measurement method provided by an embodiment of the present application;

[0042] Figure 5 is a flow chart of another proximity measurement method provided by an embodiment of the present application;

[0043] Figure 6 is a schematic diagram of various ranges in a proximity measurement method provided by an embodiment of the present application;

[0044] Figure 7 is a schematic diagram of various ranges in a proximity measurement method provided by an embodiment of the present application;

[0045] Figure 8 is a schematic diagram of a capacitive sensing device provided by an embodiment of the present application. DETAILED DESCRIPTION

[0046] In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the following will combine the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the present application.

[0047] In this application, the terms "comprise", "contain", or any other variant thereof, are intended to cover a non-exclusive inclusion, so that a process, method, article, or apparatus that comprises a list of elements not only includes those elements, but also includes other elements not expressly listed or inherent to such process, method, article, or apparatus. Without more limitations, the element defined by the phrase "comprises a" does not exclude the presence of additional identical elements in the process, method, article, or apparatus that includes the element.

[0048] The embodiment of the application provides a proximity measurement method applied to a capacitive sensing device, which is used to solve the problem that in the prior art, the measurement range of the proximity of the capacitive sensor in the traditional scheme is consistent with the range of the capacitive sensor. Further, in the process that an object gradually approaches the sensor, once the measurement of the proximity exceeds the measurement range of the sensor, the proximity value remains the full-scale value of the sensor at this time, and different actual proximities cannot be effectively distinguished, and the measurement accuracy is low.

[0049] Referring to Figure 1 The proximity measurement method comprises the following steps.

[0050] S101, acquiring capacitive data.

[0051] The capacitive data comprises a capacitive sampling value and a compensation capacitive value.

[0052] It should be noted that the capacitive data can be collected by a corresponding detection unit. The compensation capacitive value is used to compensate the capacitive sampling value.

[0053] S102, determining whether the capacitive sampling value is in a current proximity measurement range.

[0054] The current proximity measurement range is a measurement range corresponding to the current compensation capacitive value.

[0055] In actual application, the main purpose of step S102 is to determine whether the capacitive sampling value of the capacitive sensor is valid; in the valid case, the calculated proximity is accurate; in the invalid case, the calculated proximity is distorted; in other words, step S102 can also be used as a judgment of whether the compensation capacitive mechanism needs to be adjusted.

[0056] When the compensation capacitive value is a determined value, the actual measurement range corresponding to the compensation capacitive value, that is, the proximity change range corresponding to the compensation capacitive value, is consistent with the sampling range of the capacitive sensor.

[0057] If the capacitive sampling value is in the current proximity measurement range, step S103 is performed.

[0058] S103, determining the current proximity according to the capacitive data.

[0059] Since the capacitance sampling value is in the current proximity measurement range, the current proximity is determined according to the capacitance data, and the accuracy is high. It should be noted that the specific calculation process is not described here, as long as the proximity can be determined according to the capacitance data, which is within the protection scope of the present application.

[0060] It should be noted that step S103 is a step executed when the capacitance sampling value is in the current proximity measurement range; it is explained that the current proximity measurement range meets the measurement requirements, that is, it is accurate to measure the proximity using the current proximity measurement range at this time.

[0061] If the capacitance sampling value exceeds the current proximity measurement range, step S104 is executed.

[0062] S104, adjust the compensation capacitance value to adjust the proximity measurement range, and then determine the current proximity according to the adjusted capacitance data.

[0063] It should be noted that the purpose of adjusting the compensation capacitance value is to adjust the proximity measurement range, so that the capacitance sampling value is within the adjusted proximity measurement range, so as to realize the measurement of proximity, and avoid the problem of inaccurate proximity measurement caused by measuring beyond the current proximity measurement range. That is, after adjusting the proximity measurement range, the proximity is measured, thereby improving the accuracy of proximity measurement.

[0064] The compensation capacitance is used to compensate for the current capacitance sampling value.

[0065] Specifically, the compensation capacitance value in the capacitance sensor can be adjusted, and different compensation capacitance values offset the capacitance sampling values of different capacitance sensors. Secondly, due to the existence of parasitic capacitance in the capacitance sensor, the capacitance sampling value of the capacitance sensor has inherent offset. Combining these two characteristics, the sampling model of the capacitance sensor can be represented by formula (1).

