Automatic Testing Method and Device for Transducer Pairing Performance under Variable Voltage Conditions

Abstract

An embodiment of the present application provides a method for automatically testing the pairing performance of transducers under variable pressure conditions. The method includes: obtaining the static capacitance C0 and impedance characteristic curves of each transducer in a pair of transducers in a test pipeline under different environmental parameters, where the environmental parameters include the pressure and flow rate in the test pipeline; determining the impedance admittance circle diagrams of the susceptance and conductance of each transducer under each environmental parameter according to the static capacitance, impedance characteristic curves of each transducer and the equivalent circuit model of the transducer circuit, so as to determine the resonance frequency, half-power frequency, bandwidth, quality factor, dynamic resistance, dynamic capacitance and dynamic inductance corresponding to each transducer and each environmental parameter; for each environmental parameter, comparing the pairing parameters of the pair of transducers under the environmental parameter, and when the difference between the pairing parameters of the two transducers in the pair of transducers under all environmental parameters does not exceed a preset threshold, confirming that the pairing parameters of the two transducers are consistent.

Description

Technical Field

[0001] This application belongs to the field of transducer devices, and specifically relates to an automatic test method and device for the pairing performance of transducers under variable pressure conditions. Background Art

[0002] An ultrasonic transducer is a device that uses the piezoelectric effect of piezoelectric crystals to convert the mechanical vibration generated by ultrasonic waves into an electrical signal or generates mechanical vibration under the drive of an electric field to emit ultrasonic waves. An ultrasonic flowmeter usually consists of one or more transducer pairs. If the pairing performance of the two transducers in the transducer pair is poor, there will be a mismatch between the two transducers in the transducer pair, resulting in inaccurate test results in the ultrasonic flowmeter. However, the prior art has not established an evaluation standard for the use characteristics, technical indicators, and methods of the transducers used in ultrasonic flowmeters. There is a lack of research on the performance matching and test devices for the transducer pairs used in ultrasonic flowmeters in China, resulting in the inability to carry out comprehensive performance matching work on the transducer pairs used in ultrasonic flowmeters. Summary of the Invention

[0003] In view of the above-mentioned defects or deficiencies in the prior art, embodiments of this application provide an automatic test method and device for the pairing performance of transducers under variable pressure conditions, which can test the pairing parameters of the transducer pair to determine whether the pairing parameters of the two transducers in the transducer pair are consistent, so as to improve the test accuracy of the ultrasonic flowmeter.

[0004] To achieve the above object, in the first aspect of this application, an automatic test method for the pairing performance of transducers under variable pressure conditions is provided, including:

[0005] Obtaining the static capacitance C 0 and impedance characteristic curves of each transducer in the transducer pair in the test pipeline, where the environmental parameters include the pressure and flow rate in the test pipeline;

[0006] Determining the impedance admittance circle diagram of the susceptance and conductance of each transducer at each environmental parameter according to the static capacitance and impedance characteristic curves of each transducer, so as to determine the resonance frequency and half-power frequency corresponding to each transducer and each environmental parameter;

[0007] Determining the bandwidth BW and quality factor Q of each transducer at each environmental parameter according to the resonance frequency and half-power frequency of each transducer;

[0008] Determining the dynamic resistance R m and dynamic capacitance C m and dynamic inductance L m of each transducer at each environmental parameter through the circuit equivalent model and impedance admittance circle diagram;

[0009] For each environmental parameter, compare the pairing parameters of the transducer pair under the environmental parameter. The pairing parameters include bandwidth BW, quality factor Q, dynamic resistance R m , dynamic capacitance C m , dynamic inductance L m , static capacitance C 0 , and resonance frequency;

[0010] When the difference between the pairing parameters of the two transducers in the transducer pair under all environmental parameters does not exceed the preset threshold, confirm that the pairing parameters of the two transducers are consistent.

[0011] In an embodiment of the present application, the method further includes determining the impedance admittance circle diagram of the susceptance and conductance of each transducer according to the static capacitance and impedance characteristic curve of each transducer, including: determining the susceptance B and conductance G at different frequencies according to the impedance characteristic curve; for each transducer, determining the impedance admittance circle diagram of the transducer according to the susceptance B, conductance G and static capacitance of the transducer.

[0012] In an embodiment of the present application, the expression of the impedance admittance circle diagram is as shown in formula (1):

[0013]

[0014] where G is conductance, B is susceptance, R m is dynamic resistance, ω is angular frequency, C 0 is the static capacitance of the transducer.

[0015] In an embodiment of the present application, calculate the dynamic resistance R according to formula (2) m , calculate the dynamic inductance L according to formula (3) m , calculate the dynamic capacitance C according to formula (4) m ;

[0016] R m = 1 / G max Formula (2);

[0017]

[0018] where G max is the maximum value of conductance G, f 1 , f 2 are both half-power point frequencies, which are the frequencies corresponding to the maximum susceptance B and the minimum susceptance B respectively, ω 2 , ω 1 are the angular frequencies corresponding to f 1 and f 2 respectively, f s is the series resonance frequency, which is the frequency corresponding to the maximum conductance, ω sis f s The corresponding angular frequency.

[0019] In an embodiment of the present application, the bandwidth BW is calculated according to formula (5), and the quality factor q is calculated according to formula (6);

[0020] BW = Δf = f 2 -f 1 Formula (5);

[0021]

[0022] wherein, f 1 , f 2 are both half-power point frequencies, which are respectively the frequency corresponding to the maximum susceptance B and the frequency corresponding to the minimum susceptance B, ω 2 , ω 1 are respectively the angular frequency corresponding to f 1 and the angular frequency corresponding to f 2 , f s is the series resonance frequency, which is the frequency corresponding to the maximum conductance, ω s is the angular frequency corresponding to f s The corresponding angular frequency.

[0023] In an embodiment of the present application, the circuit equivalent model includes: dynamic capacitance c m , dynamic inductance L m , dynamic resistance R m , static resistance R 0 and static capacitance C 0 ; the first end of the dynamic capacitance C m is connected to the first end of the dynamic inductance L m , the second end of the dynamic capacitance C m is connected to the first end of the dynamic resistance R m , the first end of the static resistance R 0 is connected to the first end of the dynamic inductance L m , the second end of the static resistance R 0 is connected to the second end of the dynamic resistance R m , the first end of the static capacitance R 0 is connected to the first end of the dynamic inductance L m , the second end of the static capacitance C 0 is connected to the second end of the dynamic resistance R m .

