Calibration Device and Method for Operating Time of a Relay Testing Instrument

Abstract

The present invention discloses a calibration device and method for the action time of a relay test instrument. The calibration device includes an electronic coil module, an electronic contact module, and an MCU module. The electronic coil module is connected to the input end of the MCU module, and the electronic contact module is connected to the output end of the MCU module. The input of the electronic coil module is provided with two input ends for simulating coil input. The output of the electronic contact module is provided with three output ends for respectively simulating the normally closed end, normally open end, and common end of the relay. The output of the MCU module is respectively provided with a first output end and a second output end. The present invention constructs an electronically programmable relay, and the time modules of the electronically programmable relay can all be set by a program, which can meet the adjustment of the time period and the number of bounce times, enabling the user to set comparison time parameters according to the performance of the mechanical relay for time accuracy calibration, and having the characteristics of high calibration accuracy and easy implementation.

Description

Technical Field

[0001] The present invention relates to the technical field of relay testing, and particularly to a calibration device and method for the action time of a relay testing instrument. Background Art

[0002] A relay is an automatic switching element with isolation function, and is widely used in remote control, telemetry, communication, automatic control, mechatronics and power electronic equipment, and is one of the most important control elements. In order to ensure the use effect of the relay, it is usually necessary to use a relay testing instrument, namely a relay comprehensive parameter tester, to detect some parameters of the relay, such as the test of coil resistance, contact resistance, pull-in / release voltage, pull-in / release time, etc. Therefore, the accuracy of the relay testing instrument will directly affect the test results of the product. After the relay testing instrument is used for a period of time, due to the reduction of the accuracy of the chip or circuit, the test accuracy of the relay testing instrument is also reduced. Thus, during the use of the relay testing instrument, its accuracy must be calibrated regularly to ensure the test accuracy.

[0003] At present, the calibration method for the relay testing instrument is generally carried out by calibrating each item separately. For example, a high-precision multimeter is used to calibrate the voltage of the relay testing instrument, and a high-precision resistance box is used to calibrate the resistance of the relay testing instrument. These calibration items can meet the requirements and obtain mutually recognized calibrations. However, due to the particularity of the relay, the time parameter test of the relay testing instrument includes action time, action bounce time, release time and release bounce time. At present, the metrology institute cannot perform the metrology of the instrument according to the conventional time calibration method.

[0004] Therefore, in the current industry, the time calibration of the relay testing instrument usually adopts the reference comparison method. Specifically, the result of comparing the level changes of the coil & contact is collected by a brand oscilloscope for accuracy judgment. Since the time scale value of the oscilloscope is affected by the artificial visual deviation, there will be uncertainty in the reading, which results in the disadvantage of inaccurate calibration and affects the judgment of the accuracy of the test results of the relay testing instrument for the product. Summary of the Invention

[0005] The purpose of the present invention is to overcome the deficiencies of the prior art, and provide a calibration device and method for the action time of a relay testing instrument. By constructing an electronic programmable relay, and the time modules of the electronic programmable relay can be set by programs, which can meet the adjustment of time period and bounce times, so that the user can set the comparison time parameters according to the performance of the mechanical relay for time accuracy calibration, and has the characteristics of high calibration accuracy and easy implementation.

[0006] The technical solution adopted by the present invention to solve its technical problems is: a calibration device for the operating time of a relay test instrument, including an electronic coil module, an electronic contact module, and an MCU module; the electronic coil module is connected to the input end of the MCU module, and the electronic contact module is connected to the output end of the MCU module; the input of the electronic coil module is provided with two input ends for simulating the coil input to be connected to the relay test instrument as the coil input connection end of the relay; the output of the electronic contact module is provided with three output ends for respectively simulating the normally closed end, normally open end, and common end of the relay to be connected to the relay test instrument as the contact output end of the relay; the output of the MCU module is respectively provided with a first output end for controlling the signal change of the normally closed end of the electronic contact module and a second output end for controlling the signal change of the normally open end of the electronic contact module; the MCU module receives the signal of the electronic coil module and outputs corresponding control signals from the first output end and the second output end according to the preset control mode to respectively control the signal changes of the normally closed end and the normally open end of the electronic contact module.

