High-voltage thyristor short-circuit switch testing device and system
By designing a high-voltage thyristor short-circuit switch test device, and using Hall current signals to generate overcurrent protection signals to control IGBT discharge switches, the problem that existing devices cannot effectively detect high-voltage thyristor short-circuit switches is solved, thus improving the system's reliability and operational safety.
Patent Information
- Application Number
- CN202210269626.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-03-18
- Publication Date
- 2026-01-02
- Estimated Expiration
- 2042-03-18
AI Technical Summary
Existing switch testing equipment cannot meet the testing requirements of high-voltage thyristor short-circuit switches and cannot effectively detect the overcurrent protection of the power supply system and the normal operating status of the thyristor short-circuit switch.
A high-voltage thyristor short-circuit switch test device was designed, including a DC power supply module, a charging current-limiting resistor, an IGBT discharge switch, a pulse discharge capacitor, an IGBT drive and protection circuit module, and an overcurrent detection and latching module. The device generates an overcurrent protection signal by acquiring Hall current signals, and controls the IGBT discharge switch to turn on or off, thereby ensuring the reliability of the power supply system.
This technology enables reliability testing of high-voltage thyristor short-circuit switches and overcurrent protection devices, improving system reliability and operator safety.
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Figure CN114878998B_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of electrical engineering, and particularly relates to a testing device for thyristor short-circuit switch. BACKGROUND
[0002] The overcurrent protection device is a key component for ensuring the safety of the ion source. The overcurrent protection device is used for detecting the state between the load electrodes of the ion source, rapidly cutting off the high-voltage power supply when the electrodes are struck by lightning, and triggering the thyristor short-circuit switch at the output end of the 80kV / 70A high-voltage pulse power supply, so as to ensure that the parasitic energy of the power supply is rapidly released, thereby ensuring the reliable operation of the ion source. In order to determine whether the overcurrent protection of the power supply system and the thyristor short-circuit switch can normally work, a high-voltage thyristor short-circuit switch testing device needs to be developed. Through the testing of the testing device, it can be determined whether the high-voltage thyristor short-circuit switch can normally work, and whether the overcurrent detection equipment of the power supply can normally work.
[0003] However, the current switch testing method and device cannot meet the above testing requirements, and thus cannot meet the actual needs of the high-voltage thyristor short-circuit switch testing. SUMMARY
[0004] The present application aims at overcoming the shortcomings of the prior art, and provides a high-voltage thyristor short-circuit switch testing device.
[0005] The present application is implemented by the following technical solutions:
[0006] The high-voltage thyristor short-circuit switch testing device comprises a direct-current power supply module, a charging current-limiting resistor, an IGBT discharge switch, a pulse discharge capacitor, an IGBT drive and protection circuit module, and an overcurrent detection and latching module. The positive electrode of the direct-current power supply module is connected to one end of the pulse discharge capacitor and the source electrode of the IGBT discharge switch through the charging current-limiting resistor. The drain electrode of the IGBT discharge switch is used for connecting to the positive electrode of the measured loop. The negative electrode of the direct-current power supply module is connected to the other end of the pulse discharge capacitor, the power supply ground, and the negative electrode of the measured loop.
[0007] The IGBT drive and protection circuit module is used for controlling the IGBT discharge switch to be turned on or turned off according to the received overcurrent protection signal.
[0008] The input end of the overcurrent detection and latching module is used for collecting the Hall current signal output by the measured loop, and generating an overcurrent protection signal according to the Hall current signal. The overcurrent protection signal is latched and sent to the input end of the IGBT drive and protection circuit module, so that the IGBT drive and protection circuit module controls the IGBT discharge switch to be turned off or turned on according to the received overcurrent protection signal.
