A robustness test method for vehicle display screen signals

Abstract

The present invention relates to the technical field of vehicle display screen signal testing, and in particular to a robustness testing method for vehicle display screen signals, by determining the interfaces of a product to be tested, and performing robustness testing on the signals of each interface in turn. The present invention solves the low-probability problem caused by software vulnerabilities or hardware differences that are difficult to trigger under general conditions in the existing vehicle display screen testing; and also solves the problem that unexpected problems may occur in the mass production stage due to the limited number of products used for verification in the early stage of product design and development, as the product base increases.

Description

Technical Field

[0001] The invention relates to the technical field of vehicle-mounted display screen signal testing, and in particular to a robustness testing method for a vehicle-mounted display screen signal. Background Art

[0002] Car displays can be divided into two types: integrated and detached. This article focuses on detached car displays. Unlike integrated displays, detached car displays passively receive control and video signals from the host. However, they also integrate various functions such as backlight, touch control, communication, and diagnosis. They can realize human-computer information interaction, video playback, and control of entertainment systems, comfort systems, etc. during the use of the car.

[0003] Robustness refers to the ability of a control system to maintain certain other performance characteristics under certain (structure, size) parameter perturbations. Based on different definitions of performance, it can be divided into stability robustness and performance robustness. A fixed controller designed with the robustness of a closed-loop system as the goal is called a robust controller.

[0004] In the verification of automotive electronics products, such as the black box test of vehicle display software, since the target is embedded software, even after the software passes the software code review, static code scanning, software unit test, and software integration test, there are still low-probability problems caused by software vulnerabilities that are difficult to trigger under normal conditions or differences with hardware. Due to the limited number of products used for verification in the early stage of product design and development, certain problems may be leaked. Especially in the mass production stage, due to the increase in the product base, such problems gradually appear.

[0005] Therefore, in order to address this issue, in the early stage of product design, under the conditions of the original verification test, some low-probability vulnerabilities caused by the above reasons were further eliminated, and a robustness test method for vehicle display screen signals came into being. Summary of the invention

[0006] The invention content of the present invention is to provide a robustness testing method for vehicle display screen signals, which mainly solves the low-probability problems caused by software vulnerabilities or hardware differences that are difficult to trigger under general conditions in the existing vehicle display screen tests; and because the number of products used for verification is limited in the early stage of product design and development, unexpected problems will arise due to the increase in the product base in the mass production stage.

[0007] The present invention proposes a robustness test method for a vehicle-mounted display screen signal, comprising the following steps:

[0008] Determine each interface of the product to be tested, and perform robustness test on the signal of each interface in turn.

[0009] Preferably, determining each interface of the product to be tested, specifically, determining whether the interface of the product to be tested belongs to an external interface, an internal interface or another interface;

[0010] A robustness test is performed on the signal of each interface, specifically, a targeted robustness test is performed on the interface signal according to the interface category of the product to be tested.

[0011] Preferably, targeted robustness tests are performed on the interface signals according to the interface category of the product to be tested, specifically, a reset pulse test or a random pulse test is performed on the signal of the external interface, a signal switch test or a reset pulse test is performed on the signal of the internal interface, and a signal switch test is performed on the signals of the other interfaces.

[0012] Preferably, the reset pulse test includes a voltage level reset pulse test and a time level reset pulse test;

[0013] The voltage level reset pulse test is specifically to perform a voltage U decreasing manner in a very small step within a certain range and reset it at a fixed time T to check whether there is an input that causes a software error within the range;

[0014] The time-level reset pulse test is specifically to perform a delay T operation with a very small step size within a certain time range after the voltage drops U, and then reset to check whether there is an input that causes a software error within the range;

[0015] The random pulse test is specifically that both the drop time T and the drop voltage U take random values, and a reset operation is performed at the random time T according to the random voltage U to check whether there is an input within the range that causes a software error.

[0016] Preferably, the external interface includes a power interface, an external wake-up interface, a video interface, and a bus interface;

[0017] The internal interfaces include a configuration communication interface, an MCU detection interface, a chip error detection interface, and a chip voltage detection interface at each level.