[0007] The electronic coil module includes a first optocoupler, and the first optocoupler has a transmitting diode, a receiving diode, and a receiving triode inside; both ends of the transmitting diode are set as the two coil input connection ends of the electronic coil module; one end of the receiving diode is connected to the power supply end, the other end of the receiving diode is connected to the base of the receiving triode, the emitter of the receiving triode is grounded, and the collector of the receiving triode is used as the output end of the electronic coil module to be connected to the MCU module.

[0008] The electronic coil module further includes a resistor R1 and a resistor R2; the resistor R1 is connected between one end of the transmitting diode of the first optocoupler and one of the coil input connection ends; the resistor R2 is connected between the collector of the receiving triode of the first optocoupler and the power supply end.

[0009] The resistor R1 is connected between the positive electrode end of the transmitting diode of the first optocoupler and the positive electrode coil input connection end.

[0010] The electronic contact module includes a second optocoupler, which has two emitter diodes, two receiver diodes and two receiver triodes; one end of one emitter diode is connected to the first output end of the MCU module, and the other end of the one emitter diode is connected to the power supply terminal; one end of the other emitter diode is connected to the second output end of the MCU module, and the other end of the other emitter diode is connected to the power supply terminal; one end of one receiver diode matching the one emitter diode is connected to the positive voltage terminal, the other end of the one receiver diode is connected to the base of one receiver triode, the emitter of the one receiver triode is connected to the negative voltage terminal and serves as the common terminal of the electronic contact module, and the collector of the one receiver triode serves as the normally closed terminal of the electronic contact module; one end of the other receiver diode matching the other emitter diode is connected to the positive voltage terminal, the other end of the other receiver diode is connected to the base of the other receiver triode, the emitter of the other receiver triode is connected to the negative voltage terminal and serves as the common terminal of the electronic contact module, and the collector of the other receiver triode serves as the normally open terminal of the electronic contact module.

[0011] The electronic contact module further includes a resistor R3, a resistor R4, a resistor R5 and a resistor R6; the resistor R3 is connected between the other end of one emitter diode of the second optocoupler and the power supply terminal; the resistor R4 is connected between the other end of the other emitter diode of the second optocoupler and the power supply terminal; the resistor R5 is connected between the collector of one receiver triode of the second optocoupler and the positive voltage terminal; the resistor R6 is connected between the collector of the other receiver triode of the second optocoupler and the positive voltage terminal.

[0012] The resistor R3 is connected between the positive extreme of one emitter diode of the second optocoupler and the power supply terminal; the resistor R4 is connected between the positive extreme of the other emitter diode of the second optocoupler and the power supply terminal.

[0013] A calibration method for the action time of a relay test instrument is to preset a program capable of setting time parameters in the MCU module. When the program is running, by detecting the input signal of the electronic coil module and combining with the setting of the time parameters, control signals are respectively output to the electronic contact module through the first output end and the second output end to control the signal changes of the normally closed terminal and the normally open terminal of the electronic contact module. Then, the time parameters obtained by using the relay test instrument to detect the normally closed terminal and the normally open terminal are compared with the set values of the time parameters in the MCU module, so as to obtain the detection deviation situation of the relay test instrument, and the relay test instrument is corrected correspondingly according to the deviation situation.

[0014] A calibration method for the operation time of a relay test instrument, comprising the following steps:

[0015] S1. Initialize the contact ports, set the first output terminal to low level, the second output terminal to high level, make the normally closed terminal at low level, and the normally open terminal at high level;

[0016] S2. The MCU determines whether the coil is energized, that is, determines whether the input level of the MCU module changes. If not, return to continue the determination. If so, respectively proceed to step S3 and step S7;

[0017] S3. Start the internal timer to count, and perform the action processing for the normally closed terminal to leave;

[0018] S4. The MCU determines whether the timing for the normally closed terminal to leave ends. If not, return to continue the determination. If so, proceed to the next step;

[0019] S5. Start the internal timer to count, and perform the action processing for the normally closed terminal to bounce back;

[0020] S6. The MCU determines whether the pulse output ends when the normally closed terminal bounces back. If not, return to continue the determination. If so, proceed to step S11;