[0009] Further, the IGBT drive and protection circuit module comprises:
[0010] The light receiving module U1 and the light receiving module U2 are used for receiving the start signal and the overcurrent protection signal respectively, the pins 3 and 7 of the light receiving module U1 and the light receiving module U2 are connected with the ground GND, the pin 2 of the light receiving module U1 and the light receiving module U2 is connected with the +5V power supply, the pin 6 of the light receiving module U1 and the light receiving module U2 is connected with the +5V power supply through the resistor R1 and the resistor R2 respectively, the pin 6 of the light receiving module U1 is connected with the pin 1 of the NOT gate chip U3A and the pin 1 of the jumper J1, the pin 2 of the NOT gate chip U3A is connected with the pin 3 of the jumper J1, and the pin 2 of the jumper J1 is connected with the pin 1 of the AND gate chip U4A; the pin 6 of the light receiving module U2 is connected with the pin 3 of the NOT gate chip U3B and the pin 1 of the jumper J2, the pin 4 of the NOT gate chip U3B is connected with the pin 3 of the jumper J2, and the pin 2 of the jumper J2 is connected with the pin 2 of the AND gate chip U4A; the pin 3 of the AND gate chip U4A is connected with the pin 1 of the pulse trigger delay chip U5A, the pins 14 and 15 of the pulse trigger delay chip U5A are connected with both ends of the capacitor C3 respectively, the pin 14 of the pulse trigger delay chip U5A is connected with the ground GND, the pin 15 of the pulse trigger delay chip U5A is connected with the +5V power supply through the resistor R8, the pins 2, 3 and 16 of the pulse trigger delay chip U5A are connected with the +5V power supply, the pins 2, 3 and 16 of the pulse trigger delay chip U5A are connected with the pin 1 of the J3 through the resistor R21, the pin 4 of the pulse trigger delay chip U5A is connected with the pin 3 of the jumper J3, the pin 8 of the pulse trigger delay chip U5A is connected with the ground GND, the pin 2 of the jumper J3 is connected with the pin 4 of the AND gate chip U4B, the pin 6 of the AND gate chip U4B is connected with the pin 10 of the pulse trigger delay chip U5B, the pins 6 and 7 of the pulse trigger delay chip U5B are connected with both ends of the capacitor C4 respectively, the pins 6 and 9 of the pulse trigger delay chip U5B are connected with the ground GND, the pin 7 of the pulse trigger delay chip U5B is connected with the +5V power supply through the resistor R10, the pin 11 of the pulse trigger delay chip U5B is connected with the +5V power supply, the pin 5 of the pulse trigger delay chip U5B is connected with the pin 1 of the jumper J4, the pin 12 of the pulse trigger delay chip U5B is connected with the pin 3 of the jumper J4, the pin 2 of the jumper J4 is connected with the pin 2 of the optocoupler chip U6, the pin 3 of the U6 chip is connected with the ground GND, the pin 8 of the optocoupler chip U6 is connected with the +15V power supply, the pins 6 and 7 of the optocoupler chip U6 are connected, and the pins 6 and 7 of the optocoupler chip U6 are connected with the gate G of the IGBT discharge switch Q1 through the resistor R12 and the resistor R13 as the driving signal, the pin 5 of the optocoupler chip U6 is connected with the ground GND as the drain D driving signal of the IGBT discharge switch Q1.
[0011] Further, the overcurrent detection and latch module comprises a current sensor for collecting the Hall current of the measured circuit.