[0066] Lcap = Lx + Lpar - Loff formula (1)

[0067] Wherein, Lcap is the capacitance sampling value of the capacitance sensor, Lx is the actual proximity between the object and the capacitance sensor, Loff is the quantization value of the proximity corresponding to the compensation capacitance, that is, the compensation capacitance value, and Lpar is the quantization value of the proximity corresponding to the parasitic capacitance, that is, the parasitic capacitance value.

[0068] If it is determined that the capacitance sampling value of the capacitance sensor is out of the current proximity measurement range, the compensation capacitance needs to be adjusted. Assuming that the compensation capacitance is Loff0, the actual proximity is Lx0, and the capacitance sampling value of the capacitance sensor is Lcap0 after the calculation of formula (1), as shown in formula (2).

[0069] Lcap0 = Lx0 + Lpar - Loff0 formula (2)

[0070] In actual operation, since Lpar is unknown, Loff can be adjusted by using the bisection method or other methods, so that Lcap is near 0. At this time, Loff1 can be approximated as Lx0 + Lpar, achieving the effect of simultaneously compensating for the parasitic capacitance and the current proximity. That is, after the compensation capacitance value is set, the capacitance sampling value can be used as the proximity; that is, the embodiment provides a method for calculating the proximity according to the compensation capacitance value and the capacitance sensor sampling value. At the same time, according to the effective range of the capacitance sampling value, the compensation capacitance adjustment is triggered, and the compensation capacitance value is used to expand the proximity measurement range.

[0071] As shown in formula (1), when the compensation capacitance is Loff0, the capacitance sampling value of the capacitance sensor is out of the proximity measurement range of the sensor. Figure 6 After the compensation capacitance is adjusted, as shown in formula (2), the quantization value of the compensation capacitance is Loff1, and the proximity is within the effective range of the capacitance sampling value of the capacitance sensor at this time. Figure 7

[0072] In the embodiment, the proximity can be accurately measured whether in the current proximity measurement range or not, that is, the measurement accuracy is improved; in addition, the proximity measurement range is dynamically adjusted, which can measure the case where the proximity change range is greater than the range of the capacitance sensor, and meets the test requirements of testing the far proximity with high sensitivity and the close proximity with low sensitivity at the same time.

[0073] It is worth noting that the proximity measurement range in the prior art is limited and consistent with the range of the capacitance sensor. When the proximity is out of the range of the capacitance sensor, the proximity value remains at the full-scale value, and the far proximity with high sensitivity and the close proximity with low sensitivity cannot be tested at the same time.

[0074] In the embodiment, the compensation capacitance is dynamically adjusted to expand the proximity measurement range, and the scene where the proximity is out of the range of the capacitance sensor can be effectively identified. In addition, the far proximity with high sensitivity and the close proximity with low sensitivity can be tested at the same time.

[0075] It should be noted that when the compensation capacitance value is the corresponding value, the actual measurement range and the proximity measurement range corresponding thereto are not completely equal. ​

[0076] In practical application, the proximity measurement range is a subset of the actual measurement range; wherein, the actual measurement range is the actual range corresponding to the current compensation capacitance value.

[0077] That is, the lower limit value of the proximity measurement range is greater than or equal to the lower limit value of the actual measurement range, and the upper limit value of the proximity measurement range is less than or equal to the upper limit value of the actual measurement range. Wherein, the actual effective range is the actual range corresponding to the compensation ability of the compensation capacitance.

[0078] In the sampling data variation range of the capacitance sensor, it is necessary to note that the sampling data variation range is related to the compensation ability of the compensation capacitance; the proximity measurement range is set as [LowTh, HighTh], wherein, LowTh is the lower limit value of the proximity measurement range, which is close to but greater than the lower limit of the range of the capacitance sensor, of course, it is not excluded that it is equal; HighTh is the upper limit value of the proximity measurement range, which is close to but less than the upper limit of the range of the capacitance sensor, of course, it is not excluded that it is equal. The capacitance sampling value of the capacitance sensor is within the proximity measurement range, which is valid sampling, that is, step S103 is executed at this time; the capacitance sampling value of the capacitance sensor is outside the proximity measurement range, which is invalid sampling. For the case of invalid sampling, the compensation capacitance needs to be adjusted; that is, step S104 is executed at this time. It should be noted that HighTh and LowTh are related to the capacitance sensor and are irrelevant to different compensation capacitances.