[0018] Preferably, a signal switch test or a reset pulse test is performed on the signal of the internal interface, specifically, a signal switch test is performed on the configuration communication interface, the chip error detection interface and each level voltage detection interface of the chip, and a signal switch test or a reset pulse test is performed on the MCU detection interface.

[0019] Preferably, the signal switch test is specifically to perform a switching operation between valid / invalid signals, and the switching time increases in a set range with a very small time increment step to check whether there is a situation that causes software errors.

[0020] Preferably, the other signal is a hardware watchdog signal;

[0021] The signal switch test is specifically to switch between valid / invalid signals, and the switching time increases in a very small time increment within a set range to check whether there is a situation that causes software errors, and the maximum fault injection time should be greater than the watchdog time.

[0022] As can be seen from the above, the application of the technical solution provided by the present invention can achieve the following beneficial effects:

[0023] First, the test method proposed in the present invention can be used to test the black box of the vehicle display screen. Compared with the random stress test, the test method of the present invention is more targeted and has a tendency, and its test result is more accurate;

[0024] Second, the testing method proposed in the present invention can perform multiple tests before mass production, thereby reducing the risk of batch accidents after mass production of products, reducing the risk level, and improving customer satisfaction. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0026] Figure 1 Schematic diagram of a Class A signal robustness test in a test method according to an embodiment of the present invention;

[0027] Figure 2 Schematic diagram of a Class B signal robustness test in a test method according to an embodiment of the present invention;

[0028] Figure 3 A reset pulse diagram of a voltage level reset pulse test in a test method according to an embodiment of the present invention;

[0029] Figure 4 A reset pulse diagram of a time-level reset pulse test in a test method according to an embodiment of the present invention;

[0030] Figure 5 This is a reset pulse diagram of a random reset pulse test in a test method according to an embodiment of the present invention. DETAILED DESCRIPTION

[0031] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0032] In the existing vehicle display screen testing, there are still low-probability problems caused by software vulnerabilities that are difficult to trigger under normal conditions or hardware differences. In addition, due to the limited number of products used for verification in the early stage of product design and development, unexpected problems will arise due to the increase in the product base in the mass production stage.

[0033] In order to solve the above problem, this embodiment proposes a robustness test method for a vehicle display screen signal, which mainly determines each interface of the product to be tested and performs a robustness test on the signal of each interface in turn.

[0034] In this embodiment, the product under test is preferably a vehicle-mounted display screen black box, which may also be referred to as DUT.

[0035] Preferably, but not limited to, in this embodiment, the robustness test is performed on the signal of each interface, and multiple signals of each interface can be tested one by one, that is, each signal of multiple interfaces is tested simultaneously.

[0036] More specifically, determining each interface of the product to be tested, specifically, determining whether the interface of the product to be tested belongs to an external interface, an internal interface or another interface;

[0037] Perform robustness tests on the signals of each interface. Specifically, perform targeted tests on the interface signals according to the interface category of the product to be tested.

[0038] Preferably, in this embodiment, the external interface includes a power interface, an external wake-up interface, a video interface, and a bus interface; the internal interface includes a configuration communication interface, an MCU detection interface, a chip error detection interface, and a chip voltage detection interface at each level; other interfaces include a hardware watchdog. Furthermore, the external interface signals include power interface signals such as B+ / ACC, external wake-up signals such as Enable / Wakeup, video signals, and bus signals; the internal interface signals include configuration communication signals, MCU detection signals, chip error detection signals, and chip voltage detection signals at each level; the signals of other interfaces include hardware watchdog signals.

[0039] More specifically, targeted robustness tests are performed on interface signals according to the interface category of the product to be tested, specifically, reset pulse test or random pulse test is performed on the signal of the external interface, signal switch test or reset pulse test is performed on the signal of the internal interface, and signal switch test is performed on the signals of other interfaces.