[0012] The Hall current is connected through terminal J5, the positive pole of the Hall current signal is connected with one end of resistor R111, one end of capacitor C1 and one end of resistor R6; the negative pole of the Hall current signal is connected with ground GND; the other end of resistor R6 is connected with pin 2 of optocoupler chip U6, pin 3 of optocoupler chip U6 is connected with pin 2 of resistor R4 and one end of capacitor C2 through resistor R7, the other end of capacitor C2 is connected with ground GND, pin 3 of resistor R4 is connected with ground GND through resistor R5, pin 1 of resistor R4 is connected with +15V power supply through resistor R3; pin 8 of optocoupler chip U6 is connected with +15V power supply, pin 1 and pin 4 of optocoupler chip U6 are connected with ground GND; pin 7 of optocoupler chip U6 is connected with +15V power supply through R9 and connected with pin 3 of U7 through R114 respectively; pin 5 of latch chip U7 is connected with +15V power supply through resistor R115, pin 6 of latch chip U7 is connected with ground GND through resistor R116, pin 7 of latch chip U7 is directly connected with ground GND, pin 14 of latch chip U7 is directly connected with +15V power supply; pin 1 of latch chip U7 is connected with pin 1 of non gate U8A, pin 3 of non gate U8B, pin 5 of non gate U8C, pin 7 of non gate U8D, pin 9 of non gate U8E and pin 11 of non gate U8F respectively; pin 2 of non gate U8A, pin 4 of non gate U8B, pin 6 of non gate U8C, pin 8 of non gate U8D, pin 10 of non gate U8E and pin 12 of non gate U8F are connected with pin 3 of U9; pin 2, pin 6 and pin 7 of light sending module U9 are connected with +5V power supply through resistor R12.
[0013] Further, the models of the jumpers J1, J2, J3, J4 and J5 are 410203G0AM.
[0014] Further, the pulse trigger delay chip adopts 74HC123 chip.
[0015] Further, the optocoupler chip adopts TLP250 chip.
[0016] In another aspect, the application provides a high-voltage thyristor short-circuit switch test system, comprising a test loop and a measured loop, the test loop adopts the high-voltage thyristor short-circuit switch device provided in any one of the possible embodiments of the above technical solutions, and the measured loop comprises a high-voltage thyristor short-circuit switch Q2, the anode of the thyristor short-circuit switch Q2 is the positive pole of the measured loop and is connected with the drain of the IGBT discharge switch, and the cathode of the thyristor short-circuit switch Q2 is the negative pole of the measured loop.
[0017] Further, the negative pole of the measured loop is connected with an overcurrent protection device G2, the overcurrent protection device is used to collect the Hall current in the measured loop and generate an overcurrent protection signal according to the Hall current signal, the overcurrent protection signal is latched and sent to the input end of the IGBT drive and protection circuit module, so that the IGBT drive and protection circuit module controls the IGBT discharge switch to be turned off or turned on according to the received overcurrent protection signal.
[0018] The application has the following beneficial technical effects: the reliability test of the high-voltage thyristor short-circuit switch and the overcurrent protection device in the 80kV / 70A high-voltage pulse power supply system, and the implementation of the scheme increases the reliability of the system and the safety of the on-site operators. BRIEF DESCRIPTION OF DRAWINGS
[0019] Figure 1 A high-voltage thyristor short-circuit switch test wiring diagram is provided for the specific embodiments of the application.
[0020] Figure 2 An IGBT drive and protection circuit module schematic diagram in the high-voltage thyristor short-circuit switch test device is provided for the specific embodiments of the application.
[0021] Figure 3 An overcurrent detection and latching module schematic diagram in the high-voltage thyristor short-circuit switch test device is provided for the specific embodiments of the application. DETAILED DESCRIPTION
[0022] The application is further described below in combination with the drawings and specific embodiments of the specification.
[0023] Embodiment: A high-voltage thyristor short-circuit switch test device, comprising: a DC power supply module, a charging current-limiting resistor, an IGBT discharge switch, a pulse discharge capacitor, an IGBT drive and protection circuit module, the device further comprising an overcurrent detection and latching module, the positive pole of the DC power supply module is connected with one end of the pulse discharge capacitor and the source S of the IGBT discharge switch through the charging current-limiting resistor, the drain D of the IGBT discharge switch is used to be connected with the positive pole of the measured loop, and the negative pole of the DC power supply module is connected with the other end of the pulse discharge capacitor, the power supply ground and the negative pole of the measured loop.
[0024] The IGBT drive and protection circuit module is configured to control the IGBT discharge switch to be turned on or turned off according to the received overcurrent protection signal.