[0021] S7. Start the internal timer to count, and perform the action processing for the normally open terminal to close;

[0022] S8. The MCU determines whether the timing for the normally open terminal to close ends. If not, return to continue the determination. If so, proceed to the next step;

[0023] S9. Start the internal timer to count, and perform the action processing for the normally open terminal to bounce back;

[0024] S10. The MCU determines whether the pulse output ends when the normally open terminal bounces back. If not, return to continue the determination. If so, proceed to step S11;

[0025] S11. The MCU determines whether the coil is energized, that is, determines whether the input level of the MCU module changes. If not, return to continue the determination. If so, respectively proceed to step S12 and step S16;

[0026] S12. Start the internal timer to count, and perform the action processing for the normally open terminal to leave;

[0027] S13. The MCU determines whether the timing for the normally open terminal to leave ends. If not, return to continue the determination. If so, proceed to the next step;

[0028] S14. Start the internal timer to count, and perform the action processing for the normally open terminal to bounce back;

[0029] S15. The MCU determines whether the normally open terminal bounces back and whether the pulse output has ended. If not, it returns to continue the determination. If so, it ends or returns to S1;

[0030] S16. Start the internal timer to count, and handle the closing action of the normally closed terminal;

[0031] S17. The MCU determines whether the timing of the normally closed terminal closing has ended. If not, it returns to continue the determination. If so, it proceeds to the next step;

[0032] S18. Start the internal timer to count, and handle the bouncing back action of the normally closed terminal;

[0033] S19. The MCU determines whether the normally closed terminal bounces back and whether the pulse output has ended. If not, it returns to continue the determination. If so, it ends or returns to S1.

[0034] Compared with the prior art, the beneficial effects of the present invention are:

[0035] In the present invention, an electronic coil module, an electronic contact module, and an MCU module are used to form a calibration device for the action time of a relay test instrument; and the electronic coil module is connected to the input end of the MCU module, and the electronic contact module is connected to the output end of the MCU module; the input of the electronic coil module is provided with two input ends for simulating coil input to be used as the coil input connection ends of the relay test instrument to connect to the relay; the output of the electronic contact module is provided with three output ends for respectively simulating the normally closed terminal, normally open terminal, and common terminal of the relay to be used as the contact output ends of the relay test instrument to connect to the relay; the output of the MCU module is respectively provided with a first output end for controlling the signal change of the normally closed terminal of the electronic contact module and a second output end for controlling the signal change of the normally open terminal of the electronic contact module; the MCU module receives the signal of the electronic coil module and, according to the preset control mode, outputs corresponding control signals from the first output end and the second output end to respectively control the signal changes of the normally closed terminal and the normally open terminal of the electronic contact module. The present invention constructs an electronically programmed relay, and the time modules of the electronically programmed relay can all be set through programs, which can meet the adjustment of the time period and the number of bounces, enabling the user to set the comparison time parameters according to the performance of the mechanical relay for time accuracy calibration, and having the characteristics of high calibration accuracy and easy implementation.

[0036] The following further elaborates on the present invention in conjunction with embodiments; however, a calibration device and method for the action time of a relay test instrument of the present invention are not limited to the embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 It is the schematic diagram of a mechanical relay;

[0038] Figure 2 is the schematic diagram of the calibration device for the operation time of the relay test instrument according to an embodiment of the present invention;

[0039] Figure 3 is the flowchart of the calibration method for the operation time of the relay test instrument according to an embodiment of the present invention Figure 1 ;

[0040] Figure 4 is the flowchart of the calibration method for the operation time of the relay test instrument according to an embodiment of the present invention Figure 2 ;

[0041] Figure 5 is the operation timing diagram of the calibration device and method for the operation time of the relay test instrument according to an embodiment of the present invention. Detailed implementation manners

[0042] Embodiment

[0043] Refer to Figure 1 As shown, a mechanical relay usually includes two coil connection terminals Col+ and Col-, and three load connection terminals, namely, normally closed terminal NC, normally open terminal NO, and common terminal COM. When the relay test instrument tests the relay, it needs to be connected to these ports.

