Test accurate light source thermometers

Abstract

The present application relates to the technical field of light source, disclose a test accurate light source heat meter, including base and upper pressing plate, the base forms the test area of placing group light source;Group light source includes light source, a plurality of through holes are arranged in the base, a plurality of conductive pins are arranged below the base, the upper end of the conductive pin is placed in the lower part of the through hole, a heating element is arranged in the base;When the group light source is placed on the test area, the upper pressing plate moves downward and presses on the group light source and the base, drives the base to move downward, the upper end of the conductive pin passes through the through hole and extends into the test area, and abuts against the positive and negative poles of the light source;When the upper pressing plate moves upward, the upper pressing plate is separated from the pressing on the group light source and the base, the base moves upward and resets, and the upper end of the conductive pin is located in the lower part of the through hole;The test accurate light source heat meter tests the electrical performance of the light source, the welding is loose, the heated expansion is disconnected, the unqualified light source can be tested in advance, and the test accurate effect is realized.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of light sources, in particular to a light source thermal tester with accurate testing. BACKGROUND

[0002] A light source is a light emitting element in various lamps, and its performance directly affects the performance of the lamps. The light source generally includes a substrate and a chip arranged on the substrate, the chip is electrically connected with the substrate, and then fluorescent glue is applied on the substrate, the fluorescent glue wraps the plurality of chips, and the light emitted by the chip is transmitted through the fluorescent glue.

[0003] After the light source is manufactured, the power-on performance of the light source needs to be tested to determine whether the light source can be normally used.

[0004] In the prior art, after the light source is manufactured, the positive and negative electrodes of the light source are connected for power-on to test the power-on performance of the light source, but the welding lines on the substrate of some light sources are not stable or have a phenomenon of loose welding, so although the power-on performance is not a problem in the testing process, the welding position of the welding line is easy to break in the use process, and these cannot be tested in the existing tester, and the existing tester cannot achieve accurate testing. SUMMARY

[0005] The present application relates to the technical field of light sources, in particular to a light source thermal tester with accurate testing.

[0006] The present application is realized in that the light source thermal tester with accurate testing comprises a bottom base moving up and down and an upper pressing plate moving up and down relative to the bottom base, the top of the bottom base is recessed downward to form a test area for placing groups of light sources, the test area is arranged upward, and the upper pressing plate is located above the test area; the groups of light sources comprise a plurality of light sources arranged in a dot matrix, the light source has a substrate, and the substrate is provided with positive and negative electrodes.

[0007] A plurality of through holes are arranged in the bottom base, the through holes pass through the bottom base up and down, and the through holes pass upward to the test area; a plurality of conductive pins are arranged below the bottom base, the lower ends of the conductive pins are fixedly arranged, the upper ends of the conductive pins are arranged in the lower part of the through holes, the height of the conductive pins is greater than the height of the through holes; and a heating element is arranged in the bottom base.

[0008] When the group of light sources is placed on the test area, the upper pressing plate moves downward and presses on the group of light sources and the base, driving the base to move downward, the upper end of the conductive needle extends into the test area through the through hole and abuts against the positive and negative poles of the light source; when the upper pressing plate moves upward, the upper pressing plate is separated from the group of light sources and the base, the base moves upward to reset, and the upper end of the conductive needle is located in the lower part of the through hole.

[0009] Further, the heating element is a heating sheet, the heating sheet includes an abutting part covering the test area and an embedded part embedded in the base, the embedded part is formed at the outer periphery of the abutting part, the abutting part is provided with a plurality of hollowed-out areas, and the plurality of hollowed-out areas are respectively communicated with the plurality of through holes in an up-down direction; when the group of light sources is placed in the test area, the substrate of the light source abuts on the abutting part, and the positive and negative poles are arranged opposite to the hollowed-out areas.

[0010] Further, the outer periphery of the test area has a longitudinally arranged outer peripheral side wall, the bottom of the test area is provided with an elastic strip, the elastic strip is arranged along the circumferential direction of the test area, a curved ring is formed between the embedded part and the abutting part, the curved ring is arched upward in a curved shape, and the curved ring encloses a receiving cavity with an opening arranged downward; the elastic strip is embedded in the receiving cavity.