[0025] The input end of the overcurrent detection and latching module is configured to collect a Hall current signal output by the measured circuit, and generate an overcurrent protection signal according to the Hall current signal. The overcurrent protection signal is latched and sent to the input end of the IGBT drive and protection circuit module, so that the IGBT drive and protection circuit module controls the IGBT discharge switch to be turned off or turned on according to the received overcurrent protection signal.
[0026] Figure 1 The test circuit block diagram on the left side of the middle shows the high-voltage thyristor short-circuit switch test device provided by the embodiment, which includes a VGG direct-current power supply module, a charging current-limiting resistor Rc1, an IGBT discharge switch Q1, a pulse discharge capacitor Cc1, and an IGBT drive and protection circuit module KKHB. The positive electrode of the VGG direct-current power supply module is connected to one end of the pulse discharge capacitor Cc1 and the source electrode S of the IGBT discharge switch Q1 through the charging current-limiting resistor Rc1, respectively. The drain electrode D of the IGBT discharge switch Q1 is connected to the positive electrode A port of the measured circuit. The negative electrode of the VGG direct-current power supply module is connected to the other end of the pulse discharge capacitor Cc1, the power supply ground AGND, and the negative electrode B port of the measured circuit through the charging current-limiting resistor Rc1, respectively. The device further includes an overcurrent detection and latching module.
[0027] Figure 1 G1 in the middle is the overcurrent detection and latching module.
[0028] Optionally, in specific embodiments, the negative electrode of the measured circuit is connected to an overcurrent protection device G2. The overcurrent protection device is configured to collect a Hall current in the measured circuit, generate an overcurrent protection signal according to the Hall current, latch the overcurrent protection signal, and send the overcurrent protection signal to the input control end of the IGBT drive and protection circuit module.
[0029] When the test circuit works, the direct-current power supply module VGG is turned on to charge the pulse discharge capacitor Cc1. When the capacitor is charged to a rated voltage (such as 12V), the IGBT discharge switch is triggered through the IGBT drive and protection circuit module KKHB to perform discharge test on the thyristor short-circuit switch in the measured circuit. If the switch is normal, the overcurrent detection and latching module G1 can send an overcurrent protection signal within 2us, latch the signal, and send the overcurrent protection signal to the IGBT drive and protection circuit module, so as to avoid continuous triggering of the IGBT discharge switch.
[0030] If the over-current protection signal sent by the over-current protection device G2 in the tested circuit can be received by the IGBT drive and protection circuit module, it indicates that the thyristor short-circuit switch and the over-current protection module of the system can work normally; otherwise, the over-current protection module G2 needs to be tested or replaced.
[0031] In the embodiment, the over-current detection and latching module G1 and the over-current protection module G2 both include a current sensor. Alternatively, the over-current detection and latching module G1 and the over-current protection module G2 can adopt the same circuit structure.
[0032] In the embodiment, the test circuit includes an IGBT switch, a LEM current sensor, a 12V DC power supply, a plurality of pulse capacitors, a plurality of optical transmitting chips HFBR-1414, a plurality of optical receiving chips HFBR-2412, a plurality of NOT gate chips 74HC04, a plurality of D flip-flop CD4013, a plurality of light-emitting diodes BAV199, a plurality of comparators LM311 and a plurality of pulse output chips 74HC12.
[0033] The test circuit is formed by connecting the 12V DC power supply, the resistor Rc1, the IGBT switch Q1 and the pulse capacitor Cc1 in series, and ensuring that the 12V DC power supply and the pulse capacitor Cc1 are connected with AGND. The high-voltage thyristor short-circuit switch Q2 of the tested circuit is connected in parallel with the pulse capacitor Cc1, and the over-current protection G1 device is installed at the cathode of the thyristor short-circuit switch Q2.