[0079] In practical application, referring to Figure 2 Before step S102, it further includes:

[0080] S201, judge whether the current collection action is initial collection.

[0081] If the current collection action is not initial collection, it means that the current proximity measurement range is not 0, and the subsequent steps can be executed according to the current measurement range.

[0082] Therefore, if the current collection action is not initial collection, step S102 is executed to judge whether the capacitance sampling value is within the current proximity measurement range.

[0083] In practical application, referring to Figure 3 After step S201, if the current collection action is initial collection, step S301 is executed.

[0084] S301, determine the initial compensation capacitance value.

[0085] It should be noted that the compensation capacitance value in the capacitance sensor can be adjusted, and different compensation capacitance values offset the capacitance sampling values of different capacitance sensors. Secondly, due to the existence of the parasitic capacitance in the capacitance sensor, the capacitance sampling value of the capacitance sensor has an inherent offset. In combination with the two characteristics, the sampling model of the capacitance sensor can be represented by formula (1).

[0086] Lcap = Lx + Lpar - Loff Formula (1)

[0087] Wherein, Lcap is the capacitance sampling value of the capacitance sensor, Lx is the actual proximity between the object and the capacitance sensor, Loff is the quantization value of the proximity corresponding to the compensation capacitance, that is, the compensation capacitance value, and Lpar is the quantization value of the proximity corresponding to the parasitic capacitance, that is, the parasitic capacitance value.

[0088] In actual operation, when the proximity of the object is Lx base , Loff is adjusted so that Lcap is close to 0. At this time, Loff is approximately equal to Lx base + Lpar, and the compensation capacitance quantization value at this time is recorded as Loff base . Considering that Loff is Loff base , the compensation capacitance compensates for the current proximity and the parasitic capacitance value at the same time, so the current proximity Lx base can be regarded as an estimated proximity reference point, and then the subsequent proximity measurement is equivalent to the relative value with the reference point, which offsets the influence of the parasitic capacitance.

[0089] It should be noted that there are many situations when Loff needs to be adjusted, such as: the initialization stage, at this time no object approaches the sensor, and the proximity Lx base is regarded as 0; or, the capacitance sampling value of the capacitance sensor exceeds the current proximity measurement range, at this time the proximity Lxbase is the full-scale value of the proximity sensor, and in order to better measure the proximity, the compensation capacitance value needs to be adjusted at this time.

[0090] Specifically, the electronic device executes step S301 once when starting up or when the parasitic capacitance value needs to be adjusted, to determine the initial compensation capacitance value, so as to eliminate the parasitic capacitance value; then the corresponding steps can be executed to effectively measure the proximity. It should be noted that the capacitance sampling value and the parasitic capacitance value can be replaced with each other.

[0091] In order to facilitate the description, step S104 is divided into two steps, which are: S1041, adjusting the compensation capacitance value to adjust the proximity measurement range; and step S1042, determining the current proximity based on the adjusted compensation capacitance information.

[0092] In actual application, referring toFigure 4 Before step S1042, further comprising:

[0093] S401, determining the predicted proximity according to the adjusted compensation capacitance information.

[0094] It should be noted that the relationship between the parasitic capacitance adjustment value and the proximity offset is that when adjusting the proximity offset, the Loff base compensating for the parasitic capacitance is taken as the reference point. Assuming that after the compensation capacitance adjustment, the parasitic capacitance quantization value is Loff. At this time, the proximity offset Lcap relative to the capacitance sensor capacitance sampling value can be considered as Loff base . The proximity Lprox can be expressed as formula (3).

[0095] Lprox = Lcap + Loff - Loffbase formula (3)

[0096] Since Loff base compensates for the parasitic capacitance and the actual proximity Lx base , the reference point of Lprox is Lx base .