[0011] When the upper pressing plate moves downward and abuts on the curved ring, the curved ring and the elastic strip are deformed downward, driving the abutting part to arch upward; when the upper pressing plate moves upward and is separated from the curved ring, the curved ring and the elastic strip reset upward, driving the abutting part to reset downward.

[0012] Further, the upper pressing plate includes a bottom plate, an intermediate plate and a top plate, the bottom plate is connected to the bottom of the intermediate plate, the top plate is arranged above the intermediate plate, and the top plate and the intermediate plate are connected by a plurality of longitudinally arranged connecting shafts; the top plate is connected with a driving structure, and the driving structure drives the upper pressing plate to move up and down relative to the test area.

[0013] When the driving structure drives the upper pressing plate to move downward, the bottom plate abuts on the group of light sources and the base, and drives the base to move downward.

[0014] Further, the bottom plate has an abutting surface arranged toward the test area, the abutting surface is covered with an elastic layer, and the elastic layer is attached with a heat-conducting sheet; when the upper pressing plate moves downward, the heat-conducting sheet abuts on the group of light sources and the base, and presses downward on the curved ring to deform the curved ring.

[0015] Further, the bottom of the heat-conducting sheet is provided with a limiting groove, which is arranged in a surrounding manner, the depth of the limiting groove is less than the arching height of the bending ring, and the width of the limiting groove is greater than the width of the bending ring; when the upper pressing plate moves downward, the bending ring is embedded in the limiting groove, and the upper pressing plate presses the bending ring to be downwardly recessed and deformed in the limiting groove.

[0016] Further, an annular space is formed between the bending ring and the outer circumferential sidewall of the test area, which is arranged in a circumferential surrounding manner along the test area.

[0017] Further, a transition ring is arranged between the outer circumference of the bending ring and the embedded part, which abuts against the bottom of the annular space; the heat-conducting sheet extends downwardly with an embedded ring, which is arranged in a surrounding manner.

[0018] When the upper pressing plate moves downward, the heat-conducting sheet abuts against the group of light sources and the base, the embedded ring is embedded in the annular space and presses the transition ring from top to bottom.

[0019] Further, the upper surface of the transition ring is provided with a plurality of raised ribs, which are arranged in a circumferential interval manner along the transition ring, and extend between the embedded part and the bending ring.

[0020] Further, the light source thermal tester with high test accuracy comprises a frame, the base is movably arranged on the frame, the lower end of the conductive pin is connected to the frame, and the upper end of the conductive pin extends upwardly; the frame is provided with a buffer shaft, and the outer circumference of the buffer shaft is provided with a spring.

[0021] The base is provided with a blind hole with a bottom opening, the upper end of the buffer shaft is movably arranged in the blind hole, and has a buffer interval with the top of the blind hole; the lower end of the spring is fixedly connected to the frame, and the upper end of the spring extends into the blind hole and abuts against the top of the blind hole.

[0022] When the upper pressing plate moves downward and abuts against the base, the base moves downward, the spring is compressed, the upper end of the conductive pin extends into the test area through the through hole and abuts against the positive and negative electrodes of the light source; when the upper pressing plate moves upward, the spring drives the base to reset upwardly.

[0023] Compared with existing technologies, this invention provides an accurate thermal tester for light sources. A group of light sources is placed on the test area, and an upper pressure component is moved downwards until it presses against the group of light sources and the base. The base moves downwards under pressure until a conductive needle passes through a through-hole, extends into the test area, and presses against the positive and negative electrodes of the light source. This allows for testing the electrical performance of the light source. The operation is simple, and multiple light sources can be tested simultaneously. During the test, some loosely welded areas will expand and break due to heat, thus identifying light sources with substandard welds in advance, achieving accurate testing results. Attached Figure Description

[0024] Figure 1 This is a front view schematic diagram of the accurate thermal tester for light sources provided by the present invention;

[0025] Figure 2 This is a front view schematic diagram of the driving structure provided by the present invention;

[0026] Figure 3 This is a cross-sectional schematic diagram showing the arrangement between the base plate and the base provided by the present invention;

[0027] Figure 4 yes Figure 3 Enlarged diagram of point A in the diagram. Detailed Implementation

[0028] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0029] The implementation of the present invention will be described in detail below with reference to specific embodiments.