[0024] The second aspect of the present application provides a processor configured to execute an automatic test method for the transducer pairing performance under variable voltage conditions.

[0025] The third aspect of the present application provides an automatic testing device for the pairing performance of transducers under variable pressure conditions. The automatic testing device for the pairing performance of transducers under variable pressure conditions includes: a capacitance meter for obtaining the static capacitance of each transducer; an impedance analysis device for obtaining the impedance characteristic curve of each transducer; a pressure and flow device for changing the pressure and flow in the transducer test pipeline; and the above-mentioned processor.

[0026] In an embodiment of the present application, the pressure and flow device includes: a main pipeline, which sequentially includes a first electric ball valve, a pressure and flow sensing transmitter, a transducer fixing device, a standard flowmeter, a temperature and flow sensing transmitter, and a second electric ball valve; a boosting bypass branch, which includes a first valve and a second valve. The first end of the first valve is connected to the first electric ball valve, the second end of the first valve is connected to the first end of the second valve, and the second end of the second valve is connected to the main pipeline between the first electric ball valve and the pressure and flow sensing transmitter; a nitrogen injection branch, which includes a third valve and a fourth valve. The first end of the third valve is connected to a nitrogen storage device, the second end of the third valve is connected to the first end of the fourth valve, and the second end of the fourth valve is connected to the main pipeline between the first electric ball valve and the pressure and flow sensing transmitter; a venting branch, which includes a fifth valve and a sixth valve. The first end of the fifth valve is in contact with air, the second end of the fifth valve is connected to the first end of the sixth valve, and the second end of the sixth valve is connected to the main pipeline between the second electric ball valve and the temperature and flow sensing transmitter.

[0027] The fourth aspect of the present application provides a machine-readable medium, which stores instructions that, when executed by a machine, cause the machine to execute an automatic testing method for the pairing performance of transducers under variable pressure conditions.

[0028] Through the above technical solutions, the automatic testing device and method for the pairing performance of transducers provided by the embodiments of the present application have the following beneficial effects:

[0029] The above-mentioned automatic testing method, device, and storage medium for the pairing performance of transducers analyze the impedance of the pairing performance parameters of transducers by calibrating the parameters of each transducer under different environmental parameters, so as to obtain the pairing parameters of each transducer. According to the pairing parameters of the transducers under different environmental parameters, it can be determined whether the two transducers in the transducer pair are paired consistently, which can improve the pairing consistency of the two transducers in the transducer pair used for testing, and further improve the testing accuracy of the ultrasonic flowmeter.

[0030] Other features and advantages of the present application will be described in detail in the subsequent specific implementation section. Description of the Drawings

[0031] The accompanying drawings are used to provide a further understanding of the embodiments of the present application, and constitute a part of the specification. Together with the following specific embodiments, they are used to explain the embodiments of the present application, but do not constitute a limitation to the embodiments of the present application. In the accompanying drawings:

[0032] Figure 1 Schematically shows a flowchart of a method for automatically testing the pairing performance of transducers under variable pressure conditions according to an embodiment of the present application;

[0033] Figure 2 Schematically shows a schematic diagram of a transducer admittance circle diagram according to an embodiment of the present application;

[0034] Figure 3 Schematically shows a schematic diagram of simulating an equivalent circuit model of a piezoelectric transducer according to an embodiment of the present application;

[0035] Figure 4 Schematically shows an automatic test cabinet for the pairing performance of transducers according to an embodiment of the present application;

[0036] Figure 5 Schematically shows a flowchart of the test process of an automatic test cabinet for the pairing performance of transducers according to an embodiment of the present application;

[0037] Figure 6 Schematically shows a device for changing the pressure and flow rate of a test pipeline according to an embodiment of the present application;

[0038] Figure 7 Schematically shows an internal structure diagram of a computer device according to an embodiment of the present application. Specific Embodiments

[0039] The following details the specific embodiments of the embodiments of the present application with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are only used to illustrate and explain the embodiments of the present application, and are not used to limit the embodiments of the present application.

[0040] Figure 1 Schematically shows a flowchart of a method for automatically testing the pairing performance of transducers under variable pressure conditions according to an embodiment of the present application. As Figure 1 shown, in an embodiment of the present application, a method for automatically testing the pairing performance of transducers under variable pressure conditions is provided, including the following steps:

[0041] Step S101, obtaining the static capacitance c 0 and impedance characteristic curves of each transducer in a pair of transducers in a test pipeline, where the environmental parameters include the pressure and flow rate in the test pipeline.

[0042] The processor can obtain the static capacitance and impedance characteristic curves of each transducer, and these two sets of test data are used to calculate the inherent pairing parameters of each transducer. The static capacitance of the transducer refers to the capacitance generated by the clamping of the transducer, and the impedance characteristic curve of the transducer refers to the susceptance and conductance characteristics reflected by the impedance inside the transducer at different current frequencies. There may be a mismatch between the two transducers in the transducer pair under different pressures and flows, so it is necessary to conduct tests under various environmental parameters. The environmental parameters changed in this application include the pressure and flow rate in the test pipeline.

[0043] Step S102: Determine the impedance - admittance circle diagram of the susceptance and conductance of each transducer at each environmental parameter according to the static capacitance and impedance characteristic curves of each transducer, so as to determine the resonance frequency and half - power frequency corresponding to each transducer and each environmental parameter.

[0044] After obtaining the static capacitance and impedance characteristic curves of the transducer, the processor can calculate the impedance - admittance circle diagram of the susceptance and conductance of each transducer. According to the obtained impedance - admittance circle diagram, the processor can determine the resonance frequency and half - power frequency of each transducer. Among them, susceptance is the reciprocal of reactance, conductance is the reciprocal of resistance, and the impedance - admittance circle diagram is the relationship formula between susceptance and conductance in the transducer. The resonance frequency specifically includes series resonance frequency, parallel resonance frequency, positive resonance frequency, and anti - resonance frequency.

[0045] Step S103: Determine the bandwidth BW and quality factor Q of each transducer at each environmental parameter according to the resonance frequency and half - power frequency of each transducer.

[0046] The processor can determine the bandwidth and quality factor of each transducer according to the known resonance frequency and half - power. Each ultrasonic transducer has a bandwidth value, which is the range of the operating frequency of the transducer. The quality factor of the transducer is a quality index representing the ratio of the energy stored in the transducer to the energy lost per week.

[0047] Step S104: Determine the dynamic resistance R m , dynamic capacitance C m , and dynamic inductance L m of each transducer at each environmental parameter through the circuit equivalent model and impedance - admittance circle diagram.