[0034] The IGBT drive and protection circuit module is shown in Figure 2 and includes:
[0035] U1 and U2 are optical receiving modules for receiving the start signal and the overcurrent protection signal of the test loop, the No. 3 and No. 7 pins of the optical receiving modules U1 and U2 are connected with GND, the No. 2 pins thereof are connected with +5V power supply, the No. 6 pins thereof are connected with +5V power supply through resistors R1 and R2 respectively, the No. 6 pin of the optical receiving module U1 is connected with the No. 1 pin of the NOT gate chip U3A and the No. 1 pin of the jumper J1 simultaneously, the No. 2 pin of the NOT gate chip U3A is connected with the No. 3 pin of the jumper J1, the No. 2 pin of the jumper J1 is connected with the No. 1 pin of the AND gate chip U4A; the No. 6 pin of the optical receiving module U2 is connected with the No. 3 pin of the NOT gate chip U3B and the No. 1 pin of the jumper J2, the No. 4 pin of the NOT gate chip U3B is connected with the No. 3 pin of the jumper J2, the No. 2 pin of the jumper J2 is connected with the No. 2 pin of the AND gate chip U4A, the No. 3 pin of the AND gate chip U4A is connected with the No. 1 pin of the pulse trigger delay chip U5A, the No. 14 and No. 15 pins of the pulse trigger delay chip U5A are connected with both ends of the capacitor C3 respectively, the No. 14 pin of the pulse trigger delay chip U5A is connected with GND simultaneously, the No. 15 pin of the pulse trigger delay chip U5A is connected with +5V power supply through the resistor R8, the No. 2, No. 3 and No. 16 pins of the pulse trigger delay chip U5A are connected with +5V power supply, the No. 2, No. 3 and No. 16 pins of the pulse trigger delay chip U5A are connected with the No. 1 pin of the J3 through the resistor R21 simultaneously, the No. 4 pin of the pulse trigger delay chip U5A is connected with the No. 3 pin of the jumper J3, the No. 8 pin of the pulse trigger delay chip U5A is connected with GND, the No. 2 pin of the jumper J3 is connected with the No. 4 pin of the AND gate chip U4B, the No. 6 pin of the AND gate chip U4B is connected with the No. 10 pin of the pulse trigger delay chip U5B, the No. 6 and No. 7 pins of the pulse trigger delay chip U5B are connected with both ends of the capacitor C4 respectively, the No. 6 and No. 9 pins of the pulse trigger delay chip U5B are connected with GND, the No. 7 pin of the pulse trigger delay chip U5B is connected with +5V power supply through the resistor R10, the No. 11 pin of the pulse trigger delay chip U5B is connected with +5V power supply, the No. 5 pin is connected with the No. 1 pin of the jumper J4, the No. 12 pin is connected with the No. 3 pin of the jumper J4, the No. 2 pin of the jumper J4 is connected with the No. 2 pin of the U6 chip, the No. 3 pin of the U6 chip is connected with GND, the No. 8 pin of the U6 chip is connected with +15V power supply, the No. 6 and No. 7 pins of the U6 chip are connected, and are connected with the gate G of the IGBT switch Q1 as driving signals through the resistors R12 and R13 respectively, the No. 5 pin of the U6 chip is connected with DGND and is connected with the drain D of the IGBT switch Q1 as a driving signal.
