A display screen electrical measurement screen leakage current testing method and system

Abstract

The invention discloses a method and system for testing leakage current of an electrical measurement screen of a display screen. The method comprises the following steps: inputting a first voltage to each transistor pixel in a first stage of a driving sequence, so that the display screen displays a first picture; inputting a second voltage to each transistor pixel in a second stage of the driving sequence, so that the display screen displays a second picture; inputting a second voltage to each transistor pixel in a third stage of the driving sequence, so that the display screen displays a third picture; charging each transistor pixel with a first voltage in a fourth stage of the driving sequence, so that the display screen displays a fourth picture; determining whether the display screen is a qualified product by comparing the brightness of the first picture, the second picture, the third picture, and the fourth picture; inputting a forward voltage and a reverse voltage to the transistor pixel so that the display screen displays pictures of different brightnesses, so that process personnel can easily select unqualified display screen products, thereby solving the problem of too many electrical measurement pictures leading to reduced shipments.

Description

Technical Field

[0001] The present invention relates to the technical field of display screen electrical measurement, and in particular to a display screen electrical measurement screen leakage current testing method and system. Background Art

[0002] Before the display screen enters the post-process, it will be electrically tested to select qualified products to enter the post-process and select unqualified products to prevent qualified products from mixing into the post-process, so as not to affect the yield of the post-process.

[0003] There are many types of electrical testing screens available. Too many screens will cause the electrical testing time to be too long, resulting in a decrease in shipment volume. Too few effective screens will result in some defective products being unable to be selected out by electrical testing, which will affect the yield of subsequent processes.

[0004] For example, Chinese patent application CN101493589A discloses a TFTLCD programmable comprehensive performance electrical tester and a detection method thereof, wherein the electrical tester outputs seven kinds of changing voltage signals that can drive the TFT LCD, including GG, EVEN, DATAR, G, B and other voltage signals, to generate ten pictures, namely black, primary grayscale, secondary grayscale, tertiary grayscale, white, red, green and blue.

[0005] However, when selecting qualified and unqualified products, if there are too many electrical testing screens, the electrical testing time will be too long, the efficiency will be reduced, and the shipment rate will be affected. Summary of the invention

[0006] The existing display screen electrical testing has too many test screens, which causes the test time to be too long, resulting in a decrease in shipment volume.

[0007] In view of the above problems, a method and system for testing leakage current of display screen electrical measurement is proposed. By inputting forward voltage and reverse voltage to each transistor pixel in the driving sequence, the display screen can display pictures of different brightness. If the transistor leakage current is large and the characteristics are poor, the picture will alternate between light and dark and flickering, making it easy for process personnel to select unqualified display screen products. The problem of existing display screen electrical measurement, too many electrical measurement screens, resulting in too long electrical measurement time, thus leading to reduced shipments, is solved.

[0008] In a first aspect, a method for testing leakage current of a display screen includes:

[0009] Step 100: inputting a first voltage to each transistor pixel in the first stage of the driving sequence, so that the display screen displays a first picture;

[0010] Step 200, inputting a second voltage to each transistor pixel in the second stage of the driving sequence, so that the display screen displays a second picture;

[0011] Step 300: inputting a second voltage to each transistor pixel in the third stage of the driving sequence, so that the display screen displays a third picture;

[0012] Step 400, charging each transistor pixel with a first voltage in the fourth stage of the driving sequence, so that the display screen displays a fourth picture;

[0013] Step 500: Determine whether the display screen is a qualified product by comparing the brightness of the first picture, the second picture, the third picture, and the fourth picture;

[0014] The first and third stages of the driving sequence turn on the transistors row by row and turn off the transistors row by row after inputting the corresponding voltages, and the second and fourth stages of the driving sequence turn off the transistors, and:

[0015] The first stage and the third stage input a first voltage and a second voltage respectively;

[0016] The second stage and the fourth stage input the second voltage and the first voltage respectively;

[0017] The first voltage and the second voltage have opposite polarities.