[0048] The processor can obtain the dynamic resistance, dynamic capacitance, and dynamic inductance of the transducer according to the impedance - admittance circle diagram combined with the equivalent circuit of the transducer. The dynamic resistance of the transducer is mainly caused by the mechanical loss of the transducer, and also includes the load resistance in the presence of a load. The dynamic capacitance of the transducer is caused by the mechanical compliance of the transducer. The dynamic inductance of the transducer is caused by the mass of the transducer.

[0049] Step S105: For each environmental parameter, compare the pairing parameters of the transducer pair under the environmental parameter. The pairing parameters include bandwidth BW, quality factor Q, dynamic resistance R m , dynamic capacitance C m , dynamic inductance L m , static capacitance C 0 , and resonant frequency.

[0050] In an ultrasonic flowmeter, there are two transducers. First, the first transducer emits an ultrasonic signal according to the piezoelectric effect, and the second transducer receives the ultrasonic signal according to the inverse piezoelectric effect. After the second transducer receives the ultrasonic signal and obtains the corresponding parameters, the transmitting and receiving of the two transducers are swapped. The second transducer emits the ultrasonic signal, and the first transducer receives the ultrasonic signal. The consistency of the pairing parameters of the transducers directly affects the test accuracy of the ultrasonic flowmeter. Therefore, whether the pairing parameters of the two transducers are consistent is extremely important during actual use. In this application, the pairing parameters of the transducers include bandwidth, quality factor, dynamic resistance, dynamic capacitance, dynamic inductance, static capacitance, and resonant frequency. The processor will compare multiple pairing parameters of the two transducers in the transducer pair to obtain the pairing result.

[0051] Step S106: When the difference between the pairing parameters of the two transducers in the transducer pair under all environmental parameters does not exceed the preset threshold, confirm that the pairing parameters of the two transducers are consistent.

[0052] After a pairing test is completed, perform air pressure and flow control steps on the transducer test pipeline to precisely control the gas pressure and flow passing through the transducers. Specifically, the air pressure and flow control steps include: controlling the gas pressure flowing through the main pipeline by using the bypass valve and vent valve on the main pipeline to ensure that the gas can accurately flow through the transducers for detection. The flow regulating valve on the pipeline controls the gas flow rate, and the pressure gauge, thermometer, and flowmeter are placed for detecting the pressure, temperature, and flow rate. Ensure that the pressure and flow of the flowing gas can be accurately controlled, so as to realize the detection of the performance of the pairing parameters of the transducers under different pressures and flows.

[0053] The processor will compare the pairing parameters of the two transducers in the transducer pair. If the difference between each pairing parameter does not exceed the preset threshold, it can be determined that the two transducers corresponding to this transducer pair are paired consistently.

[0054] In one embodiment, the impedance - admittance circle diagram of the susceptance and conductance of each transducer determined according to the static capacitance and impedance characteristic curve of each transducer includes: determining the susceptance B and conductance G at different frequencies according to the impedance characteristic curve; for each transducer, determining the impedance - admittance circle diagram of the transducer according to the susceptance B, conductance G and static capacitance of the transducer. The processor can calculate the impedance - admittance circle diagram of the susceptance and conductance of the transducer according to the impedance characteristic curve and static capacitance of each transducer. The susceptance is the reciprocal of reactance, the conductance is the reciprocal of resistance, and the impedance - admittance circle diagram is the relational expression of susceptance and conductance in the transducer, which is circular in a two - dimensional coordinate system. When the medium is air, that is, when there is no load, according to the analysis of the circuit equivalent model:

[0055]

[0056] As can be seen from formula (7), when G m reaches the maximum value ω s is called the series - resonance angular frequency. Generally in engineering, the quality factor Q of the piezoelectric transducer m is defined as:

[0057]

[0058] Substituting formula (8) into formula (7) gives:

[0059]

[0060] It can be seen from the above formula that G m varies continuously between , and the rate of this change is determined by the quality factor Q m . According to G max , the series - resonance angular frequency ω s and the dynamic resistance R m can be determined. If the static resistance R 0 of the transducer is considered, then the change curve of G(ω) and all characteristic curves shift upward According to G min , the static resistance R 0 can be determined. According to G max , the series - resonance angular frequency ω s and the dynamic resistance R m of the transducer can be determined.

[0061]

[0062] When , X m = 0; when ω → 0, Xm → -∞; when ω → ∞, X m → +∞; X m increases monotonically with the increase of ω. According to the definition of X m of B m derivation is carried out

[0063]

[0064] It can be seen from formula (11): (1) When X m = 0 or X m → ∞, B m = 0. That is, when ω = 0, ω = ωs, ω → ∞, B(ω) has three zeros. (2) When X m = ±R m B m has an extreme value; when X m = -R m at this time When X m = +R m at this time (3) B m changes continuously between . According to the impedance characteristic curve of B(ω), when X m = ±R m According to the impedance characteristic curve of B(ω), it can be known that is the half-power point. ω 1 , ω 2 are the half-power point angular frequencies. If the static loss R 0 of the transducer is considered then the change curve of G(ω), the entire characteristic curve moves up According to G min the static loss resistance R 0 can be determined, and according to G max the series resonance angular frequency ω s and the dynamic loss resistance R m of the transducer can be determined.

[0065] In one embodiment, for the transducer pairing performance test method, the expression of the impedance admittance circle diagram is as formula (1):

[0066]

[0067] where G is the conductance, B is the susceptance, R m is the dynamic resistance, ω is the angular frequency, C 0 is the static capacitance of the transducer. According to the equivalent circuit of the transducer, the static impedance z 0 and the dynamic impedance z mFor

[0068]

[0069] The relationship between the transducer impedance Z and the transducer admittance Y is: Z = 1 / Y, and the static admittance Y can be obtained 0 and the dynamic admittance Y m For

[0070] Y 0 = jωC 0 = jB 0 Formula (14);

[0071]

[0072] Wherein, G 0 , G m respectively represent the static conductance and the dynamic conductance; B 0 , B m respectively represent the static susceptance and the dynamic susceptance. The total admittance of the transducer:

[0073] Y = Y 0 + Y m = G m + j(B 0 + B m ) = G + jB Formula (18);

[0074]

[0075] Combined with Formula (15), it can be obtained:

[0076]

[0077] That is, the expression of the impedance - admittance circle diagram as Figure 2 shown:

[0078]

[0079] Wherein, f m , f n are respectively the frequencies when the admittance amplitude is the largest and the smallest, and are called the maximum admittance frequency and the minimum admittance frequency. f s is the frequency when the conductance G is the largest, and at this frequency, L m - C m resonance occurs, and it is called the series resonance frequency; the frequency point f p is called the parallel resonance frequency. f a , f r are the frequency points when the susceptance B is 0, and are called the anti - resonance frequency and the resonance frequency. f 1 , f 2The frequencies at which the susceptance B is maximum and minimum respectively are called the half-power point frequencies. Based on the admittance curves of conductance and susceptance versus frequency, the processor calculates the admittance circle diagram.