[0097] S402, determining whether the predicted proximity is within the proximity valid range.

[0098] The proximity valid range is the valid range corresponding to the compensation ability of the compensation capacitance, and the proximity measurement range is a subset of the proximity valid range.

[0099] In actual application, considering the limited compensation ability of the compensation capacitance, the proximity valid range has certain limitations. Assuming that the range of the capacitance sensor is [Lx_min, Lx_max], the range of the compensation capacitance is [Loff_min, Loff_max], and in the process of the object gradually approaching the capacitance sensor, the change range of the proximity is [Lx_min, Lx_max+Loff_max].

[0100] It should be noted that the range of the capacitance sensor is: when the compensation capacitance is 0, the proximity range that can be measured by the capacitance sensor, representing the physical characteristics of the capacitance sensor; the range of the compensation capacitance is: the compensation capacitance belongs to the capacitance sensor module, representing the compensable proximity range. The proximity measurement range is: after dynamically adjusting the compensation capacitance, the proximity measurement range that can be recognized. It can be understood that: proximity measurement range = range of the capacitance sensor + range of the compensation capacitance.

[0101] If the predicted proximity is within the proximity valid range, step S1042 is executed, and the adjusted compensation capacitance information determines the current proximity.

[0102] In actual application, referring toFigure 5 After step S402, if the predicted proximity is out of the proximity valid range, step S501 is performed.

[0103] S501, determine that the proximity is in an abnormal state.

[0104] That is, the proximity valid range is determined according to the range of the compensation capacitor and the range of the capacitance sensor.

[0105] Specifically, in the change range of the proximity, the proximity valid range [LowMin, HighMax] is set, wherein the lower limit value of the proximity valid range is LowMin, which is close to but greater than Lx_min, and of course the case of equality is not excluded; the upper limit value of the proximity valid range is HighMax, which is close to but less than Lx_max+Loff_max, and of course the case of equality is not excluded. The proximity within the proximity valid range is valid data; the proximity outside the proximity valid range is invalid data. For invalid data, the proximity is determined to be in an abnormal state at this time.

[0106] Another embodiment of the present application provides a capacitance sensing device, which comprises Figure 8 The capacitance sensing device comprises a capacitance sensor and an MCU program processing module.

[0107] The capacitance sensor is configured to provide capacitance data for the MCU program processing module.

[0108] The inductance sensor and the MCU program processing module are combined to implement a proximity measurement method.

[0109] The working process and principle of the proximity measurement method are described in detail in the above embodiment, which will not be repeated here and are within the protection scope of the present application.

[0110] In actual application, the capacitance sensor comprises a compensation capacitor and a detection capacitor unit.

[0111] The compensation capacitor is configured to offset the parasitic capacitance in the capacitance sensor.

[0112] The input end of the detection capacitor unit is connected to the compensation capacitor, and the detection capacitor unit is configured to detect capacitance data.

[0113] The output end of the detection capacitor unit serves as the output end of the capacitance sensor.

[0114] That is, the detection capacitor unit is configured to obtain capacitance data, wherein the capacitance data comprises a capacitance sampling value and a compensation capacitor value.

[0115] In actual application, the MCU program processing module comprises a proximity measurement module and a data processing module.

[0116] The proximity measurement module is configured to receive the capacitance sampling value and the compensation capacitance value provided by the capacitance sensor, dynamically adjust the compensation capacitance value, and provide the proximity data and the proximity abnormality flag to the data processing module.

[0117] The data processing module is configured to determine the approaching or moving away state according to the proximity data and the proximity abnormality flag provided by the proximity measurement module.

[0118] The working processes and principles of the modules are described in the above embodiments, which will not be repeated here, and are within the protection scope of the present application.

[0119] The features described in the various embodiments of the present application can be replaced or combined with each other, and the same or similar parts of the various embodiments can be referred to each other. Each embodiment focuses on the differences from other embodiments. In particular, the system or system embodiments are described simply because they are basically similar to the method embodiments. The relevant parts can be referred to the part of the method embodiments. The above described system and system embodiments are only illustrative, and the units described as separate components can be or can not be physically separated, and the components shown as units can be or can not be physical units, i.e. they can be located in one place or distributed on multiple network units. Some or all modules can be selected to achieve the purpose of the present embodiment according to actual needs. Those skilled in the art can understand and implement without creative labor.