[0018] In conjunction with the display screen electrical measurement screen leakage current testing method of the present invention, in a first possible implementation manner, the step 100 includes:

[0019] Step 110, in the first stage of the driving sequence, use the gate scanning driving lines G1, G2, ..., Gn to turn on the transistors row by row;

[0020] Step 120, corresponding to the first stage, inputting a first voltage to the pixel transistors row by row;

[0021] Step 130 , corresponding to the first stage, after acquiring the first voltage row by row, the pixel transistors are turned off row by row.

[0022] In combination with the first possible implementation manner of the present invention, in a second possible implementation manner, step 200 includes:

[0023] Step 210: In the second stage of the driving sequence, the gates G1, G2, ..., Gn are used to scan the driving lines, and the pixel transistors are kept in the off state row by row.

[0024] Step 220, corresponding to the second stage, inputting a second voltage to the pixel transistors row by row;

[0025] Step 230, corresponding to the second stage, after acquiring the second voltage row by row, the pixel transistor continues to be turned off;

[0026] The duration of the second stage is equal to the duration of the first stage.

[0027] In combination with the first possible implementation manner of the present invention, in a third possible implementation manner, step 200 further includes:

[0028] Step 240: In the second stage of the driving sequence, the gates G1, G2, ..., Gn are used to scan the driving lines, and the pixel transistors are kept in the off state row by row.

[0029] Step 250, corresponding to the second stage, inputting a second voltage to the pixel transistors row by row;

[0030] Step 260, corresponding to the second stage, after acquiring the second voltage row by row, the pixel transistor continues to be turned off;

[0031] The duration of the second stage is twice as long as the duration of the first stage.

[0032] In combination with the third possible implementation manner of the present invention, in a fourth possible implementation manner, step 300 includes:

[0033] Step 310, in the third stage of the driving sequence, using the gate scanning driving lines G1, G2, ..., Gn to turn on the transistors row by row;

[0034] Step 320, corresponding to the third stage, inputting a second voltage to the pixel transistors row by row;

[0035] Step 330 , corresponding to the third stage, after acquiring the second voltage row by row, the pixel transistors are turned off row by row.

[0036] In combination with the fourth possible implementation manner of the present invention, in a fifth possible implementation manner, step 400 includes:

[0037] Step 410: In the fourth stage of the driving sequence, the gates G1, G2, ..., Gn are used to scan the driving lines, and the pixel transistors are kept in the off state row by row.

[0038] Step 420, corresponding to the fourth stage, inputting a first voltage to the pixel transistors row by row;

[0039] Step 430, corresponding to the fourth stage, after acquiring the first voltage row by row, the pixel transistor continues to be turned off;

[0040] The duration of the fourth stage is equal to the duration of the third stage.

[0041] In combination with the fourth possible implementation manner of the present invention, in a sixth possible implementation manner, step 400 further includes:

[0042] Step 440: In the fourth stage of the driving sequence, the gates G1, G2, ..., Gn are used to scan the driving lines, and the pixel transistors are kept in the off state row by row.

[0043] Step 450, corresponding to the fourth stage, inputting a first voltage to the pixel transistors row by row;

[0044] Step 460, corresponding to the fourth stage, after acquiring the first voltage row by row, the pixel transistor continues to be turned off;

[0045] The duration of the fourth stage is twice that of the third stage.

[0046] In conjunction with the display screen electrical measurement screen leakage current testing method described in the present invention, in a seventh possible implementation manner, the first voltage is a forward voltage, and the second voltage is a reverse voltage.

