A high-temperature resistance testing system for flat pre-embedded wire harnesses

Abstract

This invention provides a high-temperature resistance testing system for flat pre-embedded wire harnesses. The testing system includes a high-temperature testing module and a test data processing module. The high-temperature testing module includes a single-item testing unit and a superimposed testing unit. The single-item testing unit is used to perform tensile and high-temperature tests on the wire harness under test for single-parameter detection. The superimposed testing unit is used to perform two or more parameter tests on the wire harness under test. This invention first obtains a basic parameter of the wire harness by performing single-item tests on temperature resistance and tensile strength, and then simultaneously performs multiple parameter tests on the wire harness. This can demonstrate the impact of adding other influencing factors under high-temperature conditions on the service life of the wire harness, thus solving the problem that existing high-temperature testing methods for wire harnesses are too simplistic and cannot comprehensively demonstrate the performance under high-temperature conditions.

Description

Technical Field

[0001] This invention relates to the field of wire harness testing technology, and in particular to a high-temperature resistance testing system for flat pre-embedded wire harnesses. Background Technology

[0002] A wiring harness is the overall system of service equipment for a given load source group, such as trunk lines, switching devices, and control systems. The basic research content of traffic theory is to study the relationship between traffic volume, call loss, and wiring harness capacity. To facilitate installation and maintenance, and to ensure that electrical equipment can operate under the worst conditions, the different specifications and colors of wires used by various electrical devices throughout the vehicle are rationally arranged and bundled together with insulating material. This ensures completeness and reliability. Pre-buried wiring harnesses are typically used in conduits or underground locations, where removal is inconvenient once installed.

[0003] In existing technologies, pre-embedded flat wire harnesses need to maintain high quality and a long service life because pre-embedded wiring is inconvenient for subsequent maintenance and monitoring. Therefore, it is necessary to test pre-embedded flat wire harnesses. However, the existing high-temperature testing methods for flat wire harnesses are relatively simple, only testing the impact of high temperature on the wire harness. In specific applications, high temperature is the main influencing factor, but the quality of the wire harness will also be affected by other parameters under the action of high temperature. The existing high-temperature testing methods are limited and it is difficult to fully demonstrate the impact of high temperature on the use of wire harnesses. Summary of the Invention

[0004] To address the shortcomings of existing technologies, the purpose of this invention is to provide a high-temperature resistance testing system for flat pre-embedded wire harnesses. By first conducting single tests on the wire harness for temperature resistance and tensile strength, a basic parameter of the wire harness can be obtained. Then, multiple parameter tests are conducted simultaneously on the wire harness to demonstrate the impact of adding other influencing factors under high-temperature conditions on the performance of the wire harness. This solves the problem that existing high-temperature testing methods for wire harnesses are too simplistic and cannot comprehensively demonstrate the performance under high-temperature conditions.

[0005] To achieve the above objectives, the present invention provides a high-temperature resistance testing system for flat pre-embedded wire harnesses. The testing system includes a high-temperature testing module and a test data processing module. The high-temperature testing module includes a single-parameter testing unit and a superimposed testing unit. The single-parameter testing unit is used to perform tensile and high-temperature tests on the wire harness under test for single-parameter detection. The superimposed testing unit is used to perform two or more parameter tests on the wire harness under test. The test data processing module is used to comprehensively judge the test results of the single-parameter testing unit and the superimposed testing unit to obtain the comprehensive test result of the wire harness under test.

[0006] Furthermore, the individual test unit is configured with a tensile test strategy, which includes: selecting a wire harness of a first test length as the tensile test wire harness, fixing both ends of the tensile test wire harness, stretching one end of the tensile test wire harness with a first tensile force, then increasing the first force every first test time interval and stretching again, recording the tensile force at the time when the tensile test wire harness completely breaks, setting the tensile force as the breaking tensile force, and setting the duration of the tensile test as the tensile breaking duration.