[0080] In one embodiment, determining the dynamic resistance, dynamic capacitance, and dynamic inductance of each transducer through a circuit equivalent model and impedance admittance circle diagram includes: calculating the dynamic resistance R according to formula (2) m , calculating the dynamic inductance L according to formula (3) m , calculating the dynamic capacitance C according to formula (4) m ;

[0081] R m = 1 / G max Formula (2);

[0082]

[0083] where G max is the maximum value of conductance G, f 1 , f 2 are both half-power point frequencies, which are the frequencies corresponding to the maximum susceptance B and the minimum susceptance B respectively, ω 2 , ω 1 are the angular frequencies corresponding to f 1 and f 2 respectively, f s is the series resonance frequency, which is the frequency corresponding to the maximum conductance, ω s is the angular frequency corresponding to f s . The dynamic resistance R m , the dynamic inductance L m , and the dynamic capacitance C m are the three transducer pairing parameters, which are important parameters for confirming whether the transducers are paired. The processor calculates the admittance circle diagram of the transducer conductance and susceptance through the static capacitance of the transducer and the transducer admittance curve, and the above three pairing parameters of the transducer can be calculated according to the admittance circle diagram.

[0084] In one embodiment, determining the bandwidth and quality factor of each transducer according to the resonance frequency and half-power frequency of each transducer includes: calculating the bandwidth BW according to formula (5), and calculating the quality factor Q according to formula (6);

[0085] BW = △f = f 2 -f 1 Formula (5);

[0086]

[0087] where f 1 , f 2They are all half-power point frequencies, which are the frequencies corresponding to the maximum susceptance B and the minimum susceptance B respectively, ω 2 and ω 1 are the angular frequencies corresponding to f 1 and the angular frequency corresponding to f 2 respectively. f s is the series resonance frequency, which is the frequency corresponding to the maximum conductance. ω s is the angular frequency corresponding to f s respectively. Bandwidth and quality factor are important parameters for confirming whether transducers are paired. The admittance circle diagram of the conductance and susceptance of the transducer is calculated through the static capacitance of the transducer and the admittance curve of the transducer. The bandwidth and quality factor of the transducer can be calculated according to the admittance circle diagram.

[0088] In one embodiment, the pairing parameters between two transducers are compared. The corresponding pairing parameters of the two transducers are subtracted. When the differences of all pairing parameters do not exceed the preset threshold, the pairing of the two transducers is consistent; when there is one or more differences of pairing parameters exceeding the preset threshold, the pairing of the two transducers is inconsistent. The determination of the preset threshold is based on the required accuracy of the transducer and the influence of each parameter on the time delay in the transducer pair-shot experiment.

[0089] In one embodiment, before the transducer pairing performance test, it also includes the step of transducer pair-shot. Specifically, a transducer pair-shot experiment can be carried out to adjust the distance between the transmitter and receiver of the transducer. Each of the required paired transceiver transducers is installed at both ends of the pipeline, and the signals of the transducers are transmitted and received using the principle of time difference method. Further, a transducer pair-shot experiment can be added to obtain the time delay characteristic curve of the transducer. Subsequently, according to the influence of the transducer pairing parameters on the time delay, the threshold of the difference between the pairing parameters of the two transducers in the transducer alignment can be set.

[0090] In one embodiment, before the transducer pairing performance test, it also includes the signal transmission and acquisition steps to realize signal excitation of the transmitting transducer and information measurement and acquisition of the receiving transducer. Specifically, the signal transmission and acquisition steps include: connecting the transmitting transducer to a signal generator and a power amplifier for voltage signal excitation; connecting the receiving transducer to an amplifier and a signal collector, and at the same time connecting the signal collector to a processor to send the amplified data of the received transducer signal and the impedance characteristic parameters to the processor for analysis and processing by the processor.

[0091] For example, during the actual testing process, when it is necessary to test the pairing performance parameters of the two transducers of a transducer pair, the processor will obtain the static capacitance and impedance characteristic curves of the transducers and calculate the impedance characteristic circle diagram of the conductance and susceptance of the transducers. The processor will obtain the resonant frequency and half-power frequency of the transducer based on the impedance characteristic circle diagram, and then obtain the bandwidth and quality factor of the transducer. The processor obtains the dynamic resistance, dynamic capacitance, and dynamic inductance of the transducer according to the circuit equivalent model and impedance characteristic circle diagram of the transducer. The processor obtains the pairing parameters of the other transducer of the transducer pair and compares the pairing parameters of the two transducers. Change the internal pressure and flow rate of the test pipeline, and return to the step where the processor obtains the static capacitance and impedance characteristic curves of the transducers until the step where the processor compares the pairing parameters of the two transducers. Obtain the differences in the corresponding pairing parameters of the two transducers in the transducer pair under different pressures and flow rates. After obtaining the pairing parameters of the transducer pair under all preset pressures and flow rates, determine the threshold value of the corresponding pairing parameter difference according to the test accuracy requirements to be achieved by the transducer. Assume that the threshold value is 1% of the smaller pairing parameter of the two transducers. If there is a difference in one or more pairing parameters that is greater than the threshold value, then the pairing of the two transducers is inconsistent; if the differences in the pairing parameters of the two transducers do not exceed the threshold value, then it can be determined that the parameter pairing of the two transducers is consistent.

[0092] Using the above method can ensure accurate data measurement. Automatic data collection can greatly improve work efficiency, reduce work errors and work costs. In addition, testing the pairing parameters of the two transducers of the transducer pair improves the pairing consistency of the two transducers of the transducer pair used for testing and improves the test accuracy of the ultrasonic flowmeter.