[0047] In a second aspect, a display screen electrical measurement screen leakage current testing system, using the testing method of the first aspect, comprises:

[0048] Pixel transistor;

[0049] Scan drive line;

[0050] Voltage input unit;

[0051] Control unit;

[0052] Display unit;

[0053] The row scanning drive line is connected to the gate of each row of the pixel transistors, the voltage input unit is connected to the drain of each column of the pixel transistors, and the source of the pixel transistor is connected to the capacitor and then grounded;

[0054] The control unit is connected to the scan drive line and the voltage input unit respectively;

[0055] The display unit is connected to the control unit and is used to display status pictures of different input voltages;

[0056] The control unit is used to output the working timing of each row of pixel transistors to control the pixel transistors to turn on or off;

[0057] The voltage input unit is used to input a first voltage or a second voltage to the pixel transistor according to a working sequence.

[0058] In conjunction with the display screen electrical measurement screen leakage current test system described in the second aspect, in a first possible implementation manner, the first voltage is a forward voltage, and the second voltage is a reverse voltage.

[0059] The display screen electrical measurement screen leakage current test method and system described in the present invention can make the display screen display pictures of different brightness by inputting forward voltage and reverse voltage to each transistor pixel in the driving sequence. If the transistor leakage current is large and the characteristics are poor, the screen will be alternately displayed with light and dark alternation and flickering, so that process personnel can easily select unqualified display screen products, which solves the problem of existing display screen electrical measurement, too many electrical measurement screens, resulting in too long electrical measurement time, thereby leading to reduced shipments. BRIEF DESCRIPTION OF THE DRAWINGS

[0060] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.

[0061] Figure 1 It is a schematic diagram of a first embodiment of a method for testing leakage current of a display screen in the present invention;

[0062] Figure 2 It is a schematic diagram of a second embodiment of a method for testing leakage current of a display screen in the present invention;

[0063] Figure 3 It is a schematic diagram of a third embodiment of a method for testing leakage current of a display screen in the present invention;

[0064] Figure 4 2 is a schematic diagram of a fourth embodiment of a method for testing leakage current of a display screen according to the present invention;

[0065] Figure 5 It is a schematic diagram of a fifth embodiment of a method for testing leakage current of a display screen in the present invention;

[0066] Figure 6 2 is a schematic diagram of a sixth embodiment of a method for testing leakage current of a display screen according to the present invention;

[0067] Figure 7 It is a schematic diagram of a seventh embodiment of a method for testing leakage current of a display screen in the present invention;

[0068] Figure 8 It is a schematic diagram of a first embodiment of a display screen electrical measurement screen leakage current testing system of the present invention;

[0069] Fig. 9 It is a driving timing diagram of the display screen electrical measurement screen leakage current test in the present invention;

[0070] The names of the parts indicated by the numbers in the drawings are: 10 - pixel transistor, 20 - scanning drive line, 30 - voltage input unit, 40 - control unit, 50 - display unit. DETAILED DESCRIPTION

[0071] The following will be combined with the accompanying drawings in the invention to clearly and completely describe the technical solutions in the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, other embodiments obtained by ordinary technicians in this field without creative work are all within the scope of protection of the present invention.

[0072] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0073] The existing display screen electrical testing has too many test screens, which causes the test time to be too long, resulting in a decrease in shipment volume.

[0074] In view of the above problems, a method and system for testing leakage current of a display screen is proposed.

[0075] Example 1

[0076] like Figure 1 , Figure 1 The present invention is a schematic diagram of the first embodiment of the method for testing leakage current of a display screen by electrical measurement of a screen, and a method for testing leakage current of a display screen by electrical measurement of a screen, comprising: step 100, inputting a first voltage to each transistor pixel in the first stage of a driving sequence, so that the display screen displays a first picture; step 200, inputting a second voltage to each transistor pixel in the second stage of a driving sequence, so that the display screen displays a second picture; step 300, inputting a second voltage to each transistor pixel in the third stage of a driving sequence, so that the display screen displays a third picture; step 400, charging each transistor pixel with a first voltage in the fourth stage of a driving sequence, so that the display screen displays a fourth picture; step 500, determining whether the display screen is a qualified product by comparing the brightness of the first picture, the second picture, the third picture, and the fourth picture; the first stage and the third stage of the driving sequence turn on the transistors row by row and turn off the transistors row by row after inputting the corresponding voltage, the second stage and the fourth stage of the driving sequence make the transistors in a closed state, and the first stage and the third stage respectively input the first voltage and the second voltage; the second stage and the fourth stage respectively input the second voltage and the first voltage; the first voltage has opposite polarity to the second voltage.