[0007] Furthermore, the single-item test unit is configured with a high-temperature test strategy, which includes: selecting a wire harness of a first test length as the high-temperature test wire harness, placing the high-temperature test wire harness in a high-temperature test chamber, maintaining a first test temperature for a first test time, and then increasing the first temperature rise value every first test time interval to continue the test. When the surface of the high-temperature test wire harness shows signs of burning or melting and falling off, the high-temperature test is stopped, and the test temperature at this time is set as the damage temperature, and the test duration is set as the temperature damage duration.

[0008] Furthermore, the test data processing module includes a single test data processing unit, which is configured with a single test data processing strategy. The single test data processing strategy includes substituting the fracture tensile force, failure temperature, tensile failure time, and temperature failure time into the single test reference formula to obtain the single test reference value.

[0009] When the single-item test reference value is greater than or equal to the first single-item reference threshold, a high-level single-item harness signal is output; when the single-item test reference value is greater than or equal to the second single-item reference threshold and less than the first single-item reference threshold, a medium-level single-item harness signal is output; when the single-item test reference value is less than the second single-item reference threshold, a low-level single-item harness signal is output. The harness quality of the high-level single-item harness signal is better than that of the medium-level single-item harness signal, and the harness quality of the medium-level single-item harness signal is better than that of the low-level single-item harness signal. Furthermore, the larger the single-item test reference value, the better the harness quality, and the smaller the single-item test reference value, the worse the harness quality.

[0010] Furthermore, the single-item test reference formula is configured as follows: Pdxc = Nlsd × Tlsd + Wps × Tps; where Pdxc is the single-item test reference value, Nlsd is the tensile strength at break, Tlsd is the tensile fracture time, Wps is the failure temperature, and Tps is the temperature failure time.

[0011] Furthermore, the superimposed testing unit is configured with a superimposed testing strategy, which includes: selecting a wire harness of a first test length as the superimposed testing wire harness, placing the superimposed testing wire harness in a high-temperature testing chamber, fixing both ends of the superimposed testing wire harness, setting a first tensile force, a first test temperature, and a first test humidity as the initial tensile force, temperature, and humidity, and then increasing the first force, the first temperature rise value, and the first humidity at each first test interval to continue testing. When the superimposed testing wire harness experiences any of the following faults: breakage, burning, or melting and falling off, the test is stopped, the test temperature at this time is set as the superimposed test temperature, the tensile force at this time is set as the superimposed tensile force, the humidity at this time is set as the superimposed test humidity, and the test duration at this time is set as the superimposed duration.

[0012] Furthermore, the test data processing module includes a superimposed test data processing unit, which is configured with a superimposed test data processing strategy. The superimposed test data processing strategy includes substituting the superimposed test temperature, superimposed tensile force, superimposed test humidity, and superimposed duration into the superimposed test reference formula to obtain the superimposed test reference value.

[0013] When the superimposed test reference value is greater than or equal to the first superimposed reference threshold, a high-level superimposed test signal is output. When the superimposed test reference value is greater than or equal to the second superimposed reference threshold and less than the first superimposed reference threshold, a medium-level superimposed test signal is output. When the superimposed test reference value is less than the second superimposed reference threshold, a low-level superimposed test signal is output. The first superimposed reference threshold is greater than the second superimposed reference threshold. The harness quality of the high-level superimposed test signal is better than that of the medium-level superimposed test signal, and the harness quality of the medium-level superimposed test signal is better than that of the low-level superimposed test signal. Furthermore, the larger the superimposed test reference value, the better the harness quality, and the smaller the superimposed test reference value, the worse the harness quality.

[0014] Furthermore, the superposition test reference formula is configured as follows: Pdjc=(Ndj×k1+Wdj×k2+Sdj×k3) Tdj Wherein, Pdjc is the reference value for superposition test, Ndj is the superposition tensile force, Wdj is the superposition test temperature, Tdj is the superposition time, Sdj is the superposition test humidity, k1 is the tensile superposition conversion coefficient, k2 is the temperature superposition conversion coefficient, and k3 is the humidity superposition conversion coefficient.