[0040] like Figure 1 and Figure 2 As shown, in this embodiment, the signal value range of the external interface is larger, and most of the signal values ​​within the range are valid, referred to as Class A signals; the signal value range of the internal interface and other interfaces is smaller, and the signal has only two values, referred to as Class B signals.

[0041] In this embodiment, for Class A signals, due to the large voltage range and many effective values, the robustness can be detected by traversing within the limit range of the DUT working environment; for Class B signals, since the signal value has only two states, switching operations between valid / invalid signals can be performed for this type of signal, and the switching time increases within the set range with extremely small time increments to check whether there are any situations that may cause software errors.

[0042] More specifically, the reset pulse test includes a voltage level reset pulse test and a time level reset pulse test.

[0043] The voltage level reset pulse test is to perform a voltage U decreasing step by step within a certain range and reset it at a fixed time T to check whether there is any input within the range that causes software errors. Figure 3 As shown, determine the normal operating voltage A of the DUT, the time it takes for the DUT to recover to normal operation after reset (assumed to be 5s in the figure), and the minimum drop time that can be recognized by the software (assumed to be 5ms in the figure). Then, start from voltage A and gradually reduce and recover until it drops to 0V.

[0044] The time-level reset pulse test is to perform a very small step delay T operation within a certain time range after the voltage drops U, and then reset it to check whether there is any input that causes software errors within the range. Figure 4 As shown in the figure, determine the normal operating voltage A of the DUT, the time it takes for the DUT to recover to normal operation after reset (assumed to be 5s in the figure), and the complete power-off time of the DUT. Then drop from voltage A to 0V, and increase the duration of each drop by 1ms from 1ms until the drop duration reaches the complete power-off time.

[0045] Random pulse test, specifically, the drop time T and drop voltage U are both random values, and the reset operation is performed at the random voltage U and the random time T to check whether there is an input within the range that causes software errors. Figure 5As shown, the normal working voltage A of the DUT is determined, and the time it takes for the DUT to recover to normal working after reset. Then the voltage A is randomly dropped, and the drop duration is random, and the test is repeated in this way.

[0046] Preferably, the minimum value of the voltage-level reset pulse voltage can be set to 0, and the maximum value can be determined with reference to the DUT working range. The drop time is set to the minimum time that can be detected by the software logic, the recovery duration is the time it takes for the DUT to recover to normal operation after reset, and the recovery voltage is the normal working voltage; the minimum value of the time-level reset pulse time can be set to 1ms, and the maximum value can be set to the time it takes for the DUT to completely power off. For random pulses, the drop time and voltage can be random, and the recovery time and voltage are the time it takes for the DUT to recover to normal operation after reset and the normal working voltage.

[0047] More specifically, a signal switch test or a reset pulse test is performed on the signals of the internal interfaces, specifically, a signal switch test is performed on the configuration communication interface, the chip error detection interface, and each level of chip voltage detection interface, and a signal switch test or a reset pulse test is performed on the MCU detection interface.

[0048] More specifically, the signal switch test is to perform a switching operation between valid / invalid signals, and the switching time increases in very small time increments within a set range to check whether there are any situations that may cause software errors.

[0049] Preferably, but not limited to, the configuration communication interface includes the deserializer chip LVDS+, the deserializer chip SDA / UART_Tx, the backlight chip SDA / SPI, the touch chip SDA / SPI, and the slider chip SDA / SPI. For such signals, attention should be paid to the time of fault injection and removal. The timing of fault injection is before product configuration; the time of fault removal is after product configuration is completed. The minimum time value can be set to 1ms, the maximum value can be set to the time required for configuration, and the step size is set to 1ms.

[0050] Preferably but not limited to, the chip error detection signal includes a backlight chip error detection pin, a TFT chip error detection pin, a LVDS chip error detection pin, and a TP chip error detection pin. For this type of signal, the minimum signal switching time can be set to 1ms, the maximum value can be set to a time greater than the signal detection filter, and the step size is set to 1ms.