[0030] In the accompanying drawings of this embodiment, the same or similar reference numerals correspond to the same or similar components. In the description of this invention, it should be understood that if terms such as "upper," "lower," "left," and "right" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, they are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, the terms used to describe positional relationships in the accompanying drawings are only for illustrative purposes and should not be construed as limiting this patent. For those skilled in the art, the specific meaning of the above terms can be understood according to the specific circumstances.

[0031] Reference Figures 1-4 The image shown is a preferred embodiment of the present invention.

[0032] The test accurate light source thermal tester comprises a base 200 moving up and down and an upper pressing plate moving up and down relative to the base 200, the top of the base 200 is concave downward to form a test area 202 for placing a group of light sources, the test area 202 is arranged upward, and the upper pressing plate is located above the test area 202; the group of light sources comprises a plurality of light sources arranged in a dot matrix, and each light source has a substrate provided with positive and negative poles.

[0033] A plurality of through holes are arranged in the base 200, the through holes pass through the base 200 up and down, and the through holes pass upward to the test area 202; a plurality of conductive pins 201 are arranged below the base 200, the lower ends of the conductive pins 201 are fixedly arranged, the upper ends of the conductive pins 201 are arranged in the lower part of the through holes, the height of the conductive pins 201 is greater than the height of the through holes; and a heating element is arranged in the base 200.

[0034] When the upper pressing plate is not pressed downward, the upper ends of the conductive pins 201 are arranged in the lower part of the through holes and do not pass through the through holes to the test area 202. The heating element can be heated by electrification, and the heating element can be connected with an external power supply through a connecting wire to realize electrification heating.

[0035] When the group of light sources is placed on the test area 202, the upper pressing plate moves downward and presses the group of light sources and the base 200, drives the base 200 to move downward, the upper ends of the conductive pins 201 pass through the through holes and extend into the test area 202 to abut against the positive and negative poles of the light sources; when the upper pressing plate moves upward, the upper pressing plate is separated from the group of light sources and the base 200, the base 200 moves upward to reset, and the upper ends of the conductive pins 201 are arranged in the lower part of the through holes.

[0036] The test accurate light source thermal tester provided above can place the group of light sources on the test area 202, move the upper pressing element downward until the upper pressing element presses the group of light sources and the base 200, the base 200 is pressed downward until the conductive pins 201 pass through the through holes and extend into the test area 202 and abut against the positive and negative poles of the light sources, so that the electrification performance of the light sources can be tested, the operation is simple, the simultaneous testing of a plurality of light sources can be realized, some parts with loose welding will be expanded and disconnected during the testing process, so that the light sources with unqualified welding can be tested in advance, and the test accuracy can be realized.

[0037] The heating element is a heating sheet, which comprises an embedded part 502 embedded into the base 200 and an abutting part 503 covering the test area 202, the embedded part 502 is formed at the outer periphery of the abutting part 503, the abutting part 503 is provided with a plurality of hollowed-out areas, and the plurality of hollowed-out areas are respectively communicated with the plurality of through holes in an up-down direction; when the group light source is placed in the test area 202, the substrate of the light source abuts on the abutting part 503, and the positive and negative electrodes are arranged opposite to the hollowed-out areas.

[0038] In this way, the substrate of the light source directly abuts on the abutting part 503, so that the light source can be more directly contacted with the heat source, the test effect is improved, and the test result is more accurate.

[0039] The outer periphery of the test area 202 is provided with a longitudinally arranged outer peripheral side wall, the bottom of the test area 202 is provided with an elastic strip 504, the elastic strip 504 is arranged along the circumferential direction of the test area 202, a curved ring 505 is formed between the embedded part 502 and the abutting part 503, the curved ring 505 is arched upward in a curved shape, the curved ring 505 encloses a receiving cavity with an opening arranged downward, the elastic strip 504 is embedded in the receiving cavity, and the elastic strip 504 abuts on the inner side wall of the receiving cavity.