[0093] In one embodiment, the schematic diagram of the simulation of the internal circuit equivalent model of the transducer is as Figure 3 shown. The circuit equivalent model includes: dynamic capacitance C m , dynamic inductance L m , dynamic resistance R m , static resistance R 0 and static capacitance C 0 ; the first end of the dynamic capacitance C m is connected to the first end of the dynamic inductance L m , the second end of the dynamic capacitance C m is connected to the first end of the dynamic resistance R m , the first end of the static resistance R 0 is connected to the first end of the dynamic inductance L m , the second end of the static resistance R 0 is connected to the second end of the dynamic resistance R m , the first end of the static capacitance R 0 is connected to the first end of the dynamic inductance L m and the first end of the static capacitance C0 The second end of m is connected to the second end of the dynamic resistor R.

[0094] In one embodiment, as Figure 4 shown, a cabinet for automatically testing the pairing performance of transducers is further provided, including: a capacitance meter for obtaining the static capacitance of each transducer (not shown in the figure); an impedance analysis device for obtaining the impedance characteristic curve of each transducer (not shown in the figure); a circuit equivalent model for simulating the internal circuit structure of the transformer; a processor for executing the method of automatically testing the pairing performance of transducers; a signal generator for providing electrical signal devices with various frequencies, waveforms and output levels; an oscilloscope for signal acquisition; a power amplifier for amplifying the signal emitted by the signal generator; a display for outputting the pairing result; and an industrial control computer for detecting and calculating data parameters.

[0095] In one embodiment, as Figure 5 shown, the capacitance meter 505 tests the static capacitance of the transducer, and the processor 506 obtains the test data of the capacitance meter; the impedance analysis device 504 tests the impedance characteristic curve of each transducer, and the obtained curve is displayed in the oscilloscope 507, and the processor calculates the impedance admittance circle diagram of the transducer according to the curve.

[0096] In one embodiment, as Figure 5 shown, the processor 506 calculates the resonant frequency and half-power point frequency of the transducer according to the impedance admittance circle diagram of the transducer and the circuit equivalent model; the processor 506 determines the bandwidth and quality factor of the transducer according to the resonant frequency and half-power point frequency; the processor 506 determines the dynamic resistance, dynamic capacitance and dynamic inductance of the transducer according to the impedance admittance circle diagram of the transducer and the circuit equivalent model.

[0097] In one embodiment, as Figure 5 shown, the transducer test signal is emitted by the signal generator 501, amplified by the power amplifier 502, and the transducer 503 receives the signal amplified by the power amplifier. The impedance analysis device 504 obtains the impedance characteristic curve of the transducer, and the impedance characteristic curve is shown on the oscilloscope, and the processor 506 analyzes and calculates the impedance characteristic curve to obtain the impedance admittance circle diagram of the susceptance and conductance of the transducer.

[0098] In one embodiment, as Figure 5 shown, after the processor 507 obtains the pairing parameters of the two transducers of the transducer pair, it performs analysis and calculation to confirm whether the difference between the pairing parameters of the two transducers in the transducer pair exceeds a preset threshold. If there is a difference in one or more pairing parameters that exceeds the preset threshold, then the display 507 outputs pairing inconsistency; otherwise, the display 507 outputs pairing consistency.

[0099] In one embodiment, the automatic transducer pairing performance testing device under voltage-changing conditions outputs the final transducer pairing result to a display device provided with the cabinet.

[0100] In one embodiment, Figure 6 As shown, a pressure flow device for changing the pressure and flow in the transducer test pipeline is provided. This device is used to change the pressure in the transducer test pipeline before the transducer pairing test or after completing a transducer pairing test. The pressure flow device includes a main line, a boost bypass branch, a nitrogen injection branch, and a venting branch. The main line includes a first electric ball valve 601, a pressure sensor transmitter 602, a transducer fixing device 612, a standard flow meter 603, a temperature sensor transmitter 604, and a second electric ball valve 605 in sequence; the boost bypass branch includes a first valve 606 and a second valve 607, the first end of the first valve 606 is connected to the first electric ball valve 601, the second end of the first valve 606 is connected to the first end of the second valve 607, and the second end of the second valve 607 is connected to the main line between the first electric ball valve 601 and the pressure sensor transmitter 602; the nitrogen injection branch includes a third valve 609 and a third valve 601. Four valves 608, the first end of the third valve 609 is connected to the nitrogen storage device, the second end of the third valve 609 is connected to the first end of the fourth valve 608, and the second end of the fourth valve 608 is connected to the main pipe between the first electric ball valve 601 and the pressure sensor transmitter 602; the venting branch includes a fifth valve 611 and a sixth valve 610, the first end of the fifth valve 611 is in contact with the air, the second end of the fifth valve 611 is connected to the first end of the sixth valve 610, and the second end of the sixth valve 610 is connected to the main pipe between the second electric ball valve 605 and the temperature sensor transmitter 604.

[0101] The specific pressure transformation steps are as follows: During the measurement process, the electric ball valve 601, valve 606, valve 607 and valve 605 are closed, and valves 610 and valve 611 are opened to vent the high-pressure natural gas in the main pipeline from the venting branch. Open valves 608 and valve 609, inject nitrogen, and discharge the natural gas in the main pipeline. When the concentration of natural gas in the discharged gas is lower than a certain concentration, close valves 608, valve 609, valve 610 and valve 611. Install the transducer to be measured on the fixture 612. After the installation is completed, open valves 608, valve 609, valve 610 and valve 611, and then inject nitrogen to discharge the air brought in during the installation process from the main pipeline. When the oxygen concentration of the gas discharged from the exhaust port of the venting branch is lower than the preset concentration, close valves 608, valve 609, valve 610 and valve 611. Open valves 606 and valve 607 and slowly inject natural gas to increase the pressure of the main pipeline. When the pressure inside the main pipeline reaches the preset pressure, valves 606 and 607 are closed, and valves 601 and 605 are opened. At this time, the main pipeline is connected, and the flow in the main pipeline is controlled by adjusting the opening of the downstream flow regulating valve (not shown in the figure), while observing the values ​​of the pressure sensor transmitter 602, the standard flow meter 603, and the temperature sensor transmitter 604. When the pressure and flow in the main pipeline are stable within the preset range, the transducer parameter pairing test is performed.