[0015] Furthermore, the test data processing module also includes a comprehensive data processing unit, which is configured with a comprehensive data processing strategy. The comprehensive data processing strategy includes: substituting the superimposed test reference value and the individual test reference value into the comprehensive processing formula to obtain the comprehensive reference value.

[0016] When the comprehensive reference value is greater than or equal to the first comprehensive reference threshold, a high-level signal for harness detection is output; when the comprehensive reference value is greater than or equal to the second comprehensive reference threshold and less than the first comprehensive reference threshold, a medium-level signal for harness detection is output; when the comprehensive reference value is less than the second comprehensive reference threshold, a low-level signal for harness detection is output. The first comprehensive reference threshold is greater than the second comprehensive reference threshold. The harness quality of the high-level signal for harness detection is better than that of the medium-level signal for harness detection, and the harness quality of the medium-level signal for harness detection is better than that of the low-level signal for harness detection. Furthermore, the larger the comprehensive reference value, the better the harness quality; the smaller the comprehensive reference value, the worse the harness quality.

[0017] Furthermore, the comprehensive processing formula is configured as follows: Among them, Pzhc is a comprehensive reference value.

[0018] The beneficial effects of this invention are as follows: This invention can perform tensile and high-temperature single-parameter tests on the wire harness under test through the single-item test unit in the high-temperature test module, and perform two or more parameter tests on the wire harness under test through the superimposed test unit. Finally, the test data processing module is used to comprehensively judge the test results of the single-item test unit and the superimposed test unit to obtain the comprehensive test result of the wire harness under test. This invention can obtain basic quality results by performing tensile and high-temperature single tests on the wire harness under test, and then obtain superimposed test results by performing multiple tests simultaneously. By comprehensively judging the single-item and superimposed test results, the high-temperature test of the wire harness can be improved, thereby improving the comprehensiveness of the test results. Attached Figure Description

[0019] Other features, objects, and advantages of the present invention will become more apparent from the following detailed description of non-limiting embodiments with reference to the accompanying drawings:

[0020] Figure 1 This is a system principle block diagram of the present invention. Detailed Implementation

[0021] To make the technical means, creative features, objectives and effects of this invention easier to understand, the invention will be further described below in conjunction with specific embodiments.

[0022] Please see Figure 1This invention provides a high-temperature resistance testing system for flat pre-embedded wire harnesses. It can first perform single tests on the wire harness for temperature resistance and tensile strength to obtain a basic parameter of the wire harness. Then, it can simultaneously perform multiple parameter tests on the wire harness to show the impact of adding other influencing factors under high temperature conditions on the service status of the wire harness. This solves the problem that existing high-temperature testing methods for wire harnesses are too singular and cannot fully demonstrate the performance under high temperature conditions. It can improve the detail of high-temperature testing of wire harnesses, thereby improving the comprehensiveness of the test results.

[0023] The testing system includes a high-temperature testing module and a test data processing module.

[0024] The high-temperature testing module includes a single-item testing unit and a superimposed testing unit. The single-item testing unit is used to stretch the wire harness under test and perform single-item parameter detection at high temperature. The single-item testing unit is configured with a tensile testing strategy, which includes: selecting a wire harness of a first test length as the tensile test wire harness, fixing both ends of the tensile test wire harness, stretching one end of the tensile test wire harness with a first tensile force, and then increasing the first force every first test time interval and stretching again. When the tensile test wire harness completely breaks, the tensile force at this time is recorded and set as the breaking tensile force, and the duration of the tensile test is set as the tensile breaking duration. The single-item test unit is equipped with a high-temperature test strategy, which includes: selecting a wire harness of a first test length as the high-temperature test wire harness, placing the high-temperature test wire harness in a high-temperature test chamber, maintaining a first test temperature for a first test time, and then increasing the first temperature value every first test time interval to continue the test. When the surface of the high-temperature test wire harness shows signs of burning or melting and peeling, the high-temperature test is stopped, and the test temperature at this time is set as the failure temperature, and the test duration is set as the temperature failure duration. The tensile test and the high-temperature test can reflect the basic quality of the wire harness.