[0077] In the first stage of the driving sequence, the G1, G2, ..., Gn gate scanning drive lines 20 are opened row by row to charge the first voltage. The first voltage Vdata can be +5V. Vdata charges the pixel TFT transistor row by row, and then the transistor is closed row by row. At this time, the display screen displays the first picture, and the first picture is brighter. In the second stage of the driving sequence, a leakage test is performed. At this time, the G1, G2, ..., Gn gate scanning drive lines 20 maintain a low level, and the pixel transistor 10 connected thereto is in a closed state. Vdata inputs a voltage opposite to the first voltage to the pixel transistor 10 through the G1, G2, ..., Gn gate scanning drive lines 20, such as -5V, to give the pixel transistor 10 in the closed state an opposite voltage. If the characteristics of the pixel transistor 10 are poor, such as a large leakage current, the positive polarity voltage of the pixel capacitor will leak to the negative polarity voltage of Vdata, and the displayed second picture will appear dark.

[0078] In the third stage of the driving sequence, the gate scanning drive lines G1, G2, ..., Gn are opened row by row to charge the second voltage. The second voltage Vdata can be -5V. Vdata charges the pixel TFT transistors row by row, and then the transistors are closed row by row. The display screen displays the third picture, and the brightness of the third picture is equivalent to that of the first picture.

[0079] Similarly, in the fourth stage of the driving sequence, a leakage test is performed and a first voltage is input. At this time, the G1, G2, ..., Gn gate scanning drive lines 20 maintain a high level, and the pixel transistor 10 connected thereto is in an off state. Vdata inputs a first voltage opposite to the second voltage, for example, +5V, to the pixel transistor 10 through the G1, G2, ..., Gn gate scanning drive lines 20, to give an opposite voltage to the off-state pixel transistor 10. If the characteristics of the pixel transistor 10 are poor, such as a large leakage current, the negative polarity voltage of the pixel capacitor will leak to the positive polarity voltage of Vdata, and the displayed fourth picture will appear darkened, and the brightness of the fourth picture is equivalent to that of the second picture.

[0080] By inputting forward voltage and reverse voltage to each transistor pixel during the driving sequence, the display screen can display pictures of different brightness. If the transistor leakage current is large and the characteristics are poor, the picture will alternate between light and dark and flicker. This makes it easy for process personnel to select unqualified display screen products, solving the problem of existing display screen electrical testing, where there are too many test screens, resulting in too long test time, which leads to reduced shipments.

[0081] Example 2

[0082] Preferably, if Figure 2 , Figure 2It is a schematic diagram of the second embodiment of the method for testing leakage current of the display screen in the present invention. Step 100 includes: Step 110, using G1, G2, ..., Gn gate scanning driving lines 20 to turn on the transistors row by row in the first stage of the driving sequence; Step 120, corresponding to the first stage, inputting the first voltage to the pixel transistors 10 row by row; Step 130, corresponding to the first stage, after obtaining the first voltage row by row, the pixel transistors 10 are turned off row by row. In the first stage of the driving sequence, G1, G2, ..., Gn gate scanning driving lines 20 are turned on row by row to charge the first voltage. The first voltage Vdata can be +5V. Vdata charges the pixel TFT transistors row by row, and then the transistors are turned off row by row. At this time, the display screen displays the first picture, and the first picture is brighter.