[0051] Preferably, but not limited to, the voltage detection signals of each level of the chip include 3V3_SW voltage detection pin, BL chip voltage detection pin, TFT chip voltage detection pin, LVDS chip voltage detection pin, and TP chip voltage detection pin. For such signals, the minimum signal switching time can be set to 1ms, the maximum value can be set to a time greater than the signal detection filter, and the step size is set to 1ms.

[0052] Preferably, but not limited to, MCU detection signals include backlight NTC detection pin signals, LVDS Lock signals, internal wake-up signals, and MCU reset signals. When a signal switch test is used for such signals, the minimum signal switch time can be set to 1ms, the maximum value can be set to a time greater than the signal detection filter, and the step size is set to 1ms; when a reset pulse test is used, refer to the test parameters in the external interface.

[0053] Preferably, the other signal is a hardware watchdog signal; the signal switch test is specifically to switch between valid / invalid signals, and the switching time increases within a set range with a very small time increment step to check whether there is a situation that causes software errors, and the maximum fault injection time should be greater than the watchdog time.

[0054] In summary, the robustness test method of the vehicle display signal proposed in this embodiment can greatly improve the accuracy of the test results, while avoiding the problem of large-scale recycling after mass production, reducing product risks and improving user satisfaction.

[0055] The above-described implementation methods do not constitute a limitation on the protection scope of the technical solution. Any modification, equivalent replacement and improvement made within the spirit and principle of the above-described implementation methods shall be included in the protection scope of the technical solution.

Claims

1. A robustness test method for a vehicle display screen signal, characterized in that: The following steps are involved: Determine each interface of the product to be tested, and perform robustness test on the signal of each interface in turn; Determining the interfaces of the product to be tested specifically includes determining whether the interfaces of the product to be tested belong to external interfaces, internal interfaces or other interfaces; The performing of a robustness test on the signal of each interface is specifically, performing a targeted robustness test on the interface signal according to the interface category of the product to be tested; Among them, according to the interface category of the product to be tested, the interface signal is subjected to a targeted robustness test, specifically, a reset pulse test or a random pulse test is performed on the signal of the external interface, a signal switch test or a reset pulse test is performed on the signal of the internal interface, and a signal switch test is performed on the signal of the other interfaces; Wherein, the reset pulse test includes a voltage level reset pulse test and a time level reset pulse test; The voltage level reset pulse test is specifically to perform a voltage U decreasing manner in a very small step within a certain range and reset it at a fixed time T to check whether there is an input that causes a software error within the range; The time-level reset pulse test is specifically to perform a delay T operation with a very small step size within a certain time range after the voltage drops U, and then reset to check whether there is an input that causes a software error within the range; The random pulse test is specifically that both the drop time T and the drop voltage U take random values, and a reset operation is performed at the random time T according to the random voltage U to check whether there is an input within the range that causes a software error.

2. The robustness test method of a vehicle display screen signal according to claim 1, characterized in that: The external interface includes a power interface, an external wake-up interface, a video interface, and a bus interface; The internal interfaces include a configuration communication interface, an MCU detection interface, a chip error detection interface, and a chip voltage detection interface at each level.

3. The robustness test method of a vehicle display screen signal according to claim 2, characterized in that: Perform a signal switch test or a reset pulse test on the signal of the internal interface, specifically, perform a signal switch test on the configuration communication interface, the chip error detection interface, and the chip voltage detection interface at each level, and perform a signal switch test or a reset pulse test on the MCU detection interface.

4. The robustness test method of a vehicle display screen signal according to claim 3 is characterized in that: The signal switch test is specifically to perform a switching operation between valid / invalid signals, and the switching time increases in a very small time increment step within a set range to check whether there is a situation that causes software errors.

5. The robustness testing method of a vehicle display screen signal according to claim 1, characterized in that: The signal of the other interface is a hardware watchdog signal; The signal switch test is specifically to switch between valid / invalid signals, and the switching time increases in a very small time increment within a set range to check whether there is a situation that causes software errors, and the maximum fault injection time should be greater than the watchdog time.

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