[0025] The superimposed testing unit is used to perform two or more parameter tests on the wire harness to be tested. The superimposed testing unit is configured with a superimposed testing strategy, which includes: selecting a wire harness of a first test length as the superimposed test wire harness, placing the superimposed test wire harness in a high-temperature testing chamber, fixing both ends of the superimposed test wire harness, setting a first tensile force, a first test temperature, and a first test humidity as the initial tensile force, temperature, and humidity, and then increasing the first force, first temperature rise value, and first humidity at a first test time interval to continue testing. When the superimposed test wire harness experiences any of the following faults: breakage, burning, or melting and falling off, the test is stopped, the test temperature at this time is set as the superimposed test temperature, the tensile force at this time is set as the superimposed tensile force, the humidity at this time is set as the superimposed test humidity, and the test duration at this time is set as the superimposed duration. In the pre-buried line, due to the collapse of the terrain and the change of underground humidity, it is necessary to consider the influence of the tensile force and humidity change that the wire harness may be subjected to during the high-temperature test. Therefore, integrating the changes in tensile force and humidity into the temperature change test can improve the comprehensiveness of the high-temperature test of the wire harness.

[0026] The test data processing module is used to comprehensively judge the detection results of individual test units and superimposed test units and obtain the comprehensive test result of the wire harness to be tested. The test data processing module includes an individual test data processing unit, which is configured with an individual test data processing strategy. The individual test data processing strategy includes substituting the tensile breaking force, the breaking temperature, the tensile breaking time, and the temperature breaking time into the individual test reference formula to obtain the individual test reference value. The individual test reference formula is configured as: Pdxc = Nlsd × Tlsd + Wps × Tps; where Pdxc is the individual test reference value, Nlsd is the tensile breaking force, Tlsd is the tensile breaking time, Wps is the breaking temperature, and Tps is the temperature breaking time.

[0027] When the single-item test reference value is greater than or equal to the first single-item reference threshold, a high-level single-item harness signal is output; when the single-item test reference value is greater than or equal to the second single-item reference threshold and less than the first single-item reference threshold, a medium-level single-item harness signal is output; when the single-item test reference value is less than the second single-item reference threshold, a low-level single-item harness signal is output. The harness quality of the high-level single-item harness signal is better than that of the medium-level single-item harness signal, and the harness quality of the medium-level single-item harness signal is better than that of the low-level single-item harness signal. Furthermore, the larger the single-item test reference value, the better the harness quality, and the smaller the single-item test reference value, the worse the harness quality.

[0028] The test data processing module includes a superimposed test data processing unit, which is configured with a superimposed test data processing strategy. The strategy includes substituting the superimposed test temperature, superimposed tensile force, superimposed test humidity, and superimposed duration into a superimposed test reference formula to obtain a superimposed test reference value. The superimposed test reference formula is configured as: Pdjc=(Ndj×k1+Wdj×k2+Sdj×k3) Tdj Wherein, Pdjc is the reference value for superposition test, Ndj is the superposition tensile force, Wdj is the superposition test temperature, Tdj is the superposition duration, Sdj is the superposition test humidity, k1 is the tensile superposition conversion coefficient, k1 is set according to the proportion of tensile test in the overall test of the wire harness, k2 is the temperature superposition conversion coefficient, k2 is set according to the proportion of temperature test in the overall test of the wire harness, k3 is the humidity superposition conversion coefficient, k3 is set according to the proportion of humidity test in the overall test of the wire harness, and in the specific setting process, k2 is greater than k3, and k3 is greater than k2.

[0029] When the superimposed test reference value is greater than or equal to the first superimposed reference threshold, a high-level superimposed test signal is output. When the superimposed test reference value is greater than or equal to the second superimposed reference threshold and less than the first superimposed reference threshold, a medium-level superimposed test signal is output. When the superimposed test reference value is less than the second superimposed reference threshold, a low-level superimposed test signal is output. The first superimposed reference threshold is greater than the second superimposed reference threshold. The harness quality of the high-level superimposed test signal is better than that of the medium-level superimposed test signal, and the harness quality of the medium-level superimposed test signal is better than that of the low-level superimposed test signal. Furthermore, the larger the superimposed test reference value, the better the harness quality, and the smaller the superimposed test reference value, the worse the harness quality.