[0083] In one embodiment, if Figure 3 , Figure 3 It is a schematic diagram of the third embodiment of the display screen leakage current test method in the present invention, and step 200 includes: step 210, using G1, G2, ..., Gn gate scanning drive line 20 in the second stage of the driving timing to keep the pixel transistor in a closed state row by row; step 220, corresponding to the second stage, inputting the second voltage to the pixel transistor 10 row by row; step 230, corresponding to the second stage, after obtaining the second voltage row by row, continue to keep the pixel transistor 10 in a closed state; wherein the duration of the second stage is equal to the duration of the first stage.

[0084] Furthermore, if Figure 4 , Figure 4 It is a schematic diagram of the fourth embodiment of the display screen leakage current test method in the present invention, and step 300 includes: step 310, using G1, G2, ..., Gn gate scanning drive lines 20 to turn on transistors row by row in the third stage of the driving timing; step 320, corresponding to the third stage, inputting the second voltage to the pixel transistor 10 row by row; step 330, corresponding to the third stage, after obtaining the second voltage row by row, the pixel transistor 10 is turned off row by row.

[0085] Furthermore, if Figure 5 , Figure 5 It is a schematic diagram of the fifth embodiment of the display screen leakage current test method in the present invention, and step 400 includes: step 410, using G1, G2, ..., Gn gate scanning drive line 20 in the fourth stage of the driving timing to keep the pixel transistor in a closed state row by row; step 420, corresponding to the fourth stage, inputting the first voltage to the pixel transistor 10 row by row; step 430, corresponding to the fourth stage, after obtaining the first voltage row by row, continue to keep the pixel transistor 10 in a closed state; wherein the duration of the fourth stage is equal to the duration of the third stage.

[0086] In this embodiment, the first stage, the second stage, the third stage, and the fourth stage all maintain the time of one frame of image, and the duration is equal. The input voltage is the first voltage and the second voltage alternating. If the transistor leakage current is large and the characteristics are poor, the picture will alternate between light and dark and flicker. In this case, the display screen has a large leakage current and is selected and no longer enters the subsequent process.

[0087] In another embodiment, Figure 6 , Figure 6 It is a schematic diagram of the sixth embodiment of the display screen leakage current test method in the present invention, and step 200 also includes: step 240, using G1, G2, ..., Gn gate scanning drive line 20 in the second stage of the driving timing to keep the pixel transistor in a closed state row by row; step 250, corresponding to the second stage, inputting the second voltage to the pixel transistor 10 row by row; step 260, corresponding to the second stage, after obtaining the second voltage row by row, continue to keep the pixel transistor 10 in a closed state; wherein, the duration of the second stage is twice the duration of the first stage.

[0088] Furthermore, if Figure 7 , Figure 7 It is a schematic diagram of the seventh embodiment of the display screen electrical measurement screen leakage current test method in the present invention, and step 400 also includes: step 440, using G1, G2, ..., Gn gate scanning drive line 20 in the fourth stage of the driving timing to keep the pixel transistor in a closed state row by row; step 450, corresponding to the fourth stage, inputting the first voltage to the pixel transistor 10 row by row; step 460, corresponding to the fourth stage, after obtaining the first voltage row by row, continue to keep the pixel transistor 10 in a closed state; wherein, the duration of the fourth stage is twice the duration of the third stage.

[0089] The circulation principle of this embodiment can be, for example, Fig. 9 , Fig. 9 This is a schematic diagram of the driving timing of the display screen electrical measurement screen leakage current test in the present invention:

[0090] In the first frame, G1, G2, etc. Gn are gate scanning drive lines 20, which drive to turn on the transistor row by row, and Vdata is charged to the pixel TFT transistor, and then the transistor is turned off row by row;

[0091] In the second frame, the gate scanning lines G1 to Gn continue to maintain a low level, that is, the pixel transistor 10 is in the off state. At this time, Vdata gives an opposite voltage state. If the voltage of Vdata is +5V when charging before, it is -5V at this time. This function is mainly to give an opposite voltage to the pixel transistor 10 in the off state. If the characteristics of the pixel transistor 10 are poor, such as a large leakage current, the positive polarity voltage of the pixel capacitor will leak to the negative polarity voltage of Vdata, and the display screen will appear dark.