[0044] Refer to Figure 2 As shown, a calibration device for the operation time of a relay test instrument according to the present invention includes an electronic coil module, an electronic contact module, and an MCU module; the electronic coil module is connected to the input end of the MCU module, and the electronic contact module is connected to the output end of the MCU module; the input of the electronic coil module is provided with two input terminals Col+ and Col- for simulating coil input to be connected to the relay test instrument as the coil input connection terminals of the relay; the output of the electronic contact module is provided with three output terminals for respectively simulating the normally closed terminal NC, normally open terminal NO, and common terminal COM of the relay to be connected to the relay test instrument as the contact output terminals of the relay; the output of the MCU module is respectively provided with a first output terminal PWM0 for controlling the signal change of the normally closed terminal NC of the electronic contact module and a second output terminal PWM1 for controlling the signal change of the normally open terminal NO of the electronic contact module; the MCU module receives the signal from the electronic coil module and outputs corresponding control signals from the first output terminal PWM0 and the second output terminal PWM1 according to the preset control mode to respectively control the signal changes of the normally closed terminal and the normally open terminal of the electronic contact module.

[0045] In this embodiment, the electronic coil module includes a first optocoupler U1, and the first optocoupler U1 has a transmitting diode, a receiving diode, and a receiving triode therein; both ends of the transmitting diode are set as two coil input connection ends Col+ and Col- of the electronic coil module; one end of the receiving diode is connected to the power supply terminal Vdd, the other end of the receiving diode is connected to the base of the receiving triode, the emitter of the receiving triode is grounded to Vss, and the collector of the receiving triode serves as the output end of the electronic coil module and is connected to the MCU module, that is, the collector of the receiving triode is connected to the INTO connection end of the MCU module, and the emitter of the receiving triode is grounded to the Vss end and is connected to the Gnd connection end of the MCU module.

[0046] In this embodiment, the electronic coil module further includes a resistor R1 and a resistor R2; the resistor R1 is connected between one end of the transmitting diode of the first optocoupler U1 and one of the coil input connection ends; the resistor R2 is connected between the collector of the receiving triode of the first optocoupler U1 and the power supply terminal Vdd.

[0047] In this embodiment, the resistor R1 is connected between the positive terminal of the transmitting diode of the first optocoupler U1 and the positive-pole coil input connection end Col+.

[0048] In this embodiment, the electronic contact module includes a second optocoupler U2, and the second optocoupler U2 has two transmitting diodes, two receiving diodes, and two receiving triodes therein; one end of one of the transmitting diodes is connected to the first output terminal PWM0 of the MCU module, and the other end of the one transmitting diode is connected to the power supply terminal; one end of the other transmitting diode is connected to the second output terminal of the MCU module, and the other end of the other transmitting diode is connected to the power supply terminal Vdd; one end of one of the receiving diodes that matches the one transmitting diode is connected to the positive voltage terminal V+, the other end of the one receiving diode is connected to the base of one of the receiving triodes, the emitter of the one receiving triode is connected to the negative voltage terminal V- and serves as the common terminal COM of the electronic contact module, and the collector of the one receiving triode serves as the normally-closed terminal NC of the electronic contact module; one end of the other receiving diode that matches the other transmitting diode is connected to the positive voltage terminal V+, the other end of the other receiving diode is connected to the base of the other receiving triode, the emitter of the other receiving triode is connected to the negative voltage terminal V- and serves as the common terminal COM of the electronic contact module, and the collector of the other receiving triode serves as the normally-open terminal NO of the electronic contact module.

[0049] In this embodiment, the electronic contact module further includes a resistor R3, a resistor R4, a resistor R5, and a resistor R6; the resistor R3 is connected between the other end of one of the emitter diodes of the second optocoupler U2 and the power supply terminal Vdd; the resistor R4 is connected between the other end of the other emitter diode of the second optocoupler U2 and the power supply terminal Vdd; the resistor R5 is connected between the collector of one of the receiving transistors of the second optocoupler U2 and the positive voltage terminal V+; the resistor R6 is connected between the collector of the other receiving transistor of the second optocoupler U2 and the positive voltage terminal V+.