[0102] For example, first vent the natural gas in the pipeline from the vent branch, inject nitrogen, and isolate the natural gas from the air. After installing the transducer, exhaust the air that enters the main pipeline during the installation process, and slowly inject natural gas into the boost bypass branch to boost the gas pressure in the main pipeline. When the pressure reaches 1MPa, close the valve of the boost bypass branch. The flow and flow rate in the main pipeline are controlled by adjusting the opening of the downstream flow control valve. The flow rate in the main pipeline to be adjusted is 2m 3When the pressure is [[pressure value]] / h and the pressure and flow rate fluctuations are less than 5%, a transducer pairing experiment is carried out. Open the automatic test cabinet for transducer pairing performance, and use the capacitance meter in the automatic test cabinet for transducer pairing performance to measure the static capacitance of each transducer. Use impedance analysis equipment to obtain the impedance characteristic curve of each transducer. After obtaining the two data, the processor in the automatic test cabinet for transducer pairing performance will analyze and calculate them according to the circuit equivalent model to obtain the impedance admittance circle diagram of conductance and susceptance. The processor will calculate the dynamic capacitance, dynamic inductance, dynamic resistance, bandwidth, and quality factor of the two transducers based on the obtained impedance admittance circle diagram. Change the pressure and flow rate in the main test pipeline, and return to the step of using the capacitance meter to measure the static capacitance of each transducer until the processor calculates the dynamic capacitance, dynamic inductance, dynamic resistance, bandwidth, and quality factor of the two transducers based on the obtained impedance admittance circle diagram. After completing the transducer pairing performance test under all preset pressures and flow rates, the test process ends. Assume that the threshold is 2% of the smaller pairing parameter of the two transducers. If the difference in one or more pairing parameters is greater than the threshold, then the two transducers are not paired consistently; if the differences in the pairing parameters of the two transducers do not exceed the threshold, then the two transducers are paired consistently under this pressure and flow rate. The automatic test device for transducer pairing performance will output the final pairing performance result.

[0103] By using the above method, the pressure and flow rate of the test pipeline can be changed, enabling the transducers to conduct pairing tests under different loads, improving the consistency of the pairing of the two transducers in the transducer pair used for testing, and enhancing the test accuracy of the ultrasonic flowmeter.

[0104] The processor contains a kernel, and the kernel retrieves the corresponding program unit from the memory. One or more kernels can be set, and by adjusting the kernel parameters, the above automatic test method for transducer pairing performance under variable pressure conditions can be realized.

[0105] The memory may include non-permanent memory in a computer-readable medium, forms such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash memory (flash RAM), and the memory includes at least one memory chip.

[0106] An embodiment of the present application provides a storage medium with a program stored thereon, and when the program is executed by a processor, the above automatic test method for transducer pairing parameters under variable pressure conditions is realized.

[0107] An embodiment of the present application provides a processor for running a program, and when the program runs, it executes the above automatic test method for transducer pairing parameters under variable pressure conditions.

[0108] In one embodiment, a computer device is provided. The computer device can be a terminal, and its internal structure diagram can be as Figure 7As shown. The computer device includes a processor, a network interface, a display screen, an input device, and a memory (not shown in the figure) connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes an internal memory and a non-volatile storage medium. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, it implements a method for automatically testing the pairing performance of transducers. The display screen of the computer device can be a liquid crystal display screen or an electronic ink display screen. The input device of the computer device can be a touch layer covering the display screen, or a button, a trackball, or a touchpad provided on the housing of the computer device, or an external keyboard, touchpad, or mouse, etc.

[0109] Those skilled in the art can understand that Figure 7 the structure shown in is only a block diagram of some structures related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine some components, or have different component arrangements.

[0110] An embodiment of the present application provides a device, which includes a processor, a memory, and a program stored on the memory and executable on the processor. When the processor executes the program, the following steps are implemented: obtaining the static capacitance C of each transducer in a pair of transducers in a test pipeline under different environmental parameters, and impedance characteristic curves, where the environmental parameters include the pressure and flow rate in the test pipeline; determining the impedance admittance circle diagram of the susceptance and conductance of each transducer at each environmental parameter according to the static capacitance and impedance characteristic curves of each transducer to determine the resonance frequency and half-power frequency corresponding to each transducer and each environmental parameter; determining the bandwidth BW and quality factor Q of each transducer at each environmental parameter according to the resonance frequency and half-power frequency of each transducer; determining the dynamic resistance R 0 、dynamic capacitance C m 、dynamic capacitance C m and dynamic inductance L m of each transducer at each environmental parameter through a circuit equivalent model and an impedance admittance circle diagram; for each environmental parameter, comparing the pairing parameters of the transducer pair under the environmental parameter, where the pairing parameters include bandwidth BW, quality factor Q, dynamic resistance R m 、dynamic capacitance C m 、dynamic capacitance C m 、static capacitance C 0, Resonant frequency; when the difference between the pairing parameters of the two transducers in the transducer pair under all environmental parameters does not exceed the preset threshold, it is confirmed that the pairing parameters of the two transducers are consistent.

[0111] In one embodiment, the impedance admittance circle diagram of the susceptance and conductance of each transducer determined according to the static capacitance and impedance characteristic curve of each transducer includes: the impedance characteristic curve determines the susceptance B and conductance G at different frequencies; for each transducer, according to the susceptance B, conductance G, and static capacitance C of the transducer 0 Determine the impedance admittance circle diagram of the transducer.

[0112] In one embodiment, after obtaining the impedance characteristic curve and static capacitance, the expression of the impedance admittance circle diagram is as shown in formula (1):

[0113]

[0114] where G is the conductance, B is the susceptance, R m is the dynamic resistance, ω is the angular frequency, C 0 is the static capacitance of the transducer.

[0115] In one embodiment, calculate the dynamic resistance R according to formula (2) m , calculate the dynamic inductance L according to formula (3) m , calculate the dynamic capacitance C according to formula (4) m ;

[0116] R m = 1 / G max Formula (2);

[0117]

[0118] where G max is the maximum value of the conductance G, f 1 , f 2 are both half-power point frequencies, which are the frequencies corresponding to the maximum susceptance B and the minimum susceptance B respectively, ω 2 , ω 1 are the angular frequencies corresponding to f 1 and f 2 corresponding angular frequencies respectively, f s is the series resonant frequency, which is the frequency corresponding to the maximum conductance, ω s is the angular frequency corresponding to f s corresponding angular frequency.

[0119] In one embodiment, calculate the bandwidth BW according to formula (5), and calculate the quality factor Q according to formula (6);

[0120] BW = △f = f 2-f 1 Formula (5);

[0121]

[0122] where f 1 and f 2 are both half-power point frequencies, which are the frequencies corresponding to the maximum susceptance B and the minimum susceptance B respectively, ω 2 and ω 1 are the angular frequencies corresponding to f 1 and f 2 respectively, f s is the series resonance frequency, which is the frequency corresponding to the maximum conductance, and ω s is the angular frequency corresponding to f s .