[0120] The skilled person can further realize that the units and algorithm steps of the examples described in conjunction with the disclosed embodiments can be realized by electronic hardware, computer software or a combination of both. In order to clearly illustrate the interchangeability of hardware and software, the components and steps of the examples have been described generally in the above description. Whether the functions are realized in hardware or software depends on the specific application and design constraints of the technical solution. The skilled person can use different methods to realize the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0121] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to the embodiments will be apparent to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A proximity measurement method characterized by, The method comprises: acquiring capacitance data; wherein the capacitance data comprises a capacitance sample value and a compensation capacitance value; determining whether the capacitance sample value is within a current proximity measurement range; the current proximity measurement range is a measurement range corresponding to the current compensation capacitance value; if the capacitance sample value is within the current proximity measurement range, determining a current proximity according to the capacitance data; if the capacitance sample value is outside the current proximity measurement range, adjusting the compensation capacitance value to adjust the proximity measurement range, and then determining the current proximity according to the adjusted capacitance data; before determining the current proximity according to the adjusted capacitance data, the method further comprises: determining a predicted proximity according to the adjusted compensation capacitance information; determining whether the predicted proximity is within a proximity effective range; the proximity effective range is an effective range corresponding to the compensation capability of the compensation capacitance, and the proximity measurement range is a subset of the proximity effective range; if the predicted proximity is within the proximity effective range, the step of determining the current proximity according to the adjusted capacitance data is performed.

2. The proximity measurement method of claim 1, wherein, before determining whether the capacitance sample value is within the current proximity measurement range, the method further comprises: determining whether a current collection action is an initial collection; if not, the step of determining whether the capacitance sample value is within the current proximity measurement range is performed.

3. The proximity measurement method of claim 2, wherein, after determining whether the current collection action is the initial collection, if yes, the method further comprises: determining an initial compensation capacitance value.

4. The proximity measurement method of claim 1, wherein, after determining whether the predicted proximity is within the proximity effective range, if the predicted proximity is outside the proximity effective range, the method further comprises: determining that the proximity is in an abnormal state.

5. The proximity measurement method of claim 1, wherein, a lower limit value of the proximity effective range is greater than or equal to an actual lower limit value of an effective range, and an upper limit value of the proximity effective range is less than or equal to an actual upper limit value of the effective range; wherein the actual effective range is an actual range corresponding to the compensation capability of the compensation capacitance.

6. The proximity measurement method according to any one of claims 1 to 5, characterized in that, a lower limit value of the proximity measurement range is greater than or equal to a lower limit value of an actual measurement range, and an upper limit value of the proximity measurement range is less than or equal to an upper limit value of the actual measurement range; wherein the actual measurement range is an actual range corresponding to the current compensation capacitance value.

7. A capacitive sensing device, characterized by comprises: a capacitance sensor and an MCU program processing module; the capacitance sensor is configured to provide capacitance data for the MCU program processing module; the capacitance sensor and the MCU program processing module are combined to implement the proximity measurement method according to any one of claims 1-6.

8. The capacitive sensing device of claim 7, wherein, the capacitance sensor comprises a compensation capacitance and a detection capacitance unit; the compensation capacitance is configured to offset a parasitic capacitance in the capacitance sensor; an input end of the detection capacitance unit is connected to the compensation capacitance, and is configured to detect capacitance data; an output end of the detection capacitance unit serves as an output end of the capacitance sensor.

9. The capacitive sensing device of claim 7, wherein, the MCU program processing module comprises a proximity measurement module and a data processing module; The proximity measurement module is configured to receive the capacitance sampling value and the compensation capacitance value provided by the capacitance sensor, dynamically adjust the compensation capacitance value, and provide proximity data and a proximity abnormality flag to the data processing module. The data processing module is configured to determine a proximity-removal state according to the proximity data and the proximity abnormality flag provided by the proximity measurement module.

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