[0092] In the third frame, each state is the same as the second frame. The purpose of adding this frame is to continue to increase the reverse voltage input of the pixel transistor 10. If there is leakage current, the screen will appear darker.

[0093] Similarly, in the fourth frame, G1 to Gn continue to be turned on row by row, and Vdata charges a negative voltage to the pixel transistor 10, and then G1 to Gn are turned off row by row. In the fifth frame, Vdata performs a leakage test on the voltage opposite to that of the fourth frame. The sixth frame is a further leakage current test screen.

[0094] After that, the first frame to the sixth frame will be cycled. If the transistor leakage current is large and the characteristics are poor, the screen will alternate between light and dark and flicker. In this case, the display screen has a large leakage current and is selected and no longer enters the post-process.

[0095] In this embodiment, the first stage and the third stage both maintain the duration of one frame of image, the second stage and the fourth stage maintain the duration of two frames of image, the input voltage is the first voltage and the second voltage alternately, and in the second stage and the fourth stage, voltages of opposite polarity of the duration of two frames of image are continuously input. If the transistor leakage current is large and the characteristics are poor, the displayed image will become darker, and the screen will alternate between light and dark and flicker more obviously, making it easier for users to pick out defective products.

[0096] Example 3

[0097] like Figure 8 , Figure 8 1 is a schematic diagram of a first embodiment of a display screen electrical measurement screen leakage current test system in the present invention; a display screen electrical measurement screen leakage current test system, using the test method of the first aspect, includes a pixel transistor 10, a scanning drive line 20, a voltage input unit 30, a control unit 40, and a display unit 50;

[0098] The row scanning drive line 20 is connected to the gate of each row of pixel transistors 10, the voltage input unit 30 is connected to the drain of each column of pixel transistors 10, and the source of the pixel transistor 10 is connected to the capacitor and then grounded; the control unit 40 is connected to the scanning drive line 20 and the voltage input unit 30 respectively; the display unit 50 is connected to the control unit 40, and is used to display the status screen of different input voltages; the control unit 40 is used to output the working timing of each row of pixel transistors 10 to control the pixel transistors 10 to turn on or off; the voltage input unit 30 is used to input the first voltage or the second voltage to the pixel transistor 10 according to the working timing. The first voltage is a forward voltage, and the second voltage is a reverse voltage.

[0099] The display screen electrical measurement screen leakage current test method and system described in the present invention can make the display screen display pictures of different brightness by inputting forward voltage and reverse voltage to each transistor pixel in the driving sequence. If the transistor leakage current is large and the characteristics are poor, the screen will be alternately displayed with light and dark alternation and flickering, so that process personnel can easily select unqualified display screen products, which solves the problem of existing display screen electrical measurement, too many electrical measurement screens, resulting in too long electrical measurement time, thereby leading to reduced shipments.

[0100] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for testing leakage current of a display screen, characterized in that: include: Step 100: inputting a first voltage to each transistor pixel in the first stage of the driving sequence, so that the display screen displays a first picture; Step 200, inputting a second voltage to each transistor pixel in the second stage of the driving sequence, so that the display screen displays a second picture; Step 300: inputting a second voltage to each transistor pixel in the third stage of the driving sequence, so that the display screen displays a third picture; Step 400, charging each transistor pixel with a first voltage in the fourth stage of the driving sequence, so that the display screen displays a fourth picture; Step 500: Determine whether the display screen is a qualified product by comparing the brightness of the first picture, the second picture, the third picture, and the fourth picture; The first and third stages of the driving sequence turn on the transistors row by row and turn off the transistors row by row after inputting the corresponding voltages, the second and fourth stages of the driving sequence turn off the transistors, and: the first and third stages input the first and second voltages respectively; The second stage and the fourth stage input the second voltage and the first voltage respectively; The first voltage and the second voltage have opposite polarities.