[0040] When the upper pressing plate moves downward and abuts on the curved ring 505, the curved ring 505 and the elastic strip 504 are deformed downward, and the abutting part 503 is arched upward; when the upper pressing plate moves upward and is separated from the curved ring 505, the curved ring 505 and the elastic strip 504 are reset upward, and the abutting part 503 is reset downward.

[0041] After the upper pressing plate moves downward, the curved ring 505 is deformed by abutting on the curved ring 505, and then the elastic strip 504 is deformed, the deformation of the curved ring 505 can drive the abutting part 503 to arch upward, so that the abutting part 503 is more stably and closely contacted with the light source. When the upper pressing plate is separated from the curved ring 505, the curved ring 505 is reset upward under the elastic action of the elastic strip 504.

[0042] In the embodiment, the upper pressing plate comprises a bottom plate 103, an intermediate plate 102 and a top plate 101, the bottom plate 103 is connected to the bottom of the intermediate plate 102, the top plate 101 is arranged above the intermediate plate 102, and the top plate 101 and the intermediate plate 102 are connected by a plurality of longitudinally arranged connecting shafts 104; the top plate 101 is connected with a driving structure, the driving structure drives the upper pressing plate to move upward and downward relative to the test area 202; when the driving structure drives the upper pressing plate to move downward, the bottom plate 103 abuts on the group light source and the base 200, and drives the base 200 to move downward.

[0043] The driving structure drives the movement of the top plate 101, the intermediate plate 102 and the bottom plate 103, so that the structure is simpler and the operation is more convenient.

[0044] The driving structure comprises a driving shaft 106 arranged longitudinally, the lower end of the driving shaft 106 is connected with the top plate 101, the upper end of the driving shaft 106 is hinged with a swing piece 400, the swing piece 400 is connected with a handle 401; when the handle 401 drives the swing piece 400 to swing, the swing piece 400 drives the driving shaft 106 to move up and down. In this way, only the handle 401 needs to be swung up and down, and the up and down movement of the driving shaft 106 can be realized correspondingly.

[0045] A guide sleeve 107 is arranged above the top plate 101, the driving shaft 106 movably passes through the guide sleeve 107, so that the longitudinal movement of the driving shaft 106 is ensured.

[0046] In the embodiment, the bottom plate 103 has an abutting surface arranged towards the test area 202, the abutting surface is covered with an elastic layer 401, and the elastic layer 401 is attached with a heat-conducting sheet 402; when the upper pressing plate moves downward, the heat-conducting sheet 402 abuts on the group of light sources and the base 200, and presses and deforms the curved ring 505 downward.

[0047] By arranging the heat-conducting sheet 402, and when the upper pressing plate abuts on the base 200, the heat-conducting sheet 402 also generates heat, and the heat-conducting sheet directly abuts on the group of light sources, so that the whole light source is uniformly heated up and down, and the test is more accurate.

[0048] The bottom of the heat-conducting sheet 402 is provided with a limiting groove 404, the limiting groove 404 is arranged in a surrounding manner, the depth of the limiting groove 404 is less than the arching height of the curved ring 505, and the width of the limiting groove 404 is greater than the width of the curved ring 505; when the upper pressing plate moves downward, the curved ring 505 is embedded in the limiting groove 404, and the upper pressing plate presses and deforms the curved ring 505 downward in the limiting groove 404.

[0049] In this way, when the upper pressing plate presses the curved ring 505, the curved ring 505 is embedded in the limiting groove 404, the limiting groove 404 can guide the deformation direction of the curved ring 505 and the elastic strip 504, and the height of the limiting groove 404 is less than the arching height of the curved ring 505, so that the curved ring 505 can be pressed and deformed elastically. The width of the limiting groove 404 is greater than the width of the curved ring 505, so that the curved ring 505 and the elastic strip 504 have sufficient deformation width, can realize transverse deformation in the limiting groove 404, and facilitate the arching of the abutting part 503.

[0050] The curved ring 505 and the outer circumferential side wall of the test area 202 form an annular space 501, the annular space 501 is arranged in a surrounding manner along the circumference of the test area 202, and the annular space 501 can ensure that the curved ring 505 has sufficient transverse deformation space.