[0123] In one embodiment, the circuit equivalent model includes: a dynamic capacitor C m , a dynamic inductor L m , a dynamic resistor R m , a static resistor R 0 and a static capacitor C 0 ; the first end of the dynamic capacitor C m is connected to the first end of the dynamic inductor L m , the second end of the dynamic capacitor C m is connected to the first end of the dynamic resistor R m , the first end of the static resistor R 0 is connected to the first end of the dynamic inductor L m , the second end of the static resistor R 0 is connected to the second end of the dynamic resistor R m , the first end of the static capacitor R 0 is connected to the first end of the dynamic inductor L m , and the second end of the static capacitor C 0 is connected to the second end of the dynamic resistor R m .

[0124] The present application also provides a computer program product, which is suitable for executing a program initialized with the following method steps when executed on a data processing device: obtaining the static capacitance C of each transducer in a pair of transducers in a test pipeline under different environmental parameters 0And impedance characteristic curves, environmental parameters include the pressure and flow rate in the test pipeline; determine the impedance - admittance circle diagrams of the susceptance and conductance of each transducer at each environmental parameter according to the static capacitance and impedance characteristic curves of each transducer, so as to determine the resonance frequency and half - power frequency corresponding to each transducer and each environmental parameter; determine the bandwidth BW and quality factor Q of each transducer at each environmental parameter according to the resonance frequency and half - power frequency of each transducer; determine the dynamic resistance R of each transducer at each environmental parameter through the circuit equivalent model and impedance - admittance circle diagram m , dynamic capacitance C m and dynamic inductance L m ; for each environmental parameter, compare the pairing parameters of the transducer pair under the environmental parameter, and the pairing parameters include bandwidth BW, quality factor Q, dynamic resistance R m , dynamic capacitance C m , dynamic inductance L m , static capacitance C 0 , resonance frequency; when the differences between the pairing parameters of the two transducers in the transducer pair under all environmental parameters do not exceed the preset threshold, confirm that the pairing parameters of the two transducers are consistent.

[0125] In one embodiment, determining the impedance - admittance circle diagrams of the susceptance and conductance of each transducer according to the static capacitance and impedance characteristic curves of each transducer includes: the impedance characteristic curve determines the susceptance B and conductance G at different frequencies; for each transducer, determine the impedance - admittance circle diagram of the transducer according to the susceptance B, conductance G and static capacitance of the transducer.

[0126] In one embodiment, after obtaining the impedance characteristic curve and static capacitance, the expression of the impedance - admittance circle diagram is as shown in formula (1):

[0127]

[0128] where G is the conductance, B is the susceptance, R m is the dynamic resistance, ω is the angular frequency, C 0 is the static capacitance of the transducer.

[0129] In one embodiment, calculate the dynamic resistance R according to formula (2) m , calculate the dynamic inductance L according to formula (3) m , calculate the dynamic capacitance C according to formula (4) m ;

[0130] R m = 1 / G max Formula (2);

[0131]

[0132] Among them, G max is the maximum value of the conductance G, and f 1 , f 2 are both half-power point frequencies, which are respectively the frequency corresponding to the maximum susceptance B and the frequency corresponding to the minimum susceptance B. ω 2 , ω 1 are respectively the angular frequencies corresponding to f 1 and the angular frequency corresponding to f 2 . f s is the series resonance frequency, which is the frequency corresponding to the maximum conductance, and ω s is the angular frequency corresponding to f s .

[0133] In one embodiment, the bandwidth BW is calculated according to formula (5), and the quality factor Q is calculated according to formula (6);

[0134] BW = △d = f 2 - f 1 Formula (5);

[0135]

[0136] Among them, f 1 , f 2 are both half-power point frequencies, which are respectively the frequency corresponding to the maximum susceptance B and the frequency corresponding to the minimum susceptance B. ω 2 , ω 1 are respectively the angular frequencies corresponding to f 1 and the angular frequency corresponding to f 2 . f s is the series resonance frequency, which is the frequency corresponding to the maximum conductance, and ω s is the angular frequency corresponding to f s .

[0137] In one embodiment, the circuit equivalent model includes: dynamic capacitance C m , dynamic inductance L m , dynamic resistance R m , static resistance R 0 and static capacitance C 0 ; the first end of the dynamic capacitance C m is connected to the first end of the dynamic inductance L m , the second end of the dynamic capacitance C m is connected to the first end of the dynamic resistance R m , the first end of the static resistance R 0 is connected to the first end of the dynamic inductance L m , the second end of the static resistance R 0 is connected to the second end of the dynamic resistance R m , and the static capacitance... 0The first end of is connected to the dynamic inductor L m The first end of the static capacitor C 0 The second end of is connected to the second end of the dynamic resistor R m is connected.

[0138] Those skilled in the art should understand that the embodiments of the present application can be provided as a method, a system, or a computer program product. Therefore, the present application can take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present application can take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0139] The present application is described with reference to the flowcharts and / or block diagrams of methods, apparatuses (systems), and computer program products according to the embodiments of the present application. It should be understood that each flow and / or block in the flowchart and / or block diagram, as well as the combination of flows and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to the processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing devices to generate a machine, such that the instructions executed by the processor of the computer or other programmable data processing devices generate means for implementing the specified functions in one Figure 1 one or more flows and / or blocks Figure 1 one or more blocks.

[0140] These computer program instructions can also be stored in a computer-readable memory that can direct a computer or other programmable data processing device to work in a specific manner, such that the instructions stored in the computer-readable memory generate a manufactured article including instruction means that implement the specified functions in one Figure 1 one or more flows and / or blocks Figure 1 one or more blocks.

[0141] These computer program instructions can also be loaded onto a computer or other programmable data processing device, such that a series of operation steps are executed on the computer or other programmable device to generate a computer-implemented process, so that the instructions executed on the computer or other programmable device provide steps for implementing the specified functions in one Figure 1 one or more flows and / or blocks Figure 1 one or more blocks.

[0142] In a typical configuration, a computing device includes one or more processors (CPUs), an input / output interface, a network interface, and a memory.

[0143] The memory may include non - permanent memory in the form of computer - readable media, random access memory (RAM) and / or non - volatile memory such as read - only memory (ROM) or flash RAM. The memory is an example of computer - readable media.

[0144] Computer - readable media includes permanent and non - permanent, removable and non - removable media that can store information by any method or technology. The information can be computer - readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase - change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read - only memory (ROM), electrically erasable programmable read - only memory (EEPROM), flash memory or other memory technologies, compact disc read - only memory (CD - ROM), digital versatile disc (DVD) or other optical storage, magnetic cassette tapes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non - transitory media that can be used to store information that can be accessed by a computing device. As defined herein, computer - readable media does not include transitory media such as modulated data signals and carrier waves.