[0036] In the embodiment, the overcurrent detection and latching module G2 is as shown in Figure 3 , and includes:
[0037] The Hall current signal enters the overcurrent detection and protection board (i.e. the overcurrent detection and latch module) through the J5 terminal, the positive pole of the Hall current signal is connected with one end of the resistor R111, one end of the capacitor C1 and one end of the resistor R6; the negative pole of the Hall current signal is connected with GND. The other end of the resistor R6 is connected with the 2nd pin of U6, the 3rd pin of U6 is connected with the 2nd pin of the resistor R4 and one end of the capacitor C2 through the resistor R7, the other end of the capacitor C2 is connected with GND, the 3rd pin of the resistor R4 is connected with GND through the resistor R5, the 1st pin of the resistor R4 is connected with the +15V power supply through the resistor R3. The 8th pin of U6 is connected with the +15V power supply, the 1st and 4th pins of U6 are connected with GND. The 7th pin of U6 is connected with the +15V power supply through R9 and connected with the 3rd pin of U7 through R114. The 5th pin of U7 is connected with the +15V power supply through the resistor R115, the 6th pin of U7 is connected with GND through the resistor R116, the 7th pin of U7 is directly connected with GND, the 14th pin of U7 is directly connected with the +15V power supply. The 1st pin of U7 is connected with the 1st pin of U8A, the 3rd pin of U8B, the 5th pin of U8C, the 7th pin of U8D, the 9th pin of U8E and the 11th pin of U8F. The 2nd pin of U8A, the 4th pin of U8B, the 6th pin of U8C, the 8th pin of U8D, the 10th pin of U8E and the 12th pin of U8F are connected with the 3rd pin of U9. The 2nd, 6th and 7th pins of U9 are connected with the +5V power supply through the resistor R12.
[0038] U4 is a light receiving module for overcurrent protection reset signal; the 3rd and 7th pins of the light receiving module U1 are connected with GND, the 2nd pin is connected with the +5V power supply, the 6th pin is connected with the +5V power supply through the resistor R7, the 6th pin of the light receiving module U4 is connected with the 1st pin of the NOT gate chip U3C and the 1st pin of the jumper J3, the 2nd pin of the NOT gate chip U3C is connected with the 3rd pin of the jumper J3, the 2nd pin of the jumper J3 is connected with the 4th pin of the latch chip U7 as the overcurrent protection reset signal.
[0039] The U9 light sending module is connected with the U2 light receiving module through the optical fiber jumper, when the overcurrent signal appears, the action of blocking the IGBT switch through U2.
[0040] The models of the jumpers J1, J2, J3, J4 and J5 are 410203G0AM.
[0041] Based on the above embodiment, the application further provides a high-voltage thyristor short-circuit switch test system, which comprises a test loop and a measured loop, the test loop adopts the high-voltage thyristor short-circuit switch device provided in any one of the possible implementation manners of the above technical solutions, such as Figure 1As shown, the measured circuit includes a high-voltage thyristor short-circuit switch connected in parallel with a pulse discharge capacitor, a cathode of the thyristor short-circuit switch Q2 is connected with an overcurrent protection device, and the overcurrent protection device is used to output an overcurrent protection signal.
[0042] In specific embodiments, the jumper pins J1, J2, J3, J4 and J5 are model 410203G0AM.
[0043] The J5 terminal is used to receive a current signal of a LEM current sensor, the collected current signal is compared by a comparator, if the current is greater than a set value, an overcurrent protection signal is sent to an IGBT drive and protection circuit module to block the IGBT, which proves that the high-voltage thyristor short-circuit switch and the overcurrent protection device are both working properly. The current signal is detected by a current sensor of LEM company.
[0044] The high-voltage thyristor short-circuit switch testing device provided by the application sets an IGBT drive and protection circuit module and an overcurrent detection and latching module, can quickly latch an overcurrent protection signal, and can reset the overcurrent protection signal through an optical signal, so as to achieve the goal of remote control and ensure the life safety of the tester.
[0045] The application realizes the reliability test of the high-voltage thyristor short-circuit switch and the overcurrent protection device in the 80kV / 70A high-voltage pulse power supply system, and increases the reliability of the system and the safety of the on-site operator through the implementation of the scheme.
[0046] The above description is only the preferred embodiments of the application, and it should be pointed out that, for ordinary skilled in the art, without departing from the technical principles of the application, a number of improvements and modifications can be made, and these improvements and modifications should be considered as the protection scope of the application.