[0051] In the embodiment, the transition ring 506 is arranged between the outer periphery of the bending ring 505 and the embedded portion 502, and abuts against the bottom of the annular space 501. The heat-conducting sheet 402 extends downwardly with the embedded ring 403 arranged in a surrounding manner. When the upper pressing plate moves downwardly, the heat-conducting sheet 402 abuts against the group of light sources and the base 200, the embedded ring 403 is embedded in the annular space 501 and presses against the transition ring 506 from top to bottom.

[0052] In this way, under the limitation of the transition ring 506, the bending ring 505 does not pull the embedded portion 502 greatly during the bending deformation, so as to avoid pulling the connection of the embedded portion 502. The embedded ring 403 presses against the transition ring 506, so as to realize the contact between the heat-conducting sheet 402 and the heat-generating sheet.

[0053] The upper surface of the transition ring 506 is provided with a plurality of raised ribs 507 protruding upwardly, the raised ribs 507 are arranged at intervals along the circumference of the transition ring 506 and extend between the embedded portion 502 and the bending ring 505. In this way, the plurality of raised ribs 507 can further stabilize the transition ring 506 and reduce the extrusion deformation of the transition ring 506, so as to further avoid the bending deformation of the bending ring 505 and the pulling of the embedded portion 502.

[0054] In the embodiment, the light source thermal tester with high testing accuracy comprises a frame, the base 200 is movably arranged on the frame, the lower end of the conductive pin 201 is connected to the frame, and the upper end of the conductive pin 201 extends upwardly; the frame is provided with a buffer shaft, and the outer periphery of the buffer shaft is sleeved with a spring;

[0055] The base 200 is provided with a blind hole with a bottom opening, the upper end of the buffer shaft is movably arranged in the blind hole and has a buffer interval with the top of the blind hole; the lower end of the spring is fixedly connected to the frame, the upper end of the spring extends into the blind hole and abuts against the top of the blind hole;

[0056] When the upper pressing plate moves downwardly and abuts against the base 200, the base 200 moves downwardly, the spring is compressed, the upper end of the conductive pin 201 extends into the testing area 202 and abuts against the positive and negative electrodes of the light source; when the upper pressing plate moves upwardly, the spring drives the base 200 to move upwardly.

[0057] By arranging the spring between the base 200 and the frame, the spring can move up and down relative to the frame. When the base 200 moves downwardly, the spring is compressed, and the conductive pin 201 can be exposed in the testing area 202 and abut against the positive and negative electrodes of the light source. When the base 200 is not under pressure, the spring restores the deformation and drives the base 200 to move upwardly.

[0058] The above merely describes preferred embodiments of the present application, and is not used to limit the present application, any modification, equivalent replacement and improvement within the spirit and principle of the present application should be included in the protection scope of the present application.