[0145] It should also be noted that the term "comprising", "including" or any other variant thereof is intended to cover non - exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but also other elements not expressly listed or elements inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the statement "comprising an..." does not exclude the presence of additional identical elements in the process, method, article, or apparatus that comprises the element.

[0146] The above are only embodiments of the present application and are not used to limit the present application. For those skilled in the art, various changes and modifications can be made to the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present application shall be included within the scope of the claims of the present application.

Claims

1. An automatic test method for the pairing performance of transducers under variable pressure conditions, characterized in that, the method includes: Obtain the static capacitance C of each transducer in the transducer pair in the test pipeline under different environmental parameters 0 and impedance characteristic curves, where the environmental parameters include the pressure and flow rate in the test pipeline; Determining the impedance - admittance circle diagrams of susceptance and conductance of each transducer at each environmental parameter according to the static capacitance and impedance characteristic curves of each transducer, so as to determine the resonance frequency and half - power frequency corresponding to each transducer and each environmental parameter; Determining the bandwidth BW and quality factor Q of each transducer at each environmental parameter according to the resonance frequency and the half - power frequency of each transducer; Determine the dynamic resistance R, dynamic capacitance C m and dynamic inductance L m of each transducer under each environmental parameter through the circuit equivalent model and the impedance admittance circle diagram; m dynamic capacitance C m and dynamic inductance L m ; For each environmental parameter, compare the pairing parameters of the transducer pair under the environmental parameter, where the pairing parameters include bandwidth BW, quality factor Q, dynamic resistance R m , dynamic capacitance C m , dynamic inductance L m , static capacitance C 0 , resonant frequency; When the differences between the pairing parameters of the two transducers in the transducer pair under all environmental parameters do not exceed a preset threshold, confirming that the pairing parameters of the two transducers are consistent; Among them, the determining the impedance - admittance circle diagrams of susceptance and conductance of each transducer according to the static capacitance and impedance characteristic curves of each transducer includes: Determining the susceptance B and conductance G at different frequencies according to the impedance characteristic curve; For each transducer, determining the impedance - admittance circle diagram of the transducer according to the susceptance B, conductance G of the transducer and the static capacitance.

2. The automatic test method for the pairing performance of transducers under variable pressure conditions according to claim 1, characterized in that, The expression of the impedance - admittance circle diagram is as formula (1): where G is the conductance, B is the susceptance, R m is the dynamic resistance, ω is the angular frequency, C 0 is the static capacitance of the transducer.

3. The automatic test method for the pairing performance of transducers under variable pressure conditions according to claim 1, characterized in that, Calculate the dynamic resistance R according to formula (2) m , calculate the dynamic inductance L according to formula (3) m , calculate the dynamic capacitance C according to formula (4) m ; R m = 1 / G max Equation (2); Among them, G max is the maximum value of the conductance G, f 1 , f 2 are both half-power point frequencies, which are the frequencies corresponding to the maximum susceptance B and the minimum susceptance B respectively, ω 2 , ω 1 are the angular frequencies corresponding to f 1 and f 2 respectively, f s is the series resonance frequency, which is the frequency corresponding to the maximum conductance, ω s is the angular frequency corresponding to f s .

4. The automatic test method for the pairing performance of transducers under variable pressure conditions according to claim 1, characterized in that, Calculating the bandwidth BW according to formula (5) and calculating the quality factor Q according to formula (6); BW = Δf = f 2 -f 1 Equation (5); where f 1 and f 2 are both half-power point frequencies, which are the frequencies corresponding to the maximum susceptance B and the minimum susceptance B respectively, ω 2 and ω 1 are the angular frequencies corresponding to f 1 and f 2 respectively, f s is the series resonance frequency, which is the frequency corresponding to the maximum conductance, ω s is the angular frequency corresponding to f s .

5. The automatic test method for the pairing performance of transducers under variable pressure conditions according to claim 1, characterized in that, The circuit equivalent model includes: dynamic capacitor C m , dynamic inductor L m , dynamic resistor R m , static resistor R 0 and static capacitor C 0 ; The first end of the dynamic capacitor C m is connected to the first end of the dynamic inductor L m The second end of the dynamic capacitor C m is connected to the first end of the dynamic resistor R m The first end of the static resistor R 0 is connected to the first end of the dynamic inductor L m The second end of the static resistor R 0 is connected to the second end of the dynamic resistor R m The first end of the static capacitor C 0 is connected to the first end of the dynamic inductor L m The second end of the static capacitor C 0 is connected to the second end of the dynamic resistor R m is connected.

6. A processor, characterized in that, configured to execute the automatic test method for the pairing performance of transducers under variable pressure conditions according to any one of claims 1 to 5.

7. An automatic test device for the pairing performance of transducers under variable pressure conditions, characterized in that, includes: A capacitance meter for obtaining the static capacitance of each transducer; An impedance analysis device for obtaining the impedance characteristic curve of each transducer; A pressure - flow device for changing the pressure and flow rate in the transducer test pipeline; The processor according to claim 6.

8. The automatic test device for the pairing performance of transducers under variable pressure conditions according to claim 7, the pressure - flow device includes: A main pipeline, successively including a first electric ball valve, a pressure - sensing transmitter, a transducer fixing device, a standard flowmeter, a temperature - sensing transmitter, and a second electric ball valve; A boosting bypass branch, including a first valve and a second valve, the first end of the first valve is connected to the first electric ball valve, the second end of the first valve is connected to the first end of the second valve, and the second end of the second valve is connected to the main pipeline between the first electric ball valve and the pressure - sensing transmitter; The nitrogen injection branch includes a third valve and a fourth valve. The first end of the third valve is connected to the nitrogen storage device. The second end of the third valve is connected to the first end of the fourth valve. The second end of the fourth valve is connected to the main pipeline between the first electric ball valve and the pressure sensing and transmitting device. The venting branch includes a fifth valve and a sixth valve. The first end of the fifth valve is in contact with air. The second end of the fifth valve is connected to the first end of the sixth valve. The second end of the sixth valve is connected to the main pipeline between the second electric ball valve and the temperature sensing and transmitting device.

9. A machine-readable medium storing instructions, wherein, when the instructions are executed by a machine, the machine is caused to execute the automatic test method for transducer pairing performance under variable pressure conditions according to any one of claims 1 to 5.

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