2. The display screen electrical measurement screen leakage current testing method according to claim 1, characterized in that: The step 100 includes: step 110, using G1, G2, ..., Gn gate scanning drive lines to turn on transistors row by row in the first stage of the driving sequence; Step 120, corresponding to the first stage, inputting a first voltage to the pixel transistors row by row; Step 130 , corresponding to the first stage, after acquiring the first voltage row by row, the pixel transistors are turned off row by row.

3. The display screen electrical measurement screen leakage current testing method according to claim 2 is characterized in that: The step 200 includes: step 210, using G1, G2, ..., Gn gates to scan the drive lines in the second stage of the driving sequence, and keeping the pixel transistors in a closed state row by row; step 220, corresponding to the second stage, inputting a second voltage to the pixel transistors row by row; Step 230, corresponding to the second stage, after acquiring the second voltage row by row, the pixel transistor continues to be turned off; The duration of the second stage is equal to the duration of the first stage.

4. The display screen electrical measurement screen leakage current testing method according to claim 2, characterized in that: The step 200 further includes: step 240, using the gates G1, G2, ..., Gn to scan the driving lines in the second stage of the driving sequence, and keeping the pixel transistors in a closed state row by row; step 250, corresponding to the second stage, inputting a second voltage to the pixel transistors row by row; Step 260, corresponding to the second stage, after acquiring the second voltage row by row, the pixel transistor continues to be turned off; The duration of the second stage is twice as long as the duration of the first stage.

5. The display screen electrical measurement screen leakage current testing method according to claim 4, characterized in that: The step 300 includes: step 310, in the third stage of the driving sequence, using the gate scanning driving lines G1, G2, ..., Gn to turn on the transistors row by row; Step 320, corresponding to the third stage, inputting a second voltage to the pixel transistors row by row; Step 330 , corresponding to the third stage, after acquiring the second voltage row by row, the pixel transistors are turned off row by row.

6. The display screen electrical measurement screen leakage current testing method according to claim 5, characterized in that: The step 400 includes: step 410, using G1, G2, ..., Gn gates to scan the drive lines in the fourth stage of the driving sequence, and keeping the pixel transistors in a closed state row by row; step 420, corresponding to the fourth stage, inputting a first voltage to the pixel transistors row by row; Step 430, corresponding to the fourth stage, after acquiring the first voltage row by row, the pixel transistor continues to be turned off; The duration of the fourth stage is equal to the duration of the third stage.

7. The display screen electrical measurement screen leakage current testing method according to claim 5, characterized in that: The step 400 further includes: step 440, in the fourth stage of the driving sequence, using the gates G1, G2, ..., Gn to scan the driving lines, and keeping the pixel transistors in a closed state row by row; step 450, corresponding to the fourth stage, inputting the first voltage to the pixel transistors row by row; Step 460, corresponding to the fourth stage, after acquiring the first voltage row by row, the pixel transistor continues to be turned off; The duration of the fourth stage is twice that of the third stage.

8. The display screen electrical measurement screen leakage current testing method according to any one of claims 1 to 7, characterized in that: The first voltage is a forward voltage, and the second voltage is a reverse voltage.

9. A display screen electrical measurement screen leakage current test system, using the test method of claim 8, characterized in that: Includes: pixel transistor; Scan drive line; Voltage input unit; Control unit; Display unit; The scanning driving line is connected to the gate of each row of the pixel transistors, the voltage input unit is connected to the drain of each column of the pixel transistors, and the source of the pixel transistor is connected to the capacitor and then grounded; The control unit is connected to the scan drive line and the voltage input unit respectively; The display unit is connected to the control unit and is used to display status pictures of different input voltages; The control unit is used to output the working timing of each row of pixel transistors to control the pixel transistors to turn on or off; The voltage input unit is used to input a first voltage or a second voltage to the pixel transistor according to a working sequence.

10. The display screen electrical measurement screen leakage current test system according to claim 9, characterized in that: The first voltage is a forward voltage, and the second voltage is a reverse voltage.

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