[0050] In this embodiment, the resistor R3 is connected between the positive electrode of one of the emitter diodes of the second optocoupler U2 and the power supply terminal Vdd; the resistor R4 is connected between the positive electrode of the other emitter diode of the second optocoupler U2 and the power supply terminal Vdd.

[0051] See Figures 3 to 5 As shown, a calibration method for the action time of a relay test instrument of the present invention is to preset a program capable of setting time parameters in the MCU module. When the program is running, by detecting the input signal of the electronic coil module and combining the setting of the time parameters, control signals are respectively output to the electronic contact module through the first output terminal PWM0 and the second output terminal PWM1 to control the signal changes of the normally closed terminal NC and the normally open terminal NO of the electronic contact module. Then, the time parameters obtained by using the relay test instrument to detect the normally closed terminal NC and the normally open terminal NO are compared with the set values of the time parameters in the MCU module, so as to obtain the detection deviation situation of the relay test instrument, and the relay test instrument is corrected correspondingly according to the deviation situation.

[0052] A calibration method for the action time of a relay test instrument of the present invention includes the following steps:

[0053] S1. Initialize the contact ports, set the first output terminal PWM0 to 0, the second output terminal PWM1 to 1, make the normally closed terminal NC be 0, and the normally open terminal NO be 1;

[0054] S2. The MCU determines whether the coil is energized, that is, determines whether the input level of the MCU module changes? If not, return and continue to judge. If so, respectively transfer to steps S3 and S7;

[0055] S3. Start the internal timer to time, and perform the action processing for the normally closed terminal NC to leave;

[0056] S4. The MCU determines whether the timing for the normally closed terminal NC to leave ends? That is, whether the time of T1 is reached. If not, return and continue to judge. If so, transfer to the next step;

[0057] S5. Start the internal timer for timing and handle the bounce action of the normally-closed terminal NC;

[0058] S6. The MCU determines whether the bounce of the normally-closed terminal NC and the pulse output have ended, that is, whether the time of T2 has been reached. If not, return and continue to judge. If so, go to step S11;

[0059] S7. Start the internal timer for timing and handle the closing action of the normally-open terminal NO;

[0060] S8. The MCU determines whether the timing of the closing of the normally-open terminal NO has ended, that is, whether the time of T3 has been reached. If not, return and continue to judge. If so, go to the next step;

[0061] S9. Start the internal timer for timing and handle the bounce action of the normally-open terminal NO;

[0062] S10. The MCU determines whether the bounce of the normally-open terminal NO and the pulse output have ended, that is, whether the time of T4 has been reached. If not, return and continue to judge. If so, go to step S11;

[0063] S11. The MCU determines whether the coil is energized, that is, whether the input level of the MCU module has changed. If not, return and continue to judge. If so, go to steps S12 and S16 respectively;

[0064] S12. Start the internal timer for timing and handle the leaving action of the normally-open terminal NO;

[0065] S13. The MCU determines whether the timing of the leaving of the normally-open terminal NO has ended, that is, whether the time of T5 has been reached. If not, return and continue to judge. If so, go to the next step;

[0066] S14. Start the internal timer for timing and handle the bounce action of the normally-open terminal NO;

[0067] S15. The MCU determines whether the bounce of the normally-open terminal NO and the pulse output have ended, that is, whether the time of T6 has been reached. If not, return and continue to judge. If so, end or return to S1;

[0068] S16. Start the internal timer for timing and handle the closing action of the normally-closed terminal NC;

[0069] S17. The MCU determines whether the timing of the closing of the normally-closed terminal NC has ended, that is, whether the time of T7 has been reached. If not, return and continue to judge. If so, go to the next step;

[0070] S18. Start the internal timer for timing and handle the bounce action of the normally-closed terminal NC;

[0071] S19. The MCU determines whether the normally closed terminal NC bounces back and whether the pulse output ends, that is, whether the time of T8 is reached. If not, it returns to continue the determination. If so, it ends or returns to S1.