[0030] The test data processing module further includes a comprehensive data processing unit, which is configured with a comprehensive data processing strategy. The comprehensive data processing strategy includes: substituting the superimposed test reference value and the individual test reference value into a comprehensive processing formula to obtain a comprehensive reference value; the comprehensive processing formula is configured as follows: Among them, Pzhc is a comprehensive reference value.

[0031] When the comprehensive reference value is greater than or equal to the first comprehensive reference threshold, a high-level signal for harness detection is output; when the comprehensive reference value is greater than or equal to the second comprehensive reference threshold and less than the first comprehensive reference threshold, a medium-level signal for harness detection is output; when the comprehensive reference value is less than the second comprehensive reference threshold, a low-level signal for harness detection is output. The first comprehensive reference threshold is greater than the second comprehensive reference threshold. The harness quality of the high-level signal for harness detection is better than that of the medium-level signal for harness detection, and the harness quality of the medium-level signal for harness detection is better than that of the low-level signal for harness detection. Furthermore, the larger the comprehensive reference value, the better the harness quality; the smaller the comprehensive reference value, the worse the harness quality.

[0032] Working principle: First, the single-parameter test unit in the high-temperature test module can perform tensile and high-temperature tests on the wire harness under test to detect single parameters. Then, the superimposed test unit in the high-temperature test module can perform two or more parameter tests on the wire harness under test. Finally, the test data processing module is used to comprehensively judge the test results of the single-parameter test unit and the superimposed test unit to obtain the comprehensive test result of the wire harness under test. This invention can obtain basic quality results by performing single tensile and high-temperature tests on the wire harness under test, and then perform multiple simultaneous tests to obtain superimposed test results. The comprehensive test result is obtained by comprehensively judging the single-parameter and superimposed test results.

[0033] Finally, it should be noted that the above-described embodiments are merely specific implementations of the present invention, used to illustrate the technical solutions of the present invention, and not to limit it. The scope of protection of the present invention is not limited thereto. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that any person skilled in the art can still modify or easily conceive of changes to the technical solutions described in the foregoing embodiments within the technical scope disclosed in the present invention, or make equivalent substitutions for some of the technical features; and these modifications, changes, or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be covered within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A high-temperature resistance testing system for flat pre-embedded wire harnesses, characterized in that, The testing system includes a high-temperature testing module and a test data processing module. The high-temperature testing module includes a single-parameter testing unit and a superimposed testing unit. The single-parameter testing unit is used to perform tensile and high-temperature tests on the wire harness under test for a single parameter. The superimposed testing unit is used to perform two or more parameter tests on the wire harness under test. The test data processing module is used to comprehensively judge the test results of the single-parameter testing unit and the superimposed testing unit to obtain the comprehensive test result of the wire harness under test. The superimposed test unit is configured with a superimposed test strategy, which includes: selecting a wire harness of a first test length as the superimposed test wire harness, placing the superimposed test wire harness in a high-temperature test chamber, fixing both ends of the superimposed test wire harness, setting a first tensile force, a first test temperature, and a first test humidity as the initial tensile force, temperature, and humidity, and then increasing the first force, the first temperature rise value, and the first humidity at each first test interval to continue testing. When the superimposed test wire harness experiences any of the following faults: breakage, burning, or melting and falling off, the test is stopped, the test temperature at this time is set as the superimposed test temperature, the tensile force at this time is set as the superimposed tensile force, the humidity at this time is set as the superimposed test humidity, and the test duration at this time is set as the superimposed duration. The test data processing module includes a superimposed test data processing unit, which is configured with a superimposed test data processing strategy. The superimposed test data processing strategy includes substituting the superimposed test temperature, superimposed tensile force, superimposed test humidity, and superimposed duration into the superimposed test reference formula to obtain the superimposed test reference value. When the superimposed test reference value is greater than or equal to the first superimposed reference threshold, a high-level superimposed test signal is output; when the superimposed test reference value is greater than or equal to the second superimposed reference threshold and less than the first superimposed reference threshold, a medium-level superimposed test signal is output; when the superimposed test reference value is less than the second superimposed reference threshold, a low-level superimposed test signal is output. The superposition test reference formula is configured as follows: Wherein, Pdjc is the reference value for superposition test, Ndj is the superposition tensile force, Wdj is the superposition test temperature, Tdj is the superposition time, Sdj is the superposition test humidity, k1 is the tensile superposition conversion coefficient, k2 is the temperature superposition conversion coefficient, and k3 is the humidity superposition conversion coefficient.