Claims
1. A test device for high voltage thyristor short circuit switches, characterized in that The device comprises a direct current power module, a charging current limiting resistor, an IGBT discharge switch, a pulse discharge capacitor, an IGBT drive and protection circuit module, and an overcurrent detection and latching module; the positive pole of the direct current power module is connected with one end of the pulse discharge capacitor and the source pole of the IGBT discharge switch through the charging current limiting resistor; the drain pole of the IGBT discharge switch is used for connecting with the positive pole of the measured loop; the negative pole of the direct current power module is connected with the other end of the pulse discharge capacitor, the power supply ground, and the negative pole of the measured loop; the IGBT drive and protection circuit module is used for controlling the IGBT discharge switch to be turned on or turned off according to the received overcurrent protection signal; the input end of the overcurrent detection and latching module is used for collecting the Hall current signal output by the measured loop, and the overcurrent protection signal is generated according to the Hall current signal; the overcurrent protection signal is latched and sent to the input end of the IGBT drive and protection circuit module, so that the IGBT drive and protection circuit module controls the IGBT discharge switch to be turned off or turned on according to the received overcurrent protection signal; the overcurrent detection and latching module comprises a current sensor, and the current sensor is used for collecting the Hall current of the test loop; the Hall current is connected through the terminal J5; the positive pole of the Hall current signal is connected with one end of the resistor R111, one end of the capacitor C1, and one end of the resistor R6; the negative pole of the Hall current signal is connected with the ground GND; the other end of the resistor R6 is connected with the 2nd pin of the optical coupler chip U6; the 3rd pin of the optical coupler chip U6 is connected with the 2nd pin of the resistor R4 and one end of the capacitor C2 through the resistor R7; the other end of the capacitor C2 is connected with the ground GND; the 3rd pin of the resistor R4 is connected with the ground GND through the resistor R5; the 1st pin of the resistor R4 is connected with the +15V power supply through the resistor R3; the 8th pin of the optical coupler chip U6 is connected with the +15V power supply; the 1st and 4th pins of the optical coupler chip U6 are connected with the ground GND; the 7th pin of the optical coupler chip U6 is connected with the +15V power supply through R9 and connected with the 3rd pin of U7 through R114; the 5th pin of the latch chip U7 is connected with the +15V power supply through the resistor R115; the 6th pin of the latch chip U7 is connected with the ground GND through the resistor R116; the 7th pin of the latch chip U7 is directly connected with the ground GND; the 14th pin of the latch chip U7 is directly connected with the +15V power supply; the 1st pin of the latch chip U7 is connected with the 1st pin of the NOT gate U8A, the 3rd pin of the NOT gate U8B, the 5th pin of the NOT gate U8C, the 7th pin of the NOT gate U8D, the 9th pin of the NOT gate U8E, and the 11th pin of the NOT gate U8F; the 2nd pin of the NOT gate U8A, the 4th pin of the NOT gate U8B, the 6th pin of the NOT gate U8C, the 8th pin of the NOT gate U8D, the 10th pin of the NOT gate U8E, and the 12th pin of the NOT gate U8F are connected with the 3rd pin of U9; the 2nd pin, the 6th pin, and the 7th pin of the light sending module U9 are connected with the +5V power supply through the resistor R12. 2. The high-voltage thyristor short-circuit switch test device according to claim 1, characterized in that The IGBT drive and protection circuit module comprises: The light receiving module U1 and the light receiving module U2 are used for receiving start signals and overcurrent protection signals respectively, the No. 3 pin and the No. 7 pin of the light receiving module U1 and the light receiving module U2 are connected with the ground GND, the No. 2 pin of the light receiving module U1 and the light receiving module U2 is connected with the +5V power supply, the No. 6 pin of the light receiving module U1 and the light receiving module U2 is connected with the +5V power supply through the resistor R1 and the resistor R2 respectively, the No. 6 pin of the light receiving module U1 is connected with the No. 1 pin of the NOT gate