[0072] A calibration device and method for the operation time of a relay test instrument according to the present invention uses an electronic coil module, an electronic contact module, and an MCU module to form a calibration device for the operation time of the relay test instrument. The electronic coil module is connected to the input end of the MCU module, and the electronic contact module is connected to the output end of the MCU module. The input of the electronic coil module is provided with two input ends for simulating coil input to be connected to the relay test instrument as the coil input connection end of the relay. The output of the electronic contact module is provided with three output ends for respectively simulating the normally closed terminal, normally open terminal, and common terminal of the relay to be connected to the relay test instrument as the contact output end of the relay. The output of the MCU module is respectively provided with a first output end for controlling the signal change of the normally closed terminal of the electronic contact module and a second output end for controlling the signal change of the normally open terminal of the electronic contact module. The MCU module receives the signal of the electronic coil module and outputs corresponding control signals from the first output end and the second output end according to the preset control mode to respectively control the signal changes of the normally closed terminal and the normally open terminal of the electronic contact module. The present invention constructs an electronically programmed relay, and the time modules of the electronically programmed relay can all be set by a program, which can meet the adjustment of the time period and the number of bounces, enabling the user to set comparison time parameters according to the performance of the mechanical relay for time accuracy calibration, and having the characteristics of high calibration accuracy and easy implementation.

[0073] The above is only the preferred embodiment of the present invention and does not impose any form of limitation on the present invention. Although the present invention has been disclosed above with the preferred embodiment, it is not intended to limit the present invention. Any person skilled in the art can make many possible changes and modifications to the technical solution of the present invention or modify it into an equivalent equivalent embodiment without departing from the scope of the technical solution of the present invention. Therefore, any simple modification, equivalent change, and modification made to the above embodiment based on the technical essence of the present invention without departing from the content of the technical solution of the present invention shall fall within the scope of the protection of the technical solution of the present invention.

Claims

1. A calibration device for the operating time of a relay test instrument, characterized in that: It includes an electronic coil module, an electronic contact module and an MCU module; the electronic coil module is connected to the input end of the MCU module, and the electronic contact module is connected to the output end of the MCU module; the input of the electronic coil module is provided with two input ends for simulating coil input to be connected to the relay test instrument as the coil input connection ends of the relay; the output of the electronic contact module is provided with three output ends for respectively simulating the normally closed end, normally open end and common end of the relay to be connected to the relay test instrument as the contact output ends of the relay; the output of the MCU module is respectively provided with a first output end for controlling the signal change of the normally closed end of the electronic contact module and a second output end for controlling the signal change of the normally open end of the electronic contact module; the MCU module receives the signal of the electronic coil module and outputs corresponding control signals from the first output end and the second output end according to the preset control mode to respectively control the signal changes of the normally closed end and the normally open end of the electronic contact module; the electronic coil module includes a first optocoupler, and the first optocoupler has a transmitting diode, a receiving diode and a receiving triode inside; both ends of the transmitting diode are set as the two coil input connection ends of the electronic coil module; one end of the receiving diode is connected to the power supply end, the other end of the receiving diode is connected to the base of the receiving triode, the emitter of the receiving triode is grounded, and the collector of the receiving triode is used as the output end of the electronic coil module to be connected to the MCU module; the electronic contact module includes a second optocoupler, and the second optocoupler has two transmitting diodes, two receiving diodes and two receiving triodes inside; one end of one of the transmitting diodes is connected to the first output end of the MCU module, and the other end of the one transmitting diode is connected to the power supply end; one end of the other transmitting diode is connected to the second output end of the MCU module, and the other end of the other transmitting diode is connected to the power supply end; one end of one of the receiving diodes matching the one transmitting diode is connected to the positive voltage end, the other end of the one receiving diode is connected to the base of one of the receiving triodes, the emitter of the one receiving triode is connected to the negative voltage end and serves as the common end of the electronic contact module, and the collector of the one receiving triode serves as the normally closed end of the electronic contact module; one end of the other receiving diode matching the other transmitting diode is connected to the positive voltage end, the other end of the other receiving diode is connected to the base of the other receiving triode, the emitter of the other receiving triode is connected to the negative voltage end and serves as the common end of the electronic contact module, and the collector of the other receiving triode serves as the normally open end of the electronic contact module.

2. The calibration device for the operation time of the relay test instrument according to claim 1, characterized in that: The electronic coil module further includes a resistor R1 and a resistor R2; the resistor R1 is connected between one end of the emitting diode of the first optocoupler and one of the coil input connection terminals; the resistor R2 is connected between the collector of the receiving transistor of the first optocoupler and the power supply terminal.