2. The high-temperature resistance testing system for flat pre-embedded wire harnesses according to claim 1, characterized in that, Each individual test unit is configured with a tensile test strategy, which includes: selecting a wire harness of a first test length as the tensile test wire harness, fixing both ends of the tensile test wire harness, stretching one end of the tensile test wire harness with a first tensile force, then increasing the first force every first test time interval and stretching again, recording the tensile force at the time when the tensile test wire harness completely breaks, setting the tensile force as the breaking tensile force, and setting the duration of the tensile test as the tensile breaking duration.

3. The high-temperature resistance testing system for flat pre-embedded wire harnesses according to claim 2, characterized in that, The single-item test unit is configured with a high-temperature test strategy, which includes: selecting a wire harness of a first test length as the high-temperature test wire harness, placing the high-temperature test wire harness in a high-temperature test chamber, maintaining a first test temperature for a first test time, and then increasing the first temperature value every first test time interval to continue the test. When the surface of the high-temperature test wire harness shows signs of burning or melting and falling off, the high-temperature test is stopped, and the test temperature at this time is set as the failure temperature, and the test duration is set as the temperature failure duration.

4. The high-temperature resistance testing system for flat pre-embedded wire harnesses according to claim 3, characterized in that, The test data processing module includes a single test data processing unit, which is configured with a single test data processing strategy. The single test data processing strategy includes: substituting the tensile fracture force, failure temperature, tensile fracture time, and temperature failure time into the single test reference formula to obtain the single test reference value. When the single-item test reference value is greater than or equal to the first single-item reference threshold, a high-level signal for the single-item harness is output; when the single-item test reference value is greater than or equal to the second single-item reference threshold and less than the first single-item reference threshold, a medium-level signal for the single-item harness is output; when the single-item test reference value is less than the second single-item reference threshold, a low-level signal for the single-item harness is output.

5. The high-temperature resistance testing system for flat pre-embedded wire harnesses according to claim 4, characterized in that, The reference formula for the individual test is configured as follows: Wherein, Pdxc is the reference value for a single test, Nlsd is the tensile strength at break, Tlsd is the tensile fracture time, Wps is the failure temperature, and Tps is the thermal failure time.

6. The high-temperature resistance testing system for flat pre-embedded wire harnesses according to claim 5, characterized in that, The test data processing module further includes a comprehensive data processing unit, which is configured with a comprehensive data processing strategy. The comprehensive data processing strategy includes: substituting the superimposed test reference value and the single test reference value into the comprehensive processing formula to obtain the comprehensive reference value. When the comprehensive reference value is greater than or equal to the first comprehensive reference threshold, the output harness detection comprehensive high-level signal is generated; when the comprehensive reference value is greater than or equal to the second comprehensive reference threshold and less than the first comprehensive reference threshold, the output harness detection comprehensive medium-level signal is generated; when the comprehensive reference value is less than the second comprehensive reference threshold, the output harness detection comprehensive low-level signal is generated.

7. The high-temperature resistance testing system for flat pre-embedded wire harnesses according to claim 6, characterized in that, The comprehensive processing formula is configured as follows: ; where Pzhc is a comprehensive reference value.

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