chip U3A, and is also connected with the No. 1 pin of the jumper J1, the No. 2 pin of the NOT gate chip U3A is connected with the No. 3 pin of the jumper J1, and the No. 2 pin of the jumper J1 is connected with the No. 1 pin of the AND gate chip U4A; the No. 6 pin of the light receiving module U2 is connected with the No. 3 pin of the NOT gate chip U3B and the No. 1 pin of the jumper J2, the No. 4 pin of the NOT gate chip U3B is connected with the No. 3 pin of the jumper J2, and the No. 2 pin of the jumper J2 is connected with the No. 2 pin of the AND gate chip U4A, the No. 3 pin of the AND gate chip U4A is connected with the No. 1 pin of the pulse trigger delay chip U5A, the No. 14 pin and the No. 15 pin of the pulse trigger delay chip U5A are connected with both ends of the capacitor C3 respectively, meanwhile the No. 14 pin of the pulse trigger delay chip U5A is connected with the ground GND, the No. 15 pin of the pulse trigger delay chip U5A is connected with the +5V power supply through the resistor R8, the No. 2 pin, the No. 3 pin and the No. 16 pin of the pulse trigger delay chip U5A are connected with the +5V power supply, meanwhile the No. 2 pin, the No. 3 pin and the No. 16 pin of the pulse trigger delay chip U5A are connected with the No. 1 pin of the J3 through the resistor R21, the No. 4 pin of the pulse trigger delay chip U5A is connected with the No. 3 pin of the jumper J3, the No. 8 pin of the pulse trigger delay chip U5A is connected with the ground GND, the No. 2 pin of the jumper J3 is connected with the No. 10 pin of the pulse trigger delay chip U5B, the No. 6 pin and the No. 7 pin of the pulse trigger delay chip U5B are connected with both ends of the capacitor C4 respectively, the No. 6 pin and the No. 9 pin of the pulse trigger delay chip U5B are connected with the ground GND, the No. 7 pin of the pulse trigger delay chip U5B is connected with the +5V power supply through the resistor R10, the No. 11 pin of the pulse trigger delay chip U5B is connected with the +5V power supply, the No. 5 pin is connected with the No. 1 pin of the jumper J4, the No. 12 pin is connected with the No. 3 pin of the jumper J4, the No. 2 pin of the jumper J4 is connected with the No. 2 pin of the optical coupler chip U6, the No. 3 pin of the U6 chip is connected with the ground GND, the No. 8 pin of the optical coupler chip U6 is connected with the +15V power supply, the No. 6 pin and the No. 7 pin of the optical coupler chip U6 are connected, and are used as the gate G driving signal of the IGBT discharge switch Q1 through the resistor R12 and the resistor R13 respectively, the No. 5 pin of the optical coupler chip U6 is connected with the ground GND and is used as the drain D driving signal of the IGBT discharge switch Q1.
3. The high-voltage thyristor short-circuit switch test arrangement according to claim 2, characterized in that The jumper J1, J2, J3 and J4 are model 410203G0AM.
4. The high-voltage thyristor short-circuit switch test arrangement according to claim 2, characterized in that The pulse trigger delay chip adopts 74HC123 chip.
5. The high-voltage thyristor short-circuit switch test arrangement according to claim 2, characterized in that The optical coupler chip adopts TLP250 chip.
6. A high voltage thyristor short circuit switch test system, characterized by The test system comprises a test loop and a measured loop, the test loop adopts the high-voltage thyristor short-circuit switch device as claimed in any one of claims 1-5, and the measured loop comprises a high-voltage thyristor short-circuit switch Q2, the anode of the thyristor short-circuit switch Q2 is the positive pole of the measured loop and is connected with the drain of the IGBT discharge switch, and the cathode of the thyristor short-circuit switch Q2 is the negative pole of the measured loop.
7. The high-voltage thyristor short-circuit switch test system according to claim 6, characterized in that, the negative pole of the measured loop is connected with an over-current protection device G2, the over-current protection device is used for collecting Hall current in the measured loop, generating an over-current protection signal according to the Hall current signal, latching the over-current protection signal and sending the over-current protection signal to the input end of the IGBT drive and protection circuit module, so that the IGBT drive and protection circuit module controls the IGBT discharge switch to be turned off or turned on according to the received over-current protection signal.
Citation Information
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