3. The calibration device for the operation time of the relay test instrument according to claim 2, characterized in that: The resistor R1 is connected between the positive terminal of the emitting diode of the first optocoupler and the positive coil input connection terminal.

4. The calibration device for the operating time of the relay test instrument according to claim 1, characterized in that: The electronic contact module further includes a resistor R3, a resistor R4, a resistor R5 and a resistor R6; the resistor R3 is connected between the other end of one of the emitting diodes of the second optocoupler and the power supply terminal; the resistor R4 is connected between the other end of the other emitting diode of the second optocoupler and the power supply terminal; the resistor R5 is connected between the collector of one of the receiving transistors of the second optocoupler and the positive voltage terminal; the resistor R6 is connected between the collector of the other receiving transistor of the second optocoupler and the positive voltage terminal.

5. The calibration device for the operating time of the relay test instrument according to claim 4, characterized in that: The resistor R3 is connected between the positive terminal of one of the emitting diodes of the second optocoupler and the power supply terminal; the resistor R4 is connected between the positive terminal of the other emitting diode of the second optocoupler and the power supply terminal.

6. A calibration method for a calibration device of the operating time of a relay test instrument according to any one of claims 1 to 5, characterized in that: A program capable of setting time parameters is preset in the MCU module. When the program runs, by detecting the input signal of the electronic coil module and combining the setting of the time parameters, control signals are output to the electronic contact module through the first output terminal and the second output terminal respectively to control the signal changes of the normally closed end and the normally open end of the electronic contact module. Then, the time parameters obtained by detecting the normally closed end and the normally open end using a relay test instrument are compared with the time parameter setting values in the MCU module, so as to obtain the detection deviation situation of the relay test instrument, and the relay test instrument is corrected correspondingly according to the deviation situation.

7. A calibration method for a calibration device of the operating time of a relay test instrument according to any one of claims 1 to 5, characterized in that: It includes the following steps: S1. Initialize the contact ports, set the first output terminal to low level, the second output terminal to high level, make the normally closed end low level, and the normally open end high level; S2. The MCU judges whether the coil is powered on, that is, judges whether the input level of the MCU module changes? If not, return and continue to judge. If so, go to steps S3 and S7 respectively; S3. Start the internal timer to time, and perform the action processing when the normally closed end leaves; S4. The MCU judges whether the timing when the normally closed end leaves is over? If not, return and continue to judge. If so, go to the next step; S5. Start the internal timer to time, and perform the action processing when the normally closed end rebounds; S6. The MCU judges whether the pulse output is over when the normally closed end rebounds? If not, return and continue to judge. If so, go to step S11; S7. Start the internal timer to time, and perform the action processing when the normally open end closes; S8. The MCU judges whether the timing when the normally open end closes is over? If not, return and continue to judge. If so, go to the next step; S9. Start the internal timer to time, and perform the action processing when the normally open end rebounds; S10. The MCU determines whether the normal start end bounces back and whether the pulse output has ended. If not, it returns to continue the determination. If so, it proceeds to step S11; S11. The MCU determines whether the coil is energized, that is, whether the input level of the MCU module changes. If not, it returns to continue the determination. If so, it proceeds to steps S12 and S16 respectively; S12. Start the internal timer to count, and the normal start end leaves the action processing; S13. The MCU determines whether the timing of the normal start end leaving has ended. If not, it returns to continue the determination. If so, it proceeds to the next step; S14. Start the internal timer to count, and the normal start end bounce back action processing; S15. The MCU determines whether the normal start end bounces back and whether the pulse output has ended. If not, it returns to continue the determination. If so, it ends or returns to S1; S16. Start the internal timer to count, and the normally closed end closing action processing; S17. The MCU determines whether the timing of the normally closed end closing has ended. If not, it returns to continue the determination. If so, it proceeds to the next step; S18. Start the internal timer to count, and the normally closed end bounce back action processing; S19. The MCU determines whether the normally closed end bounces back and whether the pulse output has ended. If not, it returns to continue the determination. If so, it ends or returns to S1.

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