Claims

1. A test accurate light source thermal meter characterized by, The application relates to a testing device for a group of light sources, which comprises a base and an upper pressing plate, the top of the base is concave downward to form a testing area for placing the group of light sources, the testing area is arranged upward, and the upper pressing plate is arranged above the testing area; the group of light sources comprises a plurality of light sources arranged in a dot matrix mode, the light source has a substrate, and the substrate is provided with positive and negative poles. A plurality of through holes are arranged in the base, the through holes pass through the base upward and downward, and the through holes pass through to the testing area upward; a plurality of conductive pins are arranged below the base, the lower ends of the conductive pins are fixedly arranged, the upper ends of the conductive pins are arranged in the lower part of the through holes, and the height of the conductive pins is greater than the height of the through holes; and a heating element is arranged in the base. When the group of light sources is placed on the testing area, the upper pressing plate moves downward and presses the group of light sources and the base, drives the base to move downward, the upper ends of the conductive pins pass through the through holes and extend into the testing area to abut against the positive and negative poles of the light source; when the upper pressing plate moves upward, the upper pressing plate is separated from the group of light sources and the base, the base moves upward to reset, and the upper ends of the conductive pins are arranged in the lower part of the through holes. The heating element is a heating sheet, the heating sheet comprises an abutting part covering the testing area and an embedded part embedded in the base, the embedded part is formed at the outer periphery of the abutting part, the abutting part is provided with a plurality of hollow areas, the plurality of hollow areas are respectively communicated with the plurality of through holes upward and downward, when the group of light sources is placed in the testing area, the substrate of the light source abuts against the abutting part, and the positive and negative poles are arranged opposite to the hollow areas. The outer periphery of the testing area is provided with a longitudinally-arranged outer periphery side wall, the bottom of the testing area is provided with an elastic strip, the elastic strip is arranged along the circumferential direction of the testing area, a curved ring is formed between the embedded part and the abutting part, the curved ring is arched upward in a curved shape, the curved ring is surrounded to form a containing cavity with an opening arranged downward, and the elastic strip is embedded in the containing cavity. When the upper pressing plate moves downward and abuts against the curved ring, the curved ring and the elastic strip are deformed downward, and the abutting part is arched upward; when the upper pressing plate moves upward and is separated from the curved ring, the curved ring and the elastic strip are reset upward, and the abutting part is reset downward. The upper pressing plate comprises a bottom plate, an intermediate plate and a top plate, the bottom plate is connected to the bottom of the intermediate plate, the top plate is arranged above the intermediate plate, and the top plate and the intermediate plate are connected through a plurality of longitudinally-arranged connecting shafts; the bottom plate is provided with an abutting surface arranged toward the testing area, the abutting surface is covered with an elastic layer, and the elastic layer is attached with a heat-conducting sheet; when the upper pressing plate moves downward, the heat-conducting sheet abuts against the group of light sources and the base, and presses the curved ring to be deformed downward. The bottom of the heat-conducting sheet is provided with a limiting groove, the limiting groove is arranged in a surrounding shape, the depth of the limiting groove is smaller than the arching height of the curved ring, and the width of the limiting groove is greater than the width of the curved ring; when the upper pressing plate moves downward, the curved ring is embedded in the limiting groove, and the upper pressing plate presses the curved ring to be deformed downward in the limiting groove.

2. The test accurate optical pyrometer as claimed in claim 1, wherein, The top plate is connected with a driving structure, which drives the upper pressing plate to move up and down relative to the test area; when the driving structure drives the upper pressing plate to move downward, the bottom plate presses on the group of light sources and the base, and drives the base to move downward.

3. The test accurate optical pyrometer as claimed in claim 2, wherein, An annular gap is formed between the curved ring and the outer circumferential sidewall of the test area, and the annular gap is arranged along the circumference of the test area.

4. The test accurate optical pyrometer as claimed in claim 3, wherein, The outer periphery of the curved ring and the inner embedding part have a transition ring, which abuts the bottom of the annular gap; the heat-conducting sheet extends downward with an embedded ring, which is arranged in a ring shape. When the upper pressing plate moves downward, the heat-conducting sheet abuts the group of light sources and the base, the embedded ring is embedded in the annular gap, and abuts the transition ring from top to bottom.

5. The test accurate optical pyrometer as claimed in claim 4, wherein, The upper surface of the transition ring is convexly provided with a plurality of raised ribs, which are arranged along the circumference of the transition ring, and the raised ribs extend between the inner embedding part and the curved ring.

6. A test accurate bolometer as claimed in any one of claims 1 to 5, wherein, The accurate light source thermal tester comprises a frame, the base is movably arranged on the frame, the lower end of the conductive needle is connected to the frame, and the upper end of the conductive needle extends upward; the frame is provided with a buffer shaft, and the outer periphery of the buffer shaft is sleeved with a spring. The base is provided with a blind hole with a bottom opening, the upper end of the buffer shaft is movably arranged in the blind hole, and the upper end of the buffer shaft has a buffer gap with the top of the blind hole; the lower end of the spring is fixedly connected to the frame, the upper end of the spring extends into the blind hole, and abuts the top of the blind hole; When the upper pressing plate moves downward and abuts the base, the base moves downward, the spring is compressed, the upper end of the conductive needle passes through the through hole and extends into the test area, and abuts the positive and negative electrodes of the light source; when the upper pressing plate moves upward, the spring drives the base to reset upward.

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